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Note: The company keeps the right to perfect the instruction. If equipments do not agree with
the instruction at anywhere, please contact our company in time. We will provide you with
corresponding service.
is registered trademark of Beijing Sifang Automation Co., Ltd.
We reserve all rights to this document, even in the event that a patent is issued and a different
commercial proprietary right is registered. Improper use, in particular reproduction and
dissemination to third parties, is not permitted.
This document has been carefully checked. If the user nevertheless detects any errors, he is
asked to notify us as soon as possible.
The data contained in this manual is intended solely for the IED description and is not to be
deemed to be a statement of guaranteed properties. In the interests of our customers, we
constantly seek to ensure that our products are developed to the latest technological standards
as a result it is possible that there may be some differences between the hardware/software
product and this information product.
Manufacturer:
Beijing Sifang Automation Co., Ltd.
Introduction, this chapter presents the basic content and have a brief
introduction of this manual
Installing the IED, this chapter introduces the procedure to install IED and
how to check that the IED is properly connected to the protection system
Read and change setting, this chapter introduces how to read and
change the setting value via LHMI or software tool, and switch the setting
value group
IED testing, this chapter contains that what should be tested and how to
test the IED
Appendix, this chapter presents the significant data and diagram of the
IED
Target audience
Technical support
In case of further questions concerning the CSC family, please contact Sifang
compay or your local Sifang representative.
Safety information
Avoid to touching the circuitry when covers are removed. The IED
contains electirc circuits which can be damaged if exposed to static
electricity. Lethal high voltage circuits are also exposed when covers
are removed
Using the isolated test pins when measuring signals in open circuitry.
Potentially lethal voltages and currents are present
Changing the setting value group will inevitably change the IEDs
operation. Be careful and check regulations before making the
change
Contents
Chapter 1 IED Introduction ...............................................................................................................1
Chapter 2 Local human machine interface ....................................................................................3
1 Introduction .......................................................................................................................................4
2 Liquid crystal display (LCD) ...........................................................................................................5
3 LED ....................................................................................................................................................6
4 Keyboard...........................................................................................................................................7
5 IED menu ..........................................................................................................................................8
5.1 Menu construction ...........................................................................................................8
5.2 Operation status.............................................................................................................10
5.3 Operation configuration ................................................................................................10
5.4 Settings ...........................................................................................................................10
5.5 Report ..............................................................................................................................10
5.6 Communication configuration ......................................................................................11
5.7 Testing .............................................................................................................................11
5.8 Device setup ...................................................................................................................11
5.9 Device information .........................................................................................................13
Chapter 3 Installing IED ..................................................................................................................15
1 Unpacking and checking the IED ................................................................................................16
2 Installing the IED............................................................................................................................17
3 IED connection ...............................................................................................................................18
3.1 IED connector.................................................................................................................18
3.1.1 Introduction .............................................................................................................18
3.1.2 Terminals of Analogue Input Module (AIM) ........................................................19
3.1.3 Terminals of Fast binary Input & Output Module (FIO) ....................................23
3.1.4 Terminals of Fast binary Output Module (FOM) ................................................24
3.1.5 Terminals of Binary Input & Output module (BIO).............................................25
3.1.6 Terminals of CPU module (CPU).........................................................................26
3.1.7 Terminals of Power Supply Module (PSM) ........................................................27
3.1.8 RS232 port ..............................................................................................................28
3.2 Connecting to protective earth .....................................................................................28
3.3 Connecting the power supply module ........................................................................28
3.4 Connecting to CT and VT circuits ...............................................................................28
3.5 Connecting the binary inputs and outputs..................................................................28
3.6 Making the screen connection .....................................................................................29
3.7 RS485 and RS232 ports connection ..........................................................................29
3.7.1 RS485 port connection .........................................................................................29
3.7.2 RS232 port connection .........................................................................................30
3.8 Connecting the GPS...................................................................................................... 30
4 Checking before energizing .........................................................................................................32
4.1 Introduction .....................................................................................................................32
4.2 Checking the protective earth connection ................................................................. 32
4.3 Checking the power supply connection ..................................................................... 32
4.4 Checking the CT and VT circuits connection ............................................................ 32
4.4.1 Checking the CT circuits connection .................................................................. 32
4.4.2 Checking the VT connection ................................................................................ 33
4.5 Checking the binary input and output connection .................................................... 33
4.5.1 Checking the binary input connection ................................................................ 33
4.5.2 Checking the binary output connection .............................................................. 34
4.6 Checking the screened cables connection ................................................................ 34
4.7 Checking the S485 and RS232 port connectios ....................................................... 34
4.7.1 Checking the RS485 port connection ................................................................. 34
4.7.2 Checking RS232 port connection ....................................................................... 34
4.8 Checking GPS connection ........................................................................................... 34
4.9 Checking the insulation voltage and insulation resistance ..................................... 34
4.9.1 Checking the insulation voltage .......................................................................... 34
4.9.2 Checking the insulation resistance ..................................................................... 35
5 Checking after energizing ............................................................................................................ 36
5.1 Introduction..................................................................................................................... 36
5.2 Test LCD......................................................................................................................... 36
5.3 Test the keyboard.......................................................................................................... 36
5.4 Setting the IED time ...................................................................................................... 36
5.5 Checking the software and hardware version ........................................................... 37
Chapter 4 Read and change setting ............................................................................................. 39
1 Read and change the setting vaule ............................................................................................ 40
1.1 Read and change the setting value via LHMI ........................................................... 40
1.1.1 Introduction ............................................................................................................. 40
1.1.2 Communication parameter................................................................................... 40
1.1.3 Setting values, binary settings and soft connetors for protection function ... 41
2 Switching the setting group.......................................................................................................... 43
2.1 Introduction..................................................................................................................... 43
2.2 Method for switching setting group via LHMI ............................................................ 43
2.3 Method for switching setting group via binary input ................................................. 43
Chapter 5 Testing the communication connection and time synchronization ......................... 45
1 Testing the communication connection ...................................................................................... 46
1.1 Testing the Ethernet communication .......................................................................... 46
1.1.1 Testing the electrical Ethernet communication ................................................. 46
1.1.2 Testing the optical Ethernet communication...................................................... 46
1.2 Testing the RS485 port................................................................................................. 46
1.3 Testing the RS232 port................................................................................................. 46
2 Testing the time synchronization ................................................................................................. 48
2.1 Network mode ................................................................................................................ 48
2.2 IRIG-B mode .................................................................................................................. 48
Chapter 6 IED testing ...................................................................................................................... 49
1 Introduction..................................................................................................................................... 50
2 Points for attention during testing................................................................................................52
3 Preparing for test ...........................................................................................................................54
3.1 Introduction .....................................................................................................................54
3.2 Connecting test equipment to IED ..............................................................................54
4 Testing the power supply ..............................................................................................................56
4.1 Checking the self-startup performance ......................................................................56
4.2 DC power on and power off testing.............................................................................56
4.3 Checking the expiry date of power supply .................................................................56
5 Checking the analog channel ......................................................................................................57
5.1 Checking and adjusting the zero drift .........................................................................57
5.2 Checking and calibrating ..............................................................................................57
6 Testing binary input .......................................................................................................................59
7 Testing binary output .....................................................................................................................60
8 Verifying the IED functions ...........................................................................................................61
8.1 Overcurrent protection ..................................................................................................61
8.1.1 Verifying the settings .............................................................................................61
8.1.2 Completing the test................................................................................................68
8.1.3 Reference setting list for test ...............................................................................68
8.2 Earth fault protection ..................................................................................................... 70
8.2.1 Verifying the settings .............................................................................................70
8.2.2 Completing the test................................................................................................76
8.2.3 Reference setting list for test ...............................................................................76
8.3 Sensitive earth fault protection ....................................................................................78
8.3.1 Verifying the settings .............................................................................................78
8.3.2 Completing the test................................................................................................83
8.3.3 Reference setting list for test ...............................................................................83
8.4 Negative sequence overcurrent protection ................................................................85
8.4.1 Verifying the settings .............................................................................................85
8.4.2 Completing the test................................................................................................88
8.4.3 Reference setting list for test ...............................................................................88
8.5 Switch-onto-fault protection..........................................................................................89
8.5.1 Verifying the settings .............................................................................................89
8.5.2 Completing the test................................................................................................92
8.5.3 Reference setting list for test ...............................................................................92
8.6 Overload protection .......................................................................................................92
8.6.1 Verifying the settings .............................................................................................93
8.6.2 Completing the test................................................................................................95
8.6.3 Reference setting list for test ...............................................................................95
8.7 Overvoltage protection ..................................................................................................95
8.7.1 Verifying the settings .............................................................................................96
8.7.2 Completing the test..............................................................................................100
8.7.3 Reference setting list for test .............................................................................100
8.8 Undervoltage protection..............................................................................................101
8.8.1 Verifying the settings ...........................................................................................101
8.8.2 Completing the test ............................................................................................. 107
8.8.3 Reference setting list for test ............................................................................. 107
8.9 Thermal overload protection ...................................................................................... 108
8.9.1 Verifying the settings ........................................................................................... 108
8.9.2 Completing the test ............................................................................................. 113
8.9.3 Reference setting list for test ............................................................................. 113
8.10 Displacement voltage protection ............................................................................... 114
8.10.1 Verifying the settings ........................................................................................... 114
8.10.2 Completing the test ............................................................................................. 117
8.10.3 Reference setting list for test ............................................................................. 118
8.11 Circuit breaker failure protection ............................................................................... 118
8.11.1 Verifying the settings of stage 1 of CBF protection ........................................ 119
8.11.2 Completing the test ............................................................................................. 122
8.11.3 Reference setting list for test ............................................................................. 123
8.12 Dead zone protection.................................................................................................. 123
8.12.1 Verifying the settings ........................................................................................... 124
8.12.2 Completing the test ............................................................................................. 125
8.12.3 Reference setting list for test ............................................................................. 125
8.13 Synchro-check and energizing check function ....................................................... 125
8.13.1 Verifying the settings ........................................................................................... 125
8.13.2 Completing the test ............................................................................................. 132
8.13.3 Reference setting list for test ............................................................................. 132
8.14 Auto-recloser ................................................................................................................ 134
8.14.1 Verifying the settings ........................................................................................... 134
8.14.2 Completing the test ............................................................................................. 134
8.14.3 Reference setting list for test ............................................................................. 135
8.15 Low(under) frequency load shedding protection .................................................... 137
8.15.1 Verifying the settings ........................................................................................... 137
8.15.2 Completing the test ............................................................................................. 141
8.15.3 Reference setting list for test ............................................................................. 141
8.16 Low voltage load shedding protection ...................................................................... 142
8.16.1 Verifying the settings ........................................................................................... 142
8.16.2 Completing the test ............................................................................................. 146
8.16.3 Reference setting list for test ............................................................................. 146
8.17 Overload load shedding protection ........................................................................... 147
8.17.1 Verifying the settings ........................................................................................... 147
8.17.2 Completing the test ............................................................................................. 150
8.17.3 Reference setting list for test ............................................................................. 151
8.18 Unbalance protection .................................................................................................. 151
8.18.1 Verifying the settings ........................................................................................... 152
8.18.2 Completing the test ............................................................................................. 155
8.18.3 Reference setting list for test ............................................................................. 155
8.19 Under current monitoring ........................................................................................... 156
8.19.1 Verifying the settings ........................................................................................... 156
8.19.2 Completing the test..............................................................................................158
8.19.3 Reference setting list for test .............................................................................158
8.20 Current overload monitoring.......................................................................................158
8.20.1 Verifying the settings ...........................................................................................158
8.20.2 Completing the test..............................................................................................161
8.20.3 Reference setting list for test .............................................................................161
8.21 Control circuit faulty supervising................................................................................162
8.21.1 Verifying the settings ...........................................................................................162
8.21.2 Completing the test..............................................................................................163
8.21.3 Reference setting list for test .............................................................................163
8.22 Current transformer secondary circuit supervision ................................................. 164
8.22.1 Verifying the settings ...........................................................................................164
8.22.2 Completing the test..............................................................................................165
8.22.3 Reference setting list for test .............................................................................165
8.23 Voltage transformer secondary circuit supervision................................................. 165
8.23.1 Verifying the settings ...........................................................................................166
8.23.2 Completing the test..............................................................................................173
8.23.3 Reference setting list for test .............................................................................173
8.24 Monitoring function ......................................................................................................174
8.24.1 Auxiliary contact of circuit breaker monitoring................................................. 174
9 Checking before operation .........................................................................................................176
9.1 Checking the LED ........................................................................................................176
9.2 Checking the display on LCD.....................................................................................176
9.3 Checking the clock ......................................................................................................176
9.4 Checking the voltage and current .............................................................................176
9.5 Checking the setting group ........................................................................................176
9.6 Checking the setting .................................................................................................... 176
9.7 Checking the binary input ...........................................................................................177
9.8 Checking the normal operation mode.......................................................................177
9.8.1 Trip and close test with the circuit breaker.......................................................177
9.9 Put into operation.........................................................................................................177
Chapter 7 Operating maintenance ..............................................................................................179
1 Attentions during operating ........................................................................................................180
2 Routine checking .........................................................................................................................182
3 Periodical checking .....................................................................................................................183
4 The alarm information .................................................................................................................184
4.1 Alarm information class I and the description..........................................................184
4.2 Alarm information class II and the description for M1 ............................................184
Chapter 8 Transportation and storage ........................................................................................189
1 Transportion..................................................................................................................................190
2 Storage ..........................................................................................................................................191
Chapter 9 Appendix .......................................................................................................................193
1 Arrangement diagram of modules.............................................................................................194
2 Typical diagram ............................................................................................................................195
Chapter 1 IED Introduction
1
Chapter 1 IED Introduction
The Human Machine Interface (HMI) on the IED provides an ideal
mechanism for the day to day operation and even advanced use of the IED.
The keyboard, LCD and LEDs on the front of the IED are what constitute the
HMI. Troubleshooting, monitoring, setting and configuring are all possible via
this interface. Through the screens and menu elements available, as well as
the keypad, the user is able to navigate throughout the menu structure and
move from screen to screen.
The IED is unpacked and visually checked. The connection to the protection
system has to be checked in order to verify that the installation is successful.
The settings for each function must be calculated before the commissioning
task. The functions setting menu have been listed in detail so that the user
can find and change the required settings directly and correctly. For the
different application, the IED can be performed conveniently through
switching the setting group.
For the functions included in the IED can be tested by users, the testing
procedure have been listed as reference to verify that protection function
operate correctly.
After the IED is in service, some checking items also need to be done for
maintenance in order to ensure that the IED is in good condition during
operation, some suggestions have been preset as reference and the user can
perform some other checking items according to the relevant regulations.
2
Chapter 2 Local human machine interface
3
Chapter 2 Local human machine interface
1 Introduction
The HMI is simple and easy to be used for routine operation, the front panel
of the HMI consists of LCD, LED and keyboard. As shown in the following
picture, the setting, configuration, monitoring, maintenance and fault analysis
can be performed in HMI.
2. LEDs
3. Arrow keys
4. Reset key
5. Quit key
6. Set key
4
Chapter 2 Local human machine interface
5
Chapter 2 Local human machine interface
3 LED
There are 11 LEDs on the left side of the LCD. The definition for each LED is
shown as following table.
6
Chapter 2 Local human machine interface
4 Keyboard
The keyboard is used to monitor and operate IED. The keyboard has the
same look and feel in CSC family. As shown in Figure 1, keyboard is divided
into Arrow keys, Reset key, Quit key and Set key. The specific instructions on
the keys as the following table described:
Key Function
Up arrow key Move up in menu
Page up between screens
Increase value in setting
Down arrow key Move down in menu
Page down between screens
Decrease value in setting
Left arrow key Move left in menu
Right arrow key Move Right in menu
Reset key Reset the LEDs
Return to normal scrolling display state directly
Set key Enter main menu or submenu
Confirm the setting change
Quit key Back to previous menu
Cancel the current operation and back to previous menu
Return to scrolling display state
Lock or unlock current display in the scrolling display state (the
lock state is indicated by a "solid diamond" type icon on the botton
right corner of the LCD)
7
Chapter 2 Local human machine interface
5 IED menu
Analog BI
Metering Connect
OpStatus
Energy GOOSEINF
Switch Time
OpConfig
Connect GOO Ctrl
Read Switch
Settings
Write Delete
Event Operation
Wave
MainMenu
Eth 1# Serial
Monitor
BO Zero
BI Remote
Testing
LED Test TestMode
Accuracy
Module Print
SysParam Backlit
8
Chapter 2 Local human machine interface
Table 3 Full name for the menu
9
Chapter 2 Local human machine interface
Sub-menu Full name Sub-sub menu Full name
information OpInfo Operation information
5.4 Settings
5.5 Report
10
Chapter 2 Local human machine interface
Sub menu Sub-sub menu Explanation
unnecessary test records before IED operation.
5.7 Testing
11
Chapter 2 Local human machine interface
Sub menu Sub-sub Sub-sub-sub Explanation
menu menu
Hardware support is necessary, the setup
NetConf must be consistent with the hardware, and
LON/485/Ethernet are optional
The default is the soft connector mode, for
soft and hard combined mode, only the
Connect specific protection hard contact is provided,
Module
the other protection hard connector starts up
by default
BIO module setup depends on the practical
BIO
equipment
AI module setup depends on the practical
sql
equipment
Setup of CSC2000 protocol, identify the
CSC2000 communication requirement of this station
and practical hardware configuration
Setup of 103 protocol, identify the
Prot103 communication requirement of this station
and practical hardware configuration
Remote Setup of 61850 protocol, identify the
IEC61850 communication requirement of this station
and practical hardware configuration
DevSetup
Setup of signal, protocol version, report
Signal parameter and time synchronization, identify
the external condition of this station
Setup of the related parameters for external
Modify
conditions
SysParam
Load the default value when upgrade CPU
Default
program
Print Set network printer address
Adjust the compensation coefficient of the
Zero measurement module under the zero input
status
Scale Scale adjustment
Metering Confirm and save zero setup and scale
Save
setup
Clear the current memorized operation value
Reset of the measurement module (power and
impulse counter)
Set the back light to keep constant on or
Backlit automatically turn off when the keyboard is
free
12
Chapter 2 Local human machine interface
13
Chapter 2 Local human machine interface
14
Chapter 3 Installing IED
15
Chapter 3 Installing IED
3. Check all items included in accordace with the delivery documents. Once
the IED has been started make sure that the software functions ordered
have been included in the delivery
5. If the protection IED is repacked for transport again, the storage packing
of the IED must provide proper degree of protection against possible
damage, in accordance with the standard of IEC 60255-21-1 class 1 and
IEC 60255-21-2 class 1
16
Chapter 3 Installing IED
1. Insert the IED into cabinet and the bottom of the IED should be supported
on the frame of cabinet
2. Fix the IED by tightening all screws against the cabinet. The IED should
be fixed in the cabinet and each screw should be firmed
3. Connect the earthing screw on the rear panel to the nearest protective
earthing point in the cubicle. The protective earth cables should be green
or yellow conductors with cross-sectional area 2.5mm2 according to
electrical regulations and electrical standards requirement
The wiring from the cubicle terminal block to the IED terminals must be
connected in accordance with the established guidelines for this type of
IED. The wires from binary inputs and outputs and the auxiliary power
supply must be routed separated from the current transformer cables
between the terminal blocks of the cubicle and the IEDs connections.
CT and VT are connected to the analogue input module on the rear side
of the IED.
Auxiliary power supply and binary input and output signals are connected
using female connectors. Signal wires are connected to a female
connector, which is then plugged into the corresponding male connector,
located at the rear of the IED.
17
Chapter 3 Installing IED
3 IED connection
3.1.1 Introduction
18
Chapter 3 Installing IED
I06 I02 I1
I03 Null
I07
I04 Null
I08
I05 Null
I09
I06 Null
I10
I07 Null
Metering
19
Chapter 3 Installing IED
Protection
U04 Input
U05 I01 I1 Star point
U06 I02 I1
U03 UC1 Star point
U07
U04 UC1
U08
U05 UC2 Star point
I09
U06 UC2
I10
U07 UC3 Star point
Metering
20
Chapter 3 Installing IED
Analogue
Terminal Remark
Input
I01 I1 Star point
I02 I1
I03 IC1 Star point
I04 IC1
I05 IC2 Star point
I06 IC2
I07 IC3 Star point
I08 IC3
I09 Null
I10 Null
Star point,
I11 ImB
for metering
Figure 4 Terminals arrangement of AIM C
series For
I12 ImB
metering
21
Chapter 3 Installing IED
Analogue
Terminal Remark
Input
I01 IA Star point
I02 IA
I03 IB Star point
I04 IB
I05 IC Star point
I06 IC
I07 I0 Star point
I08 I0
Star point
I09 ImA
For metering
I10 ImA For metering
Star point For
I11 ImC
metering
I12 ImC For metering
22
Chapter 3 Installing IED
Output
Terminal Definition
relay
01 Binary input 1
02 Binary input 2
03 Binary input 3
04 Binary input 4
Common terminal
for all binary
05 inputs above,
connect with DC
negative terminal
06 Null
07 Trip contact 1-1 Relay 1
08 Trip contact 1-0 Relay 1
09 Trip contact 2-1 Relay 2
10 Trip contact 2-0 Relay 2
11 Trip contact 3-1 Relay 3
12 Trip contact 3-0 Relay 3
13 Trip contact 4-1 Relay 4
14 Trip contact 4-0 Relay 4
15 Trip contact 5-1 Relay 5
16 Trip contact 5-0 Relay 5
17 Trip contact 6-1 Relay 6
18 Trip contact 6-0 Relay 6
19 Trip contact 7-1 Relay 7
20 Trip contact 7-0 Relay 7
Figure 6 Terminals arrangement of FIO
23
Chapter 3 Installing IED
Output
Terminal Definition
relay
01 Trip contact 1-1-1 Relay 1
02 Trip contact 1-1-0 Relay 1
03 Trip contact 1-2-1 Relay 1
04 Trip contact 1-2-0 Relay 1
05 Trip contact 2-1-1 Relay 2
06 Trip contact 2-1-0 Relay 2
07 Trip contact 2-2-1 Relay 2
08 Trip contact 2-2-0 Relay 2
09 Trip contact 3-1-1 Relay 3
10 Trip contact 3-1-0 Relay 3
11 Trip contact 3-2-1 Relay 3
12 Trip contact 3-2-0 Relay 3
13 Trip contact 4-1-1 Relay 4
14 Trip contact 4-1-0 Relay 4
15 Trip contact 4-2-1 Relay 4
16 Trip contact 4-2-0 Relay 4
17 Trip contact 5-1-1 Relay 5
18 Trip contact 5-1-0 Relay 5
19 Trip contact 5-2-1 Relay 5
20 Trip contact 5-2-0 Relay 5
Figure 7 Terminals arrangement of FOM
24
Chapter 3 Installing IED
21 21 Binary input 7
Common terminal
DC -
22 for all binary
22 inputs, connect
Figure 8 Terminals arrangement of BIO with AUX.DC
negative terminal
25
Chapter 3 Installing IED
Terminal Definition
01 Binary input 1
02 Binary input 2
03 Binary input 3
04 Binary input 4
05 Binary input 5
06 Binary input 6
07 Binary input 7
Common terminal for all
08 binary inputs above, connect
with DC -24V. terminal
09 Time synchronization
10 Time synchronization GND
11 RS485 port - 1B
12 RS485 port - 1A
Optional optical fiber or RJ45
Ethernet
port for station automation
Port A
system
Optional optical fiber or RJ45
Ethernet
port for station automation
Port B
system
26
Chapter 3 Installing IED
Terminal Definition
01 Binary input 1
02 Binary input 2
03 Binary input 3
Binary inputs
04 Binary input 4
05 Binary input 5
06 Binary input 6
07 Binary input 7
08 Binary input 8
09 Binary input 9
Common terminal for all
binary inputs above, connect
10
with AUX.DC negative
terminal
11 AUX.DC 24V+ output
DC 24V
output
27
Chapter 3 Installing IED
RS232 serial port is located on front panel, the software tool in PC can be
connected with the IED via this port to make setting, testing and cofiguration,
etc.
Connect the earthing screw on the rear panel to the nearest protective
earthing point in the cubicle. The protective earth cables should be green or
yellow conductors with cross-sectional area 2.5mm2 according to electrical
regulations and electrical standards requirement.
The cubicle must be properly connected to station earthing system, using the
conductor with cross-sectional area of at least 4mm2.
The wiring from the cubicle terminal block to the IED terminals must be
connected in accordance with the established guidelines for this type of IED.
The wires from binary inputs and outputs and the auxiliary power supply must
be routed separated from the current transformer cables between the terminal
blocks of the cubicle and the IEDs connections.
CT and VT are connected to the analogue input module on the rear side of
the IED.
Auxiliary power supply and binary input and output signals are connected
using female connectors. Signal wires are connected to a female connector,
which is then plugged into the corresponding male connector, located at the
28
Chapter 3 Installing IED
rear of the IED.
Procedure:
All wiring to the female connector should be done before it is plugged into
the male part and screwed to the case. The conductors can be of rigid
type (solid, stranded) or of flexible type.
If two conductors, each with area 1.5 mm2 (AWG 15) need to be
connected to the same terminal, a ferrule must be used to combine the
two conductors, no soldering is needed. Wires with a smaller gauge can
be inserted directly into the female connector receptacle and the
fastening screw shall be tightened.
When using screened cables always make sure screens are earthed and
connected according to applicable engineering methods. This may include
checking for appropriate earth points near the IED, for instance, in the cubicle
and/or near the source of measuring. Ensure that earth connections are
made with short conductors of an adequate cross section, at least 6 mm2
(AWG10) for single screen connections.
The RS485 interface is capable of half-duplex service with the signals A/A'
and B/B' to transmit signals.
29
Chapter 3 Installing IED
The network topology of RS485 adopts bus type of terminal matched, do not
support ring or star network. Use the single and continuous channel as bus.
The terminating resistance is located on beginning and terminal of the bus
cable. The other ports do not need the terminating resistance.
One RS232 serial port is provided and located on front panel, which is used to
connect personal computer. The RS232 port adopts half-dupex
communication mode, usually which is connected with 9-pin D-subminiature
female connectors
Connection method: direction connection cable for serial port, the IED
terminal is pins and the PC termianl is female connector. The terminal of 2, 3,
4 and 5 is connected directly. As shown in the following picture:
Mount the GPS antenna on the building roof or the place of visibility to all
direction is obtained, top of the antenna should be horizontal. Mount the
antenna to console and fix the console on the building roof with expansion
bolts. The turning radius should not be too small when laying the cables. The
length of antenna cables is designed strictly based on antenna gain, so, it is
not allowed to lengthen, shorten or add connectors that will affect signal
reception or can't receive any signals.
30
Chapter 3 Installing IED
The principle for mounting GPS antenna is that the position is visible
completely to all directions in 360, however, for some special conditions,
mount the antenna at the place with best visibility as far as possible.
The GPS port is located on the rear side of communication module, as shown
in Figure 9, which can be connected with screened twist-pair cable.
31
Chapter 3 Installing IED
4.1 Introduction
Check that the auxiliary power supply voltage remains within the permissible
input voltage range under all operating conditions. Check that the polarity is
correct.
Check that the wiring is in strict accordance with the supplied connection
diagram. If any errors appearance, do not continue before any errors are
corrected. The following tests shall be performed on every primary CT
connected to IED:
Primary injection test to verify the current change ratio of the CT, the
correct wiring up to the protection IED and correct phase sequence
connection (i.e. A, B, C)
32
Chapter 3 Installing IED
CT excitation test in order to confirm that the current transformer is of the
correct accuracy rating and that there are no shorted turns in the current
transformer windings. Manufacturer's design curves should be available
for the current transformer in order to compare the actual results
Check that the wiring is in strict accordance with the supplied connection
diagram. If any errors appearance, do not continue before any errors are
corrected.
Polarity check
Grounding check
Phase relationship
When checking the binary outputs, it's better to disconnect the binary output
connector from binary output module. Check all connected signals in order to
make sure that both the input level and polarity of voltage are in accordance
with the IEDs specifications.
34
Chapter 3 Installing IED
Using the withstand voltage tester to apply correspondung level voltage
between tested circuit and earth, and between circuits (e.g. 2000VAC
/2800VDC), lasting 1 min. No flashover and breakdown apperance, the
leakage current is less than 10mA.
Using a rotating meter with 500V to test insulation resistance in turn between
analog circuits and earth, and the circuits to each other. Every resistance
must not be less than 100 M. And the lasting time for resistance test is not
less than 5s to ensure that the value of insulation resistance is read in a
steady state.
35
Chapter 3 Installing IED
5.1 Introduction
After energizing the IED, the blue back light of LCD light up, operate the keys
to turn pages to check that the LCD display is correct.
All the keys on front panel including Arrow keys, Reset key, Set key and Quit
key can be operated to check that these keys satisfy with the correpsonding
function, the detail functions of each key are described in Table 2.
This procedure describes how to set the IED time from the local HMI.
1. Enter into the time setting menu: OpConfig/Time, press the Set button to
enter into the setting menu
Use the Left and Right arrow buttons to move between the time and date
values (year, month, day, hours, minutes and seconds). Use the Up and
Down arrow buttons to change the value.
Press the Set button to set the data and clock to the new values.
36
Chapter 3 Installing IED
Check the hardware version: In this menu, to check the equipment code.
37
Chapter 3 Installing IED
38
Chapter 4 Read and change setting
39
Chapter 4 Read and change setting
1.1.1 Introduction
All the function settings, binary settings and connectors can be read and set
through LHMI. The user can browse to the desired settings and enter into the
appropriate vaules. The parameters for each function can be found in the
LHMI. See the Technical applciation manual for a complete list of setting
parameters for each function.
The address of Ethernet port 1and Ethernet 2 can be modified in this setting.
The related parameter about BIO module can be modified in this setting.
In this menu, the parameter for RS232 and RS485 port can be set, such as
baud rate, transmission protocol, etc.
In this menu, the LON address, STA name and Bay name can be set.
40
Chapter 4 Read and change setting
1.1.2.5 Time synchronization mode
Network mode
The time synchronization mode can be changed into network time mode via
this setting.
IRIG-B Mode
The time synchronization mode can be changed into IRIG-B time mode via
this setting.
protection function
The menu of protection setting is used to check and modify every function
setting, using left and right button to chose the vaule and the up and down
buttons are used to modify the value, the upper and lower limits of setting
value will be displayed when the cursor move to corresponding setting items.
The protection binary settings are used to enable or disable each function.
Two ways for modifying the binary setting via LHMI:
1. Modify the value of hex format displayed in this menu to enable or disable
the corresponding function.
2. Press the right button for a while, the detail information for this binary
setting will be displayed, using up and down button to select the required
function and the left and right button to enable or disable this function.
41
Chapter 4 Read and change setting
1.1.3.3 Protection soft connector
The protection soft connectors are used to enable or disable each function,
On means enable and Off means disable. Use the up and down button to
select the required connector and the left and right button to enable or disable
this function.
42
Chapter 4 Read and change setting
2.1 Introduction
There are 16 setting groups with same setting items in the IED, for each
group settings can be set and saved separately, the different setting groups
can be switched according to different application.
The current setting group number and the chosen setting group number are
displayed in the LCD, change the setting group number by up and down
button, comfirm the result by Set button after the setting group number is
chosen.
Note: the functions are related with setting value, binary setting as well as
connector, so, the group number for setting value and connector should be
consistent in order to make sure the IED operate normally.
The binary setting "BI SetGrp Switch" in the menu described above is used
for switching setting group via binary input, when this binary setting is set to 1,
and the corresponding binary input is active, the setting group is switched
from group 1 to group 2. If the binary setting is set to 1 and the binary input is
inactive, the setting group is switched from group 2 to group 1.
Note: The method for swithing setting group via binary input is only available
for switching between group 1 and group2.
43
Chapter 4 Read and change setting
44
Chapter 5 Testing the communication connection and
time synchronization
45
Chapter 5 Testing the communication connection and
time synchronization
1 Testing the communication connection
46
Chapter 5 Testing the communication connection and
time synchronization
Using the dedicated cable for serial port to connect the PC with IED, if
connection fail, check the corresponding configuration of IED is true or not. If
all configurations are true, and the connection is still unsuccessful, please
check the connection cable and communication port.
47
Chapter 5 Testing the communication connection and
time synchronization
2 Testing the time synchronization
DevSetup/Remote/Signal/SynType
Check that the IED time is changed automatically in accordance with time
synchronization source
DevSetup/Remote/Signal/SynType
Check that the IED time is changed automatically in accordance with time
synchronization source
48
Chapter 6 IED testing
49
Chapter 6 IED testing
1 Introduction
IED test requirements:
The IED setting value must be completed before the testing can start.
Terminal diagram
Prepare the IED for test before testing a function. Consider the logic diagram
of the tested protection function when perform the test. All included functions
in the IED are tested according to the corresponding test instrunctions in this
chapter.
50
Chapter 6 IED testing
Display value in HMI
51
Chapter 6 IED testing
It is allowed to plug-in and pull out each module after the power supply
disconnection. Aviod AC current circuit opened when plug in and pull out
the modules
Keep cleaning and pay attention to dust prevention for each module
In principle, the electric iron can't be used in field, if the electric iron need
to be used for welding during testing, the welding can be performed after
the power disconnection or using the electric iron with earthed wire
During testing, do not insert the module into the wrong position. When
plug in and pull out the module apply appropriate force instead of
overexerting to avoid pins bending or damage the fastening components
of module
During testing, consider the safety measure between the IED and other
running equipment and the safety measure of related circuit between
external running equipment and the IED
During testing, if the current magnitude that is input into IED is large than
three times of rated current, it should be noticed that the time should not
be too long
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Chapter 6 IED testing
When energizing the IED in the first time, using multimeter to check the
power supply, the circuit of voltages and currents are connected correcly
to avoid short circuit or open circuit
Tighten all the screws of all terminals again for the new project in order to
prevent improper connection, and plug in and pull out all the modules
again to aovid the modules loosing result from operation or installation
53
Chapter 6 IED testing
3.1 Introduction
If the modules are needed to be plugged in or pulled out, make sure that
the power is disconnected, and the measure of prevention electrostatic
should be done in order to avoid the damage to module or performance
degradation
Before testing, connect the test equipment according to the IED specific
connection diagram. Pay special attention to the correct connection of the
input and output current terminals. Check that the input and output logical
signals in the logic diagram for the function under test are connected to the
corresponding binary inputs and outputs of the IED. The testing connection
diagram is shown in Figure 12.
The user must verify that the connections are correct and the analog signals
are measured correctly after connection completed.
Procedure:
54
Chapter 6 IED testing
value
Tester IED
IA IA IA
IB IB IB
IC IB IC
IN IN IN
UA UA
UB UB
UC UC
UN UN
Trip A
Trip B
Trip C
55
Chapter 6 IED testing
Power on the IED, in order to check the self-startup performance of the IED,
energizing the IED with the voltage rised slowly from zero to 80% rated
voltage, at this time, observe the green Run LED on the front panel that
should be lighted continuously. After the DC power disappears, the normal
closed contact should be disconnected, which can be tested using the
multimeter, the contact is show in Figure 10.
Changing the DC power to 80% rated voltage, power off and power on the
power supply some times, the Run LED on the front panel should turn off
and turn on correspondingly. The normal closed contact should be in the on
or off state. The contact is show in Figure 10.
When period checking, check the expiry date of the power supply module, if
the power supply module has been used more than 5 years, please replace it.
56
Chapter 6 IED testing
MainMenu/Testing/Zero
In this menu, the zero drift values of all analog channels have been listed in
detail, check that the zero drift is met the requirement. Generally, the
requirement of the current channels is <0.01In, the voltage channels is <0.5V.
If the zero drift value is not satisfied the requirement, adjust the corresponding
zero drift.
MainMenu/DevSetup/Zero
MainMenu/DevSetup/Save
It is allowed to check zero drift after energizing the IED for 5 minutes, when
adjusting the zero drift, disconnect electrical connection of the IED, test
equipment, standard source and external circuit, make sure that there are no
any inputs to analog terminals, select the menu and adjust zero drift. After
zero drift adjustment succeed, enter into the " Save " menu to complete the
adjustment.
MainMenu/OpConfig/Analog
MainMenu/OpConfig/Metering
The analog quantities scale for protection function is not used to be adjusted,
the accuracy is guaranteed by hardware. For the scale adjustment, Only the
measurement channel is adjusted.
Before testing, disable all of the connectors and binary settings in order to
avoid the protection function startup or maloperation.
Using the test equipment with 0.1 grade, connect the voltages and currents of
test equipment to the corresponding input terminals to check the magnitude
and phase angle of voltage and current. The magnitude tolerance of IED
displaying value and external injected value should be less than 2.5%
(phase voltage vaule tolerance <0.2V when voltage channel is 1V, zero
57
Chapter 6 IED testing
sequence voltage tolerance <0.2V when voltage channel is 3V; current value
tolerance <0.02In when current channel is 0.08 In).
MainMenu/DevSetup/Scale
MainMenu/DevSetup/Save
Make sure that zero adjustment have been completed before scale
adjustment, and then inject rated voltage and current, after the standard
source output steadily, enter into the menu described above to adjust scale.
After scale adjustment succeed, enter into the " Save " menu to complete the
adjustment. And then check the measurement value, the accuracy
requirement is: tolerance of voltage and current should be less than 0.2%
and tolerance of power should be less than 0.5%.
Note: during testing, if the measuring tolerance of the analog quantities are
large than the required range, check that the testing connection, testing
method and external measurement meter is correct, the testing source has
not wave distortion, before all of the exteral equipments are checked, it
should not adjust or change the components of the IED immediately.
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Chapter 6 IED testing
Check the binary input status in this menu, all the binary input status should
be displayed as "empty circle" icon. Make sure that the circuit of binary input
is in good condition, the power of binary input have been connected (24V,
110V or 220V). Test the binary input one by one according to the engineering
drawing, the tested binary input status displayed in HMI should be displayed
as "solid circle" icon.
59
Chapter 6 IED testing
Testing binary output in this menu to verify the correctness of signal circuit
and output circuit.
During testing the binary output, the corresponding relay contact operate, the
irrelevant contacts should not operate. Use the multimeter to measure the
corresponding output contacts of the tripping and signal.
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Chapter 6 IED testing
1. Enable the protection function binary setting via software tool or LHMI
3. Input the rated currents and voltages to make the IED operating
normally for 20s
7. Stop the output from test equipment and restore to original state
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
61
Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_OC1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
62
Chapter 6 IED testing
Test item Description
as 1
Settings/Write/Select/Ctr Word 1/OC1 Dir, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Fault simulation Fault current: 200% of the setting value
Fault voltage: 85% rated voltage
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
63
Chapter 6 IED testing
Test item Description
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
64
Chapter 6 IED testing
Test item Description
as 1
Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Harmonic phase: phase B or phase C
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 200% of the setting value
Cross-blocking time: the same as setting value
Fault time: longer than (cross-blocking time + operate setting value)
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of technical data (cross-blocking time +
operate time)
65
Chapter 6 IED testing
Test item Description
Ratio of I2/I1: 200% of the setting value
Fault current: 105% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of overcurrent
portection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.
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Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the time calculated by the equation
Test result The corresponding output contacts should not close
67
Chapter 6 IED testing
Inverse time stage characteristic
User-defined characteristic
The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
68
Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
blocking overcurrent
protection
Current setting for inverse
6. 0.5In I_OC Inv A 0.05In 20.00In
time stage
Time factor for inverse time
7. 0.056 AK_OC Inv S 0.001 1000
stage
8. 0.02 P_OC Inv Index for inverse time stage 0.01 10.00
Delay time for inverse time
9. 0 BK_OC Inv S 0.00 60.00
stage
10. 30 Angle_OC Direction characteristic angle degree 0.00 90.00
Maximum inrush current
11. In I_2H_UnBlk A 0.25In 20.00In
setting
Ratio for second harmonic
12. 0.15 Ratio_I2/I1 current to fundamental 0.07 0.50
component
Time setting for
13. 0.2 T2h_Cross_Blk S 0.00 60.00
cross-blocking function
69
Chapter 6 IED testing
Bit Default 0 1 Explanation
Stage 1 of overcurrent
4.0 1 OC1 Alarm OC1 Trip
protection alarm or trip
Inverse stage of overcurrent
4.1 1 OC Inv Alarm OC Inv Trip
protection alarm or trip
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
70
Chapter 6 IED testing
Test item Description
Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
71
Chapter 6 IED testing
Test item Description
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 1/EF1 Dir, set the binary setting as
1
Settings/Write/Select/Ctr Word 1/EF U2/I2 Dir, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Negative sequence current: 200% of the setting value
Fault simulation
Zero sequence voltage: 0 V
Negative sequence voltage: 85% rated voltage
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
72
Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 105% of setting value
Fault simulation
Fault current: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
73
Chapter 6 IED testing
Test item Description
95% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 95% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
105% of the maximum inrush current restraint setting verifying
OpConfig/Connect/Func_EF1, set the connecotr as "On"
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Ratio of I2/I1: 200% of the setting value
Fault simulation
Fault current: 105% of the maximum inrush current restraint setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of earth fault
portection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.
74
Chapter 6 IED testing
8.2.1.3 Verifying the settings of inverse time stage
75
Chapter 6 IED testing
Test item Description
Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data
The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
Time factor for inverse
6. 12 AK_EF Inv S 0.001 1000
time stage
Index for inverse time
7. 1 P_EF Inv 0.01 10.00
stage
Delay time for inverse
8. 0 BK_EF Inv S 0.000 60.00
time stage
Characteristic angle for
9. 30 Angle_EF degree 0.00 90.00
zero-sequence direction
Characteristic angle for
10. 30 Angle_Neg negative-sequence degree 0.00 90.00
direction
Maximum inrush phase
11. In I_2H_UnBlk A 0.25In 20.00In
current setting
Maximum inrush zero
12. In 3I0_2H_UnBlk sequence current A 0.25In 20.00In
setting
Ratio for second
13. 0.15 Ratio I2/I1 harmonic current to 0.07 0.50
fundamental component
Ratio for zero sequence
second harmonic
14. 0.15 Ratio I02/I01 current to zero 0.07 0.50
sequence fundamental
component
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Chapter 6 IED testing
Bit Default 0 1 Explanation
Enable or disable the
1.15 0 EF U2/I2 Dir Off EF U2/I2 Dir On
negative sequence direction
2.7 0 3I0 Measured 3I0 Calculated 3I0 measured or calculated
2.8 1 3U0 Measured 3U0 Calculated 3U0 measured or calculated
Enable or disable the function
2.11 0 Blk EF_CT Fail UnBlk EF_CT Fail
of CT fail blocking
Enable or disable the function
2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail
of VT fail blocking
Stage 1 of overcurrent
4.2 1 EF1 Alarm EF1 Trip
protection alarm or trip
Inverse stage of overcurrent
4.3 1 EF Inv Alarm EF Inv Trip
protection alarm or trip
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
78
Chapter 6 IED testing
Test item Description
95% of the current setting verifying
OpConfig/Connect/Func_SEF1, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Sensitive current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
79
Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A, instantanuous, forward direction
Direction angle: 3 from operating boundary setting value
Fault simulation Sensitive current: 200% of the setting value
Zero sequence voltage: 200% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
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Chapter 6 IED testing
Table 43 Direction angle setting verifying
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of sensitive earth fault
portection are same as stage 1, only need to change the corresponding test
81
Chapter 6 IED testing
conditions and settings into the conrresponding stage 2 required.
82
Chapter 6 IED testing
Test item Description
Binary input None
Fault type: phase A
Fault simulation Sensitive current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, the operate
Test result time meet the requirement of calculated by inverse time stage
equation of technical data
The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
setting for stage 2 0.05In 20.00In
(Normal) (Normal)
4. 0.1 T_SEF2 Time delay for stage 2 S 0.00 60.00
0.005 1.00
Sensitive current
(SEF) (SEF)
5. 0.5In I_SEF Inv setting for inverse A
0.05In 20.00In
stage
(Normal) (Normal)
Time factor for inverse
6. 12 AK_SEF Inv S 0.001 1000
time stage
Index for inverse time
7. 1 P_SEF Inv 0.01 10.00
stage
Delay time for inverse
8. 0 BK_SEF Inv S 0.000 60.00
time stage
Characteristic angle
9. 30 Angle_SEF for U0/I0- degree 0.00 90.00
measurement
Sensitve current for
direction determination
10. 0.01 IsCOS_SEF A 0.005 1.00
of IsCos
measurement
Displacement voltage
for stage 1 of
11. 20 U_3V01 V 2.00 100.0
displacement voltage
protection
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Chapter 6 IED testing
Bit Default 0 1 Explanation
fault protection alarm or trip
Stage 2 of sensitive earth
4.5 1 SEF2 Alarm SEF2 Trip
fault protection alarm or trip
Inverse stage of sensitive
4.6 1 SEF Inv Alarm SEF Inv Trip earth fault protection alarm or
trip
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
setting list for test in this section
Binary input None
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of negative sequence
overcurrent portection are same as stage 1, only need to change the
corresponding test conditions and settings into the conrresponding stage 2
required.
86
Chapter 6 IED testing
Table 51 Current setting verifying
87
Chapter 6 IED testing
2 Verifying the settings of other phase
The test method and test items of verifying the other phase of inverse time
stage are same as phase A, only need to change the corresponding test
conditions and settings into the other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
88
Chapter 6 IED testing
Bit Default 0 1 Explanation
Stage 1 of negative sequence
4.7 1 NSOC1 Alarm NSOC1 Trip overcurrent protection alarm
or trip
Inverse stage of negative
4.8 1 NSOC Inv Alarm NSOC Inv Trip sequence overcurrent
protection alarm or trip
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
105% of the current setting verifying
OpConfig/Connect/Func_EF1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 105% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_EF1, set the connector as "On"
Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting
as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of manual reclosure
Fault type: phase A, instantanuous
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
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Chapter 6 IED testing
Test item Description
The corresponding output contacts should be closed, the operate
Test result
time meet the requirement in technical data
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
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Chapter 6 IED testing
Test item Description
95% of the current setting verifying
OpConfig/Connect/Func_OL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 95% of the setting value
Fault time: longer than the setting value
Test result The alarm should not be issued
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Chapter 6 IED testing
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
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Chapter 6 IED testing
Test item Description
OpConfig/Connect/Func_OV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as
1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Overvoltage phase: phase A
Fault simulation Overvoltage value: 120% of the setting value
Overvoltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data
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Chapter 6 IED testing
Test item Description
Overvoltage phase: phase A
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The protection function dropout
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
Overvoltage phase: phase AB
Fault simulation Overvoltage value: 95% of the setting value
Overvoltage time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
99% of the voltage setting verifying
Settings/ProtContwd/Pls Input SetGrNo/Voltage/Func_OV1, set
the binary setting as 1
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV PE, set the
Binary setting
binary setting as 0
Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV1 Trip, set
the binary setting as 1
Settings/ProtSet/Pls Input SetGrNo/Current, the detail setting list
Setting value
refer to the Reference setting list for test in this section
Binary input None
Overvoltage phase: phase AB
Overvoltage value: 120% of the setting value
Fault simulation
Overvoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The protection function dropout
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of overvoltage
protection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Table 77 Overvoltage protection function setting list
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Table 79 Voltage setting verifying
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Chapter 6 IED testing
Test item Description
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation
Current value: 200% of the setting value
Undervoltage time: longer than the setting value
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data
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Chapter 6 IED testing
Table 82 Auxiliary contact supervision verifying
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Chapter 6 IED testing
Test item Description
as 1
Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Dropout ratio: 101% of the setting value
Test result The undervoltage protection function should dropout
99% of the dropout ratio setting value
OpConfig/Connect/Func_UV1, set the connector as "On"
Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting
as 1
Binary setting Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as
1
Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Undervoltage phase: phase A
Undervoltage value: 80% of the setting value
Fault simulation Current value: 200% of the setting value
Undervoltage time: longer than the setting value
Dropout ratio: 99% of the setting value
Test result The undervoltage protection function should not dropout
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the phase-to-phase voltage
discrimination are same as phase-to-earth voltage discrimination, only need
to change the corresponding test conditions and settings into the
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Chapter 6 IED testing
conrresponding phase-to-phase voltage discrimination required.
The test method and test items of verifying the stage 2 of undervoltage
protection are same as stage 1, only need to change the corresponding test
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Chapter 6 IED testing
conditions and settings into the conrresponding stage 1 required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Bit Default 0 1 Explanation
Enable or disable the function
3.0 1 UV Chk CB Off UV Chk CB On
of checking CB status
Enable or disable the function
3.1 1 UV Chk All Phase UV Chk One Phase of checking single phase or
three phase voltage
Phase-to-phase or
3.2 1 UV PP UV PE
phase-to-earth discrimination
Stage 1 of undervoltage
4.11 1 UV1 Alarm UV1 Trip
protection alarm or trip
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Test item Description
as 1
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Chapter 6 IED testing
Test item Description
Accumulation time: for a certain time
Cooling phase:
Fault type: phase A
Fault current: 0
Accumulation time: for a certain time
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Chapter 6 IED testing
Test item Description
Test result The alarm should not be issued
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
105% of the current setting verifying
OpConfig/Connect/Func_ThermOL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation Fault current: 200% of the setting value
Fault time: longer than the time calculated by the equation
The corresponding output contacts should be closed, and the
Test result
operate time meet the requirement in technical data
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Chapter 6 IED testing
Test item Description
Test result The alarm should not be issued
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Fault simulation Displacement voltage phase: phase A
Displacement voltage value: 95% of the setting value
Displacement voltage time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
The test method and test items of verifying the stage 2 of overvoltage
protection are same as stage 1, only need to change the corresponding test
conditions and settings into the conrresponding stage 2 required.
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Chapter 6 IED testing
1.1 Verifying the low voltage setting
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Chapter 6 IED testing
Test item Description
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation Low voltage value: 80% of the low voltage setting value
Phase B: 105% of the high voltage setting value
phase C: 120% of the high voltage setting value
High voltage time: longer than the setting value
Test result The corresponding fault pahse should be reported
95% of the high voltage setting verifying
OpConfig/Connect/Func_3V01, set the connector as "On"
Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting
Binary setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: three phase-ground voltages connected to IED in
grounded wye configuration
Low voltage phase: phase A
Fault simulation Low voltage value: 80% of the low voltage setting value
Phase B: 95% of the high voltage setting value
phase C: 120% of the high voltage setting value
High voltage time: longer than the setting value
Test result The corresponding fault pahse should not be reported
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
105% of the zero-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Zero-sequence current value: 105% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the zero-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Zero-sequence current value: 95% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Negative-sequence current value: 105% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the negative-sequence current setting verifying
OpConfig/Connect/Func_CBF, set the connector as "On"
Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary
Binary setting setting as 1
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of initiation circuit breaker failure protection
CBF phase: phase A
Current value: 200% of the setting value
Fault simulation
Negative-sequence current value: 95% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Active the binary input of initiation circuit breaker failure protection
Binary input
The CB status is Off
CBF phase: phase A
Fault simulation Current value: 70% of the setting value
CBF time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the settings of other phase
protection are same as phase A, only need to change the corresponding test
conditions and settings into the conrresponding phase A required.
The test method and test items of verifying the stage 2 of CBF protection are
same as stage 1, only need to change the corresponding test conditions and
settings into the conrresponding stage 2 required.
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Chapter 6 IED testing
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
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Chapter 6 IED testing
Test item Description
The corresponding output contacts should be closed, and the
Test result
operated time meet the requirement in technical data
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
If the tester can't provide the reference voltage U4, the wiring connection is
shown in Figure 14.
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Chapter 6 IED testing
Test item Description
1 V of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: less than (rated voltage value voltage
Synchronism condition difference setting + 1 V)
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchronazation OK is issued
> 1 V of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: large than (rated voltage value voltage
Fault simulation difference setting + 1 V)
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of voltage difference failure is issued
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Chapter 6 IED testing
Test item Description
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Synchronism condition Voltage difference: 0
Frequence difference: less than (setting value + 20 mHz)
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchronazation OK is issued
> 20 mHz of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Fault simulation Voltage difference: 0
Frequence difference: large than (setting value + 20 mHz)
Angle difference: 0
Checking time: longer than the setting value
Test result The report of frequency difference failure is issued
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Chapter 6 IED testing
Test item Description
Test result The report of synchronazation OK is issued
> 3 of the setting value
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: rated voltage
Reference voltage: rated voltage
Fault simulation Voltage difference: 0
Frequence difference: 0
Angle difference: large than (setting value + 3)
Checking time: longer than the setting value
Test result The report of angle difference failure is issued
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Chapter 6 IED testing
Test item Description
Binary input Active the binary input of synchronization request
Synchro-check phase: phase A
Three-phase voltage: 120% of the setting value
Reference voltage: 95% of the setting value
Fault simulation Voltage difference: less than the voltage difference setting value
Frequence difference: 0
Angle difference: 0
Checking time: longer than the setting value
Test result The report of synchro-check failure is issued
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: rated voltage
Fault simulation
Reference voltage: 102% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check failure is issued
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Chapter 6 IED testing
Test item Description
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Voltage condition
Reference voltage: 98% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check meet is issued
102% of the setting verifying
OpConfig/Connect/Func_AR, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input of three-phase initiation reclosure
Energizing check phase: phase A
Three-phase voltage: 0
Fault simulation
Reference voltage: 102% of the setting value
Checking time: longer than the setting value
Test result The report of energizing check failure is issued
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
NO. Default Abbr. Explanation
2. On Func_MC Enable or disable the synchronization check function
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Chapter 6 IED testing
Bit Default 0 1 Explanation
Override mode
8.14 Auto-recloser
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
The test method of verifying the other short is same as shot 1, only need to
change the corresponding test conditions and settings into the
conrresponding shot 1 required.
Continue to test another function or end the test. Restore connections and
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Chapter 6 IED testing
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
17. 10 T_CB Faulty Time setting for CB faulty S 0.10 60.00
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Chapter 6 IED testing
Bit Default 0 1 Explanation
protection
Enable or disable the AR
function is initiated by stage 1
5.9 0 NSOC1 Init AR Off
of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by stage 2
5.10 0 NSOC2 Init AR Off
of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by inverse
5.11 0 NSOC Inv Init AR Off
stage of negative sequence
overcurrent protection
Enable or disable the AR
function is initiated by single
5.15 0 3P Fault Init AR 3P Fault Blk AR
phase fault or three phase
fault
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
Frequency value: 105% of the low frequency setting
Voltage value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the frequency setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 95% of the low frequency setting
Fault simulation Voltage value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
95% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 95% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Fault simulation Voltage value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Frequency value: 70% of the low frequency setting
Voltage value: 70% of the voltage checking setting
Fault simulation
Current value: 70% of the current checking seeting
dF/dt value: 95% of the setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Table 137 Low frequency load shedding protection function setting list
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Chapter 6 IED testing
Current checking setting for low
5. 0.2In I_Chk A 0 2.00In
frequency load shedding protection
Table 138 Low frequency load shedding protection binary setting list
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 105% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Voltage value: 70% of the voltage setting
Voltage checking value: 95% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the voltage checking setting verifying
OpConfig/Connect/Func_LF LS, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 105% of the voltage checking setting
Current value: 70% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Voltage value: 70% of the voltage setting
Fault simulation Voltage checking value: 70% of the voltage checking setting
Current value: 105% of the current checking seeting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Table 145 Low frequency load shedding protection function setting list
Table 146 Low frequency load shedding protection binary setting list
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Chapter 6 IED testing
Bit Default 0 1 Explanation
Enable or disable the binary
3.4 1 dF(dU)/dt Off dF(dU)/dt On
setting of dF(dU)/dt
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
1.2 Verifying the time setting
148
Chapter 6 IED testing
Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Current value: 120% of the current setting
Fault simulation
Voltage value: 105% of the voltage checking setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
1.5 Verifying the dU/dt setting
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
152
Chapter 6 IED testing
Test item Description
Test result The corresponding output contacts should be closed
95% of the voltage setting verifying
Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
95% of the current setting verifying
OpConfig/Connect/Func_UBL, set the connector as "On"
Binary setting Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Voltage value: 105% of the voltage setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Table 162 Unbalance protection function setting list
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 95% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should be closed
105% of the current setting verifying
Binary setting OpConfig/Connect/Func_UC, set the connector as "On"
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Three phase CB status is On
Fault type: phase A
Fault simulation Current value: 105% of the current setting
Fault time: longer than the setting value
Test result The corresponding output contacts should not close
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Chapter 6 IED testing
Test item Description
The corresponding output contacts should be closed, and the
Test result
inhibition time meet the requirement in technical data
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
8.20.1.1 Verifying the setting for tripping
159
Chapter 6 IED testing
8.20.1.2 Verifying the setting for alarming
160
Chapter 6 IED testing
Test item Description
Current value: 200% of the current setting
Fault time: longer than the setting value
The alarm should be issued, and the alarm time meet the
Test result
requirement in technical data
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
Test result The alarm should not be issued
Active both of the two binary input
Settings/Write/Select/Ctr Word 4/DS Faulty On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input Active the binary input DS Open and DS Close
Fault simulation Active time: longer than the setting value
Test result The alarm should be issued
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
NO. Default Abbr. Explanation Unit Min. Max.
Time setting for supervising the
1. 10 T_CB POS S 0.10 60.00
CB status
Time setting for supervising the
2. 10 T_DS POS S 0.10 60.00
DS status
Time setting for supervising the
3. 10 T_ES POS S 0.10 60.00
ES status
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
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Chapter 6 IED testing
Test item Description
95% of the zero-sequence current setting verifying
Settings/Write/Select/Ctr Word 2/CT Fail On, set the binary
Binary setting
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Fault type: phase A
Fault simulation
Fault current: 95% of the setting value
Test result The CT failure alarm is reported
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
Before starting the test, please make sure that the protection function setting
165
Chapter 6 IED testing
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
166
Chapter 6 IED testing
Test item Description
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 95% of the phase-to-earth setting value
Test result The VT failure alarm is reported
105% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the phase-to-earth setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 105% of the phase-to-earth setting value
Test result The VT failure alarm is not reported
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Chapter 6 IED testing
Test item Description
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 105% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is reported
95% of the current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 95% of the setting value
Zero/negative sequence current value: 150% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is not reported
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Chapter 6 IED testing
Test item Description
Zero/negative sequence current value: 105% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is reported
95% of the Zero/negative sequence current setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A, B, C
Voltage value: 80% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 95% of the setting value
Zero-sequence voltage: 70% of the setting value
Test result The VT failure alarm is not reported
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Chapter 6 IED testing
Test item Description
value
Test result The VT failure alarm is reported
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Solid earthed, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Fault simulation
Zero-sequence voltage value: 95% of the phase-to-earth setting
value
Test result The VT failure alarm is not reported
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
2 Isolated system
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Chapter 6 IED testing
Test item Description
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 105% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 120% of the phase-to-phase
setting value
Test result The VT failure alarm is reported
95% of the phase-to-earth voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 95% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 120% of the phase-to-phase
setting value
Test result The VT failure alarm is not reported
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Chapter 6 IED testing
Test item Description
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 105% of the phase-to-phase
setting value
Test result The VT failure alarm is reported
95% of the phase-to-phase voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
Binary setting
setting as 1
Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: no protection startup
Phase failure: phase A
Zero-sequence voltage value: 105% of the phase-to-earth setting
Fault simulation
value
Max(Uab, Ubc, Uca) Min(Uab, Ubc, Uca): 95% of the phase-to-phase
setting value
Test result The VT failure alarm is not reported
The test method and test items of verifying the other phase are same as
phase A, only need to change the corresponding test conditions and settings
into the conrresponding other phase required.
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Chapter 6 IED testing
Test item Description
Precondition: VT failure
Voltage value: 105% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Test result The information of voltage restoring should be reported
95% of the voltage setting verifying
Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary
setting as 1
Binary setting
Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary
setting as 1
Settings/Write/Select, the detail setting list refer to the Reference
Setting value
setting list for test in this section
Binary input None
Precondition: VT failure
Voltage value: 95% of the setting value
Fault simulation
Current value: 150% of the setting value
Zero/negative sequence current value: 150% of the setting value
Test result The information of voltage restoring should not be reported
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
Table 193 VT failure supervision function setting list
Before starting the test, please make sure that the protection function setting
values and parameters are correct, refer to section Introduction, Points for
attention during testing and Preparing for test in this chapter.
The test method of checking the other phase are same as phase A, only need
to change the corresponding test conditions into the conrresponding other
phase required.
Continue to test another function or end the test. Restore connections and
settings to their original values, if they were changed for testing purposes.
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Chapter 6 IED testing
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Chapter 6 IED testing
Power on the IED, the LED Run is lit steadily in green, other LEDs should be
extinguished.
After setting the date and time of the IED, power on and off the IED with five
times in short time, checking the tolerance of date and time is within the
permissible range.
Inject system currents (load current must be larger than 0.08In) and voltages
into the IED, and then check whether the magnitude, phase angle, polarity
and phase sequence of each measuring analog value are correct or not.
Checking the settings one by one of each group which are possibly used in
the actual operation modes.
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Chapter 6 IED testing
Check the state of all binary inputs. Particularly ensure that the IED is not in
test mode, meaning that the green Run LED is not flash continuously
Trip and close the circuit breaker, the corresponding feedback state of circuit
breaker injected via binary inputs should be read out and compared with the
actual state of circuit breaker, the displayed state should be in accordance
with the actual state.
9.8.1.2 Switching the circuit breaker state from remote control center
If all the checking items described above and the other checking items need to be
performed according to the site condition have been checked and correct, the IED can be
put into operation.
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Chapter 6 IED testing
178
Chapter 7 Operating maintenance
179
Chapter 7 Operating maintenance
Warning
Caution
Note
180
Chapter 7 Operating maintenance
corresponding LED in front panel will be lighted, and the event reports
will be displayed in HMI; if the autoreclosure function operate, the
corresponding LED will be lighted and the reports will be displayed in
HMI
If the alarming class I appearance during operation, stop running the IED,
record the alarm information and inform the responsible engineer, at this
time, it is not allowed to press the Reset button. If the alarming class II
appearance, record the alarm information and inform the responsible
engineer to analyse and deal with.
181
Chapter 7 Operating maintenance
2 Routine checking
Checking the LEDs status
182
Chapter 7 Operating maintenance
3 Periodical checking
Check that the inside and outside of the IED are cleanly and no ash
deposition
All components (including the chips, transformer and relay, etc.) of the
IED are fixed well, no loosing phenomenon, the IED apperance is regular
and no damage and distortion phenomenon
The buttons are operated flexibly with good feeling and fixed reliably
All the IED terminals for connection are firmd without loosing
phenomenon, and the marked number are clear and correct
Energizing the IED with DC power supply for several seconds, the green
Run LED and protection function LED that connector have been
enabled will be lighted without any alarm or operation lED lighted (if
lighted, press Reset button to reset), the analog quantities is displayed in
HMI
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Chapter 7 Operating maintenance
Information Description
RAM Error RAM is abnormal
EPROM Error EPROM is abnormal
Flash Error Flash is abnormal
BO Abnormal Binary output is abnormal
AD Error AD is abnormal
Zero Offset Zero drift is out of limitation
Invalid SetGr Pointer of setting group is error
Setting Chk ERR Setting value is error
Logic Scheme ERR Logic file and CPU file do not cooperate
Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
VT Fail VT failure in circuit of voltage transformer
V1P VT Fail VT failure in circuit of the forth voltage transformer
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
CB Not Ready BI2 is active to indicate CB is not ready
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz
184
Chapter 7 Operating maintenance
Information Description
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
Negative sequence overcurrent protection stage 1 issues an alarm
NSOC1 Alarm
signal
Negative sequence overcurrent protection inverse stage issues an
NSOC Inv Alarm
alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal
3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal
PhA Grounded Phase A is grounded
PhB Grounded Phase B is grounded
PhC Grounded Phase C is grounded
UV1 Alarm Undervoltage protection stage 1 issues an alarm signal
OV1 Alarm Overvoltage protection stage 1 issues an alarm signal
Therm OL Alarm Thermal overload protection issues an alarm signal
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1
Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal
185
Chapter 7 Operating maintenance
Information Description
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1
Information Description
File ERR Read configuration files wrong
BIO OUT ERR Fail to response the BO in BIO module
BIO COM ERR Communication failure in BIO module
GOO_A_COMMU_ERR Communication failure in GOOSE A
GOO_A_CFG_ERR Configuration failure in GOOSE A
GOO_B_COMMU_ERR Communication failure in GOOSE B
GOO_B_CFG_ERR Configuration failure in GOOSE B
VT Fail VT failure in circuit of voltage transformer
V1p VT Fail VT failure in circuit of the forth voltage transformer
CB Faulty 3Ph CB Open and 3Ph CB Close are both active or inactive
DS Faulty DS Open and DS Close are both active or inactive
ES Faulty ES Open and ES Close are both active or inactive
Trip Fail Trip command is issued lasting for more than 9s
MMI Com Fail Communication failure between HMI and CPU module
Frequency difference measured from software and hardware is
Frequency Differ
0.5Hz
OC1 Alarm Overcurrent protection stage 1 issues an alarm signal
OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal
EF1 Alarm Earth fault protection stage 1 issues an alarm signal
EF Inv Alarm Earth fault protection inverse stage issues an alarm signal
SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal
SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal
SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal
3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal
3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal
PhA Grounded Phase A is grounded
PhB Grounded Phase B is grounded
PhC Grounded Phase C is grounded
UV1 Alarm Undervoltage protection stage 1 issues an alarm signal
OV1 Alarm Overvoltage protection stage 1 issues an alarm signal
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Chapter 7 Operating maintenance
Information Description
UBL Alarm Unbalance protection issues an alarm signal
OL Alarm Over load protection issues an alarm signal
Inhibit close Drive a contact to inhibit reconnection of capacitor
CT Fail Failure in circuit of current transformer
BI Set SetGr2 Setting group switches to 1 when binary input is 0
BI Set SetGr1 Setting group switches to 2 when binary input is 1
187
Chapter 7 Operating maintenance
188
Chapter 8 Transportation and storage
189
Chapter 8 Transportation and storage
1 Transportion
The IED can be transported by means of conveyance, such as car, train, ship,
etc. In order to ensure the perfect performance of the IED, prevent the IED
from rain, snow, vibration, shock and bump.
190
Chapter 8 Transportation and storage
2 Storage
If the IED is to be stored before installation, this is must be done in the original
transport casing in a dry and dust free place. The packed IED should be
stored in a waterproof and snow proof place without acid or alkaline or other
corrosive gas and explosive gas. The storage temperature is from -25C to
+40C, and the relative humidity does not exceed 80%. Observe the
environmental requirements stated in the technical data.
191
Chapter 8 Transportation and storage
192
Chapter 9 Appendix
Chapter 9 Appendix
193
Chapter 9 Appendix
194
Chapter 9 Appendix
2 Typical diagram
backup protection
Figure 16 Application of feeder protection to measure three phase and earth currents
195
Chapter 9 Appendix
Figure 17 Application of feeder protection to measure three phase and earth currents and three phase
voltages (bus side)
Figure 18 Application of feeder protection to measure three phase and earth currents and three phase
voltages (line side)
196
Chapter 9 Appendix
A
B
C
AIM2
U01
UA
U02
UB
U03
UC
U04
UN
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
Figure 19 Application of feeder protection to measure three phase and earth currents and single phase
voltage (Ph-Ph) (bus side)
197
Chapter 9 Appendix
A
B
C
AIM2
U01
UA
U02
UB
U03
UC
U04
UN
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
Figure 20 Application of feeder protection to measure three phase and earth currents and single phase
voltage (Ph-E) (bus side)
198
Chapter 9 Appendix
A
B
C
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
AIM1
I01
*
I1
I02
Figure 21 Application of feeder protection to measure three phase currents, earth current, and
sensitive earth current
199
Chapter 9 Appendix
Figure 22 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and three phase voltages (bus side)
200
Chapter 9 Appendix
A
B
C
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
AIM2
U01
UA
U02
UB
U03
UC
U04
UN
AIM1
* I01
I1
I02
Figure 23 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and three phase voltages (line side)
201
Chapter 9 Appendix
Figure 24 Application of feeder protection to measure three phase currents, earth current and sensitive
earth current, and single phase voltage (Ph-Ph) (bus side)
202
Chapter 9 Appendix
Figure 25 Application of feeder protection to measure three phase currents, earth current, and
sensitive earth current, and single phase voltage (Ph-E) (bus side)
203
Chapter 9 Appendix
Figure 26 Application of transformer backup protection to measure three phase currents, earth
current, and neutral current
204
Chapter 9 Appendix
Figure 27 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and three phase voltages (bus side)
205
Chapter 9 Appendix
A
B
C
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
AIM2
U01
UA
U02
UB
U03
UC
U04
UN
AIM1
* I01
I02 I1
Figure 28 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and three phase voltages (line side)
206
Chapter 9 Appendix
A
B
C
AIM2
U01
UA
U02
UB
U03
UC
U04
UN
AIM2
I01
I02 IA
I03
I04 IB
* * * I05
I06 IC
I07
I08 IN
AIM1
* I01
I02 I1
Figure 29 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and single phase voltage (Ph-Ph) (bus side)
207
Chapter 9 Appendix
Figure 30 Application of transformer backup protection to measure three phase currents, earth current
and neutral current, and single phase voltage (Ph-E) (bus side)
208
Chapter 9 Appendix
209
Chapter 9 Appendix
210
Chapter 9 Appendix
Figure 33 Typical connection for capacitor bank unbalanced current protection with three current
inputs
Figure 34 Typical connection for capacitor bank unbalanced voltage protection with three voltage
inputs
211
Chapter 9 Appendix
Figure 35 Typical connection for capacitor bank unbalanced current protection with one current input
Figure 36 Typical connection for capacitor bank unbalanced voltage protection with one voltage input
212
Chapter 9 Appendix
Figure 38 Neutral current differential protection
for grounded Split-Wye capacitor bank
A
B
C
213
Chapter 9 Appendix
Figure 46 Three unbalanced voltages detection
for Capacitor Bank
A
B
C
U1
214
Chapter 9 Appendix
215