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APPLICATION
GUIDE
For POSITION
CONTROL
INDEX
y Selection Guide P.2
y Measurement Principle P.3 to 4
y Position Control Using a Reflective Sensor P.5
y Position Control Using a Thrubeam Sensor P.6
y Successful Applications P.7
POSITION CONTROL Selection Guide
Measuring the height of a Measuring the deflection of a Detecting the position of heated
spinless coater tensioned sheet copper pipe
2
POSITION CONTROL
MEASUREMENT PRINCIPLE
1D Triangulation Measurement Principle (LK-G Series) HIGH-SPEED WIDE RANGE 12 SENSOR HEADS CONNECTION
The semiconductor laser emits the laser beam to the target as shown above. The light reflected off the target is focused by the
ernostar lens and forms an image on the light-receiving element. The position of the beam spot on the receiving element varies
with the distance to the target. This variation is evaluated and converted into a measurement of target position.
Confocal Measurement Principle (LT-9000 Series) CLEAR TARGET THICKNESS HIGH-ACCURACY DOUBLE-SCANNING
Semiconductor Semiconductor
laser laser
Light-receiving Light-receiving
element element
The coaxial optical system improves Pinhole The received Pinhole The received
measurement performance Tuning fork
light intensity
Tuning fork
light intensity is
is low. high.
High angular characteristics Measurement of film
thickness
Sensor Sensor
3
MEASUREMENT PRINCIPLE
Spectroscopic unit
SI-F01U Sensor head
SLDSLD Interference light Spectroscopic assay
Light source (SLD) Polarization maintaining SI-F01 Part of the broad wavelength The two reflected light beams Splitting the interference light
optical fiber light emitted from the SLD is interfere with each other. The into different wavelengths with
reflected by the heads intensity of the interference light the spectroscope produces an
Spectro- reference surface, while the with a specific wavelength is optical intensity distribution for
scope Interference light Emitted light part that passes the reference determined according to the a specific wavelength. The
Waveform Reference reflection surface Target surface is mirror-reflected on distance between the reference distance to the target is
analysis the target and returns into the surface and the target. The obtained by carrying out
Diffraction
CCD grating head. relative maximum interference is waveform analysis on the
reached when the determined distribution.
distance is an integral multiple
Displacement data SLD: Super Luminescent Diode of the wavelength.
1D Thru-beam Measurement Principle (LS-9000 Series) NEW METHOD LONG LIFE HIGH-ACCURACY HIGH-SPEED
16,000 Hz
sampling rate
4
POSITION CONTROL
Measurement method
1. Set the reference point as 0. Controller
2. The position output is obtained at the reference point (0) when the target Reference
passes through. point 0.000
It is possible to obtain the output at the reference point as well as at some
distance "X*" from the reference point.
Movement Position
* x is adjustable. output
Position accuracy depends on the resolution and repeatability of the measuring instrument.
Using the averaging function stabilizes the measurement, but makes the response time slower. It is necessary to select the
optimum setting by balancing the two factors.
Resolution
Position ON Position ON
output output
OFF
OFF
Position accuracy
(The ON positions vary.)
Variance in the ON position = Position accuracy
5
POSITION CONTROL Position Control Using a Thrubeam Sensor
Measurement method
Indicator Indicator Position
0
t
Movement
0.000 0.000
Set the target at the reference point. Activate Set the judgment value of the indicator to 0. The position output is obtained at the reference
the auto-zero function of the controller. The point (the point where the indicator is set to 0) when the target passes through.
auto-zero function instantly sets the indication
of measurement value to 0.(This operation is
performed for the first time only.)
Indicator
X-axis
direction X-axis direction 1.342
Y-axis direction 1.676
POINT L S-90 0 0 Series ensures long life due t o its solid st at e design.
The LS-9000 Series has solved
the problem of motor durability
that has been a disadvantage of
the laser scanning method.
Semiconductor laser
Applications
Positioning a liquid crystal plate Measuring the gap of a mill roller Detecting the position of fiber
6
POSITION CONTROL
SUCCESSFUL APPLICATIONS
STEEL/BEARING
Pinch roller total indicator Heated steel pipe positioning Material position control during Temper roller skew
runout measurement welding measurement
AUTOMOTIVE/AIRCRAFT
Engine valve stroke inspection Feed bar backlash Detection of sealant spread Cotter valve height
measurement measurement
WEB/GLASS/Li-ION/SOLAR
T-die extruder adjustment Coating material on door glass Film edge curl measurement Rubber sheet tension control
control height measurement
SEMI/ELECTRONIC PARTS/HDD
Resin mold height Checking of wafer/robot arm Z-axis positioning of a wafer Automatic focus of image
measurement position through a viewport inspection system
ELECTRONIC PARTS/CONNECTOR
Ink level measurement CCD mounting position check Inspection of return speed of Zoom lens characterization
switch
7
DISPLACEMENT METER/DIMENSION MEASUREMENT SYSTEM LINEUP
Reflective-Type Measurement Instrument
High-Speed, High-Accuracy High-speed 2D/3D Laser Scanner
CMOS Laser Displacement Sensor LJ-V7000 Series
LK-G5000 Series
HIGH-SPEED 2D/3D
PROFILES
HIGH-ACCURACY COMPACT
DOUBLE-SCANNING NO HEAT
GREEN LED 2D
HIGH-ACCURACY
HIGH-SPEED
CALL T O C O N TA C T Y O U R L O C A L O F F I C E
TOLL
FREE
1-888-KEYENCE
1 - 8 8 8 - 5 3 9 - 3 6 2 3
www.keyence.com SAFETY INFORMATION
Please read the instruction manual carefully in
order to safely operate any KEYENCE product.
The information in this publication is based on KEYENCEs internal research/evaluation at the time of release and is subject to change without notice.
Copyright (c) 2010 KEYENCE CORPORATION. All rights reserved. MeasurePosition-KA-TG-E 1064-3 E 611395 Printed in Japan
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