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Chapter 4:
Imperfections in Solids
ISSUES TO ADDRESS...
• What are the solidification mechanisms?
Chapter 4 - 1
Imperfections in Solids
Chapter 4 - 2
Polycrystalline Materials
Grain Boundaries
• regions between ______
• transition from ______ of
one region to that of the
other
• slightly __________
• low density in grain
boundaries
– high _________
– high _________
– high chemical reactivity
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Solidification
Grains can be - __________ (roughly same size in all directions)
- __________ (elongated grains)
~ 8 cm
_____
_____
Shell of
Columnar in _______ grains
area with less due to rapid
undercooling cooling (greater
Adapted from Fig. 5.17, ΔT) near wall
Callister & Rethwisch 3e.
Imperfections in Solids
There is no such thing as a perfect crystal.
• What are these imperfections?
• Why are they important?
Chapter 4 - 5
Types of Imperfections
• Vacancy atoms
• Interstitial atoms _______ defects
• Substitutional atoms
Chapter 4 - 6
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__________
distortion
of planes
• Self-_____________:
-"extra" atoms positioned between _______ sites.
self-
interstitial
distortion
of planes
Chapter 4 - 7
Equilibrium Concentration:
Point Defects
• Equilibrium ______________ varies with temperature!
Nv -
Q
No. of potential =
exp
v
defect sites N
kT
______________
Boltzmann's constant
-23
(1.38 x 10 J/atom-K)
-5
(8.62 x 10 eV/atom-K)
Each _______ site
is a potential
vacancy site
Chapter 4 - 8
Nv Nv _______
ln
N N
-Qv /k
__________
dependence!
T
1/ T
defect _______________
Chapter 4 - 9
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Chapter 4 - 11
OR
Chapter 4 - 12
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Chapter 4 - 13
Chapter 4 - 14
Impurities in Solids
• Specification of composition
m1
– weight percent C1 = x 100
m1 + m2
m1 = mass of component 1
n m1
– atom percent C1' = x 100
n m1 + n m 2
Chapter 4 - 15
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Line Defects
Dislocations:
• are line defects,
• slip between crystal planes result when ___________ move,
• produce permanent (plastic) ________________.
slip steps
Chapter 4 - 16
Imperfections in Solids
Linear Defects (__________________)
– Are one-dimensional defects around which atoms are
misaligned
• Edge ____________:
– extra half-plane of atoms inserted in a crystal ___________
– b perpendicular (⊥) to dislocation line
• Screw dislocation:
– _______________ ramp resulting from shear deformation
– b parallel (||) to dislocation line
Burger’s vector, b: measure of _____________ distortion
Chapter 4 - 17
Imperfections in Solids
Edge Dislocation
Chapter 4 - 18
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Imperfections in Solids
Screw Dislocation
Screw Dislocation
b
Dislocation
line
Burgers vector b (b)
(a)
Adapted from Fig. 4.4, Callister & Rethwisch 8e.
Chapter 4 - 20
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Edge
Chapter 4 - 22
Imperfections in Solids
Dislocations are visible in electron micrographs
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• Stacking faults
– For FCC metals an error in ABCABC packing sequence
– Ex: ABCABABC
Chapter 4 - 25
• __________ on catalysts
are normally surface
defects
Single crystals of
(Ce0.5Zr0.5)O2
used in an automotive
catalytic converter
Fig. 4.11, Callister & Rethwisch 8e.
Chapter 4 - 26
Microscopic Examination
Chapter 4 - 27
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Optical Microscopy
• Useful up to _______ magnification.
• _________ removes surface features (e.g., scratches)
• Etching changes ____________, depending on crystal
orientation.
crystallographic planes
Adapted from Fig. 4.13(b) and (c), Callister
& Rethwisch 8e. (Fig. 4.13(c) is courtesy
of J.E. Burke, General Electric Co.)
Micrograph of
brass (a Cu-Zn alloy)
0.75mm
Chapter 4 - 28
Optical Microscopy
Grain boundaries...
• are ______________,
• are more susceptible
to etching,
• may be revealed as polished surface
dark lines,
• change in _________ _______________
orientation across _______________
(a)
boundary. Adapted from Fig. 4.14(a)
and (b), Callister &
ASTM grain Rethwisch 8e.
(Fig. 4.14(b) is courtesy
size number of L.C. Smith and C. Brady,
the National Bureau of
at 100x (b)
magnification Chapter 4 - 29
Optical Microscopy
• Polarized light
– metallographic scopes often use polarized
light to increase contrast
– Also used for transparent samples such as
polymers
Chapter 4 - 30
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Microscopy
Optical ___________ ca. 10-7 m = 0.1 µm = 100 nm
For higher resolution need higher _________
– X-Rays? Difficult to focus.
– Electrons
• wavelengths ca. 3 pm (0.003 nm)
– (Magnification - 1,000,000X)
• __________ resolution possible
• Electron beam focused by __________ lenses.
Chapter 4 - 31
Chapter 4 - 32
Summary
• Point, Line, and Area defects exist in solids.
Chapter 4 - 33
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