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11352 J. Phys. Chem.

B 2006, 110, 11352-11360

Photoelectrochemical Decomposition of Water into H2 and O2 on Porous BiVO4 Thin-Film


Electrodes under Visible Light and Significant Effect of Ag Ion Treatment

Kazuhiro Sayama,*,† Atsushi Nomura,‡ Takeo Arai,† Tsuyoshi Sugita,‡ Ryu Abe,†
Masatoshi Yanagida,† Takashi Oi,§ Yasukazu Iwasaki,§ Yoshimoto Abe,‡ and Hideki Sugihara†
Energy Technology Research Institute, National Institute of AdVanced Industrial Science and Technology
(AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan, Faculty of Science and Technology,
Science UniVersity of Tokyo, Yamazaki 2641, Noda, Chiba 278-8514, Japan, and Nissan Research Center,
Nissan Motor Co., Ltd., 1 Natsushima, Yokosuka, Kanagawa 237-8523, Japan
ReceiVed: December 28, 2005; In Final Form: April 1, 2006

The photoelectrochemical properties of porous BiVO4 thin-film electrodes on conducting glass for H2 production
from water under visible light were investigated. BiVO4 films were prepared by the metal-organic
decomposition method, and particles were 90-150 nm in diameter. Under visible-light irradiation, H2 and O2
evolved in a stoichiometric ratio (H2/O2 ) 2) from an aqueous solution of Na2SO4 with an external bias. The
photocurrent increased with addition of methanol. The band structure of BiVO4 was investigated by open-
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circuit potential, flat-band potential, X-ray photoelectron spectroscopy, and calculations based on density
functional theory. The top of the valence-band potential of BiVO4 was shifted negatively compared to the
potentials of the conventional oxide semiconductors without Bi. We surmise that hybridization between the
O-2p and Bi-6s orbitals might contribute to the negative shift of the BiVO4 valence band. Treatment with an
from https://pubs.acs.org/doi/10.1021/jp057539+.

aqueous solution of AgNO3 improved the photocurrent of the BiVO4 electrode significantly. The maximum
incident photon-to-current conversion efficiency at 420 nm was 44%. This value was the highest among
mixed-oxide semiconductor electrodes under visible light irradiation. AgNO3 treatment also improved the
stability of the photocurrent. The Ag+ ion in/on the BiVO4 catalyzed the intrinsic photogeneration of oxygen
with the holes.

1. Introduction the conducting glass and then firing it. Moreover, relatively high
Since the publication of the Honda-Fujishima effect on TiO2 IPCEs (ca. 25%) were also reported for porous Fe2O3 thin-film
electrodes under UV light,1 photoelectrochemical water splitting electrodes on conducting glass prepared by spraying the glass
with semiconductor photoelectrodes has been regarded as an with a solution containing iron salts.10,15,16 It is worth mentioning
ideal means of converting solar energy directly into clean fuel, that high IPCEs were obtained with this simple wet process,
namely, hydrogen energy.2-22 The energy density of solar light although many defects in the porous film electrodes may have
is relatively low; therefore, many featuresssuch as high energy- been present.
conversion efficiency, high stability, low-cost production, and To effectively absorb visible light from solar light, utilization
simple structure for large-area utilizationsare required for of semiconductors having a narrower band gap is essential. In
semiconductor photoelectrodes. To increase the solar energy studies of multijunction hybrid photoelectrodes, which were
conversion efficiency, effective utilization of visible light over designed to decompose water directly with no external bias,20-22
a wide wavelength region is indispensable. It should be noted development of effective oxide semiconductors for O2 evolution
that oxide semiconductors have many advantages, for example, has been important. However, oxide semiconductor materials
they are generally stable, are suitable for O2 evolution, and are that have efficient O2 evolution ability and a band gap that is
produced easily compared to non-oxide semiconductors. How- narrower than that of WO3 are limited. Some porous thin-film
ever, the efficiencies of various oxide semiconductor electrodes electrodes of various oxide semiconductorsssuch as metal-ion-
with conventional types, such as single crystal or sintered pellet, doped oxides and mixed oxides on conducting glassshave been
are low in the visible-light region, even when a high external investigated;7-10,13-17 however, their IPCEs are not satisfactory.
bias was applied. We have studied new oxide semiconductors for their water-
It was recently reported that a nanocrystalline WO3 thin film
splitting ability under visible light. In the field of photocatalysis,
on a conducting glass electrode showed an excellent incident
BiVO4 semiconductor powder was reported to show high O2
photon-to-current conversion efficiency (IPCE > 75%) for water
evolution when Ag+ or Fe3+ ions were used as electron
decomposition under visible light.5,6 The nanocrystalline WO3
acceptors under visible light, but this semiconductor had no H2
film was prepared by spreading a colloidal solution of WO3 on
evolution ability.19,23,24 The band gap of BiVO4 (2.4 eV) was
* Address correspondence to this author. Phone: +81-(0)298-61-6234. smaller than that of WO3 (2.7 eV). It is speculated that the top
Fax: +81-(0)298-61-4760. E-mail: k.sayama@aist.go.jp. of the valence band consists of Bi-6s and O-2p orbitals;23
† National Institute of Advanced Industrial Science and Technology
therefore, such physical properties as mobility of charge and
(AIST).
‡ Science University of Tokyo. band potentials of BiVO4 are probably different from those of
§ Nissan Motor Co., Ltd. simple oxide semiconductors. In an earlier work, we reported
10.1021/jp057539+ CCC: $33.50 © 2006 American Chemical Society
Published on Web 05/19/2006
Photoelectrochemical Decomposition of Water J. Phys. Chem. B, Vol. 110, No. 23, 2006 11353

briefly that a nanocrystalline BiVO4 film electrode on conduct- 1240 × photocurrent density [µA/cm2]
ing glass showed an excellent IPCE for the decomposition of IPCE ) (2)
water.12 wavelength [nm] × photon flux [W/m2]
In this study, the physical and photoelectrochemical properties The monochromatic photon flux through the band-pass filter
of BiVO4 films, the effect of sacrificial reagent addition, and (Nihon Shinku Kogaku Co.) was measured by an optical
the band structure of BiVO4 were investigated in detail. photodiode power meter (Advantest Co., TQ8210), and it was
Moreover, surface modifications of the semiconductor photo- corrected for the reflection loss at the Pyrex glass cell and the
electrodes,18,25 as well as semiconductor photocatalysts, were FTO glass. The electrodes were characterized by X-ray diffrac-
important for improving efficiency and stability. We report tometry (XRD, Mac Science, MX-Labo), using Cu KR radiation
herein that surface modification of a BiVO4 electrode by at 40 mA, 40 kV, and by Raman spectroscopy (Jasco, NRS-
treatment with an aqueous solution of AgNO3 substantially 1000, 532 nm). Scanning electron microscopy (SEM) was
improved both efficiency and stability under visible-light performed on a Hitachi S-800 instrument. The composition of
irradiation. the semiconductors was measured with an X-ray fluorescence
analyzer (XRF, Rigaku Co., ZSX-mini, 40 kV, 1.2 mA). In the
2. Experimental Section case of X-ray photoelectron spectroscopy (XPS) (Ulvac-Phi,
XPS-1800), an Al anode with a monochromator was used to
2.1. Preparation of BiVO4 Electrode. The BiVO4 films were significantly reduce the background signal. To completely
prepared by a modified metal-organic decomposition (MOD) prevent the charge-up effect, many techniques were used. Both
method.12,26 Bi(NO3)3‚5H2O (Kanto Chemical Co.) in acetic acid a low-energy electron (<2 eV) and a low-energy Ar+ ion (<10
(0.2 mol/L) and vanadium(IV) (oxy)acetylacetonate (Azmax eV) were emitted to neutralize the charges at the same time to
Co.) in acetylacetone (0.03 mol/L) were mixed with a 1:1 the BiVO4/FTO electrode, which was grounded to the sample
stoichiometric ratio of Bi to V. The solution was coated by holder by a Cu wire. The measurement area was relatively large
means of a spin coater (Mikasa Co., 1H-D7, 1000 rpm, 10 s) (2.0-0.8 mm2). The binding energy was referenced to the C-1s
on a conducting glass (FTO glass, Nippon Sheet Glass Co., peak taken at 284.8 eV or the O-1s peak at 531.0 eV. The band
F-doped SnO2, 10 Ω/sq) and fired at 500 °C in air for 30 min. structure and the partial density of states of BiVO4 were
The spin coatings and the calcinations were repeated 6 times. calculated based on density functional theory (DFT), using
The average thickness of the rough film, as measured by a step CASTEP package software (Accelrys Co.). The generalized
meter (Tencor, Alpha step), was ca. 0.5 µm for 6 layers. gradient approximation (GGA-PBE) was applied.
In the case of the surface modifications, the BiVO4/FTO Measurement of H2 and O2 evolution was performed in a
electrode was immersed in various aqueous solutions (0.01 mol/ Pyrex glass cell connected to a closed gas-circulating system.
L) in the dark for 12 h and was then thoroughly washed with The BiVO4/FTO electrode was connected with Cu wire by
distilled water. indium solder, and the connecting part was covered with an
2.2. Photoelectrochemical Measurement and Character- epoxy resin. The light source was a Xe lamp (300 W, Cermax
ization. The photoelectrochemical and capacitance measure- lamp), and the BiVO4 electrode area was ca. 2 cm2. A Pt wire
ments were conducted with a potentiostat (BAS, 612A) and a was used as the counter electrode, and a reference electrode
Pyrex glass cell. A Pt wire and a Ag/AgCl electrode (0.21 V vs was not used. The electrode wires were connected tightly to
NHE, pH 0) were used as the counter and reference electrodes, the Pyrex glass cell with silicone rubber to prevent any air
respectively. For stability testing (the photocurrent-time mea- leakage. An aqueous solution of Na2SO4 (0.5 mol/L, 80 mL)
surement), the photocurrent was measured by a two-electrode was introduced into the cell and was degassed completely, and
system without a reference electrode. An aqueous solution of then argon gas (100 Torr) was introduced into the system. The
0.5 mol/L of Na2SO4 (pH 5.8) was used most often as the cell was preirradiated for few hours to prevent contamination.
electrolyte solution because the stability of the BiVO4 film in Evolved H2 and O2 gases were detected by on-line gas
Na2SO4 (aq sol) was good compared to that in other solutions. chromatography (Shimadzu Co., TCD, 5 Å molecular sieves,
It should be noted, however, that because the Na2SO4 solution argon carrier gas).
was unbuffered, the applied potential was probably overesti-
mated owing to the pH change around the electrode surface 3. Results and Discussion
during the photoreaction. The light source was a Xe lamp (500 3.1. Structure of BiVO4 Film and Photoelectrochemical
W, Ushio Denki Co.) with/without UV cutoff (HOYA, L-42) Properties. Figure 1 shows the SEM photographs of the BiVO4
or band-pass filters. The unfiltered light intensity was measured electrodes prepared by the MOD method. A porous structure
by a spectroradiometer (Yamashita Denso Co., YSR-1100M) was observed; therefore, the electrolyte solution will penetrate
between 350 and 500 nm, corresponding to the active wave- into the pores of the BiVO4 film. The BiVO4 particles were
length of BiVO4, to be 450 W/m2. The light intensity of AM- 90-150 nm in diameter. The BiVO4 electrodes prepared by the
1.5G (Japan Industrial Standard, JIS-C8911) between 350 and MOD method were strong mechanically, and the film was not
500 nm was 175 W/m2; therefore, the unfiltered Xe light removed by a hard scratch with a Teflon plate and a nail,
intensity was nearly equivalent to a condition of 2.6 Sun. The suggesting good adhesion properties of the film due to the strong
semiconductor electrodes were irradiated through the FTO connection between particles and between particles and the
conducting glass. The masked-off irradiated area was 0.28 cm2. conducting glass.
The light-harvesting efficiency (LHE) of the electrode was Three crystalline phases have been reported for synthetic
calculated from the transmittance (T) and reflectance (R) with BiVO4: the monoclinic sheelite type, the tetragonal sheelite
use of an integrating sphere (Jasco, V-570): type, and the tetragonal zircon type.23,24,27-29 The crystalline
phase depends on the synthetic method used for its preparation.
LHE ) 1 - R - T (1) The tetragonal and monoclinic phases have been reported to be
selectively obtained depending on the Bi/V stoichiometric ratio
The IPCE was then calculated from the following equation: in solution, with excess Bi(III) leading to the tetragonal zircon-
11354 J. Phys. Chem. B, Vol. 110, No. 23, 2006 Sayama et al.

observed at more than open-circuit potential (Vop ) -0.06 V)


under UV and visible light, and the photocurrent increased
steadily with applied positive potential. The absorption spectrum
of the BiVO4 film is shown in Figure 5. The threshold of the
absorption was ca. 500-520 nm, which is in accord with that
of the monoclinic BiVO4.23,24 The band gap was estimated at
ca. 2.4 eV. The dependence of the IPCE on the wavelength in
Na2SO4 (aq sol) is also shown (Figure 6a). The IPCE decreased
with longer wavelength, and the shape of the IPCE action
spectrum was similar to that of the absorption spectrum. But,
the edge of the IPCE spectrum seems to be blue-shifted
compared with that of the absorption spectrum. In the case of
the photon with low energy in the longer wavelength region,
the photon penetration depth is larger and the electron diffusion
length was longer. Therefore, it is considered that the probability
of the charge recombination during the long diffusion increased
and then the IPCE decreased around the light absorption edge.
In the case of the water splitting on the semiconductor
photoelectrodes without any sacrificial reagents in the electro-
lyte, measurement of O2 and H2 evolution is very important;
however, reports on gas measurement in the photoelectrochemi-
cal cell are very few. We investigated H2 and O2 evolution from
the BiVO4 cell using a closed gas-circulating system. Evolution
of H2 and O2 evolution at a stoichiometric ratio (H2/O2 ) 2)
was observed under visible-light irradiation (Figure 7). There
was no gas evolution in the dark under the same conditions.
The total amount of evolved gas was almost identical with that
Figure 1. SEM photograph of the surface of BiVO4 electrodes prepared calculated by the total passage of photoelectrons.
by the MOD method and calcined at 500 °C. The promotion effect of the photocurrent by the addition of
organic compounds was reported for various semiconductor
type phase.23,24 The tetragonal zircon-type phase changed
photoelectrodes.5,6,19,30 Investigation of the oxidation properties
irreversibly to the monoclinic sheelite-type at 397-497 °C.27-29
The monoclinic BiVO4 converted reversibly to the tetragonal of organic compounds on the BiVO4 electrode is meaningful
sheelite-type at >255 °C.29 Monoclinic sheelite-type BiVO4 has for degradation of harmful compounds and for H2 production,
been reported to show good photocatalytic activity for O2 using biomass under visible light. The photocurrent almost
evolution from AgNO3 aqueous solution compared to the doubled with the addition of methanol at a positive potential
tetragonal zircon-type and the tetragonal sheelite phases.23,24 above +0.5 V (Figure 4b). Similar behavior on the improvement
Figure 2a shows the XRD pattern of the BiVO4/FTO electrode of photocurrent was reported by Nakato et al., though the
prepared by the MOD method at 500 °C. All peaks (V) were photocurrent was very small.19 The open-circuit potential was
assigned as sheelite-type, and its main peak was at 29°, in shifted slightly from -0.06 to -0.13 V by addition of methanol.
addition to the FTO glass peaks (*). The difference between The photocurrent increased more than two times at low applied
the monoclinic and tetragonal sheelite phases can be judged by potential. It is suggested that the charge recombination was
the existence of a peak at 15° and splitting of peaks at 18.5° predominant at low applied potential without methanol and that
and 35°. The XRD peaks of the BiVO4 film on the conducting the charge recombination was suppressed by the methanol
glass were weak for distinguishing this difference because the addition owing to the hole-scavenging effect of methanol.5
film was very thin. The XRD pattern of BiVO4 powder prepared Figure 6b shows the IPCE spectra of the BiVO4 electrode with
by the calcination of the same MOD solution at 500 °C was and without methanol addition. The IPCE also nearly doubled
clearly assigned to the monoclinic sheelite-type (inset, Figure with methanol addition, suggesting the possibility of a current-
2b). The tetragonal sheelite BiVO4 heated at 500 °C changed doubling effect caused by electron injection from oxidized
to the monoclinic BiVO4 during the cooling process to room radical intermediates.5,30
temperature.29 Therefore, it is concluded that the BiVO4 film 3.2. Band Structure of BiVO4. It is speculated, from the
electrode was the monoclinic sheelite-type. The tetragonal results of photoemission and the redox potential of Bi5+/Bi3+,
zircon-type phase with its main peak at 24° and other phases, that the top of the valence band of BiVO4 may be formed by
Bi2O3 and V2O5, were not observed. Raman spectra of the both O-2p and Bi-6s orbitals and that the top of the Bi-6s orbital
BiVO4/FTO electrode (Figure 3a) and the BiVO4 powder may be more negative than that of O-2p.23,31 However, the band
prepared by solid-state methods as a reference sample of structure of BiVO4 has not yet been measured experimentally.
monoclinic sheelite-type BiVO4 (Figure 3b) were almost Herein we investigate the band structure of BiVO4 in detail using
equivalent. The peaks at 822, 365, 325, and 219 cm-1 were photoelectrochemical measurements, the band-structure calcula-
assigned to the symmetric stretch mode of V-O, the symmetric/ tion based on DFT, and the valence-band XPS measurement.
asymmetric deformation mode of VO43-, and the external mode Figure 8 shows the density of states (DOS) of the monoclinic
of the monoclinic BiVO4.26,29 sheelite-type BiVO4. The bottom of the conduction band of
Figure 4a shows the current-potential properties of the BiVO4 was formed mainly by the V-3d orbital, and the O-2p
BiVO4 film electrode, and the electrolyte was Na2SO4 aqueous orbital was also hybridized. The potential of the conduction band
solution without additives. The dark current was observed only edge (Ecb) is considered to be related to the open-circuit potential
above 1.3 V (vs Ag/AgCl). The anodic photocurrent was (Vop) under irradiation. The Vop of the BiVO4 electrode under
Photoelectrochemical Decomposition of Water J. Phys. Chem. B, Vol. 110, No. 23, 2006 11355

Figure 2. (a) XRD pattern of the BiVO4/FTO electrode prepared by the MOD method at 500 °C: (V) monoclinic sheelite-type BiVO4; (*) FTO
conducting glass. (b) XRD pattern of BiVO4 powder prepared by calcination of the same MOD solution at 500 °C.

Figure 5. Light-harvesting efficiency (LHE) spectrum of the BiVO4/


Figure 3. Raman spectra of (a) the BiVO4 film electrode prepared by FTO electrode.
the MOD method calcined at 500 °C and (b) the BiVO4 powder
prepared by solid-state methods as a reference sample of monoclinic
sheelite-type BiVO4.

Figure 6. Dependence of IPCE on the wavelength in Na2SO4 (aq


sol): (a) without additives and (b) with methanol (10 vol %). The
applied potential was +1.0 V versus Ag/AgCl.

observed. The shape of the XPS spectrum was similar to the


shape of the valence band of the total DOS in Figure 8,
suggesting that the result of the DFT calculation on the valence
Figure 4. Current-potential plots for the BiVO4 film electrode in band was qualitatively in accord with the XPS measurement.
various electrolyte solutions: (a) Na2SO4 aqueous solution without The peak at 12 eV in the XPS spectra of BiVO4 was assigned
additives and (b) with methanol (10 vol %). Unfiltered whole light mainly to the Bi-6s orbital, according to the DFT calculation
from a Xe lamp was used for irradiation. The pH was adjusted to 5.8. in Figure 8. The XPS measurement of various semiconductor/
FTO electrodes (Figure 9a-e) was conducted carefully with
unfiltered light irradiation was between -0.2 and -0.05 V (vs both electron and Ar+ ion neutralizer systems. The semiconduc-
Ag/AgCl). The Vop was influenced by light intensity. The Vop tor on the FTO conducting glass was very thin (<1 µm) to avoid
range of the BiVO4 electrode was similar to that of the the charge-up effect; at the same time, no Sn-3d5/2 signal from
nanocrystalline WO3 electrode when these photocurrents were the conducting glass was confirmed, suggesting no pinholes in
adjusted to the same level for our experimental results. If the the semiconductor film. The XPS spectra were proportionately
Ecb of BiVO4 and WO3 are equal, then the valence-band shifted with the bias to the sample holder within 0.05 eV.
potential edge (Evb) of BiVO4 is estimated to be more negative Therefore, it is concluded that the charge-up effect was
than that of WO3, because the band gap of BiVO4 (2.4 eV) is negligible under this experimental condition. The spectrum
smaller than that of WO3 (2.7 eV). thresholds of BiVO4 and Bi2O3 were always lower than those
Figure 9a shows the XPS spectrum of the BiVO4/FTO of WO3, TiO2, and V2O5 in both cases of the C-1s and the O-1s
electrode at around 0 eV binding energy. The main peak at 6 corrections of the binding energy: {WO3, TiO2, V2O5} > BiVO4
eV had shoulders on both sides, and another peak at 12 eV was > Bi2O3. Therefore, we believe that Bi-containing semiconduc-
11356 J. Phys. Chem. B, Vol. 110, No. 23, 2006 Sayama et al.

Figure 10. Mott-Schottky (1/C2 versus applied potential, where C is


the capacitance) plot of the BiVO4 electrode in the dark at 600 Hz.

Figure 7. Time course of H2 and O2 evolution under visible-light to the bottom of the Ecb and is considered to be located just
irradiation (>420 nm). The applied bias was 1.6 V to the Pt counter under the Ecb for n-type semiconductors. According to the small
electrode. band gap of BiVO4, the top of Evb of BiVO4 was calculated to
be more negative than those of TiO2 and WO3.
Absolute values of Ecb and Evb of semiconductors are very
important but are controversial in each method mentioned above.
The comparison method for Voc was simple; however, Voc was
sensitive to light intensity, electrolyte solution, and quality of
film preparation. In the case of XPS measurement, complete
neutralization for the charge-up effect and precise correction
of the binding energy are essential. The Efb from the Mott-
Schottky analysis was affected by the Helmholtz capacitance
for dielectric semiconductors.32 It is considered that the dielectric
property of BiVO4 might cause the upward deviation of the plots
below -0.5 V in Figure 10.32,33 However, it should be
emphasized that all results from these three methodss
comparison of Voc, XPS measurement, and Mott-Schottky
analysissindicated that the top of Evb of BiVO4 was shifted to
less positive potentials in comparison with the values for the
conventional semiconductors without Bi. The negative shift of
the valence band is beneficial because it decreases the band
Figure 8. Density of state (DOS) of monoclinic sheelite-type BiVO4
calculated by the DFT method. Note that the x axis is inverted compared gap of oxide semiconductors without the positive shift of the
to the Figure 9 XPS and that “zero energy” refers to the occupied level. conduction band, leading to the decrease of applied bias.
According to the DFT calculation in Figure 8, the Bi-6s orbital
was mainly located -10 eV apart from the valence band made
mainly of O-2p. However, we also found that the top of the
valence band contained a slight amount of the Bi-6s component
(O-2p, 97%; Bi-6s, 2%; V-3d, 1%) and the Bi-6s peak at -10
eV also contained an O-2p component (O-2p, 15%; Bi-6s, 84%;
V-3d, 1%), suggesting hybridization between the O-2p and Bi-
6s orbitals.34 This hybridization may have contributed to the
upper shift of the BiVO4 valence band. Similar behavior about
the shift of valence band was also suggested in the Bi-6s, the
Pb-6s, or Ag-4d hybrid orbitals of PbBi2Nb2O9 and (AgBi)0.5-
MO4 (M ) W and Mo).35,36 We suggest that the transfer of
holes on the valence band becomes easy with the formation of
a hybrid Bi-6s-O-2p orbital. We also investigated other MVO4
Figure 9. XPS spectra of various semiconductors on FTO conducting (M ) Y, In) electrodes; however, high efficiencies were not
glass. The binding energy was referenced to the C-1s at 284.8 eV: (a) obtained. These results suggest that the Bi orbital probably
BiVO4, (b) Bi2O3, (c) V2O5, (d) WO3, and (e) TiO2. played an important role in the high efficiency of the BiVO4
electrode.
tors easily discharged the electron and that the top of Evb of 3.3. Stability of the BiVO4 Electrode and the Ag Treat-
BiVO4 and Bi2O3 was shifted negatively toward those of ment Effect. Figure 11a shows the time course of the photo-
conventional Bi-free oxide semiconductors. current for the BiVO4 electrode. The photocurrent decreased
The flat-band potential (Efb) of semiconductor electrodes is gradually, but it remained constant at ca. 0.5 mA/cm2 for more
usually measured by Mott-Schottky analysis.10,17 Figure 10 than 10 h. The turnover number of observed photoelectrons to
shows the Mott-Schottky plot of the BiVO4 electrode. The Efb the BiVO4 unit was ca. 60 for 1 h. No change in the BiVO4
of the BiVO4 was -0.6 ( 0.1 V (vs Ag/AgCl). Values of Efb electrode after a 10-h photoreaction was observed in the XRD,
for the WO3 and TiO2 electrodes in the same electrolyte solution XRF, and UV-vis spectra, suggesting that the bulk of BiVO4
were ca. -0.6 and -0.8 V, respectively. Efb is strongly related was intrinsically stable for the photoelectrochemical reaction.
Photoelectrochemical Decomposition of Water J. Phys. Chem. B, Vol. 110, No. 23, 2006 11357

Figure 13. Dependence of IPCE on wavelength in Na2SO4 (aq sol):


(a) no AgNO3 treatment and (b) after AgNO3 treatment. The applied
potential was +1.0 V versus Ag/AgCl.

TABLE 1: Dependence of Treatment Time of AgNO3


Aqueous Solution on Photocurrent and Stabilitya
Figure 11. Time course of the photocurrent of BiVO4 electrodes: (a) initial
no AgNO3 treatment and (b) after AgNO3 treatment. The applied bias treatment photocurrent photocurrent after
was 1.2 V to the Pt counter electrode. treatment time (mA/cm2) 30 min (mA/cm2)
no treatment - 1.2 0.8
AgNO3 treatment 1 min 1.9 0.9
in the dark 1h 2.2 2.3
3h 2.1 2.2
12 h 2.0 2.1
AgNO3 treatment 1 min 2.1 1.3
with light
a
Two-electrode system; applied bias, 1.2 V; AgNO3 concentration,
0.01 mol/L.

reaction site. On the other hand, reports on surface modifications


of photoelectrodes are limited.14,15,17,18,25 Ohno et al. reported
an improvement in the IPCE of a TiO2 single-crystal photo-
electrode by adsorption of Fe3+ ion.25 We investigated surface
modifications of the BiVO4 electrode by aqueous solutions (0.01
mol/L, 12 h) containing various metal nitrates and chlorides,
such as AgNO3, Pd(NO3)2, Cr(NO3)3, Cu(NO3)2, Ni(NO3)2, Fe-
(NO3)3, RuCl3, RhCl3, H2PtCl6, and HAuCl4. Among them,
treatment with AgNO3 aqueous solution improved the photo-
current significantly. Figure 12 (upper panel) shows the
potential-current curve of BiVO4 without (a) and after (b) the
AgNO3 treatment. The photocurrent increased sharply with a
positive potential sweep in the case of the Ag-treated electrode.
The IPCE of the BiVO4 electrode in the visible-light region
nearly doubled with AgNO3 treatment (see Figure 13). The
maximum IPCE at 420 nm was 44%. This value was the second
highest to that of the nanocrystalline WO3 electrode among
oxide semiconductor electrodes under the visible-light region
and was highest among mixed-oxide semiconductor electrodes,
suggesting the great potential for porous thin-film electrodes
with use of various mixed-metal oxide semiconductors. The
photocurrent and stability were not improved by treatment with
Figure 12. Potential-current curve of the BiVO4 electrodes. The
applied bias was 1.2 V to the Pt counter electrode. Unfiltered whole HNO3 and many other nitrates, except AgNO3, suggesting that
light from a Xe lamp was used for irradiation. (Upper panel) In Na2- H+ and NO3- ions did not contribute to the promotion of
SO4 aqueous solution: (a) no AgNO3 treatment and (b) after AgNO3 photocurrent but that Ag+ ions did contribute to the promotion
treatment. (Lower panel) In Na2SO4 aqueous solution with methanol effect. The promotion effect was observed even at low
addition (10 vol %): (c) no AgNO3 treatment and (d) after AgNO3 concentrations of AgNO3 aqueous solution (1 mmol/L).
treatment. AgNO3 treatment improved not only the IPCE but also the
stability of the photocurrent (see Figure 11b), whereas the
The photocurrent was restored to 70% of the initial efficiency photocurrent without AgNO3 treatment decreased gradually with
by keeping it in the dark for 1 day or by cyclic voltammetry. It irradiation time (Figure 11a). The photocurrent with AgNO3
is speculated that slight changes, for example, in the valence treatment was maintained at around 4 mA/cm2. The turnover
state in BiVO4 or in the surface structure, may influence the number of total electrons per BiVO4 unit was found to be more
photocurrent stability. than 200 for 1 h. The Ag in the BiVO4 electrode was not
In the study of photocatalysts, surface modifications and detected by XRF measurement, suggesting that the total amount
loading of cocatalyst have often been investigated for the of Ag was less than the measurement’s limit of detection (<1
promotion of the charge separation and the formation of active wt % of BiVO4). If the Ag amount was 1 wt %, then the turnover
11358 J. Phys. Chem. B, Vol. 110, No. 23, 2006 Sayama et al.

TABLE 2: Measurement of Surface Condition by XPS


surface Ag amount binding energy (eV)a half peak width (eV)
(surface atom %) V/Bi ratio Ag3d5/2 Bi4f7/2 V2p3/2 Bi4f7/2 V2p3/2
no treatment 0 0.85 159.35 516.30 1.05 0.90
AgNO3 treatmentb 3.2 0.64 367.50 159.00 516.20 1.05 1.10
no treatment f 1 h photoreactionc 0 0.22 158.85 515.80 1.20 0.90
AgNO3 treatmentb f 1 h photoreactionc 0.4 0.09 367.65 158.95 515.95 1.20 1.00
AgNO3 treatmentb f 1 h photoreactionc f Ar+ etchingd 1.8 1.03 368.10 159.50 515.85 1.30 2.55
+157.50
a
Binding energy was corrected by C1s ()284.8 eV). b AgNO3 treatment conditions: 0.01 mol/L, 12 h in the dark. c Photoreaction conditions:
two-electrode system, 1.2 V applied bias for 1 h. d Argon ion etching at 3 kV for 2 min, 5 × 5 mm raster area.

number of total electrons per Ag unit was calculated at more


than 6500. Table 1 shows the dependence of treatment time
with an aqueous solution of AgNO3 on photocurrent and
stability. The photocurrent increased with only a 1-min treatment
with AgNO3 solution; however, the photocurrent decreased to
half its original value after a 30-min photoreaction. On the other
hand, a stable photocurrent was also observed with treatments
that were longer than 1 h. It is considered that the simply
adsorbed Ag+ ion on the BiVO4 surface desorbed easily and
quickly during the photoreaction and that some changesssuch
as strong interaction between Ag+ and the BiVO4 surfaces
might occur during a treatment time that was longer than 1 h.
The Ag0 metal could be photodeposited on the surface of the
BiVO4 electrode by short time (1 min) irradiation in AgNO3
aq sol without bias. The photoelectrochemical behavior of the
electrode covered with electrodeposited Ag0 was similar to that Figure 14. Speculated reaction mechanism of O2 evolution on the
with 1-min AgNO3 treatment in the dark, as shown in Table 1. BiVO4 electrode. The real BiVO4 layer was more porous and consisted
It was found that the metallic color of Ag0 was removed after of many particles, but it was simplified here. (i) Forward reaction with
the photoelectrochemical reaction in Na2SO4 aq sol under anodic water and holes to evolve O2 gas, (ii) backward reaction with O2 and
electrons.
bias.
Table 2 summarizes the results of XPS measurements on the
therefore it is reasonable to assume that Ag+ ion in/on the BiVO4
surface of the various BiVO4 electrodes. The surface atomic
probably remained in an oxidized state during photogeneration
ratio of V to Bi on the initial BiVO4 electrode without treatment
of oxygen by the hole in the valence band under anodic bias
(V/Bi ) 0.85) was smaller than the stoichiometric ratio, and it
during the photoreaction for O2 evolution. BiVO4 has ion-
decreased more after AgNO3 treatment for 12 h in the dark.
exchange ability because it can be synthesized by ion-exchange
After 1 h of photoreaction, the surface atomic ratio of V/Bi
from KV3O8 and Bi3+ ion.23 According to the ion radii, the Ag+
decreased significantly at both electrodes, both with and without
AgNO3 treatment. The bulk composition of the electrode was (1.15 Å) may be ion-exchanged at the Bi3+ (1.03 Å) site rather
almost ideal from the data of the V/Bi ratio after a short period than at the V5+ site (0.54 Å) in the BiVO4. The difference of
of Ar+ etching. The XRD pattern, the bulk ratios of V/Bi the charge was probably compensated by the valence change
measured by XRF, and the UV-vis spectrum of the BiVO4 of Bi3+ to Bi5+ partially around the Ag+.
electrodes with/without AgNO3 treatment were not changed after In both casesswith and without the AgNO3 treatmentsthe
1 h of photoreaction. It is also confirmed that the V2O5 electrode binding energy of Bi-4f7/2 and V-2p3/2 decreased and the half
dissolved, whereas the Bi2O3 electrode was stable in Na2SO4 peak width of Bi-4f7/2 was broadened after the photoreaction,
during the photoreaction, and that the photocurrents of these suggesting some changes of surface valence state during the
electrodes were small compared to the photocurrent of the photoreaction for both cases. Thus the effect of the AgNO3
BiVO4 electrode. It is concluded that only the surface V atoms treatment could not be explained directly by this change of
dissolved from the BiVO4 surface during the photoreaction and surface valence state and the change of surface V/Bi ratio
that the BiVO4 was covered with a thin Bi-rich layer. This thin measured by XPS.
Bi-rich layer may help prevent further erosion of BiVO4. In the case of the BiVO4 photocatalyst, high O2 evolution
The amount of surface Ag decreased after the photoreaction activity was observed with Ag+ ion as an electron acceptor,23,24
because of desorption from the surface with dissolution of and the degradation activity of alkylphenols was improved by
surface V. However, the intensity of XPS of surface Ag the loading of oxidized Ag particles (AgOx) as cocatalysts.35
increased after the short period of Ar+ etching. It is suggested We investigated AgNO3 treatment for other porous semiconduc-
that a silver atom penetrated the BiVO4, as in an ion-exchange tor electrodes, such as TiO2 and WO3; however, no positive
reaction. The valence state of Ag in/on the BiVO4 after the effects on the photocurrent and stability were observed. These
photoreaction was not clear from the XPS measurement because results suggested a unique interaction between BiVO4 and Ag.
the chemical shift of Ag-3d was small and the intensity of the It is speculated that the Ag+ ion-exchange layer formed on the
Auger spectra of Ag-3d4d4d was too weak to determine the semiconductor surface played an important role for the BiVO4
Ag valence. The redox potential of Ag+/Ag0 (+0.80 V vs NHE, electrode (Figure 14).To investigate the mechanism of AgNO3
pH 0) is more negative than that of O2/H2O (+1.23 V). The treatment, the cathode currents by the reduction of O2 gas (the
photodeposited Ag0 with metallic color on the BiVO4 electrode backward reaction of O2 formation) on the BiVO4 electrodes
was removed during the photoreaction under anodic bias; with and without treatment were measured. The cathode current
Photoelectrochemical Decomposition of Water J. Phys. Chem. B, Vol. 110, No. 23, 2006 11359

The BiVO4 particles in the porous electrode were 90-150


nm in diameter. The crystalline phase of the BiVO4 film was
monoclinic sheelite-type. The band gap was estimated at ca.
2.4 eV. Evolution of H2 and O2 at the stoichiometric ratio (H2/
O2 ) 2) was observed under visible-light irradiation. The
photocurrent increased with addition of methanol.
The band structure of BiVO4 was also investigated in detail.
All results indicated that the top of Evb of BiVO4 was shifted
negatively compared to those of the conventional semiconduc-
tors without Bi. The hybridization between the O-2p and Bi-6s
orbitals might have contributed to the negative shift of the
BiVO4 valence band.
Treatment with a AgNO3 aqueous solution significantly
improved the photocurrent of the BiVO4 electrode. The maxi-
mum IPCE at 420 nm was 44%. This value was just below that
of the nanocrystalline WO3 electrode when compared with other
Figure 15. Cathodic current of the BiVO4 electrode in the dark: (a) oxide semiconductor electrodes under the visible-light irradiation
N2 purge and no AgNO3 treatment; (b) N2 purge and AgNO3 treatment; and the highest among mixed-oxide semiconductor electrodes,
(c) O2 purge and no AgNO3 treatment; and (d) O2 purge and AgNO3
suggesting great future potential of porous thin-film electrodes
treatment.
with various mixed-metal oxide semiconductors. The AgNO3
of O2 reduction on BiVO4 was not decreased by Ag treatment, treatment improved not only the IPCE but also the stability of
as shown in Figure 15. Therefore, it is considered the inhibition the photocurrent.
of the backward reaction, which is O2 reduction with an electron
in the BiVO4 conduction band (process i in Figure 14), was Acknowledgment. This study was partially supported by
not the main consequence of the Ag treatment. the Industrial Technology Research Grant Program (04A20507c)
In a report on a Ag-loaded BiVO4 photocatalyst, partially from NEDO of Japan.
oxidized silver (AgOx) on the BiVO4 was considered to
contribute to the acceleration of charge separation and increase References and Notes
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