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Amkor offers a world class full turn-key solution for outsourcing your assembly and test value chain activities. This
enables our customers to focus on their internal core competencies while reducing costs and improving performance which
is critical to achieving strategic and financial business success.
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Rev Date: 04’09
www.amkor.com
service TEST
Amkor offers an extensive portfolio for wafer probe as part of our full turn-key services for outsourcing your value
add activities. Our ability to offer a one-stop-shop simplifies your manufacturing processes and reduces supply
chain management activities.
• High volume production test for 300mm, 200mm and 150mm wafers
• Full temperature range (-55 °C to +150 °C)
• Thin wafer handling capabilities (<150μm)
• RF probe capabalities
• DPS (Die processing services)
• Clean room environment
• Multi-site probe
• Probe card repair capabilities
• Bake retention
• Bumped wafer probe
• Electronic Assembly Support:
• Die attach wafer mapping (ALPS)
• Edge dies exclusion
• Wafer map template generation
• Inkless probe
• Probe wafer mapping
Amkor Test Development Centers provide complete engineering services from program development, full product
characterization to production ramp. Amkor has an extensive team of highly skilled test engineers with experi-
ence in mixed-signal, memory, high-end digital, power management and RF. Reliability and prototype production
testing are also supported in these development centers. Amkor also offers expertise in defining test strategies for
lowest overall cost and can assist in development of test specifications.
• Project management process(s)
• Rapid first article development
• Advanced wafer probe
• Low cost RF probe
• Hardware (contactor, load board, probe card, handler kits)
• Robust contacting solutions aligned with Amkor's bump and package roadmap
• Novel test solution for low cost, bottom PoP (Package-on-Package)
• SiP module test strategies (including in-line test)
• Automation of system level test solutions
• Program conversion
• Multi-site test
• Strip test for punch and saw devices (low mix/high volume)