7sa52 line1:

. .
Test Object - Device Settings
. . .
Substation/Bay:
Substation: SMP Substation address:
Bay: Folder Bay address:
. . .
Device:
Name/description: SMP /Folder Manufacturer:
Device type: 7SA522 Device address:
Serial/model number:
Additional info 1:
Additional info 2:
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 110.0 V V primary: 110.0 V
I nom (secondary): 1.000 A I primary: 1.000 A
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 120.0 V I max: 10.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 5.000 ms Deglitch time: 0.000 s
. . .
Overload Detection:
Suppression time: 50.00 ms

Test Object - Other RIO Functions

.
CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings

. . . .
System parameters:
Line length: 18.83 Ω Line angle: 85.00 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 100.0 ms Tol. T abs. -: 100.0 ms
 Tol. Z rel.: 5.000 % Tol. Z abs.: 100.0 mΩ
. . . .
Grounding factor:
RE/RL: 2.520000 XE/XL: 0.710000
Separate arc resistance: no

Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1 Tripping L-L 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1 Tripping L-E 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1B extended L-L 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1B extended L-E 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z2 Tripping L-L 300.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z2 Tripping L-E 300.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z3 Tripping L-L 800.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z3 Tripping L-E 800.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z4 Tripping L-L 1.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z4 Tripping L-E 1.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
X/Ω
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Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 110.00 V RIO/Device/Nominal Values/V nom

Comment

. .
Test Module
Name: OMICRON Advanced Distance Version: 3.10
Test Start: 05-Dec-2017 11:24:08 Test End: 05-Dec-2017 11:29:05
User Name: Manager:
Company:
Test Settings
.
Test model:
Test model: constant test current ITest 2.000 A
Allow reduction of yes kS = kL: no
ITest/VTest:
ZS mag.: 0.000 Ω ZS angle: 0.00 °
kS mag.: 1.000 kS angle: 0.00 °
.
Fault Inception:
Mode: random
DC-offset: no
.
Times:
Prefault: 0.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception
.
Other:
Extended zones: not active Switch off at zero crossing: yes
Load current enabled: no Load current:: n/a
.
Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 mΩ
Ignore nominal no
characteristics:
Search interval: 200.0 mΩ
.
Auxiliary Binary Outputs:
Name Fault inception Slope Trip Delay time Slope
Delay time
Ext. zones active n/a Open n/a Open

Test Results
Shot Test: Fault Type L1-E
|Z| Phi % % of t nom t act. Dev. ITest Result
3.924 Ω 85.00 ° n/a 0.000 s 14.10 ms 14.10 ms 2.000 A Passed
7.356 Ω 85.00 ° n/a 0.000 s 16.10 ms 16.10 ms 2.000 A Passed
10.00 Ω 85.00 ° n/a 0.000 s 16.50 ms 16.50 ms 2.000 A Passed
13.82 Ω 30.00 ° n/a 0.000 s 16.20 ms 16.20 ms 1.583 A Passed
10.00 Ω 10.00 ° n/a 0.000 s 13.90 ms 13.90 ms 1.991 A Passed
22.23 Ω 30.00 ° n/a 0.000 s 34.50 ms 34.50 ms 984.4 mA Passed
17.67 Ω 85.00 ° n/a 300.0 ms 334.1 ms 11.37 % 2.000 A Passed
22.19 Ω 85.00 ° n/a 300.0 ms 334.2 ms 11.4 % 1.803 A Passed
27.17 Ω 54.39 ° n/a 300.0 ms 338.8 ms 12.93 % 1.030 A Passed
24.71 Ω 76.23 ° n/a 300.0 ms 334.5 ms 11.5 % 1.507 A Passed
17.71 Ω 70.00 ° n/a 300.0 ms 334.3 ms 11.43 % 1.949 A Passed
27.34 Ω 85.00 ° n/a 800.0 ms 834.5 ms 4.313 % 1.464 A Passed
28.37 Ω 72.52 ° n/a 800.0 ms 839.0 ms 4.875 % 1.256 A Passed
33.78 Ω 53.69 ° n/a 800.0 ms 834.0 ms 4.25 % 820.9 mA Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.38 % 1.991 A Passed
18.76 Ω 174.21 ° n/a 1.000 s 1.054 s 5.41 % 1.053 A Passed
20.00 Ω -174.78 ° n/a 1.000 s 1.034 s 3.44 % 987.3 mA Passed
10.00 Ω 170.00 ° n/a 1.000 s 1.055 s 5.46 % 1.991 A Passed
 X/Ω

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Shot Test: Fault Type L2-E

|Z| Phi % % of t nom t act. Dev. ITest Result
3.924 Ω 85.00 ° n/a 0.000 s 14.70 ms 14.70 ms 2.000 A Passed
7.356 Ω 85.00 ° n/a 0.000 s 16.20 ms 16.20 ms 2.000 A Passed
10.00 Ω 85.00 ° n/a 0.000 s 16.40 ms 16.40 ms 2.000 A Passed
13.82 Ω 30.00 ° n/a 0.000 s 16.50 ms 16.50 ms 1.583 A Passed
10.00 Ω 10.00 ° n/a 0.000 s 14.40 ms 14.40 ms 1.991 A Passed
22.23 Ω 30.00 ° n/a 0.000 s 34.60 ms 34.60 ms 984.4 mA Passed
17.67 Ω 85.00 ° n/a 300.0 ms 334.0 ms 11.33 % 2.000 A Passed
22.19 Ω 85.00 ° n/a 300.0 ms 334.0 ms 11.33 % 1.803 A Passed
27.17 Ω 54.39 ° n/a 300.0 ms 334.0 ms 11.33 % 1.030 A Passed
24.71 Ω 76.23 ° n/a 300.0 ms 339.4 ms 13.13 % 1.507 A Passed
17.71 Ω 70.00 ° n/a 300.0 ms 334.3 ms 11.43 % 1.949 A Passed
27.34 Ω 85.00 ° n/a 800.0 ms 839.4 ms 4.925 % 1.464 A Passed
28.37 Ω 72.52 ° n/a 800.0 ms 834.0 ms 4.25 % 1.256 A Passed
33.78 Ω 53.69 ° n/a 800.0 ms 834.0 ms 4.25 % 820.9 mA Passed
5.176 Ω -150.00 ° n/a 1.000 s 1.034 s 3.38 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.42 % 1.991 A Passed
18.76 Ω 174.21 ° n/a 1.000 s 1.054 s 5.41 % 1.053 A Passed
20.00 Ω -174.78 ° n/a 1.000 s 1.034 s 3.4 % 987.3 mA Passed
10.00 Ω 170.00 ° n/a 1.000 s 1.054 s 5.43 % 1.991 A Passed
 X/Ω

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Shot Test: Fault Type L3-E

|Z| Phi % % of t nom t act. Dev. ITest Result
3.924 Ω 85.00 ° n/a 0.000 s 14.70 ms 14.70 ms 2.000 A Passed
7.356 Ω 85.00 ° n/a 0.000 s 16.90 ms 16.90 ms 2.000 A Passed
10.00 Ω 85.00 ° n/a 0.000 s 16.30 ms 16.30 ms 2.000 A Passed
13.82 Ω 30.00 ° n/a 0.000 s 15.80 ms 15.80 ms 1.583 A Passed
10.00 Ω 10.00 ° n/a 0.000 s 16.20 ms 16.20 ms 1.991 A Passed
22.23 Ω 30.00 ° n/a 0.000 s 34.20 ms 34.20 ms 984.4 mA Passed
17.67 Ω 85.00 ° n/a 300.0 ms 334.2 ms 11.4 % 2.000 A Passed
22.19 Ω 85.00 ° n/a 300.0 ms 334.5 ms 11.5 % 1.803 A Passed
27.17 Ω 54.39 ° n/a 300.0 ms 333.8 ms 11.27 % 1.030 A Passed
24.71 Ω 76.23 ° n/a 300.0 ms 334.0 ms 11.33 % 1.507 A Passed
17.71 Ω 70.00 ° n/a 300.0 ms 334.7 ms 11.57 % 1.949 A Passed
27.34 Ω 85.00 ° n/a 800.0 ms 834.3 ms 4.287 % 1.464 A Passed
28.37 Ω 72.52 ° n/a 800.0 ms 834.5 ms 4.313 % 1.256 A Passed
33.78 Ω 53.69 ° n/a 800.0 ms 833.9 ms 4.237 % 820.9 mA Passed
5.176 Ω -150.00 ° n/a 1.000 s 1.034 s 3.43 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.040 s 3.95 % 1.991 A Passed
18.76 Ω 174.21 ° n/a 1.000 s 1.054 s 5.41 % 1.053 A Passed
20.00 Ω -174.78 ° n/a 1.000 s 1.035 s 3.45 % 987.3 mA Passed
10.00 Ω 170.00 ° n/a 1.000 s 1.054 s 5.39 % 1.991 A Passed
 X/Ω

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Shot Test: Fault Type L1-L2

|Z| Phi % % of t nom t act. Dev. ITest Result
4.639 Ω 70.00 ° n/a 0.000 s 15.00 ms 15.00 ms 2.000 A Passed
10.00 Ω 70.00 ° n/a 0.000 s 17.50 ms 17.50 ms 2.000 A Passed
15.24 Ω 50.00 ° n/a 0.000 s 34.20 ms 34.20 ms 2.000 A Passed
10.00 Ω 40.00 ° n/a 0.000 s 17.00 ms 17.00 ms 2.000 A Passed
18.43 Ω 76.55 ° n/a 300.0 ms 334.4 ms 11.47 % 2.000 A Passed
22.86 Ω 80.00 ° n/a 300.0 ms 334.3 ms 11.43 % 2.000 A Passed
25.89 Ω 52.91 ° n/a 300.0 ms 334.7 ms 11.57 % 2.000 A Passed
25.51 Ω 70.00 ° n/a 300.0 ms 339.3 ms 13.1 % 2.000 A Passed
27.32 Ω 85.00 ° n/a 800.0 ms 834.7 ms 4.338 % 2.000 A Passed
30.00 Ω 66.19 ° n/a 800.0 ms 839.0 ms 4.875 % 2.000 A Passed
37.06 Ω 47.23 ° n/a 800.0 ms 834.5 ms 4.313 % 1.619 A Passed
6.594 Ω 170.00 ° n/a 1.000 s 1.054 s 5.41 % 2.000 A Passed
6.449 Ω -160.00 ° n/a 1.000 s 1.035 s 3.48 % 2.000 A Passed
3.549 Ω -170.00 ° n/a 1.000 s 1.034 s 3.43 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.035 s 3.47 % 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result
4.639 Ω 70.00 ° n/a 0.000 s 15.00 ms 15.00 ms 2.000 A Passed
10.00 Ω 70.00 ° n/a 0.000 s 21.90 ms 21.90 ms 2.000 A Passed
15.24 Ω 50.00 ° n/a 0.000 s 33.90 ms 33.90 ms 2.000 A Passed
10.00 Ω 40.00 ° n/a 0.000 s 17.40 ms 17.40 ms 2.000 A Passed
18.43 Ω 76.55 ° n/a 300.0 ms 339.0 ms 13 % 2.000 A Passed
22.86 Ω 80.00 ° n/a 300.0 ms 339.5 ms 13.17 % 2.000 A Passed
25.89 Ω 52.91 ° n/a 300.0 ms 334.3 ms 11.43 % 2.000 A Passed
25.51 Ω 70.00 ° n/a 300.0 ms 334.7 ms 11.57 % 2.000 A Passed
27.32 Ω 85.00 ° n/a 800.0 ms 834.8 ms 4.35 % 2.000 A Passed
30.00 Ω 66.19 ° n/a 800.0 ms 839.6 ms 4.95 % 2.000 A Passed
37.06 Ω 47.23 ° n/a 800.0 ms 834.9 ms 4.362 % 1.619 A Passed
6.594 Ω 170.00 ° n/a 1.000 s 1.055 s 5.46 % 2.000 A Passed
6.449 Ω -160.00 ° n/a 1.000 s 1.034 s 3.44 % 2.000 A Passed
3.549 Ω -170.00 ° n/a 1.000 s 1.035 s 3.46 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.42 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.41 % 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L3-L1

|Z| Phi % % of t nom t act. Dev. ITest Result
4.639 Ω 70.00 ° n/a 0.000 s 15.50 ms 15.50 ms 2.000 A Passed
10.00 Ω 70.00 ° n/a 0.000 s 17.20 ms 17.20 ms 2.000 A Passed
15.24 Ω 50.00 ° n/a 0.000 s 34.60 ms 34.60 ms 2.000 A Passed
10.00 Ω 40.00 ° n/a 0.000 s 16.80 ms 16.80 ms 2.000 A Passed
18.43 Ω 76.55 ° n/a 300.0 ms 334.7 ms 11.57 % 2.000 A Passed
22.86 Ω 80.00 ° n/a 300.0 ms 334.1 ms 11.37 % 2.000 A Passed
25.89 Ω 52.91 ° n/a 300.0 ms 339.4 ms 13.13 % 2.000 A Passed
25.51 Ω 70.00 ° n/a 300.0 ms 334.8 ms 11.6 % 2.000 A Passed
27.32 Ω 85.00 ° n/a 800.0 ms 834.8 ms 4.35 % 2.000 A Passed
30.00 Ω 66.19 ° n/a 800.0 ms 834.8 ms 4.35 % 2.000 A Passed
37.06 Ω 47.23 ° n/a 800.0 ms 834.8 ms 4.35 % 1.619 A Passed
6.594 Ω 170.00 ° n/a 1.000 s 1.054 s 5.39 % 2.000 A Passed
6.449 Ω -160.00 ° n/a 1.000 s 1.034 s 3.43 % 2.000 A Passed
3.549 Ω -170.00 ° n/a 1.000 s 1.035 s 3.49 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.4 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.035 s 3.47 % 2.000 A Passed
 X/Ω

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Shot Test: Fault Type L1-L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result
4.639 Ω 70.00 ° n/a 0.000 s 15.80 ms 15.80 ms 2.000 A Passed
10.00 Ω 70.00 ° n/a 0.000 s 22.10 ms 22.10 ms 2.000 A Passed
15.24 Ω 50.00 ° n/a 0.000 s 34.60 ms 34.60 ms 2.000 A Passed
10.00 Ω 40.00 ° n/a 0.000 s 16.20 ms 16.20 ms 2.000 A Passed
18.43 Ω 76.55 ° n/a 300.0 ms 334.4 ms 11.47 % 2.000 A Passed
22.86 Ω 80.00 ° n/a 300.0 ms 334.9 ms 11.63 % 2.000 A Passed
25.89 Ω 52.91 ° n/a 300.0 ms 339.9 ms 13.3 % 2.000 A Passed
25.51 Ω 70.00 ° n/a 300.0 ms 339.4 ms 13.13 % 2.000 A Passed
27.32 Ω 85.00 ° n/a 800.0 ms 834.8 ms 4.35 % 2.000 A Passed
30.00 Ω 66.19 ° n/a 800.0 ms 839.4 ms 4.925 % 2.000 A Passed
37.06 Ω 47.23 ° n/a 800.0 ms 834.5 ms 4.313 % 1.870 A Passed
6.594 Ω 170.00 ° n/a 1.000 s 1.059 s 5.92 % 2.000 A Passed
6.449 Ω -160.00 ° n/a 1.000 s 1.039 s 3.92 % 2.000 A Passed
3.549 Ω -170.00 ° n/a 1.000 s 1.040 s 3.99 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.034 s 3.43 % 2.000 A Passed
10.00 Ω -170.00 ° n/a 1.000 s 1.035 s 3.47 % 2.000 A Passed
 X/Ω

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Shot Details:
.
Parameters:
Fault Type: L1-L2-L3
| Z |: 10.00 Ω Phi: -170.00 °
R: -9.848 Ω X: -1.737 Ω
%: n/a % of:
ITest 2.000 A

.
Results:
t act.: 1.035 s Assessment: Passed
t nom: 1.000 s Dev.: 3.47 %
t min: 900.0 ms t max: 1.100 s
. .
Fault Quantities (natural): Fault Quantities (symmetrical):
VL1: 20.00 V 0.00 ° V0: 0.000 V n/a
VL2: 20.00 V -120.00 ° V1: 20.00 V 0.00 °
VL3: 20.00 V 120.00 ° V2: 0.000 V n/a
IL1: 2.000 A 170.00 ° I0: 0.000 A n/a
IL2: 2.000 A 50.00 ° I1: 2.000 A 170.00 °
IL3: 2.000 A 290.00 ° I2: 0.000 A n/a
VFault: 20.00 V 0.00 °
IFault: 2.000 A 170.00 °

Fault
Prefault
 V/V

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VL1 VL2 VL3

I/A

2.0

1.0

0.0
0.10 0.20 0.30 0.40 0.50 t/s
-1.0

-2.0

-3.0
IL1 IL2 IL3

Trip
Start

0.10 0.20 0.30 0.40 0.50

t/s

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 1.035 s <none> n/a
C2 - C1 1.035 s n/a

.
Test State:
Test passed