Академический Документы
Профессиональный Документы
Культура Документы
1 2
06-924-16
1 2
New Developments in PV Module Testing New Technologies 1 The hot-spot test (IEC 61215) is carried out
Standardization Despite joint efforts of various testing in our double climate chamber with a solar
To give room to a fast developing and laboratories worldwide, international simulator. ©BSW-Solar
innovative market, the standard’s structure standards are always one step behind the 2 Measurement device developed for hail test.
has been revised. While in the past, there latest developments in PV module and cell
were different standards for two major technologies. Thus, test procedures for the
technologies (IEC 61215 ed. 2 for crystalline newest technologies often do not exist.
former version
silicon and IEC 61646 ed. 2 for thin film PV
modules), the new standard is divided into Two prominent examples for such technolo- IEC 61215 Ed. 2
c-Si
two parts. As illustrated in Fig. 3, one part gical trends are bifacial PV modules, which
states the test conditions, while the other use the front and rear side illumination to
IEC 61646 Ed. 2
part includes general requirements as well generate electricity, and PV modules with thin-film
as special adaptions of the test conditions so-called organic or dye solar cells.
for individual technologies. In addition,
almost every test procedure has been The TestLab PV Modules supports custo- new version
(partly released)
technically adjusted and new tests have mers in adapting and developing suitable
been added. testing conditions for new technologies
IEC 61215-1 Ed. 1 test requirements
in close cooperation with the certification
Exemplarily some highlighted changes are: body VDE. Our long-term experience in
IEC 61215-1-1 Ed. 1
n consideration of LID : Independent from PV module testing helps us to identify c-Si
the cell technology, every module is necessary modifications in test conditions IEC 61215-1-2 Ed. 1
tested for its sensitivity to an initial light- that enable certification testing for new CdTe