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Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
on X-ray spectrometry. In setting up a procedure for coating- dispersive system, is set to record the intensity of a selected
thickness measurement using an energy-dispersive system, emission characteristic of the basis metal. In an energy-
consideration should be given to the fact that the detector dispersive system, the multichannel analyzer is set to accumu-
“sees” and must process not only those pulses of interest but late the pulses comprising the same energy peak. The intensity
also those emanating from the substrate and from supporting will be a maximum for a sample of the uncoated basis metal
and masking materials in the excitation enclosure. Therefore, and will decrease with increasing coating thickness. This is
consideration should be given to restricting the radiation to the because both the exciting and secondary characteristic radia-
area of interest by masking or collimation at the radiation tions undergo attenuation in passing through the coating.
source. Similarly, the detector may also be masked so that it Depending upon the atomic number of the coating, when the
3 4
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APPENDIX
(Nonmandatory Information)
X1.1 Since commercially available X-ray spectrometry intensity for Ni Ka is obtained from a sample of the unplated
thickness gages give a direct display in thickness units, it is not brass substrate and subsequently substracted for each of the
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necessary for the user of such equipment to generate or to use intensity readings obtained from electroplated samples.
calibration curves. However, the general shapes of calibration X1.1.2 Absorption—A representative calibration curve for
curves in the emission mode and in the absorption mode of determining a nickel coating thickness by X-ray absorption is
operation are given here as general information. shown in Fig. X1.2. The intensities are background-corrected
X1.1.1 Emission—A typical calibration curve for determin- as they were in the emission technique. The emission now
ing a nickel coating thickness by X-ray emission is shown in being measured comes from the substrate.
Fig. X1.1. The intensities are background-corrected, that is, the
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NOTE—Intensity is that of the Cu Ka line from the brass substrate after subtraction of background intensity.
FIG. X1.2 Calibration Curve for the Determination of a Nickel Thickness by X-Ray Absorption
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