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 PROCESS CAPABILITY

Process capability is defined as 60

Three ways process capability can be obtained are :

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Defining process capability
Process capability refers to the ability of the
process to meet the specifications set by the
customer or designer.
A critical performance measure which addresses
process result w.r.t. product specification.

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 Caution !
A process must be in statistical control before its
capability is measured.

Processes out of control fluctuate and thus are

unpredictable; trying to measure their
capability would lead to misleading
conclusions.

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Evaluation of process capability

It is critical to understand that:

1. Process specification pertain to individual item
quality characteristics
2. Capability indices pertain to population of
individual items
3. Subgroup based control chart limits pertain to
only the population of the subgroup NOT to the
population of individual items.

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 Process capability analysis
Objective is to determine how well the output
from a process meets specification limits
Compare total process variation and
tolerance.

LSL USL

-3 +3
Target
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 Process Capability Index (Cp)
The capability index measures whether the process or
machine can produce pieces which conform to the
specifications.
The larger the index, the more likely the process will
generate conforming parts or pieces provided that the
process is centred at the nominal or target value. (CP >=
1.33)

CAUTION : The capability index does not indicate process performance

in terms of the nominal or target value.

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 Process Capability Index
The Process Capability Index (Cpk) differs from the Cp in that it indicates if the
process mean has shifted away from the design target, and in which
direction it has shifted that is, if it is off center.
If the Cpk index is greater than 1.00 then process is capable of meeting
design specifications. If Cpk is less than 1.00 then process mean has moved
closer to either upper or lower design specifications, and generate defects.
When Cpk equals Cp, this indicates that the process mean is centered on the
design (nominal) target.

X LTL UTL - X
C pk = min or

3 3
where
x-bar is the mean of the process
sigma is the standard deviation of the process
UTL is the customers upper tolerance limit (specification)
and LTL is the customers lower tolerance limit

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Calculating process capability
indices
Process capability indices: ratios that quantify
the ability of a process to produce within
specifications
Two common indices are:
The Cp index
-the inherent or potential inherent measure of capability
The Cpk index

- a realizes or actual measure of capability

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 Relationship of Process
Capability to Specification Limits
Three situations:
1. 6 0 =USLLSL Case I
2. 6 0 >USLLSL Case II
3. 6 0 <USLLSL Case III

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Interpreting the Process Capability Index

Cpk < 1 Not Capable

Cpk > 1 Capable at 3

Cpk > 1.33 Capable at 4

Cpk > 1.67 Capable at 5

Cpk > 2 Capable at 6

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 Process Capability Index (Cp)
(Process Potential Index --Text)
Process Capability and the specification limits (i.e., tolerances) are
combined to form a Capability Index:

Cp = USL- LSL
6 0

If Cp < 1.00 Case III

If Cp = 1.00 Case II

If Cp > 1.00 Case I

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 Process Capability Index (Example)

A process has a mean of 45.5 and a standard deviation of 0.9. The

product has a specification of 45.0 3.0. Find the Cpk .

X LTL UTL - X
C pk = min or

3 3

= min { (45.5 42.0)/3(0.9) or (48.0-45.5)/3(0.9) }

= min { (3.5/2.7) or (2.5/2.7) }

= min { 1.30 or 0.93 } = 0.93 (Not capable!)

However, by adjusting the mean, the process can become capable.

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Individual values compared with
averages
When distributions of averages are compared to
distributions of individual values, the averages
are grouped closer to the center value than are
the individual values, as described by the central
limit theorem.
What does this imply for averages in control
limits versus individual values in specification
limits?

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To simplify calculation
If the process can be assumed to be normal, the
population standard deviation can be estimated
from either the standard deviation associated
with the sample standard deviation or the range:

S
R
or
d 2 c 4
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Control limits and specification
limits
X-bar charts do not reflect how widely the
individual values composing the plotting averages
spread.
The spread can only be seen by observing what is
happening on the s or r chart.

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The Six sigma spread versus
specification limits
Case I: 6 < USL - LSL
Most desirable; individual values fall within specification
limits
Case II: 6 = USL - LSL
Okay, as long as the process remains in control
Case III: 6 > USL - LSL
Undesirable; process incapable of meeting specifications

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Potential capability (Cp index)
Measure inherent capability of production
process
Defined as

Cp =Upper Spec limit Lower Spec Limit

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The estimated index= ^Cp

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 Actual Capability (Cpk index)
Measure realized capability relative to actual
production (assuming process is stable)
Define as:
Cpk =minimum { (- LSL)/3 , (USL -)/3 }

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 Another measure of process capability (Cpk)
(Process Performance Index

This measure takes into account the centring of the process. We first
obtain two one-sided indexes, then select the minimum of the two.

This measure takes into account the centring of the

process.

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 The Six sigma spread versus
specification limits
Case I: 6 < USL - LSL
Most desirable; individual values fall within specification
limits
Case II: 6 = USL - LSL
Okay, as long as the process remains in control
Case III: 6 > USL - LSL
Undesirable; process incapable of meeting specifications

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Illustration

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23
Illustration contd

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Illustration contd

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compiled by amir Yazid 26
 Recommended minimum value of
Process Capability Ratio

Two sided One sided

specification specification
Existing process 1.33 1.25
New process 1.50 1.45
Safety , strength or critical parameters 1.50 1.45
for existing process
Safety , strength or critical parameters 1.67 1.60
for new process

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 Motorolas Six Sigma Concept

With the process centred exactly in the middle (nominal dimension), only
2 defectives out of one billion are expected.

If the process mean shifts 1.5 sigma, the expected number of defectives
will be 3.4 per million.
 In-class exercise (ICE)
What is the key to achieving six-sigma
capability?