EUE3223

 Understand basic principles and basic elements of instrumentation (measurement)

and control systems.
 The basic working principles of a variety of sensors will be introduced.
 Create a transfer function to perform the control function for engineering systems.
 Compare various types of signals and their conversion in a basic measurement
system.
 Apply the principles of a selection of signal processors and conditioners as well as
the signal receivers.
 Manipulate transfer function of open and closed loop control systems.
 Derive the mathematical models of basic engineering systems.
 Evaluate the output response of the control systems.
 Final Examination: 50%
 In-class Test: 20%
 Coursework (4 Labs/ 2 Assignments): 30%
 Sensors and Primary Transducers
 Signal Processors and Receivers
 Electric Actuators
 Instrumentation System Models and Calibration
 Process Control Systems and Controllers
 Closed Loop Engineering Systems
 Transfer Function Manipulation
 System Response
Compare various types of signals and their
conversion in a basic measurement system.
Apply the principles of a selection of signal
processors and conditioners as well as the
signal receivers.
Instrumentation Systems
Basic Definitions
Sensors & Transducers
Instrumentation is the use of electrical
/mechanical components to measure and
display physical parameters
The system has basic identifiable component
parts
Temperature, pressure,
speed, strain,
position, etc.

Transducer or Signal Signal

Sensor Conditioning Processing

User

Display, record,
monitor, control
 Platinum Resistance
PRT Thermometers
(PRTs) PRT sensors

Wheastone Instrumentation
A/D conversion
Bridge Amplifier

Linearisation

Display
Ideally the relationship between the input and
output of the instrumentation system is linear –
defined by the “Sensitivity”
However several factors affect this relationship
a. Resolution
b. Non-linearity
c. Hysterisis
d. Interfering inputs (temp.)
e. Modifying inputs (temp)
f. Accuracy
RANGE
 This specifies the minimum and maximum of a variable
This can be defined for both input and output of the
system
– i.e. Input Range - 1000C to 2500C,
– Output Range – 0 2500mV

SPAN
This specifies the maximum variation of a variable
– i.e. Input Range: 100  C to 250  C, Input Span: 150C
– i.e. Output Range: 0 to 2500mV, Output Span: 2500mv
SENSITIVITY
This defines the ratio of the output variable change to input
variable change
– i.e. Output Range: 0 to 2500mV, Output Span: 2500mv
– i.e. Input Range: 100  C to 250  C, Input Span: 150C
0 2500 1
G   16.67 mV C
I 150
0  GI  16.67 I (mV )
Resolution
This defines the minimum resolvable change in an input or
output usually because of discrete changes in the variable,
Output Range: 0 to 2500mV, Output Span: 2500mv
Input Range: 100  C to 250  C, Input Span: 150C
Sensitivity, G = 16.67mV/  C
Output resolution, O = 16.67mV or 0.67% of maximum
Input resolution, I = 16.67mV/G = 1  C or 0.4% of maximum
16.67 mV
O 
1 2500mV
I   0.4%  6.668 x10 3
250
 0.67%
Non-linearity
This defines the amount of unconformity to a linear relationship
between input and output,
 Output Range: 0 to 2500mV, Output Span: 2500mv I  2C
 Input Range: 100  C to 250  C, Input Span: 150C
 Sensitivity, G = 16.67mV/  C O  GI  16.67 x 2C
 Output resolution, O = 16.67mV or 0.67% of maximum
 Input resolution, I = 16.67mV/G = 1  C or 0.4% of maximum
 33.34mV
 Non-linearity, Eg specified as 2 C max or 1.3% of Span
O 33.34
Non  linearity  
Spanoutput 2500
 0.0133  1.33%
Hysterisis
This defines the variability in the output or input depending upon the direction of
change.
Exhibits a “memory” of change, express as a % of span
 Output Range: 0 to 2500mV, Output Span: 2500mv
 Input Range: 100  C to 250  C, Input Span: 150C
 Sensitivity, G = 16.67mV/  C
 Output resolution, O = 16.67mV or 0.67% of maximum
 Input resolution, I = 16.67mV/G = 1  C or 0.4% of maximum
 Non-linearity, 2 C max or 1.3% of Span
 Hysterisis, Eg. Specified 3 C max or 2% of Span
The characteristics may be E.g.: Measured Voltage is
defined mathematically as: 1333.6mV, at sensitivity of
16.67mV/ . Range = 100
C to 250
C
V  G(Temp-100 ) (mV ) V
Temp   100 (C)
V G
Temp   100 (C)
G
±2C non linearity 1333.6
Temp   100  180C  2C
error 16.67
Notice the non- Temp  180C  1.3% of span
linearity error is ± so it
does not assume in a
particular non-linear
characteristics
The system may be affected by several factors or inputs
which effect the system
Modifying Input: Modifies the linear sensitivity (i.e.
temperature in
strain gauges)
Interfering input: Interferes with the “zero condition” ie
changes the static reference( ageing, drift, temp, etc)
Relates to the “closeness” to the true value of the measured quantity
It is standards based using National and International Standards – National
Physical Laboratory (NPL)
Requires calibration against standards using instruments in turn calibrated
against standards.
This is usually performed by approved test houses hence “traceability”
 i.e. 2% of reading
Finally manufacturers
may accommodate
Hysteresis, non-linearity
and resolution by
defining error bands
This defines that for a
particular input the
output will be within
±ΔO
Instrumentation Systems have sensing, conditioning and
display functional blocks
Instrumentation has definitions of range, span, sensitivity,
hysteresis, non linearity, accuracy and error bands
Accuracy is based upon calibration against known
standards
These standards are in turn calibrated against reference
standards (traceability)
Care must be taken to minimise the effects of Modifying
and interfering inputs
Understand the process of electronic
measurement
Appreciate the potential effects the
measurement instrument may have upon
the measurement
Able to analyse the limitations of
instruments in measurement
Ideally in any measurement system the action
of taking a measurement should not affect the
actual value to be measured
When using specific instruments this is generally
not a problem however when “building” a system
to take a measurement it can be
Consider the following simple measurement
 Measurement of the voltage or current should indicate the
values above. This relies upon:

A. The current measurement

instrument having ZERO
resistance. Short circuit
currect (SCC)
B. The voltage measuring
instrument having
INFINITE resistance. Open
circuit voltage (OCV)
The voltage measuring
instrument has FINITE
resistance of 10kohms
 Voltage measured = V
Current Measurement
changes because the
voltage measuring
instrument draw current:
Measured current becomes I = 5.5mA
A 10% measurement error
The current
measurement instrument
has a 100ohm resistance.

This cause the current

to drop to
5/1100 = 4.5456mA And the voltage to drop to:
An error of 0.4544mA 4.5456V
or 9.1% error in current An error of 0.4544V or 9.1% error in
voltage
The current
measurement instrument
has a 100ohm resistance,
and the voltage
measurement instrument
has a 10kOhm resistance.
This cause the current
to drop to And the voltage to drop to:
5/1009 = 4.955mA 4.505V
An error of 0.0454mA An error of 0.495V or 9.9% error in
or 0.9% error in current voltage
The action of taking a measurement can influence the
measurement
Loading effects should be considered
Modern instrument minimize this problem by either
presenting:
(a) an “INFINITE” resistance at its terminals (voltage
measurement)
(b) A “ZERO” resistance at its terminals (current measurement)
However, awareness of the potential problem is paramount in
any system.