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Analytical Instruments for Material Characterizations
Analytical Instruments for Material Characterizations

Analytical Instruments for Material Characterizations

Material Characterizations for Compliance with EU Regulations on RoHS

3 - 5

Material Characterizations for Compliance with EU Regulations on RoHS

6 - 9

Energy Dispersive X-Ray Fluorescence Spectrometer EDX

10 - 11

Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX

12 - 16

Optical Emission Spectrometer OES

17 - 19

Electron Probe Micro Analyser EPMA

20 - 23

X-Ray Photoelectron Spectrometer XPS

24 - 26

Scanning Probe Microscope SPM

27 - 29

X-Ray Diffractometer XRD

Probe Microscope SPM 27 - 29 X-Ray Diffractometer XRD Non-Destructive Simultaneous Screening & Measurements
Non-Destructive Simultaneous Screening & Measurements for the six substances EDX EDX EDX 300ppm>Br Br30000ppm
Non-Destructive Simultaneous Screening & Measurements for the six substances
EDX
EDX
EDX
300ppm>Br
Br30000ppm
Cd, Pb, Hg
Total Br
Total Cr
Yes
Cd<100ppm
No
Pb, Hg<1000ppm
Cr<1000ppm
(PBB/PBDE)
300ppmBr<30000ppm
No
Yes
OK
Failed
OK
Yes
No
OK
Confirmation analysis performed
when necessary
FTIR
PBB, PBDE?
No
Yes
UV
Yes
Selective measurement of
Cr 6+ using diphenylcarbazide method
Failed
Cr 6+ <1000ppm
No
ICP-AES/MS, AA
Yes
No
Precise measurement of
Cd, Pb and Hg
GCMS
Precise measurement of
PBB and PBDE
Failed
Cd<100ppm
Pb, Hg<1000ppm
PBB, PBDE<1000ppm

The flowchart is based on the EU administrative test method that was originally proposed by the JBCE (Japan Business Council in Europe) in 2003 to the EU for the public administration of testing the six substances regulated under RoHS.

• Effect of clarifications to applicable exemption status of restricted brominated flame retardants

• Clarification of criteria when evaluating by bromine content in brominated flame retardants Since RoHS is subject to Article 95 of the EU Treaty, lobbying to harmonize content inspection methods among all EU member countries continues. However, with little progress from the EU itself, the IEC is considering standardizing inspection methods.

Regulated Substances and maximum Allowable Concentration Levels (Threshold Values)

ELV

RoHS

Remarks

Cadmium (Cd)

100ppm

100ppm

• Of the 6 substances regulated by RoHs, the applicable

exemption status of deca-BDE was decided. (October 15, 2005)

     

Lead (Pb)

1000ppm

1000ppm

• Threshold values were decided by the committee. ELV (June 29, 2002) and RoHs (August 29, 2002) and RoHs. (August 19, 2005)

     

Mercury (Hg)

1000ppm

1000ppm

• The threshold value denominator for both ELV and RoHs is “homogeneous material”, but this has not been clearly defined. Therefore, separate guidance notes to provide clarification for RoHs are expected.

Hexavalent Chromium (Cr 6+ )

1000ppm

1000ppm

• Board decision regarding ELV appendix II revision (September 30, 2005) eliminated the ELV prerequisite prohibiting intentional use, Currently, RoHs does not have regulations prohibiting intentional use.

Polybrominated Biphenyls (PBB)

Exempt

1000ppm

Polybrominated Diphenyl Ethers (PBDE)

Exempt

1000ppm

• Be aware that both ELV and RoHs include definitions of applicable exemption status.

NEW
NEW

Three Screening Analysis Kits are available to suit different applications.

RoHS Screening Analysis Kit

Kit for screening cadmium, lead, mercury, chromium, and bromine. Polyethylene samples containing these five elements are supplied in the kit for instrument management.

RoHS and Halogen Screening Analysis Kit

In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine in plastics. Polyethylene samples containing these six elements are supplied in the kit for instrument management.

RoHS, Halogen, and Antimony Screening Analysis Kit

In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine and antimony in plastics. Polyethylene samples containing these seven elements are supplied in the kit for instrument management.

6

Energy

Dispersive

X-Ray

Fluorescence

Spectrometer

EDX

Areas of Application EDX-7000 • Petroleum & Petrochemicals
Areas of Application
EDX-7000
• Petroleum & Petrochemicals

• Building & Construction Materials • Medical Supplies

• Agriculture and Food Products

• Iron, Steel & Non-Ferrous Metals

• Machinery & Automobiles

• Environment

Metals • Machinery & Automobiles • Environment E D X - L E Elemental Analysis How

EDX-LE

Elemental Analysis

How It Works

An X-ray source irradiates a sample, which in turn emits fluorescent x-rays. The fluorescent X-rays are characteristic of the material. This information is used to identify an unknown sample.

The intensity of the X-rays is indicative of the concentration of the material within a sample. If a standard is available, a calibration curve can be developed to measure the concentration accurately.

On the other hand, it is possible to estimate the concentration using theoretical method in the absence of a standard.

Major Advantages

Unlike ICP analysis or AAS analysis • Electrical & Electronic Materials which requires meticulous sample • Chemical industry

pre-treatments, EDX analysis requires minimum or no sample pre-treatment. Quantitation is possible in the absence of a standard. This Is accomplished using theoretical approximation.

Excellence in Science

EDX

Energy Dispersive X-Ray Fluorescence Spectrometer

EDX Energy Dispersive X-Ray Fluorescence Spectrometer WINNER OF IBO 2014 GOLD AWARD EDX-7000/8000 One EDX over

WINNER OF IBO 2014 GOLD AWARD

EDX-7000/8000

One EDX over all others

NO Liquid nitrogen required
NO Liquid nitrogen required

Key Features and Capabilities

• High performance Silicon Drift Detector (SDD)

• High sensitivity, high resolution & high speed

• Sleek design with small footprint

• Solid, liquid, powder & thin film

• Analysis in air, vacuum*, helium-purged* environment

• 12-sample turret* for solid & liquid samples

• New intuitive software for RoHS*, halogen*, antimony*, tin* screening & general applications

• Minimum maintenance required

• Coating thickness measurement

• NO liquid nitrogen required

thickness measurement • NO liquid nitrogen required Measurement Range • EDX-7000 11 Na to 92 U

Measurement Range

• EDX-7000 11Na to 92U

• EDX-8000 6C to 92U

NEW
NEW

* Optional Item

Excellence in Science 7

EDX-7000/8000

NEW
NEW

Meet FDA 21 CFR Part 11 Requirements

Security Functions

• Unique user authentication by ID/password, operation logging and screen locking.

Operation Log Output Functions

• Allows authorized personnel to output history of user operations or changes of system configuration setting as audit trail logs.

PDF Output Functions

Validation Functions

• Integrity-checking software is built-in to identify any tempering.

EDX Applications for Pharmaceutical Industry

• EDX was adopted as a general analytical method of USP from 1 May 2015.

• Described in USP<735> X-Ray Fluorescence Spectrometry

• Main focus is analysis of impurity

• Advantages: No sample preparation, non-destructive analysis and few easy steps (as shown below)

non-destructive analysis and few easy steps (as shown below) Assemble Sample Cup Pack Sample Set Sample

Assemble Sample Cup

and few easy steps (as shown below) Assemble Sample Cup Pack Sample Set Sample for Analysis

Pack Sample

Set Sample for Analysis

Detection Limit of EDX

Select Program & Start

Unit : μg/g

Integration Time

Cr

Ni

As

Ru

Pd

Pt

300sec

0.4

0.4

0.09

0.6

1.1

0.3

1,200sec

0.2

0.3

0.03

0.3

0.5

0.2

It was calculated from standard deviation after 10 repeat measurements using cellulose blank sample.

Excellence in Science 8

No Experience Necessary Perfect for Beginners

NO Liquid nitrogen required
NO Liquid nitrogen required

Model specifically for RoHS/ELV screening

EDX-LE

Key Features and Capabilities

• Solid, liquid, powder & thin film*

• Intuitive software for RoHS, halogen*, antimony*, tin* screening & general applications*

• Analysis in air environment

• Minimum maintenance required

• Coating thickness measurement*

• NO liquid nitrogen required

Measurement Range

• EDX-LE 13 AI to 92 U

EDX

Excellence in Science 9

Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX High Resolution Elemental Analysis How It Works An X-ray
Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX High Resolution Elemental Analysis How It Works An X-ray
Wavelength
Dispersive
X-Ray
Fluorescence
Spectrometer
WDX
High Resolution Elemental Analysis
How It Works
An X-ray source irradiates a sample, which in turn emits fluorescent
x-rays. The fluorescent X-rays are characteristic of the material. This
information is used to identify an unknown sample. The intensity of the
X-rays is indicative of the concentration of the material within a sample.
If standards are available, a calibration curve can be developed to
measure the concentration accurately. On the other hand, it is possible to
use theoretical method to estimate the concentration, if a standard is not
available.
Unlike EDX spectrometers, WDX spectrometers use crystals to diffract the
wavelengths of fluorescent X-rays before they reach detectors. As a
result, the WDX spectrometers typically have better resolution several
times over EDX spectrometers.
XRF-1800
Major Advantages
Areas of Application
• Electrical & Magnetic Materials

Unlike ICP analysis or AAS analysis which requires meticulous sample pre-treatments, WDX analysis requires minimum or no sample pre-treatment. For example, grinding a solid sample to homogenize the compound. Quantitation is possible in the absence of a standard. This Is accomplished using theoretical approximation.

• Chemical industry

• Petroleum & Coal Industry

• Ceramic, Building & Construction Materials

• Papers & Pulps

• Agriculture and Food Products

• Iron, Steel & Non-Ferrous Metals

• Environment Pollutants

and Food Products • Iron, Steel & Non-Ferrous Metals • Environment Pollutants MXF-2400 10 Excellence in

MXF-2400

Wavelength Dispersive X-Ray Fluorescence Spectrometer

Wavelength Dispersive X-Ray Fluorescence Spectrometer W D X • World-first 250µm mapping • Qualitative /

WDX

• World-first 250µm mapping
• World-first 250µm mapping

• Qualitative / quantitative analysis using higher order X-rays

• Film thickness measurement

• Inorganic component analysis for high-polymer thin film

• Integrated instrument and workbench design

• High-speed sample loading system

Sequential XRF Spectrometer

XRF-1800

Key Features and Capabilities

• Solid, liquid, powder & thin film

• Air, vacuum and helium-purged* environment

• 4kW generator mated to a high performance X-ray tube

• Two detectors (ie. Scintillation Counter & Flow Proportion Counter)

• Wide-area analysis (ie. 10mm-30mm)

• Local-area analysis (ie. 500µm-3mm)

Measurement Range

• Standard 8O to 92U • Optional 4Be to 92U

Position 1 Position 2
Position 1
Position 2

Mapping of Rare Earth Ore by XRF-1800

Position 1 Position 2 Mapping of Rare Earth Ore by XRF-1800 Ba Ce La Ca Multi-Channel

Ba

1 Position 2 Mapping of Rare Earth Ore by XRF-1800 Ba Ce La Ca Multi-Channel XRF

Ce

1 Position 2 Mapping of Rare Earth Ore by XRF-1800 Ba Ce La Ca Multi-Channel XRF

La

1 Position 2 Mapping of Rare Earth Ore by XRF-1800 Ba Ce La Ca Multi-Channel XRF

Ca

Multi-Channel XRF Spectrometer

MXF-2400

Key Features and Capabilities

• High throughput with high level of automation

• Solid, liquid & powder

• Air, vacuum and helium-purged* environment

• 4kW generator mated to a high performance X-ray tube

• Simultaneous analysis of up to 36 elements

• Spectrometer with fixed monochromator-Two types of detector (ie. Gas Sealed Detector & Flow Proportion Counter)

Measurement Range

4Be to 92U (Maximum)

• Spectrometer with scanning monochromator*-One detector (ie. Scintillation Counter)

• Small foot-print with compact design

• High sensitivity

• High precision

Highly accurate elemental analysis of ferrous & non-ferrous metals

How It Works

This analytical technique is commonly known as “arc spark spectrometry”. This is because it uses a short pulse of electrical spark to transfer energy to the atoms in the metal samples, which in turn emits lights that are characteristic of the material. This information is used to identify its chemical composition. The intensity of the light is indicative of the concentration of the material within a sample. With standard samples available, a calibration curve can be developed to measure the concentration accurately.

Optical emission spectrometers use diffracting grating to diffract the wavelengths of light before they reach detectors. As there is an array of detectors, an analysis of tens of elements can be performed within a minute. Optical emission spectrometers typically are capable of low detection limit. In Shimadzu’s optical emission spectrometers, various unique features, such as the time-resolution analysis and pulse distribution analysis (PDA) photometry, make them the most sensitive and precise OES on the market.

Major Advantages

Unlike ICP analysis or AAS analysis which requires meticulous sample pre-treatments, OES analysis requires minimum sample pre-treatment. Only need to polish the sample surface to make sure it is free from contaminants and is uniformly flat. The analysis is non destructive.

Areas of Application

• Steel Industry

• Cast Iron Industry

• Aluminium Ingot and Rolling Industry

• Machinery Manufacturing Industry

• Automobile Industry

• Ship-building Industry

• Testing Service Industry

Optical

Emission

Spectrometer

OES

Testing Service Industry Optical Emission Spectrometer OES PDA-8000 PDA-7000 PDA-5500 S PDA-5000 12 Excellence in

PDA-8000

PDA-7000
PDA-7000
Service Industry Optical Emission Spectrometer OES PDA-8000 PDA-7000 PDA-5500 S PDA-5000 12 Excellence in Science

PDA-5500 S

Service Industry Optical Emission Spectrometer OES PDA-8000 PDA-7000 PDA-5500 S PDA-5000 12 Excellence in Science

PDA-5000

Service Industry Optical Emission Spectrometer OES PDA-8000 PDA-7000 PDA-5500 S PDA-5000 12 Excellence in Science

Optical Emission Spectrometer

Optical Emission Spectrometer OES PDA-8000 Key Features and Capabilities • Top-tier spectrometer • Paschen-Runge

OES

Optical Emission Spectrometer OES PDA-8000 Key Features and Capabilities • Top-tier spectrometer • Paschen-Runge

PDA-8000

Key Features and Capabilities

• Top-tier spectrometer

• Paschen-Runge Spectrometer with 1000mm focal length providing high resolution measurements

• Time-Resolution PDA Photometry (Patented Technique)

• Temperature-controlled chamber for spectrometer

• Vacuum spectrometer enhances sensitivity and low running cost

• Novel excitation unit with real-time energy monitoring

• Ultra-trace Analysis of high purity materials

• Feature-rich software with intuitive interface

• Energy efficient design with “Eco-friendly” label

Time Resolution Pulse Distribution Analysis (PDA) Photometry

• The discharge conditions to obtain the optimal measurement sensitivity differ for each spectral line

• The table below compares the Background Equivalent Concentration (BEC) values for a conventional method and the PDA-series

Element

C

P

S

B

Conventional Method (ppm)

160

150

100

80

PDA Method (ppm)

80

75

50

40

100 80 PDA Method (ppm) 80 75 50 40 Newly Designed Spectrometer Achieves Higher Stability A

Newly Designed Spectrometer Achieves Higher Stability

40 Newly Designed Spectrometer Achieves Higher Stability A Novel Excitation Unit Photomultiplier Tube Exit Slit

A Novel Excitation Unit

Photomultiplier Tube Exit Slit Toroidal Mirror
Photomultiplier
Tube
Exit Slit
Toroidal Mirror

Light Receptor

Condensing System

Discharge Defect Realtime Energy Monitoring
Discharge
Defect
Realtime Energy Monitoring

Constant Monitoring of the Discharge Status

Constant Regulative Spark (CRS) Conventional Arc-Like Discharge
Constant Regulative Spark (CRS)
Conventional Arc-Like Discharge

Ultra Trace Analysis of High Purity Materials

Wavelength Range |

Metal Base

•120 to 550 nm (ferrous metals)

•120 to 700 nm (non-ferrous metals)

| • Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc • Single or multi-element base

OES

PDA-7000

OES PDA-7000 Key Features and Capabilities • Mid-tier spectrometer • Paschen-Runge Spectrometer with 600mm focal

Key Features and Capabilities

• Mid-tier spectrometer

• Paschen-Runge Spectrometer with 600mm focal length

• Vacuum spectrometer enhances sensitivity and low running cost

• Time-Resolution PDA Photometry (Patented Technique)

• Ultra-trace Analysis of high purity materials

• Choice of discharge types to suit elements and analysis ranges

• High-sensitivity analysis of nitrogen in steel

• Simple operation software with intuitive interface

Wavelength Range Metal Base

• 121 to 481 nm (ferrous metals)

• 121 to 589 nm (non-ferrous metals)

• Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc

• Single or multi-element base

metals) • Fe / Al / Cu / Zn / Pb / Sn / Mg /

Optical Emission Spectrometer

Optical Emission Spectrometer TOP-SELLING MODEL PDA-5500S Key Features and Capabilities • High performance at affordable

TOP-SELLING MODEL

PDA-5500S

Key Features and Capabilities

• High performance at affordable price

• Great value

• Paschen-Runge Spectrometer with 600mm focal length

• Vacuum spectrometer enhances sensitivity and low running cost

• Time-Resolution PDA Photometry (Patented Technique)

• Ultra-trace Analysis of high purity materials

• Choice of discharge types to suit elements and analysis ranges

• Simple operation software with intuitive interface

• Maximum 24 channels of light receptors

• Three types of factory calibration

Wavelength Range

Metal Base

• 121 to 481 nm (ferrous metals)

• 121 to 589 nm (non-ferrous metals)

to 481 nm (ferrous metals) • 121 to 589 nm (non-ferrous metals) • Fe, AI &

• Fe, AI & Cu based

OES

OES

WINNER OF

OES WINNER OF PDA-5000 NEW Key Features and Capabilities • Trace analysis of steel and cast

PDA-5000

NEW
NEW

Key Features and Capabilities

• Trace analysis of steel and cast iron

• Software-guided maintenance procedures

• High performance at affordable price

• Paschen-Runge Spectrometer with 600mm focal length

• Vacuum spectrometer enhances sensitivity and low running cost

• New digital excitation source with better performance and less maintenance

• Maximum 24 channels of light receptor

• Simple operation software with intuitive interface

Wavelength Range Metal Base

• 170 to 485 nm

• Fe

Wavelength Range Metal Base • 170 to 485 nm • Fe Summary of Comparisons   PDA-8000
Wavelength Range Metal Base • 170 to 485 nm • Fe Summary of Comparisons   PDA-8000

Summary of Comparisons

Metal Base • 170 to 485 nm • Fe Summary of Comparisons   PDA-8000 PDA-7000 PDA-5500S
 

PDA-8000

PDA-7000

PDA-5500S

PDA-5000

Focal Length

1000 mm

600 mm

600 mm

600 mm

Light Receptors (Max)

64 Channels

64 Channels

32 Channels

24 Channels

Gas Channels

Available

Available

Not Available

Not Available

Wavelength Range

120 to 550 nm (Ferrous) 120 to 700 nm (Non ferrous)

121 to 481 and 589 nm

121 to 481 and 589 nm

178 to 481 nm

Metal Base

Single or Multi

Single or Multi

Fe, Al & Cu

Fe

Factory Calibration

Various Types

Various Types

Various Types

Various Types

Measurement Method

Time-Resolution

Time-Resolution

Time-Resolution

Intensity Integration

PDA Method

PDA Method

PDA Method

Method

Real-Time Energy Monitoring

Available

Not Available

Not Available

Not Available

PDA-R Software

Available

Not Available

Not Available

Available

A powerful tool capable of high resolution imaging and high resolution analysis of chemical composition, chemical state and even crystalline structure. A far more superior instrument than scanning electron microscope with EDX (SEM + EDX).

How It Works

EPMA has an electron gun and a sophisticated optics system. By varying energy of electron beams, interactions between incident electron beam and sample produce signals. These signals are captured with appropriate detectors to yield backscatter images and secondary electron images. With the presence of an optical microscope, optical images complement the information provided by electron images.

Wavelength dispersive X-ray fluorescence (WDX) spectrometry is typically an integral part of EPMA. Instead of X-ray photons as the excitation energy as in the case of a standalone WDX system, EPMA uses electron beams to generate the effects. Additional analytical techniques such as energy dispersive X-ray (EDX) fluorescence spectrometry and cathode- luminescence attachment can be added.

Major Advantages

The superb WDX resolution is the source of EPMA advantages. It enables wide range of elemental analysis and mapping, as well as chemical state analysis. The latter is not possible in a SEM with EDX.

Areas of Application

• Metal Industry

• Machinery Manufacturing Industry

• Ship-building Industry

• Chemical Industry

• Aerospace Industry

• Materials R&D Industry

• Resources & Energy Industry

• Semiconductor & Electronic

Industry

Electron

Probe

Micro

Analyser

EPMA

I n d u s t r y Electron Probe Micro Analyser EPMA EPMA-8050G EPMA-1720 Series

EPMA-8050G

u s t r y Electron Probe Micro Analyser EPMA EPMA-8050G EPMA-1720 Series ExcellenceExcellence inin ScienceScience

EPMA-1720 Series

ExcellenceExcellence inin ScienceScience 1717

EPMA

CUTTING-EDGE FE ELECTRON OPTICAL SYSTEM

EPMA-8050G

Key Features and Capabilities

High brightness Schottky electron source (ie. Field Emission or FE)

3nm - highest Secondary Electron Image resolution for an EPMA

• Ultra high sensitivity analysis

• Ultra high resolution mapping

• Chemical State Analysis

• Wavelength Dispersive X-Ray (WDX) Spectrometer

• Secondary Electron Imaging

• Backscatter Electron Imaging

• Optical Microscope Imaging

• Mapping

• Magnification 400,000x

• Cathode-Luminescence attachment*

Unprecedented Spatial Resolution

10nA

100nA

1µA

FE

Unprecedented Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current
Unprecedented Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current
Unprecedented Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current

CeB6

Unprecedented Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current
Unprecedented Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current

Tungsten

Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current cannot
Spatial Resolution 10nA 100nA 1µA FE CeB6 Tungsten This current cannot be set This current cannot

This current cannot be set

This current cannot be set

Comparison of Electron Gun Beam Characteristics (10 kV accelerating voltage)

Elemental Range

• Standard 5B to 92U • Optional 4Be to 92U

NEW
NEW

Ultra-High Sensitivity

100nA

500nA

1.5µA

5µm
5µm
5µm
5µm
5µm
5µm

Mapping Analysis of 1% Si in Stainless Steel (10 kV accelerating voltage)

Electron Probe Micro Analyser
Electron Probe Micro Analyser

EPMA

Electron Probe Micro Analyser EPMA EPMA-1720Series Key Features and Capabilities • 5nm - Secondary Electron Image
Electron Probe Micro Analyser EPMA EPMA-1720Series Key Features and Capabilities • 5nm - Secondary Electron Image

EPMA-1720Series

Key Features and Capabilities

• 5nm - Secondary Electron Image Resolution

• High resolution mapping

• Chemical State Analysis

• Wavelength Dispersive X-Ray (WDX) Spectrometer

• Secondary Electron Imaging

• Backscatter Electron Imaging

• Optical Microscope Imaging

• Mapping

• Magnification 400,000x

• Cathode-Luminescence attachment*

Maintains the 52.5° X-ray take-off angle that is fundamental to analytical performance.

angle that is fundamental to analytical performance. ❶ ❷ Analysis data for foreign matter in a
angle that is fundamental to analytical performance. ❶ ❷ Analysis data for foreign matter in a
❶
❷

Analysis data for foreign matter in a pit. is the distribution of iron (Fe); is the distribution of titanium (Ti). The high take-off angle used by the EPMA-1720 ensures highly accurate analysis of rough samples.

Elemental Range

• Standard 5B to 92U • Optional 4Be to 92U

SEM Observation

5 B to 92 U • Optional 4 Be to 92 U SEM Observation Image of

Image of Tin Balls Magnification: 10,000x

Mapping Analysis

Image of Tin Balls Magnification: 10,000x Mapping Analysis Analysis of solder Element: Pb; region 14 ×

Analysis of solder Element: Pb; region 14 × 14 µm

X-Ray Photoelectron Spectrometer (XPS) analyses the chemical compositions and chemical state in a material. Sampling depth is typically 10nm. It is a critical tool for material failure analysis as well as cutting-edge material innovation and development. XPS is also known as Electron Spectroscopy for Chemical Analysis (ESCA).

How It Works

An X-ray source imparts photons of energy onto sample. The absorbed energy causes some electrons to break free from its shell and eject out. They are guided and assisted towards a detector by electrostatic and magnetic lens in a ultra high vacuum atmosphere. XPS has spectroscopy and imaging capabilities. It can measure all the elements except hydrogen (Z=1) and helium (Z=2). Modern XPS is also capable of multiple analytical techniques, eg. auger electron spectroscopy (AES) and ultra-violet photoelectron spectroscopy, that increase its functionality.

Major Advantages

High resolution analysis of surface of materials. Wide applications in various industries.

Areas of Application

Semiconductor Catalyst Thin film coating Polymer & plastic Magnetic memory

• Nanotechnology

Biotechnology

Fabric

Glass

Battery

Cosmetics

X-Ray

Photoelectron

Spectrometer

XPS

AXIS SUPRA
AXIS SUPRA
Fabric Glass Battery Cosmetics X-Ray Photoelectron Spectrometer XPS AXIS SUPRA AXIS NOVA Amicus 20 Excellence in

AXIS NOVA

Amicus
Amicus

X-Ray Photoelectron Spectrometer

X-Ray Photoelectron Spectrometer NEW ARGUABLY THE BEST XPS ON THE MARKET AXIS SUPRA XPS Key Features
NEW
NEW

ARGUABLY THE BEST XPS ON THE MARKET

AXIS SUPRA

NEW ARGUABLY THE BEST XPS ON THE MARKET AXIS SUPRA XPS Key Features and Capabilities •

XPS

Key Features and Capabilities

• State-of-the-art specifications in the XPS world

• Unrivalled automated sample handling and ease of use

• High resolution and high sensitivity spectroscopy

• New Windows-based control software - ESCApe

• Small spot size: < 15µm

• Lateral resolution: 1µm

• Delay-Line Detector (DLD) with 128 detector channels

• 180º Hemispherical analyser (HSA) for spectroscopy

• Spherical mirror analyser (SMA) for parallel imaging

• High power Al monochromator X-ray source with 500mm Roland circle

• Fully automatic electron-only charge neutralizer

• Scanned and snapshot spectroscopy modes

• 2D imaging

• Multi-technique capabilities including Scanning Auger Microscopy (SAM) Schottky Field Emission Source, Ion Scattering Spectroscopy (ISS), Secondary Ion Mass Spectrometry (SIMS) & Ultraviolet Photoelectron Spectroscopy (UPS)

XPS

XPS AXISNOVA Key Features and Capabilities • Superb automated sample handling with the best specifications in

AXISNOVA

Key Features and Capabilities

• Superb automated sample handling with the best specifications in the world

• Ideal for QA and problem solving tasks

• Delay-Line Detector with 128 detector channels

• 180° Hemispherical analyser (HSA)

• Spherical mirror analyser (SMA)

• High resolution and high sensitivity spectroscopy

• Small spot size, < 15µm

• High power Al monochromator with 500mm Rowland circle

• Fully automatic charge neutralizer

• Scanned & snapshot spectroscopy modes

• 2D imaging mode

• Compact footprint

• Scanned & snapshot spectroscopy modes • 2D imaging mode • Compact footprint 22 Excellence in

X-Ray Photoelectron Spectrometer

X-Ray Photoelectron Spectrometer XPS LOW COST, HIGH PERFORMANCE XPS Amicus Key Features and Capabilities • Compact

XPS

LOW COST, HIGH PERFORMANCE XPS

Amicus

Key Features and Capabilities

• Compact & versatile XPS ideal for routine laboratory analysis

• Rapid sample introduction system

• Automated carousel for multiple samples

• Dual anode (Mg & Al source)

• Single channeltron detector with low/high pass filter

• Integrated ion etching source

• Single technique system

detector with low/high pass filter • Integrated ion etching source • Single technique system Excellence in
detector with low/high pass filter • Integrated ion etching source • Single technique system Excellence in
Sample observation down to atomic resolution. It is used for surface morphologic and topographic study.
Sample observation down to atomic resolution. It is used for surface morphologic and topographic study.

Sample observation down to atomic resolution. It is used for surface morphologic and topographic study.

How It Works

SPM consists of a cantilever with a sharp tip at its end that is used to scan the sample surface. When the tip is brought into close range of a surface, forces between the tip and surface cause a deflection of the cantilever. A laser spot is used to measure the deflection by reflecting it off the top surface of the cantilever onto a detector. Several forces can be imaged, measured and even manipulated. Some common examples are mechanical contact force, magnetic force, electric current etc. Measurements can be done in air, vacuum or liquid environment. Effects of temperature, humidity, gas and electrochemistry on samples can be studied.

Major Advantages

Ultra high resolution analysis of surface of materials. A wide variety of sample characteristics can be analysed. Relevant to a big spectrum of industry.

Areas of Application

• Living organisms, eg. E.coli bacteria

• Metals, eg. boundary surface of plating layer

• Non metals, eg. ferroelectric domains

• Minerals, eg. observation of calcite in solution

• Ceramics, eg. film dispersed with silica

• Polymers, eg. Li-ion battery separator

• Powders, eg. toner particle

• Nanotechnology, eg. rendering images using electric potential

• Thin films, eg. cross-section of the film

• Semiconductors, eg. electric potential analysis of organic thin film transistor

• Coatings, eg. baking finished surface

Scanning

Probe

Microscope

SPM

SPM-8000FM
SPM-8000FM

SPM-9700

Scanning Probe Microscope

Scanning Probe Microscope SPM SPM-8000FM NEW Observation and measurement of hydration / solvation are possible now

SPM

SPM-8000FM

NEW
NEW
Scanning Probe Microscope SPM SPM-8000FM NEW Observation and measurement of hydration / solvation are possible now

Observation and measurement of hydration / solvation are possible now

Key Features and Capabilities

• Ultra-high resolution observation in air or liquids

• Performance level on par with a vacuum-type SPM

• Uses Frequency Modulation method

• Headslide mechanism gives stability

• Headslide mechanism enhances efficiency

• Small footprint

Headslide mechanism enhances efficiency • Small footprint SPM-9700 Key Features and Capabilities • Highly versatile
Headslide mechanism enhances efficiency • Small footprint SPM-9700 Key Features and Capabilities • Highly versatile

SPM-9700

Key Features and Capabilities

• Highly versatile with a wide range of scanning modes

• Headslide mechanism gives high stability

• Headslide mechanism enhances efficiency

• Design is resistant to vibration, wind & noise without a need for a special external enclosure

• Wide variety of 3D rendering functions using mouse operations

• SPM observation in liquid medium

• SPM observation in humidity, gas, temperature, lighting controlled environment

• Small footprint

SPM

NANO SEARCH MICROSCOPE

OLS-4500

3-in-1 Integrated Microscope:

Optical / Laser / Probe

Key Features and Capabilities

• Integrated Optical / Laser Scanning / Scanning Probe Microscope

• Seamless Accurate Measurement from millimeters to nanometers

• Never lose sight of target when switching from one microscopic observation to another

• Significant reduction in measurement time

• Ultra-wide range of observations

20 µm 5 µm 64 µm 1280 µm 256 µm 640 µm
20 µm
5 µm
64 µm
1280 µm
256 µm
640 µm
NEW
NEW
time • Ultra-wide range of observations 20 µm 5 µm 64 µm 1280 µm 256 µm
time • Ultra-wide range of observations 20 µm 5 µm 64 µm 1280 µm 256 µm

To study crystallographic properties such as phases, angles and distance between planes etc. These pieces of information are useful as they indicate properties such as strengths, chemical signature, ease of dissolvation etc.

How It Works

This analytical technique is non destructive. X-rays focused on a sample fixed on the axis of the goniometer are diffracted by the sample. The changes in the diffracted X-ray intensities are measured and plotted against the incident angles of the sample. Qualitative and quantitative analysis can be performed.

Major Advantages

X-Ray diffractometry offers critical information that no other techniques could match. It is easy to set-up and operate. Interpretation of results is boosted with commercially available databases.

Areas of Application

• Metal Industry

• Machinery Industry

• Ship-building Industry

• Chemical Industry

• Cement, Ceramic & Glass Industry

• Pharmaceutical Industry

• Resources & Energy Industry

• Electrical & Electronic Industry

• Construction & Engineering Industry

• Environment & Waste Management Industry

• Testing Service Industry

X-Ray

Diffractometer

XRD

• Testing Service Industry X-Ray Diffractometer XRD OneSight XRD-7000 XRD-6100 ExcellenceExcellence inin

OneSight

Testing Service Industry X-Ray Diffractometer XRD OneSight XRD-7000 XRD-6100 ExcellenceExcellence inin SciencScience e

XRD-7000

Service Industry X-Ray Diffractometer XRD OneSight XRD-7000 XRD-6100 ExcellenceExcellence inin SciencScience e 2727

XRD-6100

ExcellenceExcellence inin SciencSciencee 2727

XRD

OneSight Wide-Range High-Speed Detector

High-Speed Detector With 1280 Channels Achieves High-Speed, High-Sensitivity Performance

The OneSight consists of a semiconductor Si sensor array. It achieves an intensity approximately 100 times higher than that obtained by a scintillation detector. The OneSight can also perform wide-angle range measurement without a scanning goniometer for significantly higher throughput. It can be easily mounted on existing XRD-6100/7000 units at customers’ sites*.

*It is necessary to set up the OneSight parameters during the initial installation. It may be necessary to update the software and hardware. For more details, please contact your representative.

NEW
NEW

ONE SHOT Function Achieves Simultaneous Measurement of Diffration Profile at a Wide Range Angle

The OneSight can perform a simultaneous diffraction profile measurement at more than 10 deg. angle range without a scanning goniometer. This is useful for quantitative when using a specified diffraction peak.

Standard Sample Data of Asbestos (Chrysotile) (30 sec. measurement time per sample)

Asbestos (Chrysotile) (30 sec. measurement time per sample) High-Speed Quantitative Analysis using Three Types of

High-Speed Quantitative Analysis using Three Types of measurement Modes

The OneSight features three kinds of measurement modes: High Solution, Standard, and Fast. It enables measurement speed 10 times faster (high resolution), 15 times faster (standard), and 25 times faster (fast) than those attained with a scintillation detector.

28 Excellence in Science

X-Ray Diffractometer XRD
X-Ray Diffractometer
XRD
X-Ray Diffractometer XRD XRD-7000 Key Features and Capabilities • Theta-theta goniometer • High-speed rate

XRD-7000

Key Features and Capabilities

• Theta-theta goniometer

• High-speed rate (1000°/min)

• Ultra-precision angle reproducibility (0.0002°)

• X-Rays are turned on during analysis ONLY

• Compact design

• Simple operation with intuitive interface

• Wide range of optional attachments for conceivable applications

NEW
NEW

XRD-7000 & XRD-6100 Meet FDA 21 CFR Part 11 Requirements

XRD-6100

Key Features and Capabilities

• Theta-Two theta goniometer

• High-speed rate (1000°/min)

• High-precision angle reproducibility (0.001° for two theta)

• X-Rays are turned on during analysis ONLY

• Compact design

• Simple operation with intuitive interface

• Wide range of optional attachments for conceivable applications

with intuitive interface • Wide range of optional attachments for conceivable applications Excellence in Science 29

Excellence in Science 29

Our Partners

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Perfomax Analytical 704, Crystal Paradise, Veera Desai Road Andheri (W), Mumbai - 400053, India Tel.: (022) 26731868 Fax: (022) 26731869 Email: nainesh@perfomaxtech.com www.perfomaxtech.com

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30 Excellence in Science

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Myanmar Amtt Co., Ltd 5/ Sah-B Aung Mingalar Street, 4 Qtr, Mayangone 11061, Yangon, Myanmar

Tel:

(951) 666 802, 656 453 (951) 656 819

Fax: (951) 667 609

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Philippines Shimadzu Philippines Corporation 11/F Sun Life Centre, 5th Avenue corner Rizal Drive, Bonifacio Global City, Taguig City 1634, Philippines Tel: (632) 869-9563 Fax: (632) 519-9285

Sri Lanka

Hayleys Lifesciences (Pvt) Limited 25 Foster Lane, Colombo 10, Sri Lanka.

Tel:

(94) 11 269 9100 (94) 11 267 4578

Thailand Bara Scientific Co., Ltd. 968 Rama 4 Road, Silom Bangrak, Bangkok 10500, Thailand Tel: (66-2) 632 4300 Fax: (66-2) 637 5497 www.barascientific.com

Vietnam TECOTEC Co 2nd Floor, CT3A Building, Me Tri Thuong Urban Zone Tu Liem, Hanoi, Vietnam Tel: (84-4) 3576-3500 Fax: (84-4) 3576-3498 Email: hanoi@tecotec.com.vn www.tecotec.com.vn

Notes:

Excellence in Science 31

Customer Support Centre

Customer Support Centre SHIMADZU (ASIA PACIFIC) PTE. LTD. 79 Science Park Drive #02-01/08 Cintech IV Singapore
Customer Support Centre SHIMADZU (ASIA PACIFIC) PTE. LTD. 79 Science Park Drive #02-01/08 Cintech IV Singapore

SHIMADZU (ASIA PACIFIC) PTE. LTD.

79 Science Park Drive #02-01/08 Cintech IV Singapore Science Park 1 Singapore 118264

TEL: 6778-6280

FAX: 6779-2935

Enquiry: sales@shimadzu.com.sg

www.shimadzu.com

Company names, product/service names and logos used in this publication are trademarks and trade names of Shimadzu Corporation affiliates, whether or not they are used with trademark symbol “TM” or “®”. Third-party trademarks and trade names may be used in this publication to refer to either the entitles or their products/services. Shimadzu disclaims any proprietary interest in trademarks and trade names other than its own. Pictures are for illustration only, actual specifications may vary.

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