The 9th International Symposium on NDT in Aerospace

8-10 November, 2017, Xiamen, China

Detection of defects in aircraft multi-layered conductive

structures by IDC-MFM method
Donglin LI, Xiaochun SONG, Tao CHEN, Jun TU, Jian GAO
School of Mechanical Engineering, Hubei University of Technology, Wuhan, China
Corresponding author: Donglin Li, e-mail: 136235958@qq.com

Abstract
This paper describes the application of injected direct current-magnetic field measurement (IDC-MFM) method
for the detection of surface defects and hidden defects in multi-layered conductive structures. The principle of
IDC-MFM is briefly illustrated. Three-dimensional simulation of disturbed magnetic field by defects in
carrying-current conductive structure is performed to demonstrate the potential of IDC-MFM method for
inspecting surface defects and hidden defects in multi-layered conductive structures. The feasibility of
IDC-MFM method is verified by the experiments of defects in different locations and defects with different
depths or hidden depths.

Keywords: Direct current, Magnetic field, Defect, Conductive structure, Non-destructive testing

1. Introduction
Multi-layered conductive structures have been widely applied in the aerospace industry. The
detection and characterization of deep defects and hidden defects in multi-layered
conductive structures of aging aircraft has been identified as major problems in aeronautical
non-destructive testing. Although traditional eddy current testing (ECT) method is
commonly used in the inspection of aircraft multi-layered conductive structures, it is only
suitable for surface and subsurface defects due to the limitation of skin effect[1-2]. The pulsed
eddy current testing (PECT) method is a new technology developed in recent years, which is
an effective detection method for deep defects in multi-layered conductive structures, but it is
difficult to detect hidden defects[3-4]. For this reason, the development of reliable
non-destructive testing techniques to detect hidden defects in aircraft multi-layered
conductive structures is imperative.
The injected direct current-magnetic field measurement (IDC-MFM) technique described in
this paper aims to offer a possible route to overcoming some of the limitations imposed by the
existing NDT techniques on the inspection multi-layered conductive structures, which should
be able to recognize both surface and hidden defects in aircraft multi-layered conductive
structures by the non-contacting inspection.In order to verify that the IDC-MFM method has
the capability of non-contacting inspection for both surface and hidden defects in aircraft
multi-layered conductive structures, in this paper, firstly three-dimensional simulation is
carried out to study the variation of magnetic field in the carrying-current conductive
structure. Then, the experiment is performed to verify the simulation results. Last, the
detectability of IDC-MFM method for the hidden defects in conductive structure is
investigated.
2. The principle of IDC-MFM
The principle of IDC-MFM is illustrated in Fig. 1. When the conductive structure is injected
direct current, if it has no defect present, there exists an unperturbed current I and a
corresponding magnetic flux density B0 immediately above the surface of the conducive
structure. When a defect presents, the current is disturbed and flows around the ends and
down the faces of the defect. Associated with the disturbed current is the magnetic field
disturbed that the magnetic flux density above the surface of the conducive structure changes

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8-10 November, 2017, Xiamen, China

from B0 to B0+∆B. Defect inspection is accomplished by sensing the change of magnetic flux
density ∆B with a magnetometer.

B0 +¦ B
¤
B0 B0

Fig. 1. The principle of IDC-MFM.

Many electromagnetic non-destructive method, such as eddy current testing (ECT) and
alternating current field measurement (ACFM), employ the induced alternating current to
excite magnetic field, with the result that they only can detect the surface or subsurface
defects[5]. In order to avoid the skin effect, the IDC-MFM method uses direct current as the
exciting current and it is introduced by directly injected into the specimen, with the result that
this method could has the capability of inspecting not only the surface defects but also the
hidden defects due to the current flowing in the total tested region of the specimen. Because
the disturbed magnetic field excited by the direct current is very faint, the IDC-MFM method
employs the tunnel magneto resistance (TMR) as the sensor to probe the defect signals.
3. Three-dimensional simulation of the disturbed magnetic field
In order to investigate the distribution of the disturbed magnetic field by defects in
carrying-current conductive structure, three-dimensional simulation is performed in three
cases: the conductive structure has a transverse slot on the top surface, hidden in the body and
on the bottom surface. In simulation model, the conductive structure is a aluminium plate
with 100mm length, 20mm width and 4mm thickness, and the slot is 10mm long by 2mm wide
and 2mm deep. The geometric dimensions of plate and slot and the different location of slot in
longitudinal cross-section are shown in Fig.2 and Fig.3, respectively. A steady current I of 1A
is injected into the plate and its flow direction is parallel to the plate length and perpendicular
to the slot length.
20

100 10 4

I I

Y
X Z

Fig.2. The geometric dimensions of plate and slot.

2

Y
Z
（a） （b） （c）
Fig.3. The different location of slot in longitudinal cross-section.（a）on top surface, （b）hidden in body
and （c）on bottom surface.
The simulation results of the magnetic field distribution in three cases are shown in Fig. 4,
Fig.5. and Fig.6, respectively. For the region of no defect or far from the defect, the magnetic
field distribution is elliptical shape on the horizontal cross-section (parallel to X-Y plane) and
uniform on the longitudinal cross-section (parallel to Y-Z plane), which is in agreement with
the Biot-Savart law[6]. However the magnetic field distribution has prominent change near
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8-10 November, 2017, Xiamen, China

the defect, whether the slot on top surface, bottom surface or hidden in body, because the
defect disturbs the current flow and the distribution of magnetic field. It is worth noting that
the change of magnetic field distribution is generated in the spatial region not only near the
top surface but also near its opposite surface.

(a) (b)
Fig.4. The magnetic field distribution as the slot on top surface. (a) the horizontal cross-section and (b)
the longitudinal cross-section.

(a) (b)
Fig.5. The magnetic field distribution as the slot hidden in body. (a) the horizontal cross-section and
(b) the longitudinal cross-section.

(a) (b)
Fig.6. The magnetic field distribution as the slot on bottom surface. (a) the horizontal cross-section and
(b) the longitudinal cross-section.
In order to acquire the variational quantity of the magnetic field as the slot in three different
location, scanning paths are set up above the top surface with the distance of 0.5mm. The
variation curves of magnetic flux density are plotted in Fig.7. It can be seen that the amplitude
of top surface slot is much larger than that of body slot and bottom surface slot, and the
amplitude of body slot is a little bigger than that of bottom surface slot.
-5
x 10
2.7
Magnetic flux density (T)

2.6

2.5

2.4

top surface
2.3 body
bottom surface
2.2
-0.04 -0.02 0 0.02 0.04
Scan length（ m ）

Fig. 7. The comparisons of the magnetic field.

The simulation results give some indication that the IDC-MFM method has the potential of
detecting both surface and hidden defects in conductive structures. In addition, the detection
for far surface defects and hidden defects are more difficult than near surface defects.

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8-10 November, 2017, Xiamen, China

4. Experiments for multi-layered metals

The experimental equipment consists of a direct current source, resistors, a pair of electrodes,
a magneto sensor, an amplifier, an A/D converter and a computer, as shown in. Fig. 8. The
specimen is directly injected steady electric current by the direct current source and electrodes.
The sensor scans above the specimen surface to detects the changed signal of magnetic flux
density. After processed by an amplifier and an A/D converter, the defect signals are saved in
the computer.
In experiment, the signals of magnetic field may be very weak according to the preceding
simulation results and the specimen would give off heat. Compared with all kinds of
magneto sensors, here the tunnel magneto resistance (TMR) sensor is selected to sever as
the magneto sensor because the TMR sensor has advantages of high sensitivity and good
temperature stability.
Amplifier A/D converter Computer

Sensor
Electrode Electrode
I Specimen

Direct current source Resistors

Fig. 8. The schematic diagram of experimental equipment.

Considering the thickness of aircraft multi-layered conductive structures is the range from
3mm to 4mm, the testing specimen is made up of three aluminium plates, therein one is 2mm
thick and other two are 1mm thick, so that the thickness of specimen is 4mm. Other
geometrical dimensions of aluminium plate are the same as the previous simulation.
In order to verify the simulation results, in the first experiment, the 2mm thick plate is
machined a transverse through deep slot with 10mm length and 2mm width and it is laid
above, among and beneath of two 1mm thick plate, respectively, such that the slot location is
on top surface, hidden in body and on bottom surface, respectively. Fig.9. shows three cases
of testing specimen.
2

2
1
1

10
20

(a) (b) (c)

Fig.9. Three locations of defects in testing specimen. (a) on top surface, (b) hidden in body and (c) on
bottom surface.
When a direct current I of 2.4A is injected into the testing specimen and the TMR sensor
scanned above the top surface at a lift-off distance of 0.5mm, the magnetic field signals of
defects in three locations are obtained, as shown in Fig. 10. It can be seen that the signal
amplitude of top surface slot is much larger than that of body slot and bottom surface slot,
and the signal amplitude of body slot is a little bigger than that of bottom surface slot.
Comparing Fig.10 with Fig.7, the experiment result is consistent with the foregoing
simulation, which further confirm that the IDC-MFM method has the capability of
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8-10 November, 2017, Xiamen, China

non-contacting inspection for both surface and hidden defects in multi-layered conductive
structures.
3.6

Signal amplitude（ V）
3.4

3.2

3 top surface
body
bottom surface
2.8
0 100 200 300 400 500 600
Sampling number（ N）
Fig.10. The signals of defects in three locations.
In the second experiment, the 2mm thick plate is machined four transverse slots, which depths
are 1mm, 2mm, 2mm and 2mm, respectively. One of 1mm thick plate is machined a transverse
through slot and another is machined two transverse through slots. All of slots is 10mm length
and 2mm width, and the distances of two slots are equal.
Fig.11. shows the schematic diagram that the thick plate is laid above the two thin plate.
When the sensor scanned above the top surface, four slots may be regarded as surface defects
in multi-layered plate and their depths are 1mm, 2mm, 3mm and 4mm, respectively. The
signals of surface defects with different depths are obtained, as shown in Fig.12(a). It can be
seen that the deeper the defect is, the bigger the amplitude of signal is. Fig.12(b) shows the
relationship between the defect depth and the relative amplitude. It can be seen that the
relative amplitude is nearly proportional to the depth of a slot.
depth 1mm 2mm 3mm 4mm
2
1
1

10
20

Fig.11. The multi-layered aluminium plates with four surface defects.

0.4 0.5
Relative amplitude（ V）

0.4
Signal amplitude（ V）

0.2

1mm 0.3
0 2mm
0.2

-0.2 3mm
0.1
4mm
-0.4 0
0 100 200 300 400 500 600 1 1.5 2 2.5 3 3.5 4
Sampling number（ N） Defect depth（ mm ）
(a) (b)
Fig.12. The signals of surface defects. (a) Signals of defects with different depths and (b) the
relationship between depths and signal relative amplitude.
Fig.13. shows the schematic diagram that the thick plate is laid beneath the two thin plate.
When the sensor scanned above the top surface, four slots may be regarded as hidden defects
in multi-layered plate and their hidden depths are 3mm, 2mm, 1mm and 0mm, respectively.
The signals of hidden defects with different hidden depths are obtained, as shown in Fig.14(a).
It can be seen that the deeper the defect is hidden, the smaller the amplitude of signal is. Fig.
14(b) shows the relationship between the hidden depth and the relative amplitude, which also

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8-10 November, 2017, Xiamen, China

illustrates the approximately linear relationship between the amplitude and the hidden depth
of the defect.

hidden depth 3mm 2mm 1mm 0mm

Fig.13. The multi-layered aluminium plates with four hidden defects.

0.6 0.7

0.6

Relative amplitude （ V）
0.4
Signal amplitude（ V）

3mm 0.5
2mm
0.2 0.4

0.3
0 1mm
0.2
-0.2
0.1
0mm
-0.4 0
0 100 200 300 400 500 600 0 0.5 1 1.5 2 2.5 3
Sampling number（ N） Defect hidden depth（ mm）
(a) (b)
Fig.14. The signals of hidden defects. (a) Signals of defects with different hidden depths and (b) the
relationship between hidden depths and signal relative amplitude.

5. Conclusions
Based on the principle of electric current perturbation, the IDC-MFM method is proposed,
which uses the injected direct current to induce magnetic field and the TMR sensor to probe
the defect signals. The results of simulation and experiment verified that the IDC-MFM
method has the capability of inspecting surface and hidden defects in multi-layered
conductive structures, however the detection for the hidden defects is more difficult than near
surface defects. Furthermore, the result of further experiments show that the signal amplitudes
are increased with the defects depths increasing and decreased with the hidden defects depths
increasing.
Acknowledgements
The authors thank for the support of the National Natural Science Foundation of China
(NNSFC) (Grant No. 51575165, Grant No.51707058) and Hubei University of Technology
Doctoral start up funded projects (BSQD2016005).
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8-10 November, 2017, Xiamen, China

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