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DYNASCAN CORPORATION MANUAL for Model 162 TRA:JSJSTOR,iFET Tester has been designed to quickly test conventional (bipolar) transistors and the newer field eflect transistors (FETs) IN-CIRCUIT and OUT-OF-CIRCUIT using the same simple testing procedure. The 162 also tests diodes, SCRs, UJTs and Triacs.
DYNASCAN CORPORATION MANUAL for Model 162 TRA:JSJSTOR,iFET Tester has been designed to quickly test conventional (bipolar) transistors and the newer field eflect transistors (FETs) IN-CIRCUIT and OUT-OF-CIRCUIT using the same simple testing procedure. The 162 also tests diodes, SCRs, UJTs and Triacs.
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Attribution Non-Commercial (BY-NC)
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Скачайте в формате PDF или читайте онлайн в Scribd
DYNASCAN CORPORATION MANUAL for Model 162 TRA:JSJSTOR,iFET Tester has been designed to quickly test conventional (bipolar) transistors and the newer field eflect transistors (FETs) IN-CIRCUIT and OUT-OF-CIRCUIT using the same simple testing procedure. The 162 also tests diodes, SCRs, UJTs and Triacs.
Авторское право:
Attribution Non-Commercial (BY-NC)
Доступные форматы
Скачайте в формате PDF или читайте онлайн в Scribd