2010 IMS Edition

www.awrcorp.com | www.awr.tv

• Cover Story: Seeds of Change

• MicroApps Schedule
• AWR 2010 Release Product Overview
• Product Focus: AXIEM Evolution
• Success Story: Acreo
• Success Story: Multitest
• Article: Nonlinear Behavioral Models
• News Flash: AWR CEO Dane Collins Elected to
EDAC Board of Directors
• News Flash: AWR Graduate Gift Initiative

Cover Story
Seeds of Change
AWR’s new ad, “Ideas Grow Faster in
the Right Environment” graces the front
of our 2010 AWR Magazine that you
are now holding. The sprout represents
AWR’s corporate culture in so many
ways: innovation, spawning new ideas,
the right environment for growth and
creativity, seeds of change…
The economy is on the road to recovery,
and smart businesses have been laying
the groundwork and sowing the seeds
of change in anticipation of a future far
different from before the downturn.
2
Welcom e to Sun n y Ca liforn ia!
Sherry Hess, Vice President of Marketing, AWR
AWR has weathered the economic
turbulence well (we just announced our
13th consecutive year of record reve-
nues), certainly better than others in our
industry. One reason? You! Or should I
say the trust you have in AWR. Custom-
er trust is a huge competitive advantage
at AWR. We hope that you know you can
trust us and that you know from experi-
ence that we don’t just sell a product,
we provide improved productivity, faster
time-to-market, more bang for the buck.
Ideas grow faster in the right environ-
ment—Yes. Of course they do. AWR’s
software enables you, our valued cus-
tomer, to focus on your ideas, growing
them into winning products. And be-
cause our environment runs easily and
efficiently and is constantly enhanced
with our own innovative, next-generation
technologies, it allows you to think cre-
atively and explore design possibilities.
AWR was founded on innovation, and
our drive to deliver the technologies
today that you need not only for today
but for tomorrow’s designs as well.
Our core competencies, innovation and
service, have helped our customers
get through the hard times, and will be
the environment that enables them to
“sprout” the ideas they need to be com-
petitive in the future.
Knowing that ideas grow faster in the
right environment, AWR has, as usual,
been busy sprouting ideas into new
technologies that’s part of our upcom-
ing 2010 software release - Microwave
Office®, Visual System Simulator™, and
AXIEM™. We’ve included a sneak peek in
the pages of this magazine, as well as on
the AWR website at www.awrcorp.com.
Enjoy IMS 2010!
AWR EVENTS AT IMS IMS 2010

MICROAPPS SCHEDULE
Date and Time: Title and Company:

Multi-chip Module Design Challenges

Tuesday, May 25
Josh Moore, Dustin Hoekstra
09:30
AWR Corp.

Nonlinear Co-simulation with Real-time Channel Measurements for PCB Signal Integrity
Tuesday, May 25
Mike Heimlich, Khaled Nikro, Harry Momjian
10:10
Macquarie University; AWR Corp.; Anritsu Corp.

Causality Considerations for Multi-Gigabit StatEye Analysis

Tuesday, May 25
Michael Heimlich, Scott Wedge
10:30
AWR Corp.; Synopsys, Inc.

System-Level Component Models for RF EDA

Tuesday, May 25
Jiang Liu, Lawrence Dunleavy
13:10
Modelithics, Inc.

Multi-Rate Harmonic Balance for Non-Linear Simulation

Tuesday, May 25
Josh Moore, John Dunn
13:30
AWR Corp.

PA Design Inclusive of Load-Pull Analysis

Tuesday, May 25
Josh Moore, Dustin Hoekstra
14:10
AWR Corp.

Online Design Environment Provides Interactive Datasheets for Small Signal RF Transistors
Tuesday, May 25 – Allows Users to Generate Custom Datasheets for a Variety of Operating Conditions
14:30 Sherry Hess, Uwe Knorr, Ronald Thissen
AWR Corp.; Transim Technology Corp; NXP Semiconductors

Using AWR’s iFilter™ Wizard to Efficiently Synthesize Lumped & Distributed Filters
Tuesday, May 25
Mark Saffian
14:50
AWR Corp.

Single Chip LNA Using High Q Inductors on a Silicon-on-Sapphire Process

Tuesday, May 25
Duncan Widman, Yash Moghe
16:30
AWR Corp.; Sapphicon Semiconductor

A New Approach for Nonlinear Behavioral Modeling

Wednesday, May 26
Darren McCarthy, Johannes Benedikt
11:30
Tektronix Inc.; Mesuro Limited

A Methodical Approach to Analyzing and Understanding the Performance of a LTE System

Wednesday, May 26
Joel Kirshman
12:30
AWR Corp.

The Use of Computer Clusters and Spectral and Domain Decomposition

Wednesday, May 26 in 3D FEM Analysis
14:50 John DeFord, John Dunn
AWR Corp.

Test & Measurement Migration to Integrated Simulation, Test & Measurement

Thursday, May 27 for M&RF Design
09:30 Jon Leitner
Rohde & Schwarz

3
 Product
Update What’s New in the AWR 2010 Release

Microwave Office DEsign environment

Nonlinear Behavioral Modeling

• Nonlinear behavioral model support for Agilent’s X-parameters®,

Mesuro’s Cardiff model and more. Read “Nonlinear Behavioral Models”
article in this magazine for more information!

MRHB™

• Multi-rate harmonic balance (MRHB) technology was first introduced

in 2009 and developed specifically for customers with spectrally
rich simulations (transceivers, system on chip, module, etc.). MRHB
dramatically increases the speed and reduces the computer memory
required to perform steady-state analysis of complex nonlinear systems
with multiple signal sources and the 2010 release delivers even faster
simulation time and greater reduction in memory.

Constant Compression/Constant Output Power Simulation

• Great for PA designers, this new feature takes advantage of advanced

APLAC® capabilities enabling compression to be computed from linear
gain region or max gain region (i.e. gain expansion).

Linear Stability Analysis

• Normalized determinant function (NDF) and stability envelope

measurement now available! And what’s more, they offer a more
comprehensive solution than standard stability metrics or Gamma Probes.

Connectivity Tracer

• Seeing is believing! The ability to highlight all nets or user selected nets
and locate short or open circuits visually with ease is priceless. Check
out a live demo or AWR.TV video of this new feature!

Connectivity Tracer iFilter

4
Lots and lots of enhancements and updates Product
have been rolled into AWR’s 2010 release of
its software including Microwave Office, VSS
Update
and AXIEM. Highlights of the new and exciting
additions in the 2010 release are presented here.

AXIEM 3D planar em simulator

Antennas

• All the existing benefits of AXIEM (larger problems, faster solve

times, etc.) and now for antennae too! Works with existing antenna
measurements, new antenna gain measurements. Read “AXIEM
Evolution” article in this magazine for more information!

vss - visual system simulator software

Advanced Amplifier Behavioral Model - Time Delay Neural Network
(TDNN™)

• PA designers rejoice! TDNN now enables memory effect modeling in

VSS & MWO (thru the use of a model extraction wizard in MWO).

Turbo Decoders

• Supports turbo codes used in 3G/4G standards, such as cdma2000,

IS856, WiMAX, and LTE. Library includes components that can be used
for decoding of custom turbo codes too!

Microwave Office Plug-n-Play modules

iFilter™ (lumped and distributed filter synthesis)

• The iFilter intuitive user interface enables designers to quickly and easily
design filters, connect them directly to circuitry, and make optimization
trade-offs that positively impact their designs. iFilter technology,
which was developed specifically for synthesis of lumped-element and
distributed filters, runs seamlessly as a module within Microwave Office!

AWR Connected™ for Cadence Allegro

• Now PCB layouts can be directly imported from Cadence Allegro. The
schematic is created so that the resulting S-parameters are automatically
wired to components and full dielectric stackup is transferred ready for
EM extraction with AWR’s ACE or AXIEM technology.

AWR Connected for Cadence Allegro

5
Product Focus: AXIEM Evolution
Dr. John Dunn, Senior Engineer, AWR

Introduction AXIEM – The Early Years AXIEM – Take the

As the wireless world grows and
evolves in response to consumer
demand for more features in an ever
smaller form factor, so too has high-
frequency EM simulation grown and
evolved. Once a back-end verification
tool in the high-frequency design flow,
EM simulation has become an inte-
gral part of the design process, and
AWR’s AXIEM 3D planar EM simula-
tion technology is at the forefront
in enabling designers to factor EM
simulation into the design flow right
from the beginning.
Embodying 20+ man years in develop-
ment, AXIEM is specifically aimed at
3D planar applications like RF printed
circuit boards (PCBs) and modules,
as well as LTCC, MMIC, and RFIC
design. AXIEM has quickly become
an invaluable integrated tool within
the AWR Design Environment, where
its capacity, accuracy, and speed are
proving to be competitive differentia-
tors for our customers in their time-
to-market race.
We were unable to EM this entire structure
using any other EM solver and turned to AWR
to give it a try. The insights gained as unveiled
by AXIEM opens up new vistas in mm-wave
design for Mimix.
(2007/2008)
AXIEM, in beta form, burst onto the
scene in 2007 as an unprecedent-
ed new technology that transformed
RF/microwave design by making
it feasible to perform EM analysis
at the beginning of the design flow,
where it can benefit designers most
by helping diagnose issues early,
thus significantly shortening the
design process. This first rev of
AXIEM boasted NLn(N) simulation
speed (where N is the number of
unknowns) as well as several other
innovations, including not only its
near linear scaling solver algorithm
but also advanced hybrid meshing
technology, both of which delivered
the capacity, accuracy, and speed
necessary to make use throughout
the design cycle a reality. In 2008
AXIEM became available to the
general engineering public and the
use of it for EM’ing designs began
in a big way.
Challenge! (2009)
In 2009, adoption spread widely
throughout AWR’s Microwave Office
customer base and delivered on the
tagline: Think Fast. Think AXIEM!
Documented customer success sto-
ries from companies such as Mimix,
Legrand, and TriQuint began to roll
in. New features introduced to AXIEM
included 64-bit platform support and
additional, extensive port and deem-
bedding options.
For example, coupled line calibration
became available. Line ports could
be grouped together for ease of use
in differential excitations and mu-
tual ground return between different
ports. Internal ports were enhanced
and made more powerful and flexible.
A grouped calibration option was add-
ed, so that ports close to each other
could include the proximity effects of
one another – a necessary feature
when using ports to connect devices
such as chip capacitors or FETs.
As respect for the abilities of AXIEM
grew, AWR offered the AXIEM Chal-
lenge to “put its money where its
mouth is.” AWR was so confident that
AXIEM could solve complex problems
faster than commercially-available,
competing tools, it promised to buy
lunch for the entire design team doing
the benchmark if proven otherwise.

Dr. Simon Mahon, Director of MMIC Design

Mimix Broadband, Inc.

6
The power and speed of AWR’s new AXIEM
3D planar EM software made it possible to
accurately and efficiently simulate the entire
structure of very complex NDPA MMIC.

Chuck Campbell, Fellow

TriQuint Semiconductor

AXIEM – No bounds!
(2010)
The latest version of AXIEM continues
to win new users and expand its mar-
ket presence. The AWR 2010 release
of AXIEM now has no bounds--literally!
Antenna capabilities are today part and
parcel of AXIEM and are quickly becom-
axiem 2010 key features
ing an indispensable tool for designers
• Seamless integration with Microwave Office® and Analog Office® software
of antennas.
• Proprietary full-wave planar EM solver technology
AXIEM v2010 is ideal for large, planar,
antenna designs, for example, arrays • Advanced hybrid meshing technology
with a large number of elements. De- • Numerous source/excitations including auto-calibrated internal ports
signers can finally study effects such as
• Parametric studies, optimization, and tuning
scan blindness, which can only be seen
by simulating the full array. Traditionally,
• 3D visualization and animation

the matrix solve in planar EM solvers • Support for 64-bit PC platform and multi-core configurations
is of the order N3, where N is the • Antenna capabilities
number of unknowns. By comparison, •  Works with existing antenna measurements
AXIEM’s fast solver technology scales •  New antenna gain measurements
as the order of Nln(N). So to illustrate, • And all the AXIEM benefits (larger problems, faster solve times, etc.)
if a designer increases the number
of antennas by a factor of 10, the
traditional solver will take 1000 times
longer to simulate (think 1000 min-
utes), whereas AXIEM would only need
35 times to do it (think 35 minutes to
solve). Post processing features have
been added so that the user can visual-
ize traditional antenna pattern measure-
ments for linear, circular, and elliptical
polarizations, and current patterns on
the antennas.

In less than three years, AXIEM has

achieved wide customer adoption and
has benchmarked better than other EM
tools that have been on the market for
decades. This year AWR is taking the
AXIEM Challenge to Japan, a country
renown for pushing EM to the limit with Vivaldi antenna in AXIEM.
the toughest of design problems.

7
Customer
Product Success Story
Update
Acreo Uses Visual System Simulator to Successfully
Optimize System Performance of Complex UWB Transceiver

Microwave Office DEsign environment

Nonlinear Behavioral Modeling

Customer
• Nonlinear Background
behavioral model support for Agilent’s X-parameters®,
“VSS gives us a deeper
Mesuro’s Cardiff model and more. Read “Nonlinear Behavioral Models”
Acreo AB, Kista, Sweden, refines and understanding of system aspects.
article in this magazine for more information!
transfers research results into industrially Its flexibility and open platform
MRHB™
viable products and processes in the means parameter optimization can
fields of electronics
• Multi-rate and optics.
harmonic balanceWith
(MRHB) technology wasquickly
first introduced
and easily be done. With
operations
in 2009in Kista, Norrköping,
and developed and
specifically for customersVSS
with spectrally
we were able to successfully
Hudiksvall, Acreo is active
rich simulations in printed system on chip, module, etc.). MRHB
(transceivers, realize our system.”
electronics, industrial
dramatically nano and
increases the speed and reduces the computer memory
Lars Pettersson, Research Engineer
microtechnology, photonics,
required to perform quantum analysis of complex nonlinear systems
steady-state Acreo AB
well infrared photodetector (QWIP)and the 2010 release delivers even faster www.acreo.se
with multiple signal sources
technology, sysem
simulation integration,
time andreduction in memory.
and greater
relations business services.
AWR Solution
Constant Compression/Constant Output Power Simulation
ISO9001 certified, Acreo operates We needed to
• Great for PA designers, this new feature takes advantage of advanced create a SCM
clean room facilities for thin-film and
APLAC® capabilities enabling compression to be computed from linear transceiver
volume printing production. The company
gain region or max gain region (i.e. gain expansion). link suitable
employs more than 150 people, the
Linear Stability
majority Analysis
of whom hold engineering and for 100Gb/s

post-graduate level degrees. function (NDF) and stability envelope transmission.

• Normalized determinant
The system-level
Themeasurement now available! And what’s more, they offer a more
Design Challenge development of a
comprehensive solution than standard stability metrics or Gamma Probes.
The need for higher capacities within SCM transceiver link
Connectivity
Internet Tracer is driving the
infrastructure was modeled within
demand for network
• Seeing architectures
is believing! The abilitycapable
to highlight all nets or user selected nets AWR’s Visual System
of supporting 100Gb/s Ethernet (IP)
and locate short or open circuits visually with ease is priceless. Check Simulator. This
2-Carrier SCM transceiver link simulation block diagrams and
basedout
traffic.
a live demo or AWR.TV video of this new feature! RF system model
simulation results in Visual System Simulator.
enabled us to assess
One such bandwidth-efficient technology
the influence of component performance in the electrical domain, particularly
being explored is sub-carrier multiplexing
non-linearity and noise, with respect to the SCM link performance requirements.
(SCM), where quadrature modulated
The design of critical component building blocks in the 65nm CMOS SOI process
(QAM) signals on different carrier
such as IQ modulators, power combiners, and low noise amplifiers (LNAs) for
frequencies are combined and
the SCM transceiver, were done at the circuit level. The performance of these
subsequently encoded onto an optical
components was then assessed in the VSS system simulation environment to
carrier. This transceiver approach
investigate the capabilities of CMOS for next generation optical networking with
capitalizes on the increasing speed of
the SCM architecture.
silicon technology (65nm complementary
metal oxide semiconductor CMOS process “Using Visual System Simulator together with Matlab® to create the RF system
on HR-SOI substrate) to perform more model proved to be a straightforward task.” said Lars Pettersson, research
of the signal processing in the electrical engineer at Acreo. “The flexibility, ease-of-use, and open platform of Visual
domain before converting to light. System Simulator was a very positive feature. Visual System Simulator gave a
good understanding of how group delay variations affected the whole system

Connectivity Tracer performance and we were able to optimize the system using this knowledge.”
iFilter

6
8
Customer Success Story

Microwave Office Software with ACE™ Technology Dramatically Cuts

Simulation Times of Multitest’s High-performance IC Test Boards

“Using AWR’s ACE technology,

Customer Background
Multitest is one of the world’s leading
suppliers of test equipment for
semiconductor integrated circuits (ICs).
It markets test handlers, contactors, and
automatic test equipment (ATE) printed
circuit boards (PCBs), which are used
for the functional test of individual chips.
They act as a mechanical and electrical
interface between the semiconductor
and the actual tester with the test
software. A high throughput rate,
measurement accuracy to the thousandth
of a millimeter, precision temperature
accuracy, and the latest in measurement
and production technology are all
important factors.
Multitest is able to accurately and
efficiently simulate PCB interfaces
prior to fabrication. This gives our
customers the confidence they
need before they even receive our
hardware.”
Ryan Satrom, Signal Integrity Engineer
Multitest
www.multitest.com
Analysis of routing strategy is
straightforward with ACE: if layout is
tuned, the RF model is automatically
updated and simulated. Image shows
Multitest’s test board routing layout
and simulation results.

The Design Challenge

Multitest’s main customers are
multinational manufacturers of
semiconductors who insist on the highest
quality standards in their products.
In order to ensure this high quality,
the company provides its clients with
highly innovative test handling solutions,
custom-tailored to fit individual needs and
requirements. Because high throughput
rate and accuracy are critical, Multitest
uses AWR’s Microwave Office with ACE
(automated circuit extraction) to simulate
and optimize its PCB designs simply,
accurately, and efficiently.
AWR Solution
Microwave Office enabled us to readily
create libraries for several different PCB
stackups (various numbers of layers and
thicknesses) characterized previously in
3D EM. Within each of these libraries,
via models were linked to .s2p files that
were simulated in a 3D simulator. Proper
via modeling (thru-hole and back-drilled)
is a critical component to accurate PCB
simulations. With the ACE technology
enabled within AWR’s Microwave Office
software, we were able to leverage the
ease, simplicity, and efficiency of ACE,
and the Microwave Office user interface
for that matter, to successfully simulate
any board desired while maintaining
appropriate via models as well.
AWR’s Microwave Office software with
its ACE innovation simplified a job that
used to take many hours into one that
is more streamlined -- completed in
significantly less time.
Why did you choose AWR?
We chose AWR software for several
reasons:
1) The user-friendly interface of the
software makes it easy to learn
2) PCB layout importing is
straightforward and robust
3) ACE is accurate and fast, giving us a
quick design turnaround
For these reasons and more, AWR’s
Microwave Office featuring ACE is a
winning combination for the design of
Multitest’s high-performance PCB test
boards. Personally, I’ve seen some
designs realize more than 50% saving in
simulation time (including set-up steps)
by adopting this methodology.

9
Nonlinear Behavioral Models – New Methods for
Nonlinear Device Characterization
Background
Linear and nonlinear device models are the building blocks of most RF and microwave
designs. S-parameters are often used to represent linear devices. As a “black-box” OPENWAVE FORUM
model, they can easily be obtained using a vector network analyzer and distributed
for simulation. S-parameters use superposition to equate the linear relationship
The OpenWave Forum (OWF)
between incident and reflected waves at all of the device’s ports. Nonlinear devices,
INTRODUCTION
however, distort waveforms such that their behavior cannot be represented through
The concept of using behavioral models
superposition or S-parameters. Fortunately, recent developments in measurement and
in nonlinear simulations has existed for
modeling technology have focused on technology-independent, measurement-based
20 years or more but only recently have
black box models.
advances in measurement technology
(improved arbitrary signal generation
Current Approaches Presented at IMS
and sampling techniques) allowed
Agilent (IMS Booth #924) practical implementation to become

• Develops Agilent’s X-parameters®, which are included in its N5242 nonlinear a reality. The OWF aims to ensure
usability of these new models in large-
vector network analyzer for large-signal measurements and Advanced Design
signal simulations, regardless of the
System software, and are applicable to large and small-signal conditions and for
measurement and modeling techniques
linear and nonlinear components. X-parameters are a mathematical superset of
that are used.
S-parameters and reduce to S-parameters in the small-signal region.
OWF BENEFITS
Anritsu & HFE Sagl (IMS Booth #2910)
The OWF is an alliance of RF and
• Provide state-of-the-art active load pull tuners, ultra-low-loss couplers and microwave firms that seek to
harmonic phase standard (HPS) designed to operate with the VectorStar VNA. ® collaborate, create, and promote a
The nonlinear load pull system offers multiple behavioral analysis data including unified and transparent data exchange
polyharmonic information representing current and voltage waveforms under format for large-signal simulations,

large-signal conditions. measurements, and models.

Rohde & Schwarz & NMDG (IMS Booth #2519) For a current list of OWF members, to
learn more and/or to join: go to
• Offer NMDG’s ICE platform that employs an R&S VNA (or VNAs and high
www.openwaveforum.org
frequency oscilloscopes from other vendors) to characterize nonlinear
components under real life signal conditions and to produce S-function models.
AWR®
These S-functions accurately predict harmonic and modulation behavior of Nonlinear Modeling
White Paper

the device under test and can be used within ICE or an external simulation AWR’S SUPPORT OF POLYHARMONIC DISTORTION AND
NONLINEAR BEHAVIORAL MODELS
Linear and nonlinear device models are the building blocks of most RF and

environment. microwave designs. S-parameters are often used to represent linear devices. As a
“black-box” model, they can easily be obtained using a vector network analyzer and
distributed for simulation. S-parameters use superposition to equate the linear
relationship between incident and reflected waves at all of the device’s ports.
Nonlinear devices, however, distort waveforms such that their behavior cannot be

Tektronix & Mesuro (IMS Booth #1033) represented through superposition or S-parameters.

Historically, nonlinear devices have been represented in simulation by compact

empirical or analytical SPICE models that operate in the time domain. Today’s
high-frequency circuit simulators analyze the linear portions of the network in the Malcolm Edwards
frequency domain and the nonlinear components in the time domain, resolving the AWR Corporation

• Deliver a characterization system to provide polyharmonic IV tables using two through an iterative technique called harmonic balance. malcolm@awrcorp.com

The process of developing a compact model, be it empirical or analytical, is costly,

time consuming, and potentially exposes the device maker’s intellectual property.
More importantly, since most compact model parameters are extracted from

arbitrary harmonic impedances. The data is used to populate the Cardiff Model, linear 50 ohm S-parameters and DC IV (static and pulsed) data, their ability to
predict behavior under extreme nonlinear conditions or non-50 ohm terminations
may be questionable. The cost of model development is not trivial, and the
resulting quality and availability varies among integrated device manufacturers.

developed by Cardiff University, providing an accurate behavioral model at powers This situation presents the high-frequency circuit designer with a bit of a dilemma.
Fortunately, recent developments in measurement and modeling technology have
focused on technology-independent, measurement-based black box models. This

of hundreds of watts at microwave frequencies.

white paper examines the different nonlinear models and measurement systems
available today and how they can be used with Microwave Office®, a leading
high-frequency design environment from AWR Corporation.

CHARACTERIZING NONLINEAR DEVICES

Nonlinear models are most often used to describe the behavior of transistors,
including the large-signal regime where power amplifiers and mixers operate.

Speak with AWR to learn more about these nonlinear behavioral modeling approaches
Large-signal computer models for devices are continually evolving in order to
keep up with changes in semiconductor technology. To attempt standardization
of model parameters used in different simulators, an industry working group
of semiconductor vendor companies and EDA vendor companies called the

and Microwave Office compatibility. A complete white paper on this topic written by
Compact Model Council (CMC), has been formed to choose, maintain, and
promote the use of standard models. An elusive goal in such modeling is
prediction of next-generation circuit performance and the identification of
technical direction for developing models capable of such predictions.

AWR’s Malcolm Edwards is available on www.awrcorp.com/mwo and more closely

This requires the selection of operating conditions that define the nonlinear
characteristics of devices, the nonlinear equations that replicate this behavior,
and extraction of the parameters to be used in these model equations. An
obvious alternative to using standard or evolving compact models to address the

examines the different nonlinear models and measurement systems available today
next-generation of devices would be to simply use the measured data directly, as
is the case for S-parameters and linear devices.

and how they can be used with Microwave Office, a leading high-frequency design
environment from AWR Corporation. “AWR’s support of PolyHarmonic Distortion
and Nonlinear Behavioral Models”, white paper
by Malcolm Edwards. (Found on the CD)
10
News Flash
AWR CEO Dane Collins tive spanning job functions from inte-

Elected to EDAC Board of
Directors
AWR CEO Dane Collins has been elected
to the Electronic Design Automation Con-
sortium (EDAC) board of directors. The
EDA Consortium is an international as-
sociation of over 100 companies develop-
ing EDA tools and services for the design
of electronics that enable the Information
Age, including communications, comput-
ers, space technology, medical and indus-
trial equipment, and consumer electron-
ics. The EDA Consortium seeks to identify
and address issues that are common to
its members and the customer commu-
nity that the member companies serve.
A part of the EDA fabric for 22 years,
Mr. Collins possesses a broad perspec-
grated circuit (IC) designer and EDA tool
developer to corporate executive, as well
as company environments from small
startups like EEsof, High Level Design
Systems, and AWR, to big corporations
(both commercial and military) like
Cadence and General Dynamics.
”I am pleased to have been elected to
serve on the EDAC board of directors and
contribute my many years of engineering
and executive experience to the organiza-
tion”, stated Mr. Collins. “I intend to make
it a priority to bring together the members
of our industry in a spirit of cooperation
in order to work towards finding solutions
and strategies that address the common Dane Collins
CEO
problems facing us and our customers
throughout the EDA marketplace.”
AWR

News Flash
AWR Graduate Gift direct response to industry and academia

Initiative expressing the need for students to have

access to these tools prior to graduation
AWR Graduate Gift Initiative provides
and entering the job market.
qualified 2010 graduates a fully-functional
“With the increasing demand for
1-year term license free for its popular
wireless-enabled devices and the de-
Microwave Office® and Visual System
crease in microwave and RF engineering
Simulator™ (VSS) software suites - inclu-
graduates, tomorrow’s designers will
sive of AXIEM™ 3D planar EM software.
need to work harder and smarter,” said
The goal of the initiative is to give gradu-
Sherry Hess, vice president of market-
ating electrical engineering students a
ing at AWR. “Making our design tools
career head start by providing hands-on
available to these graduates is one of
exposure to AWR’s high-frequency design
the goals of our program and is part of
software.
our commitment to making engineering
Working with universities worldwide to
students more attractive to industry by
empower students with access to RF/Mi-
helping them become proficient with the
crowave software tools, AWR’s Preferred
actual tools of the trade.”
University Program was launched in

7
11
 www.awrcorp.com GO FOR GOLD
www.awr.tv

USA
Corporate Headquarters
AWR Corporation
1960 E. Grand Avenue, Suite 430
El Segundo, CA 90245
+1 310 726 3000
GO FOR GOLD
+1 310 726 3005 (fax)
Take a well earned break from RF & microwaves during IMS 2010 and Go
Japan for GOLD at AWR’s 6th Annual Customer Appreciation Party!

AWR Japan KK
This year we are taking the party to the next level and launching the first
Level 5, 711 Building ever AWR GAMES! Join in the fun playing games that include:
7-11-18 Nishi-Shinjuku, Shinjuku-ku
Tokyo 160-0023 Japan Basketball - Hockey - Bowling - Football
+81 3 5937 4803
While you’re racking up the points for prizes, we’ll be serving cold drinks
Korea and hot food as you game the night away!
AWR Korea Co. Ltd.
B-1412, Intellige-ll, 24 Jeongia-dong,
bundang-gu, Seongnam-si,
Gyeonggi-do, South Korea, 463-811
+82 31 603 7772
Location and Time
UK
AWR UK Wednesday, May 26th
2 Hunting Gate
7:00 PM - Midnight

Hitchin, Herts
ESPN Zone Anaheim
SG4 0TJ, UK 1545 Disneyland Dr.
+44 (0) 1462 428 428 Anaheim, CA 92802
Phone: 714-30-3776
Finland
AWR – APLAC ANAHEIM
Lars Sonckin kaari 16
FI-02600 Espoo, Finland
+358 10 834 5900

France Sponsors
AWR France
140 Avenue Champs Elysees
75008 Paris, France
+33 1 70 36 19 63

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