Potential-Induced

Degradation (PID):
Field Detection, Laboratory
Tests and Regeneration
TÜV Rheinland Webinar: 13 September 2018
Time: 15.00 – 16.00 o’clock (CEST)
TÜV Rheinland Webinar: 13 September 2018
Time: 15.00 – 16.00 o’clock (CEST)
Potential-Induced Degradation (PID): Field Detection, Laboratory Tests and Regeneration
Speaker: Gerhard Mathiak (TÜV Rheinland)

AGENDA Abstract
 Introduction Potential induced degradation (PID) is commonly known to
 How does PID occur? cause power output degradation of PV modules in the field,
which are installed near the negative pole of the PV module
 When does PID occur?
string. This failure mode was observed for the first time in the
 How to avoid or mitigate PID? year 2010 and put new challenges to the Silicon
 PID Laboratory Tests (Standards) Photovoltaics industry to understand this effect and find
technical solutions for prevention.
 PID Detection in the Field
Dr. Mathiak will explain in this webinar how and when PID is
 PID Regeneration likely to occur. He will analyze how to avoid or mitigate PID
 Summary and will also speak about PID test standards, PID detection
in the field and PID regeneration. He will give an overview of
the state of the art and an outlook for future tasks in PID
remedy from the viewpoint of the worldwide leading test
laboratory.
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Introduction: How does PID occur?
For p-type silicon standard cells (PID-s or PID-shunt)

 Potential difference between cells (negative) and frame (ground)

induces electrical field
 Electrical field leads to leakage currents in the order of several µA
 Positive charged ions (e.g. Sodium: Na+) can accumulate on the
surface of the cell
 Accepted root cause HYPOTHESIS “Stacking Fault-Short
Circuit” (Fraunhofer CSP 2012)
 Na+-Ions are decorating stacking saults across the p-n
junction
 Shunts are created
 The parallel resistance and the performance of the cell are
reduced.

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Introduction: How does PID occur?
Rootcause: Sodium-Ions Short Circuit pn-Junction along Stacking Fault

 Transmission Electron Microscopy (TEM) of a solar cell after PID (cross section) with stacking fault V. Naumann et al. The role

 Phosphorous (P), Nitrogen (N), Oxygen (O) and Sodium (Na) mapping with EDX of stacking faults for the

Source (1: Naumann 2013) formation of shunts during

potential-induced

degradation of crystalline Si

solar cells, Phys. Status

Solidi RRL, 1-4 (2013).

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Introduction: PID-Characteristics
Overview
Yield Loss  PID
 Severe energy yield loss after 1 or 2 years is normally the first indication of PID
 Strong influence of the environment (temperature, coastal, humidity)
 Strong influence of the system design (circuitry, grounding)
 Power loss depends on the position of module in the string (Highest power loss at negative pole)
 Power loss is higher at low irradiance (Greater impact of low shunt resistance)
 Individual PV modules and PV cells are differently sensitive to PID
 Electroluminescence images show typical pattern (e.g. chessboard or black frame)
 PV Modules can be regenerated by counter-voltage or thermal treatment

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Introduction: PID-Characteristics
Power Degradation - Low Irradiance

Power degradation under low Irradiance is more pronounced.

Example: Aluminium Foil Test with -1000 V.

Red line: Initial measurement

Green line: Intermediate measurement after 90 h
Blue line: Final measurement after 230 h

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Introduction: PID-Characteristics
Typical cell pattern - Electroluminescence

 PV Module with PID sensitive cells

 Individual cells are differently sensitive to PID
 Example: typical pattern for Aluminium foil test (230 h duration, -1000V voltage)

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Introduction: When does PID occur?
Overview of different factors on different levels

Solar Cells:
Acceleration of PID Effect:
 Composition of AR-Coating (SiN) High system voltage (negative),
PV Module: High temperature (leakage current),
 Glass type (Electrical conductivity, AR-Coating) High humidity,
 Encapsulation (Electrical conductivity) Water condensation (Low tilt angle)
 Frame type / mounting
Regeneration of PID Effect:
PV System:
High irradiance (UV)
 Maximum voltage (String length, module voltage) High positive voltage
 Inverter topology (Grounding, Transformer(less)) High temperature
Environment:
 Temperature, Humidity, Irradiance, Aerosols, Dew, Rain, Light/UV
 MOST CRITICAL: Coastal area in hot & humid climate

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Introduction: When does PID occur?
Effect of Anti-Reflective Coating (Solar cell level)

AR coating is most critical part of the solar cell design

Composition of AR-Coating (SiN) - characteristics
 Refractive index
 Morphology (Equipment: e.g. direct plasma method)
 Si-Oxide layer between SiN and Si (Na diffusion barrier)

SiN-Layer is more durable to PID

If refractive index is high (or SiN-Layer is dense)

Inverse parallel resistance after PID-Test

S. Pingel et al. Potential Induced Degradation of versus refractive index of SiN Layer
Solar Cells and Panels, IEEE PVSC, Honolulu Comparison of 3 different equipments for SiN-Layering
2010, 2817-2822.
Source (2: Pingel 2010)

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Introduction: When does PID occur?
Effect of Encapsulant (PV Module level)

Encapsulant is most critical part of PV module design:

Main Parameter is low Na-ion permeability and consequently low electrical bulk conductance
Source (3: Koch 2012)
Different encapsulants with PID prone cells: 48 hours, Mini-modules, 85°C/85%/1000V

Material Power Loss

EVA -91%...-96% S. Koch et al. Encapsulation
Influence on the Potential Induced
PE -0,7…-3,7% Degradation of Crystalline Silicon
Cells with selective Emitter
Structures, Proc. 27th EU PVSEC
TPSE -12% 2012,1991-1995.

Ionomer -7,2%
PVB -58%
PDMS -95%

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Introduction: When does PID occur?
Effect of Weather and Climate (Environment Level)

Leakage current from ground/PV module frame to cell in the string

Maximum during raining or morning dew
Source (4: Hoffmann 2012)
Rainy and sunny day
600 VDC (M17), 450 VDC (M18)

Hoffmann 2012: S. Hoffmann, M. Koehl: Influence of Humidity and Temperature on the

Potential Induced Degradation, Proc. 27th EU PVSEC 2012, 3148-3151.

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Introduction: When does PID occur?
How to Avoid or to mitigate PID?

Interruption of failure chain 1. Solar Cell 2. PV Module 3. Mounting 4. PV System

1. Solar Cell:
 Compact SiN-Layer (e.g. n>2,2)
 Oxide layer between SiNx and Si (Na diffusion barrier)
2. PV Module:
 Glass type (e.g. hydrophobic coating, Na+ - diffusion barrier)
 Encapsulant (e.g. EVA/PVB replacement)
3. Mounting:
 Mounting (e.g. rubber clamps, rear side-rails instead of frame)
4. PV System:
 Negative pole grounding (feasible with inverter with transformer)
 Regeneration over night (Anti-PID Box with counter voltage)
 Special Inverter topology (e.g. transformerless inverter of Sunways)

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Laboratory Tests
PID - Test Standards

IEC TS 62804-1:2015
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon
IEC TS 62804-2 (NWP) – under discussion
Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation - Part 2: Thin-film

Under Discussion: New Edition of IEC 61215:2015

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation – MQT 21

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Laboratory Tests
PID - Test Standard IEC TS 62804-1:2015 - Two test methods

Climatic chamber PID test Aluminum foil PID test

With a pressing mat for
fixing the foil on the
module

Frame
Frame

Leakage Current Leakage Current

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Laboratory Tests
PID - Test Standard IEC TS 62804-1:2015 - Two test methods

Climatic chamber Al-Foil Test

Test facility Climatic Chamber Temperature-controlled Lab
room
Test conditions 60°C, 85% RH 25°C, 50% RH
Or 85°C, 85% RH
Contact Frame-grounding Aluminium Foil grounding
Pressing by Mat (30 Pa)
Test duration 24h (soaking time) + 96h (4 168h (7 days)
days)
 Two modules at maximum system voltage (+1000V and -1000V)
 No pass/fail criteria is defined in the standard IEC TS 62804-1:2015, it will be necessary for future edition of IEC
61215 with integrated PID test.
 Often used pass/fail criteria: 5% power loss at 85°C, 85% RH (96h), No PID-typical EL pattern

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Laboratory Tests
PID - Test Standard IEC TS 62804-1:2015

Both test methods lead to power degradation for PID sensitive modules, but the pattern of PID affected cells is different.
This can be easily visualized by EL analysis, where cells with low shunt resistance appear darker.
Climatic chamber Al-foil Test
Mainly cells close to the frame are affected PID affected cells are randomly distributed over the module
(chess board or patchwork pattern)

Simulates location with dry climate Simulates location with rain and dew
Problem: grounding without frame Better statistics, reproducibility

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Laboratory Tests
PID - Test Standard IEC TS 62804-1:2015- Two Test Methods

Leakage current is an indicator of PID  suited to evaluate reproducibility

Climatic chamber Al-foil Test

 Highly dependent on humidity and  Nearly time constant
condensation on the front glass  Barely dependent on temperature
 Dependent on the test duration

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Laboratory Tests
Electroluminescence imaging (test current and exposure time)

PID prone cells can be detected in an early PID stage by EL imaging performed with low current injection (0.1 x nominal ISC)

 EL record @ 1 A reverse current  EL record @ 10 A reverse current

 10 min exposure time  1 min exposure time

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Laboratory Tests
Rshunt determination by complete shading of one cell
 Three single 20 cell strings with mono-c-Si cells
 Shunt resistance corresponds to grey value of strongly degraded cells in the electroluminescence image

 Before PID- Test  Before and after PID-Test (Rshunt = ΔI / ΔV)

Unshaded strings Unshaded strings

Strongly degraded Cells

Shaded strings

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PID-Detection in the Field
IR-Imaging of PV – Modules – Test set up in natural sunlight

 Simulation of PV module operating near MPP by use of sliding resistor (approx. 4Ω)

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PID-Detection in the Field
IR-Imaging of PV – Modules – Test set up in natural sunlight
 Different operating conditions – Best for PID detection at Maximum Power Point
Short circuit Maximum Power Open circuit
0 V, 7.3A 22 V, 6.6 A 0A

EL Image with PID

pattern

Isc variation of cells PID pattern (see EL image) Serial resistance, mounting, edge insulation

 Problems: 1. IR emissivity angle dependency (Bottom seems to be warmer), 2. Reflections (Sun, clouds, …)

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PID-Detection in the Field
Maximum Power of PV – Modules
Power Loss caused by PID is a function of the position in the string
 PV system with a inverter with floating potential (no transformer)
 Negative potential of modules relative to earth (module in the string 1 to 12)

V- V+

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PID-Detection in the Field
Maximum Power of PV – Modules (IV-curve parameters)

 Power loss caused by PID as a function of the module position in the string.
 Performance loss: (0. Rshunt) 1. Pmax, 2. Vpmax, 3. FF, 4. Voc, 4. Ipmax, 5. Isc (in accordance with lab results)

V-
V+

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PID-Detection in the Field
Maximum power of PV – Modules (String monitoring)

In the field, mostly data from inverter and string monitoring is available
 Test Method: Efficiency as a function of irradiance in time periods of 1 year (same date)
 Example: Efficiency loss in three years 13,8% =>12,2%

Caution:
 Higher loss of efficiency at low irradiance was expected
 Power loss can also be caused by soiling

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PID-Detection in the Field
Electroluminescence Imaging (EL)

PID-affected cells appear darker during current injection in the

dark (Lower cell voltage due to shunting)
Source (2: Pingel 2010)

Typical PID patterns:

 Half of the string, which is close to the positive PV+ pole,
shows no PID
 Patchwork of PID affected modules is caused by variable
operating conditions (Cell quality, high condensation, rain)
 Bottom row of cells is heavily affected (Collection of
condensation/dew)
 Stripes of affected cells indicate use of two cell boxes with Pingel 2010: S. Pingel et al. Potential Induced Degradation of Solar Cells and Panels,
differently PID prone cells (Stringers with two cell- feeder in
IEEE PVSC, Honolulu 2010, 2817-2822.
production line)

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PID-Detection in the Field
Infrared Imaging

PID-affected cells are hotter during operation due to lower efficiency - Source (5: Weinreich, 2016)
B. Weinreich: Fehlerbewertung
an Modulen im Feld mittels
Thermographie, 13.
Modulworkshop Cologne 2016

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PID-Detection in the Field
Comparison IR and EL imaging in the Field

Infrared Electroluminescence
During Day During Night
Environment - Good weather - During night
necessary
- Cloud and sun
reflections
Resolution - View Angle dependency + Higher Resolution
Power Supply ++ During normal - For strings 3kW, 1000 V
operation, no power supply power supply is
is necessary necessary to inject
reverse current
- Opening of connectors
With Drones ++ Huge Field possible - Several strings

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Regeneration of PID
Regeneration in the Lab – Saturation of regeneration was observed

Regeneration by counter voltage (+1000V) (can be done during the night in the field)

Regeneration by thermal treatment at 85°C and 85% RH (not practical in the field)

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Regeneration of PID
Regeneration in the Field

Regeneration by counter voltage during the night by PVO-Box of SMA

 Relative power over position in the string
 String Ribbon Solar–Modules 2008 (initial, after 4, 9, 18 months)

Power
Power

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Regeneration of PID
Regeneration in the Field

Relative regeneration of PID-Modules over 1 year

 By PVO-Box or negative pole functional grounding – Source (6: Stalder 2013).
 Low Ohmic grounding can only be made with inverters having transformer
 Full regeneration can take years
Relative Power
regeneration

M. Stalder: Was tun bei PID?, 28th

Symp. Bad Staffelstein 2013, C4.

Functional Grounding

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Regeneration of PID
Regeneration in the field - Parallel connected Anti PID-Box

e.g. PADCON Float Controller CI30

 Arrays with up to 2,5 MW interconnected
 Parallel interconnection (as SMA PVO-Box): Problems with inverter possible
 During nighttime it applies voltage of up to +915V to the positive pole with maximum 30/70 mA
regeneration current.
 2016 Costs for 1MW approx. 2000€

Solar Generator DC combiner box Inverter

Anti PID box

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Regeneration of PID
Regeneration in the field - Serial connected Anti PID-Box

e.g. ilumen PIDbox V350 for Central Inverter One or two DC input for arrays with serial connection of PV
modules.
 During nighttime it applies up to +1000V to the positive pole with max. 20 mA regeneration current.
 Maximum PV Current 350A: 350A*800V = 0.28 MW (Combiner Box)
 2016 Costs approx. 4000€
- Expensive, because up to 350A are to be switched and passed
+ Inverter is disconnected, when box works => no admission from inverter manufacturer

Solar Generator DC combiner box Anti PID box Inverter

Solar Generator DC combiner box Anti PID box Inverter

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Regeneration of PID
Regeneration in the Field - High Ohmic Functional Grounding

e.g. Siemens SINVERT High Ohmic (e.g. 22 kOhm) Minus pole grounding of Central Inverter
 Measurement of current from minus pole to ground
 Fuse switch disconnector

Solar Generator DC combiner box Inverter

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Regeneration of PID
Regeneration in the field - Overview

The choice of the method strongly depends of the PV-System (e.g. Inverter)

Parallel connected Serial connected High Ohmic Grounding

e.g. Padcon e.g. Ilumen e.g. Sinvert

+ cheaper than serial + inverter independent + Possible for some central

connected since inverter is inverters
disconnected ++ cheapest solution
+ Regeneration during night + Regeneration during night = Mainly avoidance of new
PID for PV modules which
are close to negative pole

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Summary
Take Home Messages

 PID is degradation mechanism of cells and can lead to high yield loss of PV plants
 Affected cells/modules can be identified by IR and EL imaging
 Approaches for PID avoiding can be implemented on cell, PV module and systems level
 Standard test IEC TS 62804-1 does not have a ‘Pass-Fail’ criteria.
 An integration to IEC 61215-1(new edition) as MQT21 is under development
 New approach combined Field and Chamber testing (Monitor leakage current transfer)
 Different opportunities for regeneration in the field exist:
 Regeneration during night by applying high positive voltage (Anti PID-box serial or parallel connection)
 Negative pole functional GROUNDING
 Exchange of affected modules or change of module positions in the string
 NOW: PID test becomes more and more a quality test (No fails in our lab with production year 2014 or newer)
 Main research work is now the simulation of power degradation under different environmental conditions (calculation
of leakage currents and regeneration processes)
 PID can occur again: New market locations, cell types and manufacturing processes, higher system voltages and the
degradation process can be slower and more difficult to detect
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Potential-Induced
Degradation (PID)
TÜV Rheinland Webinar
Thank you for your attention
Please pose your questions
 Questions and Answers
Which Services are offered by TÜV Rheinland?
All Solar Laboratories of TÜV Rheinland (Cologne, Shanghai, Tempe, Bangaluru) offer
 PID degradation tests and certification after TÜV Rheinland standard (2 PfG 2387/01.18) with measurement of leakage
currents (Power measurement and electroluminescence imaging) according to IEC 62804-1 (c-Si) and -2 (thin film) –
climatic chamber and Al foil test (not outdoor field simulation as proposed for thin film)
 Field inspection with infrared imaging, IV-curve measurements and electroluminescence imaging of strings during night
 Data analysis of monitoring data
Comprehensive services for the solar Industry, PV power plant owners, insurers and investors
 PV Modules
 Balance of Systems (BOS) Components
 Energy Storage Systems
 Solar Thermal Technology
 PV Power Plants: Yield assessment, Technical Due Diligence, Technical Advisory, Inspections, Risk Assessment, Failure
Analytics, Supply Chain, Services Performance Optimization, Quality Assurance, Warranty Inspections etc.
FOR MORE INFORMATION: www.tuv.com/SolarEnergy

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Questions and Answers
Which were the main events of PID in chronological order?

Year Company Topic

2005 Sunpower Polarisation degradation effects of back-contact solar cells. Action: hard grounding.

01/2008 Evergreen Degradation by polarisation of string ribbon cells is reported. Published root cause:
Contamination in one production line. Action: hard grounding.
08/2008 SMA; Evergreen SMA and Evergreen jointly develop an anti-PID box, which regenerates degraded modules
during the night.
06/2010 Solon Potential induced degradation of common c-Si cells is reported at the 35th IEEE PVSC in
Honolulu.
09/2011 Several German laboratories PID test of several module types with aluminium foil.
and manufacturers
01/2012 IEC Initiation of a draft Standard (IEC 82/685/NP, IEC 62804) about PID.

12/2012 Fraunhofer CSP Microscopic explanation of PID suggesting Na ions along stacking faults are short-circuiting p-
n junction.
09/2014 Schott Solar PID avoided on the cell level by additional oxide layer under antireflective coating (by UV-light
or thermal oxidizing
08/2015 IEC Publication of IEC TS 62804-1 about PID without pass/fail criteria.

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Questions and Answers
Other types of PID – Other types of PV modules

N-type crystalline Silicon cells are mainly used for high-efficiency cells:
 E.g.: Sunpower IBC: Polarization by negative charges on the cell surface,
Solution: Positive pole grounding
 E.g. HIT-cells with a-Si layers, PID not observed by TÜV Rheinland
Thin film modules
 Superstrate modules: Front glass with direct TCO-layer
E.g.: CdTe or a-Si
Sodium from the glass can irreversibly corrode the TCO-Layer
Solution: Negative pole grounding
 Substrate modules
E.g.: CIGS
Possibly Reversible PID by negative voltage,
Possibly Irreversible PID: Sodium through encapsulation to TCO-Layer
Solution: Negative pole grounding

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