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Velocity saturation:-
The linear relationship between the average carrier velocity and the applied field breaks down when high
fields are applied. As the electric field is increased, the average carrier velocity and the average carrier
energy increase as well. When the carrier energy increases beyond the optical phonon energy, the
probability of emitting an optical phonon increases abruptly. This mechanism causes the carrier velocity to
saturate with increasing electric field. For carriers in silicon and other materials, which do not contain
accessible higher bands, the velocity versus field relation increases monotonically as shown
Velocity-field relation for a) materials without accessible higher bands such as silicon and
b) materials with an accessible higher band such as GaAs.
For those materials the velocity-field relation can be described by:
1. In semiconductor current flows not only due to electrons instead it is due to drift of
electrons as well as holes.
2. Movement of holes is always in opposite to that of corresponding electrons.
3. Holes contribute current to their direction of movement whereas electrons contribute
current opposite to their direction of movement. Hence both currents will be in same
direction.
4. Electrons involved in causing current in semiconductor, move through conduction band
whereas holes causing current in semiconductor move through valance band. That is
why mobility of electrons and holes are different in semiconductor.
Then,
Where, n and p are the concentration of mobile electrons and holes respectively, e is
absolute charge of each electron and hole and μn and μp are mobility of electrons and holes
respectively.
Continuity equation:-
When carriers diffuse through a certain volume of semiconductor, the current density leaving
the volume may be smaller or larger depending upon the recombination or generation taking
place inside the volume. Let us consider a small length Δx of a semiconductor with cross-
sectional area Δ in the yz plane. The electron current density entering the volume Δ’ Δx is J,(x)
while that leaving is J(x + Δx). The net increase in the electron concentration per unit time,
an/&, is the difference between the electron flux per unit volume entering and leaving minus
the recombination rate
R, plus the generation rate G,. That is
in the limit of Δx + 0, we get
where R, and G, are recombination and generation rates for holes. These equations are called
continuity equations for electrons and holes respectively and describe the time dependent
relationship between current density, recombination and generation rates and distance. They
are used for solving transient phenomena and diffusion with recombination-generation of
carriers.
2. Explain current voltage characteristics of pn junction with help of suitable expressions
and discuss its temperature dependency
If the external voltage applied on the silicon diode is less than 0.7 volts, the silicon diode
allows only a small electric current. However, this small electric current is considered as
negligible. When the external voltage applied
on the silicon diode reaches 0.7 volts, the p-n
junction diode starts allowing large electric
current through it. At this point, a small
increase in voltage increases the electric
current rapidly. The forward voltage at which
the silicon diode starts allowing large electric
current is called cut-in voltage. The cut-in
voltage for silicon diode is approximately 0.7
volts.
Note : The term V1 becomes V1 -V as the forward biased voltage V opposes the barrier
potential. So net voltage across the junction becomes V1 - V.
The equation (2) can be written for open circuited unbiased p-n junction diode by putting
V = 0 as,
where pn0 is the concentration of holes on n-side just near the junction when diode is open
circuited i.e. at thermal equilibrium and hence different than p n(0).
As the concentration of holes in entire p-region is constant equating equations (2) and (3)
we get,
Note : This equation represents boundary condition and called law of junction.
This indicates that the hole concentration pn(0) at the junction under forward biased
condition is greater than its thermal equilibrium value p n0. For large forward biasing pn(0)
becomes much larger compared to pn0.
Note : The discussion is equally applicable for the electron concentration on the p-side.
Now the difference between two concentrations at the junction under unbiased and biased
condition is called injected or excess concentration denoted as pn(0).
The hole current crossing the junction from p-side to n-side is given by,
While an electron current crossing the junction from n-side to p-side is given by,
Temperature dependence:-
The reverse saturation current is depends on the temperature. If temperature increases the
generation of minority charge carriers increases. Hence, the reverse current increases with the
increase in temperature. However, the reverse saturation current is independent of the external
reverse voltage. Hence, the reverse saturation current remains constant with the increase in
voltage. However, if the voltage applied on the diode is increased continuously, the p-n
junction diode reaches to a state where junction breakdown occurs and reverse current
increases rapidly.