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Measuring Dynamic Performance

Just knowing the DC specifications of a device


cannot predict its AC performance.
Despite claims from some manufacturers, all data
acquisition devices are not created equal. Learning
to distinguish a few important specifications can make all the difference.
This white paper describes the importance of AC specifications when
measuring dynamic performance.
DC versus AC Specifications cant. AC specifications tell you how input signal. From the simplest
much noise and distortion have perspective, the data acquisition
DC specifications, which provide
been introduced into the sampled device acts as a low-pass filter that
information on the accuracy of the
data to affect the accuracy of the passes low frequencies and attenu-
A/D converter (ADC), are most im-
data for a given input signal and ates (or reduces) high frequencies.
portant in applications where you
sampling frequency. Just knowing The range of frequencies from DC
want to measure slowly changing
the DC specifications of a device to the cut-off frequency (70.7% of
signals, such as temperature, or
cannot predict its AC performance, the input signal) is called the 3 dB
low-frequency signals as compared
so it is important that you know bandwidth of the filter. The band-
to the sampling frequency of the
the AC specifications of your de- width is determined by the resis-
ADC.
vice! tance and capacitance of the cir-
In applications where you want to cuit, as shown in Figure 1.
One of the factors that determines
measure rapidly changing and/or
AC performance is the effect of the
high frequency signals, however,
analog front-end circuitry on the
AC specifications are more signifi-

Data Acquisition Device

Input Signal R
F = ------1------
2πRC
C

Figure 1. The data acquisition device acts as a low-pass filter that passes low frequencies and
attenuates high frequencies. The 3 dB bandwidth is determined by the resistance (R) and ca-
pacitance (C) of the circuit.

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What affects bandwidth?
Bandwidth is affected by over voltage protection (which acts like a resistor in
the channel’s circuit), EMI protection (which acts like a capacitor in the chan-
nel’s circuit), and the bandwidth of the operational amplifier (which affects the
power that is used and the cost of the device).

For example, assume that you frequency increases over time. tenuates the input signal, as
want to measure a +/-10 V (20 The analog front-end circuitry, shown in Figure 2.
V peak-to-peak) signal whose acting as a low-pass filter, at-

Figure 2. A +/- 10 V (20 Vp-p)


input signal is applied. The
analog front-end circuitry, act-
ing as a low-pass filter, attenu-
ates the input signal as the fre-
quency increases.

What is the Nyquist


Sampling Theorem? The design of the analog in- wide bandwidth guarantees
According to the Nyquist sampling theorem, put circuitry determines the a very flat response through
you must specify a frequency that is at least bandwidth of the device, the Nyquist range (0 to 1
twice as fast as the input’s highest frequency which in turn, determines MHz), ensuring that your
component to avoid aliasing —a condition in whether your sampled data data is accurate at the maxi-
which unwanted frequency signals appear is distorted by signal at- mum sampling frequency of
within the bandwidth of interest. For exam- tenuation or other errors. the device (2 MHz) with vir-
ple, to accurately sample a 20 kHz signal, you For example, the DT9832A tually no attenuation or
must specify a sampling frequency of at least
module, shown in Figure 3, phase distortion of the input
40 kHz.
provides a wide bandwidth, signal.
where the 3 dB point is at 10
times the Nyquist limit, or
greater than 10 MHz. This

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Figure 3. AC specifications tell you how much noise and distortion have been introduced into
the sampled data over the entire frequency range of the device. The 3 dB bandwidth of your de-
vice determines how well your sampled data reflects the real-world signal that you are trying to
measure.

As you can see, AC specifications particularly useful metric, as it • System electrical noise
are critical when characterizing measures the performance of the
• Distortions that the ADC in-
the signal bandwidth and other entire data acquisition device,
troduces
design features of your device not just the ADC, and it does so
under dynamic conditions. The under dynamic, real-world con- • The effects of over-driving the
next section describes two AC ditions. It detects such things as filter op-amps when the input
specifications that are particu- interactions between the over- signal is over-range
larly useful when measuring dy- voltage protection circuits and
namic performance. EMI filters. All of the following
errors, which are not reflected in
Understanding Two Impor-
DC specifications, contribute to
tant AC Specifications -
the ENOB specification:
ENOB and SFDR
• Noise from gain-setting resis-
When you want to measure dy-
tors within the instrumenta-
namic signals, pay particular at-
tion amplifier
tention to the following AC speci-
fications: ENOB (Effective Num- • Amplifier and sample-and-
ber of Bits) and SFDR (Spurious hold bandwidth errors
Free Dynamic Range).
• The effects of acquisition
The ENOB specification tells you time, channel-to-channel off-
how accurate your device is as a set, and channel crosstalk in
function of the input signal and the input multiplexer
the chosen sampling rate. It is a

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What is an FFT?

An FFT (Fast Fourier Transform) is an algorithm that transforms data from the time domain to the
frequency domain. The input signal is “decomposed” into its constituent frequency and correspond-
ing amplitude components, allowing a wide range of signal processing techniques to be used. The
number of “bins” or size of the FFT determines how many frequencies are available in the output
spectrum.

When a signal is observed for a finite interval of time, spectral information may be distorted. To
avoid or minimize this distortion, specifically designed filtering functions called “windows” are
used. A number of windowing functions are available. In this discussion, a Blackman Harris 92 dB
window is used.

Figure 4 shows the ENOB and 16-bit multiplexed architecture


SFDR specifications for a and a maximum sampling fre-
DT9834 module, which has a quency of 500 kHz.

Multiplexed Architecture SNR = Signal-to-Noise D = Distortion IBF = Input Below Full-Scale

Figure 4. ENOB and SFDR specifications tell you the accuracy of the A/D
front-end on your device under dynamic, worst-case conditions when switch-
ing between two channels at high speed.
Note the following when looking at Figure 4:

• A +/-10V input signal with a frequency of 1 kHz is applied.

• 1024 samples are acquired from two adjacent channels at the Nyquist limit of 125 kHz per channel.

• An FFT is performed on the acquired data using a Blackman Harris 92 dB windowing function.

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Table 1. How dB relates to Voltage for a +/-10 V Input Signal
The output spectrum shows the Range
fundamental signal and all har-
monics below the noise floor. The dB % of Full-Scale Voltage
ENOB and SFDR specifications
are calculated directly from this 0 100 +/-10 V
output spectrum.
-6 50 +/-5 V
For the DT9834 device, the ENOB -20 10 +/-1 V
specification, or the accuracy of -40 .1 +/-0.1 V
the A/D front end at the maxi-
-60 .01 +/-0.01 V
mum sampling frequency, is 14.6
bits. The SFDR, or the ratio of the
Now, let’s look at the output spectrum of a 1 kHz signal at -0.5 dB
level of the input signal to the
and -20 dB.
level of the largest distortion
component in the FFT spectrum,
is 100 dB. These specifications
characterize the worst-case
performance of the DT9834
when switching between two
channels at high speed.

Measure Accuracy at Full-


Scale

For accurate measurements, en-


sure that the A/D performance
of your data acquisition device
has been characterized with a
full-scale signal applied, or as
close to 0 dB as possible. Since the peak frequency in Figure exercised and it is impossible to
5 occurs at -0.5 dB, you know that tell how noise and other low-
For example, assume that you a +/- 10 V signal was applied to the frequency components affect your
want to measure a signal using a input. You can clearly see how data.
data acquisition device with a +/- noise and other low frequency
10 V input signal range. Table 1 Only by measuring full-scale sig-
components affect your data.
shows how dB relates to full-scale nals can you see how noise and
voltage. In Figure 6, however, the peak fre- other low-frequency components
quency occurs at -20 dB; therefore, affect your measurements. To be
according to Table 1, you know able to predict the dynamic per-
that the applied signal was only formance of your device, insist on
+/- 1 V. As you can see, if you seeing full-scale performance
measure a small signal, the full dy- specifications.
namic range of the converter is not

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Measure Performance at the For example, assume that you Figure 7 shows the ENOB and
Frequency of Interest want to measure a +/- 10 V signal SFDR specifications for the
whose frequency (the frequency of DT9832A module using a +/- 10
Since AC performance typically
interest) is 10 kHz. To properly V, 10 kHz input signal. The
degrades as the input signal fre-
characterize the dynamic per- DT9832A module has two 16-bit
quency increases, it is important
formance of your device, ensure simultaneous ADCs and a maxi-
to check the AC performance at
that the ENOB and SFDR specifi- mum sampling frequency of 2
the frequency of interest.
cations are measured using this 10 MHz.
kHz input signal.

Simultaneous Architecture SNR = Signal-to-Noise D = Distortion IBF = Input Below Full-Scale

Figure 7. ENOB and SFDR specifications for the DT9832A are taken at the frequency
of interest, allowing you to characterize the dynamic performance of your device.

As you can see, at the frequency of Verify the Accuracy of Your (accurate to at least 0.001%) with
interest on the DT9832A, the Device strength within 1 dB of the device’s
ENOB specification is 14.1 bits and maximum input range on one
If you’re uncertain about the AC
the SFDR specification is 96 dB. channel. Then with the input
performance of your device, you
Note that due to the wide signal grounded on an adjacent channel,
can measure the ENOB and SFDR
bandwidth of this device, you can acquire the data on both channels.
specifications yourself.
see virtually all signal frequencies,
Once the data has been acquired,
including any noise, that may be in To measure SFDR and ENOB, gen-
perform an FFT on the output
your data. erate a pure sinusoidal input signal

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using a Blackman Harris 92 dB Summary
windowing function. Once you have
In applications where you want to
the output spectrum of the FFT,
measure rapidly changing and/or
determine the SFDR and ENOB
high frequency signals, ENOB and
specifications.
SFDR specifications can help you
characterize dynamic performance.

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