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4
®
• Improved speed
• Advanced calibration features
• Group and focal law wizards
• Multiple-group configuration
OmniScan PA Software 1.4 ® • A new option allows you to set automatically the number of
A-scan points that will be stored. This mode will automatically ad‑
This document describes the modified and added features of ver‑ just the point quantity and the compression factor according to the
sion 1.4 of the OmniScan PA software. inspection range in order to keep the number of points between
320 and 640.
New Characteristics • Saving A-scan, C-scan, defect table, screen capture, and re‑
port files can no longer be done on the DiskOnChip. The
General Functions CompactFlash memory card, as well as any USB or network stor‑
• Improved processing speed for focal law (beam) calculation, age, can now be used to store these files.
display presentation, and application of ultrasound parameter • The maximum inspection file size allowed is limited at 160 Mb
modification. instead of previous 200 MB. Note that for 95% of the applications
• The color palette file is now using the XML format. on the market, 160 MB of memory is sufficient. When using a
It is important to note that you must update to the latest version of standard 35°–70° sectorial scan configuration, 160 MB of memory
Eclipse Scientific Products ESPalette in order to use it with the new will allow you to inspect approximately 15 m in one scan. How‑
palette file format. ever, if an extended memory is absolutely needed, an electronic
• The number of alarms has been increased to 8 logical alarms modification can be done to increase it to 300 MB.
instead of the 3 available with the OmniScan PA version 1.0. External Digital Inputs
It is now possible to customize digital inputs (DIN 1 through
DIN 4). Four digital inputs can be defined with the following
parameters:
• Preset Encoder 1
• Preset Encoder 2
• Pause/Resume (acquisition)
• Save Data
• Clear All
S-scan from previous version (left) Predefined Setups
S‑scan interpolation in version
1.4 (right)
The OmniScan PA now offers predefined setups covering the most
common inspections to increase the speed of setup preparation.
How to use RD_FlawDetector_35-70SW.ops
2.1 Connect the probe : the Focal laws will recalculate using your probe configuration
2.3 Main menu “Probe/Part”, submenu “Parts” , in “Thickness” parameter, enter the Thickness of
the part to inspect.
2.5 Press or Main Menu “Calibration”, Submenu “Phased array” Perform Wedge delay calibration - Follow
1 Recommended probe and wedge combinations Section 3
Note: Other probe and shear wave wedges combination can be used 2.7 Press or Main Menu “Gate/Alarm”,4 SubmenuSensitivity
“Gate”,calibration
adjust the A gate to the interest defect zone. This
gate will give you the different information in the 4 top readings (see below for definition).
4.9 Move the probe forward and backward to build the green envelope curve that takes the signal amplitude for each
- The A-scan is following the highest peak in the A-gate from any angles of the S-scan and giving the information b. Make sure to press Accept after a gain change
from the 4 readings:
port (USB 1.0 only). It is important to note than the boot option - At anytime to take a measurement point, the Freeze button can be pressed this will stop the refresh of the
A-scan and S-scan. To restart scanning press on Freeze a second time
- At the end of inspection, in Main Menu “File”, Submenu “Report”, press on “build” to preview the report
of all the indication found.
C-Scan Overlap Reading Fields and Inspection Information
Two kinds of electronic linear scans are now available: There are now two groups of four reading fields available instead of
• Electronic Linear Angle only one group. Only one group can be displayed at a time, but all
eight reading fields are added into the report and/or defect table.
New reading fields are added to place the indication at the correct
volumetric position from a reference point in the part:
• ViA: Volumetric position of the indication detected in gate A with
regard to the 0 position on the index axis. (For gate B, ViB.)
• VsA: Volumetric position of the indication detected in gate A with
regard to the 0 position on the scan axis. (For gate B, VsB.)
• %(Ur): Signal amplitude at the position of the reference ultra‑
sound cursor. Value not computed in analysis mode. (For measure‑
ment cursor, %(Um)
Wizards for Groups and Focal Laws
This option allows setting an angle from 0° to 90°, but without
overlap area in a raster scan inspection.
• Electronic Linear 0 Degree
Active group
16
1 128
Scanning direction
• The Group Wizard allows you to enter all probe, part, and beam
parameters, and generate all focal laws in one step instead of
generating them with each change.
• The step-by-step approach prevents the user from missing a pa‑
rameter change.
The only angle available with this option is 0° but it allows the • Online help gives general information on parameters to be set.
possibility to obtaining an overlap area in a raster scan inspection. The Group Wizard includes the Focal Law Wizard for the creation
Note that this scan mode is not available in the multiple-group of focal laws.
configuration option.
Calibration Procedures and Parameters
All calibration procedures are guided by a step-by-step menu using
Software Options
Next and Back navigation. You have now access to optional software features, which can be
ordered through the Olympus NDT customer service.
These options are:
• Multiple-group configuration (requires version 1.4)
• TOFD inspection for modules equipped with the separate conven‑
tional ultrasound channel
TOFD Configuration
Time-of-Flight Diffraction (TOFD) Testing
TOFD is a technique that uses two probes in pitch-and-catch
mode. TOFD detects and records signals diffracted from defect
tips for both detection and sizing. The TOFD data is displayed in a
grayscale B-scan. TOFD offers wide coverage and amplitude-inde‑
pendent sizing compliant with ASME‑2235 code.
• One-line scan for full-volume inspection
• Setup independent of weld configuration
• Very sensitive to all kinds of defects and insensitive to defect ori‑
entation
Example of sensitivity calibration
TOFD Option
• A B-scan encoded data imaging and storage
• Adjustable for brightness and contrast grayscale color palette
• 100 MHz A‑scan digitizing
• TOFD calibration wizard online and offline
• Hyperbolic cursor and reading for TOFD sizing
• Lateral wave resynchronization
Multiple-Group Configuration Option Multiple-Group Configuration Examples
It is now possible to manage more than one probe with two differ‑ Use one single phased array probe of 64 or more
ent configurations: different skews, different scanning types, differ‑ elements and create two different groups:
ent inspection areas, and other parameters.
Display Menu
The selection of view configurations has been decreased to keep
the preferred and most useful ones and to add some configurations
to display multiple groups.
■ Linear scan at 45º to cover the upper part
View configuration Number of groups using skips on the bottom surface
B-scan one
C-scan one
S-scan up to three
A-scan and B-scan one Use one single phased array probe of 64 or
A-scan, B-scan, and C-scan one 128 elements and create two different groups:
A-scan, B-scan, and S-scan one
A-scan, and one or two C-scans up to three
A-scan, S-scan, and possible C-scan up to three
You can now display both amplitude and thickness C‑scan views
simultaneously.
Related Software Olympus NDT
Some software packages are available to extend the functions of
the OmniScan. Training Academy
Olympus NDT has organized a Training Academy with selected
NDT Remote Control Library training companies to offer a wide variety of courses in phased
• Remote control of a number of commands. array, application techniques and related technologies. The partners
NDT Data Access Library in the Olympus NDT Training Academy are:
• Read data files generated by the OmniScan. Lavender International (UK)
TomoVIEWER
™
Tel.: 44 1226 765769
TomoVIEWER is Olympus NDT free software for phased array and
ultrasonic data viewing. This software gives you the capability to
Davis NDE (USA)
load data files generated by TomoView™ or OmniScan® PA and UT Tel.: 1 (205) 733-0404
software.
Eclipse Scientific Products (Canada)
PC-Based Analysis Software: TomoView
™
Olympus ND
505, boul. du Parc-Technologique
Québec (Québec) G1P 4S9
Canada
OmniScan_SW1.4_EN_0604 • Printed in Canada • Copyright © 2005–2006 by Olympus NDT. All Rights Reserved.
All specifications are subject to change without notice.
Olympus and the Olympus logo are registered trademarks of Olympus Corporation. rdtech@olympusndt.com
R/D Tech, the R/D Tech logo, OmniScan, and the OmniScan logo are registered trademarks, and “Innovation in NDT”, TomoView, and TomoVIEWER
are trademarks of Olympus NDT Corporation in Canada, the United States, and/or other countries. www.olympusNDT.com
Other company or product names mentioned in this document may be trademarks or registered trademarks of their respective owners.