T150 Users Manual

Keysight UTM T150
User’s Guide
Notices
© Keysight Technologies 2012, 2014 Manual Part Number licensed as “Commercial computer soft-
ware” as defined in DFAR 252.227-7014
No part of this manual may be reproduced TTA-11765-3 (June 1995), or as a “commercial item” as
in any form or by any means (including
defined in FAR 2.101(a) or as “Restricted
electronic storage and retrieval or transla-
tion into a foreign language) without prior
Edition computer software” as defined in FAR
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agreement and written consent from Key- Revision B, August 2014 agency regulation or contract clause. Use,
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Printed in USA duplication or disclosure of Software is
States and international copyright laws.
subject to Keysight Technologies’ standard
Keysight Technologies commercial license terms, and non-DOD
1400 Fountaingrove Parkway Departments and Agencies of the U.S.
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Restricted Rights as defined in FAR
Warranty 52.227-19(c)(1-2) (June 1987). U.S. Govern-
ment users will receive no greater than
The material contained in this doc- Limited Rights as defined in FAR 52.227-14
ument is provided “as is,” and is (June 1987) or DFAR 252.227-7015 (b)(2)
subject to being changed, without (November 1995), as applicable in any
notice, in future editions. Further, technical data.
to the maximum extent permitted
by applicable law, Keysight dis- Safety Notices
claims all warranties, either
express or implied, with regard to CAUTION
this manual and any information
contained herein, including but not A CAUTION notice denotes a
limited to the implied warranties of hazard. It calls attention to an
merchantability and fitness for a operating procedure, practice,
particular purpose. Keysight shall
or the like that, if not correctly
not be liable for errors or for inci-
dental or consequential damages in performed or adhered to, could
connection with the furnishing, use, result in damage to the product
or performance of this document or or loss of important data. Do not
of any information contained proceed beyond a CAUTION
herein. Should Keysight and the notice until the indicated
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conditions are fully understood
ment with warranty terms covering
the material in this document that and met.
conflict with these terms, the war-
ranty terms in the separate agree- WAR NING
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The hardware and/or software described operating procedure, practice, or
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Read This First
Read This First

Warranty
Keysight warrants Keysight hardware, accessories and supplies against
defects in material and workmanship for a period of one year from date
of shipment. If Keysight receives notice of such defects during the
warranty period, Keysight will, at its option, either repair or replace
products which prove to be defective. Replacement products may be
either new or like-new.
Keysight warrants that Keysight software will not fail to execute its
programming instructions for the period specified above due to defects
in material and workmanship when properly installed and used. If
Keysight receives notice of such defects during the warranty period,
Keysight will replace software media which does not execute its
programming instructions due to such defects. For detailed warranty
information, see back matter.
Safety Considerations
• General - This product and related documentation must be reviewed
for familiarization with these safety markings and instructions before
operation.
This product is a safety Class I instrument (provided with a
protective earth terminal).
• Before Applying Power - Verify that the product is set to match the
available line voltage and the correct fuse is installed.
• Before Cleaning - Disconnect the product from operating power
before cleaning.
• Safety Earth Ground - An uninterrupted safety earth ground must
be provided from the main power source to the product input wiring
terminals or supplied power cable.
Specifications
Environmental Conditions
Temperature (Operating): 5 to 40 °C
Temperature (Non-operating): -40 to 70 °C
Relative Humidity (Operating): 15 to 95 % relative, non-condensing
Altitude: 2000 m
TTA-11765-3 Keysight UTM T150 User’s Guide 3

Read This First
Power Requirements
100/120/220/240 VAC, 50/60 Hz
Mains supply voltage fluctuations are not to exceed 10 % of the nominal
supply voltage.
These specifications apply to the Keysight Nano UTM system, and do not
NOTE
guarantee the function of an experiment in these conditions.
Equipment Class I, Pollution Degree 2, Installation Category II.

This equipment is for indoor use only.
Disclaimers
This User’s Guide, as well as the hardware herein described, is licensed
and can only be used in compliance with such terms and agreements as
entered in by Keysight Technologies. Users of these products
understand, except where permission is given by Keysight Technologies
by said license, no part of this manual may be copied, transmitted,
stored in a general retrieval system, in any form or means, electronic, or
mechanical, without prior written permission of Keysight Technologies.
Information contained herein this User’s Guide is for general
information use only. Information is subject to change without notice.
Information should not be construed as a commitment by Keysight
Technologies. Furthermore, Keysight Technologies assumes no
responsibility or liability for any misinformation, errors, or general
inaccuracies that may appear in this manual.

Read This First
Contact Information
Keysight Technologies
4330 W. Chandler Blvd., Chandler, Arizona 85226-4965 U.S.A.
Tel: +1.480-756-5900 Fax: +1.480-756-5950
E-mail: NIO_SALES@keysight.com
Web: www.keysight.com
Customer Technical Support
1-800-844-6266
1-865-425-0566
Support Email: nanomechtech@keysight.com
Distributors and Account Representatives

Please visit our web site for up-to-date information:
http://www.keysight.com/find/nanoindenter

Read This First
Table of Contents
I Read This First

Specifications 3
Disclaimers 4
Contact Information 5
II Table of Contents
1 Introduction
Your UTM T150 System 12
Keysight Technologies 14
A Word About Us 14
Company History 14
Contacting Keysight Technologies 14
Training Session 16
2 Quick Start Guide

Getting a Test Started 19
Performing a Test 21
System Overview 26
Specifications of the T150 System 33
3 Keysight UTM T150 Components

Components 35
Bellows Cover 35
Column Protective Tube 35
Continuous Dynamic Analysis 36
Copper AWG 48 36
Crosshead Assembly 37
Data Acquisition/Control 38
Extension Axis 38
Keysight UTM T150 User’s Guide 6

Read This First
Fixed Debris Shield 39

Gantry 40
Gear Motor 41
Grips 41
Jam Nuts 42
Limit Switches 43
Locking Pins 44
Lower Frame Handle 45
Micropositioner 46
NMAT 47
Phase Lock Amplifier 48
Rubber Frame Feet 48
Sheet Metal Covering 48
Shielded Shaft Extension 50
T150 Calibration Kit 51
Total System 52
Upper Frame Handle 53
User’s Kit 54
4 Commonly Used Procedures

Mounting the Pin Hook Grips 58
Mounting the Template Grips 61
Mounting a Sample Prior to Testing 65
Method One: Template Technique 65
Method Two: Wrapping Technique 67
Crosshead Adjustment 74
Adjusting the Limit Switches 76
Horizontal and Vertical Configuration 77
Removing the Debris Shield 78
Tightening the Jam Nuts 79
Determining Frame Stiffness Using ASTM Test Method 80
Prepare the Samples 80
Perform the Test 80
Verifying Quasistatic Performance 89
Grip Alignment 89
Low Stiffness Spring Test 92
High Stiffness Spring Test 93

Read This First
5 Theory
How It Works 96
Large Strain Testing 96
Small Strain Testing 96
Instrument Theory 97
UTM vs. Traditional Tensile Testing 97
NMAT 98
PID Control 103
Extension Axis 104
Operational Theory 106
Sample Geometry 106
Grip Faces 106
Grip and Specimen Alignment 106
Slack Removal 107
Contact Detection 107
Stress Concentration 107
6 NanoSuite
NanoSuite and Windows 111
Software Compatibility 111
Upgrades and Service Packs 111
Networks and Virus Protection 111
NanoSuite Overview 112
Open NanoSuite 112
Terminology 112
Methods 112
Tabs 113
NanoSuite Help 113
Exporting Data 113
Importing Data 113
File Storage Locations 114
Navigating NanoSuite 115
Title Bar 115
Menu Bar 116
Tool Bar 144
Status Bar 146
Tabs 148
NanoSuite and Other Software 199

Read This First
7 Tensile Testing Tutorial

Getting Started 202
Chronological Test Flow and NanoSuite Segments 209
Slack Removal 209
Loading of the Specimen 210
Hold Segment 210
Unloading Segment 211
Reviewing the Results 213
8 Indentation
Getting Started 217
Protecting the Tensile Column 218
Inverting the T150 System 219
Installing the Tip and Puck Adapter 224
Preparing and Mounting of Samples 227
Testing 232
Determining the Frame Stiffness 242
A Continuous Dynamic Analysis

Getting Started 250
B Site Requirements and Specifications

Site Requirements 260
Specifications 261
Line Voltage 261
Environment Temperature 261
Humidity 262
Vibration 262
Dimensions of T150 Gantry 262
Dimensions with Isolation Cabinet 262

Read This First
Desktop Space 262

Vibration Isolation Table 262

Keysight UTM T150
User’s Guide
1
Introduction
Your UTM T150 System 12
Keysight Technologies 14
A Word About Us 14
Company History 14
Contacting Keysight Technologies 14
Training Session 16
Congratulations on the purchase of the Keysight UTM T150 universal

testing system, a premier universal testing platform that delivers
accurate and real-time mechanical properties on the finest of scales.
Capable of characterizing a variety of materials, the T150 measures the

properties of materials in a fashion that is quite unique. Drawing upon
the technologies of nano indentation, this system provides continuous
collection of data, while maintaining the highest standards of
repeatability, consistency and performance.
It is a robust system as well. The T150 universal testing system offers

features and capabilities that are suitable to both research and product
development. Capable of both small and large strains, the system
delivers the flexibility you seek in a testing platform. The T150 range of
operation makes it suitable for the characterization of a wide variety of
materials. This capability is necessary to accommodate the needs of the
materials testing community and is a large part of what the T150 system
has to offer.
Introduction 1
Your UTM T150 System

The T150 universal testing system (Figure 1) represents a great stride in
materials testing. Use of this system provides you with indispensable
convenience in data collection and enables the advancement and
application of new materials and technologies.
Figure 1 UTM T150 instrument
The default configuration of this instrument is as an extension

controlled tensile tester. However, the T150 system has been designed to
be universal testing system. To leap from the “box” momentarily, users

Introduction 1
can unlock vast potential in this machine. For example, consider the
following:
• Dynamic Mechanical Analysis
• Compression (Load-Controlled Experimentation)
• Adhesion
• Three-Point Bend
• Four-Point Bend
• Special Geometries – Component Testing (i.e., MEMS)
Ask your sales representative about any required grips and fixtures.
Options currently available for the T150 system include:

• Continuous Dynamic Analysis
• Vibration Isolation Table
• Isolation Cabinet
• NanoSuite Explorer
• Inversion Footer
• Indenter Kit

Introduction 1
Keysight Technologies
A Word About Us
Keysight Technologies, the premier measurement company, offers

high-precision, modular Nano-measurement solutions for research,
industry, and education. Exceptional worldwide support is provided by
experienced application scientists and technical service personnel.
Keysight's leading-edge R&D laboratories ensure the continued, timely

introduction and optimization of innovative, easy-to-use
nanomechanical system technologies.
Company History
Keysight Technologies brings years of instrumentation experience to

customers. In 1999, Keysight spun-off from Hewlett Packard.
In 1983, Warren Oliver and John Pethica founded Nano Instruments,

Inc. Warren Oliver, renowned in the field of Nanoindenting, remains
involved with Keysight full-time.
Nano Instruments began in Oak Ridge, Tennessee, near the Oak Ridge
National Laboratory, where the company specialized in small-scale
mechanical testing. The company grew organically until its acquisition
by MTS in 1998. MTS Nano Instruments set the standard for excellence
with its line of mechanical-properties microprobes used in materials
testing. Keysight acquired MTS Nano Instruments in 2008.
Keysight is committed to making products that contribute to advances in

science and technology. Dedicated to innovation, respect, teamwork and
uncompromising integrity, Keysight focuses on speed and
accountability to meet customer needs.
Contacting Keysight Technologies
For questions regarding integration between NanoSuite and your T150

system, or for help with your instrument, please contact Technical
Support. For any questions concerning new products, options, or
instrumentation, please contact your sales representative. See "Contact
Information" on page 5 for contact details.
What You Will Need Before You Call Technical Support
If you are calling for NanoSuite integration support, we recommend that

your system is running when you call. Phone support is limited to

Introduction 1
solving system concerns. It should not be used to train new operators or

modify or enhance software.
A Note to Our Overseas Customers
Overseas customers should contact their local Keysight Technologies

representative or distributor for details concerning technical support.
Training
Keysight provides instrument and software training at the time of

installation. If you are interested in further training, please call Keysight
Technologies, Chandler, AZ, at 480-756-5900.

Introduction 1
Training Session
The training session consists of operational training and a run-through
of Chapter 7, "Tensile Testing Tutorial" section. This section will
discuss the operational training that is completed onsite with the T150
system.
After setting up the instrument, the technician will run through a number
of customer acceptance protocols to ensure that the user is
knowledgeable and satisfied with the basic operation of the system.
First, a basic run-down of the operational training is as follows:
1 System Startup and Shutdown
2 Emergency and Safety Features
3 Logging into and Using NanoSuite
a Accessing and Using the Help System
b Loading Test Methods
c Running Tests
d Saving, Naming, and Exporting Data
e Printing Reports
f Backup and Restoring the Data
Be careful not to crash the extension axis into the head!

CA U TI O N
4 Equipment Maintenance and Diagnostics

a Extension Initialization
b Automatic Test Motion - This utility method is run to ensure
proper movement of the NMAT (Nano Mechanical Actuating
Transducer) head. The NMAT is run through its range of travel
and back again to ensure that it moves through this range
correctly. This can be run initially to verify that the head is in
good condition, especially when the user thinks that there might
be a problem. The technician should explain what this method is
used for in detail to the user.
c Field Activity Report – The technician will run through the Field
Activity Report and have the customer sign-off on the completion
of the installation and training.
After the operational training is complete, the technician will take the
user through Chapter 7, "Tensile Testing Tutorial". There are certain

Introduction 1
tests that can be run with a calibration kit to ensure that the machine is
running properly.
In Chapter 2, "Quick Start Guide" the user can run their first test and
familiarize themselves with the standards and specifications of the T150
system.

Keysight UTM T150
User’s Guide
2
Quick Start Guide
Getting a Test Started 19
System Overview 26
Specifications of the T150 System 33
This quick start guide will run you through your first test. One of the
most important things to understand about the NanoSuite software and
its interface with the instrument is the concept of methods. Methods are
the programs in NanoSuite that run the instrument through a test. They
are the recipes that make up any test that is run on the instrument. A
good understanding of what methods do is very important for a broad
understanding of the instrument itself. There are a number of different
methods that come standard with the instrument. Some of these are
referenced in Chapter 7, "Tensile Testing Tutorial" of this manual.
Methods have associated PDF files that explain what each of them do
and how they work. Tensile methods can be found on the hard drive of
the CPU under C:\Program Files\ Keysight NanoSuite \ Methods \
Tensile. Read these PDF files over to obtain a good understanding of the
workings of each of these methods.
Quick Start Guide 2
Getting a Test Started

First, the user will need to turn on their CPU and double-click the
NanoSuite icon on their screen. This will open NanoSuite, as shown in
Figure 2 below. The User Name should be Keysight and the password
text box should be empty. Keysight is the default User Name for
NanoSuite. There is no password for this user. Click the OK button in
the User Login dialog box.
The user can change their login name, password, and permissions to
reflect different users. This is discussed in “Setting Up Users in
NanoSuite” of the NanoSuite training manual.
Figure 2 User Login dialog box in NanoSuite software

Quick Start Guide 2
After the user has logged in, an Open Method dialog box will pop up, as
shown in Figure 3.
Figure 3 Open Method dialog box
1 In the Open Method dialog box, click the Advanced... button.

2 Find and open the UTM T150 Standard Toecomp Quasistatic
method
3 Click OK.
4 Mount your specimen.
This specimen should be an AWG48 copper wire sample mounted using

the Template Grips. The gage length can be measured with calipers from
the User’s Kit. The diameter can be measured using the micrometer. It is
recommended that the diameter be measured more accurately with a

Quick Start Guide 2
microscope. For details on mounting the template grips, please refer to

"Mounting the Template Grips" on page 61.
For details on mounting copper wire with a specific gage length and a
measured diameter, please refer to "Method One: Template
Technique" on page 65.
For the following example, set the Specimen Diameter to 28.6 mm and
measure the nominal gage length.
Performing a Test
1 After preparing and mounting the copper wire, put approximately
5 mm of slack in the sample.
This is done by clicking the blue down arrow pictured in Figure 4

below. Watch the specimen until it can be seen to go into slack.
Figure 4 Use blue down arrow to move extension axis down
2 Remove the Locking Pins from the NMAT.

3 Click the green Go button (Figure 5) to begin the test.
Figure 5 Use the Go button to run a test

Quick Start Guide 2
4 Enter the following parameters in the Required Inputs dialog box

(see Figure 6 on page 23):
• Delta Extension for Data: 0.010 mm
• Extension At Fixture Contact: 0 mm
• Max. Strain: 0.2 mm/mm
• Nominal Gage Length: as measured in mm
• Relaxation Hold Time: 60 seconds
• Specimen Diameter: 28.6 mm
• Specimen Name: AWG48_Copper Wire
• Strain Rate: 1.000e-3 1/s
• Tension Trigger: 750 μN
• UseNominalGageLength(y=1,n=0): 1
5 After all parameters have been added to the Required Inputs window,
click OK.

Quick Start Guide 2
Figure 6 Required Inputs dialog box
A detailed explanation of the Required Inputs for each method can be

found in the PDF files that accompany them. The PDF files for tensile
methods can be found on the CPU hard drive under the folder C:\

Quick Start Guide 2
Program Files\ Keysight NanoSuite\ Methods\ Tensile. The PDF files

will have the same name as the method themselves.
After completing the Required Inputs and clicking OK, the following
dialog box (Figure 7) will open as a reminder: “Remove flags from the
T150-UTM NMAT head.”
Figure 7 Reminder to remove restraining pins
6 Confirm the flags (restraining pins) are removed and click OK.
CONGRATULATIONS! You have just run your first test. Figure 8 on

page 25 is a review page of some results. For more details on
chronological test flow and looking at data in the Review Page, refer to

Quick Start Guide 2
Chapter 7, "Tensile Testing Tutorial". For more detailed descriptions of

the NanoSuite interface, refer to Chapter 6, "NanoSuite".
Figure 8 Review Page showing test results
7 After the test is finished running and the results can be viewed,
replace the Locking Pins in the NMAT.

Quick Start Guide 2
System Overview
This section discusses the standard items and options that come with the
T150 system. These items include the system itself, grips, "Data
Acquisition/Control" (DAC) unit, "Continuous Dynamic Analysis"
(CDA) option, Inversion Footer option, and the Isolation Table and
Cabinet options.
Figure 9 on page 27 shows the UTM T150 system with the

"Micropositioner". The micropositioner is mounted to the extension axis
or crosshead. For more information on the NMAT, refer to Chapter 3,
"Keysight UTM T150 Components" and Chapter 5, "Theory".
The T150 system is designed to have ample working space around the
crosshead and NMAT to allow for a wide variety of experiments. It is
also capable of testing when oriented on its back or in an inverted
position. Convenient handles are integrated into the top and bottom of

Quick Start Guide 2
the frame to make it easy to position the T150 system in these different
configurations.
Figure 9 UTM T150 instrument with micropositioner
The electronic cabinet, housing the CPU, DAC unit, CDA option, and
"Phase Lock Amplifier" (PLA) option, is shown in Figure 10 on
page 28.
The PLA controls the CDA option available for the T150 system. The
DAC unit controls the load and displacement signal for the NMAT. The
PLA provides information to the DAC unit to control the CDA. The
DAC unit and CDA are connected to a CPU that interfaces with the

Quick Start Guide 2
instrument hardware using NanoSuite software. The CPU also controls

the motor for the extension axis of the T150 system.
Figure 10 Electronic cabinet with the CPU, DAC unit, CDA option, and
PLA

Quick Start Guide 2
NanoSuite is the software program that runs the instrument. The

operation of NanoSuite and the instrument is discussed in Chapter 6,
"NanoSuite" and Chapter 7, "Tensile Testing Tutorial".
Figure 11 below shows an example of the total system.
Figure 11 UTM T150 System
Figure 12 on page 30 below shows the "Template Grips" that come

standard with the T150 system. These grips are designed to clamp a
template in which a specimen has been mounted. The technique for
mounting specimens on templates is discussed in "Method One:
Template Technique" on page 65. Note that the grips come with
hexagonal jam nuts. These are used to tighten the grips to the crosshead
and NMAT head, respectively. The width of the slot between the two

Quick Start Guide 2
faces of the grip is ~0.020 ” or ~0.50 mm. The diameter of the attached
screw is 1.6 mm and the diameter of the hole and the set screws that
tighten these grips in place are also 1.6 mm.
Figure 12 Template grips
"Pin Hook Grips" also come standard with the T150 system. These
hooks are designed to mount samples that can be wrapped or tied. As
can be seen, the hooks are slipped into their respective collars (the pin
hook grip base) and tightened down with a screw that is inserted into the
side of the collar. These collars then easily screw onto the crosshead and
NMAT head, respectively.
Figure 13 Pin hook grips

Quick Start Guide 2
Figure 14 below shows the T150 system with the inversion footers
option. This option is discussed in further detail in Chapter 8,
"Indentation".
Figure 14 T150 system with optional inversion footers

Quick Start Guide 2
A vibration isolation table and an isolation cabinet, shown in Figure 15,

are also available for the T150. These items are designed to minimize
noise from the environment while the instrument is running.
Figure 15 Isolation cabinet closed (left) and open (right). Isolation table
fits in isolation cabinet.

Quick Start Guide 2
Specifications of the T150 System

The specifications for the UTM T150 system are:
Parameter Specification
Nominal Maximum load 500 mN
Load resolution 50 nN
Max actuator displacement ±1 mm
Displacement resolution <0.1 nm
Dynamic displacement res <0.01 nm
Max crosshead extension 200 mm*
Extension resolution 35 nm
Extension rate 0.5 μm/s to 5 mm/s
Dynamic frequency range (CDA Option only) 0.1 Hz to 2.5 kHz (sample dependent)
*Nominal value - stages with larger extensions can be obtained on a

custom basis.
Chapter 3, "Keysight UTM T150 Components" will describe all of the

hardware components of the system. Chapter 4, "Commonly Used
Procedures" decribes the commonly used procedures for the instrument.

Keysight UTM T150
User’s Guide
3
Keysight UTM T150 Components
Components 35
Bellows Cover 35
Column Protective Tube 35
Continuous Dynamic Analysis 36
Copper AWG 48 36
Crosshead Assembly 37
Data Acquisition/Control 38
Extension Axis 38
Fixed Debris Shield 39
Gantry 40
Gear Motor 41
Grips 41
Pin Hook Grips 41
Template Grips 42
Jam Nuts 42
Limit Switches 43
Locking Pins 44
Lower Frame Handle 45
Micropositioner 46
NMAT 47
Phase Lock Amplifier 48
Rubber Frame Feet 48
Sheet Metal Covering 48
Shielded Shaft Extension 50
T150 Calibration Kit 51
Total System 52
Upper Frame Handle 53
User’s Kit 54
This chapter defines the major components of the system and their uses.
This section is in alphabetical order.
Keysight UTM T150 Components 3
Components
Bellows Cover
The Bellows Cover is designed to keep debris and foreign materials

from falling into the "Extension Axis" while also allowing easy travel of
the "Crosshead Assembly". The Bellows Cover attaches to either end of
the Crosshead Assembly and the top and bottom end of the Extension
Axis travel range by opposing Velcro strips. Figure 16 below shows this
cover detached from the top end of the Extension Axis travel range.
Figure 16 Bellows Cover
Column Protective Tube
The Column Protective Tube is used to protect the "NMAT" shaft and
components. It should not be removed at any time unless done so by a

Keysight field service engineer. Figure 17 below depicts the Column

Protective Tube and its function.
Figure 17 Column Protective Tube
Continuous Dynamic Analysis
One option for the UTM T150 system is a Continuous Dynamic

Analysis (CDA). The CDA is housed in the electronic cabinet. The
CDA is controlled by the "Data Acquisition/Control" unit and optional
PLA. The CDA option provides a dynamic frequency range from 0.1 Hz
to 2.5 kHz. Note this range is sample dependent.
With the addition of the CDA option, both Continuous Dynamic

Analysis and DMA tests can be performed simultaneously with any of
the quasi-static tests listed in "PID Control" on page 103. The CDA
option is also recommended for fatigue testing as described in
"Extension Axis" on page 104. Harmonic stiffness can also be measured
using the CDA option as described in "Contact Detection" on page 107.
More information regarding the CDA option is in Appendix A,

"Continuous Dynamic Analysis".
Copper AWG 48
The Copper AWG 48 wire comes with the T150 system as a reference
material. This reference material will help the user to run preliminary
tests on the instrument upon installation and check for problems with

the instrument in the future. The properties of Copper AWG 48 are

known and are outlined in Appendix A.
Crosshead Assembly
The Crosshead Assembly attaches to the "Extension Axis" of the T150

system. This assembly consists of the Crosshead and Crosshead Adapter
Plate. It is used in conjunction with the micropositioner for specimen
mounting and specimen alignment as described in "Micropositioner" on
page 46. Pictures of the crosshead can be seen in Figure 18.
Figure 18 Crosshead front (left) and bottom (right) views
This crosshead is adjusted along the length of the Crosshead Adapter

Plate, shown on the left in Figure 19. The complete assembly is shown

on the right in Figure 19. For a procedural discussion on how to adjust

the crosshead, refer to "Crosshead Adjustment" on page 74.
Figure 19 Crosshead Adapter Plate (left) and crosshead adjustment

(right)
Data Acquisition/Control
The Data Acquisition/Control (DAC) unit is housed in the electronic

cabinet. The DAC unit controls the load and displacement signal for the
NMAT. In conjunction with the optional PLA, the DAC controls the
"Continuous Dynamic Analysis". The DAC is connected to the
computer CPU to interface the software with the T150 system.
Extension Axis
The Extension Axis is the motion system that drives the "Crosshead
Assembly". The motion system is composed of a screw-drive train on
which the Crosshead Assembly moves up and down. This screw-drive
train is actuated by a gear motor. Figure 20 on page 39 is an illustration

of what the Extension Axis looks like. Notice that the "Bellows Cover"
has been pulled up to expose the Extension Axis.
Figure 20 Extension Axis
Fixed Debris Shield
The Fixed Debris Shield is attached to the "Column Protective Tube"

that surrounds the "NMAT" shaft. The purpose of this shield is to
prevent any glue or other debris from falling in the NMAT and causing
damage. It is strongly recommended that the user not remove this debris
shield. However, it may become necessary at some point to remove it.
For more discussion on this removal, refer to "Removing the Debris

Shield" on page 78. Figure 21 shows the Fixed Debris Shield by itself
(left) and installed in the NMAT (right).
Figure 21 Fixed Debris Shield (left) and installed in the NMAT (right)
Gantry
The gantry is the superstructure housing all components of which the

T150 system is comprised. The gantry is the frame or skeletal structure
of the system. This frame is designed to be very stiff to minimize the
affect that the load frame has on experimental results. Note the frame
shown in Figure 22 is covered by the "Sheet Metal Covering".
Figure 22 Gantry for the T150 system

This picture also shows the system with the crosshead assembly and
NMAT.
Gear Motor
The Gear Motor drives the "Extension Axis" of the instrument. This
motor sits underneath the "NMAT" head. It is directly connected to the
Extension Axis and actuates the movement of the screw-drive train. A
rotary optical encoder is mounted on the motor. This encoder provides
the extension axis position which is used for the extension and strain
channels.
Grips
There are two types of grips that come standard with the T150 system.
These are the "Pin Hook Grips" and the "Template Grips". For more
concerning grip changes and mounting, refer to "Mounting the Pin
Hook Grips" on page 58 and "Mounting the Template Grips" on page 61
in Chapter 4, "Commonly Used Procedures". For specimen mounting
procedures, refer to "Mounting a Sample Prior to Testing" on page 65.
Pin Hook Grips
Figure 23 on page 41 shows the Pin Hook Grips that come standard with
the T150 system. These hooks are designed to mount samples that can
be wrapped. As can be seen, the hooks are slipped into their respective
collars (Pin Hook Grip Base) and tightened down with a screw that is
inserted into the side of the collar. These collars then easily screw onto
the micropositioner assembly and NMAT head respectively. The
diameter of the holes that the pins slip into is 0.067 ” or 1.70 mm.

The hooks are also designed with centrally located grooves for easier
mounting of springs from the "T150 Calibration Kit".
Template Grips
Figure 24 shows the Template Grips that come standard with the T150
system. These grips are designed to clamp a template in which a
specimen has been mounted. Note that the grips come with Jam Nuts.
These are used to tighten the grips to the crosshead and "NMAT" head
respectively. The width of the slot between the opposing faces of the
grip is ~0.020 ” or ~0.50 mm. The diameter of the attached screw is
1.6 mm.
Jam Nuts
The Jam Nuts, also referred to as grip nuts or hex nuts, are used in
conjunction with the "Template Grips" to lock them in place. The Jam
Nuts screw down the thread of the grips and tighten the grip in place on

the "Shielded Shaft Extension" and the micropositioner. Figure 25

displays the grip with a Jam Nut circled.
Figure 25 Jam Nut on the extended-length grip
For detailed instructions on how best to use the Jam Nuts, refer to
"Tightening the Jam Nuts" on page 79.
Limit Switches
The limit switches on the T150 system are designed to stop the "Gear
Motor" when the "Extension Axis" reaches its top or bottom range of
travel. This is to prevent any damage to the motor that drives the screw
drive-train for the Extension Axis. These limit switches are adjustable
and the user may want to change the location of the limit switches to
shorten or lengthen the range of travel for the Extension Axis. For limit
switch adjustment, see the "Adjusting the Limit Switches" on page 76.
Figure 26 on page 44 shows the limit switches for the T150 system.
A limit switch cover typically sits over the limit switches. To view the limit
NOTE
switches, simply remove this cover. In the left-hand image of Figure 26 on
page 44, the top and bottom switches are turned on. Note the red diodes
that run across the gap in the switches. The image on the right shows the
limit switch closely. A cutter blade bends around toward the limit switch
in this figure as well. When this cutter blade crosses the red light of the
switch, the extension axis stops.

Figure 26 Limit switches overview (left) and close-up view (right)
Locking Pins
The Locking Pins are very important safety features of the T150 system.
The "NMAT" head is a very sensitive device. It is designed to be this
way for experimental power and control. However, the user must be
very careful with the NMAT to prevent any damage to the head. The
Locking Pins slide into the NMAT to prevent the NMAT shaft from
being damaged when the instrument is not being used. They are also
used to protect the NMAT while "Grips" are being changed or samples
are being mounted. Anytime a test is not running, the Locking Pins

should be in place. The Locking Pins are also referred to as the

Restraining Pins. They are depicted in Figure 27.
Figure 27 Locking pins (aka restraining pins) in the NMAT head
Lower Frame Handle
The Lower Frame Handle (Figure 28 on page 46) is in place so the

instrument can be readily moved about. To move the instrument, the
user can grab the Lower Frame Handle together with the "Upper Frame
Handle" for stability. It is strongly suggested that once the instrument is
installed and in place, that the user not move the instrument from one
site to another. If this becomes necessary, take care when moving the
instrument and ensure that the "Locking Pins" are in place in the

"NMAT". Be sure that both handles are securely in place before

attempting to move the instrument.
Figure 28 Lower frame handle
Micropositioner
A precise micropositioner, as shown in Figure 29, is included as a

standard feature on the UTM T150. The micropositioner assembly is
connected to the crosshead, and allows proper alignment of samples by
moving the grip in a plane, perpendicular to the loading axis.
Figure 29 Micropositioner for the T150

NMAT
Extreme care must be used when working with the Nano Mechanical
Actuating Transducer (NMAT). Technical discussions of the NMAT can
be found in Chapter 5, "Theory".
Extreme care must be used when working with the NMAT. Lateral forces
CA U TI O N
applied to the NMAT column can cause damage to the test system.
"Locking Pins" must always be used when performing manual operations
involving the NMAT (including transporting the instrument, grip mounting,
specimen mounting, etc.)
In standard configuration and operation, the NMAT has a "Column

Protective Tube", "Fixed Debris Shield", and "Shielded Shaft
Extension" attached to it. Figure 30 and Figure 27 on page 45 help to
illustrate the NMAT and its testing configuration.
Figure 30 Schematic of NMAT (left) and NMAT shaft in Column

Protective Tube (right)
The internal components of the tensile head should only be accessed by a

CA U TI O N
certified Keysight technician. If a head malfunction is suspected, contact
Keysight for service requirements and troubleshooting techniques.

There are specific instructions on contacting technical support in

"Contacting Keysight Technologies" on page 14.
Phase Lock Amplifier
The Phase Lock Amplifier (PLA) is an option to control the

"Continuous Dynamic Analysis" unit. The PLA provides information to
the DAC unit to control the CDA.
Rubber Frame Feet
The T150 system has Rubber Frame Feet at the bottom and on the back
of the instrument. These feet are in place so the system can be run in
both the vertical and horizontal configurations without doing damage to
the system. They also help to minimize noise between the system and
the environment. A picture of the feet that sit at the bottom of the system
is pictured in Figure 31.
Figure 31 Bottom view of T150 system with rubber frame feet
These feet are also attached to the back of the system so that it can be set
down in the horizontal configuration. The different configurations can
be seen in "Horizontal and Vertical Configuration" on page 77.
Sheet Metal Covering
The Sheet Metal Covering is designed to give the T150 system a more
aesthetic appeal. The Logo Panel or name plate for the system attaches
to this covering. This covering comes in several pieces and is
detachable. There is a top covering, two side plates, a covering for the
base of the instrument, and a bottom plate. There may be configurations
of the machine that require this covering to be removed. For example,
the side plates can be removed to allow access to the breadboard hard
mount points for attachment of other devices. The same is true for the

top plate. It can be removed to install the inversion footers. The

inversion footers are discussed in Chapter 8, "Indentation". There are a
series of screws that set this covering in place and removal is very easy.
The only parts of this covering that might feasibly need removing are
the top, side, and bottom plates. There should not be a need to remove
the base covering of the instrument. Figure 32 and Figure 33 illustrate
the different pieces of the Sheet Metal Covering.
Figure 32 Top and side plates (left) and bottom plate (right)
Figure 33 Sheet metal coverings: Front view (left), top and side plates
installed (middle) and base plate with logo panel (right)

Shielded Shaft Extension
The Shielded Shaft Extension is part of the final configuration of the

"NMAT" and has a number of functions. First, as is inherent in its name,
it extends the shaft of the NMAT beyond the "Fixed Debris Shield" to
facilitate grip mounting. Mounting grips inside the "Column Protective
Tube" or below the Fixed Debris Shield can be difficult. Secondly, the
shaft extension is shielded to prevent any material (cyanoacrylate,
epoxy, etc.) from falling into the NMAT. This device in conjunction
with the debris shield does a good job of keeping foreign material out of
the NMAT head. The shaft extension is pictured by itself on the left in
Figure 34. In Figure 34 on the right, the shaft extension has been
installed on the NMAT.
Figure 34 Shielded shaft extension (left) and on the NMAT (right)

To give the user a better idea of the Shielded Shaft Extension, a

schematic of it with the NMAT shaft, the Fixed Debris Shield, and the
Column Protective Tube is shown in Figure 3-36.
Figure 35 Schematic of shielded shaft extension
T150 Calibration Kit
The kit contains two calibrated springs - one with a low stiffness (about
150 N/m), and another with a high stiffness (about 1900 N/m), as shown
in Figure 36 on page 52. Tensile tests on these springs can be performed
using the "Pin Hook Grips". The engineer installing the instrument will
verify that the instrument measures correct values of stiffness for these

springs. The springs can also be used to verify the performance of the
instrument, if needed.
Figure 36 Calibration kit with low and high stiffness springs
Total System
The total system, described in "System Overview" on page 26 and

pictured in Figure 37 on page 53, consists of the T150 system, the
electronic cabinet and vibration isolation table and isolation cabinet.

The CDA option is discussed in more detail in Appendix A,

"Continuous Dynamic Analysis".
Figure 37 Total T150 system
Upper Frame Handle
The Upper Frame Handle, shown in Figure 38, is in place so the

instrument can be readily moved around. To move the instrument, the

user can grab the Upper Frame Handle together with the "Lower Frame
Handle" for stability.
Figure 38 Upper frame handle
It is strongly suggested that once the instrument is installed and in place,

that the user not move the instrument from one site to another. If this
becomes necessary, take care when moving the instrument and ensure
that the "Locking Pins" are in place in the "NMAT". Be sure that both
handles are securely in place before attempting to move the instrument.
User’s Kit
The User’s Kit for the T150 system comes with a variety of items that
help facilitate the use of the instrument. Below is a list of these items.
• "Template Grips" set
• "Pin Hook Grips" set
• User’s Manual
• "Shielded Shaft Extension"
• "Copper AWG 48 "
• Logo Panel for T150 (see "Sheet Metal Covering")
• Micrometers (For accurate diameter measurements)
• Scissors (To cut specimens, templates, etc.)
• Calipers (For accurate gage length measurements)
• Tweezers (For specimen manipulation)
• 3.2 mm x 3.2 mm Open End Wrench (Used to tighten "Jam Nuts")

• Super Glue or Cyanoacrylate (To bond specimens to "Pin Hook

Grips" and "Template Grips")
• Accelerant (To accelerate the drying of the super glue)
• Debonder (To debond the Cyanoacrylate and Epoxy from surfaces)
• Epoxy (An adhesive for bonding specimens to templates, etc.)
• LC-COMBO/WRENCH (Allen wrench set for the T150 system)
• X-acto Knife (Razor Blade used for cleaning glue from surfaces)

Keysight UTM T150
User’s Guide
4
Commonly Used Procedures
Mounting the Pin Hook Grips 58
Mounting the Template Grips 61
Mounting a Sample Prior to Testing 65
Method One: Template Technique 65
Method Two: Wrapping Technique 67
Crosshead Adjustment 74
Adjusting the Limit Switches 76
Horizontal and Vertical Configuration 77
Removing the Debris Shield 78
Tightening the Jam Nuts 79
Determining Frame Stiffness Using ASTM Test Method 80
Prepare the Samples 80
Perform the Test 80
Verifying Quasistatic Performance 89
Grip Alignment 89
Low Stiffness Spring Test 92
High Stiffness Spring Test 93
The Keysight UTM T150 system is an extremely sensitive instrument

and requires some degree of prudence when performing procedures
involving certain components. Diligent care should be exercised when
working around the NMAT, especially when loading or removing
samples.
Be aware of the following precautions:

CA U TI O N
Lateral forces applied to the NMAT can cause damage to the test system.
Do not over-extend the upper grip (extension axis) and drive it into the
lower grip (NMAT) when moving the extension axis down.
Always pay close attention to where the extension axis is in relation to
the NMAT, it can be driven into the NMAT if the user is not careful.
When mounting samples, always use the locking pins in the lower
column, to avoid damaging the NMAT; DO NOT APPLY ROTATIONAL
FORCES (TORSION) ON THE NMAT COLUMN!
Commonly Used Procedures 4
Always use the "Locking Pins" when performing any procedures involving
CA U TI O N
the "NMAT". See Figure 39
Figure 39 Always use locking pins (aka restraining pins) when

performing any procedures involving the NMAT

Mounting the Pin Hook Grips

1 Ensure that the "Locking Pins" are in place before attempting to
mount the "Pin Hook Grips".
2 Before mounting the grips, screw the "Shielded Shaft Extension"
onto the NMAT shaft. This shaft extension is shown on the left in
Figure 40. The shaft extension is also shown mounted on the NMAT
in Figure 40 on the right.
3 Configure the system using the "Pin Hook Grips", illustrated in

Figure 41.
4 First, screw one grip onto the Shielded Shaft Extension. The hook
can be rotated to the desired orientation by loosening the cap screw,

setting the hook to the desired orientation, then tightening the cap
screw. Ensure that the cap screw is tight before mounting the sample.
This can be seen in Figure 42.
Figure 42 Use cap screws to achieve desired hook orientation
5 After the bottom hook is in place, follow step 3 and step 4 to attach
the other hook to the micropositioner assembly.

Figure 43 shows a picture of the T150 system once the grips have been
mounted.
Figure 43 T150 system with pin hook grips mounted
Many times, after a specimen has been glued to the Pin Hook Grips,
they must be cleaned before reusing them. This can be done well by
using a razor blade to clean the grips. It is best done with the grips out of
the machine so as not to scrape debris into the NMAT or overly stress
the NMAT shaft.
Mounting of the template grips is similar to the mounting of the hook

grips. Similar care must be taken to protect the NMAT while mounting.
Again, these precautions include ensuring that the restraining pins are
in place during grip mounting. Below, a brief tutorial on how to mount
the template grips is given.

Mounting the Template Grips

1 Ensure that the "Locking Pins" are in place before attempting to
mount the "Template Grips".
2 Before mounting the grips, screw the "Shielded Shaft Extension"
onto the NMAT shaft. This shaft extension is shown on the left in
Figure 44. The shaft extension is also shown mounted on the NMAT
in Figure 44 on the right.
3 Configure the system using the template grips, illustrated in

Figure 45. The cap screws are used to clamp a template in place.

4 Screw the Template Grip onto the Shielded Shaft Extension.

a First, screw in the Template Grip threading into the shaft
extension. This is shown in Figure 46.
Figure 46 Screw template grip to NMAT
There are jam nuts that come with the Template Grips that allows them
to be tightened to the Shielded Shaft Extension. A schematic of the
Template Grip can be seen in Figure 47.
Figure 47 Schematic of template grip

As can be seen, there are two jam nuts. The top jam nut sits against the
collar of the Template Grip. The bottom jam nut sits against the
Shielded Shaft Extension.
b After the threading of the Template Grip has been screwed in, the
grip is set in place. This is done by tightening the bottom jam nut
down to the Shielded Shaft Extension with the wrench. This is
shown in Figure 48. Do not apply excessive torsional force when
tightening the jam nut. Just “snug” is enough.
Figure 48 Tighten template grip to NMAT using jam nut
c After the bottom jam nut is tight, tighten the top jam nut to the
collar of the Template Grip with the wrench.
The bottom jam nut sets the grip in place against the Shielded Shaft
Extension. The top jam nut prevents the collar of the Template Grip
from twisting off of the threading it is connected to. The top jam nut
should always be snug against the collar of the Template Grip. This is
simply a precaution. The collars of the grips are securely attached to the
threading they sit on. However, it is important to try and prevent damage
to the grips. To remove the grips, simply loosen the bottom jam nut and
unthread the grip from the Shielded Shaft Extension. Again, leave the
top jam nut “snug” against the collar of the grip.
The same tightening procedure as described above is used to mount the

upper grip. The Template Grip screws into and is tightened on the

micropositioner assembly in the same fashion as is shown for the lower

grip.
The set screws on the grips are used to press the faces of the grip against
a template. These set screws are designed to secure the template in
place.
Figure 49 depicts the Template Grips mounted in the T150 system.
Figure 49 T150 with template grips

Mounting a Sample Prior to Testing

This tutorial describes two primary techniques employed for mounting
tensile specimens in the T150 system. One technique consists of
constructing a set of rectangular templates for the specimen while the
other technique consists of wrapping the specimen around the Pin Hook
Grips and gluing the specimen to these grips. Before mounting the
sample it is very important that the user know the specimen’s diameter.
This can either be done with a set of micrometers from the "User’s Kit"
or under a microscope. After mounting the sample the user will need to
enter this diameter in the Required Inputs window.

found in the .pdf files that accompany them. The .pdf files can be found
on the CPU hard drive under the folder C:\Program Files\Keysight
NanoSuite\ Methods\ Tensile. The .pdf files will have the same name as
the method themselves.
It can be very difficult to do a diameter measurement once the specimen

has been mounted. Do not use the micrometer on any part of the
specimen that is actually being tested. Measure only the ends, not the
gage area. It is also of great importance to ensure that the restraining
pins are in place while any sample mounting is taking place. This will
help prevent damage to the NMAT.
Method One: Template Technique
The template technique is a mounting strategy used for very fine

specimens. These specimens can range from biological materials to
metals. Examples of materials that are used with templates are spider
silks, cotton, hair, microwires, etc. The user must cut out a rectangular
section of construction paper or plastic sheeting. These materials are
used because they are relatively stiff. This is important because the
material is being used as a scaffold for the material being tested. The
"Template Grips" will accommodate template thicknesses up to about
0.020 ”. Next, a circular or rectangular window is cut in this rectangular
scaffold. The specimen is then glued across this window.
The gage length of the specimen is the distance between the glue joints
NOTE
on either side of the window. It will be important to measure this length
before mounting the template in the T150 system, as the user will have to
enter this value in the Required Inputs window before running the test.

After the specimen has been mounted in the template, the template is
positioned into the T150 system using the template grips. The template
is then either cut or burned on both sides so the material can be tested.
The figures below illustrate this process.
1 Start with a rectangular section of either plastic or construction paper
as shown in Figure 50.
Figure 50 Starting template material
2 Cut either a rectangular or circular window in the template using

scissors, razor blade, etc., as shown in Figure 51. A diamond window
can also be cut.
Figure 51 Rectangular (left) or circular (right) window cut in template
3 Lay the specimen across the window of the template and glue it at
both ends as shown in Figure 52.
Figure 52 Specimen across template window and glued at ends
4 After the specimen has been mounted to the template, insert the
template into the T150 system using the Template Grips. The

Template Grips will clamp the template on the long ends of your
rectangular section. After the template has been mounted in the
instrument, clip or burn both sides of the template as illustrated in
Figure 53.
Ensure that the larger portion of the separated template is connected to

NOTE
the Crosshead Assembly of the system.
Figure 53 Clip template to free the specimen for testing
If the template is construction paper, the user should cut the template
with a pair of scissors. Do this carefully so as not to impose any force on
the specimen. If the template is made of plastic sheeting, use a soldering
iron to burn away the template. A soldering iron imposes less force on
the specimen than would a pair of scissors. The template is cut at an
angle rather than orthogonally to the axis of the specimen to keep the
weight minimized that the NMAT must support.
After the specimen has been clipped, it is ready to be tested.
Method Two: Wrapping Technique
The second method that can be employed for sample preparation is the
wrapping technique. This involves wrapping a specimen around the
"Pin Hook Grips" of the T150 system. For materials that have a much
finer scale or are semi-rigid or brittle, the template technique is
generally preferable. Below are pictures that illustrate the wrapping
process.
1 Before wrapping of the specimen can take place, a gage length must
be acquired. This can be done in two ways.
a First, the hooks can be spaced out accordingly to an approximate
gage length the user wants. Then, the grip spacing can be

measured using calipers. Use the caliper measurement in the gage

length calculation as illustrated in Figure 54.
Figure 54 Gage length as distance between center points of grips
Before the specimen is mounted, the gage length and specimen diameter
should be known. Specimen diameter can be acquired using the
micrometers from the User’s Kit or under a microscope. Both specimen
diameter and gage length will need to be entered into the Required
Inputs window in NanoSuite before a test can be run. Note the gage
length of the specimen is the distance between the center point of the
two grips. Therefore,
Nominal Gage Length=grip spacing + 2*(hook diameter/2)
This can simplified to
Nominal Gage Length = grip spacing + hook diameter
Hook diameters can be measured with calipers. This concept is shown

schematically in Figure 54.
Be sure that when the grip spacing is measured using calipers that the
CA U TI O N
restraining pins are in place. These pins will prevent damage to the
NMAT. The user should also be careful not to push the caliper between
the Crosshead Assembly and the NMAT.

b Alternatively, measure a gage block to a specific length with a

pair of calipers. This gage block is then used to space the Pin
Hook Grips accordingly. Use the blue Up and Down arrows in
NanoSuite to space the grips apart. This is shown in Figure 55 on
page 69.
Figure 55 Measure gage block (left) and use block to space pin hook
grips
The wrapping technique is shown in Figure 56 on page 70.

2 The specimen is wrapped around the bottom hook with a pair of
tweezers as many times as is necessary and held in place so that it
can be glued in place.
It is very important when using the wrapping technique to avoid putting

NOTE
stress on the area of the specimen that will be tested.

Figure 56 Wrapping of a fiber specimen
Pull the sample only on the untested area as shown schematically in

Figure 57. Stress only the working end of the fiber as shown.
Figure 57 Schematic for wrapping of a fiber specimen
Be careful to not get any glue running down the pin hook grip and onto
CA U TI O N
the NMAT.

3 Glue the specimen carefully. Hold the specimen in place and apply a
drop of cyanoacrylate (CA) glue on the hook where the specimen has
been wrapped, as shown in Figure 58.
Figure 58 Carefully apply glue to specimen
4 Spray accelerant (Figure 59) on the CA glue to fix the specimen in

place quickly.
Figure 59 Use accelerant (or kicker) to set specimen in place after glue
application

Note that some specimens may be sensitive to either the CA or the

accelerant. In such cases, alternate adhesives such as epoxy should be
used.
5 After the specimen has been glued and set in place, the process
should be repeated for the other hook.
It is important not to apply too much strain to the specimen during

NOTE
mounting. Only apply tension necessary to cause the specimen to be
“taut.”
Figure 60 shows a specimen that has been completely wrapped and set
in place.
Figure 60 Mounted speciment on pin hook grips
It is important to note that this technique takes practice. It takes some

skill to properly mount samples with the wrapping technique. It will be
obvious in the resultant data of a test if the specimen has been

pre-stressed or improperly mounted. Figure 61 below shows a

schematic of a fully mounted specimen.
Figure 61 Schematic of wrap-mounted specimen

Crosshead Adjustment
The "Crosshead Assembly" supports the "Micropositioner" on the T150
system. Pictures of the crosshead can be seen in Figure 62.
Figure 62 Crosshead front (left) and bottom (right) views
The crosshead is adjusted along the length of the Crosshead Adapter

Plate. This plate has a series of 5 mm holes for adjustment of the
Crosshead. The holes are slotted to allow adjustment in the lateral
(side-to-side) direction. The Crosshead can be adjusted to accommodate
a variety of specimen gage lengths.
When adjusting the crosshead, be sure to hold it in place while loosening

CA U TI O N
the screws. This will prevent the crosshead from falling onto the NMAT
and damaging it.
To adjust the crosshead:

1 Remove the set screws that hold it in place.
2 Move the crosshead along the length of the adapter plate to the
desired location.
3 Replace and tighten the set screws.

This procedure is illustrated in Figure 63.
Figure 63 Crosshead adapter plate (left) and adjustment of crosshead

Adjusting the Limit Switches

The "Limit Switches" on the T150 system are designed to stop the
extension axis motor when the extension axis reaches its top or bottom
range of travel. This is to prevent any damage to the motor that drives
the screw drive-train for the extension axis. These limit switches are
adjustable and the user may want to change the location of the limit
switches to shorten or lengthen the range of travel for the extension axis.
1 To view the limit switches, simply remove the limit switch cover that
sits over them.
Figure 64 on the left shows the limit switches for the T150 system. The
top and bottom switches are turned on. Note the red diodes that are
visible in the gaps of the switches. The limit switches sit in a groove
next to the Crosshead Adapter Plate and are set in place by screws. A set
screw is circled in the figure on the right. A cutter blade bends around
toward the limit switch in this figure as well. When this blade interrupts
the red light of the switch, the extension axis stops.
2 Loosen the set screws.
3 Slide the limit switches along the groove for adjustment.
4 Tighten the set screws.
Figure 64 Overview of limit switches (left) and closer view (right) of limit
switch with set screw circled in blue.

Horizontal and Vertical Configuration

The T150 system can be run in both the horizontal and vertical
configuration. The most common way to run the system is in the vertical
configuration. The "NMAT" is designed to have only one degree of
freedom in its movement. In other words, it is designed to move only in
the axial direction of the NMAT shaft. The support springs of the NMAT
shaft are designed to be very compliant in the axial direction and very
stiff in the lateral direction. The vertical configuration facilitates easy
movement in the axial direction for the NMAT. However, the support
springs, because of the high stiffness in the lateral direction, are
designed so the T150 system can be set on its back and run in the
horizontal configuration. This variety in configuration will give the user
more ability to accommodate various applications. The vertical and
horizontal configurations are shown in Figure 65.
Figure 65 Vertical (left) and horizontal (right) configurations for T150

system
Be careful not to pinch the cables that connect to the system beneath the
CA U TI O N
frame.
To change between configurations, grasp the "Upper Frame Handle"

and the "Lower Frame Handle" and rotate the instrument to the desired
configuration. Take care when turning the machine so as not to damage
the instrument.

Removing the Debris Shield

Removal of the "Fixed Debris Shield" is shown in Figure 66. Take a pair
of tweezers with fine points and set both ends of the tweezers in the
holes at the top of the shield. Turn the shield counterclockwise to screw
it out of the "Column Protective Tube". Note it is typically not necessary
to remove the Debris Shield.
Figure 66 Placement or removal of fixed debris shield

Tightening the Jam Nuts

The "Jam Nuts" are used to tighten the "Template Grips" into a desired
orientation.
1 Roll the jam nut down the threading of the Template Grip with a
finger, as shown in Figure 67.
Figure 67 Roll jam nut down with finger
2 Tighten the jam nut in place with the wrench from the "User’s Kit",
as shown in Figure 68. Be careful not to over-torque the jam nut.
Figure 68 Tighten jam nut with wrench

Determining Frame Stiffness Using ASTM Test Method

In an ideal situation the frame stiffness for UTM T150 should be
infinite, and it should not have any effect on the measured mechanical
properties of the sample. However, the real frame stiffness is a finite
number and may have an influence on the measured sample properties.
It is important to note here that the frame stiffness is a combined effect
from the NMAT, cross-head, and the gripping system, which includes
grips, template, glue and the part of fiber inside the glue. Hence,
according to the ASTM C1557-03 standard for measuring tensile
strength and Young's modulus of single fibers, the frame stiffness
should be determined for each sample-grip-glue combination. The
following section outlines the procedure to determine frame stiffness.
Note that the frame stiffness for the UTM T150 does not influence the
testing of highly compliant samples.
Prepare the Samples
To calculate the frame stiffness, specimens with significantly different

gage length are required. For example, three sets of fibers with gage
lengths of about 30, 40 and 50 mm. For sample mounting procedure,
refer to the "Mounting a Sample Prior to Testing".
Perform the Test
Perform tensile test on the fiber specimen with different gage length
using the UTM T150 ASTM C1557 Fiber Tensile Strength Modulus

method, available in NanoSuite 6.0 or later. After all the tests are
completed, go to the "Review Tab" (Figure 69) in NanoSuite.
Figure 69 Review tab in NanoSuite
1 Export the data to Excel by clicking on the Export to Excel button.
Use the following parameters from the Results tab in the Excel file for
the calculation in :
• Total Compliance, C (m/N)
• Specimen Gage Length, L0 (mm)
2 Use Excel, or any plotting software, to plot Total Compliance,

C (m/N), vs. Specimen Gage Length, L0 (mm).
The value of C when L0 is 0 is the Frame Compliance, Cs (m/N).
3 Determine the Frame Stiffness, Ss (N/m), from:

1
S s = ------
Cs
Note once the Frame Stiffness is determined, the following steps

describe how to correct the calculations for the current sample, as well
as how to run the test on the next sample with the new Frame Stiffness.
4 Choose Configure > Device…as shown in Figure 70.
Figure 70 Select Device... from Configure menu
This will open the Device Configuration dialog box.
5 Select Frame Stiffness (Frame) from the Channel drop-down menu

in the Device Configuration dialog box as shown in Figure 71 on
page 83.

Figure 71 Select Frame Stiffness (Frame) from Channel menu
6 Click Calibrate (Figure 72).
Figure 72 Calibrate the Frame Stiffness
7 Note down the value in the Current XP Stiffness text box, shown in
Figure 73 on page 84. Let's call it Ss'.

Figure 73 Current XP Stiffness value in Calibrate Frame Stiffness Device

dialog box
8 Subtract Ss' from Ss, the Frame Stiffness calculated in step 3. That is
the value for the Frame Stiffness Correction (in N/m).
9 Edit the value in the Current XP Stiffness text box to the Frame
Stiffness value calculated in step 3.
10 Click OK in the Calibrate Frame Stiffness Device dialog box. Do not
click the Calibrate XP button.
11 Select HarmonicFrame (Harmonic Frame Stiffness) from the
Channel drop-down menu as shown in Figure 74 on page 85.

Figure 74 Select HarmonicFrame (Harmoninc Frame Stiffness) from

Channel menu
12 Click Calibrate in the Device Configuration dialog box as shown in

Figure 75.
Figure 75 Calibrate the Harmonic Frame Stiffness
13 Edit the value in the Current XP Stiffness text box (Figure 76) to the
Frame Stiffness value calculated in step 3.

Figure 76 Edit Current XP Stiffness
14 Click OK the Calibrate Frame Stiffness Device dialog box. Do not

click the Calibrate XP button.
15 Click OK on the Device Configuration dialog box as shown in
Figure 77 on page 87.

Figure 77 Device Configuration dialog box
16 Change the Frame Stiffness Correction value (Figure 78) to the

number calculated in step 8.
17 Press Enter.
Figure 78 Edit Frame Stiffness Correction
18 The following pop-up window (Figure 79 on page 88) will open.

Click Close.

Figure 79 Sample-Level variable has changed message
19 Click the Recalculate Sample button, shown in Figure 80. Test

results may change; do not worry about this.
Figure 80 Recalculate Sample button circled in red
Once recalculated, the Results section shows the correct values for the
current sample.
Next time when a new set of samples with the same specimen-grip
combination is tested, the Frame Stiffness Correction should be 0 N/m.
The correct Frame Stiffness from the calibration file will be used
automatically. Frame Stiffness should be calculated again if either the
specimen or the grip system is changed.

Verifying Quasistatic Performance

The quasi-static performance of the UTM T150 can be verified by using
the "T150 Calibration Kit" on page 51. The verification process makes
use of two separate NanoSuite test methods:
• "Low Stiffness Spring Test"
• "High Stiffness Spring Test"
Grip Alignment
First, follow these steps for proper grip alignment.

1 With the grooved hook grips installed, carefully run the top hook
grip down close to the lower hook grip. The figure on the left of
Figure 81 illustrates poor grip alignment in the X direction.
2 Adjust the X- adjust thumbscrew on the micropositioner for proper
alignment, as illustrated by the figure on the right in Figure 81.
Figure 81 Examples of improper (left) and proper (right) alignment in the

X direction
3 Check the hook alignment in the Y direction. The figure on the left
of Figure 82 on page 90 illustrates poor grip alignment in the Y
direction.
4 Adjust the Y- adjust thumbscrew on the micropositioner for proper
alignment, as illustrated by the figure on the right in Figure 82.

Figure 82 Examples of improper (left) and proper (right) alignment in the

Y direction
5 Run the crosshead up so that you can hang a spring in the groove of
the top hook. Adjust the vertical position so that the bottom hook is
within the bottom loop of the spring as shown in Figure 83.
Figure 83 Spring installed
6 Hang the spring so that it is in the groove of the top hook as shown in
Figure 84 on page 91. Maintain this centered position while you
make the next adjustment, which is the rotational or perpendicular
adjustment.

Figure 84 Spring centered in the groove of the top hook
7 Check for perpendicularity between the grip hook and the spring
loop. The figure on the left of Figure 85 illustrates poor
perpendicularity.
8 Use a 1.5 mm Allen wrench to adjust the perpendicularity. Loosen
the TOP hook grip. While maintaining the vertical position of the top
hook, rotate the hook to get the best possible perpendicularity
between both the top and bottom grip hooks and spring loops.
Proper adjustment, as shown on the right in Figure 85, is complete when

both the top and bottom spring loops are perpendicular to their hooks.
Figure 85 Examples of improper (left) and proper (right) perpendicularity

between the hook and spring

The alignment setup is now completed. Proceed to the next step of

testing.
Low Stiffness Spring Test

1 Launch the NanoSuite software.
2 Open the method T150 Spring Verification LOW.
3 Remove the low stiffness spring from the "T150 Calibration Kit".
The low stiffness spring has a smaller diameter wire compared to the
high stiffness spring.
4 Hang the spring on the upper hook grip.
5 Adjust the extension axis for correct spread between the grips.
6 Adjust the upper hook as needed to center the spring loops on the
grips. This should similar to the example in Figure 86.
Figure 86 Low stiffness spring mounted and ready for testing
7 Click Run in the software.

An instruction window will pop up to remind the user to load the spring
correctly as shown in Figure 87.
Figure 87 Instructions to load and verify low stiffness spring
8 When ready, click OK.
The test will then run. When testing is completed, the software will
prompt the user to save the sample. The Review page will then be
displayed.
If the results are within 5 % of the spring value, return to the test screen
and run the test four more times for a total of five runs.
If it is not within 5 %, adjust the spring on the grips and try again. If this
solves the problem, delete the first test and then run four more.
9 When 5 runs are completed, print the report.
High Stiffness Spring Test

1 Open the method T150 Spring Verification HIGH.
2 Remove the high stiffness spring from the "T150 Calibration Kit".
The high stiffness spring has a larger diameter wire compared to the low
stiffness spring.
3 Hang the spring on the upper hook grip.
4 Adjust the extension axis for correct spread between the grips.
5 Adjust the upper hook as needed to center the spring loops on the
grips.
6 Click Run in the software.

An instruction window will pop up to remind the user to load the spring
correctly.
7 When ready, click OK.
The test will then run. When testing is completed, the software will
prompt the user to save the sample. The Review page will then be
displayed.
If the results are within 5 % of the spring value, return to the test screen
and run the test four more times for a total of five runs.
If it is not within 5 %, adjust the spring on the grips and try again. If this
solves the problem, delete the first test and then run four more.
8 When 5 runs are completed, print the report.

Keysight UTM T150
User’s Guide
5
Theory
How It Works 96
Large Strain Testing 96
Small Strain Testing 96
Instrument Theory 97
UTM vs. Traditional Tensile Testing 97
NMAT 98
PID Control 103
Extension Axis 104
Operational Theory 106
Sample Geometry 106
Grip Faces 106
Grip and Specimen Alignment 106
Slack Removal 107
Contact Detection 107
Stress Concentration 107
The Keysight UTM T150 tensile testing platform is an innovation that

emerged from nanoindentation technology. It has its roots in a
technology that has gained wide acceptance in a multi-faceted array of
industry, science, and research. The following section discusses the
theory behind the instrument.
Certain clarification of terms is necessary to help the user understand

the contents of this section. Below are some of these definitions:
• NMAT - Nano Mechanical Actuating Transducer.
• Displacement - The motion detected in the capacitive gauge of the
NMAT.
• Extension - The motion detected by the movement of the crosshead
attached to the extension axis.
• Load - The load detected by the voice coil of the NMAT.
Theory 5
How It Works
Large Strain Testing
The crosshead moves, generating and measuring the extension. The

NMAT uses a feedback control loop to measure the force on the
specimen.
Small Strain Testing

The crosshead remains stationary The NMAT generates force while
measuring displacement with a capacitive gauge. In this mode, the
NMAT measures both force and displacement.

Theory 5
Instrument Theory
UTM vs. Traditional Tensile Testing
Traditional tensile testing is performed using an instrument that consists

of a frame, moving crosshead, and load cell. The specimen is mounted
between the crosshead grip and the load cell grip (see Figure 88). An
actuator causes the crosshead to move, and the load cell measures the
force or load on the specimen. This force is normalized to a stress
measurement by the cross sectional area of the specimen, while the
extension is normalized to a strain measurement by the gauge length of
the specimen. Additional techniques may be used to directly measure
the increase in specimen gauge length (such as contact or non-contact
extensometers), or to directly measure the reduction in specimen area.
Figure 88 Schematic of traditional load cell
The T150 system, shown schematically in Figure 89 on page 98, utilizes

many of the same elements as a traditional tensile tester. The instrument
consists of a frame and moving crosshead, but in place of the load cell is
a Nano Mechanical Actuating Transducer ("NMAT"). The NMAT
provides the same load or force measurement functionality as a load
cell, but incorporates a design that allows for a greater load sensitivity,

Theory 5
more robust operation as the load range is decreased, and a greater

dynamic range.
Figure 89 Schematic of T150 system
NMAT
The NMAT, shown schematically in Figure 90 on page 99, consists of

three basic elements: force measurement / control, displacement
measurement, and a support mechanism. For the NMAT produced by
Keysight, the force measurement and control unit consists of an
electromagnetic voice coil actuator. A force is measured directly from
an applied current to the electromagnetic coil. The displacement
measurement device consists of a three-plate capacitive displacement
gauge. The capacitive gage consists of two outer plates and a center
plate. Displacement of the NMAT shaft (not to be confused with
specimen extension using the extension axis), is measured by relatively
defining the center plate to the two outer plates. Finally, the support
mechanism consists of dual leaf springs attached to the central moving
shaft of the NMAT. These springs are designed to be very rigid in the
lateral direction and very compliant in the axial direction. This is to
allow only one degree of freedom of motion for the NMAT shaft. It

Theory 5
should be noted that the NMAT is identical to a Nano Indentation head

as produced by Keysight for indentation instruments.
Figure 90 NMAT schematic
There are four basic modes of operation of the NMAT:

1 In the first, the current supplied to the voice coil is varied, resulting
in actuation or movement of the NMAT shaft. The movement caused
by this actuation is measured by the capacitive displacement sensor.
This is the mode of operation used for most indentation experiments,
but it is effectively the same as a compression test. In such a test, the
force applied to the specimen is determined by the current applied to
the voice coil, and the resultant displacement of the specimen is
recorded by the displacement sensor (presuming that the NMAT
shaft and the load frame are rigid). This is defined as a “load
controlled” experiment. Other potential applications associated with
this mode of operations for the T150 system are three-point bend
tests, four-point bend tests, and adhesion experiments.
2 The second mode of operation is defined as “displacement
controlled” experimentation. The displacement sensor is monitored
as the current to the voice coil is changed. The current to the voice
coil is subsequently adjusted to achieve a prescribed displacement
rate or displacement. This “displacement control” mode is driven by
a feedback loop.

Theory 5
3 The third mode of operation is unique to the application of the

NMAT to the T150 system. In this mode, the displacement is held
constant at its zero point (with the center capacitive plate midway
between the two outer plates). The current to the voice coil is
adjusted so that the center plate remains in this zero position.
Consequently, when an external force is applied to the NMAT shaft
(i.e. extension of a specimen connected to that shaft), the current to
the voice coil is increased. In other words, the voice coil acts to resist
imposed forces. This resistance to imposed forces is the measured
load that is used to calculate the load on the specimen. This mode is
called “zero-displacement” mode and is also operated using a
feedback loop.
4 The last mode of operation is to couple any of the above methods
with a small, superimposed oscillation on the current to the voice
coil. This technique allows for the determination of both the
quasi-static and dynamic properties of the specimen.
The NMAT is designed to have certain advantages when compared to

load cells:
• The typical load cell consists of a strain gauge element, comprised of
strain gauges and flexures (see Figure 91). When an external force is
imposed on the load cell, the flexure is displaced. The strain in the
flexure is measured, and converted to a force via calibration of the
load cell. Consequently, the load cell is “statically compliant”, since
imposition of static loads result in deflection of the sensing elements
of the load cell.
Figure 91 Traditional load cell strain gauge
• Another feature of load cells is that the sensitivity is related to the

stiffness of the flexures. Very sensitive load cells can be
manufactured, but the maximum load is limited, and the cell can be
damaged by imposition of loads beyond the maximum rating.

Theory 5
• By way of contrast, in “zero-displacement mode”, the NMAT’s

sensing system does not move when external forces are applied. As
described above, a current is variably applied to the voice coil to
keep the center plate of the capacitive gauge in its “center position.”
This is defined as “static rigidity”, since the feedback loop and voice
coil resist motion of the displacement sensor.
• One effect of this design is that the load range of the NMAT is not a
function of the flexures. In a load cell, the load limit is defined by the
stiffness of the flexures that measure the force. When this limit is
reached and subsequently exceeded, the load cell can be damaged.
However, in the NMAT, when in the “zero-displacement” tensile
mode, cannot be damaged by reaching and exceeding the load limit.
The load limit is defined by the maximum current that can be pushed
through the voice coil. When an external force exceeds this limit, the
center plate simply moves to the top of its range of travel, and limit
detections in the capacitive gage will terminate the test being run. In
the NMAT, the leaf springs are used only to support and guide the
shaft. Axially, these leaf springs have been designed to be very
robust and difficult to damage in the lateral direction.
Figure 92 Schematic of crosshead motion for NMAT vs Load Cell

Theory 5
• Another advantage of this technique is that the sensitivity of the load

measurement is a function of how well the current to the voice coil
can be controlled and measured, as well as the resolution of the
capacitive displacement gauge. NanoNewton force resolution and
sub-nanometer displacement gauge resolution is a critical feature of
the NMAT for indentation testing, but is also a feature of the
“zero-displacement” tensile mode.
• A final issue is the dynamic response of the system. Load cells are
often used for fatigue tests, in which high cycle, low frequency
oscillations are applied by the crosshead and measured by the load
cell. While the NMAT can be operated in this mode as well, the
voice coil actuator in the NMAT also allows for the superimposition
of a high frequency force oscillation, enabling dynamic mechanical
analysis of the specimen simultaneous with tensile, compressive,
creep or other tests. This simultaneous oscillation is called
Continuous Dynamic Analysis. This capability is enhanced by the
low mass, low spring stiffness, and low damping of the NMAT itself.
These dynamic characteristics define the system as “dynamically
compliant,” in that there is limited contribution by the NMAT to
external dynamic forces.
Figure 93 Schematic of NMAT with DMA vs Load Cell with fatigue

testing

Theory 5
PID Control
When operated in zero-displacement mode, the feedback loop driving

the NMAT is controlled through PID parameters.
It is important to note that it is not normally necessary to adjust the PID

parameters. The parameters in place on the T150 system are general
values that work well with a wide range of materials. Some of the
parameters, such as the setpoint, are determined during manufacturing
and calibration of the instrument, and should not be changed at all. Do
not modify the PID parameters unless you are very comfortable with the
effect of doing so, and never modify the parameters without recording
the installed values (a copy of your PID parameters is kept with
manufacturing records at Keysight).
For general details on PID parameters, refer to the descriptions below.

Some of the PID parameters are specific to the NMAT, and will not have
direct analogs in general PID literature. Following are brief descriptions
of each of the PID parameters.
• Proportional Gain: This gain is a correction made to the NMAT
based on the current error of the center plate in the capacitive
gage. As stated above, when the instrument is configured in
tensile mode, a variable current is pushed through the voice coil
to keep the center plate in the middle of the capacitive gage. The
current error of the NMAT is the difference between the desired
center plate position and the current center plate position.
Proportional Gain is the correction applied to the NMAT to
minimize this error. It is simply the correction made to the NMAT
based on center plate displacement.
• Integral Gain: This gain is used in conjunction with Proportional
Gain to further correct errors in the NMAT’s center plate position.
The difficulty in using proportional gain alone is that, if set too
high, it can overcorrect. Proportional Gain updates in time
intervals and corrects the center plate position for each specified
interval. Integral Gain is a more continuous correction of center
plate position and helps to keep proportional gain from
overcorrecting along with more accurately correcting this
position. Integral Gain makes corrections to the center plate
position by summing the development of its position in real-time
and then adding the current error (current error is defined above).
This aids in doing a continuous correction of error based on the
real-time variation in displacement rather than simply correcting
the error in position once at the beginning of a specified update
interval.

Theory 5
• Derivative Gain: This gain attempts to ensure that the position of

the center plate does not cyclically or sporadically switch signs.
Derivative Gain attempts to keep the center plate from moving
back and forth over its zero point.
• Deadband: The deadband is the range in which the center plate
can float where the PID parameters will not respond. This is a
small bandwidth close to the setpoint to allow a small deviation in
center plate position. This deadband is in place so that the PID
parameters do not overcorrect for small insignificant deviations
in center plate position.
• Setpoint: When operating in zero-displacement mode, the NMAT
center plate is located at a fixed position within the capacitive
gauge. This position is nominally the center point between the
two outer plates. In this center location, you ought to be able to
insert the shaft locking pins with minimal resistance. This center
point is the setpoint. Due to small changes in the alignment of the
protective tube relative to the NMAT shaft, the setpoint may have
small variations in its absolute value. The value is unitless. There
should be no need to change the setpoint unless you are asked to
do so by a Keysight representative.
• Output Scaling: Do not change this parameter without the
supervision of a Keysight representative.
• Clear Integral: Do not change this parameter without the
• Input Data Average: Do not change this parameter without the
• Max. Delta Change: Do not change this parameter without the
While most of the discussion in this section has been targeted toward
tensile modes of operation, the T150 system is well suited to operate in
compressive, creep, stress relaxation, three point bend, and four point
bend modes. Using the proper fixtures and methods with the basic
configuration of the instrument, there is no inherent limitation on the
structure of the instrument itself. With the addition of the CDA option,
both "Continuous Dynamic Analysis" and DMA tests can be performed
simultaneously with any of the quasi-static tests listed above.
Extension Axis
Finally, in describing the instrument, it is important to note the

capabilities of the extension axis used to move the crosshead.
Extension resolution / strain measurement: As indicated above, the

strain is determined from the movement of the crosshead, rather than

Theory 5
from direct measurement (i.e., extensometry). This measurement is

made by an optical rotary encoder mounted directly on the extension
axis drive motor. The extension axis is driven be a screw drive-train.
The resolution of the extension is a function of the resolution of this
encoder, the gear ratio of the motor, the interpolation capability of the
electronic motor card, and the pitch of the drive screw. In most tensile
tests, this nanometer resolution far exceeds the test requirements (that is,
extensions are typically on the order of millimeters, so nanometer scale
resolution is sufficient). In modes of operation in which the extension is
limited to a few microns, the instrument can be operated in either force
control or displacement control, with the crosshead in a fixed position.
This mode of operation takes advantage of the sub-nanometer resolution
of the capacitive displacement sensor in the NMAT.
It is also important to note that the drive mechanism of the extension

axis, while highly resolved is not particularly suited to fatigue operation.
One important consideration in fatigue tests is the reversibility of the
extension axis. Stick-slip and backlash in the drive mechanisms can
contribute to extension reversal errors. For this reason, fatigue tests with
the T150 should utilize the dynamic capabilities of the CDA option by
imposing the fatigue oscillation with the NMAT, rather than the
extension axis. If large strain amplitude fatigue testing is desired, please
contact Keysight to discuss optional extension axis configurations.
Finally, it should be noted that the standard extension axis incorporated

in the T150 has a travel of 200 mm selected as a compromise between
speed, lead screw pitch, spatial requirements and test requirements.
Longer or shorter travels can be obtained by incorporating different
motion systems. If higher resolution or longer travel is desired, please
contact Keysight to discuss optional extension axis configurations.

Theory 5
Operational Theory
Many test practices for the T150 are direct analogs of general industry
test practices. A good source for concerns regarding specimen
preparation, mounting, alignment, and test conditions is ASTM.
Individual standards can obtained from the ASTM website:
http://www.astm.org. The following sections offer a brief review of
some of the basic issues encountered when conducting micro or
nanoscale testing.
Sample Geometry
As sample sizes become smaller, fabricating the samples to have ideal

geometries becomes either unfeasible or complex. FIB, photoetch, and
micromachining techniques can be used as necessary. Such techniques
are particularly suited to testing freestanding films or MEMS
specimens. Other materials such as biological or polymeric fibers, or
fine metal wires, are generally tested in an as-fabricated or as-harvested
condition.
Grip Faces
The grip face is often a critical component of the test. It is advisable to

use a grip that will not create stress concentration, deformation, or flaws
where the grip face contacts the material.
The ideal grip will keep the specimen from sliding, but will not impose
significant deformation or create flaws in the specimen. Knurled grip
faces are common in traditional tensile testing, as are particular grip face
materials (polymeric faces for biological materials, leather grip faces for
cotton, etc).
Wires and fibers are often tested by wrapping the fiber around a
relatively large diameter before clamping the wire or fiber end.
Grip and Specimen Alignment
Grip and specimen alignment is an important part of tensile testing. The

"Micropositioner" assembly in the T150 system has been designed to
facilitate this process. There is a micropositioner available for the T150

Theory 5
system. This is a thumbscrew-driven x and y stage that enables for

precise grip and specimen alignment.
Slack Removal
Slack removal in tensile testing is analogous to surface detection in

Nano Indentation. It is the point when all slack in the specimen has been
removed and the loading of the specimen begins. Similar to Nano
Indentation, it is sometimes difficult to determine this point, especially
with very compliant materials. Subsequently, slack removal has to be
taken into careful consideration when designing the test methods for the
T150 system. As described in the “Tutorial” section of this manual,
slack removal is essentially defined as a very small increase in load on
the NMAT. When this load increase has been reached, the instrument
moves into its loading segment. One strategy can be employed for
compliant materials to prevent false slack removal detection. The user
can use NanoSuite software to manually kick the instrument into its
loading segment. This can be done so the user can watch the load on
specimen until it begins to increase, even if it is on the order of
micronewtons. Slack removal has been carefully considered in the
design of this instrument.
Contact Detection
Contact Detection, also referred to as surface detection, as referenced

above is analogous to slack removal in a tensile test. For the T150
system, this term will be used and referred to when in the “load
controlled” mode of the instrument. It is the point at which the NMAT
shaft comes in contact with the sample it is approaching. After contact
has been detected, the remainder of the test will be carried out. This
could be applied to compression, adhesion, three point bend, or any
other “load controlled” experiment. Contact is defined as a very small
increase in stiffness measured by the NMAT. This can either be a
quasi-static contact stiffness or a harmonic stiffness. Contact stiffness is
defined as the slope of the load vs. displacement curve. Harmonic
stiffness is measured using the CDA option.
Stress Concentration
Stress concentration is an important thing to consider in material testing,

especially when attempting to perform tensile tests. When approaching
a scale that the T150 tests on, it is very difficult to account for stress
concentration all together. Grips have been designed for the instrument
that help to minimize the amount of stress concentration that forms

Theory 5
where the specimen is mounted. These grips are discussed in "Grips" on

page 41.

Keysight UTM T150
User’s Guide
6
NanoSuite
NanoSuite and Windows 111
Software Compatibility 111
Upgrades and Service Packs 111
Networks and Virus Protection 111
NanoSuite Overview 112
Open NanoSuite 112
Terminology 112
Methods 112
Tabs 113
NanoSuite Help 113
Exporting Data 113
Importing Data 113
File Storage Locations 114
Navigating NanoSuite 115
Title Bar 115
Menu Bar 116
File Menu 116
Method Menu 120
View Menu 122
Test Menu 125
Configure Menu 126
Tools Menu 128
User Menu 129
Tip Menu 136
Export Menu 136
Mode Menu 137
System Menu 137
Help Menu 141
Tool Bar 144
Status Bar 146
Message Region 146
Test Counter 147
Instrument Status Region 147
Tabs 148
Test Tab 149
Review Tab 164
Define Tab 199
NanoSuite and Other Software 199
NanoSuite 6
The purpose of this chapter is to give you a general understanding of

NanoSuite software by describing the menus, windows, tabs, dialogs,
etc. NanoSuite is the software that is designed to interface with and run
the instrument. It is an amazingly powerful tool in its ability to
effectively control an experiment as well as measure and report accurate
results. It is capable of reporting experimental data real-time as well as
post-test results. Results that are reported post-test can also be
manipulated and changed according to the users need. For example, the
user can change an experimental input to see how the results would be
affected. Basic statistical analyses such as standard deviation and mean
can also be reported. Also, with the addition of NanoSuite Explorer, the
user can write their own test methods for any given application suited
for the instrument.

NanoSuite 6
NanoSuite and Windows
Software Compatibility
The operating system that NanoSuite is currently run on is Windows 7.

It is important to discuss the issues the user might run into when running
NanoSuite with this operating system. The user will receive a CPU with
their instrument that carries Windows 7, NanoSuite, Microsoft Office,
and Analyst. It is recommended that no other software is installed on the
CPU. This is to prevent any problems that might arise from potential
software incompatibility. Problems that arise with the CPU due to
installation of extraneous programs will not be covered under warranty.
Upgrades and Service Packs
It is safe to install upgrades and service packs associated with Windows

7 on the system. Also, Keysight may send the user NanoSuite upgrades
to install. However, the user should not reinstall the operating system or
NanoSuite without contacting Keysight. Problems that arise with the
CPU due to reinstallation of the operating system or NanoSuite without
the direction of Technical Support will not be covered under warranty.
Networks and Virus Protection
The CPU can be hooked up to a network; however, it is important that

the user ensure the virus protection is up-to-date. It is recommended that
the CPU not be used to browse the internet or check e-mail. This is the
safest way to prevent viruses from infecting the computer.

NanoSuite 6
NanoSuite Overview
Open NanoSuite
A good place to start is how to open NanoSuite. The NanoSuite icon is

on the desktop of the Windows 7 operating system. It is pictured below
in Figure 94. Double-click this icon to open NanoSuite.
Figure 94 NanoSuite desktop icon
Terminology
Throughout this text, references are made to samples and tests. Tests are
individual experiments run on a specimen. Samples are a grouping of
tests. For example, if ten tensile experiments were performed on ten
specimens and saved under the same sample file name there would be
ten tests that make up one sample.
To have a better understanding of how NanoSuite functions, it helps to

have a general understanding of Channels, Formulas, and Inputs.
Channels are values that are calculated for every data point that is
included in a test. They are continuous values. For example,
Engineering Stress is a channel that is calculated for every data point to
get a continuous curve plotting.
Formulas are singular values that are calculated from the test results. For
example, toughness is a formula that is calculated for a specific test.
Inputs are singular values that help to specify parameters that the test
will be run in. For example, Specimen Diameter is an input a test uses to
calculate results. Channels, formulas, and inputs work in conjunction to
run a test and produce results. They are referenced throughout this
chapter.
Methods
One of the most important things to understand about NanoSuite and its
interface with the instrument is the concept of methods. Methods are the

NanoSuite 6
programs in NanoSuite that run the instrument through a test. They are
the recipe that makes up any test that is run on the instrument. A good
understanding of what methods do is very important for a broad
understanding of the instrument itself.
There are a number of different methods that come standard with the
instrument. These are referenced in the “Tutorial” section of this
manual. Methods have associated PDF files that explain what each of
them do and how they work. Tensile methods can be found on the hard
drive of the CPU under C:\Program Files\ Keysight NanoSuite \
Methods \ Tensile. Read these PDF files over to have a good
understanding of what each of these methods do.
Tabs
The system is designed using three basic interface tabs: the "Test Tab",
the "Review Tab", and the "Define Tab". In combination, these tabs
drive the test system and provide a fast and simple platform for
processing collected data after the test has completed. These tabs are
discussed in detail in their respective sections of this reference.
NanoSuite Help
There are a number of sources of help available to the operator of

NanoSuite. First, if one holds the cursor over most items on the screen, a
short description will pop up. Second, on-line help will describe in
greater detail many functions of the software and is available by
accessing the Help Menu on the Menu Bar. Third, this chapter is
intended to give the most information about any feature. There is also a
NanoSuite Training Manual to guide you through setting up new users
and running test batches.
Exporting Data
Tests can be exported from NanoSuite into a *.txt file. The text file will
carry all relevant channel data for that test. This is to allow further
analysis of the data. Details are discussed in the "Menu Bar" section of
this chapter.
Importing Data
When a user wishes to analyze tests that were run using one method
with a different method, they can import that data into the new method.

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This will recalculate the data given the parameters of the new method to
which it was imported. Details are discussed in the "Menu Bar" section.
File Storage Locations
Method files, sample files, export files, and import files are all stored in
specific locations. When method files are saved, they are stored under:
C:\Program Files\ Keysight NanoSuite \ Methods
Sample Files are stored under:
C:\Program Files\ Keysight NanoSuite \ Samples
Export files are stored under:
C:\Program Files\ Keysight NanoSuite \ Export
Import files are stored under:
C:\Program Files\ Keysight NanoSuite \ Import

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Navigating NanoSuite
The "Test Tab" is the initial display window for the NanoSuite interface.
It consists of a "Title Bar", "Menu Bar", "Tool Bar", and "Status Bar".
The two other interfaces are the Review and Define Tabs, which can be
accessed by clicking the file tabs located just above the handset area (as
illustrated in Figure 95). All tabs have a Title bar, Menu bar, Tool bar,
and Status bar. These four items are discussed subsequently in the next
four sections.
Figure 95 Labeled NanoSuite interface
Title Bar
The title bar, as exemplified in Figure 96 on page 116, displays the

currently loaded sample and method as well as the standard controls
used to minimize, maximize and close active windows. The user cannot

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customize the title bar. The sample loaded in this case is “PP on
Template” and the method loaded is the Demo Tensile method.
Figure 96 Title bar for NanoSuite
Menu Bar
The test tab menu bar, shown in Figure 97, provides functionality
through the command structure located in the menu lists. Access keys
are designated by an underline on the initial letter of the command and
can be accessed with the key combination “Alt + (initial letter)”, for
example [Alt + “F”] to access the File menu. Unavailable commands are
dimmed. Command separators (lines) are used to group similar
commands. The test tab menu bar and the review tab menu bar are
virtually identical with the exception that all commands may not be
available for all applications.
Figure 97 Menu bar for NanoSuite
File Menu
The file menu, shown in Figure 98 on page 117, is used for clerical
purposes, such as creating, retrieving, archiving, or printing samples.

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Recent tests are also listed in the bottom section of the menu for
convenient access of the most recently run tests.
Figure 98 File menu and descriptions for NanoSuite
Print
The Print command, shown in Figure 99, is used to print tests and
samples. Tests are the individual runs inside each sample. Samples are
the groupings of these individual runs or tests. For the T150 system,
tests are run individually and are batched within samples.
Figure 99 Print command from File menu

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Print Preview
The Print Preview command, shown in Figure 100, is used to verify the
appearance of the printed item before it is sent to the printer
Figure 100 Print Preview command from File menu
Export
The Export command will either export a test, sample, or all tests in a
sample to a text file. For the T150 system, the only one of these that is
used is the Export > Test command, as shown in Figure 101.
Figure 101 Export a test from the File menu
This command exports all the data from a currently chosen test to a text
file for potential further analysis. The user cannot export samples and all
tests in a sample because the text files would be too large and
unmanageable with the amount of data that would be exported.
Import
The import function is a very powerful feature. It allows the user to

import data from another sample into the currently loaded sample. This
allows the user to recalculate a previously ran test, or tests, in a new
method. The most important use of importing is that it allows the user to
recalculate old data with a new method. If a change is made to a method,
old data can be recalculated with the new changes. Changes to methods

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can only be done by users with the NanoSuite Explorer option. Explorer
allows the user to modify and create their own test methods.
To import a NanoSuite Sample:

1 Select the Import... and From NanoSuite Sample... options from
the File menu, as shown in Figure 102.
Figure 102 Import options from File menu

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A dialog box will then be displayed, similar to that shown in Figure 103.
Figure 103 Select tests from the Import Tests dialog box
2 Choose a sample from the Select Sample drop-down list.
It is also possible to search for a given sample by clicking the Advanced

button and then browsing directories.
Once a sample has been chosen, the tests from that sample that the user
wants to import can be selected.
3 Click OK to import the selected tests into the currently loaded
sample.
This data is then calculated in the same fashion as the resident data.
Method Menu
The method menu, shown in Figure 104 on page 121, is used for clerical
purposes (storage and retrieval) of methods. It also provides printing
and previewing functions. A list of recently used methods is also

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provided. Any of these recently used methods can be clicked and will
subsequently be loaded.
Figure 104 Method menu
Print Method
The Print Method command, shown in Figure 105, will print either short
or detailed reports of the currently loaded method. Short reports only
contain the most important information from the method. Detailed
reports contain every piece of information contained within the method.
Figure 105 Options for Print Method command from Method menu

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Print Preview Method
This command, shown in Figure 106, is used to preview the printed

version of the method.
Figure 106 Print Preview Method options from Method menu
Edit Method
The Edit Method command, shown in Figure 107, allows the user to
make certain modifications to the method. Method modification is
primarily reserved for users with the Explorer level of the NanoSuite
software.
Figure 107 Options for Edit Method from Method menu
View Menu
The View menu, shown in Figure 108 on page 123, is a set of

commands that are used to manipulate the NanoSuite interface. It can be

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used to navigate through the tab pages, change the toolbar and system
configuration buttons, and restore screen default configurations.
Figure 108 View menu
View Commands
The commands to View Test page, View Review page, and View Define
page are used for toggling between the Test, Review and Define page
"Tabs".
Text and Icon Buttons
The Text Buttons command is used to change the System Control

buttons from icons to text, shown on the left in Figure 109 on page 124.

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The System Control functions are described in the "System Controls" in

the "Test Tab" section of this chapter.
Figure 109 Text buttons view (left) and Icon buttons view (right) for the
System Control buttons

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Conversely, use the Icon Buttons command to change the System

Control buttons from text to icons, shown on the right in Figure 109.
Toolbar Buttons
Toggle between Small and Large icon sizes for the Small and Large
Toolbar buttons.
Restore Screen to Method Save Configuration
This command re-sets the display configuration to the most current

saved configuration.
Reset Sashes to Default Positions
This command resets the sashes to their default positions. Sashes are the
partitions between the Systems Control buttons, the Input Panel screen,
and the Meters.
Test Menu
The Test menu, shown in Figure 110, is used to Run, Stop and Pause
tests. The Run, Stop, and Pause commands are analogous to the Go,
Stop, and Pause buttons in "System Controls".
Figure 110 Test menu
Next Test Segment
The Next Test Segment command kicks the test from one segment to the
next. Tests are partitioned into a number of segment types (i.e. Loading

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Segment, Hold Segment, Unloading Segment, etc.) This command will

kick the currently running test from one segment to the next.
Run Post-Sample
The Run Post-Sample command executes all test segments that are in
the Post-Sample section of the test flow.
Configure Menu
The Configure menu commands, as shown in Figure 111, are used to set
up devices, meters, statistics, the toolbar, review graph and real-time
graph. Workspace and grip separation commands are grayed out and are
not available.
Figure 111 Configure menu
Device
The Device... command allows the user to calibrate and configure

hardware channels (see Figure 112 on page 127). Certain hardware
channels include Extension, Raw Displacement, Support Spring
Stiffness, etc. The user should not attempt to configure any devices
without the supervision of a Keysight technician. Refer to "Contacting

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Keysight Technologies" on page 14 for contacting Keysight for

technical support.
Toolbar
The Toolbar... command is used to add additional functions to the

toolbar (see Figure 113). The system is distributed with a default set of
command icons, but more can be added to the toolbar with this feature.
The Separator icon is used to add lines to keep icon classes categorized.
Figure 113 Customize Toolbar window

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Tools Menu
The Tools menu, shown in Figure 114, is used to validate methods,

pre-allocate tests, and recalculate samples or tests.
Figure 114 Tools menu
Validate Method
The Validate Method command verifies that the current test method
settings are valid. A message box will inform you whether or not the
method is valid. If a method is invalid, the error messages can be viewed
from the Define tab. The Define Tab can only be viewed by users with
the Explorer level software.
Preallocate
The Preallocate... command creates a fixed number of blank specimens

within a sample file, using the current test method settings. This allows
the user to input all specimen parameters (i.e. Specimen Diameter) for
all specimens in a sample before testing. For example, if the user wanted
to measure and input the diameter of five specimens before testing them,
the Preallocate... command would work well.
Recalculate Sample
The Recalculate Sample command is used to recalculate an entire

sample for a given calculation change.
Recalculate Test
The Recalculate Test command is used to recalculate a test for a given

calculation change.

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User Menu
The User menu (Figure 115) allows the user to log in and out of
NanoSuite, change the login ID password, and assign user privilege
levels and properties to all available user login IDs.
Figure 115 User menu

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View Profile
The View Profile... command opens the User Configuration dialog in

read-only form, as shown in Figure 115. The user can view their current
settings, but cannot change anything.
Users
The Users... command will pull up a Users List dialog box (Figure 116)
that allows the user to create and edit user names, passwords, privilege
levels, and properties.
Figure 116 Select Users... command to open Users List dialog box
If the user clicks either the New, Copy…, or Edit button in the Users
List dialog box, an editable User Configuration window will open.
Parameters for a user may be set for each of the following tabs:
• General tab (on the left in Figure 117 on page 131)
• Directories tab (on the right in Figure 117 on page 131)
• Properties tab (Figure 118 on page 134)

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Figure 117 User Configuration General (left) and Directories tabs (right)
Follow these steps to configure the General tab of the User

Configuration dialog box:
1 Type a user name into the User Name text box.
2 Select the Method Access Level from the drop-down menu.
Method Access Level is a number between 0 and 9. In order to access a

method, the user’s access level must be equal to or greater than the
access level defined by a test method. Method Access Level is defined
under the Define tab. The Define Tab can be viewed if the user has the
Explorer level software.
3 Select the User Privilege level from the drop-down menu.

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Adjust the User Privilege setting to manage the access a particular user
has to NanoSuite by assigning a User Privilege level. The following
table describes the features of each privilege level.
Operator An Operator can run tests and enter the values of inputs that are
required by the test method.
Editor An Editor cannot access the Define page but can edit test method
settings. However, an Editor cannot add or delete parts of a test
method.
Definer A Definer can access the Define page, and add or delete test segments
from a basic set of test segments. A Definer can also add/delete basic
data channels, inputs and formulas.
Creator A Creator can access the Define page, and add or delete test segments,
inputs, formulas, basic data channels, and formula channels.
Privilege levels are primarily important to users with the Explorer level
NOTE
option. Users with the Professional version of the NanoSuite software will
have limited editing capabilities in NanoSuite. The highest user privilege
associated with the Professional level of the software is the Editor
privilege level.
The Professional version of the software has a limited variety of these
capabilities. The Professional level of the software is capable of deleting,
editing, and adding inputs. It is capable of creating or deleting a limited
numbers of formulas and adding hardware channels. It is also capable of
enabling or disabling test segments in the test flow.
4 Select the Post Login Action from the drop-down menu to determine
what will appear after the user has logged in.

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If you have selected Load Default Method as the Post Login Action,
then type the desired method name into the Default Method text box.
You can click on the Browse button to locate the desired method.
5 Select the Language from the drop-down menu. The menu will list
all available translations.
6 Click on the Password button to open the Change Password for...
dialog box. This dialog allows you to change the user’s password.
Click on the Help button within this dialog box for more
information.
7 Configure the Directories and Properties tabs using the following
procedures.
Follow these steps to configure the Directories tab (right side of

Figure 117 on page 131) of the User Configuration dialog box:
1 In the Data Directory text box, type the path for the Data directory.
a Click on the Browse button to locate the desired directory, or
b Click on the Browse button to create a new directory.
2 Type the path for the Export directory into the Export Directory text
box.
3 Type the path for the Method directory into the Method Directory
text box.
4 Type the path for the Import directory into the Import Directory text
box.

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Follow these steps to configure the Properties tab (Figure 118) of the
User Configuration dialog box. For each property, select the appropriate
check boxes as needed for each user ID.
Figure 118 Properies tab of User Configuration dialog box
The table below describes the options in the Properties tab:

Property Description
Change Directories The user may change directories when attempting to save or
open NanoSuite files.
Change User Interface The user may move window sashes, edit the meter configuration,
change the machine control panel settings, edit the toolbar
buttons, and modify the graphs.
Test The user may access the Test page.
Review The user may access the Review page.
Edit Available if Review is selected. The user may make changes to

Editable Post-Test inputs.

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Property Description
Delete Specimen Available if Review is selected. The user may delete entire
specimens and specimen raw data.
Change Own Password The user may change his/her password by selecting the User... >
Change Password menu item.
Manual Validation The user must manually validate a test method when desired.
This property improves the speed of NanoSuite. When this item
is not checked, NanoSuite validates the method each time a
change is made to the test method.
Validate on Save Available if Manual Validation is selected. NanoSuite will
automatically validate the test method when the user saves the
method.
Change a Reference The user may change the warning, error, and target values of a
Reference file.
Create a Reference The user may create a Reference file from a sample file,
including setting warning, error, and target values.
Create Sensors/Devices The user may add, edit and delete devices, such as, load cells
and extensometers.
Supervisor The user may add, edit and delete user IDs.
Can Truncate Data The user may remove a portion of specimen data by using the
Truncate Data option on the right-click menu of the Review
Graph. Data is then removed from the crosshair position to the
end of the curve.
Can Truncate Data The user may permanently remove portions of specimen data by
Permanently using the Truncate Data option on the right-click menu of the
Review Graph.

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Tip Menu
The Tip menu (Figure 119) allows the user to select the tip for an
experiment.
Figure 119 Tip menu
To select a tip, choose Select Tip from the Tip menu to open the Select
Tip dialog box as shown in Figure 120. Select the tip from the
drop-down menu and click OK.
Figure 120 Select Tip dialog box
Export Menu
Use the Excel menu, shown in Figure 121 on page 137, for exporting
the sample to MS Excel. The data can then be manipulated and/or

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disseminated through Excel. This exports the entire sample to Excel.

Keysight has created a data analysis program called Analyst that works
in conjunction with Excel. Excel and Analyst are discussed in
"NanoSuite and Other Software".
Figure 121 Export (Excel) menu option
Mode Menu
The Mode menu commands, shown in Figure 122, are used to switch
between batch and individual modes. The T150 system only runs in
individual mode. The user should keep NanoSuite in this mode.
Figure 122 Mode menu
System Menu
The System menu, shown in Figure 123, is used for diagnostic functions
such as the CSM Control Panel, the Displacement Control Panel, the
Print Cal Control Panel, and the Tensile Tester Head PID Control Panel.
Normally, these items should only require access by the user when
prompted by an authorized Keysight service technician.
Figure 123 System menu

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CSM Control Panel
The Continuous Stiffness Measurment (CSM) control panel

(Figure 124) is used for setting parameters for the CDA option. The
CDA option is discussed further in Chapter 8, "Indentation".
Figure 124 CSM Control Panel option from System menu
Displacement Control Panel
The Displacement Control Panel, shown in Figure 125 on page 139, is

used to manually move the position or displacement of the NMAT shaft.
Below is a schematic of the Displacement Control Panel and its
functions. Refer to "NMAT" on page 98 in Chapter 5, "Theory" for

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further discussion about the NMAT and the capacitive displacement

gage.
Figure 125 Displacement Control Panel option from System menu
PrintCal Control Panel
This option displays the Print Calibrations Dialog box, as shown in

Figure 126 on page 140. As can be seen, the user can print out the data,
plots, or both of all the calibrations that are applicable to the instrument.
The calibrations that can be seen are CSM (CDA option), Displacement,

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Load, Support Spring Stiffness, X Force - Y Force, X Position - Y

Position (Indentation methods).
Figure 126 Print Calibrations Dialog box
Tensile Tester Head PID Control Panel
This option, shown in Figure 127 on page 141, sets the PIDs that control
the NMAT in its zero-displacement mode.
Do not change the PID settings unless informed to do so by a Keysight

NOTE
technician.

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Figure 127 Tensile Tester Head PID Control Panel
PIDs are the Proportional, Integral, and Derivative gains that control the
NMAT in this specialized mode. For more information on the
zero-displacment mode and PIDs, please reference Chapter 5, "Theory".
Help Menu
For NanoSuite, the Help menu, shown in Figure 128 on page 142, is
designed to help the user search for specifics on certain topics, view the
version and build number of the current NanoSuite software, and also to

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view the directory paths for all files and information associated with the
software.
Figure 128 Help menu
Topics
This option allows the user to query specific topics in NanoSuite (see
Figure 129 on page 143). You can also look through the Help Index or

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read through the Contents of the Help files. The Help menu is a good
learning tool for the NanoSuite software.
Figure 129 Topics option from Help menu

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About
This option allows the user to access a number of properties of the

NanoSuite software that is currently installed. The most important of
these is the version and build number of NanoSuite. Note that About can
also be accessed using the About NanoSuite icon from the "Tool Bar".
The build numbers represent various upgrades and improvements in the

software. Build numbers increase with upgrades. The System Options
button displays different installed options for the instrument. These are
set by Keysight and cannot be changed. The only information that the
user needs to be familiar with is the version and build number of the
software.
View Paths
This option, as shown in Figure 130, shows directory paths for all files
and references associated with the NanoSuite software. Directory
settings are discussed in "Users" on page 130.
Figure 130 View Current Path Settings dialog box
Tool Bar
The Tool bar, shown in Figure 131, consists of a set of useful icons that
provide quick access to commonly used functions, the uses of which are

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detailed in the table below. The functions are also available as items on
the drop-down menus on the "Menu Bar".
Figure 131 Tool Bar
New Sample Use this icon to start a new sample.
Open Sample This icon allows the user to open a previously run sample.
Save Sample This icon allows the user to save a sample and will display the
standard. Windows file structure for storing the file in the
folder of your choice.
Open Method This icon will open a previously installed method.
Save Method Use this icon to save a method after it is defined (for later use).
Print Sample This icon prints the currently loaded sample
About This icon will provide information concerning NanoSuite. This

NanoSuite icon displays the same dialog as using the Menu item Help and
choosing About. Refer to the "Menu Bar" section.
Batch Mode Use this icon to switch to batch mode. This is not used by the
T150 system.
Individual Mode Use this icon to switch to individual mode. This is the only
mode that the T150 system runs in. It only runs tests of
individual specimens. It does not perform batches of tests on a
specimen.

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Excel Output This icon outputs data to Microsoft Excel for data
manipulation.
Exit Use this icon to exit the software.
Stop Located at the far right of the toolbar, this button provides easy
access to the fail-safe Stop button which can be used to
terminate a running test or stop the motion of the Extension
Axis.
Additional command icons are available by choosing Configure >

Toolbar... from the "Configure Menu".
Status Bar
The status bar, illustrated in Figure 132, gives information about the
system and certain devices. There are three different compartments that
are used to relay this information.
1 "Message Region"
2 "Test Counter"
3 "Instrument Status Region"
Figure 132 Status bar
Message Region
Whenever NanoSuite is performing an action, it will display a message

in this region. Typical messages include: •
• Loading sample…
• Calculating…
• Method is valid.

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It will also tell the user what each of the "System Controls" do. Typical
messages include:
• Move the crosshead down
• Stop the test NOW!
If the Review graph is displayed in the tracking mode, this region will
display the value of the raw data point where the cursor is located. For
more information on System Controls, refer to the System Controls part
of the "Test Tab" section of this chapter. For information on the tracking
mode of the Review graph, refer to the "Graph Region "part of the
"Review Tab" section of this chapter.
Test Counter
This region displays the total number of specimens that have been tested
within the sample. It will also inform the user if there is either a test
running or if the system is idle. For example, if 6 tests have been run
within the sample and the system is idle, this section will read Tests: 6.
If 6 tests have been run within the sample and the system is running, this
section will read Running: 7.
Instrument Status Region
There are two instrument status indicators on the T150 system. Place
your mouse over the top of each of them and the information about that
indicator will pop up.
The left side of the Instrument Status indicator displays the Extension
Axis indicator. Gray means the motor is not enabled or not moving. If
the user holds the cursor over this indicator it will read Extension:
Motor is not enabled. White means the motor is moving. If the user
holds the cursor over this indicator it will read Extension: Motor is
moving.
The right side of the Instrument Status indicator displays the indenter
head or the NMAT indicator. Green means that the NMAT is parked. If
the user holds the cursor over the indicator, it will read The indenter
head is parked. Yellow means that the NMAT is not parked. If the user
holds the cursor over the indicator, it will read The indenter head is not

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parked. For more information about the NMAT, refer to "NMAT" on

page 98 in Chapter 5, "Theory".
The two figures below illustrate how the Status Bar is used. In
Figure 133, the instrument is running its third test within the sample.
The Extension Axis is moving and the NMAT is not parked. The cursor
is being held over the left indicator and a message is being displayed
that the Extension: Motor is moving.
Figure 133 Instrument running third test within the sample
In Figure 6-44, Nine tests have been run within the sample and the
instrument is idle. The Extension Axis is not moving and the NMAT is
parked.
Figure 134 Idle instrument after 9 tests within the sample
Tabs
The system is designed using three basic interface tabs as shown in

Figure 135:
1 "Test Tab"
2 "Review Tab"
3 "Define Tab"
In combination, these tabs drive the test system and provide a fast and
simple platform for processing collected data after the test has
completed.
Figure 135 Interface tabs
The Test Tab is the default page for NanoSuite. It is where tests are run
and the instrument is physically controlled. The "Review Tab" is where

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post-test data can be viewed and analyzed. In individual mode, the

"Define Tab" is where methods can be written and revised. This is only
for users with the Explorer level option of NanoSuite. For the T150
system, the user will never be in batch mode.
Test Tab
The Test Tab is the default page for NanoSuite. It is where tests are run
and the instrument is physically controlled.
The "System Controls" (Figure 136) are the buttons on the left panel of
the Test tab window. There is a menu that is accessed by right-clicking
in the Test tab. A description of each button can be viewed by holding
the mouse over the button without clicking.
Figure 136 System Controls section of Test tab window with right-click
menu displayed

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System Controls
The left panel of the Test tab displays the control buttons. These buttons
are described in detail in the following table:
Run the test Once the sample has been prepared and mounted in the
system, this button is used to initiate the test sequence. Always
remember to remove the Locking Pins from the tensile column
before beginning the test.
Stop the test This button will stop the test if the need should arise. There
NOW! may be test circumstances where the user will want to stop the
test. It is important to be aware of this button as it will stop the
extension axis if it is coming dangerously close to crashing into
the NMAT. This will stop the instrument immediately.
Move the Clicking this button, aka the GoTo button, the crosshead can be
crosshead to a moved to a user-defined, specific position. See warning and
specified text below. Note he command can be stopped in situ by hitting
position the Stop button.
Return the Hitting this button will return the crosshead to its zero
crosshead to position. This means that whatever the Extension channel
zero position value is at that time, the crosshead will move down until this
Extension channel value reads 0. The user must be careful
when hitting this button to avoid crashing the crosshead into
the NMAT. The command can be stopped in situ by hitting the
Stop button.
Pause the This button pauses the crosshead at its current position when
crosshead clicked. If the user has hit the Return button or the GoTo
button, this will pause the command.
Move the Activating this button will move the crosshead up. This is done
crosshead up when there is no test being run.

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Move the This control button will move the crosshead down when there
crosshead down is no test running. The user should take care not to run the
extension axis into the NMAT. This will damage the head.
When the Move the crosshead to a specified position button is clicked,

a dialog box will open. Specify the position in the Enter GoTo Value
dialog box, shown in Figure 137 on page 151. Note that this is a GoTo
value referenced to the Extension channel. If the current Extension
value is 100 mm and the user enters 20 mm, the crosshead will move
down 80 mm to the absolute value of 20 mm.
Figure 137 Enter GoTo Value dialog box
The user must be careful when entering the value so as not to crash the
CA U TI O N crosshead into the NMAT. Again, this is not a relative value, it is an absolute one.
The command can be stopped in situ by hitting the stop button.
The handset speed can be set by right-clicking in the system controls

area. Select Speed Mode, then select either Ramp Speed Mode or
Fixed Speed Mode as shown in Figure 138.
Figure 138 Handset right-click menu
For the T150 system, there is no difference between these two speed
modes. The instrument is always in the Ramp Speed Mode regardless
of which of these speed modes is checked. Ramp Speed Mode means
that the crosshead will begin at zero speed when you initially depress a
direction button. The crosshead speed will increase while the direction

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button is depressed, until the maximum speed of the machine has been
reached.
The user must be careful when initializing the Extension Axis. If the crosshead is
CA U TI O N attached to the lower end of the crosshead adapter plate, the crosshead
assembly can crash into the NMAT and damage it.
Select Initialize (Figure 138 on page 151) to initialize the Extension

Axis. The NanoSuite software brings it down from its current position to
its bottom range of travel. When the Extension Axis reaches its bottom
range of travel, the software tares the Extension channel in NanoSuite.
When Initialize is selected, a warning will be displayed as shown in

Figure 139. Check the system to avoid damage.
Figure 139 Handset warning for initialization
Input Panel
The right panel of the Test tab displays the Input Panel that includes
options used to configure the system. If in the individual mode on the
Input Panel region of the Test Tab, the inputs for the resident method
will be displayed and can be modified. The T150 system always runs in

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individual mode. Right-click in the Input Panel area to display the menu
as shown in Figure 140.
Figure 140 Input panel with right-click menu options
Note the panel will change as other input commands are chosen from
the menu. The user can view all the different types of inputs for the
method. Inputs are organized in a number of different ways. These
include:
• Required Inputs
• Display Only Inputs
• Editable Post-Test Inputs
• Result Inputs
• Panel Inputs
• Batch Inputs

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• Internal Use
• Hold Segment Inputs
• Unload Segment Inputs
• Data-Acquisition Inputs
• Oliver Pharr Constants
• Segment Types
• Reported Test Inputs
• Reported Calculation Inputs
• Plot Scaling Inputs
As can be seen in the figure above the right-click menu has four options
at the top for editing the inputs. These options include:
• Edit…
• Set current value as default
• Set all current values as defaults
• Input Order…
Note the Professional level of the software is capable of adding,

deleting, and editing test inputs. The details of this capability are
discussed in the Explorer level reference.
Real-Time Graph
Once the test is initiated, by clicking the green Go button, the "Input
Panel" region displays an overlay of the real-time graph, which gives a
continuous development of all available channels while the test is being
run.
Initially, while this system is going through the slack take-up segment,
the input panel region will display, as shown in Figure 141 on page 155.
The run-time message dialog and the next test segment button are part
of the real-time graph. The run-time message tells the user what the
instrument is doing and the next test-segment button will kick the test
into the next segment (i.e. loading, unloading, etc.) For more details on

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the different test segments of a standard tensile experiment, reference

Chapter 5, "Theory".
Figure 141 Input Panel region during initial stage of testing
The real-time graph has a right-click menu that allows the user to
change the properties and display. This includes the ability to look at a
variety of different channels and also to change the scaling of the
real-time graph to get a better picture of material response. Note that

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Channels are data that is taken continuously throughout the entire

course of the test. This menu is illustrated in Figure 142.
Figure 142 Real-time graph displaying right-click menu
Y-Axis Channel. This item will allow the user to choose from a variety
of different channels to set as the Y-axis in the real-time graph.
Y-Axis Units. This item will allow the user to change the units of the
channel that is set for the Y-axis.
X-Axis Channel. This item will allow the user to choose from a variety
of different channels to set as the X-axis in the real-time graph.
X-Axis Units. This item will allow the user to change the units of the
channel that is set for the X-axis.
Properties. The Real-Time Graph Setup dialog box consists of a

Scaling, Appearance, Styles, and Previous Curves tab. The Scaling,
Appearance, and Styles tabs are discussed in the Properties section of
the "Review Tab" section of this chapter.
The Previous Curves tab is shown in Figure 143 on page 157 and is
described below. The Curves tab contains the above dialog that is used

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to configure the graph. From this dialog you can set up the display of
previously run test curves on the graph with the currently running test.
Figure 143 Real-Time Graph Setup dialog box
Display the first curve in the sample. Select this check box to display
the first curve in the sample on the real-time graph along with the
currently running test. This allows you to compare the current test with
the first in real time.
Display most recent test curves. Select this check box to display a
number of the most recently run test curves in the sample on the

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real-time graph along with the currently running test. This allows the
user to compare the current test with previously run tests.
The following figures (Figure 144, Figure 145, and Figure 146 on
page 159) show typical curves for stress strain, load versus time, loss
modulus, and storage modulus.
Figure 144 Typical stress strain curves for polypropylene fiber (curve on
right has Hold for Relaxation at 400% strain)
Figure 145 Load vs Time for polypropylene showing stress relaxation at

end

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Figure 146 Typical Loss Modulus (left) and Storage Modulus (right) for
polypropylene
Meters
Real-time meters may be configured and displayed at the lower portion

of the test tab page. The menu for the meters is accessed using a
right-click in this section of the test page. This right-click menu, shown
in Figure 147, is used to set up the meters and includes commands to
zero the channel, configure channels, set the decimal places of the meter
display, change the units displayed, remove meters, add meters and set
the display properties of the meters.
Figure 147 Meter example and right-click menu

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Zero Channel. Use this command to zero (tare) the channel (see
Figure 148). Currently, the only channel that can be tared or zeroed is
the Time channel.
Figure 148 Select Zero Channel from the right-click menu
Configure. Use this command to configure the channels (see

Figure 149). This choice displays the channel definition window where
many aspects of a channel can be modified.
Figure 149 Select Configure > Channel from the right-click menu
Users with the Professional level of NanoSuite will have limited

configuring capabilities. These include changing the display name,
changing the unit class, changing the unit type, changing the export
order of the channel, changing the number of decimal places for that
channel, choosing whether the channel is calculated, inverting the

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channel polarity, changing the channel description, and choosing the

channel notation.
Decimal Places. Use this command to change the number of decimal

places displayed by the meter, as shown in Figure 150.
Figure 150 Select Decimal Places from the right-click menu
Units. Use this command to change the units displayed by the meter, as
shown in Figure 151.
Figure 151 Select Units from the right-click menu
Add Meter. Any channel defined in the method can be selected and
displayed as a meter, as shown in Figure 152. The Add Meter item can

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be chosen to display any of these channels in the Meter section of the

Test Tab.
Figure 152 Select Add Meter from the right-click menu
Properties. The last choice in the menu is Properties. Select Properties

from the right-click menu to display the Meter Configuration dialog

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box, shown in Figure 153, which may be used to choose which meters
to display, as well as display options.
Figure 153 Meter Configuration dialog box
The functional components of the Meter Configuration dialog are

described below:
• Update Example: This previews the meters in the Example box
based on the user’s style selections.
• Foreground Color: This item selects the color of the meter text.
• Background Color: This item selects the color of the meter.
• Show 3D: This displays the meter as a 3-dimensional image and can
be viewed in the Example box.
• Display Channel Names: When this item is selected the name of the
channel is displayed above the meter.

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• Display Sensor Names: When this item is selected the name of the
device for that specified channel is displayed above the meter. For
more information about devices, refer to the part of the "Menu Bar"
section that discusses configuring devices.
Review Tab
The Review tab page, shown in Figure 154, is accessed from other
pages by clicking the Review tab (located under the tool bar) or by
selecting the command from the "View Menu" item. This page is used
for reviewing the data collected from tests. The "Title Bar", "Menu
Bar", "Tool Bar" and "Status Bar" are discussed in their own separate
sections of this chapter.
Figure 154 Review tab
Legend Pane
The Legend Pane is the panel that appears to the left of the "Graph
Region "of the Review Tab. There are a number of options in this panel
for viewing and manipulating the results of each individual test in the

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sample. The Legend Pane includes three sub-sections: Legend,

Warning, and Comment. The Comment sub-section is not used for the
T150 system.
Legend. In the example in Figure 155, test number 2 is highlighted in

the Legend subsection of the Legend Pane. There are also check marks
in the boxes aside tests number one, two, and three. Highlighting a test
in the Legend Pane will make that test active. The curve of the active
test is then displayed in the Graph Region, and its results appear in the
Inputs/Results Region.
Figure 155 Legend Pane on left with Graph Region on right
The user can display inactive tests in the Graph Region by placing a
check mark next to that test number. In the example in Figure 155, test
number 2 is active and test numbers 1 and 3 are inactive but are
displayed in the Graph Region. The active curve in the Graph Region is
the only curve with markers attached. The legend in the Graph Region
allocates the active test with a set of brackets. Markers are discussed in
the “Tutorial” section.
Warning. A warning is placed when a test is stopped for any reason, a

test number has been tagged, tests have been imported to the sample,
etc. A test can have multiple warnings. A test’s first warning, or error
message, is displayed beside the test number within the Legend Pane.
There are a number of Test Icons that appear between the check boxes

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and test numbers for each specimen. The following table shows each of
these icons and their meaning.
Icon Type of Icon Description
Test This is the basic icon, which represents a specimen that has
been tested.
Has Data This icon indicates that raw data associated with the test on a
specimen exists. Since the raw data is used to create the
Review graph, a graph cannot be displayed for the specimen if
the Has Data Icon is not present.
Tagged This icon indicates that the test has been selected for
exclusion. The results of a tagged specimen are not included in
statistical comparisons performed by NanoSuite. Statistical
comparisons are made in the Results Region of the Review Tab.
These are discussed in the Results Region section of this
chapter.
Pre-allocated This icon indicates that the test is preallocated. A preallocated

Test test is a test that has been created, but not run by NanoSuite.
After the test has been run, its icon will change. The details of
preallocating a test are discussed in the "Menu Bar" section.

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A right-click menu is available for each specimen within the Legend

Pane. Right-click on any specimen icon and this menu will appear, as
shown Figure 156.
Figure 156 Legend pane right-click menu
Select All Tests. This menu item selects all of the tests within the
legend so that their curves will appear in the Graph Region. A check
mark will appear beside each selected specimen icon.
Deselect All Tests. This menu item deselects all of the tests within the
legend, leaving only the active test to appear in the Graph Region.
NOTE: The active test will be highlighted in the Legend Pane. All of the
check marks beside the specimen icons will disappear.
Tag Test. The Tag Test menu item selects a test whose results will not
be included in the statistical calculations. Statistical calculations for the
tests are discussed in the "Results Region" section of this chapter.
A check mark appears beside the Tag Test menu item when the specimen
NOTE
has been tagged.

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Recalculate Test. This menu item recalculates the results of the active
test.
Recalculate Sample. This menu item recalculates all results for the
entire sample.
Continue Testing. This menu item restarts a test that has been stopped
prematurely. For example, if the user presses the Stop button before a
test has completed because of a problem with the specimen in the
instrument, this item can be chosen to carry out the remainder of the
aborted test.
Edit Comment. This dialog is not used with the T150 system.
View Warnings. As stated above, a test’s first warning message appears

beside that test in the Legend Pane. However, there can be more than
one warning for a test. The View Warnings right-click menu item opens
the Warnings dialog for your selected test. You can view all of the
warnings associated with the test by opening the Warnings dialog.
This menu item will not appear when there are no warnings for the
NOTE
selected test.
Properties. Figure 157 on page 169 shows a Sample Properties dialog

box. This dialog allows the user to see the traceability information for a
sample, method, and its tests. The traceability of a sample, method, or
test is a timestamp that contains the date, time, customer name, system
and site numbers, user name, and software version under which a
sample or test was either created or modified. For tests, the timestamp
information is also recorded when a test is imported.
The Sample Properties dialog box has three tabs:

• The Sample tab allows the user to view the timestamps for the
currently loaded sample.
• The Method tab allows the user to view the timestamps for the
currently loaded method.
• The Tests tab allows the user to view the timestamps for all tests
within the currently loaded sample.

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To switch between tabs, simply click on the name of the tab.
Figure 157 Sample Properties dialog box
To change which timestamp is being viewed, use the selection buttons

located in the Mode group. The four modes are: General, Creation,
Modification, and Import. For a sample, the General category reports
the amount of computer memory used by the numeric data stored in all
tests of the sample. The number reported is in either MB (megabytes) or
kB (kilobytes). For a method, the General category reports the name of
the method the current method is derived from (if there is one) and if the
current method is a master method or not. For a test, the General
category reports the computer memory consumed by only that test’s
numeric data and the number of data points stored per channel in that
specimen. The Creation, Modification, and Import categories display
information for that timestamp. All data is displayed in the list view
located to the right of the Mode group.
When the user is in the Tests tab, a drop-down list and two buttons will
appear. The drop-down list allows the selection of which test’s data is
displayed. To move through the available tests, the arrow buttons are

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used. The left arrow moves to the previous test, and the right arrow
moves to the next test.
The Print button will print a report of all the timestamp information for
the tests, the method and the sample. The Print Preview button will
display the report in a text editor instead of printing it.
Export Specimen. This menu item writes a test export file based on the
settings made in the Test Export configuration item of the test method.
After a test has been exported, NanoSuite will have a dialog in the
Message Region of the Status Bar. An example of this dialog can be
seen in Figure 158. For more information about the Status Bar refer to
the "Status Bar" section
Figure 158 Message in Status Bar for Test Export
Print Test. This menu item prints a test report based on the settings
made in the Test Report configuration item of the test method.
Delete Curve Data. This menu item deletes the curve data of the
selected test. A dialog box will appear to verify that the user wants to
delete the curve data as shown in Figure 159.
Figure 159 Delete Curve Data dialog box

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Delete Test. This menu item deletes the selected test from the sample.
The dialog box shown in Figure 160 will appear to verify that the user
wants to delete the test.
Figure 160 Test Deletion warning dialog box
Delete All Tests. This menu item deletes all of the tests from the
sample. The dialog box shown in Figure 161 will appear to verify that
the user wants to delete all of the tests.
Figure 161 Deleta All Tests warning dialog box
Delete All Tagged Tests. This menu item deletes all of the tests that
have been tagged. The dialog box shown in Figure 162 will appear to
verify that the user wants to delete all of the tagged tests.
Figure 162 Delete All Tagged Tests warning dialog box

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Graph Region
The Graph Region displays the selected channel data for the test
selected in the "Legend Pane". As shown in Figure 163, there are
colored markers on the graph. The markers denote a variety of values
from zero displacement marker, peak stress marker, offset yield stress
marker etc. Markers are referenced throughout this section. Marker
definitions are discussed in Chapter 7, "Tensile Testing Tutorial".
Figure 163 Graph Region

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Right-clicking in the area displays the following menu items, shown in

Figure 164. The menu is accessed with a right-click within the graph
window on the "Review Tab".
Figure 164 Graph Region right-click menu
Reset. This menu item returns the Review graph to its original scale.
Scaling is set in the Properties menu item and is discussed later in this
section.
Crosshair. This menu item enables and disables the Review graph
crosshair. The crosshair allows you to identify individual data points. It
is enabled by default. A check mark beside this menu item means that
the crosshair is enabled.
Tracking. This menu item enables and disables the crosshair’s tracking
feature. This feature causes the crosshair to follow your mouse pointer
as you move the pointer along your graph. The tracking feature is

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enabled by default. A check mark beside this menu item indicates that
tracking is enabled.
Add. Use this command to add text and/or text plus an arrow to
highlight important features on the graph (see Figure 165).
Figure 165 Use Add command
After either text, an arrow, or both have been added to the Review graph
as illustrated above, they can be moved to a desired location. To move
text, simply click and drag the text to the desired position. Note: Be sure

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to place your text within the area created by the x- and y-axis. All text
outside of this area will disappear. To move an arrow, click on the tip of
the arrow. A dotted box will appear around the arrow. Position the
dotted box so that the tip of the arrow is pointing to the desired location.
Click on the tail of the arrow and drag it to the desired position as well.
If there is text associated with the arrow, it will move with the arrow as
it is positioned. To edit or delete text or an arrow, simply right-click on
the item and select either Delete or Edit.
Zoom. This menu item will display all Zoom objects in the current
method. To execute one of the listed Zoom objects, simply select it from
the menu, as shown in Figure 166. Zoom objects are added to the
method by the Review Graph Zoom To Region page. This is discussed
in the Properties section below.
Figure 166 Zoom command to rescale for loading data
Gridlines. By selecting the gridlines check box, the user can have the
graph be displayed with gridlines connecting the major tick marks.
Line Display. This option allows the user to choose what type of graph
NanoSuite will produce. As shown in Figure 6-81, there are three
choices:
• Lines Only
• Lines and Points
• Points Only

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Figure 167 Line Display options from graph right-click menu
In Lines Only mode, all data points on the graph will have a line
connecting them, but will not have a point character denoting every data
point. In Lines and Points mode, all data points will have a line
connecting them, and every point will be denoted by a point character,
as shown on the right in Figure 168. In Points Only mode, data points
are not connected by a line, but each point is denoted by a point
character, as shown on the left in Figure 168.
Figure 168 Examples of graph with Points Only (left) and Lines and Points
(right)

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Legend. Selecting this command displays the legend box (shown in

Figure 169). Clearing the checkmark removes the legend.
Figure 169 Select Legend for display on graph
Truncate Data. This item allows the user to remove a portion of test
data from the Review Graph. Data is removed from the crosshair
position to the end of the curve (see Figure 170).
Figure 170 Truncate Data option
Channels and Units. The Channels and Units commands are used to set
the Xand Y axes of the graph to the desired settings. There are a number

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of settings available in NanoSuite, as illustrated in the following

examples in Figure 171 and Figure 172.
Figure 171 Select the Y Axis Channel (left) and Y Axis Units (right)
Figure 172 Select the X Axis Channel (left) and X Axis Units (right)

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Review Page Settings. The Review page settings can be configured

with the following menu items (see Figure 173). The Properties menu
item is discussed below.
Figure 173 Review Page Configuration options
Properties. Use the Properties option to set the graph parameters. Using
this option, the user can set the Y and X axis variables, the units they are
displayed in, and whether multiple channels are used. The Real-Time
Graph setup, discussed in the "Real-Time Graph "section, has the
Scaling, Appearance, and Styles tabs as well. These are discussed
below.
Using the Scaling tab, the user can set the Y and X axis variables, the
units they are displayed in, and whether multiple channels are used.
• Axis Scale Selection. These controls allow the minimum maximum
values of an axis to be configured. If the checkbox is clear, then the
user can enter the maximum value the axis should display. The value
entered should be in the units selected for the axis. If the checkbox is
selected, then NanoSuite will automatically select the values of the
axis such that the curve data is always in view.
• Axis Channel Selection: Select the channel to be displayed from the
list of channels in the top drop-down menu. This menu will contain a
list of all channels that are not hidden. When a channel is selected,
the bottom drop-down menu will fill with the available units of the
selected channel. Select desired display units in the list.
• Multiple Curve Selection: To display multiple curves on an axis,
select the Multiple Channels checkbox. Note: Only one axis can
display multiple curves. If one axis has the Multiple Channels option
selected, then the Multiple Channels checkbox is disabled for the
other axis. Once the Multiple Channels option has been selected,
press the Select button to configure which channels are displayed.

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• Multiple Curve Plotting: Multiple channels can be plotted on either

the Y or the X axis. To enable multiple curve plotting for an axis, use
the channel drop-down menu to select a channel that has the same
units class of the multiple curves for a desired plot. Then, select the
Multiple Curves checkbox. The Select button will now be enabled.
Clicking the Select button will produce the dialog shown in
Figure 174.
Figure 174 Configure Channels dialog box
The Available list on the left shows all channels that have the correct
unit class and are not hidden. The Selected list on the right shows all
channels that will be displayed on the Review Graph. To have a channel
be displayed on the Review Graph, use the Add button or double-click
the name of the channel in the Available list. This will cause the channel
to move from the Available list to the Selected list.
To keep a channel from being displayed simultaneously with other

channels, use the Remove button or double-click the name of the
channel in the Selected list. This will cause the channel to move from
the Selected list to the Available list.
After multiple channels have been set up for the Graph Region, the
right-click menu displays an extra item that allows the user to specify
which channels are active. Multiple channels can still be viewed in the
Graph Region, but the active channel will carry the experiment markers

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and the crosshair. The user can choose the active channel as shown in
Figure 175.
Figure 175 Active Channel right-click menu
In Figure 176, the two graphs displayed on the screen are True Strain
and Engineering Strain as indicated in the legend. The active channel is
Engineering Strain as specified by the brackets in the legend. The curve
with the markers and the crosshair is active, yet both can be seen on the
graph.
Figure 176 Graph with multiple channels

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The Appearance tab, shown in Figure 177, allows configuration of

legend, logarithmic scaling, axis offsets, foreground and background
colors, gridlines, and color printing, as described below.
Figure 177 Appearance tab of Review Graph Setup
Legend. The Review Graph can display a legend that denotes the color
and/or line style of each specimen’s curve. To display the legend, select
the Legend checkbox. Then, select the location on the graph the legend
should be displayed. The possible locations are: top, top right, right,
bottom right, bottom, left bottom, left, and top left. Lastly, select the

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Border checkbox if you wish the legend to be displayed with a box

around it.
The sample graph in the Appearance tab will update to give an example of
NOTE
what the Review Graph will look like under the current configuration.
Multiple Test Curve Offsets: Y-Offset. This setting is useful when

multiple curves have been plotted on the same graph. It indicates the
amount of vertical space that will separate each curve.
Multiple Test Curve Offsets: X-Offset. This setting is useful when

multiple curves have been plotted within the same graph. It indicates the
amount of horizontal space that will separate each curve.
Logarithmic Scale. A scale of measurement that plots the axis of your

Review graph on a Log (base-10) scale. Each major division on the axis
will be a multiple of 10 and there will be 10 minor divisions between
each major division.
Color Selection (Foreground, Background). Pressing either the

Foreground Color or Background Color selection button will display the
standard Windows color selection dialog. From this dialog, you can
choose the foreground or background color of the review graph. The
foreground color determines the color of the axis lines, tick marks, tick
mark labels, and axis labels. The background color determines the color
of the graph’s background.
NanoSuite will not allow the user to assign a line color to be the same as
NOTE
the background color. In this case, NanoSuite will prompt you to change
the color. Line colors and styling are discussed in the “Styles” section
below.
Show X and Y Gridlines. By selecting the gridlines check box, the user
can have the graph be displayed with gridlines connecting the major tick
marks. Figure 6-92 above shows an example graph with gridlines.
Print in Black and White. If you have a color printer installed on your
system, NanoSuite can print any report or graph in color. To have
NanoSuite print in color, clear the Print in Black and White checkbox.

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If you do not have a color printer installed, select the Print in Black
and White checkbox to speed up printing operations.
The black and white option also applies for a Print Preview.
NOTE
Show All Curves After Test Complete. If this option is selected,

NanoSuite will automatically display every test in the sample on the
Review Graph upon completion of a test.
The Styles tab allows the selection of what colors and line styles to use
when overlaying multiple specimens on the Review Graph (see
Figure 178).
Figure 178 Styles tab of Review Graph Setup

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The features of this tab are described below:
Color. This list lets the user specify which colors NanoSuite will use
when overlaying multiple tests on the Review graph. The first test will
be displayed in the first color in the list, the second test the second color,
etc. Once all the colors in the list have been displayed, the list will
repeat from the top. The colors in the list can be edited by right-clicking
on the Color List to produce the menu shown in Figure 179.
Figure 179 Color List menu
• The Add... menu option allows the user to add another color to
the list. The colors can be repeated in the list as desired.
• The Edit... option will allow the user to change the currently
selected color.
• Cut will copy the currently selected color to the Clipboard and
remove it from the list.
• Similarly, Copy will copy the currently selected color to the
Clipboard but will not remove it from the list.
• If a color is currently on the Clipboard, the Paste menu option
will be enabled. Selecting Paste will insert the copied color into
the list below the currently selected color.
• The Clear menu option will remove ALL colors from the list.
Style. This list lets the user specify which linestyles NanoSuite will use
when overlaying multiple tests on the Review Graph. The first test will
be displayed in the first linestyle in the list, the second test in the second
linestyle, etc. Once all the linestyles in the list have been displayed, the
list will repeat from the top. The linestyles in the list can be edited by

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right-clicking on the Linestyle List. Right-clicking will produce the

menu shown in
• The Add... menu option allows the user to add one of the four
possible linestyles to the list. The linestyles can be repeated in the
list as desired.
• The Edit...option allows the user to change the currently selected
linestyle to another style.
• Cut will copy the currently selected style to the Clipboard and
remove it from the list.
• Similarly, Copy will copy the currently selected style to the
Clipboard but will not remove it from the list.
• If a style is currently on the Clipboard, the Paste option will be
enabled. Selecting Paste will insert the copied style into the list
below the currently selected style.
• Clear will remove ALL styles from the list.
Change Line Color/Style for Each. These boxes allow the user to
decide how to alternate color and/or linestyles when overlaying multiple
tests in the Graph Region. If None is selected, then no color/line
alteration is performed. The user can select to have the colors/lines
alternated by test. Also, if the the Multiple Channel option is being used,
the user can have colors/lines alternated by channel.
Line Display. This drop-down menu allows the user to choose what
type of graph NanoSuite will produce. There are three choices: 1) Lines
Only, 2) Lines and Points, and 3) Points Only. The difference between
these three settings is discussed in the right-click menu section above.
Copy Changes to Real Time Graph. By pressing this button you can
copy the color list and line style list of the review graph to the real-time
graph, which also keeps a list of colors and line styles to use with
multiple curves. This way you can be assured the same color and line
style is used for each test by both the real-time and review graphs.
The Lines tab allows a user to add new and edit existing lines to be
drawn on the Review Graph. There are three types of lines that can be

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drawn in the Graph Region. There are lines defined by two markers,
lines defined by one marker, and lines that are drawn at a particular
value (see Figure 180).
Figure 180 Lines tab of Review Graph Setup

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Right-click in the Lines tab to open the menu (Figure 181) to select
from the following:
Figure 181 Add lines using right-click menu from Lines tab
Line Defined by Two Markers. This dialog box, shown in Figure 182,
is used when creating a line between 2 markers on the Review graph.
Use it to draw your test’s modulus line or offset yield line. The line will
only appear for the active curve in your Review graph.
Figure 182 Line defined by two markers dialog box

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Follow these steps to specify a line on your graph:

1 Click on the Marker 1 drop-down menu to select the marker formula
that identifies the first point of your line.
2 Click on the Marker 2 drop-down menu to select the marker formula
that identifies the second point of your line
3 Click on the Line Type drop-down menu to select how the line will
be drawn between the two points. NanoSuite can draw the line
directly or draw it based on a least-squares curve fit.
The above settings are sufficient to establish the slope and position of
NOTE
your line. However, you may want to reposition, or offset, your line from
its original position. To draw the offset yield line, simply offset your
modulus line by a specific value.
4 If you want your line placed betdrop-down menuween the markers,

click on the No Offset radio button.
5 If you want your line to run through a third marker, click on the
Offset by Marker radio button. The slope of your line will not
change. Click on the Marker drop-down menu to select the marker
formula that you want your line to go through.
6 If you want your line offset from its original position by a value,
click on the Offset by Value radio button. The slope of your line will
not change:
• Click on the X-Offset drop-down menu to select the input that
will specify the amount that your line will be offset in the
x-direction.
• Click on the Y-Offset drop-down menu to select the input that
will specify the amount that your line will be offset in the
y-direction.
7 Type a name for your line into the Label text box.
8 Click on the Line Style button to specify the line type and color for
the line. Thickness, style, and color can be defined within this Line
Style button the same as described in the Style section above.
Line Defined by One Marker. This dialog box, shown in Figure 6-99,
is used when extending a line to each axis from a particular marker on
the Review graph. Use it to draw lines on your test that will help you
determine and display what the values are of a particular marker on the

NanoSuite 6
Review graph. The line will only appear for the active curve in your
Review graph.
Figure 183 Lines defined by 1 marker dialog box

1 Click on the Marker drop-down menu to select the marker formula
that identifies the point of your lines.
2 If you want to draw a vertical line from the marker to the X-axis,
placed a check on the Draw Vertical Line check box.
3 If you want to draw a horizontal line from the marker to the Y-axis,
placed a check on the Draw Horizontal Line check box.
4 If you want to extend the lines you selected from the marker to the
end of the graph, placed a check on the Extend Line(s) check box.
Line Defined by a Value. This dialog box, shown in Figure 184 on

page 191, is used when extending a line at a particular value on the

NanoSuite 6
Review graph. The line will only appear when the unit class in the
Graph Region matches the unit class of the line that has been defined.
Figure 184 Lines defined by a value dialog box

1 Type in the number in the Value text box to display the line at the
value you select.
2 Click on the Unit Class button to select the unit class that will
identify your line.
3 Click on the Unit drop-down menu to change the actual units. For
example, you might want to set the value for 2000 Newton versus
figuring out what that would be in pounds.

NanoSuite 6
Zoom To Regions. The dialog shown in Figure 185 is used to configure

Zoom Regions for the Graph Region of the Review page.
Figure 185 Zoom to Regions tab of Review Graph Setup
There are two types of zoom objects in NanoSuite: Zoom To Region,

and Zoom To Marker. The Zoom To Region object allows the user to
automatically zoom in on a region defined by two markers. The Zoom
To Marker object allows the user to automatically zoom in on a marker
displayed on the Review Graph. Once a Zoom object has been created,
it can be activated by selecting it from the Zoom menu option of the
Review Graph’s right-click menu.
Zoom to Region. This dialog, shown in Figure 186 on page 193, allows
you to specify a Zoom To Region screen object. These screen objects

NanoSuite 6
allow you to focus on a specific part of the Graph Region by using the
right-click menu.
Figure 186 Zoom to Region dialog box
Follow these steps to specify a Zoom To Region screen object:

1 Click on the Marker 1 drop-down menu to select the left side of your
Zoom To region.
2 Click on the Marker 2 drop-down menu to select the right side of
your Zoom To region.
3 In the Label text box, type a name for the Zoom region. Select this
name from the Review graph’s right-click menu whenever you want
to use this screen object.
Zoom to Marker. This dialog box, shown in Figure 187, allows you to
specify a Zoom To Marker screen object. This screen object allows you
to focus your graph on a specific point within the Graph Region by
using the right-click menu.
Figure 187 Zoom to Marker dialog box

NanoSuite 6
Follow these steps to specify a Zoom To Marker screen object:

1 Click on the Marker drop-down menu to select the point of the graph
that you want focus on.
2 In the Label text box, type a name for the Zoom region. Select this
name from the Review graph’s right-click menu whenever you want
to use this screen object.
Inputs/Results Region
Post-test configuration of inputs and results may be accomplished in this

region of the "Review Tab", shown in Figure 188.
Figure 188 Inputs/Results Region of Review tab

NanoSuite 6
Options for configuring inputs and results may be accessed by

right-clicking in the region, resulting in the menu shown in Figure 189.
Figure 189 Inputs/Results region right-click menu
Edit. This command allows the user to open the Edit dialog, which
allows the user to change channel, formula, and input settings. This
choice accesses capabilities that are described in the Explorer manual.
Editing channels, formulas, and inputs is discussed in the Explorer

NOTE
manual. NanoSuite Professional users have certain limited editing
capabilities that are specified in the "Menu Bar" section of this manual.
Inputs Result Order. This item, shown in Figure 190, allows the user
to change the order of the inputs that are shown in the both the Result
section of the Inputs/Results Region and the Result Region of the
Review tab. Both of these sections will display both the input and
formula results.
Figure 190 Order Results dialog box using Inputs

NanoSuite 6
Formula Results Order. This item, shown in Figure 191, allows the
user to change the order of the formulas that are shown in the both the
Result section of the Inputs/Results Region and the Result Region of the
Review tab. Both of these sections will display both the input and
formula results.
Figure 191 Order Results dialog box using Formulas
Results. This item will show both the input and formula results
specified as shown by the examples above. As can be seen in
Figure 192, the input results are the first five results and the formula
results are the remaining results. Inputs and formulas can be set as
results when they are created.
Figure 192 Results displayed in the Inputs/Results region
Raw Channel Data. This menu item, shown in Figure 193, sets the
Inputs/Results Region to display only the raw channel data for the active

NanoSuite 6
specimen. The value of each channel will correspond to the data point
marked by the Review graph crosshair.
Figure 193 Raw Data Channel displayed in the Input/Results region
Required Inputs. This menu item, shown in Figure 194, sets the
Inputs/Results Region to display only the Required Inputs. Inputs can be
set as Required Inputs when they are created.
Figure 194 Required Inputs selection from right-click menu
Inputs Editable. This menu item, shown in Figure 195 on page 198,
sets the Inputs/Results Region to display Editable Post-Test Inputs.
These are inputs than can be changed after the test has been run, and

NanoSuite 6
NanoSuite will recalculate the results of the test given the new value of
that input. Inputs can be set as Editable Post-Test when they are created.
Figure 195 Inputs Editable Post-test
Inputs for Preallocated Test. This menu item, shown in Figure 196,
sets the Result panel to display all of the inputs for a preallocated test as
editable inputs. Preallocation of tests is discussed in the "Menu Bar"
section of this chapter.
Figure 196 Inputs for Preallocated Test
Results Region
The Results Region (Figure 197 on page 198) of the "Review Tab"
displays all the input and formula results for each specific test. Inputs
and formulas can be set to be displayed as results when they are created.
Figure 197 Results Region in the Review tab

NanoSuite 6
Statistics for all the tests in the sample can also be seen with the
displayed results in Figure 198. Right-click in the lower Results area,
select Configure Statistics, and set the configuration in the Statistics
Selection dialog box.
Figure 198 Results region with configured statistics displayed
Define Tab
In the Professional version of NanoSuite, the Define Tab cannot be seen

by the user. As can be seen above, the Define Tab cannot be chosen.
The Define Tab is used to write, edit, and create new methods.
NanoSuite and Other Software
NanoSuite works in conjunction with other software for data analysis

purposes. As discussed in the "Menu Bar" part of this chapter,

NanoSuite 6
NanoSuite samples can be outputted to Excel. The data from that sample
will then lie in an Excel spreadsheet. Analyst, a software package
created by Keysight, uses the data in the Excel spreadsheet to do certain
statistical analyses. Instructions about how to use Analyst can be found
on the online help for that program. Instructions on how to import data
into Analyst for tensile methods associated with the T150 system can be
found in the PDF files that accompany them.

Keysight UTM T150
User’s Guide
7
Tensile Testing Tutorial
Getting Started 202
Chronological Test Flow and NanoSuite Segments 209
Slack Removal 209
Loading of the Specimen 210
Hold Segment 210
Unloading Segment 211
The following tutorial will discuss how to run a tensile test on copper
wire using the Keysight UTM T150 system with NanoSuite. NanoSuite
is the standard software package that comes with the system. This level
of the software allows the user to perform tests along with other
privileges.
There is a second level of the software entitled NanoSuite Explorer.

This gives the user the ability to write their own methods. Methods are
discussed in Chapter 2, "Quick Start Guide" and Chapter 6, "NanoSuite"
introduction. The difference between NanoSuite Explorer and
NanoSuite Professional is discussed in the "Menu Bar" section
Chapter 6.
Tensile Testing Tutorial 7
Getting Started
1 Turn on the CPU and double-click the NanoSuite icon on the screen.
This will load the user into NanoSuite. Upon entering NanoSuite, as
shown in Figure 199, a user login box will appear in the screen. The
User Name should be Keysight and the password box should be empty.
Keysight is the default user for NanoSuite. There is no password for this
user.
The user can change their login name, password, and permissions to
reflect different users. This is discussed in "Menu Bar" on page 116.
Figure 199 User Login
2 Click OK.
After the user has logged in, an Open Method dialog box will pop up.
This allows the user to choose between several different methods for
T150. The current methods available that come standard with the
instrument are:
• UTM T150 ASTM C1557 Fiber Tensile Strength Modulus
• UTM T150 Standard Toecomp Quastistatic
• UTM T150 Standard Toecomp CDA
• UTM T150 Standard Toecomp Quastistatic Variable Yield Point
• UTM T150 Standard Toecomp CDA Cyclic

• UTM T150 Standard Toecomp CDA Cyclic Strain Reset
A detailed explanation of these methods can be found in the PDF files

that accompany them. The PDF files can be found on the CPU hard
drive under the folder C:\Program Files\Keysight NanoSuite\Methods.
The PDF files will have the same name as the method themselves.
3 When the Open Method dialog box comes up, as shown in
Figure 200, click Advanced....
4 Find and open the UTM T150 Standard Toecomp Quasistatic

method and click OK.

After clicking OK on the Open Method dialog box, NanoSuite will then
display the full default screen for the T150. This is shown in Figure 201.
Figure 201 NanoSuite main window
5 Mount your specimen.
This should be AWG48 copper wire mounted on a template. The

nominal gage length for the sample can be measured with the calipers
from the "User’s Kit". Using scanning electron microscopy, the
diameter of this copper wire has been measured to be 29 m. For details
on mounting the template grips, please refer to "Mounting the Template
Grips" on page 61 in Chapter 4, "Commonly Used Procedures". For
details on mounting a copper wire sample, please refer to "Method One:
Template Technique" on page 65.

Performing a Test
This is done by clicking the blue down arrow pictured in Figure 8-4.
Watch the specimen until you can see it go into slack.
Figure 202 Button to move extension axis down
Slack is put into the specimen for three reasons. First, slack removal in
tensile testing is analogous to surface detection in nanoindentation.
When all slack in the specimen has been removed, the true response of
the specimen to an imposed load is measured. For more on this, refer to
"Slack Removal" on page 107.
Second, so the specimen is not strained by the NMAT jump described

below.
Third, for users with the CDA option, so that there is a sufficient slack
region during the initial phase of the test during which the free state
dynamic signature of the NMAT can be characterized. The CDA option
is described in more detail in Appendix A, "Continuous Dynamic
Analysis".
2 Remove the locking pins from the NMAT.
These locking pins are in place to prevent damage to the NMAT while
the instrument is not running. The user may notice the NMAT shaft
jump when removing the pins. This is because the PID loop that is
trying to keep the NMAT shaft centered is applying force to the NMAT.
After a moment, the NMAT shaft will return to its zero position. For

more on zero displacement mode, please refer to the "NMAT" on

page 98.
Once this is done, the user is ready to begin testing.
Remember, specimen diameter and gage length are obtained during

NOTE
specimen mounting and will be needed for the Required Inputs window
described below.
3 Click the green GO button (Figure 203) to begin the test.
Figure 203 Go button to run test
After clicking the button and waiting a few moments for some system
configuration, the Required Inputs window will display.
4 Enter the required inputs. Test parameter inputs must be configured
before testing can proceed.
Enter these parameters as specified in Figure 204 on page 207 for the
UTM T150 Standard Toecomp Quasistatic method:
• Specimen Diameter: 29 mm
• Specimen Name: AWG48_Copper

click OK.

found in the PDF files that accompany them. The PDF files for tensile
methods can be found on the CPU hard drive under the folder C:\

Program Files\ Keysight NanoSuite\ Methods\ Tensile. The PDF files

will have the same name as the method themselves.
dialog box (Figure 205) will open as a reminder: “Remove flags from
the T150-UTM NMAT head.”
6 Confirm the flags (restraining pins) are removed and click OK.
7 After the test is finished running and the results can be viewed,
replace the locking pins in the NMAT.

Chronological Test Flow and NanoSuite Segments

After the OK button is clicked on the dialog box in Figure 205 on
page 208 above, the system will begin taking up the slack in the sample.
The tests that are run in NanoSuite consist of a series of test segments.
For the standard methods, these segments consist of the slack take-up
segment, the loading segment, a hold segment, and the unloading
segment. The following figures help demonstrate what NanoSuite will
look like when running a standard test.
Slack Removal
An illustration of the slack take-up segment of the test can be seen in

Figure 206. Slack take-up is discussed in "Performing a Test " on
page 205 and also in "Slack Removal" on page 107. The black screen to
the right of the control buttons is the Real-Time Graph. As shown, a
message below this screen indicates the instrument is in the slack
take-up segment. This message is called a run-time message.
Figure 206 NanoSuite screen for slack take-up segment
Taking up the slack consists of running the extension axis slowly at a

constant strain rate until the Raw Load channel changes by a specific
value. This value is specified by the Tension Trigger input that is
designated by the user when filling out the Required Inputs window.

The concept of channels in NanoSuite is discussed in Chapter 6,

"NanoSuite". Please reference this section for more detailed analysis of
the NanoSuite Professional level software.
Loading of the Specimen

After the slack has been taken out of the specimen, the instrument will
begin the extension of the sample at a constant strain rate specified by
the Required Input Strain Rate. The specimen will be extended to a
value specified by the input Max. Strain. Figure 207 illustrates how
NanoSuite will look when in the loading segment of a test. The run-time
message indicates that the sample is being extended. Note that the graph
to the right shows the Engineering Stress vs. Engineering Strain graph
propagating in real-time. The user can change the real-time graph axes
by right-clicking on the Real-Time Graph. For a more detailed
explanation of the Real-Time Graph, refer to "Test Tab" on page 149.
Figure 207 NanoSuite screen for Loading segment
Hold Segment
After the instrument has completed the loading of the specimen it will
go into a hold segment. The input Relaxation Hold Time specifies how
long that the instrument runs this segment. Essentially, the extension
axis stops moving and holds the specimen at a constant extension value.

This is so that, if desired, the user can do a stress relaxation experiment.

In Figure 208, a real-time curve is shown.
Figure 208 NanoSuite screen for Hold segment
Unloading Segment
When the hold segment of the test is done, the instrument will then go
into the unloading segment. In this segment, the extension axis returns
to its pre-test extension. It does this by first returning to an extension

slowly until the Load on Specimen is approximately zero. This is

Figure 209 NanoSuite screen for Unloading segment returning to Zero

Load Point
After it returns to a zero load point, the extension axis quickly returns
back to its pre-test position. When the extension axis arrives at its
pre-test position, the test is calculated and the user can save the sample
if they wish. The results of the test can be looked at in the Review tab of
NanoSuite.

Reviewing the Results

1 Click on the Review tab to look at the results of the test.
The default graph will be Engineering Stress vs. Engineering Strain.

The quasi-static modulus is the slope of the elastic portion of this curve.
The Review tab is shown in Figure 210.
The user can manually change the quasi-static modulus by changing the
location of the 1 and 2 markers on the graph. The calculated modulus
value is the slope between these two markers.
2 To change the marker locations, move to a location on the graph and
press 1 or 2 on the keyboard.

The 1 marker must come before the 2 marker on the curve for modulus
to be calculated correctly. An example of setting the marker is shown in
Figure 211.
Figure 211 Reset the 1 marker by moving up the curve with the crosshair
and pressing 1 on the keyboard
Attempt to change the location of these markers and see how it affects
the calculation of modulus. These markers should set automatically.
However, there are times when experimental error will cause these
markers to set incorrectly.
All other markers can be reset with the same technique. Just move to an
appropriate place on the graph and press the letter or number
corresponding to that marker.
• S is the Start Experiment marker. This defines the start of the
experiment.
• L is the Zero Load marker. This is defined as where the load on
the specimen begins.
• D is the Zero Displacement marker. This is defined as where the
displacement or extension of the specimen begins. Quantitatively,
this point on the curve is defined as where the tangent line to the
elastic portion of the stress strain curve that defines the
quasi-static modulus meets the engineering strain axis.
• P is the Peak Stress marker. This is defined as the highest stress
value on the curve.

• B is the Break Index marker. This is the pointon the curve that
defines a specimen break. This marker is used to calculate
toughness of the material.

Keysight UTM T150
User’s Guide
8
Indentation
Getting Started 217
Protecting the Tensile Column 218
Inverting the T150 System 219
Installing the Tip and Puck Adapter 224
Preparing and Mounting of Samples 227
Testing 232
Determining the Frame Stiffness 242
The Keysight UTM T150 tensile testing platform is an innovation that

emerged from nanoindentation technology. Due to the unique design of
the NMAT, the T150 tensile tester system can also be employed as an
indenter. This feature provides excellent duality to the laboratory
environment. The indentation chapter is designed to introduce you to
operating the T150 system as an indenter and to guide you through your
first test.
Indentation 8
Getting Started
In order to operate in the indentation mode, the indentation kit is
required. These parts are available from Keysight. Please see
"Contacting Keysight Technologies" on page 14 if you would like
information about adding this option to your system. The required parts
are shown in Figure 212 and described below:
1 Micropositioner
2 DCM Puck with Sample
3 Berkovich Indenter
4 Tip Changer and Nut
5 Indentation Puck Adapter
6 Inversion Footer Assembly
Figure 212 Indentation required parts
Because this system is foremost a tensile testing platform, using this

NOTE
system as an indenter has its limitations. The T150 system is
recommended for use on bulk materials where precise targeting of micro
or nano features is not desired. Additionally, it is intended that the
indentation kit be used for simple load/unload indentation testing
method.

Indentation 8
Performing a Test
Protecting the Tensile Column
The T150 system is an extremely sensitive instrument and requires

some degree of caution when performing procedures involving certain
components. Diligent care should be exercised when working around
the NMAT, especially when loading or removing samples.
Be aware of the following precautions:

CA U TI O N
Lateral forces applied to the NMAT can cause damage to the test system.
Do not over-extend the upper grip (extension axis) and drive it into the
lower grip (NMAT) when moving the extension axis down.
Always pay close attention to where the extension axis is in relation to
the NMAT, it can be driven into the NMAT if the user is not careful.
When mounting samples, always use the locking pins in the lower
column, to avoid damaging the NMAT; DO NOT APPLY ROTATIONAL
FORCES (TORSION) ON THE NMAT COLUMN!
Always use the "Locking Pins" when performing any procedures involving
CA U TI O N
the "NMAT". See Figure 213
Figure 213 Always use locking pins (aka restraining pins) when
performing any procedures involving the NMAT

Indentation 8
Inverting the T150 System
The indentation kit includes an inversion footer assembly that allows

you to turn upside down the T150 system. By inverting the system, the
crosshead and platform will be aesthetically similar to traditional
indenters. Inverting the system is not mandatory when performing
indentations tests; the data is not dependent on the orientation of the
indenter. However, it is beneficial to invert the system if you will be
testing wet samples and to ease the installation of the indenter tip. We
strongly recommend that the inversion footers be utilized when
performing an indentation test.
1 Beginning with the system in the upright position, ensure the NMAT
locking pins are in place. Proceed with shutting down NanoSuite and
continue by shutting down the CDA Control Unit (if installed),
Controller, and the CPU respectively.
The rocker power switch for the CDA Control Unit is located on the
right-rear of the unit (as viewed from the front). The controller power
switch is located on the front of the unit. Turn off the CPU per the
manufacturer. Figures of the CDA Control Unit and controller power
switches are depicted in Figure 214.
Figure 214 Rocker switches for CDA Control Unit (left) and controller
(right)
2 Disconnect all cables. Be sure to allow plenty of room to carefully

work and disconnect all wiring to the system. The result should be
something similar to Figure 215 on page 220.

Indentation 8
Figure 215 T150 system with disconnected wiring and peripheral

hardware
3 The Upper Frame Handle, shown in Figure 216, is in place so the

instrument can be readily moved around. Remove the C-shaped
handle in order to make room for the inversion footers.
Figure 216 Upper frame handle
4 On the back side of the system there are four mounting holes that
receive the inversion footers. These are shown in Figure 217 on
page 221.

Indentation 8
Figure 217 Mounting holes for inversion footers
5 Secure the inversion footers with four (4) of the M6x25 socket head
cap screws. The inversion footers should be oriented as shown in
Figure 218.
Figure 218 Inversion footers mounted on T150 system
6 Utilize the remaining six (6) M6x25 socket head cap screws to
mount the inversion plate to the inversion footers. A gap of about ¼
in exists between the inversion plate and the cover of the T150; thus,
take care to balance the plate during installation. If dropped, the plate
could cause serious damage to the NMAT and crosshead.

Indentation 8
After the inversion plate is installed, the result will be as shown in

Figure 219.
Figure 219 Inversion footers and plate mounted on T150 system
7 With care, invert the system. Be careful not to handle the equipment
by the crosshead or NMAT. The Lower Frame Handle is in place so
the instrument can be readily moved about (see Figure 220).
Figure 220 Lower frame handle

Indentation 8
Once inverted, the result will be similar to Figure 221.
Figure 221 Inverted system
8 Reattach wiring and proceed with testing. Three cables connect to

the T150. All connections are unique, but on the adjoining wire
harness there are multiple DB15-pin male cables. For the T150, only
the Y-Axis cable needs to be connected. The cable is labeled near its
connector. The remaining DB15-pin cables remain disconnected.
9 In order to return to the standard setup for tensile testing, follow the
reverse of step 1 to step 7.

Indentation 8
When operating in the inverted position, take care in using NanoSuite.

The directional arrows of the software do not invert with the system.
Thus, when pressing the up arrow the crosshead will move down.
Installing the Tip and Puck Adapter
Beginning from the standard tensile setup, the user must remove the
template grips used during tensile testing.
1 Ensure that the locking pins are in place before attempting to remove
the template grips. Additionally, move the crosshead up to avoid any
possible interference while changing the hardware.
The NMAT locking pins must be in place before proceeding!

CA U TI O N
2 Unscrew the template grip and shielded shaft extension mounted on

the NMAT. See Figure 222.
Figure 222 Removing the template grip from the NMAT
3 Using a pair of tweezers, remove the fixed debris shield as shown in

Figure 223 on page 225.

Indentation 8
Figure 223 Removing the fixed debris shield
4 As shown in Figure 224, use forceps or tweezers to install the tip into
the retaining nut. The retaining nut is being held by the tip-change
tool.
Figure 224 Install tip using tweezers

Indentation 8
Use care when handling the tip. Do not touch the diamond tip with any
CA U TI O N
object. A dirty indenter can cause corrupted data, so pick up the indenter
by the Indenter Tip Tab only, as shown in Figure 225.
Figure 225 Handle tip using the indenter tip tab
5 Install the indenter by aligning the tab with the slot in the shaft by
feel.
It is advised to align the indenter tab in the tip-change tool prior to

installing; this minimizes the opportunity to damage the indenter tip.
Ordinarily, the tab will be aligned parallel to the front surface; visually
inspect the receiver to align the tab.
6 Align the threads and tighten the indenter-retaining nut into the shaft.
Ensure proper alignment of the threads and gently rotate the tool in a
clockwise direction to install the indenter. Ensure a snug fit, but do not
over-tighten.
7 Unscrew the template grip used in tensile testing from the crosshead
as shown in Figure 226 on page 227.

Indentation 8
Figure 226 Removing the template grip from the micropositioner
8 Install the indentation puck adapter into the crosshead. See

Figure 227.
Figure 227 Installing the puck adapter
Preparing and Mounting of Samples
Before you test a sample, you must prepare it by mounting it on a

sample disk. The following procedures are for mounting a single sample

Indentation 8
on a sample disk. However, you can mount many samples on a single

sample disk.
For samples that are not sensitive to heat, follow these steps:
1 Locate a sample disk and place it on a heating element (hot plate), as
Figure 228 Heat the sample disk on a heating element
2 Turn the heating element on medium-low heat and wait for the disk
to heat for about 5 minutes (or until it is hot enough to melt
crystalbond).
3 When the disk is warm, spread a small amount of crystalbond onto
the surface of the disk, as shown in Figure 229.
Figure 229 Spreading crystalbond onto the surface of a sample disk
4 Locate your sample. Avoid touching the sample with your fingers,
using tweezers if necessary.
5 Place the sample on the sample disk, as shown in Figure 230 on
page 229.

Indentation 8
Figure 230 Placing the sample on the sample disk
6 Using wooden contacts (such as toothpicks), press down on the

sample so that it seats in the crystalbond, as shown in Figure 231
Figure 231 Seating the sample into the crystalbond
7 Use pliers to remove the sample disk from the heating element and
allow the disk to cool to room temperature.
8 Turn the heating element off.
For samples that are sensitive to heat, follow these steps:

1 Locate a sample disk and place it on a heating element.
2 Turn the heating element on medium-low heat and wait for the disk
to heat for about 5 minutes.
3 When the disk is warm, spread a small amount of crystalbond onto
the surface of the disk.
4 Place a microscope slide onto the surface of the sample disk and
press down on the slide with wooden contacts so that the slide seats

Indentation 8
in the crystalbond, as shown in Figure 232. Move the slide around

with the wooden contacts until there are no bubbles between the
slide and the sample disk.
Figure 232 Seating the slide into the crystalbond
5 Use pliers to remove the sample disk from the heating element and
allow the disk to cool to room temperature.
6 Turn the heating element off.
7 Mix a small amount of five-minute epoxy.
8 Using a wooden stick, place a small amount of epoxy on the slide, as
Figure 233 Placing epoxy on the slide
9 Locate your sample. Avoid touching the sample with your fingers,
using tweezers if necessary.
10 Place the sample on the microscope slide and press down on the
sample with wooden contacts so that it seats in the epoxy, as shown
in Figure

Indentation 8
Figure 234 Seating the sample in epoxy
11 Allow the epoxy to fully cure.
To remove the sample or microscope slide from the sample disk and
reuse the sample disk for subsequent testing, heat the sample disk on a
heating element and remove the sample after the crystalbond has
melted. You can leave the remaining crystalbond on the sample disk for
the next sample.
Mount sample disc into the indentation puck adapter (see Figure 235)
and tighten the set screw.
Figure 235 Indentation puck adapter with sample mounted

Indentation 8
Testing
1 After the user has logged into NanoSuite, an Open Method dialog
box will pop up. This allows the user to choose between several
different methods for the T150. The method to be chosen for
indentation is UTM Basic Hardness, Modulus, Load Control.
2 If this is the first test or a tip configuration needs to be completed,
please see steps 1-7 of Section 7.2 Determining Frame Stiffness.
3 With the samples installed and the locking pins in place, move the
crosshead to about ½ inch (12.7 mm) from the indenter tip.
If operating in the inverted position, the NanoSuite blue Up and Down

NOTE
directional buttons will not be inverted. This means the Up button will
physically move the crosshead down; similarly, the Down button will
move the crosshead up.
In other words, no matter if the system is inverted or not, it can always be
said that Up will increase the distance between the indenter and the
crosshead, while Down will decrease the distance.
4 Remove the locking pins.

5 In NanoSuite change the NMAT Mode from Load Cell Mode to
Load Control Mode.
This is accomplished by right-clicking in the NanoSuite work area,

selecting NMAT Mode, and clicking on Load Control Method. This is

Indentation 8
displayed in Figure 236. (If the NMAT locking pins need to be

reinserted, please see step 13).
Figure 236 Selecting the Load Control Mode
Load Control Mode must be selected each time the method is opened!
NOTE
6 Click the green Go button to begin the test.
After pressing the button and waiting a few moments for some system
configuration, the Required Inputs window will display.
7 Enter the required inputs. Test parameter inputs must be configured
before testing can proceed. Enter the following parameters as shown
in Figure 237 on page 234:
• Approach Distance to Store: 1000 nm
• Max program Load: 100 mN
• Peak Hold Time: 5 s
• Percent to Unload: 90%
• Perform Drift Test Segment (yes=1, no=0): 0
• Poissons Ratio: 0.180

Indentation 8
• Surface Approach Distance: 10 micron

• Surface Approach Sensitivity: 25 %
• Surface Approach Velocity: 100 nm/s
• Time to Load: 15 s
Figure 237 Required Inputs window with specified parameters
A detailed explanation of the required inputs for each method can be

found in the .pdf files that accompany them. The .pdf files for
indentation tests can be found on the CPU hard drive under the folder
C:\Program files\Keysight NanoSuite\Methods\Load Control Method.
The .pdf files will have the same name as the methods themselves.
8 After all of the parameters have been added to the Required Inputs
window, click OK.
This will cause the method to begin. The crosshead, with sample
mounted onto it, will now begin to approach the indenter. This will
allow a rough surface find. NanoSuite displays a run-time message as

Indentation 8
shown in Figure 238 which says, “Moving indenter to position closest to

the sample.”
Figure 238 Default NanoSuite screen for moving sample close to indenter
Once the indenter detects contact with the sample, a dialog box will
appear. The dialog box, shown in Figure 239 on page 236, says, “Please
move micropositioner to fresh spot on sample.”
9 When this dialog box appears, move the position of the sample so
that any indent caused by the surface find will not affect the
indentation test. It is recommended that one or both micropositioners
be rotated at least ⅛ turn.

Indentation 8
Figure 239 Dialog box will prompt to move the micropositioner
10 Click the OK button.
NanoSuite will then display the runtime message (Figure 240),

“Holding for thermal drift to stabilize.” During this hold segment, the
system remains constant to allow the environment to equilibrate. The
testing will resume after a fixed amount of time.
Figure 240 NanoSuite screen with Hold segment message
After the hold segment, the instrument will begin the approach of the
indenter towards the sample. The specimen will be tested to a value
specified by the input Max. Program Load.
The run-time message will read, “Surface Approach: Moving indenter

toward sample.” During this process a dialog box will appear, as shown

Indentation 8
in Figure 241. This dialog box allows the user to manually determine
when the indenter is in contact with the sample.
Resume should only be selected if you are manually determining contact

NOTE
with the indenter. Otherwise, NanoSuite performs this function. Selecting,
Resume is rare and is most often utilized when independently monitoring
a channel or testing a sample with low stiffness.
11 Click the Resume button only if the process is being determined

manually. Otherwise, NanoSuite will proceed without any user input.
Figure 241 NanoSuite screen for manually deciding surface contact
Figure 242 on page 238 illustrates how NanoSuite will look when in the
loading segment of a test. Note that the graph to the right shows the
Displacement Into Surface vs. Force on Surface graph propagating in
real-time. The user can change the real-time graph axes by
right-clicking on the Real Time Graph. For a more detailed explanation

Indentation 8
of the Real Time Graph, refer to the "Test Tab" section of Chapter 6,
"NanoSuite".
Figure 242 NanoSuite screen for Loading segment
When the hold segment of the test is done, the instrument will then go
into the unloading segment. In this segment, the indenter returns to its
pre-test extension. It does this by first executing the input Percent to
Unload, and then the extension axis quickly returns to its pre-test
position.
This is shown in Figure 243 on page 239. When the extension axis
arrives at its pre-test position, the test is calculated and the user can save

Indentation 8
the sample if they wish. The results of the test can be analyzed in the
"Review Tab" of NanoSuite.
Figure 243 NanoSuite screen for Unloading segment
12 After completion of the test, review the results by clicking on the

Review tab.

Indentation 8
Many post-processing results can be found on the Review tab. An

example is displayed in Figure 244.
Figure 244 Review tab example: Displacement Into Surface vs. Force on
Surface
13 If you choose run another test, rotate one or both micropositioners at

least ⅛ turn. Then click the green Go button to resume testing.
14 After all testing is finished, return the NMAT Mode to Load Cell
Mode and replace the locking pins. Changing the mode is done by
right-clicking and following the menu path as shown in Figure 245
on page 241.

Indentation 8
The locking pins are installed in order to protect and keep the NMAT
NOTE
stationary. It is important to remove the locking pins before changing
NMAT Modes.
This is because the locking pins are aligned to the zero position of the
NMAT while in Load Cell Mode. The zero position changes when
changing modes; this also means the locking pins cannot be re-inserted
when NanoSuite is in Load Control Mode. Once finished with the test,
follow the reverse of step 4 to place in the Load Cell Mode and reinstall
the locking pins.
Figure 245 Selecting the Load Cell Mode

Indentation 8
Determining the Frame Stiffness

1 In NanoSuite, select Configure Tip from the Tip menu.
2 In the Configure Tip Parameters dialog box, click the Add button.
3 In the New Tip dialog box, enter the name for the tip. The typical
naming convention is to type in the general shape of the tip (such as
Berk for a Berkovich tip) plus the tip serial number, as shown in
Figure 7-33.
4 Click OK.
Figure 246 New Tip dialog box
5 Enter the parameter m0 in the Configure Tip Parameters dialog box

in NanoSuite, as shown in Figure 247. A nominal value is 24.56.
6 Enter the parameter m1 in the Configure Tip Parameters dialog box
in NanoSuite, as shown in Figure 247. A nominal value is 200.
Figure 247 Configure Tip Parameters dialog box

Indentation 8
7 Click OK , and then click the OK button in the Recalculate with

Current Tip dialog box.
8 Select Save Sample from the File menu.
9 Make sure that the fused silica sample standard is mounted as the
sample.
10 In NanoSuite, select Open Method… from the Method menu.
11 From the Filename drop-down menu in the Open Method dialog box,
select UTM Method for Determining Frame Stiffness.
12 Click OK .
13 Click the green GO arrow to initiate testing.
14 Edit any required inputs if desired, as shown in Figure 248.
15 Click OK to initiate testing
Allow testing to complete.

16 Repeat the test if desired by clicking the green GO button.

Indentation 8
When testing is complete, go to the Review tab. A sample set of results

are displayed in Figure 249.
Figure 249 Review tab with sample results
17 Delete any obviously aberrant tests:

a Identify the test number by referring to the legend next to the
graph of the results.
b Right-click on the number of the aberrant test in the Legend pane.
c Select Delete Test from the resulting pop-up menu.
d Click Yes in the Test Deletion confirmation box.
e Right-click anywhere in the Legend pane and Select All Tests
from the resulting pop-up menu to populate the graphs.
18 Open the method you will be testing.
19 Select Device… from the Configure menu. The dialog box in
Figure 250 on page 245 shows the resulting Device Configuration
dialog box.

Indentation 8
20 Click Calibrate to display the Calibrate Frame Stiffness Device

dialog box as shown in Figure 251.
Figure 251 Calibrate Frame Stiffness Device dialog box
21 Input the average value calculated from UTM Method for

Determining Frame Stiffness in the XP Calibration text box.
22 Click OK.

Indentation 8
Do not change the values for the DCM Calibration; the DCM
Calibration is not applicable to this procedure.
23 Click OK in the Device Configuration dialog box.
24 Proceed with testing.

Keysight UTM T150
User’s Guide
A
Continuous Dynamic Analysis
Getting Started 250
The Keysight Continuous Dynamic Analysis (CDA) option provides a

simple means of determining dynamic properties, such as storage and
loss modulus and tan , with the Keysight T150 UTM. This innovative
option utilizes a technique whereby the NMAT applies an oscillatory
force that is superimposed over the nominal force, shown schematically
in Figure 252 on page 248. The T150 with the CDA option imposes a
small oscillation on a material that is being simultaneously subjected to
a variable quasi-static strain. Hence, it can provide material properties
over a range of strain in one experiment. Note that conventional
dynamic mechanical analysis (DMA) only provides information at a
particular strain.
The amplitude of the oscillation is measured by the capacitive sensor

inside the NMAT. As a result, the technique can be used to impose
oscillatory forces at a higher frequency than is achievable by imposing
Continuous Dynamic Analysis A
an oscillation via the crosshead. CDA also provides the advantage of

measuring complex moduli over a range of frequencies.
Figure 252 Overview schematic of the T150 CDA option

The CDA option offers a direct, accurate measurement of the specimen's

stiffness at each point in the experiment, enabling mechanical properties
to be determined continuously as the specimen is strained (Figure 253).
Figure 253 Viscoelastic time-dependent behavior of small diameter

compliant fibers using the CDA option over a range of strain
By measuring both the amplitude and phase relationships between the

load and displacement oscillations, the CDA option makes it possible to
determine storage and loss modulus. The option enables the T150 UTM
users to gain access to dynamic properties continuously through the
force curve, providing a wealth of information on the material behavior.
The following section will discuss how to run a tensile test with
continuous dynamic analysis on copper wire using the Keysight T150
UTM system. This also serves as the means to verify the CDA
performance of the T150 system.

Getting Started
First, the user will need to turn on their CPU.
1 Double-click the NanoSuite icon on the screen. This will open
NanoSuite, as shown in Figure 254. The User Name should be
Keysight and the password text box should be empty. Keysight is
the default User Name for NanoSuite. There is no password for this
user.
2 Click the OK button in the User Login dialog box.
Figure 254 User Login dialog box in NanoSuite software

After the user has logged in, an Open Method dialog box will pop up, as
3 In the Open Method dialog box, click the Advanced... button.

4 In the Tenstile Utility Methods folder, find and open the UTM T150
CDA Verification method.
5 Click OK.
After clicking OK on the Open Method dialog box, NanoSuite will then
display the full default screen for T150 as shown in Figure 256.
Figure 256 NanoSuite default window

6 Mount an AWG 48 copper wire specimen. The nominal gage length

for the sample can be measured with the calipers from the "User’s
Kit". The diameter of this copper wire has been measured using
scanning electron microscopy to be 29 μm.
For details on mounting the template grips, please refer to "Mounting

the Template Grips" on page 61 in Chapter 4, "Commonly Used
Procedures". For details on mounting a copper wire sample, please refer
to "Method One: Template Technique" on page 65.

Performing a Test
This is done by clicking the blue down arrow pictured in Figure 257
below. Watch the specimen until you can see it go into slack.
Figure 257 Use blue down arrow to move extension axis down
Slack is put into the specimen for three reasons. First, slack removal in
tensile testing is analogous to surface detection in nanoindentation.
When all the slack in the specimen is removed, the true response of the
specimen to an imposed load is measured. For more on this, refer to
"Slack Removal" on page 107.
Second, so the specimen is not strained by the NMAT jump described

below.
Third, and most important for the CDA test methods, so that there is
sufficient slack to characterize the free state dynamic signature of the
NMAT during the slack removal phase of the test.
2 Remove the "Locking Pins" from the NMAT.
These locking pins are in place to prevent damage to the NMAT while
the instrument is not running. The user may notice the NMAT shaft
jump when removing the pins. This is because the PID loop that is
trying to keep the NMAT shaft centered is applying force to the NMAT.

After a moment, the NMAT shaft will return to its zero position. For
more on the load-cell mode, please refer to "NMAT" on page 98.
Once this is done, the user is ready to begin testing.
Note: Remember, specimen diameter and gage length are obtained

during specimen mounting and will be needed for the Required Inputs
window described below.
3 Click the green Go button (Figure 258) to begin the test.
Figure 258 Use the Go button to run a test
Upon clicking the button, the Required Inputs window will be

displayed.
4 Enter the following parameters in the Required Inputs dialog box
(see Figure 259 on page 255):
• Frequency: 20 Hz
• Harmonic Force: 2.0 nN
• Specimen Diameter: 29 mm
• Specimen Name: AWG48_Cu_CDA

click OK.

dialog box (Figure 260) will open to ask: "Have you removed the T150
NMAT head restraining pins?"
6 Click OK to start the test.

7 After the test is finished, replace the locking pins in the NMAT.
8 Repeat the tensile tests with CDA on at least two more AWG 48
Copper Wire specimens.

Reviewing the Results

1 Click on the Review tab to look at the results of the tests.
The default graph will be Engineering Stress vs. Engineering Strain as

shown in Figure 261. Dynamic Modulus data are indicated by the red
box.

Review the results in the column Dynamic Modulus (GPa), as shown in

Figure 262. The mean value is circled in red.
Figure 262 Dynamic Modulus data in Results and Statistics section of

Review tab
The Dynamic Modulus for the AWG 48 copper wire should be between
125 and 135 GPa. The instrument performance is verified if the mean
value of the Dynamic Modulus from at least three tests falls within that
range.

Keysight UTM T150
User’s Guide
B
Site Requirements and Specifications
Site Requirements 260
Specifications 261
Line Voltage 261
Environment Temperature 261
Humidity 262
Vibration 262
Dimensions of T150 Gantry 262
Dimensions with Isolation Cabinet 262
Desktop Space 262
Vibration Isolation Table 262
The Keysight UTM T150 is a precision tensile tester capable of

measuring material properties at very small scales. External influences
on testing, such as vibration, noise, humidity, air current, and
temperature, may affect test results. Isolation from these conditions is
proportional to the level of desired precision. In other words, the better
the laboratory conditions, especially when testing at the extreme
operating capabilities of the instrument, the better the results.
Site Requirements and Specifications B
Site Requirements
The following laboratory conditions are suggested:
• A ground-level laboratory on a concrete pad
• Minimal traffic through the lab during tests
• Use of a noise isolation chamber
• Use of a vibration isolation table
• Temperature and humidity controls
• Sliding glass doors, where practical, to reduce air surges (not
included with T150 system)

Specifications
Line Voltage
110/220 V AC at 50/60 Hz, 2000 VA (clean power with a good ground;

eight-outlet power strip included). As a rule of thumb, when higher
levels of precision are desired, take greater precautions in the conditions
under which testing is performed.
Environment Temperature
+/- 1 ºC
Operating the T150 system in high-humidity conditions is strongly

CA U TI O N
discouraged!

Humidity
20% - 80% relative, non-condensing
Vibration
Isolation from vibration is strongly encouraged for testing.
Dimensions of T150 Gantry
30 1/8" (H) x 9 15/16" (W) x 12 1/8" (L)
76.52 cm x 25.24 cm x 30.80 cm
Dimensions with Isolation Cabinet
72 1/4" (H) x 21" (W) x 24 1/2" (L)
183.52 cm x 53.34 cm x 62.23 cm
Desktop Space
A desk is not included in the T150 system but a 48 " desk is

recommended for the computer monitor, keyboard and mouse.
Vibration Isolation Table
4 1/2" (H) x 16" (W) x 20" (L)
11.43 cm x 40.64 cm x 50.8 cm

This information is subject to change without notice.
© Keysight Technologies 2001, 2014
Revision B, August 2014
*TTA-11765-3*
TTA-11765-3
www.keysight.com

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Keysight UTM T150

Read This First

TTA-11765-3 Keysight UTM T150 User’s Guide 3

Equipment Class I, Pollution Degree 2, Installation Category II.

TTA-11765-3 Keysight UTM T150 User’s Guide 4

Customer Technical Support

Support Email: nanomechtech@keysight.com

Distributors and Account Representatives

TTA-11765-3 Keysight UTM T150 User’s Guide 5

I Read This First

2 Quick Start Guide

3 Keysight UTM T150 Components

Keysight UTM T150 User’s Guide 6

Fixed Debris Shield 39

4 Commonly Used Procedures

Keysight UTM T150 User’s Guide 7

Keysight UTM T150 User’s Guide 8

7 Tensile Testing Tutorial

A Continuous Dynamic Analysis

B Site Requirements and Specifications

Keysight UTM T150 User’s Guide 9

Desktop Space 262

Keysight UTM T150 User’s Guide 10

Congratulations on the purchase of the Keysight UTM T150 universal

Capable of characterizing a variety of materials, the T150 measures the

It is a robust system as well. The T150 universal testing system offers

Your UTM T150 System

Figure 1 UTM T150 instrument

The default configuration of this instrument is as an extension

Keysight UTM T150 User’s Guide 12

Options currently available for the T150 system include:

Keysight UTM T150 User’s Guide 13

Keysight Technologies, the premier measurement company, offers

Keysight's leading-edge R&D laboratories ensure the continued, timely

Keysight Technologies brings years of instrumentation experience to

In 1983, Warren Oliver and John Pethica founded Nano Instruments,

Keysight is committed to making products that contribute to advances in

Contacting Keysight Technologies

For questions regarding integration between NanoSuite and your T150

What You Will Need Before You Call Technical Support

If you are calling for NanoSuite integration support, we recommend that

Keysight UTM T150 User’s Guide 14

solving system concerns. It should not be used to train new operators or

A Note to Our Overseas Customers

Overseas customers should contact their local Keysight Technologies

Keysight provides instrument and software training at the time of

Keysight UTM T150 User’s Guide 15

Be careful not to crash the extension axis into the head!

4 Equipment Maintenance and Diagnostics

Keysight UTM T150 User’s Guide 16

Keysight UTM T150 User’s Guide 17

Getting a Test Started

Figure 2 User Login dialog box in NanoSuite software

Keysight UTM T150 User’s Guide 19

Figure 3 Open Method dialog box

1 In the Open Method dialog box, click the Advanced... button.

This specimen should be an AWG48 copper wire sample mounted using

Keysight UTM T150 User’s Guide 20

microscope. For details on mounting the template grips, please refer to

This is done by clicking the blue down arrow pictured in Figure 4

Figure 4 Use blue down arrow to move extension axis down

2 Remove the Locking Pins from the NMAT.

Figure 5 Use the Go button to run a test

Keysight UTM T150 User’s Guide 21