Академический Документы
Профессиональный Документы
Культура Документы
Printed with permission of the copyright holder, the American Gear Manufacturers Association, 1001 N. Fairfax Street, Fifth Floor, Alexandria, VA 22314-1587.
Statements presented in this paper are those of the author(s) and may not represent the position or opinion of the American Gear Manufacturers Association.
Comparison Measurements
The comparison measurements featured seven measurement
methods (see Table 2). The following sections give details of the
different measurement parameters.
Tactile calibration on a µCMM. The calibration measure-
ments were performed on the Zeiss F25 micro coordinate mea-
suring machine (µCMM). The µCMM calibrated both measure- Figure 2 Internal microgear measurement standard with custom clamp.
ment standards with measurement
uncertainties in the sub-microm- Table 2 Overview of measurement methods we compared (the abbreviation GMI stands for gear
measuring instrument)
eter range (Table 3). The probing
Measurement of Measurement of
force was 1 mN. external microgear internal microgear
The tactile calibration provided
Tactile calibration on a μCMM Except 0.1-mm module Except 0.1-mm module
the reference values for the com-
parison measurements. The cali- Tactile measurement on a GMI with standard probe Except 0.1-mm module Except 0.1-mm module
bration values refer to the devia- Tactile measurement on a GMI with custom microprobe Yes Not yet
tions of the profile and the helix Computed tomography (CT) measurement Yes Yes
(see ISO 1328 and ANSI/AGMA Optical measurement: focus variation Yes Yes
1012-G05). The calibrated gear
Optical measurement: transmitted light Not possible Yes
parameters were evaluated in
Tactile-optical measurement Yes Not yet
the software of the measuring
machine (Zeiss Gear Pro (Ref. 8).
Table 3 Measurement uncertainties of the tactile calibrations. The measurement uncertainties are equal
The smallest module embodied for all three modules (1 mm, 0.5 mm, and 0.2 mm)
(mn = 0.1 mm) was not calibrated Internal microgear, Internal microgear, External microgear,
because the probing element, Parameter titanium carbide titanium and carbide
Ucal (k = 2) in μm Ucal (k = 2) in μm Ucal (k = 2) in μm
whose sphere diameter is 125 µm,
Profile slope deviation fHα 0.6 0.5 0.4
is too large for the tooth spaces.
Profile form deviation ffα 0.5 0.5 0.3
Figure 3 shows the measurement Total profile deviation Fα 0.7 0.6 0.5
setups. Helix slope deviation f 0.5 0.4 0.4
Hβ
Helix form deviation ffβ 0.5 0.5 0.3
Total helix deviation Fβ 0.6 0.6 0.5
Figure 3 Measurement setups of the microgear measurement standards on the µCMM. The left side of the figure shows the external measurement
standard (Ref. 2)]. The right side of the figure shows the internal measurement standard and its custom clamp.
Figure 9 Reconstruction of the internal microgear measurement standard with focus variation.
0.5
Additionally, the imaged profile lines are an 10.7 10.75 10.8 10.85 -12 -11.5 -11 -10.5 -10
envelope of the whole facewidth, which leads x-coordinate in mm x-coordinate in mm
workpiece surface onto the image sensor. In this study, measur- (Table 8). The results show that each measurement method has
ing gears required that the workpieces be tilted to ensure an shortcomings.
adequate angle. Furthermore, the fixed focal length of the lenses For industrial measurements, the combination of measure-
limits the reconstruction internal gears — in the case of the ment time, cost, and quality can be a helpful key value to evaluate
internal microgear measurement standard, we were not able to measurement methods. In the context of measurement technol-
completely reconstruct the workpiece. ogy, “quality” can be, among other things, influenced by accuracy,
CT systems allow contactless measurements that yield a com- precision, measurement uncertainty, holistic characterization of
plete 3D representation of the workpiece. However, the reso- the workpiece (3-D-reconstruction of the workpiece), robustness,
lution depends on the workpiece size (in contrast to all other and reliability. In terms of quality, the tactile measurements fea-
methods described in this work). Accordingly, CT measure- tured the smallest measurement uncertainties but generated only
ments yield low resolutions for gears whose ratios of the outer line data. CT measurements generated a holistic digital represen-
diameter to the module are high. tation of the workpiece. The focus variation method was the most
The following two figures show the measurement results. cost- and time-efficient measurement method. High-precision
Measurement results of the 1 mm, 0.5 mm, and 0.2 mm modules coordinate measuring machines and CT systems cost about two
are stated in mean differences to the tactile calibration (regard- to five times as much as most optical systems.
ing all modules and teeth). First, we computed the single dif-
ferences (measurement result minus the corresponding result Conclusion and Outlook
of the calibration). Afterwards, we computed the mean of PTB successfully conducted comparison measurements of two
these differences for every gear parameter (fHα, ffα, Fα, fHβ, ffβ, Fβ) microgear measurement standards using seven measurement
because the differences between the modules are mostly negli- methods. The following goals were pursued:
gible, whereas the differences regarding the gear parameters are • Verification of the measurement standards and their
decisive. The term “abs” in the following figures states that the calibration
mean was computed using the absolute value of each difference. • Performance evaluation of the measuring machines involved
regarding microgear measurements
The best agreement with the calibration values comes from • Comparison of the measuring machines based on actual mea-
GMI and µGMI. Most of the Focus Variation and CT results dif- surement data
fer markedly from the calibration values.
Analyzing the CT measurements of the internal microgear, Since a reasonable number of measurement results are within
we found out that the reason for the large differences in the pro- the measurement uncertainty of the calibration, we infer that
file form deviations is the virtual tip relief due to limited struc- the measurement standards are adequate and that their calibra-
tural resolution. Shortening the evaluation range of the profiles tion is correct.
at the tip end would have halved the differences to the calibra- Industry and research may benefit from the workpiece-like
tion values. measurement standards by testing and evaluating measur-
In general, the form deviations of the CT and focus varia- ing techniques and machines. Using different techniques and
tion measurements are large due to limited resolution and machines to measure a calibrated workpiece reveals their indi-
noise — applying filters could decrease the differences to the cal- vidual advantages and disadvantages.
ibration values. The comparison measurements using the GMI Small and medium-sized enterprises (SMEs) could take
were successful because the results are within the measurement advantage of the comparison measurements by using the inde-
uncertainties. pendent and comparable measurement data provided here. This
Based on this study, we checked the applicability of the mea- will allow SMEs to have increased confidence when investing in
surement methods used regarding microgear measurements measuring machines.
Ultimately, only some of the measurement methods were ade- The authors acknowledge the Deutsche Forschungsgemeinschaft
quate for measuring the 0.1 mm module, namely: tactile mea- for providing financial support (grant KN 1181/1-1), and the
surement with the IMT/PTB microprobe, CT, optical measure- Physikalisch-Technische Bundesanstalt (PTB), the national metrol-
ments, and tactile-optical measurement with the fiber probe. ogy institute of Germany, for providing the framework for the
Currently, PTB and TU Braunschweig are further developing research described. We gratefully acknowledge the support of the
the custom microprobe (Ref. 9). Our goal is to expand the mea- Braunschweig International Graduate School of Metrology (B-IGSM).
surement capabilities of conventional GMIs and CMMs by inte-
grating our microprobe. This allows the use of smaller probing
sphere diameters and yields higher sensitivity. The microprobe
is supplemented by a microenvironment, which is a portable
separative device that protects and monitors the direct measure-
ment environment and includes clamping and cleaning solu-
tions (Refs. 4–5).
Acknowledgments. We gratefully thank our colleagues
Michael Neugebauer, Achim Wedmann, Marlen Krause, Astrid
Linkogel, Dieter Schulz, Ulrich Neuschaefer-Rube, Fabricio Borges
de Oliveira, Vaclava Dunovska, Nelson Ferreira, and David Metz
for performing and evaluating the measurements, and Rudolf
Meeß and Christian Wolpert for manufacturing the internal
microgear measurement standard.
6
Difference from the calibration values in µm
Tactile-
optical
4 Focus
Variation
µGMI
2
GMI
0
CT
-2
-4
-6
Δffb
Δffb
Δffb
Δffb
Δffb
Δffb
ΔfHb
ΔfHb
ΔfHb
ΔfHb
ΔfHb
ΔfHb
ΔFb
ΔFb
ΔFb
ΔFb
ΔFb
ΔFb
Figure 15 Comparing the helix deviations for the modules from 0.2 mm to 1 mm of the external microgear. µGMI means a
measurement using a custom microprobe integrated into our GMI. The best agreement with the calibration values comes
from GMI and µGMI. Most of the Focus Variation and CT results differ markedly from the calibration values.
3 Tactile-
optical
2 Focus
Variation
µGMI
1
GMI
0 CT
-1
-2
Δffa
Δffa
Δffa
Δffa
Δffa
Δffa
ΔfHa
ΔfHa
ΔfHa
ΔfHa
ΔfHa
ΔfHa
ΔFa
ΔFa
ΔFa
ΔFa
ΔFa
ΔFa
m=1 L m=1 R m=0.5 L m=0.5 R m=0.2 L m=0.2 R
Profile deviations
Figure 16 Comparing the profile deviations for the modules from 0.2 mm to 1 mm of the external microgear. µGMI means a
measurement using a custom microprobe integrated into our GMI. The best agreement with the calibration values comes
from GMI and µGMI. Most of the Tactile-optical and CT results differ markedly from the calibration values. The largest
differences can be found in the Focus Variation measurements, which are consistently too large.
1
Measurement results in µm
µGMI CT
-1
-2
ffb
ffb
fHb
Fb
fHb
Fb
m = 0.1 mm L m = 0.1 mm R
Helix deviations
Figure 17 Comparing the helix deviations for the 0.1 mm module of the external microgear (CT and tactile measurement with custom
microprobe on the GMI). Overall, the results agree.
10
8
6
4
2
Measurement results in µm
0
-2
µGMI CT
-4
-6
-8
-10
ffa
ffa
fHa
Fa
fHa
Fa
m = 0.1 mm L m = 0.1 mm R
Profile deviations
Figure 18 Comparing the profile deviations for the 0.1 mm module of the external microgear (CT and tactile measurement with
custom microprobe on the GMI). The length of the profile is short, which might explain the large deviations of the CT
measurement.
microgears
at www.geartechnology.com
www.
and finished his PhD in 2012.
geartechnology
He has since 2014 been the
head of the working group for
gear and thread metrology
at the Physikalisch-
Technische Bundesanstalt
in Braunschweig, Germany. Stein is an active .com.
member in national standardization bodies for
gear metrology of the VDI/VDE and DIN.
Drop by our website to uncover
Karin Kniel studied
mechanical engineering decades of peer-reviewed technical and
at TU Braunschweig. She
has been employed in the
back to basic articles.
Physikalisch-Technische
Bundesanstalt for nearly 20
years. In 2007, she finished
You don’t need to be an archeologist to
her PhD and became the “excavate” the information that matters
head of the working group
Gears and Threads. Since 2014, she has to you.
been the head of the Coordinate Metrology
department. The task of this department is
an industry-oriented dissemination of the Gear Technology is happy to report that
SI-unit “meter” in the field of dimensional
3-D metrology. With the goal of ensuring
every issue (1984 to present) is now
traceability and enhancing accuracy, Kniel’s
department develops measurement methods,
available online at
facilities and standards.
Andreas Dietzel received
his diploma and PhD degrees www.geartechnology.com/issues
in physics from the University
of Göttingen (Germany) in
1986 and 1990. From 1990
to 1994, he worked in the
IBM Laboratory of Surface
and Structure Analysis in
Boeblingen (Germany),
and from 1994 to 1996 at the IBM Research
Laboratory in Rueschlikon (Switzerland) in
the Optoelectronics Department. In 1996,
he joined the IBM Storage Technology
Division in Mainz (Germany) as head of the
Laboratory for Magnetic Characterization
and Technology Projects. In 2003, he joined
Robert Bosch GmbH as project manager for
next-generation acceleration sensors. In 2004,
he was appointed full professor for the new
section — micro- and nanoscale engineering
in the Department of Mechanical Engineering
of the TU Eindhoven (The Netherlands). In
2012, he was appointed professor at TU
Braunschweig (Germany) and became head
of the Institute of Microtechnology (IMT).
Dietzel’s current research interests include
sensors and actuators for metrological and
aeronautical applications.