Вы находитесь на странице: 1из 24

EE6378 Power Management Circuits

Lecture 4: Voltage
g References

I t
Instructor:
t Prof.
P f Hoi
H i Lee
L

Mixed Signal & Power IC Laboratory


Mixed-Signal
Department of Electrical Engineering
The University of Texas at Dallas

Introduction
ƒ Here, we will learn to build a reference voltage to provide a stable
and accurate supply voltage. The voltage reference is an
electronic circuit to provide an accurate and stable DC voltage
that is very insensitive to the change in supply voltage and
temperature

ƒ How accurate is a voltage reference? E.g. Weston cell is an


electrochemical device which provides a reproducible voltage of
1.018636 V at 20oC with a small temperature coefficient of 40
ppm/oC. For integrated circuit implementation, active solid-state
de ices can achie
devices achievee a tempco of 1 4 ppm/oC if appropriate
1-4
compensation technique is employed

ƒ Note
• To minimize error due to self-heating, voltage reference usually
operates with modest current (e.g. < 1mA)
• Tempco
p = temperature
p coefficient,, usually
y expressed
p pp oC
in ppm/
o -6 o
(parts per million/ C or 10 / C

EE6378 Lecture 4 © 2009 H. Lee pg. 2


Overview

ƒ Performance Requirements
ƒ Zener Diode Voltage Reference
ƒ Bandgap Voltage References
ƒ Bandgap Voltage References Implemented in
CMOS technologies

EE6378 Lecture 4 © 2009 H. Lee pg. 3

Performance Parameters (1)

The primary requirements of a voltage reference are accuracy and


stability. Some qualitative parameters are:

ƒ Load Regulation = ΔVo/ΔIo (usually expressed in mV/mA or mV/A) or


Load Regulation = 100(ΔVo/ΔIo) (in %/mA or %/A)

ƒ Line Regulation = ΔVo/ΔVin (usually expressed in mV/V) or


Line Regulation = 100(ΔVo/ΔVin) (in %/V)

ƒ Power Supply Rejection Ratio (PSRR) is a measure of the ripple in the


reference voltage due to the ripples in the supply voltage

Vri
PSRR = 20 log10 (in dB)
Vro

EE6378 Lecture 4 © 2009 H. Lee pg. 4


Performance Parameters (2)

Example of line regulation / supply-voltage dependence at VDD = 3.3, 4.15


and 5V (step size of 0.85V)

VDD=5V

VDD=4.15V

VDD=3.3V

Line regulation at T = 27o C is


Vref (VDD = 5V ) − Vref (VDD = 3.3V ) 1.201 − 1.176
= = 14.7mV / V
5 − 3.3 5 − 3.3

EE6378 Lecture 4 © 2009 H. Lee pg. 5

Performance Parameters (3)

The maximum (Vref(max)) and minimum (Vref(min)) reference voltages are


1.1761V and 1.1731V, respectively. The reference voltage at T = 27oC
(Vref) is
i 11.1761V. The ttempco iin ppm//oC can b
1761V Th be ffound
dbby

Vref (max) − Vref (min) 106 1.1761 − 1.1731 106


Tempco = × = × = 25.5 ppm /O C
Vref (Tmax − Tmin ) 1.1761 (100 − 0)

EE6378 Lecture 4 © 2009 H. Lee pg. 6


Overview

ƒ Performance Requirements
ƒ Zener Diode Voltage Reference
ƒ Bandgap Voltage References
ƒ Bandgap Voltage References Implemented in
CMOS technologies

EE6378 Lecture 4 © 2009 H. Lee pg. 7

Review on Zener Diode Voltage Reference

ƒ The Zener diode described in Lecture 2 can be considered as a


voltage reference. Since the breakdown voltage due to Zener
breakdown mechanism has a negative temperature coefficient, and
the breakdown voltage due to the avalanche multiplication has a
positive coefficient, the reference voltage is somewhat independent
of the change of temperature

rz Rs Rs r z
Vo = Vin + VZK − IL
Rs + r z Rs + r z Rs + r z

ΔVo rz
Line Regulation = =
ΔVin Rs + rz
ΔVo Rs r z
Load Regulation = =-
ΔI L Rs + r z

EE6378 Lecture 4 © 2009 H. Lee pg. 8


Improved Zener Diode Reference (1)

ƒ In the case of Zener diode, the output voltage Vo heavily depends on


the load current IL, which in most cases are not good. It would be
better if we could shield the Vz from the influence of the load. This
can be done with the help of an op amp as shown below. This
method refers to self regulation which shifts the burden of line and
load regulations from the diode to the op amp

EE6378 Lecture 4 © 2009 H. Lee pg. 9

Improved Zener Diode Reference (2)


ƒ By
B iinspection,
ti
R2 24k
Vo = (1 + )Vz = (1 + )6.2 = 10V .
R1 39k
ƒ The output voltage is also adjustable
via R2 Vo = (1 +
R2
)Vz = (1 +
24k
)6.2 = 10V .
ƒ The load current IL is supplied
pp from the R1 39k

opamp such that the current flowing


through the Zener diode is almost
constant at
V − Vz 10.0 − 6.2
Iz = o = = 1.15mA.
R3 3.3k
ƒ Since the diode current is independent
p
of the load current, the diode voltage is
insensitive to the load
ƒ R3 can be raised to avoid unnecessary
power wastage and self-heating
self heating effects

EE6378 Lecture 4 © 2009 H. Lee pg. 10


Load Regulation (1)
ƒ The load regulation is directly related to the output
impedance. To find Ro, we suppress the input source
Vz and apply the test-voltage technique. By voltage
divider formula:

R1 // rin
vN = v
R1 // rin + R2

ƒ Summing currents at the output node


v − v − Av N − v
i+ N + =0
R2 ro

ƒ Eliminating vN and solving for the Ro=v/I, we obtain


ro
Ro =
1 + [( A + ro / R1 + ro / rin ) /(1 + R2 / R1 + R2 / rin )]
ro R1
≈ where b =
1 + Ab R1 + R2

EE6378 Lecture 4 © 2009 H. Lee pg. 11

Load Regulation (2)

ƒ Typically rin is in the MΩ range or


greater, R1 and R2 are in kΩ range
and ro is on the order of 102 Ω. The
t
terms ro/R1, ro/r
/ in, and
d R2/r
/ in can thus
th
be ignored to yield Ro≈ro/(1+Ab)

ƒ The load regulation Ro≈rro/(1+Ab)


which is much smaller than the Zener
diode voltage reference without
p p
opamp

ƒ Since ro and A are frequency


dependent, so are the load
regulation. In general, load regulation
tends to degrade with frequency

EE6378 Lecture 4 © 2009 H. Lee pg. 12


Thermal Stability (1)
ƒ Thermal stability is one of the most demanding performance
requirement of voltage references due to the fact that semiconductor
components are strongly influenced by temperature
ƒ The forward-bias
for ard bias voltage
oltage VD and ccurrent
rrent ID of a silicon pn jjunction,
nction
which forms the basis of the diodes and BJTs, are related as
VD=VTln(ID/IS), where VT is the thermal voltage and IS is the saturation
current. Their expressions
p are

VT = kT / q and IS = BT 3 exp( −VG 0 / VT )

where
k=1.381×10-23 is Boltzmann’s constant
q=1.602 ×10-23 C is the electron charge
T is the absolute temperature
p
B is a proportionality constant
VG0 = 1.205V is the bandgap voltage for silicon

EE6378 Lecture 4 © 2009 H. Lee pg. 13

Thermal Stability (2)

ƒ The temperature coefficient (TC) of the thermal voltage:


∂VT k
TC(VT ) = = = 0.0862mV/ oC
∂T q
ID V
∂[ln ] ∂(3 lnT − G 0 )
∂VT I IS V VT V − VD 3k
TC(VD ) = ln( D ) + VT = D − VT = -(( G 0 + )
∂T IS ∂T T ∂T T q

Assume VD=650mV at 25oC, we get TC(VD) ≈ -2.1mV/oC.

ƒ TC(VT) have a positive tempco and TC(VD) have a negative tempco,


so these two equations form the basis of two common approaches to
thermal stabilization,, namely,
y, thermal compensated
p Zener diode
references and bandgap references

EE6378 Lecture 4 © 2009 H. Lee pg. 14


Thermally Compensated Zener Diode Reference

ƒ Idea of thermally compensated Zener diode is to connect a forward-


biased diode in series with a Zener diode having an equal but
opposing tempco as shown below

ƒ Since TC(Vz) is a function of Vz and Iz. We can fine tune Iz to drive


the tempco
p of the composite
p device to zero. In this case,, a 7.5mA is
used to give a reference voltage of Vz = 5.5+0.7 = 6.2V with tempco
ranging from 100ppm/oC to 5ppm/oC

EE6378 Lecture 4 © 2009 H. Lee pg. 15

Overview

ƒ Performance Requirements
ƒ Zener Diode Voltage Reference
ƒ Bandgap Voltage References
ƒ Bandgap Voltage References Implemented in
CMOS technologies

EE6378 Lecture 4 © 2009 H. Lee pg. 16


Bandgap Voltage Reference (1)
ƒ Since the best breakdown voltages of the Zener diode references
range from 6 to 7V, they usually require supply voltages on the order
of 10V to operate. This can be a drawback in systems powered from
l
lower supplies,
li suchh as 5V.
V Thi
This lilimitation
i i iis overcome b
by b
bandgap
d
voltage references, so called because their output is determined
primarily by the bandgap voltage of silicon VG0 = 1.205V

EE6378 Lecture 4 © 2009 H. Lee pg. 17

Bandgap Voltage Reference (2)

ƒ Addition of the voltage drop VBE of a base-emitter


junction, which has a negative tempco, to a voltage
proportional to the thermal voltage VT, which has a
positive
iti ttempco, tto generate
t a reference
f voltage,
lt which
hi h
is independent of temperature

EE6378 Lecture 4 © 2009 H. Lee pg. 18


Fundamentals

ƒ As TC(VBE) ≈ -2.1mV/°C and TC(VT) = 0.0086mV/°C, then zero tempco is


achieved at a particular temperature (e.g. T=300K):

VBG = VBE + KVT


i.e. TC (VBG ) |300K = TC (VBE ) + K ⋅ TC (VT ) = 0
− TC (VBE ) 2.1
⇒ K= = = 24.4
TC (VT ) 0.086

ƒ If for a particular transistor with certain bias current such that VBE =
650mV, then

VBG = VBE + KVT = 0.65 + 24.4(0.0259) = 1.28 V.


ƒ Note that VT = kT/q ∝ T, i.e. VT is proportional to absolute temperature.
We call VT a Proportional To Absolute Temperature voltage, or in short,
PTAT voltage

EE6378 Lecture 4 © 2009 H. Lee pg. 19

Bandgap Voltage Reference Circuit (1)

ƒ From the figure, the emitter area of Q1 is n


times as large as the emitter area of Q2,
then Is1/Is2 = n
ƒ By op amp action with identical collector
resistances, the collector currents are also I C 2 I S1
identical, i.e. IC1 = IC2. Ignore the base IR3 = VBE 2 − VBE1 = VT ln( ) = VT ln(n)
I C1 I S 1
currents we have KVT = R4(IC1+IC2) = 2R4I
currents,

I I
IR3 = VBE 2 − VBE1 = VT ln( C 2 S1 ) = VT ln(n)
IC1IS1

Combine two equations give

2R4 VT R
K= = 2 4 ln(n)
VT R3 R3
R
⇒ VBG = VBE 2 + KVT = VBE 2 + (2 4 ln n)VT
R3

EE6378 Lecture 4 © 2009 H. Lee pg. 20


Bandgap Voltage Reference Circuit (2)

ƒ From
F the
th previous
i di
discussion,
i ffor a zero
tempco voltage reference VBG, K ≈ 24,
with n = 4, then

R4 K 24.4
= = ≈ 8.8
R3 2 ln 2 2 ln 4

ƒ Note that I = VTln(n)/R3 ∝ VT, I is a


PTAT current

EE6378 Lecture 4 © 2009 H. Lee pg. 21

Brokaw Cell

ƒ Brokaw cell is commonly used bandgap-cell


realization
li ti circuit
i it and
d iis shown
h iin th
the fi
figure

ƒ The function of op amp is replaced by Q3,


Q4 and Q5. Q3 and Q4 form a current mirror
to enforce the collector currents of Q1 and
Q2 are identical

ƒ The emitter follower Q5 raises the reference


voltage to Vref = (1+R1/R2)VBG

EE6378 Lecture 4 © 2009 H. Lee pg. 22


Stability of a Bandgap Reference

ƒ In a bandgap reference, there exists 2


feedback loops, 1 positive loop and 1
negative loop.

ƒ For the negative loop (the outer loop),


R2 + 1 / g m1
Negative Loop Gain = A( s )
R1 + R2 + 1 / g m1
R2 + 1/ gm1
Negati e Loop Gain =
Negative A(s )
R1 + R2 + 1/ gm1

ƒ For the positive loop (the inner loop),


1/ gm1
Positive Loop Gain = A(s )
R1 + 1/ gm1

ƒ For stability, we must have a negative


loop gain magnitude > positive loop
gain magnitude. This is true as
((a+c)/(b+c))>(a/b) for b>a

EE6378 Lecture 4 © 2009 H. Lee pg. 23

Stability of Simple Brokaw Cell (1)

ƒ If we neglect R3, then clearly Q1 and Q2 form a differential pair with


p
positive and negative
g terminals tied together
g
ƒ Above is the way to break the loop for measuring loop gain. The
circuit should have a DC closed loop and AC open loop. The DC
closed loop p is for biasing
g and the AC loopp is to measure loop
pggain

EE6378 Lecture 4 © 2009 H. Lee pg. 24


Stability of Simple Brokaw Cell (2)

ƒ With the presence of R3, the positive loop looks like an amplifier with
degenerated emitter ⇒ the gain is smaller than that with R3.
Therefore, negative loop gain magnitude > positive loop gain
magnitude, i.e. stability requirement is satisfied
ƒ Cc is the compensation capacitor. Here, dominant pole
compensation is employed

EE6378 Lecture 4 © 2009 H. Lee pg. 25

Overview

ƒ Performance Requirements
ƒ Zener Diode Voltage Reference
ƒ Bandgap Voltage References
ƒ Bandgap Voltage References Implemented in
CMOS technologies

EE6378 Lecture 4 © 2009 H. Lee pg. 26


CMOS Bandgap References (1)

ƒ CMOS is the dominant technology for both digital and


analog circuit design nowadays
ƒ Independent bipolar transistors are not available in
CMOS technology
ƒ CMOS voltage reference, however, can be achieved by
making use of the concept of voltage reference. These
CMOS circuits rely on using well transistors.
transistors These
devices are vertical bipolar transistors that use wells
as their bases and the substrate as their collectors

EE6378 Lecture 4 © 2009 H. Lee pg. 27

CMOS Bandgap References (2)

ƒ These vertical bipolar well transistors have reasonable current gain


(≈ 25), but very high series base resistance (≈ 1kΩ/ ) due to the fact
that the base contact is far away from the base
ƒ The maximum collector current is thus limited to less than 0.1mA to
minimize errors due to the base resistance

EE6378 Lecture 4 © 2009 H. Lee pg. 28


CMOS Bandgap References (3)

Two possible implementations:

ƒ For
F example,
l ini th
the n-wellll CMOS implementation,
i l t ti what
h t is
i VBG off the
th
reference circuit?

EE6378 Lecture 4 © 2009 H. Lee pg. 29

CMOS Bandgap References (4)

VBG = VEB 2 + VR 2
ƒ Assume the op amp has very large gain
and very small input currents such that its
input terminals are at the same voltage,
then VR 3 = VEB 2 − VEB1 = ΔVEB

VR 3 = VEB 2 − VEB1 = ΔVEB

ƒ Since the current through R1 is the same


as in R3

VR1 VR 3 R1 R
= or VR1 = VR 3 = 1 ΔVEB
R1 R3 R3 R3
R1
VBG = VEB 2 + ΔVEB
R3

EE6378 Lecture 4 © 2009 H. Lee pg. 30


CMOS Voltage References (5)

ƒ In CMOS realization, the bipolar


transistors are often taken the same
size, and different current densities
(IC/IS) are realized by taking R1 greater
than R2, which causes I2 to be greater
than I1:

I2 R1
VR1 = VR 2 ⇒ I1R1 = I2R2 or =
I1 R2

kT I2
ΔVEB = VEB 2 − VEB1 = ln( )
q I1
R1 kT R R R
⇒ VBG = VEB 2 + ln( 1 ) with K = 1 ln( 1 )
R3 q R2 R3 R2

EE6378 Lecture 4 © 2009 H. Lee pg. 31

Example

ƒ Find the resistances of a bandgap voltage reference based on the


CMOS n-well process where I1 = 5μA, I2 = 40μA and VEB = 0.65V at
T = 300K.
300 Assume VBG = 1.24V
12

ƒ Ans. R1 = 118kΩ, R2 = 14.8kΩ and R3 = 10.1kΩ

EE6378 Lecture 4 © 2009 H. Lee pg. 32


Other CMOS References

ƒ Current mirror enforces equal


currents at M1, M2 and M3
ƒ Voltage clamping by M4 and M5
to enforce V1=V2

ƒ PTAT loop formed by Q1, Q2 and


R1
I = VT ln(N ) / R1
R2
Vref = VEB 3 + ln(N ) ⋅ VT
R1
ƒ Cascode current mirror or other
forms for better current matching
at different supply voltages

EE6378 Lecture 4 © 2009 H. Lee pg. 33

Current Mirror with Op Amp

ƒ In CMOS reference using


current mirror with op amp,
an op amp is used to
enforce the drain voltage of
M1 the same as of M2. This
allows a better current
matching of drain currents of
M1 and M2

EE6378 Lecture 4 © 2009 H. Lee pg. 34


Error Sources in Voltage-Reference Design

ƒ Current mirror
ƒ Voltage-clamping
Voltage clamping circuit
ƒ BJT emitter area ratio (BJT matching)
ƒ Resistor ratio (resistor matching)
ƒ Base current
ƒ Base resistance
ƒ Systematic offset at different supply voltages
ƒ Random offset of devices
ƒ Temperature gradient within a chip

EE6378 Lecture 4 © 2009 H. Lee pg. 35

Design Considerations: BJTs

ƒ Closely packed common-centroid layout


ƒ Large
L Nddoes not provide
id significant
i ifi change
h d
due to the
h llogarithm
ih
relation
ƒ Generally, N=8 is chosen based on chip area consideration

EE6378 Lecture 4 © 2009 H. Lee pg. 36


Design Considerations: Resistors

ƒ Matching is important to
obtain an accurate resistance
ratio
ƒ Square-like common-centroid
layout

EE6378 Lecture 4 © 2009 H. Lee pg. 37

Typical Low-Voltage Implementation

ƒ Error-amplifier current mirror


enforces VA = VB

ƒ Min VDD = VREF + |Vov,M2|

ƒ Offset voltage → error

ƒ Offset voltage = function of VTH,


mobility and transistor size →
temperature dependent

ƒ Use simple
p amplifier
p

ƒ Reduce both systematic and


random offset

EE6378 Lecture 4 © 2009 H. Lee pg. 38


Offset Voltage Consideration

VT ln(N ) + VOFF
I=
R1
R2
⇒ Vref = VEB 2 + ( )[VT ⋅ ln(N ) + VOFF ]
R1

ƒ A larger
l N iis used
d tto minimize
i i i
the required R2/R1, and the
effect of the amplifier offset
ƒ I
Increase chip
hi area

EE6378 Lecture 4 © 2009 H. Lee pg. 39

Base Resistance Consideration

ƒ Large base resistance of


parasitic vertical BJT

ƒ Diode-connected BJT ≠ VEB

ƒ As mentioned before, I <


0.1mA

ƒ Not due to low-power


design, but due to reduce
voltage across RB

ƒ On layout, more N-well


contacts to reduce RB

EE6378 Lecture 4 © 2009 H. Lee pg. 40


Base Current Compensation
ƒ β is small in CMOS technology

ƒ IC ≠ IE and IC is a function of β

ƒ Introduced β in IC causes extra


errors and temperature
dependence

ƒ Base current compensation by a


dummy transistor Q1D

ƒ IE of Q1 = I + I/β
IC of Q1 = I

ƒ Q1D must match with Q1

EE6378 Lecture 4 © 2009 H. Lee pg. 41

Resistor Trimming

ƒ Resistor
R i ratio
i can b
be fi
fine-tuned
dbby
using a series of resistor network
associated with fuse

ƒ By burning the fuse, the resistor


value can be adjusted to fine-tune
th reference
the f voltage
lt and
d the
th
temperature with zero tempco to a
particular value

EE6378 Lecture 4 © 2009 H. Lee pg. 42


Buffered Voltage Reference

ƒ Series
Series-shunt
shunt feedback

ƒ High output current to drive resistive load

ƒ Low output resistance

ƒ Isolation to reduce cross-talk through reference circuit

EE6378 Lecture 4 © 2009 H. Lee pg. 43

Current Source Generated by a Voltage


Reference

ƒ Series-series feedback

ƒ I = VREF/R

ƒ VMIN = Vov + VREF

EE6378 Lecture 4 © 2009 H. Lee pg. 44


CMOS Bandgap Reference with Sub-1-V
Operation (1)
R3 R
VREF = ( )(VEB 2 + ( 2 )ln(N ) ⋅VT )
R2 R1

ƒ R1, R2 & R3 of same material

ƒ Good matching R1 and R2 for


optimizing tempco

ƒ Good matching R2 and R3 for


adjusting
dj ti theth value
l off VREF

ƒ M1, M2 & M3 of equal W, L

ƒ VREF ≈ 0.5-0.7 V for matching VDS of


M1-M3 at different VDD

EE6378 Lecture 4 © 2009 H. Lee pg. 45

CMOS Bandgap Reference with Sub-1-V


Operation (2)

ƒ Native NMOST : VTHN = 0.2V


0 2V

ƒ Not available in standard


CMOS technologies

EE6378 Lecture 4 © 2009 H. Lee pg. 46


Low-Voltage Design Problem of Error Amplifier

ƒ Worst case (smallest) VEB at


maximum operational ƒ Worst case (largest) VEB and
temperature | THP| at minimum temperature
|V p
ƒ VEB > VTHN + 2Vov ƒ VEB < VDD - |Vthp| - 2|Vov|
ƒ Low-VTHN (<0.4V) technology ƒ VDD(min) = VEB + |VTHP| + 2Vov
ƒ B d effect
Body ff t increases
i VTHN

EE6378 Lecture 4 © 2009 H. Lee pg. 47

References

ƒ H. Banba, et. al. “A CMOS bandgap reference circuit with sub-1-V


operation,” IEEE Journal of Solid-State Circuits, vol. 34, pp. 670-
674, May 1999.
ƒ K. N. Leung, et. al. “A sub-1-V 15-ppm/°C CMOS bandgap voltage
reference without requiring low threshold voltage device,” IEEE
Journal of Solid-State Circuits, vol. 37, pp. 526-530, Apr. 2002.
ƒ P. K. T. Mok, et. al. “Design considerations of recent advanced low-
voltage low-temperature-coefficient CMOS bandgap voltage
reference,” IEEE Custom Integrated Circuits Conference, Sep. 2004,
pp. 635-642.

EE6378 Lecture 4 © 2009 H. Lee pg. 48

Вам также может понравиться