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Picture of product or

service
Crop/cut to fit. Do not
stretch!
Seminar Chennai

Torsten Bahnsen

Mahr 2007
1 · Seminar Chennai
Topics
1. Basics of roughness measurements at real work (ca.1.5 h)
2. International standards (ca. 30 min)
3. Future trends of surface measuring systems (ca. 30min.)

Mahr 2007
2 · Seminar Chennai
Picture of product or
service
Crop/cut to fit. Do not
stretch! Basics of roughness
measurement at real
work

Torsten Bahnsen

Mahr 2007
3 · Seminar Chennai
Topics
1. Filter settings and what happened
• Cut off according to ISO
• What happened to the result with different Lc
• Difference between RC- to 50% Gaussian filter
• Automatic choice of tracing length and Lc
• How to set the filter on short tracing length
2. Mean parameter
• Advantages/Disadvantages Ra, Rz
• “converting” Ra -Rz
3. External Filter on the shop floor measurement
• Tip radius, filter, measuring conditions
• Choice of probes (Example: Skidded measurement)
• Absorbing elements
• New Filter for the production?
• Measurments on the shop floor?
Mahr 2007
4 · Seminar Chennai
Roughness measurements are easy
1. All settings in the surface measurement are
standardizes. (ISO, JIS,…)
=> Target : Comparable measurements
2. Attention to countries or union standards
3. The evaluation system has to set to the settings
according to the drawing
4. Documentation of the results, that third parties can
understand the measurement settings
5. Optical and tracing results are different to
compare (sometimes not comparable)

Mahr 2007
5 · Seminar Chennai
Choice of cut off and tracing length
according to DIN EN ISO 4288

Mahr 2007
6 · Seminar Chennai
How periodic and aperiodic profiles
looks like?

Mahr 2007
7 · Seminar Chennai
Choice of cut off and tracing length
according to DIN EN ISO 4288
Point
distance
λc [mm] λs [µm] λc / λs Rtip [µm] Rz (Ra) [µm]
Max values in
(maximum µm
value)
0,08 2,5 30 0,5 0,5 bis 0,1 ( bis 0,02)

0,25 2,5 100 2 0,5 0,1- 0,5 (0,02-0,1)

0,8 2,5 300 2* 0,5 0,5 – 10 (0,1 – 2,0)

2,5 8 300 5 1,5 10 – 50 (2,0 – 10)

8 25 300 10 5 50 – 200 (10- 50)

* Surfaces of Ra >0,5 µm or Rz >3 µm can use a tip radius of 5µm without big deviation
Mahr 2007
between the measuring results.
8 · Seminar Chennai
Filter graphic of λs-Filter, roughness,
waviness and form

noise roughness waviness form

Mahr 2007
9 · Seminar Chennai
practical example :

Pt 9.825 µm

Mahr 2007
10 · Seminar Chennai
Work of a low pass filter (example 1)

Wt 2.775 µm

Mahr 2007
11 · Seminar Chennai
Work of a low pass filter (example 2)

Wt 1.424 µm

Mahr 2007
12 · Seminar Chennai
Practical example 2 :

Pt 9.825 µm

Mahr 2007
13 · Seminar Chennai
Work of a high pass filter (example 1)

Rz 7.339 µm, Ra 1.677 µm

Mahr 2007
14 · Seminar Chennai
Work of a high pass filter (example 2)

Rz 8.174 µm, Ra 1.721 µm

Mahr 2007
15 · Seminar Chennai
Effects of cut off choice to a
measurement

Mahr 2007
16 · Seminar Chennai
Effects of cut off choice to a
measurement

Mahr 2007
17 · Seminar Chennai
Effects of cut off choice to a
measurement

result = roughness ( => correct choice of Lc)

result = roughness + waviness


(=> wrong choice of Lc)

Different Filter 1,2

Mahr 2007
18 · Seminar Chennai
Difference between
RC-and Gauss- Filter

• The influence of the filter type is minimal


according to the form deviation

• The main difference is based on the filter


transmission curve
– The curve changed from 75% to 50%
– Experience : The differed transmission curves
accurse result differences of sometimes 10%
Mahr 2007
19 · Seminar Chennai
2 RC and 50% Gaussian Filters

1 – 50% Gauss Filter


2 – 2RC Filter
Mahr 2007
20 · Seminar Chennai
A simple solution :
Automatic choice of filter and tracing length
Basic rule:
Analyzing the type
Test measurement
of profile

Profile
Decision No
periodic?
Yes

Periodic profile

aperiodic profile

Mahr 2007
21 · Seminar Chennai
A simple solution :
Automatic choice of filter and tracing length

1. Start of the measurement; Rz and RSm are calculated


with Lc 0.25 and Lc 0.8mm
2. Decision aperiodic or periodic and is the result according
to the ISO standard. If not, carry on the measurement
3. Measurement continue
4. Decision if the results are according to ISO standard.
If not, carry on the measurement
5. End of the measurement with standard drive units; result with Lc= 2.5mm

Mahr 2007
22 · Seminar Chennai
A simple solution :
Automatic choice of filter and tracing length

Advantages of this function:


• You need not a test measurement
• the user need not to select a filter
• the system recognize the type of profile (periodic or aperiodic)
• the system do the evaluation according to the
ISO standard (Rz, Ra or RSM)
• the required ISO rules are saved in the system

Mahr 2007
23 · Seminar Chennai
What is to do on short tracing length?

1. Try to set the system according to ISO 4288

2. If this is not possible: Reducing of the tracing parts (n)


Try from to reduce is n=5 to e.g. n=2
Recommendation: Evaluate a own mean value, regards to a
repeatable measurement

3. Last choice: Using of unfiltered P-Parameter


Reason: The waviness get minimized on short tracing length

Mahr 2007
24 · Seminar Chennai
Traditional Surface Texture
Parameters and Functions

Some of these parameters can also be calculated from unfiltered and


waviness profiles. (P and W families of parameters)

Mahr 2007
25 · Seminar Chennai
How Many Parameters Should be
Specified

In order to try to completely and fully characterize


the surface using parameters, between 3 and 6
parameters must be chosen and should contain at
least 1 of each of the types (i.e., 1 amplitude, 1
spacing and 1 hybrid parameter).

Mahr 2007
26 · Seminar Chennai
Ra = AA = CLA
Rq = RMS

On majority of prints only Ra is


specified.

Mahr 2007
27 · Seminar Chennai
Roughness Average Ra

Mahr 2007
28 · Seminar Chennai
Ra – Roughness Average
Advantages
• The most commonly used parameter to monitor a production process.
• Default parameter on a drawing if not otherwise specified.
• Available even in the least sophisticated instruments.
• Statistically a very stable, repeatable parameter.
• Good for random type surfaces, such as grinding.
• A good parameter where a process is under control and where the
conditions are always the same, e.g. cutting tips, speeds, feeds,
cutting fluid (lubricant).

Disadvantages
• Not a good discriminator for different types of surfaces (no distinction
is made between peaks and valleys).
• Not a good measure of sealed surfaces.
Mahr 2007
29 · Seminar Chennai
Two Different Surfaces with the
same Ra

Mahr 2007
30 · Seminar Chennai
Ra, Rq Parameters
• Roughness average Ra is the arithmetic
average of the absolute values of the
roughness profile ordinates.

• Root mean square (RMS) roughness Rq is the


root mean square average of the roughness
profile ordinates.

Mahr 2007
31 · Seminar Chennai
Rq – Root Mean Roughness

Rq is more sensitive to peaks and valleys then Ra,


because the amplitudes are squared.

Applications

• Very similar to Ra, which practically replaced it


for general use.
• Used to control very fine surfaces in scientific
measurements and statistical evaluations.

Mahr 2007
32 · Seminar Chennai
Ratio of Root Mean Square to
Arithmetic Average Roughness
• Theoretical Ratio of Sine Waves Rq/Ra 1.11
• Actual ratios of Rq/Ra for various processes:
Turning 1.17 to 1.26
Milling 1.16 to 1.40
Surface grinding 1.22 to 1.27
Plunge grinding 1.26 to 1.28
Soft honing 1.29 to 1.48
Hard honing 1.50 to 2.10
Electrical discharge machining 1.24 to 1.27
Shot peening 1.24 to 1.28
• Practical first approximation of Rq/Ra
For most processes 1.25
For honing 1.45

Mahr 2007
33 · Seminar Chennai
Rz, Rmax Parameter

Mahr 2007
34 · Seminar Chennai
Rz – Mean Peak-to-Valley Height
Rmax – Maximum Peak-to-Valley Height
Applications
• Rz is more sensitive than Ra to changes in surface finish as
maximum profile heights and not averages are being
examined.
• Rmax is useful for surfaces where a single defect is not
permissible, e.g. a seal with a single scratch.
• Rz and Rmax are used together to monitor the variations of
surface finish in a production process. Similar values of Rz
and Rmax indicate a consistent surface finish, while a
significant difference indicates a surface defect in an
otherwise consistent surface.
Mahr 2007
35 · Seminar Chennai
Comparison of Ra and Rz
Ra and Rz are the most frequently used surface
parameters
Feature Ra Rz
Usage World-wide Mostly Europe

Measuring instrument Simple More advanced

Dispersion of measured values Low Higher

Assessment from the profile graph Not possible Possible

Expressiveness Bad Good

Influence of exceptional profile Low Slightly higher


peaks
Measurements with optical Not possible Possible up to
instruments a point

Mahr 2007
36 · Seminar Chennai
1. Rz Upper Limit
(Converting Ra into Rz)

2. Ra lower Limit
(Converting Rz into Ra)

Mahr 2007
37 · Seminar Chennai
Rz to Ra Conversion

• BS 1134/1-1972 Rz = x4 - x7 Ra

• Siemens Recommendations Rz = x4 - x10 Ra

– Actual ratio depends upon the shape of the profile.

Mahr 2007
38 · Seminar Chennai
Different profiles needs sometime more parameter to
describe there characteristic

Mahr 2007
39 · Seminar Chennai
External Filter
1.) Filter based on probe tips
2.) Measuring settings
3.) Choice of probe
Skidded probes (Ad- and disadvantages)
4.) Absorbing of environment problems
5.) New filter methods?
8.) Measurement in the production

Mahr 2007
40 · Seminar Chennai
Tip geometry and profile
characteristic as filter

Measuring force:
Probe tip 0,75 mN

Open angle
max. 120°
120°
r=2 µm

Comprimised profile Proportional zoomed profile

Mahr 2007
41 · Seminar Chennai
Also measuring conditon do filter the profile:
• The tracing length ln work like an high pass filter:
– If we shorten ln, the profile get less influence of long
waves. The profile include less long waves.
– Hint: ln muss minimum as long as the biggest wave
length which you like to evaluate
• point distance work like a low pass filter:
– If you get less points per mm, you get less short wave
componenets of the profile
– Hint: You need at least 7 points on the shortest wave
length
Mahr 2007
42 · Seminar Chennai
Advantage Skidded probes:
small vibration circuit

Measuring
Drive unit circuit

Probe tip

Skid
Measured
surface

Mahr 2007
43 · Seminar Chennai
The „typical“ one skidded probe

• One skidded
probes are the
most used ones
based on over all
measurement.
They are used
for plane convex
and convave
surface. They
are also used in
bores.

Mahr 2007
44 · Seminar Chennai
Example I

Step 1

Measured Profile I

Step 2

Mahr 2007
45 · Seminar Chennai
Example II

Measured Profile II

Mahr 2007
46 · Seminar Chennai
Example III

Real profile

Measured profile

Mahr 2007
47 · Seminar Chennai
Absorbing of envirements vibrations with
„Absorbing elements“

Standard
System
Leveled regulated
system

Mahr 2007
48 · Seminar Chennai
New Filter methods?

1. Gaussian filter (K-, B-,)


without pre- and post cut off
2. Robust Filter

Mahr 2007
49 · Seminar Chennai
Example: Drawings

FPRRG 0,8x5 / Ra 1,6

Mahr 2007
50 · Seminar Chennai
Robust Gaussian filter:
Principial drawing

Weighting function
Weighting function

Measured profile

Mean linie

Mahr 2007
51 · Seminar Chennai
Robust Gaussian filter: Example
• Standard filtered profile

• Robust filtered profile

Mahr 2007
52 · Seminar Chennai
Robust Gaussian filter: Advantages

• Function related, some errors do not change the


mean line filtering
• Real, based on the function related values for
Rp and Rv
• FPRRG could be the replacement for Rk, Rpk
and Rvk - one Filter for a lot of tasks !
• Pre- and post cutoff are eliminated:
Evaluation length ln = Tracing length lt

Mahr 2007
53 · Seminar Chennai
Measurement on the shop floor

• Using of fixtures
• Start the measurements with automatic
programs

Mahr 2007
54 · Seminar Chennai
Surface measurements on the shop floor
Fixture

Layers

Mahr 2007
55 · Seminar Chennai
Surface measurements on the shop floor
Vorrichtungen

Mahr 2007
56 · Seminar Chennai
Surface measurements on the shop floor
CNC-Messplätze

Mahr 2007
57 · Seminar Chennai
Conclusion

Different solution are possible:

1. Help tools of the measuring system


(Automatic choice of Cut off and tracing length)
2. Absorbing of environment vibration
3. Measuring programs with or without fixtures
4. Documentation of the measuring results
Requirement: Third parties should understand
the measurement and their settings

Mahr 2007
58 · Seminar Chennai

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