Ertl North

Laboratory Electronics Regional Test Laboratory (North), S-Block, Okhla
Industrial Area, Phase-II, New Delhi

Accreditation Standard ISO/IEC 17025: 2005
Certificate Number CC-2137 (in lieu of C-0001, C-0177, C-0178 & Page 1 of 18
C-0588)
Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017
Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

Instrument Capability (±)
ELECTRO-TECHNICAL CALIBRATION
I. SOURCE
1. DC Voltage# 1V 2 ppm Using Wavetek 7004N,

10 V 1 ppm Wavetek 4808,
100 nV to 1 mV 0.05 % to 0.5 % Fluke 5720A by
1 mV to 100 mV 3.5 ppm to 150 ppm Direct Method
100 mV to 10 V 3.5 ppm to 7.5 ppm
10 V to 1100 V 7.5 ppm to 7 ppm
2. AC Voltage# 10 Hz to 10 MHz
220 µV to 3.5 V 100 ppm to 3 % Using Fluke 5720A &
Wavetek 4808 by Direct
10 Hz to 20 kHz Method
1 mV to 220 mV 120 ppm to 650 ppm
220 mV to 22 V 50 ppm to 400 ppm
22V to 220V 50 ppm to 260 ppm
20 kHz to 1 MHz
1 mV to 220 mV 200 ppm to 2300 ppm
220mV to 22V 80 ppm to 2700 ppm
22V to 220V 80 ppm to 8000 ppm
15 Hz to 100 kHz
220 V to 600 V 50 ppm to 100 ppm
15 Hz to 20 kHz
600 V to 1100 V 50 ppm to 200 ppm
3. DC Current# 100 nA to 10 µA 35ppm to 2000 ppm Using Fluke 5720A &

10 µA to 100 mA 35ppm to 160 ppm Wavetek 4808 100 mΩ
100 mA to 2 A 45ppm to 100 ppm Guidelines 9336,
2 A to 11 A 85ppm to 420 ppm Fluke 5725A, Totek 380
11 A to 100 A 0.25 % Fluke 5725A & Current
50 A to 1000 A 0.5 to 1 % Coil by Direct Method
Ashish Kakran Avijit Das

Convenor Program Director
C-0588)

4. AC Current# 10 Hz to 10 kHz
10 µA to 22 mA 140 ppm to 1800 ppm Using Fluke 5720A,
Wavetek 4808 &
40 Hz to 10 kHz Fluke 5725,
22 mA to 2.2 A 140ppm to 1000 ppm
2.2 A to 11 A 300ppm to 1100 ppm
50 Hz to 1 kHz
11 A to 200A 0.01 % to 0.03 % Rotek 8000 (200A Amp)
40 Hz to 70Hz
20 A to 1000 A 0.5 % Fluke 5520A &
Current Coil by
Direct Method
5. LF Power# 50 Hz & 60 Hz 120 ppm to 600 ppm Using Rotek 8000-3P-

(Active/ Reactive/ PF: Unity to 0.1 200A Rotek MSB-100
Apparent) 10 V to600 V by Direct Method
(1 φ & 3 φ) 10 mA to 200 A
6. LF Energy# 50 Hz & 60 Hz 120 ppm to 600 ppm Using Rotek 8000-3P-

(1 φ & 3 φ) PF: Unity to 0.1 200A Rotek MSB-100
10 V to600 V by Direct Method
10 mA to 200 A
7. Power Factor # 50 Hz & 60 Hz Using Rotek 8000-3P-

0 - 1- 0 (Lag & Lead) 0.02° 200A, Rotek MSB-100
by Direct Method
8. DC Power # 100mW to 20kW 0.005 % to 0.1 % Using Fluke 5520A,

(1V to 1000V/ by Direct Method
1mA to 20A)

C-0588)

9. Oscilloscope Calibration
Time Base# 1 ns to 55 s 0.1% to10 ppm Using Fluke 9500 B,
(Marker) Fluke 5520 A,
by Direct Method
Deflection Factor # 10 Hz to 10 kHz
(Amplitude) 1 mV to 210 V (1 M) 0.4 % to 0.05 %
1 mV to 5 .56V (50 ) 0.4 % to 0.05 %
Bandwidth# Upto 1.1 GHz 2.5 % to 4.0 %
10. Inductance# 1 kHz

100 μH to 10 mH 0.05 % to 0.02% Using GR 1482 Series
10 mH to 10 H 0.02% to 0.05 % by Direct Method
100 H 0.05 % As per 100 H by
10 kHz to 100 kHz Simulation
10 mH to 25 mH 0.3 %
11. Capacitance# 1 kHz

1 pF 0.01 % Using GR 1403 Series,
10 pF to 1000 pF 11 ppm GR 1404, 1405, 1406,
1000 pF to 1 µF 11 ppm to 0.01 % 1409, 1423 Series,
1 µF to 1000 µF 0.01% to 0.6 % HP 16382 Series by
Direct Method
10 kHz to 1 MHz
1 pF to 1000 pF 0.5 % to 0.06%
10 kHz to 100 kHz

1000 pF to 1 µF 0.06 % to 0.16%
12. DC Resistance# 0.1 mΩ 50 ppm Using Guildline 9230,

1 mΩ, 10 mΩ, 100 mΩ 2.2 ppm to 4 ppm Tinsley 5686,
1Ω 0.7 ppm L&N 4000,
10 Ω, 100Ω 0.5 ppm to 1.9 ppm Guildline 9334,
1 kΩ 1.7 ppm Tinsley 5685A,
10 kΩ 15 ppm Tinsley 5685 B,
100 kΩ to 10 MΩ 1.5 ppm to 3.0 ppm Tinsley 5685 B,
100 MΩ 23ppm Guildline 9330,

C-0588)

1 GΩ to 1 TΩ 0.02% to 0.13 % Guildline 9334,

10 TΩ to 100 TΩ 0.13% Guildline 9336 & 9337
Series by Direct Method
13. AC Resistance# Upto 1 kHz

1 Ω to 10 kΩ 31 ppm to 12 ppm Using Tinsley 5685 &
10 kΩ to 100 MΩ 12 ppm to 110ppm GR 1440 by Direct
Method
14. Frequency# 100 kHz, 1 MHz, 3*10-10 Using Fluke 910R,

5 MHz, 10 MHz R&S SMT-06,
Gigatronics 2440M
0.01 Hz to 40 GHz 8*10-7 to 3*10-10 (Locked with Ref Std
Freq.) by Direct /
Comparison Method
15. Time Interval# 1s to 3600 s 3*10-4 to 2*10-7 Using HP 5315A, Agilent

53132A, by Direct /
Comparison Method
16. RF Power# 10 MHz to 18 GHz Using R&S SMT-06,

100 nW to 20 mW 5.5 % to 8 % Gigatronics 2440M with
HP438A, Boonton
52012, 52018, 52026
10 MHz to 1 GHz
20 mW to 10 W 8% Signal Gen with
Amplifier & HP 438A by
Direct / Comparison
Method
17. Attenuation# 50 kHz to 2.7 GHz

1 dB to 60 dB 0.32 dB to 0.36 dB Using R&S DPSP
10 MHz to 18 GHz
30 dB 0.32 dB to 0.48 dB RF Attenuator by Direct /
Comparison /
Substitution Method

C-0588)

18. Modulation# CW : 1GHz

Amplitude 10 % to 90 % 4 .1% Using R&S SMT-06,
Modulation (MF: 1 kHz) Boonton 8201 by Direct /
Depth Comparison Method
Frequency CW : 1GHz
Modulation 10kHz to 100kHz 6.1 % Using R&S SMT-06,
Deviation (MF: 1 kHz) Boonton 8201 by Direct /
Comparison Method
II. MEASURE
1. DC Voltage# 0.1 mV to 100 mV 5 ppm to 100 ppm Using Fluke 8508 A,

100 mV to 1000V 100 ppm to 7 ppm Wavetek 4950, 7004N,
Agilent 34420,HP 3458A
DC High Voltage# 1kV to 40 kV 0.65% to 1.0% Using Fluke 80E, Fluke

80K40 with DMM by
Direct / Comparison
Method
2. AC Voltage# 10 Hz to 1 MHz
1 mV to 22 mV 100 ppm to 1000 ppm Using Fluke 792A,
22 mV to 700 mV 20 ppm to 1000 ppm Fluke 8508 A,
700 mV to 22 V 10 ppm to 50 ppm Wavetek 4950,
10 Hz to 100 kHz
22 V to 1 kV 10 ppm to 190 ppm HP 3458A by Direct /
Comparison Method
AC High Voltage# 50 Hz
1kV to 28 kV 1.3 % to 1.1 % Using Fluke 80 K40 with
DMM by Direct /
Comparison Method

C-0588)

3. DC Current# 5 pA to 100 nA 2% to 0.03 % Using Dig. Tera Om

Meter Guildline 6520 &
Pico Amp. Source
Keithley 261 in Shielded
Chamber
100 nA to 100 µA 20 ppm to 1000 ppm Keithley 410, Fluke

100 µA to 1 A 10 ppm to 20 ppm 8508A, Wavetek 4950,
1 A to 20 A 10 ppm to 30 ppm Fluke 3458A,
20 A to 100 A 30 ppm to 413 ppm Std Resistance
Tinsley & L&N, L&N
4000, Shunt Guildline
100 A to 1000 A 0.02 % to 0.5 % 9230 with DMM, Fluke
36 (Clamp) by Direct /
Comparison Method
4. AC Current# 10 Hz to 1 kHz
10 μA to 1 A 100 ppm to 500 ppm Using Fluke 8508 A,
Fluke 3458A,
1 kHz to 5 kHz FlukeA40,
10 μA to 1 A 100 ppm Wavetek 4950,
Fluke 5720A
HP 34401With Shunt
10 Hz to 1 kHz
1 A to 20 A 520 ppm Std. Resistance Tinsley,
20 A to 300 A 0.1 % Std. CT, Fluke 36
(Clamp) by Direct /
45 Hz to 400 Hz Comparison Method
1 A to 100 A 0.1% to 1%
5. LF Power# 50 Hz & 60 Hz
(Active/ Reactive/ PF: Unity to 0.1 Using Rotek MSB-100,
Apparent) 10V to 600 V Hsiang Cheng 3100E,
(1Φ & 3 Φ) 5 mA to 200 A 120 ppm to 600 ppm Rotek 8000-3P-200A,
by Direct / Comparison
Method

C-0588)

6. LF Energy# 25 Hz to 100 Hz
(1Φ & 3 Φ) PF: Unity to 0.1 Using Rotek MSB-100,
1V to 600V Hsiang Cheng 3100E,
5mA to 200A 120 ppm to 600 ppm Rotek 8000-3P-200A,
by Direct / Comparison
Method
7. Power Factor# 25 Hz to 1 kHz Using YEW 2524,

0 to 1 (Lag & Lead) 0.02° HC 3100E,
Rotek MSB-100,
Rotek 8000-3P by
Direct / Comparison
Method
8. DC Power # 1V to1000 V 0.005% to 0.1% Using Wavetek 4950,

1 mA to 20 A Fluke 8508A by Direct /
100mW to 20kW Comparison Method
9. Inductance# 10 Hz to 100 kHz

100 µH to 25 mH 0.1 % to 1 % Using Quadtech 1689,
GR 1482 Series,
1 kHz GR 1409 Series by
100 µH to 100m H 0.06% to 0.03% Direct/Comparison /
100mH to 10H 0.03% to 0.06% Simulation Method
100H 0.06%
10. Capacitance# 1 kHz

1 pF to 1000 pF 90 ppm to 12 ppm Using IET 1616,
1000 pF to 1 µF 12 ppm to 0.02 % GR 1620A
1 µF to 1000 µF 0.02 % to 0.4 % Quadtech 1689,
ESI 2110, GR 1688
10 kHz to 1 MHz HP LCR Meter 4275 A
1 pF to 1000pF 0.1 % to 1 % by Direct/Comparison
Method

C-0588)

11. DC Resistance# 10 µ to 100 m 0.2% to 50 ppm Using Guildline 6675,

100 m to 10 k 50 ppm to 3ppm Guildline 6623,
10 k to 1 M 3 ppm to 6 ppm
1 M to 100 M 6 ppm to 25 ppm
100 M to 1 G 25 ppm to 40 ppm
1 G to 20 G 40 ppm to 0.15 %
20 GΩ to 1 TΩ 0.15 % to 0.2 % Guildline 6520 by Ratio
10 TΩ to 100 TΩ 0.2 % to 1 % Comparison Method
12. AC Resistance# Upto 100 kHz

1  to 100 k 0.012 % to 0.02 % Using Quadtech 1689
by Direct/Comparison
Method
13. Frequency# 0.1 Hz to 40 GHz 8*10-7 to 3*10-10 Using Agilent 53132,

HP 5345A, Agilent
8*10-7 to 3*10-8 53152A, (Locked with
Ref Freq Std) by Direct/
100 kHz, 1 MHz, 2*10-11 Comparison Method
5 MHz, 10 MHz
14. Time Interval# 1s to 3600 s 3*10-4 to 2*10-7 Using HP 5315A,

by Direct/Comparison
Method
15. RF Power# 10 MHz to 18 GHz Using R&S SMT-06,

100 nW to 20 mW 5.5 % to 8% Gigatronics 2440M with
HP438A, Boonton
52012, 52018, 52026
10 MHz to 1 GHz
20 mW to 10 W 8% Signal Gen with
Amplifier & HP 438A by
Direct / Comparison
Method

C-0588)

16. Attenuation# 10 MHz to 18 GHz 0.32 dB to 0.48 dB

1 dB to 30 dB Using R&S DPSP,
Boonton 52012, 52018,
52026, HP 438A, R&S
ZVB20 by Direct /
Comparison/
Substitution Method
17. Modulation# 10% to 90 % 4.1% Using Boonton 8201

Amplitude CW: 1 GHz by Direct /
Modulation (MF: 1 kHz) Comparison Method
Depth
18. Frequency 10 kHz to 100 kHz 6.1%

Modulation CW: 1 GHz Using Boonton 8201
Deviation# (MF: 1 kHz) by Direct /
Comparison Method
19. Reflection 10 MHz to 18 GHz

Coefficient# 0.004 to 0.5 0.015 to 0.03 Using R & S ZVB-20
by Direct Method

C-0588)

MECHANICAL CALIBRATION
I. PRESSURE INDICATING DEVICES
1. Pressure Hydraulic $ 3.0 bar to 50 bar (g) 0.008 %rdg. Using Pressure Balance
Dead Weight tester (DWT) with Cross float
Method
50.0 bar to 700.0 bar (g) 0.014 %rdg. Using Pressure Balance
(DWT) with Cross float
Method
Digital /Analog 3.0 bar to 700.0 bar (g) 0.02 % rdg. Using Dead weight
Pressure Gauge Tester
2. Pressure Pneumatic $ 0.5 bar to 13.5 bar (g) 0.015 % rdg. Using Pressure Balance
Digital/Analog Comparison Method
Pressure Gauges
7.0 bar to 200.0 bar (g) 0.01% rdg. Using Pressure Balance
Comparison Method
0.1 bar to 2.6 bar (abs) 0.07% rdg. Using Precision

Pressure indicator
Druck, 740 by
Comparison Method
(-) 0.9 bar to 0.13% rdg. Using Precision

(-) 0.1 bar (g) Pressure indicator
Druck, 740 by
Comparison Method

C-0588)

II. WEIGHTS
1. Weights$ 1 mg 0.013 mg Substitution method,

(F1 and coarser) 2 mg 0.013 mg ABBA weighing cycle
5 mg 0.013 mg
10 mg 0.013 mg Procedure is based on
20 mg 0.013 mg OIML R-111 2004 &
50 mg 0.013 mg NABL 122-02 Specific
100 mg 0.013 mg Criteria
200 mg 0.013 mg
500 mg 0.013 mg
1g 0.022 mg
2g 0.03 mg
5g 0.033 mg
10 g 0.041 mg
20 g 0.051 mg
50 g 0.061 mg
100 g 0.101 mg
200 g 0.202 mg
500 g 0.12 g
1 kg 0.12 g
2 kg 0.10 g
5 kg 0.10 g
10 kg 0.2 g
III. WEIGHING SCALE AND BALANCE
1. Weighing Machine$ (0 to 200) g Using E2 class weight

d = 0.01 mg 0.1 mg as per Procedure based
d = 0.1 mg 0.1mg on OIML R -76 (2006) &
NABL 122-03 Specific
Criteria
(0 to 12) kg Using E2 class weight
d = 1 mg 3 mg as per Procedure based
d = 10 mg 5 mg on OIML R -76 (2006) &
d =100 mg 200mg NABL 122-03 Specific
Criteria

C-0588)

(0 to 22) kg Using E2 class weight

d = 0.1 g 0.7g as per Procedure based
d=1g 2.2 g on OIML R -76 (2006) &
Criteria
Weighing Machine♣ Up to 200g 0.1mg Using E2 class weight

as per Procedure based
>200g to 12000g 0.6g on OIML R -76 (2006) &
>12kg to 22kg 0.81g Criteria
IV. ACCELERATION AND SPEED
1. Tachometer$ 60 rpm to 20000 rpm 0.022% to 0.18% of rdg. Using Tachometer By

(Non-Contact Type) Comparison
& Stroboscope
V. DIMENSION (BASIC MEASURING INSTRUMENT, GAUGE ETC.)
1. Vernier Caliper$ Using 'O' Grade Slip

L.C.: 0.01mm 0 to 200mm 0.016mm gauge by Comparison
0 to 300mm 0.016mm Method
2. Micrometer$ Using 'O' Grade Slip

(External) gauge by Comparison
L. C.: 0.001mm 0 to 25mm 0.003mm Method
L.C.: 0.01mm 0 to 25mm 0.015mm
3. Dial Gauge$ Using 'O' Grade Slip

(Plunger Type) gauge by Comparison
L.C.: 0.001mm 0 to 25mm 0.003mm Method

C-0588)

VI. ACOUSTICS
1. Sound Level# 1 kHz

94dB 0.2 dB Using B&K 4230 by
Direct Method

C-0588)

THERMAL CALIBRATION
I. TEMPERATURE
1. RTDS, (-)50 °C to 200 °C 0.044 °C Using SPRT, Digital

Thermocouple, Thermometer & Liquid
Temperature Bath by Comparison
Measuring Devices Method
With Probes$
2. RTDS, 200 °C to 660 °C 0.15°C Using SPRT, Digital

Thermocouple, Thermometer & Dry
Temperature Block Bath by
Measuring Devices Comparison Method
With Probes$
3. Thermocouple, 660 °C to 1000 °C 1.2 °C Using 'S' Thermocouple,

Temperature Digital Thermometer,
Measuring Devices High Temperature
With Probes$ Furnace & Zero ref. bath
by Comparison Method
4. Liquid In Glass (-) 50 °C to 200 °C 0.08 °C Using SPRT, Digital

Thermometer$ Thermometer & Liquid
Bath by Comparison
Method
5. Temperature (-) 50 °C to 200 °C 0.04 °C Using SPRT with Digital

Indicator With Sensor Thermometer by
of Liquid Bath$ Comparison Method
(Single Point Calibration)
6. Temperature 200 °C to 660 °C 0.15 °C Using SPRT with Digital

of Dry Block Bath$ Comparison Method

C-0588)

7. Temperature 660 °C to 1000 °C 1.20 °C Using 'S' Thermocouple,

Indicator With Sensor Digital Thermometer &
Of Dry Block / Zero Ref. bath by
Furnace$ Comparison Method
(Single Point Calib)
8. Temperature (-) 80 °C to 250 °C 0.60 °C Using Temperature

Chamber/Oven/ Calibrator with RTD's
Freezer$ Sensors & Data Logger
with RTDS by
Comparison Method
(Multi Point Calibration)
9. RTDS, (-)50 °C to 200 °C 0.06 °C Using SSPRT, Digital

Thermocouple, Thermometer & Liquid
Temperature Bath by Comparison
Measuring Devices Method
With Probes♣
10. RTDS, 200 °C to 660 °C 0.34°C Using SSPRT, Digital

Thermocouple, Thermometer & Dry
Temperature Block Bath by
Measuring Devices Comparison Method
With Probes♣
11. Thermocouple, 660 °C to 1000 °C 1.4 °C Using 'S' Thermocouple,

Temperature Digital Thermometer,
Measuring Devices High Temperature
With Probes♣ Furnace & Zero ref. bath
by Comparison Method
12. Temperature (-) 50 °C to 200 °C 0.08 °C Using SSPRT with

Indicator With Sensor Digital Thermometer by
of Liquid Bath♣ Comparison Method

C-0588)

13. Temperature 200 °C to 660 °C 0.2 °C Using SSPRT & Digital

of Dry Block Bath♣ Comparison Method
14. Temperature 660 °C to 1000 °C 1.4 °C Using 'S' Thermocouple,

Indicator With Sensor Digital Thermometer &
of Dry Block bath/ Zero Ref. bath by
Furnace♣ Comparison Method
15. Temperature (-) 80 °C to 250 °C 0.6 °C Using Temperature

Chamber/Oven/ Calibrator with RTD's
Freezer/Incubator♣ Sensors & Data Logger
with RTDs by
Comparison Method
(Multi Point Calibration)
16. SPRT/SSPRT BY -38.8344 to 660.323 °C 2.74 mk By Fixed Point Method

Fixed Point Cells$
TP of Mercury
-38.8344 °C 2.26 mk By Fixed Point Method
TP of Water 0.01 °C
MP of Gallium
29.7646 °C 3.27 mk By Fixed Point Method
FP of Tin 231.928 °C 4.58 mk By Fixed Point Method
FP of Zinc 419.527 °C 5.21 mk By Fixed Point Method
FP of Aluminum 5.94 mk By Fixed Point Method

660.323 °C

C-0588)

II. SPECIFIC HEAT & HUMIDITY
1. Humidity / 20 % RH to 95 % RH 1.30 % RH Using RH-Temperature

Temperature 10 °C to 55 °C Indicator by Comparison
Chamber$ Method
2. Humidity/ 30 % RH to 95 % RH 1.2 % RH Using RH-Temperature

Temperature & 25 °C to 55 °C 0.3°C Indicator with Chamber
Humidity Indicator $ by Comparison Method
3. Humidity / 20 % RH to 95 % RH 1.3 % RH Using RH-Temperature

Temperature 10 °C to 55 °C 0.31°C Indicator by Comparison
Chamber♣ Method

C-0588)

OPTICAL CALIBRATION
1. Optical Power $ (-) 50 dBm to 10 dBm 0.18 dB Using Optical Power

at 1310 nm & 1550 nm Meter, EXFO, IQ-1502
by standard method
2. Wavelength $ 700 nm to 1650 nm 0.58 nm Using Wave meter,

EXPO, WA 1150 by
Standard Method
3. Laser Power $ 10 dBm 0.18 dB Using WDM Laser

(at 1310 nm & 1550 nm) source, Expo, IQ-2400
by Standard Method
4. Optical Attenuation$ 1 dB to 50 dB 0.18 dB to 0.26 dB Using Variable

(at 1310 nm & 1550 nm) Attenuator, EXPO,
IQ-3100 by standard
method
5. Optical Length$ 2.2 km to 14.9 km 0.0021 km to 0.0029 km Using Optical fiber spool
by standard method
* Measurement Capability is expressed as an uncertainty () at a confidence probability of 95%

$
Only in Permanent Laboratory
♣
Only for Site Calibration
#
The laboratory is also capable for site calibration however, the uncertainty at site depends on the
prevailing actual environmental conditions and master equipment used.
Φ
Laboratory can also calibrate instruments/devices of coarser resolution / least count within the
accredited range using same reference standard/ master equipment under the scope of accreditation.


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Laboratory Electronics Regional Test Laboratory (North), S-Block, Okhla

Industrial Area, Phase-II, New Delhi

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

1. DC Voltage# 1V 2 ppm Using Wavetek 7004N,

3. DC Current# 100 nA to 10 µA 35ppm to 2000 ppm Using Fluke 5720A &

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

5. LF Power# 50 Hz & 60 Hz 120 ppm to 600 ppm Using Rotek 8000-3P-

6. LF Energy# 50 Hz & 60 Hz 120 ppm to 600 ppm Using Rotek 8000-3P-

7. Power Factor # 50 Hz & 60 Hz Using Rotek 8000-3P-

8. DC Power # 100mW to 20kW 0.005 % to 0.1 % Using Fluke 5520A,

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

Bandwidth# Upto 1.1 GHz 2.5 % to 4.0 %

10. Inductance# 1 kHz

11. Capacitance# 1 kHz

10 kHz to 100 kHz

12. DC Resistance# 0.1 mΩ 50 ppm Using Guildline 9230,

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

1 GΩ to 1 TΩ 0.02% to 0.13 % Guildline 9334,

13. AC Resistance# Upto 1 kHz

14. Frequency# 100 kHz, 1 MHz, 3*10-10 Using Fluke 910R,

15. Time Interval# 1s to 3600 s 3*10-4 to 2*10-7 Using HP 5315A, Agilent

16. RF Power# 10 MHz to 18 GHz Using R&S SMT-06,

17. Attenuation# 50 kHz to 2.7 GHz

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

18. Modulation# CW : 1GHz

1. DC Voltage# 0.1 mV to 100 mV 5 ppm to 100 ppm Using Fluke 8508 A,

DC High Voltage# 1kV to 40 kV 0.65% to 1.0% Using Fluke 80E, Fluke

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

3. DC Current# 5 pA to 100 nA 2% to 0.03 % Using Dig. Tera Om

100 nA to 100 µA 20 ppm to 1000 ppm Keithley 410, Fluke

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

7. Power Factor# 25 Hz to 1 kHz Using YEW 2524,

8. DC Power # 1V to1000 V 0.005% to 0.1% Using Wavetek 4950,

9. Inductance# 10 Hz to 100 kHz

10. Capacitance# 1 kHz

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

11. DC Resistance# 10 µ to 100 m 0.2% to 50 ppm Using Guildline 6675,

12. AC Resistance# Upto 100 kHz

13. Frequency# 0.1 Hz to 40 GHz 8*10-7 to 3*10-10 Using Agilent 53132,

14. Time Interval# 1s to 3600 s 3*10-4 to 2*10-7 Using HP 5315A,

15. RF Power# 10 MHz to 18 GHz Using R&S SMT-06,

Ashish Kakran Avijit Das

Validity 11.02.2017 to 10.02.2019 Last Amended on 13.04.2017

Sl. Quantity Measured / Range/Frequency *Calibration Measurement Remarks

16. Attenuation# 10 MHz to 18 GHz 0.32 dB to 0.48 dB

17. Modulation# 10% to 90 % 4.1% Using Boonton 8201

18. Frequency 10 kHz to 100 kHz 6.1%

19. Reflection 10 MHz to 18 GHz

Ashish Kakran Avijit Das

15. Time Interval# 1s to 3600 s 310-4 to 210-7 Using HP 5315A, Agilent

13. Frequency# 0.1 Hz to 40 GHz 810-7 to 310-10 Using Agilent 53132,

14. Time Interval# 1s to 3600 s 310-4 to 210-7 Using HP 5315A,