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Abstract
It is important that a plant does not encounter spurious trips,
therefore disrupting process and losing time and money. Even
more important is preventing the occurrence of an accident that
could result in a loss of a plant, damage to the environment, or
even loss of life.
This webinar will discuss how calculating the spurious trip rate
is important and what can be done with that number (saving
time and money). It will also cover dangerous detected failures,
and how those play a part in the Safe Failure Fraction
calculation and how they are compared to spurious trips. How
simple mechanical devices and/or final elements can still
partake in SIL ratings by means of the 2H method of evaluation
without adding additional safe failures will also be presented.
5
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exida Certification
exida has established schemes for
functional safety and cybersecurity
certification of Systems, Products,
Components, and Personnel.
Functional Safety Certification
involves a detailed analysis of both
the engineering process and design
margins resulting in random failure
rate in all failure modes.
Cybersecurity Certification involves a
detailed analysis of the engineering
process, cyber defense mechanisms,
and network robustness.
Reference Materials
Topics
Safe failures: Friend of Foe?
How to use the safe failure rates to your benefit
How Dangerous Detected Failures effect your plant
Calculations using Safe and Dangerous Detected Failure
rates
How simple mechanical devices or final elements can still
participate in SIL with low or no safe failures
2H: What is it, who should use it and how?
D=4.12E-08
HW Compliance Routes
7.4.4 the highest safety integrity level that can be claimed for a safety function is limited by
the hardware safety integrity constraints which shall be achieved by implementing one of two
possible routes:
Route 1H based on hardware fault tolerance and safe failure fraction concepts
(as in the previous release)
or What is this safe failure fraction metric?
Route 2 H based on component reliability data from feedback from end users, increased
confidence levels and hardware fault tolerance (similar to IEC 61511) for specified
safety integrity levels;
SIL4: HFT = 2; Type B : DC >= 60%
SIL3: HFT = 1; Type B : DC >= 60%
SIL2: High demand and continuous mode : HFT = 1; Type B : DC >= 60%
SIL2: Low demand : HFT = 0; Type B : DC >= 60%
7.4.4.3.3 If route 2 H is selected, then the reliability data uncertainties shall be taken into
account when calculating the target failure measure (i.e. PFD avg or PFH) and the system shall
be improved until there is a confidence greater than 90 % that the target failure measure is
achieved.
SD + SU + DD
SFF = SD
+ SU + DD + DU
SFF is defined as the ratio of (the rate of safe failures plus
dangerous failures detected by automatic diagnostics) to
(the total average failure rate) of the subsystem. It is the %
of failures that can be considered safe. It is defined for a
single channel (no redundancy, 1oo1).
SD + SU + DD
SFF = SD
+ SU + DD + DU
Product Types
2H Route
2H Route continued
1 0
2 0
3 1
No SFF 4 2
1 0
2 0
3 1
4 Special requirements apply (see IEC 61508)
exidas 2H database
Summarizing all data collected to date through assessments.
1B + hours on about 50% of the components on the mechanical database
Total of 100 B operating hours collected
ExSILentia Example
Final Element
main
contributor
1311 FITS
87 years MTTF Improve reliability
by implementing
diagnostics