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Debapratim Ghosh
deba21pratim@gmail.com
The first three words Metal Oxide Semiconductor describes the layer-wise
structure of the device.
The last three words Field Effect Transistor describes the principle of
operation.
Metal
Oxide
Semiconductor
p-sub
VG < 0
+++++++++++++++ E-field
--------
Weak E-field
E-field
----------------
The work-function difference between the gate and the silicon substrate (this
leads to the flatband voltage).
The gate voltage component required to bring about surface inversion
(surface just below the oxide).
The concentration of acceptor ions in the substrate.
The concentration of trapped charges inside the oxide.
The substrate voltage (so far weve assumed it to be ground).
Note:
The threshold voltage VTN for NMOS is positive.
The threshold voltage VTP for PMOS is negative.
Debapratim Ghosh Dept. of EE, IIT Bombay 7/20
Basics of the MOSFET
The MOS Transistor
The MOSFET Operation
Operating Regions of the MOSFET
The Experiment
n+ n+
p-substrate
Body (B)
n+ n+
+
n channel
Now for a given VGS , plot a graph of ID v/s VDS as you increase VDS ,
starting from 0V. At what value of VDS is the ID maximum?
n+ n+
n+ L n+
L
We now have ! !
1 n Cox W
ID = (VGS VTN )2 (3)
1 L
L
2 L
p
It can also be shown that, L VDS VDS,sat . Using power series, we get
L
1 = 1 VDS
L
Assuming VDS 1, equation (3) now becomes
!
n Cox W
ID = (VGS VTN )2 (1 + VDS ) (4)
2 L
Clearly, the decrease in channel length causes ID to be linearly varying with VDS !
This is called channel length modulation, and is a critical issue in IC design.
2. Current flows due to both electrons 2. Current flows due to one type of
and holes (bipolar) carrier (unipolar)
C D
B G B
E S
An n-p-n BJT An n-channel MOSFET
Debapratim Ghosh Dept. of EE, IIT Bombay 14/20
Threshold Voltage
Basics of the MOSFET
Output DC Characteristics
The MOSFET Operation
Input Characteristics in Saturation
The Experiment
Output Small Signal Characteristics
Experiment- Part 1
In this part, we will measure the NMOS threshold voltage. We will use the IC
CD4007.
Connect the NMOS substrate to ground, and the PMOS substrate to VDD .
We will operate the NMOS in the linear region. Apply a small VDS of around
0.25 V and keep it constant for a set of ID v/s VGS readings.
Vary VGS from 0 to VDD and note ID .
RG ID
RD
+
VGG + + VDS + V
DD
VGS -
-
ID
VGS
Extrapolating the linear portion of the plot to find the intercept on the VGS axis
gives us VTN .
Experiment- Part 2
VDS
This plot will help you find the Early Voltage VA . How?
Experiment- Part 3
In this part, we look at the ID VGS relationship for an NMOS in the
saturation region.
We make VGS < VDS . This ensures that VDS > VGS VTN .
We know that in the saturation region, ID = k2n (VGS VTN )2 .
What kind of an ID v/s VGS plot do you expect?
RD
RG ID
+ V
+ DD
VGS
-
Experiment- Part 4
In this part, we will measure the small signal transconductance gm of the NMOS,
defined as
id
gm = (5)
vgs
VDS
Here, id and vgs are small-signal quantities. Measure gm using the circuit shown.
Bias the NMOS in saturation with VGS = 2V and VDS = 5V.
Now apply a sine wave and find out the voltage gain Av = Vout /Vin . Also,
Av = gm RD . From this you can find the unknown gm .
VDD
RG RD
Vout
Vin
* Bring out some differences between a BJT and a MOSFET, other than the
ones mentioned in this document.
* Rather than using a metal for the gate, the contemporary VLSI industry uses
a material called polysilicon. What is it and what advantages does it offer
over using a metal for the gate?
* Suppose we take a different approach to measuring gm than the one
explained. Partially differentiating equation (2) w.r.t VGS , we find
gm = kn (VGS VTN )
Eliminating kn , we get
2ID
gm =
(VGS VTN )
Is this procedure correct? What differences do you expect to find between the
values of gm calculated by these 2 methods?