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Electrometallurgy Laboratory, Central Metallurgical R&D Institute, CMRDI, PO Box 87, Helwan, Cairo, Egypt
Received 3 October 2001; accepted 12 November 2001
Abstract
The electrochemical behaviour of chalcopyrite has been studied in sulphuric acid solutions with the carbon paste electrode
technique. Cyclic voltammetry were performed and the eect of cathodic scan limit, Fe2 and Cu2 ion concentrations were fol-
lowed. The presence of Cu2 ions in solutions leads to an increase in both the oxidation and the reduction currents, but in either case
further increases in currents were observed when Fe2 ion was added in admixture to the electrolyte. Chalcocite was identied as a
product of reactions at extremely high cathodic potentials. The morphology and structure of the produced products after anodic or
cathodic treatments of chalcopyrite were examined by the scanning electron microscopy. 2002 Elsevier Science Ltd. All rights
reserved.
2Cu2 S 4H 4e 4Cu 2H2 S 6 the corresponding reduction products are deposited on
the surface.
The positive return scan curves after reversing the po- Fig. 3 depicts the voltammetric response obtained
tential sweep at the aforementioned cathodic limits of when the potential is initially scanned cathodically.
)500, )1000 and )1250 mV were recorded. When the Curve 1 represents the voltammogram when the ca-
potential sweep is reversed at )500 mV, curve 1 in Fig. thodic scan limit is )1000 mV and curve 2 represents the
2, the products of cathodic reduction resting at the cathodic scan limit )1250 mV. The cathodic current
surface are oxidized, and an anodic peak A2 appears on peak C1 becomes much smaller as compared with Fig. 2.
the anodic scan at )70 mV. This peak corresponds to This corresponds perhaps to slight deviations in stoi-
the oxidation products produced during the cathodic chiometry in the freshly prepared natural chalcopyrite
sweep. It reects the oxidation of the formed bornite on electrode. The potential region associated with the
the surface according to the reaction (Kuzeci and bornite to chalcocite transition appears poorly dened
Kammel, 1988): in the voltammogram, where ill-dened cathodic peaks
Cu5 FeS4 xCu2 Cu5x FeS4 2xe 7 C2 and C3 appear as the potential progresses towards
the cathodic direction in the rst cycle. This may be
The shape of peak A2 could imply several electro- attributed to the absence of the oxidation products of
chemical reactions. Then at a more positive potential, chalcopyrite formed during the started positive scan as
peak A10 is developed. The peak A10 , that overlaps with seen in Fig. 2. Also, it may be due to the formation of
the rst oxidation A1, is attributed to the oxidation of some passive lm on chalcopyrite surface produced
the non-stoichiometric sulphides being decient in cop- chemically before starting the run and electrochemically
per (Kuzeci and Kammel, 1988; Lu et al., 2000). at such lower potentials (Warren et al., 1982). On the
Whereas, if the potential sweep is inverted at )1000 return scan, poorly dened anodic peaks are obtained,
mV, curve 2, poorly dened anodic peaks A4 and A3 whereas, the anodic peak A10 markedly appears. As the
appear on the anodic scan between )620 and )400 mV. scan in Fig. 3, curve 1 is continued the cathodic current
They reect the oxidation of the formed Cu2 S and H2 S is increased during the second cathodic cycle. This is
to elemental sulphur, respectively, according to (Warren likely due to the oxidation of the more refractory chal-
et al., 1985; Price and Warren, 1986; Kuzeci and Kam- copyrite. The oxidation products, intermediate phases,
mel, 1988; Lu et al., 2000): may inuence the shape of the dissolution curves.
Cu2 S Cu2x S xCu2 2xe 8 If the cathodic limit potential is increased to )1250
0 mV, Fig. 3, curve 2, there is a new cathodic current
H2 S S 2H 2e 9
contribution. The reduction at such higher potential,
The oxidation potential region associated with oxidation which may be partially due to the evolution of hydrogen
of Cu2 S and H2 S appears poorly dened in the vol- at the electrode surface, allows the cathodic products to
tammogram. Peak A2 shifts slightly towards less posi- be monitored during the subsequent anodic sweep. On
tive potential. It is related also to the reverse oxidation the reverse anodic scan the anodic peaks are markedly
of electrodeposited copper. developed during the positive-going potential scan. The
On reversing the sweep potential at )1250 mV, curve predicted oxidation peaks A5, A4, A3 and A2 appear at
3, the aforementioned anodic peaks are clearly observed. )850, )450, )200 and )60 mV, respectively, indicating
Peak A2 is enlarged and cover the potential range from that most of the chalcopyrite has been reduced to
)150 to 0 mV, and the peaks A3 and A4 are clearly chalcocite.
observed. Most characteristic is the appearance of the
anodic peak A5 at )860 mV, which is probably due to 3.2. Eect of ferrous ion and cupric ion concentrations
the formation of Cu2 S through the anodic reaction of
deposited copper and H2 S (Lu et al., 2000): 3.2.1. Eect of Fe2
When chalcopyrite is leached, Fe2 is produced as
2Cu H2 S Cu2 S 2H 2e 10
one of the reaction products. Therefore, it is important
A5 only appears when the cathodic limit is greater than to study the eect of Fe2 ions on the leaching process.
the potential range of peak C3. Cyclic voltammograms for the chalcopyrite-CPE in the
Fig. 2 shows the dependence of the anodic current presence and absence of dierent concentrations of fer-
prole on the negative potential limit. It is clearly rous ion, (015 g l1 ), in 100 g l0 1 H2 SO4 solutions
observed that the height of the anodic current peak and are shown in Fig. 4.
the corresponding peaks potential depend on the On addition of Fe2 ions the OCP is shifted to more
cathodic limit of the potential excursion. The anodic positive potentials and the current increases in the pas-
current during the positive return scan increases with the sive region. This may be attributed to an additional
increase of the cathodic scan limit. The increase of the oxidation reaction of ferrous to ferric ions at the chal-
peak height on the anodic scan in this system means that copyrite surface. On going further towards the anodic
A.E. Elsherief / Minerals Engineering 15 (2002) 215223 219
Fig. 4. Cyclic voltammograms of chalcopyrite-CPE in 100 g l1 Fig. 5. Cyclic voltammograms of chalcopyrite-CPE, started positive,
H2 SO4 , in the presence of dierent concentrations of Fe2 : (1) 0 g l1 ; in 100 g l1 H2 SO4 , in the presence of dierent concentrations of
(2) 5 g l1 ; (3) 10 g l1 and (4) 15 g l1 , at 20 C, 20 mV s1 . Cu2 : (1) 0 g l1 ; (2) 2 g l1 ; (3) 4 g l1 and (4) 8 g l1 , at 20 C,
20 mV s1 .
Fig. 9. (a) Currenttime curves representing the: (1) reduction at )900 mV, and (2) oxidation at 550 mV, of chalcopyrite-CPE in 100 g l1 H2 SO4 , at
20 C. (b) Cyclic voltammograms of chalcopyrite-CPEs that result after potentiostatic treatments: (1) reduction at )900 mV, and (2) oxidation at 550
mV, in 100 g l1 H2 SO4 , at 20 C, 20 mV s1 .
Fig. 9(b), curve 1, depicts the voltammetric response versa. This indicates that the cathodic treatment of the
obtained for the potentiostatically assisted chalcopyrite. anodically polarized chalcopyrite electrode permits the
After applying the cathodic constant potential, )900 mV reactivation of the anode surface.
for 5 min, the scan potential is initiated from )1000 mV
in the positive direction. The potential sweep towards 3.4. Morphology of the reaction products
the positive potential side presents three well-dened
and merged peaks A4, A3 and A2 at the region potential The morphology of the reaction product was deter-
from )450 to 0 mV, respectively. In this case, it is pos- mined on a polished surface of massive chalcopyrite
sible to establish that these peaks involve the oxidation mineral after the anodic and cathodic treatments at 550
processes of the reduction products obtained during the and )900 mV, respectively. The leaching samples were
potentiostatic reduction process. They are likely due to thoroughly water-washed and air-dried at room tem-
the already formed chalcocite when the potential is perature before inspection under SEM.
moved rapidly in the negative direction upon applying After 1 h of anodic leaching at 20 C in 100 g l1
the cathodic constant potential )900 mV. These peaks H2 SO4 solutions at 550 mV, the scanning electron mi-
are similar to those described on curve 2 in Fig. 8. The crographs show that the chalcopyrite surface have an
voltammogram in Fig. 9(b) shows that the nal state of etched appearance. As is clear in Fig. 10(a), the surface
chalcopyrite is similar to that obtained by means of is roughened by leaching and this nding indicates an
cathodic reduction in the presence of Cu2 and Fe2 ions increase in the eective reaction surface area. On the
in solution. other hand, particles of elemental sulphur appear in the
Anodic polarization of chalcopyrite-CPE was carried leached regions, which cause a decrease of the amount
out at constant anodic potential equal to 550 mV. The of active sites. Fig. 10(b), shows that many sulphur
results are given on curve 2 in Fig. 9(a). The application particles occur preferentially around edges. The SEM
of a positive potential pulse produces an anodic current indicates that the elemental sulphur product formed on
response due to the oxidation of the electrode. This the surface of chalcopyrite during dissolution exhibits
current subsequently decays with time to a steady-state dumbly structure and it is non-protective.
value. A steady-state passive current is obtained after 2 When the chalcopyrite massive electrode was cathod-
min. ically leached at 20 C in 100 g l1 H2 SO4 solutions at
Fig. 9(b), curve 2, taken after anodic polarization at )900 mV, the surface shows great evidence of attack and
550 mV for 5 min, shows peculiarities; the cathodic most of the surface is covered with cracked layer. An in-
processes are greatly observed. The peaks C1, C2 and C3 dication of the physical structure and mode of formation
are considerably higher than the analogous ones of Fig. of the solid reduction product is given in Fig. 11(a), which
3, and they are moved in the negative direction. This shift shows crack and ssures during electrolysis. This texture
in the active direction suggests that after anodic treat- is caused by the change in molar volume as chalcopyrite
ment of chalcopyrite there is an increase in reduction transforms to chalcocite and copper decient sulphide
rate. The denition of the negative-going potential CV CuS. The details of the surface morphology are shown in a
prole is improved by running the CV with an electrode, highly magnied photograph, Fig. 11(b), which shows
which has been previously anodically polarized, and vice colloidal, cracked surface and corrosion pits.
222 A.E. Elsherief / Minerals Engineering 15 (2002) 215223
Fig. 10. The SEM after the chalcopyrite massive electrode was polarized at 550 mV for 1 h, in 100 g l1 H2 SO4 , at 20 C: (a) 2000 ; (b) 2000 .
Fig. 11. The SEM after the chalcopyrite massive electrode was polarized at )900 mV for 1 h, in 100 g l1 H2 SO4 , at 20 C: (a) 350 ; (b) 2000 .
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