X Ray Techniques

ICFA Future Light Sources Subpanel
Overview of x-ray techniques
Makina YABASHI
SPring-8/JASRI

Miniworkshop on XFEL Short Bunch Measurement and Timing
Stanford Linear Accelerator Center
July, 26 2004
1
XFEL
Short pulse
Spatial Coherence
Peak Brilliance
X-beam Handling X-beam Diagnostics
3rd gen. SR
2
XFEL
Short pulse
Spatial Coherence
Peak Brilliance
3rd gen. SR
3
X-ray handling
Coherence preservation
Nano-beam
Temporal manipulation
Monochromator
Polarization
Thermal handling
Crystal Mirror
Window
Multilayer
µ−fabricated optics
4
Crystal: Diamond
Diamond workshop @ ESRF, May 24-25, 2004
Tamasaku et al: "Characterization of synthetic IIa diamonds at SPring-8"
Bragg Geometry Si 220(b=20.9)-C 111 @9.44 keV 5 mm
Whole g111
0.5x0.5 mm2 surface
Theory
(Sumitomo IIa)
1 mm
5
Mirror
Can we use under coherent illumination ?
6
Mirror: SP8 - Osaka Univ. collaboration
Mirror: Silicon (001) / Incident angle 1.2 mrad / Mirror length 100 mm
Camera Premachined surface CVM surface CVM+EEM surface
distance:
166 mm
566 mm
966 mm
15.0 15.0
Height(nm)
Height(nm)
10.0 10.0
5.0 5.0
0.0 0.0
0 10 20 30 40 50 60 70 0 10 20 30 40 50 60 70
Distance(mm) Distance(mm)
Mori et al, Proc. SPIE (2001) 7

Mirror: Nanobeam
Summer in 2003 E=15 keV(λ=0.8 Å)
0.6 2.5
Beam profile ｓimulated by Beam profile simulated by
using ideal shape using ideal shape
Beam profile simulated by Beam profile simulated by
0.5 using measured shape using measured shape
2.0
Measured beam profile Measured beam profile
Intensity (arb. unit)
Intensity (arb. unit)

0.4
1.5
0.3
180 nm 1.0 90 nm
0.2
0.5
0.1
0.0 0.0
-1 -0.8 -0.6 -0.4 -0.2 0 0.2 0.4 0.6 0.8 1 -1 -0.8 -0.6 -0.4 -0.2 0 0.2 0.4 0.6 0.8 1
Position [um] Position [um]
July 2004: 40 nm focus was achieved ! 8

Mimura et al.
Window: Be
NGK, BR-3 Brush-Wellman, IF-1
200 µm
Purity: 98.5 % Purity: 99.8 %

Roughness: > 1 µm Ra Roughness: 0.1 µm Ra
Thickness: 200 µm Thickness: 250 µm t
S. Goto et al:
Phase contrast imaging @ 1-km BL Proc. SRI2003
(0.5 µm res., L ~1.8 m, λ ~1 Å)
9
XFEL
3rd gen. SR
10
X-ray diagnostics
Coherence Spatial profile
Temporal profile Polarization

Statistics
Crystal Mirror
Window
Multilayer
µ−fabricated optics
11
Temporal profile
Resolution Envelop Repeat
Present ~ ps Simple Multi-shot

(Gaussian) (average)
Target ~ fs, as Complex Single-shot

(arbitrary)
12
How to measure
Temporal domain
Laser & X-ray coincidence
Fourier transform
Frequency domain
X-ray Spectral
Interferometry
13
Spatial profile: Coherence
Real-space domain
e-beam size measurement
Fourier transform
Reciprocal-space domain
X-ray Interferometry
14
Diagnostics
Temporal domain Real-space domain

Laser & X-ray e-beam size
measurement
coincidence
Fourier transform
Frequency domain Reciprocal-space domain
X-ray
X-ray Interferometry
Interferometry X-ray Interferometry
X-ray
15
Interferometry
Amplitude interferometry Intensity interferometry
Thomas Young, 1807 Hanbury-Brown and Twiss, 1956

Photon Statistics 16
Photon statistics
July 2004
Aug. 2003
私がカオス
源よ!
Chaotic light Coherent light
Intensity interferometry (2nd-order interferometry)

17
Contents
Introduction
Principle
Experiment at 3rd. gen SR
Proposal for SPPS
Proposal for XFEL
18
Instantaneous Point
wave field
/ Chaotic source
Point / Coherent source
 2π ir  iω t  2π ir 
Ne
E ( r , t ) ∝ N e exp   e E ( r , t ) ∝ ∑ exp  + iφi (t ) eiω t
 λ  i  λ 
Planer /Chaotic source
Ne
 2π i r − si  iω t Loudon, 1983
E ( r , t ) ∝ ∑ exp  + iφi (t ) e Goodman, 1985
i  λ  19
Wave packet
I = I A + I B + Γ AB + Γ*AB
temporal coherence Γ AB = E A* EB
length
spatial
coherence cell coherence
length
I ( x, t ) =
2
E ( x, t )
I A I B = I A I B + Γ AB
2
20
Variation
Two pinholes
One pinhole + Beam splitter
21
Mode number
MT ~ 2
Temporal resolution
Spatial Coincidence
resolution counter
coherence cell
MX ~ 3
100
Mode number M : Number of coherence cells
10
in the resolution function (M = MX MY MT) MX
1
I A I B = I A I B (1 + 1/ M ) 10
I AIB 1 Small M R 1
R≡ −1 = 0.1
I A IB M
Large R 0.1 1 10 100
w X /σ X 22
Contents
Introduction
Principle
Spatial domain
Temporal domain
Proposal for SPPS
Proposal for XFEL
23
Difficulty in 3rd gen. SR
2 sT ~ 10 - 100 ps (pulse width of SR)

 sT  σT ~ sub-fs (NUλ/c) for raw undulator radiation
MT = 1+  
 σT  MT ~ 10 5 - 10 6
R =1/ MT ~ 10 -5 - 10 −6
σT = λ2/∆λ = λE/∆E ∝ 1/∆E

Use of high-resolution monochromator (HRM)
Optimized condition: σT ~ sT (~ 10 ps)
∆E ~ sub meV
Y. Kunimune et al. JSR (1998)
E. Gluskin et al. JSR (2000)
24
High-Resolution Mono
10
∆E (meV)
10 -7
∆E/E
1
∆E/E = ωS cot θB
10 -8
0.1
∆E/E = ωS b1/2cot θB
1985 1990 1995 2000
Year
Energy Resolutions at E=14.4 keV
G. Faigel et al. 1987; T. Ishikawa et al. 1992;
T. Toellner et al. 1992, 1997; A.I. Chumakov et al. 1996, 2000 25
Design
E = 14.4 keV
Si 11 5 3
Glancing angle = 2°
b = b1= b2 = 1/b3 = 1/b4 = 1/10.4
Crystal size: 30 ×15 ×12 mm3
Spatial acceptance = 100 µm
∆E = 100 µeV
26
Dual co-axial
goniometer #2
Dual co-axial
goniometer #1
(12.2 nrad/pls)
27
Result
500
Slit width: 100(v) x 22.5(h) µm
2
Resonant intensity 400
300
200
∆E=
100 114 µeV
0
-300 -200 -100 0 100 200 300
Energy shift ( µeV)
28
Achieved Resolution
10
∆E (meV)
10 -7
∆E/E
1
10 -8
0.1
1985 1990 1995 2000
Year
M. Yabashi, K. Tamasaku, S. Kikuta, and T. Ishikawa,
Rev. Sci. Instrum. 72, 4080 (2001). 29
Setup
25 m/4.5 m
Undulator DCM HRM Slit APD 1&2
⊗
0 58 67.8
Distance from the center of undulator (m)
C CD camera
Th e ro tat io n cen ter of θ APD 1 APD 2

Cage for the
2 nd crystal
3 0mm
exit
bea m incident
α1 bea m
Y1 XX 1
Z1
φ1
X1
Cage
∆θ 1
mechan ical cam
TM P
manu al X
manu al Z
APD 1
Yabashi et al., SPIE 1999;
Tamasaku et al., SPIE 2002,
Kitamura et al., NIM A, 2001
BS APD 2 30
σy =
λz
2π s y
Spatial domain
ε = 6 nm.rad ε = 3 nm.rad
0.2
R
0.2
0.1
Rmax
R
0
0 100 200 300 400 500 0.1
Vertical slit width ( µm)
σy = 124.3 ± 6.9 µm
sy = 5.9 ± 0.3 µm 0
εy = 6.0 ± 0.7 pm.rad 0 100 200 300 400 500
κ = 0.10 % Vertical slit width ( µm)
M. Yabashi, K. Tamasaku & T. Ishikawa,
σy = 161.3 ± 5.0 µm
Phys. Rev. Lett. 87, 140801 (2001); sy = 4.6 ± 0.14 µm
Phys. Rev. A 69, 023813 (2004). εy = 3.6 ± 0.2 pm.rad, κ = 0.12 % 31
Pulse width
Rmax 0.2
R
0.1
0
0 100 200 300 400
Vertical slit width (µm)
Rmax= 1/ MT = (1+ σT2 /sT2)-1/2

(MX = MY = 1) Measure pulse width st
σT = 4hln2/∆E
32
Result
Vertical width = 30 µm
0 .5
E (ke V) ∆E(m e V)
14.412 0.145
0 .4 14.365 0.231
14.332 0.334
14.299 0.508
0 .3 14.267 0.763
R
0 .2
0 .1
0
0 10 20
Horizontal slit width ( µm)
33
Mode number vs. bandwidth

Measured
M t = 1/ Rmax
Calculated (s=32.7
t ps) 2
 4= ln 2 
10 = 1+  
Mt 5  ∆E ⋅ st 
sT = 32.7 ±1.6 ps
1 Streak camera: 32 ps
0.1 0.5 1
∆E (meV)
M. Yabashi, K. Tamasaku, and T. Ishikawa,
Phys. Rev. Lett. 88, 244801 (2002). 34
Contents
Introduction
Principle
Proposal for SPPS
Proposal for XFEL
35
SPPS
Pulse Optimized
width bandwidth
3rd gen. 30 ps 0.2 meV complicated
SPPS 80 fs 70 meV simple
36
Proposed Setup
Ge detector
Pinhole Intensity Si hkl
monitor
MCA
light
det.
K2
M= 2
σK − K
37
Simulation Mandel's formula

∆E (meV) M
0.2
Si 800 25 1.5 B-E
0.1
0
Probability
0.2
Si 440 80 3.9
0.1
0
0.2
Si 400 220 9.3 Poisson
0.1
E = 9.3 keV, st = 80 fs
average counting number = 2.5 0
0 10 20
Photon counting number 38
Key for success

1. Bose degeneracy S/N ∝ δ η (f T)1/2
SP8 25-m U SPPS

Degeneracy δ : ~ 0.3 ~ 90
(BP ~ 6×1023 (BP ~ 5×1025
λ ~0.086 nm ) λ ~0.13 nm)
Efficiency η: 10-2 10-1
Repetition rate f : 36 MHz 10 Hz
δ η f 1/2 : 18 30
Time: ~ 10 min < 10 min ??
2. Normalization of intensity fluctuation unrelated to
interference
39
Required time
Time (s)
10 100 1000 10000
10 δ c=1
δ c=0.1
Estimated Mc
0
100 1000 10000 100000
Total number of pulse, N
δc # of pulses Time T ∝ δc 2
1 200 20 sec
0.1 20000 2000 sec ~ 1 hour
0.01 2000000 200000 sec ~ 2 days 40
Key for success

1. Bose degeneracy
S/N ∝ δ η (f T)1/2
Degeneracy δ : ~ 0.3 ~ 90
(BP ~ 6×1023 (BP ~ 5×1025
λ ~0.086 nm ) λ ~0.13 nm)
Efficiency η: 10-2 10-1
Repetition rate f : 36 MHz 10 Hz
δ η f 1/2 : 18 30
Time: ~ 10 min < 10 min ??
2. Normalization of intensity fluctuation unrelated to
interference
41
Average for repeated pulses

I I I
ω ω ω
More intense beam
42
Single-shot Measurement
∆E1 A ( ∆t ) 2 ∆T2
A ( ∆E )
2
∆E2 ∆T1
FT '
Microstrucrure
∆E ∆t
Envelop
∆T1 ≅ h / ∆E1
J. Krzywinski, E. Saldin et al. NIM A (1997)
43
Simulation
-200 -100 0 100 200

-10 0 10
Time (fs)
Photon energy (eV)
∆T1 : 100 fs
∆E1: 10 meV
-200 -100 0 100 200
Photon energy (meV) 44
Thin target/
Setup
Divergent optics Crystal (Si, Ge, C ...)
XFEL Nearly backscattering
∆E
χg
E
Si 555: ∆E = 16 meV
@ E ≅ 9.9 keV
Array Detector
I (∆E ) = A(∆E )
2
Pulse width estimation (a priori knowledge of pulse shape)

OK
45
Detailed information
FT
A ( ∆E ) A ( ∆t ) 2
2
FT
A ( ∆E ) A ( ∆t )
Require phase information
46
Phase retrieval
Oversampling method
Miao et al. PRL 89 (2002) 088303.
2D: OK
|FT|2 Iteration
SEM image of Ni pattern on SiN

Coherent Scattering Pattern 2D Reconstructed Image
(<10 nm resolution)
1D: generally impossible for complex object

47
Example: FROG
Frequency Resolved Optical Gating

Measure energy spectrum with changing delay time
Optical
Delay Spectrometer
Non-linear
material
R. Trebino and D. J. Kane, JOSA A (1993).
2D Phase Retrieval
XFROG ?
48
Summary
We can apply intensity interferometry to measure

spatial and temporal profile of 3rd gen. SR source.
For shorter pulse, much easier.
For single-shot detection, extension of conventional
spectroscopy technique will be useful.
For determination of pulse shape, we have to retrieve
phase information. Further considerations &
discussions are required.
49
Acknowledgement
T. Ishikawa, K. Tamasaku, S. Goto, D. Miwa, T. Ueda, A. Baron

H. Kitamura, T. Shintake, T. Hara, H. Tanaka (SPring-8)
K. Yamauchi, K. Yamamura, H. Mimura, T. Matsuyama,

H. Yumoto, Y. Mori (Osaka Univ.)
J. Hastings, J. Arthur (SLAC)
50

X Ray Techniques

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ICFA Future Light Sources Subpanel

Overview of x-ray techniques

ICFA Future Light Sources Subpanel

Can we use under coherent illumination ?

Mori et al, Proc. SPIE (2001) 7

Intensity (arb. unit)

July 2004: 40 nm focus was achieved ! 8

Purity: 98.5 % Purity: 99.8 %

X-beam Handling X-beam Diagnostics

Coherence Spatial profile

Temporal profile Polarization

Present ~ ps Simple Multi-shot

Target ~ fs, as Complex Single-shot

Spatial profile: Coherence

Temporal domain Real-space domain

Thomas Young, 1807 Hanbury-Brown and Twiss, 1956

Chaotic light Coherent light

Intensity interferometry (2nd-order interferometry)

One pinhole + Beam splitter

Difficulty in 3rd gen. SR

2 sT ~ 10 - 100 ps (pulse width of SR)

σT = λ2/∆λ = λE/∆E ∝ 1/∆E

Resonant intensity 400

Th e ro tat io n cen ter of θ APD 1 APD 2

Rmax= 1/ MT = (1+ σT2 /sT2)-1/2

Mode number vs. bandwidth

SPPS 80 fs 70 meV simple

Simulation Mandel's formula

Key for success

SP8 25-m U SPPS

Key for success

Average for repeated pulses

More intense beam

-200 -100 0 100 200

Pulse width estimation (a priori knowledge of pulse shape)

Require phase information

SEM image of Ni pattern on SiN

1D: generally impossible for complex object

Frequency Resolved Optical Gating

R. Trebino and D. J. Kane, JOSA A (1993).

We can apply intensity interferometry to measure

T. Ishikawa, K. Tamasaku, S. Goto, D. Miwa, T. Ueda, A. Baron

K. Yamauchi, K. Yamamura, H. Mimura, T. Matsuyama,

J. Hastings, J. Arthur (SLAC)

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