Evolution 300 & 600 - Service Manual

The information in this publication is provided for reference only.
All information contained in

this publication is believed to be correct and complete. Thermo Electron Corporation shall not
be liable for errors contained herein nor for incidental or consequential damages in connection
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the information contained in this publication, are subject to change without notice.
This publication may contain or reference information and products protected by copyrights or
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not assume any liability arising out of any infringements of patents or other rights of third
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We make no warranty of any kind with regard to this material, including but not limited to the
implied warranties of merchantability and fitness for a particular purpose.
Copyright © 2004-2006 by Thermo Electron Corporation, Madison, WI 53711. All world rights
reserved. No part of this publication may be stored in a retrieval system, transmitted, or
reproduced in any way, including but not limited to photocopy, photograph, magnetic, or other
record, without the prior written permission of Thermo Electron Corporation.
For technical assistance, please contact:
Technical Support
Thermo Electron Corporation
5225 Verona Road
Madison WI 53711-4495 U.S.A.
Telephone: 800 642 6538 or +608 273 5015 (worldwide)
Fax: +608 273 5045 (worldwide)
E-mail: techsupport.analyze@thermo.com
Evolution, Smart Accessory, VISIONsecurity and VISIONpro are trademarks of Thermo

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269-166500
Evolution 300 and Evolution 600 Service Manual -i-
The following illustration shows the Evolution 300/Evolution 600 spectrophotometer top panel with standard and
optional features installed.
Contrast
LCD screen
Optional printer
Keypad
9
8 6
7 5 3
4 2 -
1 .
0
ro
Ze
n
Ru
Floppy disk
drive
Port for optional Sliding door
power supply
Sample
compartment
The illustration below shows the locations and uses of the connectors on the Evolution 300 and Evolution 600 right
side panel.
Zero
Ru
n
7
8
4
5 9
1
2 6
0
. 3
-
PRINTER KEY BD EXT ACCY RS232 EXT DISPLAY
- ii - Thermo Electron Corporation

The illustration below shows the locations and uses of the connectors on the Evolution 300 and Evolution 600 left
side panel.
Power ON/OFF switch Port for optional
Peltier power supply
9
8 6
7 5 3
4 2 -
1 .
0
o
Zer
Run
Power supply
connection
Power cord
The following illustrations show the locations of the connectors inside the sample compartment.
Evolution 300
Reference
connector
Sample
connector
- iii -
Evolution 600
Reference
connector
Accessory/detector
connector
Sample
connector
Accessory/detector
connector
- iv - Thermo Electron Corporation

Table of Contents
1.0 SAFETY ..................................................................................................................................................................1
1.1 CONVENTIONS USED IN THIS MANUAL...................................................................................................................1
1.2 GENERAL SAFETY PRECAUTIONS ..........................................................................................................................1
1.3 GENERAL RISK ASSESSMENT .................................................................................................................................3
2.0 GENERAL INFORMATION ...............................................................................................................................4
2.1 EVOLUTION™ 300 ................................................................................................................................................4
2.2 EVOLUTION™ 600 ................................................................................................................................................4
2.3 ABOUT THIS MANUAL ...........................................................................................................................................4
2.4 SPECIAL TOOLS .....................................................................................................................................................4
3.0 DESCRIPTION ......................................................................................................................................................5
3.1 OVERVIEW ............................................................................................................................................................5
3.2 SYSTEM OUTLINE ..................................................................................................................................................5
3.3 MAIN PROCESSOR CORE .......................................................................................................................................7
3.4 WAVELENGTH DRIVE ............................................................................................................................................7
3.5 STEPPER MOTOR DRIVES .......................................................................................................................................7
3.6 MAIN BOARD ANALOG CIRCUITRY ........................................................................................................................7
3.7 ACCESSORY INTERFACE ........................................................................................................................................8
3.8 ACCESSORY LAMPS ............................................................................................................................................10
4.0 LAMP SUB SYSTEMS........................................................................................................................................12
4.1 XENON LAMP ......................................................................................................................................................12
4.2 TUNGSTEN AND DEUTERIUM LAMPS ....................................................................................................................14
5.0 THE MEASUREMENT SYSTEM .....................................................................................................................17
5.1 EVOLUTION 300 MEASUREMENT SYSTEM OVERVIEW ..........................................................................................17
5.2 EVOLUTION 600 MEASUREMENT SYSTEM OVERVIEW ..........................................................................................21
6.0 OPTICAL SYSTEM ............................................................................................................................................22
6.1 EVOLUTION 300 OPTICAL SYSTEM DIAGRAM ......................................................................................................22
6.2 EVOLUTION 600 OPTICAL SYSTEM DIAGRAM ......................................................................................................22
6.3 FILTER WHEEL....................................................................................................................................................23
6.4 CHOPPER (EVOLUTION 600 ONLY) ......................................................................................................................24
7.0 LOCAL CONTROL POD ...................................................................................................................................26
7.1 OVERVIEW ..........................................................................................................................................................26
7.2 INTERNAL PRINTER .............................................................................................................................................26
8.0 OPERATION........................................................................................................................................................28
8.1 EVOLUTION 300 INITIALIZATION.........................................................................................................................28
8.2 EVOLUTION 600 INITIALIZATION.........................................................................................................................29
8.3 EVOLUTION 300 ENERGY PROFILE AND GAIN CONTROL ......................................................................................30
8.4 EVOLUTION 600 ENERGY PROFILE AND GAIN CONTROL ......................................................................................31
8.5 HOW THE EVOLUTION 300 ENERGY PROFILE IS MODIFIED ...................................................................................31
8.6 ADJUSTING THE GAIN MATRIX ............................................................................................................................32
9.0 PERFORMANCE AND SPECIFICATION TESTING....................................................................................36
9.1 RETRIEVING INSTRUMENT PERFORMANCE LIMITS ...............................................................................................36
9.2 EVOLUTION 300 PERFORMANCE SPECIFICATIONS ...............................................................................................41
9.3 EVOLUTION 600 PERFORMANCE SPECIFICATIONS................................................................................................43
-v-
9.4 PERFORMANCE TESTS USING THE LOCAL CONTROL SOFTWARE ......................................................................... 46
9.5 EVOLUTION 300 AND EVOLUTION 600 SPECIFICATION OVERVIEW .................................................................... 47
10.0 REMOTE DIAGNOSTICS................................................................................................................................. 48
10.1 CONNECTING THE INSTRUMENT TO A PC............................................................................................................ 48
11.0 REMOTE COMMANDS .................................................................................................................................... 53
11.1 ALPHABETIC LIST OF THE REMOTE COMMANDS .................................................................................................. 53
11.2 TEST AND CONFIGURATION COMMANDS ............................................................................................................. 70
12.0 ERROR MESSAGES .......................................................................................................................................... 81
12.1 ERROR TYPES ..................................................................................................................................................... 81
12.2 WARNINGS: ERROR NUMBERS 1000 - 1999........................................................................................................ 81
12.3 FATAL ERRORS: ERROR NUMBERS 3000 - 3999.................................................................................................. 83
12.4 ACCESSORY ERRORS: ERROR NUMBERS 5000 - 5999 ......................................................................................... 86
13.0 ROUTINE MAINTENANCE ............................................................................................................................. 87
13.1 ADDITIONAL MAINTENANCE TASKS EVERY 1000 HOURS OR 12 MONTHS ............................................................ 87
13.2 ADDITIONAL MAINTENANCE TASKS EVERY 2000 HOURS OR 24 MONTHS ............................................................ 87
13.3 AIRFLOW AND CLEANING ................................................................................................................................... 88
14.0 SERVICING......................................................................................................................................................... 90
14.1 ACCESSING THE LAMPS...................................................................................................................................... 90
14.2 REMOVING THE TOP COVERS .............................................................................................................................. 90
14.3 ACCESSING THE UNDERSIDE ............................................................................................................................... 91
14.4 REMOVING AND REPLACING THE POWER SUPPLY ............................................................................................... 92
14.5 REMOVING AND REPLACING THE OPTICS COVER ................................................................................................. 93
14.6 REMOVING AND REPLACING THE MAIN PCB ...................................................................................................... 94
14.7 CHECKING OPERATION OF SLITS AND FLIPPING MIRROR ..................................................................................... 95
14.8 REMOVING THE DETECTOR COVER ..................................................................................................................... 96
15.0 FAULT FINDING ............................................................................................................................................... 97
15.1 GENERAL ADVICE ON FAULT FINDING ................................................................................................................ 97
15.2 GETTING HELP FROM TECHNICAL SUPPORT......................................................................................................... 97
15.3 USING THE DEBUG INFORMATION ....................................................................................................................... 97
15.4 ERROR 1022 - NVM CORRUPTED ..................................................................................................................... 101
15.5 ERROR 1077 - WAVELENGTH TABLE COMPRESSION FAILED ............................................................................. 101
15.6 ERROR 3024 - MONOCHROMATOR REQUESTED TO DRIVE OUT OF RANGE ......................................................... 101
15.7 ERROR 3027 - INSTRUMENT FAILED TO INITIALIZE ........................................................................................... 102
15.8 INSTRUMENT FAILS TO WAVELENGTH CALIBRATE ............................................................................................ 102
15.9 ERROR 3060 - DEFAULT BASELINE CORRUPT.................................................................................................... 103
15.10 ERROR 3079 - DEFAULT BASELINE CANNOT BE COMPRESSED .......................................................................... 103
15.11 WAVELENGTH ERRORS .................................................................................................................................... 103
15.12 ABSORBANCE ERRORS ...................................................................................................................................... 103
15.13 NOISE ............................................................................................................................................................... 103
15.14 DRIFT ............................................................................................................................................................... 104
15.15 NOISE ON KINETICS DATA ................................................................................................................................. 104
15.16 FIXING BASELINE FLATNESS PROBLEMS .......................................................................................................... 104
16.0 HOW TO GUIDE .............................................................................................................................................. 114
16.1 HOW TO ALIGN THE OPTICS .............................................................................................................................. 114
16.2 HOW TO INSTALL A CTU (EVOLUTION 300 ONLY)........................................................................................... 122
16.3 HOW TO LUBRICATE THE MONOCHROMATOR DRIVE ......................................................................................... 123
16.4 HOW TO DISMANTLE A LOCAL CONTROL POD ................................................................................................... 125
16.5 HOW TO INSTALL AN INTERNAL PRINTER .......................................................................................................... 127
16.6 HOW TO CHECK THE FLASH TO HOLD DELAY (EVOLUTION 300 ONLY) ............................................................. 129
- vi - Thermo Electron Corporation

16.7 HOW TO CHECK ENERGY THROUGHPUT .............................................................................................................129
16.8 HOW TO REPLACE THE XENON LAMP .................................................................................................................130
16.9 HOW TO USE THE MAINTENANCE LOG ..............................................................................................................132
16.10 HOW TO USE RESET INSTRUMENT DEFAULTS ....................................................................................................133
17.0 PRODUCTION UTILITY AND SERVICE TOOL ........................................................................................136
17.1 REQUIREMENTS ................................................................................................................................................136
17.2 INSTALLATION ..................................................................................................................................................136
17.3 CONFIGURATION ...............................................................................................................................................136
17.4 REMOVAL OF THE SOFTWARE ...........................................................................................................................136
17.5 USING THE UTILITY ...........................................................................................................................................136
18.0 ACCESSORIES..................................................................................................................................................142
18.1 MERCURY LAMP ...............................................................................................................................................142
18.2 SMART ACCESSORY PCB ..................................................................................................................................143
18.3 OUTLINE CIRCUIT DESCRIPTION ........................................................................................................................143
18.4 ACCESSORY PCB CONNECTOR USAGE ..............................................................................................................146
18.5 ROTARY BASE UNIT...........................................................................................................................................147
19.0 SPARE PART NUMBERS ................................................................................................................................150
20.0 SCHEMATICS...................................................................................................................................................151
- vii -
1.0 Safety
Read this section carefully before servicing the instrument and its accessories.
This service manual is intended for internal use only by Thermo Electron qualified personnel. Any attempt to
perform the procedures described in this manual by anyone except authorized Thermo Electron Field Service
personnel may result in a non-operational device and may void the Thermo Electron warranty.
For more detailed information, see the Evolution 300 and Evolution 600 Site and Safety Manual.
1.1 Conventions used in this manual
This manual includes safety precautions and other important information presented in the following format:
Note Notes contain helpful supplementary information. ▲
Important Follow instructions labeled “Important” to avoid damaging the system hardware or losing
data. ▲
Caution Indicates a potentially hazardous situation, which, if not avoided, may result in minor or
moderate injury. It may also be used to alert against unsafe practices. ▲
Warning Indicates a potentially hazardous situation, which, if not avoided, could result in death or
serious injury. ▲
Danger Indicates an imminently hazardous situation, which, if not avoided, will result in death or
serious injury. ▲
1.2 General Safety Precautions

For the correct and safe use of this instrument and its accessories, it is essential that both operating and service
personnel follow generally accepted safety procedures in addition to those specified in this manual.
If you see the following symbol on the instrument or on an accessory, be sure to read the safety label and check the
information in the documentation that came with the instrument or accessory. The symbol indicates that there is
additional information in the documentation.
Your system was designed with protective covers to prevent exposure to dangerous voltage and other electrical
hazards. If you see the following symbol on your system, there is a risk of electric shock in the vicinity of the
symbol.
Removal of the instrument and accessory covers may expose hazardous voltages. Personnel removing covers
should be trained to avoid the risk of electric shock.
Evolution 300 and Evolution 600 Service Manual -1-

The following symbols alert you to damage from ultraviolet radiation. All personnel in the area must wear
protective UV-absorbing safety glasses.
Wear ultraviolet protective safety glasses at all times when servicing the instrument. The deuterium and xenon
lamps emit ultraviolet light that may cause eye damage. The tungsten-halogen lamp may burst upon excessive
voltage problems or if greasy residues are on the lamp surfaces. Use gloves when handling the lamps.
There is a high level of short wave UV radiation from the xenon and deuterium lamp. This is very harmful to
the skin and eyes. Always wear protective glasses/goggles that will absorb UV radiation and avoid looking
directly at the sources. Do not expose the skin to direct or reflected UV radiation. Engineers familiar with
deuterium lamps should note that the output from the xenon lamp is much more intense and potentially damaging
than that of the deuterium lamp.
Warning The tungsten and deuterium sources run extremely hot (tungsten ~250-300°C, deuterium
~150-190°C). Allow the instrument to cool for 15 minutes before servicing the lamps. ▲
The following symbol warns you about hot surfaces in the vicinity of the symbol.
To avoid a burn injury and the risk of fire or explosion, follow these guidelines:
¾ Avoid testing flammable or explosive samples.
¾ If the spectrophotometer will be purged, use a clean, nonflammable purge gas.
¾ Ensure the heater block temperature is less than the vaporization/flash point of the sample or reference
material.
¾ Do not touch hot surfaces.
¾ Never block the vents on the instrument or accessories.
- 2 - Thermo Electron Corporation

1.3 General risk assessment
Task Risk Accident Control Persons affected
Likelihood Severity
Access to equipment Specific to each Client to advise of local rules e.g. Thermo Electron
on Client site Clients’ Hardhats; safety shoes other engineer
premises protective clothing.
Access equipment Contamination Unlikely Chemical Client to complete decontamination Thermo Electron
with unknown Burn; certificate. engineer
substances Infection Notification of hazards in local
(biohazard) environment
Perform baseline Negligible risk
equipment tests
Working on open Electric shock Highly Unlikely Electrocution All electric cables are sleeved. High Thermo Electron
equipment with voltage circuits are not worked on. engineer
power source on
Use of substances Chemical Highly Unlikely Minor Very small amounts of substance Thermo Electron
For example: contamination used. Only handled by engineer Engineer
Adhesives; Client if in
degreasing sprays; immediate area
lubricants; solder
fumes
Check lamp Damage to eyes Unlikely Long-term eye Plastic / glass glasses absorb UV Thermo Electron
alignment from UV source damage Avoid looking directly into lamp. Engineer
Max duration ca. 30 min
Burn from UV Unlikely Minor Allow instrument to cool for 15 Client if in

or visible source minutes before servicing. Avoid immediate area
touching lamps.
General activities Cuts and Foreseeable Minor – Engineer training and competency Thermo Electron
within equipment scrapes to hands provided cut is engineer
cleaned and
covered
General activities Entanglement Unlikely Minor – Engineer training and competency Thermo Electron
within equipment within moving property engineer
parts damage

2.0 General Information
2.1 Evolution™ 300
This double-beam spectrophotometer uses a xenon flash source and a variable bandwidth monochromator. The
following variants are available:
Part Number Type Description

10300101 Evolution 300 Black Box with VISIONsecurity™ software
10300201 Evolution 300 Black Box with VISIONpro™ software
10300301 Evolution 300 Local Control
10300401 Evolution 300 Local Control and internal printer
10300501 Evolution 300 Black Box with no software
2.2 Evolution™ 600
This double-beam spectrophotometer uses tungsten and deuterium sources, a variable bandwidth monochromator
and a single photomultiplier tube (PMT) detector. The following variants are available:
Part Number Type Description

10600101 Evolution 600 Black Box with VISIONsecurity™ software
10600201 Evolution 600 Black Box with VISIONpro™ software
10600301 Evolution 600 Local Control
10600401 Evolution 600 Local Control and internal printer
10600501 Evolution 600 Black Box with no software
2.3 About this manual

This manual deals with the physical instrument only; it does not cover either the local control software or any
version of PC software.
Circuit and Assembly diagrams are in “Section 20.0.”
2.4 Special Tools

Refer to Special Tools

3.0 Description
3.1 Overview
The Evolution 300 and Evolution 600 are double-beam spectrophotometers based on a variable bandwidth Ebert
monochromator. The Evolution 300 uses a xenon flash tube as the source and silicon photodiode detectors over the
wavelength range 190 to 1100nm while the Evolution 600 uses tungsten and deuterium lamps as the sources and a
photomultiplier tube as the detector over a wavelength range of 190nm – 900nm. The products feature a range of
Smart Accessories™ such as a Smart Thermostatted Rotary 7-Cell Changer. These accessories have their own
processor and can be installed after instrument initialization into either position in the sample compartment.
3.2 System outline

Keyboard & Display Pod
L Astec
Timonta FKT2-45-4/1
N LPQ152
Switch and filter unit SMPS
E
DVI cable
-15 V +5V +24V

0V +15V
16VDC
0V Floppy Disc Drive
Self test motor
Main Processor Board
Accessory Bus Slit drive motor
Filter drive motor
Signal Filter wheel sensor
Sample
Preamplifier
Wavelength drive motor
Zero order sensor
+15V & control
Reference
Preamplifier
Xenon Lamp Xenon
Control PSU lamp
module
Accessory Lamp
(+5V & control lines)
Figure 3-1 Evolution 300 system block diagram

Figure 3-2 Evolution 600 system block diagram

3.3 Main Processor Core
This main processor is a Motorola® MC5407, which has a high-speed core and many integrated peripherals. This chip runs
from a 48MHz clock, which is internally multiplied to the speed required by the core. This chip requires 2 power supply
voltages, 3.3V for the peripherals and interface signals and 1.8V for the core. These are locally generated on the main PCB
from the 5V logic supply.
Two programmable logic devices are used to implement many of the logic and timing functions. IC102 provides address
decoding, memory interface and the LPC interface required by the Multi I/O chip, and other functions. IC702 provides the
measurement signal timing, the motor control logic and other functions.
The main program is stored in a 2MB 16 bit wide flash memory. A battery-backed module provides the NVM needed for
calibration and setup data while the main data store uses a PC style SDRAM module.
An Epson® SID13505F LCD controller, with its own EDO DRAM, provides the interface to the display. To simplify cabling,
the LCD control signals are converted to high speed serial signals via an LDVS transmitter chip IC603.
Finally, the normal interfaces, such as RS232, are provided by IC701 a PC87366 multi I/O controller.
3.4 Wavelength drive
This motor has to be controlled with a high degree of accuracy. It is half-stepped by a constant current driver. All of the
required functionality is provided by a UDN2916 driver IC mounted on the main control PCB.
3.5 Stepper motor drives
The Evolution 300 and Evolution 600 can have up to four smaller stepper motors. Common to both instruments are the slit
drive and filter drive. The flipping mirror drive and internal Calibration Test Unit (CTU) are Evolution 300 specific while the
chopper drive and source interchange drive are Evolution 600 specific. The drives for all these motors are on the main control
board. The same circuit is used for the Evolution 300 specific and common drives. These motors are driven directly from the
5V supply. The low side of the coil is switched to ground by means of an IPS021 driver circuit. The Evolution 600 specific
motors are driven by two separate L293DD, the source interchange motor from the 5V supply and the chopper motor from the
15V supply.
The input to all the drivers comes directly from IC702. All the logic for controlling the motors is in IC702. The IPS021 driver
is designed for automotive use and as such is very robust. It is very unlikely that this circuitry will fail. If one of these motors
is not working, check the interconnections and motor first.
3.6 Main board analog circuitry
The signals enter the board via two RJ45 connectors (PL201 and PL202) in the case of the Evolution 300 and one RJ45
connector for the Evolution 600 (PL202), straight into a differential input programmable gain amplifier. This has gains of x1,
x10 and x100 selected under software control. The outputs from these two programmable gain amplifiers go via an analog
multiplexer into the system ADC. The ADC is of the ratiometric type based on an Analog Devices AD650 voltage to
frequency converter. The system is set up to accept a full-scale input of 10V, which corresponds to a 500 kHz output from the
voltage to frequency converter. The AD650, IC206, will stop working if it receives a negative input voltage, this can occur due
to a negative offset from the preceding stages. To compensate for this a nominal offset, voltage of about 50mV is applied to
the input through R218.
The analog multiplexer, IC205, is used to switch between the sample, the reference channel, ground and a 5V reference. The
ground and 5V reference are measured; from this data, a system scaling factor is calculated.

3.6.1 Ratiometric ADC Principle
The ratiometric converter has several advantages. It effectively measures the period of the voltage to frequency converter,
rather than the frequency; this gives a resolution, which is more or less constant over the full measurement range. The system
uses two counters, a "fast counter", counting system-generated clock pulses and a "slow counter" which counts the actual
voltage to frequency converter pulses. The crucial point is that both counters are started and stopped synchronously with the
voltage to frequency converter pulse by using a D-type latch. Therefore, the fast counter period is an EXACT multiple of the
voltage to frequency converter period and so the actual full-scale frequency of the voltage-to-frequency converter is not a
prime factor in the resolution. The effective resolution is controlled by the frequency of the "fast clock". This means that there
is no need for a very fast voltage to frequency converter and the full-scale frequency can be set to a more modest value where
the linearity is best. In the Evolution 300, the fast clock is 48MHz; the counters are implemented in IC702.
3.7 Accessory Interface

The purpose of the Evolution accessory bus is to provide a means of communicating with a wide range of accessories, and to
allow others to easily be added to the range. In some cases it must also provide information about where an accessory is
installed.
The above requirements are met using a system based on the industry standard I2C specification. This specification defines a
physical interface based on a two wire serial bus, and a robust protocol to cope with collision detection and arbitration between
competing devices. Connections to the bus are via open collector drivers, which permit multiple parallel connections to the
same conductors.
3.7.1 Addressing
The I2C address of each device is made up of a fixed part, the base address, and a programmable part. In the Evolution 300,
the requirement for determining where an accessory is installed is to be met by allocating the programmable part of the
address to the physical socket. Two pins on each of the accessory sockets are hard-wired with a code specific to the location
of that socket.
Socket Function
0 Sample position
1 Reference position
3 Instrument services panel
Figure 3-3 Accessory addresses
3.7.2 Common accessory connector

Each accessory common to the Evolution 300 and Evolution 600 is installed with a male 15-way D-connector. A spike in
one of the mounting holes aligns the connectors to ensure they mate correctly. The connector on the accessory is firmly
mounted while the mating half on the instrument chassis is free to float, see Figure 3-5.
Figure 3-4 Accessory connector
-8- Thermo Electron Corporation

Figure 3-5 Instrument common accessory connector
The Evolution 600 also accommodates a diffuse reflectance accessory (DRA); this does not use the standard accessory
connector. The DRA uses a D-Sub and RJ45 connector mounted in the bridge between the sample and reference channels in
the sample compartment. See Figure 3-6 for details.
Figure 3-6 Evolution 600 DRA accessory connectors

3.7.3 Common accessory connector pin out
Pin Function
1 +15V
2 Serial Data (SDA)
3 0VL (Vss)
4 Address line zero
5 -15V
6 +16.4V (Peltier power)
9 0VP (Return for 15V)
10 +5V (Vdd)
11 Serial Clock (SCL)
12 Address line one
13 Peltier ground
14 Peltier ground
15 Peltier ground
Figure 3-7 Accessory connector pin assignment
3.8 Accessory Lamps

The lamp accessories are a special case; they only require power and limited control signals and have a fixed location;
therefore, they have a simpler interface.
Figure 3-8 Accessory lamp connector, instrument end
3.8.1 Lamp control

The software is able to switch these accessory lamps on and off by means of a single logic line. Two code lines are also
provided so that the type of lamp installed can be sensed, see table below.
Lamp Code 1 Code 2

None
For future use Low
Hg Low
Error Low Low
Figure 3-9 Accessory lamp coding

3.8.2 Accessory lamp connector
These lamps can be installed or removed without switching the instrument off. The connectors used are 9-way D-type with
the socket on the instrument and the plug on the accessory.
Pin Circuit Description

1 +5V Main power supply
2 Lamp Control Logic signal to operate the light switch
3 Code 1 Code line
4 Code 2 Code line
5 0VP Power return
7 N.C.
8 N.C.
9 0VL Logic signal return
Figure 3-10 Accessory connector pin assignment
Evolution 300 and Evolution 600 Service Manual - 11 -

4.0 Lamp Sub Systems
4.1 Xenon Lamp
The Evolution 300 uses a single xenon flashlamp source to cover the full wavelength range. The lamp is a
Hamamatsu® L4646 tube with a 3mm arc length. The maximum power rating of the lamp is 10W, and the
maximum safe flash rate is 100Hz.
The lamp is connected across a capacitor that is charged to a high voltage. A trigger pulse causes the gas in the
lamp to ionize and provide a discharge path for the energy stored in the capacitor. For reliable operation, the trigger
pulse has to have a fast rise time and about 5kV amplitude. It is has to be applied to the trigger electrodes in
sequence. This controls the way the gas ionizes and improves arc stability. A capacitor resistor network in the
trigger module controls the application of the trigger pulse to the trigger electrodes.
In the Evolution 300, the energy for each flash is stored on a 220nF capacitor. The arc current is limited only by the
equivalent series resistance (ESR) of the capacitor and the impedance of the leads to the lamp. It can exceed 75A.
The power supply is a 100W switching converter running from the +15V supply. Under normal operation, the duty
cycle is low; the high power output is needed in order to recharge the capacitor in 5ms or less. The flash voltage
has to be lower than the breakdown voltage of the gas in the lamp. In the Evolution 300, it can be varied between
700 and 1000V, giving a flash energy, ranging between 54mJ and 110mJ. The supply is designed to provide a dead
time of about 500µs after each flash. This allows to plasma in the lamp to recombine before the capacitor is
recharged. If this dead time is too short a continuous arc will be established and the lamp will rapidly be destroyed.
4.1.1 Xenon trigger module
The trigger assembly consists of a small PCB with the lamp holder and trigger circuitry mounted on it,
encapsulated in an ABS box that carries the modules fixings. Epoxy resin encapsulation is necessary to prevent
flashover on the PCB or lamp base. The circuit is shown in Figure 4-1.
5M6
R1
Gnd
Black
Trig
White
T1 R2 R3 R4
5M6 5M6 5M6

C1 C2 C3
47 pF 47 pF 47 pF
V+
Red
Figure 4-1 trigger module circuit
Views of the complete module are shown in Figure 4-2. This figure also includes a detail of the lamp showing the
electrodes.

Figure 4-2 the trigger assembly and lamp detail
4.1.2 The xenon power supply assembly

The xenon power supply PCB is mounted in a screening box on the underside of the casting, beneath the lamp
itself. The three leads to the lamp pass through the casting into the housing that covers the lamp and trigger
module. The main PCB needs to be removed to access the xenon lamp supply, see Figure 4-3, which shows the
three fixings holding the PSU box in place.
Figure 4-3 Location of the xenon lamp supply

Figure 4-4 Xenon PSU in screening box
When any work is carried out on this subsystem, it is essential that care be taken on re-assembly to ensure that all
the screening is in place, and that the toroid on the control cable is inside the screening box. The flash subsystem
produces a huge amount of electrical interference, if the screening is in any way impaired the instrument will not
operate correctly.
4.1.3 Xenon lamp Life
The xenon lamp has a rated life of 109 flashes, after which the output will have dropped to less than 50% of its
initial value. The main causes of lamp aging are burning of the main electrodes and deposition of metal from the
electrodes onto the window. The lamp will last longer if used with the high voltage supply set to between 700 and
800V, the typical operating conditions for an Evolution 300 instrument at 546nm 2nm bandwidth.
In order to improve performance where the energy is low and at narrow bandwidths, the EHT is varied with
wavelength and bandwidth. Customers who mainly use the instrument at narrow bandwidths may need a new lamp
during the lifetime of the instrument.
4.2 Tungsten and deuterium lamps
4.2.1 Tungsten Lamp
The Evolution 600 uses a miniature 12V 20W tungsten-halogen lamp in a quartz envelope that is pre-aligned and
held in place by a spring. See Figure 4-5 for more details.
Figure 4-5 Tungsten and deuterium lamps

4.2.2 Deuterium Lamp
The Evolution 600 uses a Cathodeon J15 deuterium lamp, see Figure 4-5. The following are electrical
specifications for the J15:
Heater Voltage – start (nominal): 10 Volts

Heater voltage – operational: 7 Volts
Heater Current: 1.5Amax
Arc Voltage: 55 – 90 Volts
Arc Current: 300mA
Operating Temperature: 150 to 190°C
Ignition Voltage (@ room temp.): 350Vmax
Lead coloring is: Anode = Red

Cathode = Black
Heater = Blue
4.2.3 Tungsten and deuterium lamp life

For detailed information, refer to the instrument and accessory Warranty.
The tungsten lamps are expected to have a life in excess of 1,000 hours.
Lifetime (to 50% of initial output) is > 1000 hours. The deuterium lamp is deemed to have failed when its output
drops to 50% of its initial value, although, the instrument will still be usable long after this point. When assessing
the deuterium lamp energy, take into account the optical performance of the bench. The optics should be clean and
correctly aligned.
4.2.4 Tungsten and deuterium power supply assembly

The tungsten and deuterium power supply PCB is mounted in a screening box on the underside of the casting,
beneath the optics compartment. The two cables to the lamps pass through the casting when the tungsten cable goes
directly to the lamp socket. The deuterium cable has an inline connector which plugs into the cabling of the
deuterium lamp. The main PCB needs to be removed to access the lamp supply, see Figure 4-6 and Figure 4-7 for
more details.
When working on the lamp power supply:
¾ High voltages are present, ensure that power to the board is OFF before beginning
¾ Let the instrument cool down for approximately 15 minutes as the screening box can get very hot
¾ If replacing the PCB, ensure that SIL pads are used to electrically isolate the four heatsinks around the
outside of the board – check continuity before replacing the assembly
¾ Even after the power has been shut off, be careful handling the PCB as the output capacitor for the
deuterium lamp may store change for some time

Figure 4-6 Location of the tungsten and deuterium lamp supply
Figure 4-7 Tungsten and deuterium PSU in screening box

5.0 The Measurement System
5.1 Evolution 300 measurement system overview
The Evolution 300 uses a short duration flash, rather than a continuous source. Because of this, special signal
processing techniques are required.
Each flash transfers charge from the photodiode to the first stage amplifier, which is configured as a high gain
"leaky integrator". Charge from the photodiode is transferred to the feedback capacitor where it is stored briefly
before discharging through the feedback resistor. The amplitude of the signal from this stage is determined by the
charge going in to the feedback capacitor and the capacitor value.
Next, the signal goes through a bandpass filter, which has three functions: it reduces high frequency noise on the
signal, it blocks DC to reduce the effects of light leaks (dark current and offsets), and it reduces the response to
100/120Hz signals from room lighting.
Preamp
Main board
Link
Differential amplifiers
Sample
Data to
Multiplexer ADC
Processor
Variable gain Bandpass Sample
pulse amplifier filter and hold
Reference
Other signals
Figure 5-1 Measurement System Block diagram
After the filter, a sample and hold captures the signal and stores it ready for conversion. The nature of the
flashlamp means that the flash-to-flash output varies too much for the sample and reference to be measured on
consecutive flashes. For this reason, both sample and reference are measured on the same flash. The analog data is
held by the sample and hold until both channels have been converted.
The sample and hold is on the preamplifier board, it has a differential output, which is taken via an RJ45 cable to
the main board. This type of cable is both screened and uses twisted pairs and so gives very good rejection of
EMC.
At the other end of the cable, the signal is received by a differential amplifier this gives good common mode
rejection, again helping to reduce pick up of electrical noise. The signal then goes to a multiplexer and then to the
ADC.

5.1.1 Preamplifiers
Figure 5-2 shows a simplified form of the preamplifier circuit. For clarity, power supplies, decoupling, etc., have
been omitted. The component designations match the full circuit shown in “Section 20.”
R1
C11 S1
R13
C12 S4
C1 TP1 C14
TP3 -
- C2 TP4
A1 - A3
Vo
R5 A2 +
D1 + S3
S2
+
TP2 C5
Figure 5-2 Simplified preamplifier circuit
Energy from the flash generates a charge on the photodiode; this is transferred to the feedback capacitors by means
of the virtual ground provided by A1. At maximum gain, the transfer function is about 200mV/pC. Once the pulse
has passed the charge leaks away through the feedback resistor R1, bringing the output back to zero ready for the
next flash.
Next, the signal passes through C2, which blocks any DC offsets from the first stage or photodiode. In conjunction
with R5, R13 and C14, it also forms a bandpass filter that reduces the effect of fluorescent lights at the low end and
high frequency noise at the upper end.
Switch S3 is normally closed so C5 is charged to the signal level. Some time after the flash, a signal opens S3 so
holding the signal on C5. A3 is a high impedance buffer that drives the link to the main board.
The following figures show the waveforms at TP1, TP3 and TP4. In each of these figures t = 0 is the active edge of
the flash signal. There is a delay, which varies from system to system, between the flash pulse and the output
starting to change at TP1. This delay is made up of the propagation delays in the trigger unit, the time taken for the
xenon gas to ionize and the response of the first stage.
The signal at TP3 is a delayed, inverted and smoothed version of that at TP1. This slowing of the pulse is very
important. It effectively filters out the timing jitter of the flash so that the timing of the sample and hold pulse
becomes less critical.
TP4 is the output signal from the preamplifier. In this example, the sample and hold switch is operated 100µs after
the flash signal.

1.00
0.00
-1.00
-2.00
Volts
-3.00
-4.00
-5.00
-6.00
-7.00
-50.0 0.0 50.0 100.0 150.0 200.0 250.0
Time (µs)
Figure 5-3 First stage output (TP1)
7.00
6.00
5.00
4.00
Volts
3.00
2.00
1.00
0.00
-1.00
-50.0 0.0 50.0 100.0 150.0 200.0 250.0
Time (µs)
Figure 5-4 Second stage output (TP3)
7.00
6.00
5.00
4.00
Volts
3.00
2.00
1.00
0.00
-1.00
-50.0 0.0 50.0 100.0 150.0 200.0 250.0
Time (µs)
Figure 5-5 Sample and hold output (TP4)

5.1.2 Dark signal measurement
During a normal measurement, the switch S2 (see Figure 5-2) is kept open and capacitor C2 blocks DC signals
from the first stage. This means that the dark signal from the photodiode is not seen by the measurement system.
The "dark" signal is measured when the instrument is zeroed, or a baseline is run and at a few other times. What is
actually being measured are the offsets of the remaining two amplifiers in the preamplifier and the offsets due to
the analog processing prior to the ADC on the main board. These offsets only vary slowly and so frequent "dark"
measurements are not required.
The switch S2 is only closed when the mercury lamp is being used. This is a continuous source and the signal from
it would be blocked by C2. Since the mercury lamp is only used in intensity mode, it is not necessary to make dark
signal measurements. It is the position of the mercury lines that is important, not their amplitude.
5.1.3 Measurement timing
The measurement timing is controlled by logic in the GAL, IC702, on the main PCB. The software initiates a
measurement cycle, which then runs automatically without further intervention. It starts on the falling edge of the
flash pulse. There is a delay (t1) of 17µs ±5µs from then until the signal is first seen at TP1. The time shown as t2,
is the delay from the flash signal to the point at which the data is sampled. This delay is a parameter called PDL,
which can be set using a remote command. The default value is 40, which corresponds to a delay of 80µs. The total
measurement cycle lasts 10ms during which time both the sample and reference channels are measured.
t2
FLASH
TP1
t1
TP4
Hold
ADC cycles Sample measurement Reference measurement
t3
Figure 5-6 Measurement timing

5.2 Evolution 600 measurement system overview
The Evolution 600 is based on a continuous wavelength (CW) light source and uses a chopped-beam and single
detector configuration so its measurement system is quite different from that of the Evolution 300. The chopper
alternately blocks and opens the beam over a 3-phase cycle, Sample (reference blocked), Reference (sample
blocked) and Dark (both blocked). The measurements taken are synchronized with these three phases. The
following is a typical measurement sequence:
1. Start and initialize the chopper (if not already running). Once the chopper is initialized and running, the
measurement code in the GAL is synchronized with the Sample/Reference/Dark cycles of the chopper.
2. On startup, the preamp gains are set as follows:
Sample gain is 1 (lowest)
Reference gain is 1 (lowest)
Dark gain is 67 (highest)
3. The EHT (i.e., PMT gain) starts off low on the first reading, otherwise is set at its most recent value and
is then automatically adjusted (if required) in real time to maintain a signal level of 4-8V.
4. The EHT control logic is somewhat predictive in that if the last signal level was very close to the 4V or
8V limits, then for the next reading the EHT is preset to a higher or lower level as needed. This
minimizes the amount of adjustment made during the measurement and so increases the speed at which
readings can be taken.
5. If the EHT is at maximum and the signal level is below the 4V threshold, the EHT is minimized, the
preamp gain is moved up to the next level (approximate preamp gains are 1, 8 and 67) and the EHT is
re-adjusted to obtain a signal level of 4-8V.
6. Once the signal reaches the main board the process is the same as the Evolution 300.
Figure 5-7 Evolution 600 measurement system block diagram

6.0 Optical System
6.1 Evolution 300 optical system diagram
The Evolution 300 uses a double-beam optical system. At the input, the optics are designed for a xenon flashlamp
as the main source to operate over the full wavelength range. However, provision is also made to install a mercury
lamp for wavelength calibration purposes. The lamp house mirror, M1, focuses the beam on the entrance slit.
Variable bandwidth is provided by a motor driven slit plate with provision on it for 6 bandwidths from 4nm to
0.2nm. The 0.2nm bandwidth is used for setup purposes by the software; it is not available to the user. An Ebert
configuration monochromator, similar to the well-proven UV Series design, is used for wavelength selection. In the
post monochromator optics, M3 provides a focus at the filter wheel; M4 bends the beam to make the instrument
footprint smaller. M5 refocuses the beam and directs it through the beam splitter. After this M8 and M9 steer and
focus the reference beam onto the detector. M6 and M7 do the same job for the sample beam but there is provision
between the beam splitter and M6 to fit a calibration test unit. The detector mounts have provisions for a focus
adjustment to ensure optimum light collection by the photodiode.
M8
M9
M3 M1
Reference
Photodiode Filter
Wheel
M5
Source
Sample M4
Compartment
Beam Slit plate

Sample Splitter Grating
CTU
Photodiode
M7
M6
Collimator (M2)
Figure 6-1 Evolution 300 optical system diagram
6.2 Evolution 600 optical system diagram

The Evolution 600 also uses a double-beam optical system. The input optics are designed for tungsten and
deuterium lamps as the main sources to operate over the full wavelength range. However, provision is also made to
install a mercury lamp for wavelength calibration purposes. The lamp select mirror, LM1, selects the appropriate
source depending on wavelength and or application and focuses the beam on the turning mirror, LM2. LM2 directs
the beam onto M1, which focuses it on the entrance slit. Variable bandwidth is provided by a motor-driven slit
plate with provision on it for 6 bandwidths from 4nm to 0.2nm. The Evolution 600 makes 0.2nm available to the
user. An Ebert configuration monochromator, similar to the well-proven UV Series design, is used for wavelength
selection. In the post monochromator optics, M3 provides a focus at the filter wheel; M4 bends the beam to make
the instrument footprint smaller; M5 refocuses the beam and directs it through the beam splitter.

The chopper alternately blocks and opens the beam over a 3-phase cycle, Sample (reference blocked), Reference
(sample blocked) and Dark (both blocked). After this M8 and M9 steer and focus the reference beam onto the
reference channel detector mirror DM2 while M6 and M7 steer and focus the sample beam onto the sample
channel detector mirror DM1. DM1 and DM2 steer and focus the light onto the photomultiplier tube (PMT)
detector. Mirrors M9 and M7 have horizontal and vertical adjustments to allow the sample and reference beams to
be adjusted to the PMT. Mirrors DM1 and DM2 are fixed. The adjustment must be made using the PMT alignment
tool.
Figure 6-2 Evolution 600 optical system diagram
6.3 Filter Wheel

The stray light and order sorting filters are mounted in apertures cut into a gear wheel. The wheel is driven by a
pinion mounted on a small stepper motor. There are six filter positions; these are listed in the table below.
Filter Material Default Wavelength range Comments

1 Clear 0.00 to 222.95nm
2 Hoya UG5 265.00 to 371.95nm Narrow bandpass stray light filter
3 Hoya B390 372.00 to 452.95nm Narrow bandpass stray light filter
4 Hoya CM500 453.00 to 589.95nm Wide bandpass stray light filter
5 Hoya O58 590.00 to 1100.00nm Order sorting filter, blocks shorter wavelengths
6 UV attenuator 223.00 to 264.95nm Energy profile adjustment
Figure 6-3 Evolution 300 filter wheel

Filter Material Default λ range Comments
1 Clear 0.00 to 285.00nm
2 Hoya U340 285.00 to 350.00nm Narrow bandpass stray light filter
3 Hoya B370 350.00 to 412.00nm Narrow bandpass stray light filter
4 Hoya CM500 412.00 to 511.00nm Wide bandpass stray light filter
5 Hoya Y48 511.00 to 900.00nm Order sorting filter, blocks shorter wavelengths
6 Clear Not selected
Figure 6-4 Evolution 600 filter wheel
6.3.1 Calibration Test Unit (CTU) - Evolution 300 only

This optional accessory uses the same mechanical parts as the filter wheel but with different glass.
Filter Material Function

1 Clear
2 Holmium oxide glass Wavelength checking
3 Nominal 1A neutral density glass Absorbance checking
4 WG295 For checking stray light at 220nm
5 GG375 For checking stray light at 340nm
6 Clear
6.4 Chopper (Evolution 600 only)

The Evolution 600 chopper consists of two thin metal blades on a common shaft. The blades are different in their
pattern of open and closed locations, designed to provide the proper timing of the sample, reference and dark
conditions (see Figure 6-2). A stepper motor drives the shaft. The chopper assembly also contains an infrared
calibration chopper assembly, which counts the blade rotations.
The infrared calibration sensor is active only when the chopper is being calibrated (either under instrument control,
or by using test commands). If the drive circuit malfunctions, there are two possible conditions.
1. The IR LED stays energized all the time

a. The chopper will calibrate, but there will most likely be stray light and/or photometric accuracy
issues.
2. The IR LED never energizes
a. The chopper will not calibrate, and an error message will be given.
The IR LED can be observed (when powered up) using either an infrared sensor card (MCM Electronics
#72-6722), or a night vision scope. In addition, observing the voltage drop across the LED can test the IR LED.
The chopper blades are inserted into the sample and reference light paths. The blades are offset from each other by
15 degrees, and are glued to the shaft using a special alignment fixture in manufacturing.
The chopper motor is a stepper motor controlled from the main electronics PCB. The operation is controlled by the
instrument software. It initializes and runs when the system starts collecting data. Data collection can only be
performed with the chopper running.
Chopper motor specifications:

Manufacturer: NPM
Model # PF35T-48W1
If the LC instrument or PC is controlled by VISION software, the chopper will run continuously. If the instrument
is controlled by LC only, the chopper will stop approximately one minute after an acquisition is completed.

6.4.1 Replace chopper motor
1. Disconnect the electrical connections.

2. Loosen the chopper shaft set screws.
3. Dismount the motor.
4. Mount the new motor.
5. Re-connect the electrical.
6. Power up the motor.
7. Position the sample blade with respect to the IR sensor.
8. Tighten the set screws
9. Use TES MECH CHO X.
10. Close the instrument.
11. Use TES CHO PEAK.
12. Run instrument tests.
6.4.2 Replace entire chopper assembly
1. Disconnect the electrical connections.

2. Remove the mounting screw
3. remove the filter wheel
a. remove the two mounting screws
b. set the filter wheel aside
4. Remove the chopper assembly
5. Replace the chopper by performing steps 1 through 4 (in reverse order).
Figure 6-5 Current production design of chopper

7.0 Local Control Pod
7.1 Overview
This is an optional unit fitted to local control instruments. All the signals and power required by the pod are routed
by a special DVI cable. This cable does include the industry standard signals for a DVI interface, but it also makes
use of some ways that are either optional or not fitted on the standard interface. These are used for additional power
lines and for the I2C interface. For this reason, this cable should never be replaced with a standard off the shelf DVI
cable.
The cable terminates at the interface PCB N4171, which includes the DVI "Panel link" interface circuitry. The DVI
interface uses fast serial signals for the display data, IC401 reconverts them to the form required by the display.
IC405 decodes the signals from the membrane keyboards. The data is returned to the instrument via the I2C bus.
The keyboard lines and control lines for the optional internal printer are interfaced to the I2C bus via IC 406. Serial
data comes directly through the DVI cable for the printer.
7.2 Internal Printer
The local control version of the Evolution 300 and Evolution 600 can optionally have a built-in printer. The printer
used is the Seiko® Epson LTP 2442 driven by an IF2202-02B interface board. The mechanism is mounted on the
back of the display pod, with the printer interface board mounted behind the display panel.
The printer interface board has two blocks of DIP switches mounted on it.
Switch 8 7 6 5 4 3 2 1
DIP 1 off off off off off off on off
DIP 2 off on off off on off on on
Table 7-1 Printer DIP switch settings

DIP switch 2
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
DIP switch 1
NOTE:
Switch numbering
Figure 7-1 Printer interface board showing DIP switches

8.0 Operation
8.1 Evolution 300 initialization
While the instrument is initializing, seven status messages are displayed on the screen. These are to inform the
operator of the progress of the initialization process. The title lines on the initialization page are associated with
status numbers 9 to 15 (status messages 1 to 8 are reserved for other products). When operating in terminal mode,
you only see the status numbers. The status number is output after the associated actions have been completed.
Initialize Accessories (Status 9)

The accessories are initialized. This is done first to ensure the beams are clear.
Measuring the 0V offset (Status 10)

¾ The zero and five volt reference signals are read and the ADC scaling calculated.
¾ The filter wheel is initialized and driven to the clear position.
¾ The Calibration Test Unit is initialized and driven to the clear position (Evolution 300 only).
¾ The slits are initialized and driven to 0.2nm. (0.2nm is used irrespective of the set minimum bandwidth).
Driving Mono to end stop (Status 11)

The wavelength drive is moved to the end stop sensor.
Find Zero Order (Status 12)

The zero order position is found. In normal circumstances, a fine search is conducted close to the stored position
where the peak was found last time. The 0.2nm bandwidth is used when searching for zero order; this is to reduce
the energy throughput so that the detectors do not saturate when the peak is found. The filter position used varies
from instrument to instrument; it is chosen to optimize the energy throughput for the white light peak.
If the peak is not found, a wide range coarse search is conducted to locate the correct position for the fine search.
Testing Slit Plate (Status 13)

This status message is not used at present; it is output as soon as the white light peak is found.
Measuring Xenon Lamp Energy (Status 14)

The monochromator is driven to 470nm and the 4nm slits are selected. When the CM500 filter is in the beam, all
gains set to zero and the lamp supply voltage set to its minimum value, the lamp energy is measured. A 10-second
reading is taken to warm up the lamp before the actual reading is taken.
Set defaults (Status 15)

Drives to the default wavelength and sets the 1.5nm bandwidth.
Measures zero.
Note These status codes may be displayed even if the function could not be completed correctly. Check for any
error messages after initialization has completed. ▲

8.2 Evolution 600 initialization
While the instrument is initializing, seven status messages are displayed on the screen. These are to inform the
operator of the progress of the initialization process. The title lines on the initialization page are associated with
status numbers 9 to 15 (status messages 1 to 8 are reserved for other products). When operating in terminal mode,
you only see the status numbers. The status number is output after the associated actions have been completed.
Initialize Accessories (Status 9)

The accessories are initialized. This is done first to ensure the beams are clear.
Measuring the 0V offset (Status 10)

¾ The zero and five volt reference signals are read and the ADC scaling calculated.
¾ The detector dark offset is measured.
¾ The preamp gains are calculated.
¾ The filter wheel is initialized and driven to the clear position.
¾ The slits are initialized and driven to 0.2nm. (0.2nm is used irrespective of the set minimum bandwidth).
¾ The lamp mirror position is found.
Driving Mono to end stop (Status 11)

The wavelength drive is moved to the end stop sensor.
Find Zero Order (Status 12)

The zero order position is found. In normal circumstances, a fine search is conducted close to the stored position
where the peak was found last time. The 0.2nm bandwidth is used when searching for zero order; this is to reduce
the energy throughput so that the detectors do not saturate when the peak is found. The filter position used varies
from instrument to instrument; it is chosen to optimize the energy throughput for the white light peak.
If the peak is not found, a wide range coarse search is conducted to locate the correct position for the fine search.
Testing Slit Plate (Status 13)

This status message is not used at present; it is output as soon as the white light peak is found.
Measuring Lamp Energy (Status 14)

The monochromator is driven to 340nm and the tungsten lamp energy is measured and reported as a percentage of
the stored 100% tungsten lamp energy level.
Set defaults (Status 15)

The lamp changeover wavelength is set.
¾ Drives to the default wavelength and sets the 1.5nm bandwidth.
¾ Measures zero.
Note These status codes may be displayed even if the function could not be completed correctly. Check for any
error messages after initialization has completed. ▲

8.3 Evolution 300 energy profile and gain control
The output from the xenon lamp contains many strong lines over a low continuum. In order to achieve acceptable
operation over the full wavelength range, it is necessary to try and reduce the variation in the output to something
nearer a constant level. Figure 8-1 shows how the instrument energy profile would look without any actions to even
out the peaks.
In the Evolution 300, three strategies are available to even out the energy profile: optical filtering, flash power and
gain switching.
Optical filtering: The high energy lines are in the UV. These are too big for the electronics to cope with so they
are partially attenuated using a special optical filter, which has a transmission of about 30% in the UV. It is in the
beam from 222 to 265nm. These limits are programmable.
Flash power: The energy in each flash depends on the voltage on the flash capacitor before the flash is triggered.
In the Evolution 300, this voltage can be varied from 700 to 1000V. It is possible to cause permanent damage to
the lamp by the incorrect use of this function. The preset value should not be changed, except to zero if the
signal is too big.
12.0
10.0
8.0
Intensity
6.0
4.0
2.0
0.0
100 300 500 700 900 1100
W avelength (nm)
Figure 8-1 Xenon energy profile
Gain control: There are four gains available on the first stage of the preamplifier. They are set by a number from
0 to 3. The actual gains vary from amp to amp but Table 8-1shows the typical values.
Gain no. Gain
0 1
1 1.71
2 5.85
3 24.1
Table 8-1 preamplifier gains
A second gain stage is available on the main board prior to the ADC, for simplicity we call this the ADC gain, this
gain is set by a number from 0 to 2 (see Table 8-2).
Gain no. Gain

0 1
1 10
2 100
Table 8-2 "ADC" gains

8.4 Evolution 600 energy profile and gain control
Optical filtering: Optical filtering similar to that of the Evolution 300 is used, however, due to the difference in
light sources and therefore energy levels the filters used are different.
Gain Control: There are three gain stages controlled on the Evolution 600; these are on the Photomultiplier tube,
the preamplifier and the ADC.
Photomultiplier Tube Gain: The high voltage that powers the photomultiplier tube is generated within the detector
module and is controlled by an external voltage of 0.3V to 1.1V. This is automatically generated by a 12-bit DAC
(IC705) on the control PCB and its value is dependent on the intensity of the light hitting the detector.
Preamplifier Gain: There are three gains available on the preamplifier. They are set by a number from 0 to 2. The
actual gains vary slightly from amp to amp. Typical values are shown in Table 8-3. These values are automatically
selected by software depending on signal levels.
Gain no. Gain

0 1
1 7.93
2 67.73
Table 8-3 preamplifier gains

ADC Gain: This is the same as that of the Evolution 300.
8.5 How the Evolution 300 energy profile is modified
The wavelength range is divided up into a number of segments, at present 23, but this number is programmable.
Each segment can have a separate set of gains and DAC values, for each bandwidth, and for both the xenon lamp
and the mercury lamp. The software has a large gain matrix that stores all this data. The contents of this matrix can
be examined using the command TES CON GS. Here is an example printout for part of a matrix. The "0.00" row of
the matrix is used by the software and should not be altered.
Xenon Lamp
Wave 0.2 0.5 1.0 1.5 2.0 4.0
0.00 [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0]
180.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 0 0]
201.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
217.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 1 1] [ 0 0 0 0] [ 0 0 0 0]
Table 8-4 Part of a gain table
The command for setting the data in this matrix is TES CON GS followed by 7 parameters.
The parameters are:

¾ The lamp, this can be either xenon or mercury
¾ The bandwidth
¾ The gain table segment number
¾ The DAC value, this value should not be changed. The default value is 0.
¾ The "ADC" gain this should always be 0 for the xenon lamp
¾ The sample preamplifier gain, a number between 0 and 3
¾ The reference preamplifier gain. This must have the same value as the sample channel.

Here is an example for the xenon lamp at 2nm, which sets the DAC and ADC to zero and the preamplifier gains
to 2.
TES CON GS Xe 2 5 0 0 2 2 <enter>
To completely fill the table, this command needs to be issued once for each segment for each bandwidth and for
each lamp. However, it is filled with default values at initialization and it should only be necessary to change one
or two entries to fine-tune and instrument.
Wavelength Segments
The number and position of the wavelength segments is programmable. To find how they are set on an instrument,
use the command TES CON BOU. This will display the current boundary settings of the instrument, as a list of
segment numbers and the start wavelength for that segment.
Note There is always a segment zero that starts at 0nm. This is used by the software, and it should not be altered.
Part of a sample printout is shown below. ▲
TES CON BOU <enter>

0 0
1 180
3 217
4 223
5 265
6 308
Table 8-5 part of boundary command output
Segment Start λ Segment Start λ Segment Start λ

1 180 9 432 17 819.5
2 201 10 470 18 834
3 217 11 480 19 877.5
4 223 12 497 20 918
5 265 13 523 21 975
6 308 14 545 22 990
7 372 15 590 23 997
8 412 16 614.5
Table 8-6 the default start wavelengths for each segment
8.6 Adjusting the gain matrix

Note The Evolution 600 does not use a gain matrix as gains are automatically calculated in real time based on
signal levels. ▲
Caution Do not attempt this operation unless you have been through an Evolution 300 service course. ▲
Problems with the gain settings usually cause either baseline spikes or excessive noise. Baseline spikes are due to
energy peaks causing part of the signal processing chain to saturate. This should only occur if the xenon lamp is
changed, if adjustments are made to the optics that improve the energy throughput, or if the preamplifiers have to
be changed for any reason. Excessive noise is a symptom that there is too little energy getting through the system,
either due to dirty optics or falling output from an aging lamp. In either case, it may be possible to improve
performance by adjusting the gain matrix.

The best way to assess the gain settings is by running a baseline flatness test. Set up a scan over the wavelength
range and bandwidth of interest; use a scan speed of 120nm/min and a data interval of 2nm. Run a baseline and
then a scan.
8.6.1 A gain problem test case
Figure 8-2 shows a 2nm bandwidth baseline with a problem near 420nm.
0.0015
0.0010
0.0005
Abs
0.0000
-0.0005
-0.0010
-0.0015
0 200 400 600 800 1000 1200
Wavelength (nm)
Figure 8-2 a problem baseline
The next step is to get a detailed energy profile over the problem area. Switch to sample intensity mode and scan
over the spikes at 0.5nm data interval with a scan speed of 600nm/min.
12.0000
10.0000 Before After
8.0000
Intensity
6.0000
4.0000
2.0000
0.0000
400 420 440 460 480 500
Wavelength (nm)
Figure 8-3 Energy profile before and after changing the gains
This was done for the problem instrument; the results are shown in Figure 8-3. The trace "before" clearly shows the
signals saturating for about 10nm above 420nm. Use the TES CON GS command to get the gain settings for this
wavelength range. In this case, the preamplifier gains were set to 3.

From Table 8.6 it can be seen that this wavelength range falls in segment 8. Therefore, the command to reduce the
preamplifier gains from 3 to 2 is:
TES CON GS XE 2 8 0 0 2 2
This command was sent to the problem instrument and the energy scan was repeated, this is shown in Figure 8-3 as
the trace "after". Clearly the saturation is no longer occurring. The baseline test was repeated as is shown in
Figure 8-4.
0.0015
0.0010
0.0005
Abs
0.0000
-0.0005
-0.0010
-0.0015
0 200 400 600 800 1000 1200
Wavelength (nm)
Figure 8-4 Baseline after gain adjustment
For this example instrument, this process was repeated for segment 15 (590 to 614.5nm) and again the preamplifier
gains were reduced by 1 step. Figure 8-4 shows the resulting baseline, which is well within the specification limits.
Caution Gains should only be reduced if absolutely necessary. Reducing the gain degrades the
signal-to-noise ratio and may result in an unacceptable noise level at higher absorbances. ▲
It is recommended that you save the output of the TES CON GS command to a text file as a form of backup. If an
error is made, the original values can then be reentered.
Low energy
In the example above, the spikes were caused by high energy peaks. Low energy will also cause poor baselines.
This can usually be identified because it results in a lot of noise rather than a small number of large spikes. Use the
same approach to correct this problem, this time increasing the gain as required.
8.6.2 Adjusting the filter change points
If the problem still persists when the relevant gains are set at their maximum, check if the problem is occurring
near to a filter change. The filter change points are programmable and can be moved in 0.1nm steps. The command
to recall the current settings is TES CON STR, here is an example:
TES CON STR <enter>
0 Clear 222 UV attenuator 308 UG5 372 B390 453 CM500 590 O58
To change one of the filter wavelengths, reenter the command adding the full list of wavelengths including the new
value. Here is an example:
TES CON STR 222 308.55 372 453 590 <enter>
This will move the 308 point to 308.55nm.
Caution The filter change points should not be moved by more than 1 or 2nm, other performance
parameters may be compromised. ▲

9.0
8.0
7.0
Signal energy (V)

6.0
5.0
4.0
3.0
2.0
1.0
0.0
100 300 500 700 900 1100
Wavelength (nm)
Figure 8-5 A typical 2nm bandwidth energy profile
Caution A new default baseline must be run after making any changes to the gain matrix or the filter
change points.▲

9.0 Performance and Specification Testing
The Evolution 300 and Evolution 600 incorporate as many as possible of the performance tests into the instrument
software, together with the specification limits for that instrument. In this way, any specification changes specific
to that instrument stay with it. The stored values are the correct limits for that particular instrument, not the values
published in this or any other documents. The specification limits are stored in such a way that they are preserved if
the instrument software is upgraded.
Some of the tests are available in the basic instrument, others require an accessory. A full list of what is available is
shown in Table 9-1.
Test No Hg lamp CTU CVC CTU CVC CVC CVC

accy. CTU Hg lamp Hg lamp CTU
Hg lamp
UV Abs √ √ √ √
Abs Acc CTU (0&1A) √ √
Abs Rep CTU (0&1A) √ √
Abs Acc CVC (0&1A) √ √ √ √
Abs Rep CVC (0&1A) √ √ √ √
Noise 0A √ √ √ √ √ √ √ √
Noise 1A √ √ √ √ √ √
Drift √ √ √ √ √ √ √ √
Baseline √ √ √ √ √ √ √ √
Wav Acc (Hol CTU) √ √ √
Wav Acc (Hol CVC) √ √ √ √
Wav Acc (Xe) √ √ √ √ √ √ √ √
Wav Acc (Hg) √ √ √ √
Stray (220/340 CTU) √ √ √
Stray (220/340 CVC) √ √ √ √
Bandwidth √ √ √ √
Table 9-1 Performance tests available with various accessories
It is recommended that where possible any performance testing should be carried out using the instrument software
as indicated above.
9.1 Retrieving instrument performance limits
The pass limits for each of the tests are programmed into the instrument in the factory. The data can be retrieved
using a series of special commands from the remote interface. Table 9-2 and Table 9-3 list these commands, the
response you get, and an explanation of each one is given.
In each case, the syntax is the same. For example, to access the wavelength repeatability limits you type
TES CON WAC <enter>.
The instrument responds with the limits, in this case 0.3.
When an accessory such as a CVC is installed, further test data can be retrieved. The command in this case is:
TES VAL CVC <enter> for CVC data
Or
TES VAL CTU <enter> for CTU data.
An example of the output from a CVC is shown in Table 9-4, together with some explanatory notes.

Note 1 Noise limits for earlier versions of the Evolution 300 (firmware versions 1.09 and earlier) were
specified in peak-to-peak format. Noise limits for the new Evolution 300 (firmware versions 2.00 and
later) and all Evolution 600 instruments are specified in RMS format. ▲
Note 2 When adding the tolerance of filters to the instrument tolerance (during measurement of absorbance
accuracy) the root-sum-square (RSS) method must be used. For example, for a 1A filter, the
instrument tolerance is ±0.001A and a typical filter tolerance may be ±0.004A. The RSS of these
tolerances is
√[ (0.001)2 + (0.004)2 ] = ±0.0041231A. ▲

Command Response Explanation
tes con aac 0-1A 0.0040, 1-2A 0.0060, 2-3A The absorbance accuracy should be equal to or better than ±
0.0120 the filter tolerance plus:
From 0 to 1A ± 0.002A
From 1 to 2A ± 0.004 to ± 0.006 linearly interpolated.
From 2 to 3A ± 0.006 to ± 0.012 linearly interpolated.
tes con are 0-1A 0.0020, 1-2A 0.0040, Absorbance repeatability from 0 to 1A <= ± 0.001A
2-3A 0.0080 From 1 to 2A <= ± 0.004A linearly interpolated.
From 2 to 3A <= ± 0.008A linearly interpolated.
tes con noi 0-1A 0.0003, 1-2A 0.0004, Photometric noise at 500nm:
2-3A 0.0300,500 From 0 to 0.5A <= ± 0.0003A
From 0.5 to 1.5A <= ± 0.0004A
From 1.5 to 2.5A <= ± 0.03A
tes con dri Limit 0.0005, Wave 340 Photometric drift at 340nm
Not greater than 0.0005A/hr.
tes con bas Lower 200, Upper 800, Basleline flatness, at 120nm/min, low smoothing:
Between 0.0010, Outside Between 200 and 800 nm, <= ±0.001A
0.0020, Smoothing 1, Between 190 and 200nm <= ±0.002A
Speed 120 Between 800 and 900nm <= ±0.002A
tes con wac 0.3 The wavelength accuracy limit is ± 0.3nm.
tes con wre wav rep 0.10, Bandwidths 10 The wavelength repeatability should <= ± 0.1nm. Checked
at 0.5 and 1.5nm bandwidth.
The bandwidth figure is an encoded shorthand used by the
software. Convert the number to binary and then see
diagram, which illustrates this example. (10 decimal =
00001010 binary)
M SB LSB
0 0 0 0 1 0 1 0
X X 4.0 2.0 1.5 1.0 0.5 0.2
tes con stl KCl 200 nm 2.0, Filter 220 nm Stray light at 200nm using potassium chloride solution
3.0, NaI 220 nm 3.3, >=2.0A.
Filter 340nm 3.0, NaNO2 340 nm Stray light at 220 nm using the filter >=3.0A, using sodium
3.7 iodide solution >=3.3A
Stray light at 340nm using the filter >=3.0A, using sodium
nitrite solution >=3.7A
tes con res Limit 10.0, Band 10, Wave 16 Bandwidth measured should be <=10% of the set value.
Test to be carried out at 1.5 and 0.5 nm bandwidths.

(encoded see above).
Test wavelength, mercury line at 546.07nm. The wavelength
data is encoded in a similar way to the bandwidths. See
diagram. (16 decimal = 00010000 binary)
M SB LSB
1 0 0 0 0
5 4 6 .0 7 4 3 5 .8 4 4 0 4 .6 6 2 9 6 .7 3 2 3 5 .6 5
Table 9-2 Evolution 300 commands for reading programmed test limits

Command Response Explanation
tes con aac 0-1A 0.0010, 1-2A 0.0020, 2-3A, The absorbance accuracy (photometric accuracy) should be better or equal to the tolerance of the
0.0050 instrument + the tolerance of the filters.
NOTE when adding together the tolerances the root-sun square (RSS) method must be used. See
“Section 9.1, Note 2” for more information on using the RSS method.
tes con noi 0-1A 0.00015, 1-2A 0.00025, 2-3A Photometric noise at 500nm. 2nm SBW, 5 sec integration time, RMS drift corrected.
0.00030, Wave 500 Int time 5
tes con dri Limit 0.0005, Wave 500 Stability at 500nm <0.0005A/Hr. 2nm SBW, 1 sec integration time. 2Hr warm up time.
tes con bas Lower 200, Upper 800, Between Baseline flatness ≤± 0.001A from 200-800nm. 4nm SBW, 1nm interval, 0.25 sec Integration
0.0010, Smoothing 2, Speed 120 (120nm/min), Smooth using 17 point (Medium) Savitzky-Golay filter.
tes con wac 0.3 The wavelength accuracy is ±0.3nm over the 190-900nm range (using the mercury lamp).
However, it is ±0.1nm at the 656.1nm D2 line, this is measured by averaging 10 readings under the
following conditions: SBW: 0.2nm, Scan Speed: 30nm/minute, Interval: 0.05nm.
tes con wre Wave rep. 0.10, Bandwidths 9 The wavelength reproducibility is ≤±0.1nm when the standard deviation of 10 measurements of the
following is taken: Peak separation of 10 scans of the 656.1nm D2 line.
tes con stl KCl 200nm 2.0, Filter 220nm 3.0 Stray light @ 200nm using potassium chloride < 1.0%T
NaI 220nm 3.7, Filter 340nm 3.0 Stray light @ 220nm using sodium iodide < 0.02%T
NaNO2 340nm 3.7 Stray light @ 340nm using sodium nitrite < 0.005%T
tes con res Limit 10, Band 9, Wave 64 Configuration parameters for resolution test
Table 9-3 Evolution 600 commands for reading programmed test limits

CVC data printout Explanatory notes
General data
Serial Number : 32438 CVC serial number
Cal Date : 05-03-03 CVC calibration date
Absorbance test data
Zero location : 1 Position of zero filter for visible absorbance test.
Filter location : 3 Position of absorbance filter.
Wave : 546.00, Abs : 0.9245, Tol : 0.0020 Wavelength, value & tolerance of absorbance filter
Noise test data
1A filter location : 3 Position of 1A filter to use for noise test.
2A filter location : 0 No 2A filter fitted for noise test.
UV Abs Set : FALSE UV abs set not used for noise test.
UV absorbance test data
Zero location : 4 Position of UV absorbance blank
Filter location : 5 Position of UV absorbance cell
Wave : 235.00, Abs : 0.8055, Tol : 0.0150 Wavelength, value & tolerance of UV absorbance cell
1A filter location : 0 1A filter not used in this test.
2A filter location : 0 2A filter not used in this test.
UV Abs Set : TRUE UV abs set to be used for this test.
Wavelength accuracy test data.
Zero location : 1 Position to be used for baseline.
Filter location : 2 Position of wavelength filter.
Wave : 279.30, Tol : 0.30 Peak 1 wavelength & tolerance.
Stray light test data.
Type : WG295 (220 nm) Filter type and wavelength
Zero location : 1 Position used for zero
Filter location : 6 Filter position
Type : GG375 (340 nm) Filter type and wavelength
Zero location : 1 Position used for zero
Filter location : 7 Filter position
Table 9-4 An example of CVC data

9.2 Evolution 300 Performance Specifications
This section gives details of the all the performance tests, together with the test methods and the default
specification limits.
9.2.1 UV Absorbance Accuracy
Specification: Measured at 235, 257, 313 and 350nm, 1.5nm BW with a 3-second integration time.
At each wavelength, the measured absorbance should be within ±0.004A ± the cell tolerance.
Method: In FIXED mode set a 3-second integration time and a 1.5nm bandwidth, do not use smoothing. For each
of the four wavelengths zero the instrument on the blank cell and measure the absorbance of the dichromate cell.
9.2.2 Absorbance Accuracy

Specification: Measured at 546nm, 1.5nm BW, using ND Filters.
Near 1A ± 0.004 A
Near 2A ± 0.006 A
Near 3A ± 0.012 A
Method:
Caution If your filters are not in NIST style mounts, a 15mm beam height cell holder will be required. ▲
This test must be performed at 546mm, 1.5nm bandwidth, in FIXED wavelength mode. The integration time must
be 3 sec, do not use smoothing. Make three readings on each filter and record the results.
1. ZERO the instrument on filter "0".

2. Measure each of the remaining 6 filters as shown in the table below.
3. Check that each of the readings falls within the allowed band for that filter, as shown in the Table 9-5.
4. Check that the repeatability of each block of three readings is within the allowed band for that filter, as
indicated in Table 9-5.
Filter Approx. Filter Instrument Allowable Repeatability

Number ABS tolerance tolerance range range
0 0.03 ± 0.001 ± 0.004 ± 0.005 ± 0.002
1 0.13 ± 0.001 ± 0.004 ± 0.005 ± 0.002
3 0.45 ± 0.0015 ± 0.004 ± 0.006 ± 0.002
4 0.9 ± 0.004 ± 0.004 ± 0.008 ± 0.002
6 1.8 ± 0.004 ± 0.006 ± 0.010 ± 0.004
7 2.4 ± 0.005 ± 0.009 ± 0.014 ± 0.006
8 2.9 ± 0.006 ± 0.012 ± 0.018 ± 0.008
Table 9-5 Absorbance accuracy and reproducibility limits
9.2.3 Photometric Noise

Specification: Measured at 1.5nm bandwidth, 500nm wavelength with a 1 second integration time.
Consecutive readings are taken for 30 seconds, the peak to peak variation should be less than or equal to:
0.00015 A pk-pk at 0A
0.00020 A pk-pk at 1A
0.00040 A pk-pk at 2A

Method: Ensure that the instrument has had at least 2 hours to warm up.
Select FIXED mode and drive to 500nm, at1.5nm bandwidth with the integration time set to 3 seconds. Zero the
instrument, put in a neutral density filter to give the required absorbance and press RUN. After 30 seconds press
STOP. Repeat this test for each of the three absorbances.
For each data set, fit a straight line through the data and calculate the peak to peak value relative to this line. Check
the results against the specification limits given above.
9.2.4 Zero drift
Specification: The reported absorbance at or near 0A should not vary by more than 0.0005 A/hr, measured at
340nm, with a 1.5nm bandwidth and a constant ambient temperature. The temperature coefficient of zero drift to be
better than ± 0.0002 per 5 °C.
Method: Ensure that the instrument has had at least 2 hours to warm up. Set up the instrument in fixed mode at
1.5nm bandwidth, 340nm, and integration time 3 seconds. Make a reading every minute for a period of at least 1
hour.
Fit a straight line through the data set to show the trend. Check that it is within the specification limits given above.
9.2.5 Baseline Flatness
Specification: Measured at or near 0A using a scan speed of 120nm/min, with a 2nm data interval, 1.5nm
bandwidth and low smoothing:
± 0.001A over the wavelength range 200nm to 800nm.
± 0.002A over the ranges 190 to 200 and 800 to 900nm
Method: Ensure that the instrument has had at least two hours to warm up. Scan between 190 and 900nm, 1.5nm
bandwidth, 120nm/min, with a 2nm data interval, scale ±0.005 A, smoothing set to low.
Perform a baseline and then a scan. The trace should not show any filter change steps greater than 0.001A in size.
9.2.6 Wavelength Accuracy & Reproducibility

Specification: Wavelength Accuracy, when scanning with a 0.05nm data interval the wavelength errors should be
≤ ± 0.3nm over the full wavelength range.
Wavelength Repeatability: repeat readings of the same peak should be within 0.1nm of each other.
Method 1 — Using filters: This test is carried out in absorbance mode, at 1.5nm bandwidth, with a 0.05nm data
interval and a 30nm/min scan speed. For each of the peaks a 5nm wide scan, centered on the nominal value, is
performed, following a clear beam baseline. Which peaks are used depend on the type filter fitted and whether it is
traceable to NPL or NIST. Table 9-6 shows the peaks used on a typical system fitted with an NPL traceable
holmium filter.
Holmium Filter Allowable

Tolerance Tolerance Range
279.3 ± 0.3 278.3 - 280.3
360.7 ± 0.3 359.5 - 361.9
453.3 ± 0.3 452.1 - 454.5
Table 9-6 Wavelengths used for an NPL traceable holmium filter
Method 2 — Using mercury lines: This test is carried out at 1.5nm bandwidth. Each of six mercury lines is
scanned in turn over a range of 5nm using sample intensity mode; a 0.05nm data interval and a 30nm/min scan
speed. Ensure that the instrument is set to use the mercury lamp before performing the scans. Each line should be
found within the instrument tolerance shown in Table 9-7.

Line Wavelength Instrument
range (nm) tolerance
253.7 252.0 to 256.0 ±0.3
296.7 295.0 to 299.0 ±0.3
435.8 434.0 to 438.0 ±0.3
546.1 544.0 to 548.0 ±0.3
761.0 759.0 to 763.0 ±0.3
871.7 870.0 to 874.0 ±0.3
Table 9-7 Absorbance accuracy limits using mercury lines
9.2.7 Stray Light

Specification:
Wavelength Limit Comment

200nm > 2.0 A Measured using a 12g/l Potassium Chloride solution
220nm > 3.3 A Measured using Sodium Iodide
340nm > 3.7 A Measured using Sodium Nitrite
Table 9-8 Stray light specification
Method: Stray light at 200nm is measured by scanning the test solution over the range 198 to 202nm at a 0.05nm
data interval, a speed of 30nm/min and a 1.5nm bandwidth. The baseline should be run using de-ionized water as a
blank.
At the other wavelengths, the stray light is measured in FIXED wavelength mode, at the appropriate wavelength,
with the bandwidth set to 1.5nm. Set 3 cycles each with an integration time of 3 seconds. Record the results.
Average the 3 results to get the final answer.
Zero the instrument with clear beams. Put the solution in the sample position and run the measurement. Check the
results against the specification limits.
9.2.8 Bandwidth
Specification: The half height width of the mercury 546.1 line should be within 10% of the set bandwidth. This
should be checked at 1.5 and 0.5nm bandwidths.
Method: Set up the instrument to scan the range 544 to 548nm at 30nm/min with a 0.05nm data interval in sample
intensity mode. Switch to the mercury lamp and run the scan. Find the height of the peak above the base line.
Measure the width of the peak at half the peak value above the baseline. The result should be within ±10% of the
set bandwidth. Do this test for 1.5nm and 0.5nm bandwidths.
9.3 Evolution 600 performance specifications
This section gives details of all the Evolution 600 performance tests, together with the test methods and the default
specification limits.
9.3.1 Absorbance Accuracy
Specification: This will be tested by measuring a number of NIST or NTRM photometric Accuracy standards sets.
These will specify test conditions (integration time, wavelength, SBW).
Limits: (instrument tolerances):

1A ± 0.001 A
2A ± 0.002 A
3A ± 0.005 A
Intermediate performance is based upon a segmented linear fit through the above points

Caution If your filters are not in NIST style mounts, a 15mm beam height cell holder will be required. ▲
Method:
1. Sum the instrument and filter tolerances using the RSS method as described in “Section 9.1.”
2. Set up the test parameters according to the filters being used.
3. Zero the instrument on filter “0”. Average three readings.
4. Ensure that the readings fall within the allowed band for that filter.
9.3.2 Photometric Noise
Specification: Measured at 2.0nm bandwidth, 500nm wavelength with a 5 second integration time. Results are
RMS drift corrected.
Limits: 0A: <0.00010A

1A: <0.00015A
2A: <0.0003A
Method:
1. Ensure that the instrument has had at least 2 hours to warm up.
2. Test by running the internal noise PV test, with appropriate absorbance’s in the sample light path. The PASS /
FAIL reported by the instrument is only reliable when testing 0A noise. If testing 1A or higher compare the
result (i.e., value in A) to the specified value for that absorbance level to determine if the test result is a pass or
fail.
9.3.3 Zero drift
Specification: Stability in the visible region: <0.0005A/Hr, 500nm, 2nm SBW, 3sec integration time
Method:
1. Ensure that the instrument has had at least 2 hours to warm up.
2. This will be tested by running the internal drift PQ test. If it passes without error then this specification is met.
9.3.4 Baseline Flatness
Specification: Measured at or near 0A using a scan speed of 120nm/min (i.e., 0.25sec integration), with a 1nm data
interval, 4nm bandwidth and medium smoothing.
Limits: ± 0.001A over the wavelength range 200nm to 800nm.
Method:
1. Ensure the instrument has had at least 15 minutes to warm up.
2. This is tested by running the internal baseline flatness PV test. If this passes without error then this
specification is met.
9.3.5 Wavelength Accuracy & Reproducibility
Specification:
Wavelength Accuracy: When scanning with a 0.05nm data interval the wavelength errors should be ≤ ± 0.3nm over
the full wavelength range.
Wavelength Repeatability: Repeat readings of the same peak should be within 0.1nm of each other.
Method 1 — Using filters: This test is done in absorbance mode, at 1.5nm bandwidth, with a 0.05nm data interval
and a 30nm/min scan speed. For each of the peaks, a 5nm wide scan, centered on the nominal value, is performed,
following a clear beam baseline. Which peaks are used depend on the type filter used and whether it is traceable to
NPL or NIST. Table 9-9 shows the peaks used on a typical system with an NPL traceable holmium filter installed.

Holmium Filter Allowable
Tolerance Tolerance Range
279.3 ± 0.3 278.3 - 280.3
360.7 ± 0.3 359.5 - 361.9
453.3 ± 0.3 452.1 - 454.5
Table 9-10 Wavelengths used for an NPL traceable holmium filter
Method 2 — Lamp emission lines: This test is performed using minimum bandwidth setting. Two deuterium
lines, one argon line and six mercury lines are scanned over a 4nm range using sample intensity mode, a 0.05nm
data interval and a scan speed of 340nm/min. The PMT Gain is set to produce a clear peak with sufficient
amplitude. Each line should be found within the instrument tolerance shown in Table 9-11.
Note The argon line is visible in the mercury lamp spectrum and should not be confused with 760.95nm
(253.65nm x3). ▲
Wavelength Instrument
Line range (nm) tolerance Lamp
486.0 484.0 to 488.0 ±0.30 Deuterium
656.1 654.0 to 658.0 ±0.15 Deuterium
253.7 252.0 to 256.0 ±0.3 Mercury
296.7 295.0 to 299.0 ±0.3 Mercury
435.8 434.0 to 438.0 ±0.3 Mercury
546.1 544.0 to 548.0 ±0.3 Mercury
763.5 761.0 to 765.0 ±0.30 Mercury/Argon
871.7 870.0 to 874.0 ±0.3 Mercury
Table 9-11 Wavelength accuracy limits using mercury lines
Method 3 (Evolution 600 only) — Deuterium lamp lines: If a holmium filter or CVC are not available, the
system will use a deuterium line. Verify that it uses the 2 deuterium lines in wavelength accuracy.
9.3.6 Stray Light
Specification:
Wavelength Limit Comment

200nm > 2.0 A Measured using a 12g/l Potassium Chloride solution
220nm > 3.3 A Measured using Sodium Iodide
340nm > 3.7 A Measured using Sodium Nitrite
Table 9-12 Stray light specification
Method: Stray light at 200nm is measured by scanning the test solution over the range 198 to 202nm at a 0.05nm
data interval, a speed of 30nm/min and a 1.5nm bandwidth. The baseline should be run using de-ionized water as a
blank.
At the other wavelengths, the stray light is measured in FIXED wavelength mode, at the appropriate wavelength,
with the bandwidth set to 1.5nm. Set 3 cycles each with an integration time of 3 seconds. Record the results.
Average the 3 results to get the final answer.
Zero the instrument with clear beams. Put the solution in the sample position and run the measurement. Check the
results against the specification limits.

9.3.7 Bandwidth
Specification: The half height width of the deuterium lamp 656.1 line should be within 10% of the set bandwidth.
This should be checked at 1.5 and 0.5nm bandwidths.
Method: Set up the instrument to scan the range 544 to 548nm at 30nm/min with a 0.05nm data interval in sample
intensity mode. Switch to the mercury lamp and run the scan. Find the height of the peak above the base line.
Measure the width of the peak at half the peak value above the baseline. The result should be within ±10% of the
set bandwidth. Do this test for 1.5nm and 0.5nm bandwidths.
9.4 Performance tests using the Local Control software
The following performance tests are available in the basic Evolution 300 and Evolution 600 instruments:
Wavelength repeatability
Baseline flatness
Noise
Drift
Wavelength Accuracy
More tests will be available when any of the following are installed:
¾ CVC (recommended)
¾ CTU (available with Evolution 300 only)
¾ Mercury lamp
To access the performance tests:

1. Navigate to the Main Menu page
2. Press the Utilities function key
3. Select Instrument Verification Tests
4. Press Enter
5. Highlight the first test required and press the Select/Deselect function key to select it.
Repeat for all tests needed in the current session
6. Press Run to run the selected tests
Note The drift test will take at least an hour. ▲
To view test results, highlight the test on the Instrument Verification page and press Enter.
Press the Summary function key to return to the Instrument Verification page.
Press Save Results to save the current results to the Library or to Disk.
Previous results can be loaded using the Load Results function key, or by using the Library or Disk menu items
on the Main Menu page.
Note The instrument should be allowed two hours to warm up before starting performance qualification
tests. ▲

9.5 Evolution 300 and Evolution 600 Specification Overview
Specification Evolution 300 Evolution 600
Wavelength Range 190nm - 1100nm 190nm - 900nm
Bandwidths 0.5nm, 1.0nm, 1.5nm, 2.0nm, 4.0nm 0.2nm, 0.5nm, 1.0nm, 1.5nm, 2.0nm, 4.0nm
Resolution
(Toluene/Hexane) Peak/Trough ≥ 1.50 Peak/Trough ≥ 1.50
Maximum Resolution 0.50nm 0.20nm
Wavelength Accuracy ± 0.15nm (546.07 Hg Line) ± 0.15nm (546.07 Hg Line)
± 0.3nm for 190nm - 900nm ± 0.3nm for 190nm - 900nm
Peak separation of repetitive scanning of Hg
Wavelength Reproducibility line, Peak separation of repetitive scanning of 656.1nm D2 line,
10 scans: < 0.10nm 10 scans: < 0.10nm
Standard deviation of 10 measurements using Standard deviation of 10 measurements using the above test: <
the above test: < 0.05nm 0.05nm
Photometric Accuracy 1A: ± 0.004A 1A: ± 0.004A
(or Absorbance Accuracy) 2A: ± 0.006A 2A: ± 0.006A
3A: ± 0.0012A 3A: ± 0.0012A
NIST Filters NIST Filters
Photometric Stability < 0.0005A/Hr (500nm), 2nm SBW, 2hr warm-up. <0.0005A/Hr (500nm), 2nm SBW, 2hr warm-up.
Photometric Noise 0A: < 0.00015A 0A: < 0.00010A
1A: < 0.00020A 1A: < 0.00015A
2A: < 0.00040A 2A: < 0.00030A
500nm, RMS 500nm, RMS
Stray Light 198nm: < 1.0%T (2A), KCL, EP, June 2005 198nm: < 1.0%T (2A), KCL, EP, June 2005
220nm: < 0.02%T NaI 220nm: < 0.01%T NaI
340nm: < 0.005%T NaNO2 340nm: < 0.005%T NaNO2, D2 Lamp
Baseline Flatness ± 0.001A (250nm -950nm), 2nm SBW ± 0.001A (200nm -800nm), 2nm SBW
Intelliscan plus: 3800, 2400, 1200, 600, 240, Intelliscan plus: 3800, 2400, 1200, 600, 240, 120, 60, 30, 10, 5, 1
Scan Speed 120, 60, 30, 10, 5, 1 nm/min nm/min
Data Intervals (Scanning) 10, 4, 2, 1, 0.5, 0.2, 0.1, 0.05nm 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05nm
Detector(s) Silicon photodiode x 2 Hamamatsu H7732-10 Photomultiplier tube module
Beam separation 210mm 210mm

10.0Remote Diagnostics
The Evolution 300 and Evolution 600 have extensive built-in diagnostics and low level control which eases
servicing. To access this help, a computer running a terminal emulation program is essential. No servicing can be
done if a PC is not available. The next section describes how to connect the instrument to a PC.
10.1 Connecting the instrument to a PC
10.1.1 Terminal programs
You will need software that allows you to write to and read from the computer’s serial port. The communications
parameters are: Baud rate 9600
Data bits 8
Stop bits 1
No parity
Flow control off.
Local Echo on
10.1.1.1 Windows Terminal
We recommend Windows 3.1 Terminal. This is easy to set up and use. Here are examples of the setup dialog boxes
for Windows terminal.

10.1.1.2 HyperTerminal
You can also use HyperTerminal that comes with Windows 95, Windows 98, Windows 2000, Windows NT®, and
Windows XP. To establish a connection, start HyperTerminal and select New Connection from the file menu. In
the dialog that appears, type in Evolution 300 (or Evolution 600) for the name and choose an icon. Press OK. In
the next dialog box select Direct to COM1 and press OK.
Fill in the COM1 properties dialog box as shown below:
Next, from the File menu select Properties and then click on the SETTINGS tab. Fill in the dialog box as shown
below. Click OK.

Once communication has been established you will need to save the debug data to a file. Do this using the
TRANSFERS/CAPTURE TEXT as shown in 10.1.3.2.
10.1.2 Connecting the instrument to a PC
1. Use a null modem cable (part number 4013 172 82111) to connect the RS232C port of the instrument to a free
COM port on the PC.
Here is the pin out data for the RS232 Cable:

Pin Pin
9 to 9
2 3
3 2
4 8
8 4
6 1 and 7
1 and 7 6
5 5
Earth Earth
Switch on the PC and set up a terminal program as described above.

2. Switch on the instrument and keep keying <ENTER> on the PC until the instrument responds (this may take a
few seconds).
3. The response will be something like “L384 -“, or you may get an error message. To gain control, you must type
TER <enter>. This should put the instrument into terminal mode and respond with a hyphen prompt.
Note This command (and only this command) is case sensitive. The TER must be upper case. ▲
1. You are now able to control the instrument with the commands listed in relevant sections and receive diagnostic
information from the instrument.
2. Terminal programs send the data to the instrument character by character. This means that you cannot correct
typing mistakes. If you make a mistake, press <enter> wait for the error message and start again.

10.1.3 Collecting Data
Once you have established control of the instrument and switched on the debug software, you will need to collect
the data that is returned and save it to file. This can be done by several methods; the next section details one of
them.
10.1.3.1 Using Terminal to collect data
1. From the menu bar, select Transfers and then Receive Text File.
2. The Receive Text File dialog box is displayed. Select suitable path and type in a file name then press OK.
3. Once the instrument has stopped sending data press Stop to terminate the transfer and save the file.

10.1.3.2 Using HyperTerminal to collect data
1. From the menu bar select Transfers and then Capture Text.
2. The Capture Text dialog box appears. Type in a path and file name then press Start.
3. Once the instrument has stopped sending data, from the menu bar select Transfer then Capture Text then
press Stop to terminate the transfer and save the file.

11.0Remote Commands
Note 1 TERMINAL programs send the data character by character; therefore typing errors cannot be
corrected. If you make a mistake press the Enter key, wait for an error message and start again. ▲
Note 2 You must press the Enter key at the end of each command. In the following sections this is indicated
by <enter>. ▲
11.1 Alphabetic list of the remote commands
The commands are three letter words. Some commands take parameters; these are shown in angled brackets after
the command (e.g., <parameter>). Where the command takes one of a number of parameters, this convention is
used <parameter1/parameter2>. These parameters are not optional. If you do not enter them correctly, an error
message will result. For example, “? ERROR 1000” means the first parameter is missing, incorrect or out of range.
In some cases, there are other optional parameters; these are shown in a second set of angled brackets.
NULL
<CR><any character>
The Null command is not a true command since it contains no ASCII command body. It is simply a carriage return
followed by any character. The reply is the prompt sequence. Sending the Null sequence to a bench in Local
Control mode will put it in Remote mode.
Note A bench in Local mode will only go into Remote mode if the REMOTE page is displayed or the user
interface software has not started running. ▲
AD0
Measures the ADC 0 volt reference, and records the value for use on subsequent ADC measurements.
ADC
ADC <SR/ASR/VRG> <readings>
Reads the requested signal channel. The channels are:
SR Sample / Reference (optical)
ASR Alt. Sample / Reference (optical)
VRG 5V reference / Gnd
RG Sample/Reference (Evolution 600)
The readings parameter specifies the number of readings to be averaged to give the result. If this parameter is
omitted, only one reading is made.
BANDWIDTH
BAN <bandwidth>
This command sets the instrument bandwidth. The bandwidth parameter must be one on the following list:
(0.2, 0.5, 1.0, 1.5, 2.0, 4.0).
Note 1 The list of bandwidths that the command will accept may be limited by the instrument variant. See the
command BWLIST. ▲
Note 2 Changing the bandwidth will lose any auto zero table information. ▲

BASELINE
BAS
This command runs a user baseline using the current scan method. This command can be aborted by the STOP
command.
Notes
1. This baseline will be lost when the instrument is powered down.
2. Running a DEFAULT baseline will not overwrite the USER baseline and visa versa. Both may exist at the
same time.
3. When the instrument is switched on, it will only have a DEFAULT baseline. This will be used for a scan until a
USER baseline is performed.
4. If a USER baseline exists, this will be used for the scan if it is valid.
5. In some cases, a USER baseline may have been performed but not be valid for the scan. Whether the USER or
DEFAULT baseline is used is decided automatically by the bench.
6. A DEFAULT baseline can be run using the DBASELINE command. ▲
BEAM
BEA
Returns information as to whether the instrument is single- or double-beam. The response will be either the word
SINGLE or DOUBLE.
BEEP
BEE <SHORT/LONG>
Activate the instrument beeper.
BUSY <slot number/ALL>

If the parameter is missing, you are checking if the bench is currently executing a command.
The slot number parameter can have the values 0,1,2,3 or ALL. The slot numbers are defined as follows:
Slot Accessory position

0 CTU
1 Accessory lamp position
2 Sample position
The replies are as follows:

BUSY The bench / accessory is currently executing a command.
IDLE The bench / accessory is not executing a command.
EMPTY The slot is not currently occupied by an accessory.
UNINIT The bench / accessory is not initialized.
(It requires the INITIALIZE OPTICS or the INI <slot number> command to be sent.)
Notes
1. The bench will always be UNINIT when it is first switched on. The INITIALIZE OPTICS command will
perform the initialization and the bench will go into the IDLE state.
2. The bench will return to UNINIT if the monochromator goes out of synchronization or the bench is put into
standby mode.
3. It is possible for the bench to be both BUSY and UNINIT at the same time. In this case, the bench will report
UNINIT.
4. The sipper pumping continuously will not be treated as making the bench or the accessory busy (it will be
reported as IDLE). This is done to enable measurements, etc., to be made while the fluid is being pumped -
needed for Flow Injection / Process control applications. ▲

BWLIST
This command gets the list of available bandwidths.
Note If only one bandwidth is returned, it is a fixed bandwidth instrument. ▲
CAROUSEL <SAMPLE/REFERENCE>
Finds what cell holder type is present in the location specified by the parameter. A Cell Changer or CVC will be
left at cell 1 if installed.
The replies are:
STANDARD CELL HOLDER
CELL CHANGER
CVC <serial number>
SIPPER
CELL <cell number> <SAMPLE/REFERENCE/BOTH>

Positions the specified cell in the specified Cell Changer(s) in the beam. For example, CEL 3 SAM will send a Cell
Changer in the sample beam to cell 3.
Note 1 A parameter error will occur if the specified <cell number> is outside the range of (either or) the
specified Cell Changer(s). ▲
Note 2 If the 2nd parameter is omitted, BOTH are assumed. ▲
CPOSITION <SAMPLE/REFERENCE >

This command interrogates the specified Cell Changer and returns with the position currently in the beam.
The reply is the cell number followed by a status message:
OK The Cell Changer is working properly
STALLED The Cell Changer is jammed
NOCELLP No Cell Changer is fitted
UNINITIALIZED The Cell Changer is not initialized.
Note 1 If the returned status is STALLED, the cell number returned will be the last valid position. If the
returned status is NOCELLP, the cell number returned will be 0. ▲
Note 2 If the parameter is omitted from the command, SAMPLE will be assumed. ▲
CVC <CVC/CTU>
Interrogates the CVC/CTU, the reply depends on the parameter.
1. If no parameter is sent, then TRUE will be reported if the CVC serial number matches that of the stored
calibration data, FALSE otherwise.
2. With the parameter CVC, the command reports the serial number of the installed CVC, the serial number the
calibration data refers to, and the date of the calibration.
3. If either information is not present, the serial numbers will be reported as 0.
4. With the parameter CTU, command reports the CTU identifier and calibration date.
DAC <value>
This command sets the lamp energy DAC value.
Note Misuse of this command will permanently damage the xenon lamp. Never enter a value of more than
512. ▲
DARK
Measures the dark signal, and records the value for use on subsequent optical measurements.

DATA <SEND/NOSEND/STATUS>
Sets whether data will be returned during a RUN or BASELINE when the bench is running in terminal mode. The
power-up default is to send data back during a run.
SEND Data is automatically returned during a RUN.
NOSEND Data is not returned during a run/baseline.
STATUS Reports the currently requested data send state.
DB1
This command is used to report debug information about the signals used to make the last ADC reading. More
information on this command is given in other sections of this manual.
DBASELINE <integration time>

Runs a DEFAULT baseline. This baseline will ignore the current bench run parameters and run a baseline over the
full wavelength range at a data interval of 0.1nm and the integration time supplied.
Integration time, this is the time in seconds for each point in the baseline. Only values from 0.1 - 0.5 seconds are
valid.
Notes
1. This baseline is preserved when the instrument is switched off.
2. This command is run in the factory when the instrument is being configured for shipment. It is expected that
only service engineers will re-run the command thereafter.
3. Warning, this command may take up to two hours to complete. ▲
DEBUG <CA/OI/SP/ZB> <ON/OFF/STATUS>

This command allows extra debugging code to be turned on in a number of subsystems in the instrument. This
includes bar graph displays of peak energy during optical initialization or wavelength calibration.
Wavelength Calibration subsystem.

CA
OI Optical initialization.
ZB Zero / baseline sub-system
SP Signal processing subsystem
ON Enables debug code for that subsystem.

OFF Disables debug code for that subsystem.
STATUS Displays on/off state of each subsystem.
DLIST
Reports the data intervals supported by the instrument. The reply is a list of data intervals in nm.
EDA [value]
Sets the value of the PMT control voltages used for the GMD FIXED mode. The valid range value is 69 to 255. the
EDA command with no parameter returns the current set EDA value.

FILTER <filter>
Moves the filter wheel to put the specified stray light filter in the beam. The default wavelengths are shown in the
table below.
Evolution 300 Evolution 600

Filter Start λ Stop λ Filter Start λ Stop λ
1 0.00nm 222.95nm 1 0.00nm 285.00nm
2 265.00nm 371.95nm 2 285.00nm 350.00nm
3 372.00nm 452.95nm 3 350.00nm 412.00nm
4 453.00nm 589.95nm 4 412.00nm 511.00nm
5 590.00nm 1100.00nm 5 511.00nm 900.00nm
6 223.00nm 264.95nm 6 Not used Not used
Note Sending FIL 0 will cause the filter wheel to initialize to position 1. ▲
FIXED <time/points>
This command sets the integration time to be used in a fixed measurement. Subsequent use of the RUN command
will cause the bench to do a single fixed measurement with the specified integration time.
Time Integration time 0.125 - 9999.000 seconds

Points Number of points that will be averaged to produced the fixed measurement.
Note The bench always takes at least 8 measurements per second; these are averaged to produce each fixed
measurement. ▲
GET
This command requests an ASCII dump of the bench sample store, which contains the results of the last run. The
reply is a header followed by the results.
header The header contains information about the method used to create the data. It is always sent
regardless of whether there are any results in the store.
results The results are a single column of measured values, i.e., one data value per line. If the value is
negative, it starts at column 2, if positive it starts at column 3, with leading space characters
(ASCII 32). If there are no results, this field will be empty.
GMD <FIXED/TABLE/SOFTWARE/DYNAMIC>
Gain Mode
FIXED Do not change the gain, all updates will be handled explicitly
TABLE Table EHT adjustment based on the table generated by the TES CGT TUN/DEU command.
SOFTWARE Dynamic adjustments in software
DYNAMIC Dynamic adjustments in software
IDENTIFY <SAMPLE/REFERENCE >

This command is used to interrogate an RFID accessory is installed. It returns the ID of the cell currently in the
specified beam. If there is no RFID accessory present, it returns error 1000. The reply is an ASCII string of up to
24 characters.
Example:
IDE <enter>
0006325719
-

IHOURS
Get instrument hours.
Note The instrument hours can be reset using the RLHOURS command. ▲
INITIALIZE <OPTICS/LIFETIME/FAKEOP/0/1/2/3/4/5/ALLACC>
This command will initialize the instrument and/or the specified accessories.
OPTICS Initialize optics
LIFETIME Initialize optics using larger search ranges.
FAKEOP Set the bench as initialized without actually initializing anything
0/1/2/3 Initialize the accessory in the given slot
ALLACC Initialize all installed accessories
The slot numbers are defined as follows:
Slot Accessory position
0 CTU
1 Accessory lamp position
2 Sample position
Note 1 It is possible to see if the bench requires an OPTICS initialization using the BUSY command. ▲
Note 2 Slot 2 is the sample position and slot 3 is the reference position. ▲
LAMP <MERCURY/XENON/TUNGSTEN/DEUTERIUM>
The specified lamp is selected by moving the selector mirror the next time a WDR command is performed.
Note The stray light filters will function differently depending on the mode selected. ▲
LENERGY <XENON/TUNGSTEN/DEUTERIUM>
Gets the lamp energy.
The energy is a percentage calculated by taking the ratio of the energy recorded when MLENERGY was last sent
with the energy recorded when RLENERGY was last sent.
Note 1 It is advisable to always precede this command with the MLENERGY command in order to get an up
to date indication of the current lamp energy. ▲
Note 2 Returns a Parameter 1 error if the specified lamp is not installed. ▲
LHOURS <XENON/TUNGSTEN/DEUTERIUM >

This command reports the lamp hours in two formats. First, it reports the number of flashes divided by 1000 and
then the percentage of the expected life of the lamp.
LIST
LIS <Formatted ASCII dump of current run parameters>
The LIS command returns an ASCII list of the current run parameters. The bench responds to this command by
sending a subset of the header information, which is sent with GET data.
The LIST command does not give information on accessories. The (ACCESSORY) command is provided for that
purpose.

LOCAL
Put the bench into Local control mode.
Note Once in Local mode, the <CR><LF> sequence will put the bench back into REMOTE mode. Because
of this, any command sent when the bench is in Local mode will be actioned with the side-effect that
the bench is put into remote mode. ▲
LSTATUS <MERCURY/XENON/TUNGSTEN/DEUTERIUM >

Get status of the specified lamp. The response will be one of the following:
OFF The lamp is turned off.

ON The lamp is turned on.
NOTPRESENT The lamp is not present
STRIKING If the D2 lamp is striking
Note Error 1001 is returned if the specified lamp is not installed. ▲
LSWITCH <MERCURY/XENON/TUNGSTEN/DEUTERIUM> <OFF/ON>

Switch specified lamp off or on.
Note Error 1001 is returned if the specified lamp is not installed. ▲
MLENERGY <XENON/TUNGSTEN/DEUTERIUM>
Measure the specified lamp energy. This command will drive the monochromator to the correct wavelength, before
measuring the current lamp energy and storing it in the bench.
Note 1 The percentage energy value (relative to some initial value) can be read back using the LENERGY
command. ▲
Note 2 Error 1001 is returned if the specified lamp is not installed. ▲
MODE <ABS/%TRANS/SAMPINT/REFINT >

Set measurement mode. This command dictates in what form measurements are saved in the sample store during a
run. It also applies to any other commands, which produce measurements (e.g., WVP).
ABS Absorbance
%TRANS Percentage Transmittance
SAMPINT Sample beam intensity
REFINT Reference beam intensity
MONOCAL<FULL/0.2/0.5/1.0/1.5/2.0/4.0/QUICK> <Readings>
Calibrate the monochromator using the mercury lamp. The MON <bandwidth> command does the calibration for a
particular bandwidth setting. The QUICK parameter uses a default bandwidth and sets the same calibration for
each bandwidth. The FULL parameter calibrates each of the bandwidths. The optional Readings parameter sets the
number of readings for each point in the scans of the mercury lines; a default value is used if this parameter is
absent.
MOTOR <FILTER/SELFTEST/SLIT/MONO/LAM> <steps>

Moves the specified motor through the requested number of steps.
steps The number of steps to move from the current position. If steps is negative, the
motor moves backwards.
Note There is no check on the validity of doing the operation, so avoid sending values that would cause a
motor to move through an end stop. ▲

MPLIST
Get monochromator calibration parameters. The returned values are the coefficients of a cubic through zero
equation relating motor step position to wavelength. The equation is Step = ax + bx2 + cx3. The calibration
parameters for each bandwidth are reported in turn, with the bandwidth in the last field.
Example:
MPL <enter>
1.998464e+00 2.776559e-07 6.791213e-12 4.0
1.998895e+00 1.885237e-07 1.182525e-11 2.0
1.998711e+00 2.500356e-07 7.840158e-12 1.5
1.998446e+00 3.095027e-07 3.980329e-12 1.0
1.999363e+00 2.078102e-07 7.727445e-12 0.5
Note The parameters are floating point values. ▲
MPSET <a> <b> <c> [ALL/4.0/2.0/1.5/1.0/0.5]

With this command, the monochromator calibration parameters can be entered. The values a, b, and c are
coefficients of a cubic through zero equation relating motor step position to wavelength. The equation is Step = ax
+ bx2 + cx3.
The optional ALL parameter (which is the default) programs all the bandwidths with the one set of coefficients. If
a bandwidth is specified then only that bandwidth is programmed with the coefficients.
Example:
MPS 1.998895e+00 1.885237e-07 1.182525e-11 2.0 <enter>
Note The parameters are floating point values. ▲
NUMBER <ACCESSORY/VALIDATION>
This command is used to find out how many accessory slots are currently in use and to find the number of
validation tests available.
For the NUM ACC command, the reply will be the number of accessory slots that have been in use since the
instrument was switched on.
For the NUM VAL command, the reply will be the number of validation tests that are currently supported by the
bench and its accessories.
Note If no accessories are installed, the NUM VAL command returns 5, which is the number of validation
tests supported by the bench alone. ▲
PAUSE <ON/OFF >

This command allows the bench “pause” status to be set. Measurements taken while pause status in ON will be
invalidated before being sent to VISION. This allows the user to open the sample compartment (e.g., to add an
inhibitor) without causing wild readings to appear. This command has no effect on the measurement timing or the
number of measurements taken.
ON Subsequent measurements are set to an invalid value (0%T)

OFF Subsequent measurements are processed normally
Note 1 The bench automatically sets its pause status to OFF at the start of a run, so this command need only
be sent when a pause is actually needed. ▲
Note 2 Although the bench does not return any status information, it treats PAUSE as a status command in
that it can be actioned when the instrument is busy. ▲

QACCESSORY <ACCESSORY/VALIDATION > <n>
The Query Accessory Configuration command allows you to find out what accessories are installed and what
validation tests are available.
The parameter n is the accessory slot number in the QAC ACC command and the validation test number in the
QAC VAL test. If n is greater than, or equal to, the size of the list (as returned by the NUM command), the bench
will treat this as a parameter error.
The QAC ACC Reply:

The reply contains a number of comma delimited parameter strings; each is in the form:
<PARAMETER_NAME>=<PARAMETER_VALUE>
If no accessory is associated with the given slot, there will be no parameter strings returned.
The returned values <PARAMETER_NAME> and <PARAMETER_VALUE> are ASCII strings specific to
individual accessories, but incorporating some common conventions described in the table below.
PARAMETER NAME PARAMETER VALUES USED ON ACC. TYPE

LAM (lamp) LAS / MER / XEN Light sources
CVC YES / NO CVC
CTU YES / NO CTU
TME (temperature YES / NO Temperature measuring accessories (including those
measurement) also having temperature control)
SIP (sipper) YES / NO Sippers
SER (serial number) Alphanumerical string All powered accessories
CEL (number of cells) Numerical string Cell changing accessories
MIT (min temp) Numerical string (°C) Temperature control accessories
MAT (max temp) Numerical string (°C) Temperature control accessories
MRA (max ramp rate) Numerical string (°C / Ramping temperature control accessories
min)
STR (stirrer) YES / NO Peltier Cell Changer
BEA (beam) SAM / REF Accessories that affect a specific beam
CAL (calibration date) Date string e.g. 22-02-02 Calibrated accessories
TRI (trigger) YES / NO Stopped flow accessory
CTI (time between cells) Numerical string Time to move from one cell to another (in seconds)
Here are some examples, demonstrating how to find what sample compartment, and lamp accessories are installed.
Example 1:
What accessory lamp is installed?
QAC ACC 1
LAM=MER
-
This tells us that a mercury lamp is installed in the lamp accessory position.
Example 2:
What sample beam accessory is installed?
QAC ACC 2
SER=EV6111401, CEL=7, CTI=0.531250, BEA=SAM
-
This tells us that we have a 7-Cell Changer, serial number EV6111401 in the sample beam, and that it takes 0.53
seconds to move between cells.

Example 3:
What reference beam accessory is installed?
QAC ACC 3
SER=RFI112002, RFI=YES, CEL=1, BEA=REF
-
This tells us that we have an RFID accessory, serial number RFI112002 in the reference beam.
The QAC VAL Reply:
The reply contains a number of comma delimited parameter strings; each is in the form:
<PARAMETER_NAME>=<PARAMETER_VALUE>
The returned values <PARAMETER_NAME> and <PARAMETER_VALUE> are ASCII strings specific to
individual validation tests, but incorporating some common conventions described in the table below. Two
parameter strings (TST and DSP) are returned.
Note 1 The value for TST is a 3 letter code uniquely identifying the test. ▲
Note 2 The value for DSP is a string in the bench’s currently selected language. ▲
Examples:
These examples interrogate the five basic instrument tests.
QAC VAL 1
TST=WRE, DSP= Wavelength Repeatability
-
QAC VAL 2
TST=BAN, DSP= Bandwidth Accuracy
-
QAC VAL 3
TST=BAS, DSP= Baseline Flatness
-
QAC VAL 4
TST=NOI, DSP= Noise
-
QAC VAL 5
TST=DRI, DSP= Drift
-
REPEAT <integration time> <time interval> <number of points>

This sets up the bench to take <number of points> number of fixed measurements, each for an integration time of
<integration time> (in seconds), with a time of <time interval> (in seconds) between the readings.
Integration time Integration time 0.125 - 9999.000 seconds

Time interval Time interval must be >=integration time & <= 100 hours (in seconds)
Number of points Number of points to be measured, this must be in the range 1 -8,000.
RLENERGY <XENON/TUNGSTEN/DEUTERIUM>
Reset the lamp energy. The current energy of the lamp is recorded as the initial energy.
Note Lamp energies can be read using the LENERGY command. ▲

RLHOURS <XENON/TUNGSTEN/DEUTERIUM>
Reset specified lamp hours (flashes) back to zero.
RUN <TRIG>
Performs a run using the current bench method and places the results in the sample store. The run will overwrite
any data that was previously in the sample store. The optional TRI parameter allows the run to be initiated by
asserting the run input line.
The reply is a list of data points, with one data point on each line, as below:
<Up to 12 digit data point><CR><LF>
Notes
1. It is possible to turn off the data output for using the DATA command.
2. When the run is complete, the monochromator will remain at the last wavelength measured for the run.
3. All data generated from the run will always be stored in the sample store. The contents of the store can be
retrieved using the GET command. The store is not overwritten until a new RUN is sent.
4. For a scan, the bench will always drive the monochromator to the start wavelength before starting the run.
5. If the run is a scan then either the DEFAULT or the USER baseline will be used as the reference. ▲
RZEROS
Remove all optical zeros.
Note New zeros can be performed using the ZERO command. ▲
SBU
This command requests the current state of the sipper button flag. This flag is set when the sipper button is pressed,
and cleared when a sipper action command (such as SIP or SCON) is sent.
The response is YES or NO.
SCAN <start wavelength> <stop wavelength> <data interval> <scan speed>

Set scan parameters in the bench run method. Subsequent use of the RUN command will cause the bench to scan a
spectrum according to the specified parameters.
Start and stop wavelength must be in the instrument’s wavelength range. In some cases, the start and stop
wavelengths may be adjusted by the bench such that they both lie on actual data points. The actual range is
therefore returned by the bench.
Data interval is a discrete set of nm/min values.
Scan speed is in the range 0 - 3800nm/min (or 0 for Intelliscan).
For all non-zero scan speeds, the bench will calculate an appropriate integration time in order to achieve the scan
speed requested.
If a scan speed of 0 is set then the scan will be done in Intelliscan mode where integration time varies with the
signal level. In this mode, the achieved scan speed is therefore variable and depends on the signal (how long each
point takes to measure) and data interval (how many points are measured).
Example:
To scan between 301.5 and 400.3nm with a 2nm data interval at 120nm/min use the command
SCA 301.5 400.5 2 120 <enter>
-

The instrument replies with the actual scan range and data interval.
300.00 402.00 2
Note This command does NOT cause the monochromator to drive to the start wavelength. It must be moved
to the required wavelength using the WDRIVE command. ▲
SCON < SAMPLE/RETURN/STOP > < NORMAL/ACID > [<SAM/REF/3/4/ALL>]

Set sipper running continuously. This will clear the sipper button status. The second parameter sets the pumping
speed (fast for normal and slow for acid flex tubing). The final parameter is optional. It allows an individual sipper
in a particular location to be addressed or if more than one sipper is present for them all to be driven
simultaneously. By default, the SCO command behaves if this parameter has been set to SAM (i.e., it will only
drive a sipper in the sample position).
SAMPLE Sipper continuously takes from sample.

RETURN Sipper continuously returns to sample.
STOP Sipper stops sampling.
SELFTEST <test code>

Perform the specified self test.
<Test code> is a three letter code, as returned by the QAC VAL command, for the required test. Possible values
are:
ABS Perform absorbance accuracy check.

UVA Perform a UV absorbance accuracy test
ARE Perform an absorbance repeatability test
MER Perform wavelength check using Hg lamp
FIL Perform wavelength check using filters
WRE Perform a wavelength repeatability test
STR Stray light test
LAS Perform a laser stray light test
BAN Perform a bandwidth check
BAS Perform a baseline flatness test
NOI Noise test
DRI Perform a drift test.
RES Perform a toluene in hexane resolution test
While the test is running, status messages in the range 100 to 109 are reported to indicate progress.
Results are returned from the bench when the command is complete.
There is a common header format. This is followed by the specific test information which as well as depending on
the test type will also depend on what accessories were installed at the time the test was run. Here are two example
sets of results, from a CVC absorbance test and a CVC holmium filter wavelength test.

Test Type : Absorbance Accuracy
Instrument Serial Number : 105002
Artifact Type : CVC
Artifact Calibration Date : 05-03-03
Artifact Serial number : 32438
Instrument Hours : 230
Xenon Hours : 25.7 %
Xenon Energy : 76 %
Test Time : 11:09:54
Test Date : 22-08-03
Test Result : PASS
WAVELENGTH ACTUAL MEASURED RESULT INST TOL FILTER TOL TOTAL TOL DIFFERENCE
546 0.9245 0.9215 PASS 0.0092 0.002 0.0112 -0.003
Test Type Wavelength Accuracy (Filter)
Instrument Serial Number 105002
Artifact Type CVC
Artifact Calibration Date 05/03/03
Artifact Serial number 32438
Instrument Hours 230
Xenon Hours 25.70%
Xenon Energy 75%
Test Time 11:32:42
Test Date 22/08/03
Test Result : PASS
ACTUAL MEASURED RESULT INST TOL FILTER TOL TOTAL TOL DIFFERENCE
279.3 279.15 PASS 0.3 0.3 0.6 -0.15
361 360.85 PASS 0.3 0.3 0.6 -0.15
453.6 453.65 PASS 0.3 0.3 0.6 0.05
SENSORS
Read back the state of the optosensors. The sensors are:
MO Monochromator end stop
FI filter end stop
ST CTU end stop
SLIT Slit plate end stop (not installed)
FLIP Flipping mirror end stop (not installed)
Example:
SEN
MO 0, FI 0, ST 1, SLIT 1, FLIP 1
SFACTOR
Returns the current sipper calibration factor, the date it was written to the accessory board and the tubing inner
diameter. The value is changed with the SICALIB command. The factor can also be set to a specific value using
the SPUT command.
Example:
SFA <enter>
1.234 10-05-02 0.801
-

SFILTER <filter>
SFI e
Position a specified CTU filter in the beam.
Position Filter
1 Clear beam
2 Holmium oxide glass
3 1A neutral density
4 WG295 stray light filter
5 GG375 stray light filter
6 Spare (clear)
SICAL <total Volume> <nominal Volume> <no Of Sips> <tubing ID>

This command informs the bench of the parameters that were used during a calibration of the sipper. They are used
internally to correct for differences in tubing volume to allow future SIP commands to take the correct sample
volume.
Total Volume Total sample volume collected 0.2 - 999.9ml
Nominal Volume Expected sample volume size 0.1 - 9.9ml
Number of Sips The number of sips taken 1 – 20
Tubing ID Internal diameter of tubing 0.5 – 2mm
Note The calibration is stored on the accessory board. ▲
SIPPER <Sample Volume> <SAMPLE /RETURN> <NORMAL/ACID> [<SAM/REF/3/4/ALL>]

Request the sipper to take a volume of sample. This will also clear the sipper button status. The third parameter sets
the pumping speed (fast for normal and slow for acid flex tubing). The final parameter is optional allowing an
individual sipper in a particular location to be addressed, or if more than one sipper is present for them all to be
driven simultaneously. By default the SIP command behaves if this parameter has been set to SAM (i.e., it will
only drive a sipper in the sample position).
Sample Volume The volume of sample to be sipped 0.1 - 19.999ml
SAMPLE Sip from the sample.

RETURN Return the volume to the sample.
NORMAL Normal tubing (fast).

ACID Acid tubing (slow).
Example:
To ask a Sipper in the sample position to pump 1.5ml into the cell.
SIP 1.5 SAMPLE <enter>
-
SISTANDBY <ON/OFF>
Sets the sipper standby mode on or off. When on, if the sipper has been idle for some time, the motor is driven
backwards and forwards to prevent the tubing being crushed.
Sending the SIS command without a parameter will report the current setting.
The value is stored in the instrument configuration EEPROM.
ON Do the standby movements

OFF No standby movements

SMAX
Get the maximum speed at which the bench is physically able to scan. The reply is a figure in nm/min.
Note This will depend on the largest data interval and shortest measurement period available to the bench. ▲
SNEXT
Allow the auto sampler to take the next sample. This command is used with the auto sampler in SIP&RUN mode to
enable the next sample to be loaded by the auto sampler. In terminal mode, the command will wait for a sipper
button press before returning the prompt. This command will clear the sipper button status.
SPUT <calibration Factor> <internal diameter>

This command puts a sipper calibration factor and the tubing diameter into the EEPROM on the sipper accessory
board
Example:
SPU 1.234 0.800 <enter>
-
Notes
1. The calibration factor must be in the range 0.1 - 9.999.
2. Normal tubing has an ID of 1.1 and low volume tubing an ID of 0.8.
3. The ID must be in the range 0.5 - 2mm. ▲
SSTATUS
Send back status information about the bench sample store. The reply comes in the form:
<DATE> <TIME> <BDATE> <BTIME> <DEFAULT/USER/NONE> <error code> <ATTEMP/DRIFTED>.
These terms are explained below.
DATE The date when the bench received the last RUN command, <dd:mm:yy>
TIME The time when the bench received the last RUN command, <hh:mm:ss>
BDATE The date when the baseline was performed for the run data currently in the sample
store., <dd:mm:yy>
BTIME The time when the baseline was performed for the run data currently in the sample
store, <hh:mm:ss>
DEFAULT/USER Whether the Default or User baseline/Zero was used to produce the result.
ERROR CODE If an error occurred during the run, this will be non-zero.
ATTEMP/DRIFTED Indicates whether or not the Peltier stayed at temperature during the run. This field
is undefined if no Peltier is installed.
Example:
SST <enter>
22-08-03 11:34:37 22-08-03 11:34:19 USER N/A 0 ATTEMP
Note As soon as the RUN command begins, the values returned from this command are valid for the results
that are about to be collected. ▲
STDATA
Reads the validation data on disk into NVM.
STIME <day of the week> <day-month-year> <hours: minutes: seconds>

Set bench day of the week, date and time.
Example:
STI TUE 22-08-03 14:12:22 <enter>
-

STOP
Stop the current bench action. If no command is running then the command is ignored.
STRRER <ON/OFF>
Turn stirrers on or off
Note This command affects all connected accessories that have stirrer capability. ▲
TEMP [<BLOCK/PROBE>]
This command reports the temperature, if available, from whatever accessory is present in either channel. If either
channel has no means of reporting a temperature, NONE will be reported. The optional parameter specifies
whether the probe or block temperature will be reported (or NONE if it is not available).
Example:
TEM <enter>
NONE 34.5
TERMINAL
Set communications to Terminal mode. Protocol mode is the default at switch on and when leaving standby mode.
TIME
Get bench day of the week, date and time.
Example:
TIM <enter>
FRIDAY 22-08-03 14:26:59
Note A new time can be set using the STIME command. ▲
TSET <temp> <rate> [<BLOCK/PROBE/DISABLE/FANON/FANOFF>]

This command is used to set temperature controllers to the required temperature. It also determines whether the
block or probe temperature sensor will be used by the control loop. The default is to use the block sensor. The
parameter DISABLE turns off the power, FANON turns the fan on and FANOFF turns the fan off.
<Temp> is the required temperature in °C
<Rate> is the required rate in °C/minute (for ramping devices only)
Notes
1. This command returns immediately; it does not wait for the temperature to be reached.
2. An error will occur if no temperature controller is installed.
3. A parameter error will occur if the specified <temp> or <rate> is outside the range of any of the installed
devices.
4. If the <rate> parameter is missing or zero, the temperature controllers will go to the specified temperature at
their maximum rate. ▲
VARIANT <type> <id>

This command allows you to program in the instrument type and serial number.
Type Instrument type (e.g., EV300 [maximum 8 characters])

Id Unique instrument identification number (maximum 6 digits).
Example:
VAR EV300 104005 <enter>

VERSION
Get instrument identity. The reply is in the form <type> <id> <version1> <version2> where
type Instrument type, e.g., EV300 (maximum 8 characters)

id Unique Instrument identification number (serial number, maximum 6 digits) 0 - 999999
version1 Applications software version V0.00 - V99.99
version2 Boot software version V0.00 - V99.99
WAVE
Get current wavelength of monochromator.
WDRIVE <wavelength>
Drive the monochromator to the specified wavelength.
Wavelength 0.0 - 1100.0nm (Evolution 300)

0.0 – 900nm (Evolution 600)
Note This command will also switch to (and turn on) the appropriate lamp and put the correct stray light
filter in the beam. The ability to drive below 180.0nm is left for service purposes only. ▲
WRANGE
WRA <min> <max>
Get maximum wavelength range of the instrument.
Example:
WRA <enter>
Will result in 190.00 1100.00 for the Evolution 300, or 190.00 900.00 for the Evolution 600.
WTPAIR
WTP <wavelength> <sample temp> <reference temp>
Get current wavelength of monochromator plus temperatures if relevant.
Example:
WTP <enter>
546.6 NONE 22.4
Note Temperature readings are in °C and may come from either a temperature controller or a temperature
probe; if both are installed for a particular beam, the probe temperature will be the one returned. If no
probe is present, the temperature will be reported as "NONE". ▲
WVPAIR
Get current wavelength of monochromator and live display reading, plus temperatures if relevant.
Example:
WVP <enter>
546.6 0.0097 NONE 22.4
Note Temperature readings are in °C and may come from either a temperature controller or a temperature
probe; if both are installed for a particular beam, the probe temperature will be the one returned. If no
probe is present, the temperature will be reported as "NONE". ▲

ZERO
Perform optical zero at the current wavelength. The bench is able to store up to 20 zeros.
Note 1 Any zero already existing for that wavelength will be overwritten by the new one. ▲
Note 2 If the zero does not exist and there are currently less than 20 stored in the bench then it will be added
to the list. If, however, 20 zeros already exist, the new zero will overwrite the oldest zero in the list. ▲
ZORDER
Get the number of monochromator steps from zero order, for the current position of the monochromator.
11.2 Test and configuration commands

This is a special set of commands that give a high degree of low level control of the instrument performance. They
should not be used to alter instrument settings unless articles in this manual specifically tell you to do so.
In general, if any of these commands is issued without any following parameters, it will report the current
instrument settings. This is normally how these commands should be used.
TES CGT TUN/DEU

This command performs a gain table calibration for the tungsten and deuterium lamps respectively. This is a
factory calibration that is done once and should be repeated when a lamp or detector is replaced. Currently, the gain
table is not used in measurements but should be calibrated for possible features that would be available in future
firmware releases.
TES CHO INI

This command initializes the chopper. The chopper is initialized to the dark state, meaning that no light is passing
through the sample or reference beam path. This command should be executed initially to ensure the chopper is
operating from a known state.
TES CHO DAR

This command sets the chopper so that no light passes through the sample or reference path. This command is only
used after the chopper has been initialized to ensure the chopper is operating from a known state.
TES CHO PEAK

This command is used to synchronize the chopper timing offset in relation to the bench firmware. This command is
typically executed when the bench is built and aligned.
TES CHO REF

This command sets the chopper to allow the light to pass through the reference path. This command would only
allow the light to pass through the reference path if the chopper has been initialized.
TES CHO SAM

This command sets the chopper to allow the light to pass through the sample path. This command would only
allow the light to pass through the sample path if the chopper has been initialized.
TES CHO STA

This command starts the chopper spinning. The chopper is initialized by this command.
TES CHO STO

This command stops the chopper from spinning. The chopper is initialized to the dark state by this command after
the chopper has stopped spinning.

TES CON PDL <time>
This command sets the delay between firing the xenon lamp and setting the HOLD signal. The setting is in 2µs
increments, if no parameter is sent the current value is reported. In the example, the instrument has a delay of 90µs
set.
Example:
TES CON PDL
45
TES CON STR <clear- UV attenuator > < UV attenuator -UG5> <UG5-B390> <B390-CM500> <CM500-O58>
This command sets the changeover wavelengths for the stray light filters. If no parameter is sent then the current
changeover wavelengths are reported.
Example — to get the current values

TES CON STR <enter>
0 Clear 223.00 UV attenuator 265.00 UG5 372.00 B390 453.00 CM500 590.00 O58
-
In the next example, we move the point at which the CM500 filter comes in by 1nm.
Example — to set new values

TES CON STR 223.0 265.0 372.0 454.0 590.0 <enter>
-
Note 1 The filter change points can be moved in 0.1nm increments. ▲

Note 2 Do not move the filter change points by more than 1nm or the instrument performance may be
compromised. ▲
TES CON AAC

This reports the instrument specification for the Absorbance Accuracy validation tests.
Example:
TES CON AAC <enter>
0-1A 0.0040, 1-2A 0.0060, 2-3A 0.0120
-
TES CON ARE

This reports the instrument specification for Absorbance Repeatability.
Example:
TES CON ARE <enter>
0000000000000-1A 0.0020, 1-2A 0.0050, 2-3A 0.0080
-
TES CON WAC

This reports the wavelength accuracy instrument specifications.
Example:
TES CON WAC <enter>
0.3
-

TES CON WRE
This reports the wavelength repeatability instrument specifications.
The second parameter in the reply is the bandwidths to be tested. This is a decimal number that represents a binary
bit mapped value. To interpret it, convert the number to binary, then the bandwidths are encoded such that the LSB
represents 0.2nm, the next bit represents 0.5nm, etc. Each bit that is set represents a bandwidth at which the test is
to be carried out.
MSB LSB
0 0 0 0 1 0 1 0
X X 4.0 2.0 1.5 1.0 0.5 0.2

Example:
TES CON WRE <enter>
Wav Rep 0.1, Bandwidths 10
-
TES CON NOI
This reports the noise test instrument specifications.
Example:
TES CON NOI <enter>
0-1A 0.0003, 1-2A 0.0004, 2-3A 0.0040, Wave 500, Int time 1
-
TES CON STL

This reports the stray light test instrument specifications.
Example:
TES CON STL <enter>
KCl 200nm 2.0, Filter 220nm 3.0, NaI 220nm 3.3, Filter 340nm 3.0, NaNO2 340nm 3.7
TES CON BAS

This reports the baseline flatness test instrument specifications.
Example:
tes con bas <enter>
Lower 200, Upper 800, Between 0.0010, Outside 0.0020, Smoothing 1, Speed 120
-
This means that between 200 and 800nm the limit is ±0.001A, which rises to ±0.002A outside the 200 to 800nm
range. The tests conditions are 120nm/min with low smoothing.

TES CON RES
This reports the bandwidth test instrument specifications.
Note The Band and Wave values are both bitmaps. For the bandwidths bit 0 - 0.2nm, bit 1 0.5nm, etc., and
for the mercury wavelength bit 0 - 253.65nm, etc. ▲
Example:
TES CON RES <enter>
Limit 10.0, Band 10, Wave 16
-
This example shows a bandwidth limit of ±10% to be measured at 1.5nm and 0.5nm bandwidths, using the
546.07nm mercury line.
TES CON DRI

This reports the drift test instrument specifications.
Example:
TES CON DRI <enter>
Limit 0.0005, Wave 340
-
This example means the drift test is carried out at 340nm and the limit is 0.0005A/hr.
TES CON INI <int1> <int2>

This command sets the zero order parameters. If no parameter is present, the current settings are reported.
Note Setting the Position to 0 will force a lifetime initialization. ▲
Example 1 — request the current settings

TES CON INI <enter>
Position 1021, Filter 0
-
The response states that the peak was found at 1021 steps from the end stop using filter 0.
Example 2 — reset the values to a position of 1023 using filter 1

TES CON INI 1023 1 <enter>
-
TES CON GS <XENON/MER> <0.2/0.5/1.0/1.5/2.0/4.0> <Section> <DAC Value> <ADC Gain> <Sam Gain> <Ref
Gain>
This command sets the xenon lamp DAC value and the individual gains for the given lamp / bandwidth / section
combination. If no parameter is present, the full table of values is reported.
Note The DAC value is stored as a 10-bit value so it may not be reported as entered. ▲
Example:
TES CON GS XE 1.5 1 0 0 3 3 <enter>
-
The use of this command is covered in more detail in “Section 8.6.”

TES CON BOU [<location> <wavelength>]
This command sets the boundaries (in wavelength) for the gain settings setup by TES CON GS. If no parameters
are given, the current settings are reported.
Example 1 — request the current settings (part of response shown).
tes con bou <enter>
0 0.00
1 180.00
2 201.00
3 217.00
4 223.00
Example 2 — to reset boundary 2 to 203.0nm.
TES CON BOU 2 203.0 <enter>
-
TES CON PRE <flashes> <max DAC> <DAC0> <DAC1> <DAC2> <DAC3>
This command sets the number of flashes that are discarded at the start of each set of reading. (This allows a brief
warm up time for the lamp.) It also provides a means of adjusting the xenon lamp control voltages. There is a
maximum DAC value that must not be exceed or damage may occur to the lamp, four other values that may be
used in the gain matrix.
If no parameters are present, all the programmable values are reported.
Note To save memory space, the DAC0 and DAC1 values stored as value divided by 2 - consequently if
you enter an odd number it will read back the next lower even number. The DAC2 and DAC3 values
are stored as value divided by 16 and so will be rounded to the next lowest multiple of 16. ▲
The <max DAC> value will be clipped to the next lowest one of the 4 possible DAC values.
Note This version of the command is valid for v1.06 and above. ▲
Example 1 — request the current settings.

TES CON PRE <enter>
Pre Flash 3, Max DAC 2500,V0: 0, V1: 254, V2: 511, V3: 2500
-
Example 2 — to change the V1 value to 364, not changing the other values
TES CON PRE 3 2500 0 364 511 2500<enter>
-
Pre Flash 3, Max DAC 2500, V0: 0, V1: 364, V2: 511, V3: 2500
-
TES CON REA <dark> <zero>

This command sets the number of readings to be taken when making a dark or zero measurement.
TES CON REA <enter>
Dark 10, Zero 80
-
Example 2 — to reset the values to 3 and 10
TES CON REA 3 10 <enter>
-

TES CON TPA
This command reads back the scan speed and integration time used for all the validation tests.
Example:
TES CON TPA <enter>
Scan Speed 30nm/min, Integration time 1 sec
-
TES CON ZOR [<saturation limit> <zero order position> <zero order filter> <0.5 offset> <1.0 offset > <1.5 offset>
<2.0 offset > <4.0 offset >]
This command sets and reads back the zero order position and saturation level and the offsets from the zero order
position at other bandwidths.
TES CON ZOR <enter>
Sat 7.5 V, Pos 1214, Fil 0, 0.5 -1, 1.0 0, 1.5 1, 2.0 1, 4.0 2
-
This means that the saturation limit is set to 7.5V. The peak was found at 1214 steps from the end stop, using filter
0. At 0.5nm bandwidth the peak is at 1214-1 steps, and so on.
Example 2 — to change the saturation level to 8.0V. All the other parameters must be entered as reported.
TES CON ZOR 8.0 1214 0 -1 0 1 2 3 <enter>
-
TES CON DIS 0/1

This command sets the display type (0 = old STN, 1 = new 6.4” TFT). The instrument must be power-cycled for
this command to take effect.
TES GAIN SAM 0/1/|2

This command sets transimpedance gain to x1, x8, x64 respectively.
TES GHOP
This command reports the current setting.
Example 1 — switches the transimpedance gain switching on and off. The default is on.
TES GHOP [ON|/FF] <enter>
-
Example 2 — enable gain hopping (current behavior)
TES GHOP ON <enter>
-
Example 3 — disable gain hopping

TES GHOP OFF <enter>
-
TES IPST
This command initiates the Internal Printer self test routines by toggling the lines. This checks the printing and also
reports on the RS232 configuration etc.

TES CLEAR <RTC / EEPROM / NVM>
This command clears the contents of RTC (validation information), the EEPROM (instrument information) or the
NVM (user interface, default baseline etc.).
Example:
TES CLE EEPROM <enter>
-
TES DIS
This command runs the disk test and requires a write-enabled, formatted floppy disk drive to be placed in the disk
drive of the instrument before it is executed. The command performs a simple test of the disk filing system. The
possible outcomes from the command are detailed below:
Outcome Action
PASS The disk test did not find any problems.
OPEN_CREATE_FAIL Failed to open and create the disk test file.
WRITE_FAIL Failed to write to the disk test file.
WRITE_CLOSE_FAIL Failed to close the disk test file.
OPEN_RDONLY_FAIL Failed to open the disk test file.
READ_FAIL Failed to read the disk test file.
READ_CLOSE_FAIL Failed to close the disk test file.
COMPARE_FAIL The data read back from the disk test file differs from the
data written to it.
Example:
TES DIS <enter>
PASS
-
TES DOR
This tests the sample compartment door switch (Evolution 600 only). If the reply is “OPEN”, the sample door
should be open. If the reply is “CLOSED”, the door should be closed.
TES KEY
Runs the keyboard test. The instrument waits for up to 30 seconds or until a key is pressed on the key pad. The
name of the key that was pressed is echoed back.
Example:
TES KEY <enter>
SOFT_1
TES NOI <integration_time” <readings> [ZERO|NOZERO]
If you want the test to perform the Zero process, ignore the 3rd parameter. If you wish to manually zero the
instrument, supply NOZERO as the 3rd parameter.
TES PMT AUTO/ON/OFF

If the AUTO (default) option is used, the PMT power supply will be disabled when the sample compartment door
is opened. If the OFF option is used, the PMT power supply will be disabled no matter the state of the sample
compartment door. If the ON option is used, the PMT power supply will be enabled no matter the state of the
sample compartment door. The instrument will revert to auto once the power is cycled.
TES RAW <n>

This command is used to perform n readings. These readings are taken with no automatic gain control or no
mathematical processing.
Note: n is optional. If n is not given, the command performs one reading

TES VAL CTU
This command reports the CTU calibration information.
Example:
TES VAL CTU <enter>
Identifier : 1 CTU identification
Cal Date : 24-06-02 Calibration date
Cal Wave 1 : 546.05 First test wavelength
Cal Wave 1 Tol : 0.30 First wavelength tolerance
Cal Wave 2 : 361.05 Second test wavelength
Cal Wave 2 Tol : 0.30 Second wavelength tolerance
Cal Wave 3 : 453.65 Third test wavelength
Cal Wave 3 Tol : 0.30 Third wavelength tolerance
Calibrated Absorbance : 0.9945 Absorbanec filter value
Abs Tolerance : 0.005 Absorbance test tolerance
Abs Wavelength : 546 Absorbance test wavelength
-

TES VAL CVC
This command reports the CVC calibration information.
Example:
TES VAL CVC <enter>
Identifier : 1 CVC identification
Cal Date : 24-06-02 Calibration date
Cal Wave 1 : 546.05 First test wavelength
Cal Wave 1 Tol : 0.30 First wavelength tolerance
Cal Wave 2 : 361.05 Second test wavelength
Cal Wave 2 Tol : 0.30 Second wavelength tolerance
Cal Wave 3 : 453.65 Third test wavelength
Cal Wave 3 Tol : 0.30 Third wavelength tolerance
Calibrated Absorbance : 0.9945 Absorbanec filter value
Abs Tolerance : 0.005 Absorbance test tolerance
Abs Wavelength : 546 Absorbance test wavelength
-
TES STEP <start step> <no of points> <step size> <number of readings per point>
This causes the Step Scan routine to be called. This allows step wise scanning in intensity and is useful when
investigating initialization problems.
Example:
TES STEP -20 40 1 10 <enter>
-
Note To see anything you need to have turned on either the OI or CA debug (DEB OI ON / DEB CA
ON). ▲
TES MECH <FILTER/CTU/MONO/CHO/SLIT/FLIP> <No Of Tests>

This command allows the various mechanisms to be tested. For the Filter, CTU and Mono this involves driving the
mechanism and periodically checking that the sensor is still asserted when it should be. If there is a problem, the
motor drive period will be increased and the test restarted, (an error is issued to indicate that this has occurred). For
the slit test to work, the instrument must be initialized with some light coming through the system. The flipping
mirror test simply drives between the two stable states the requested number of times so it is only really suitable for
checking for wear. The CHO option tests the synchronization between the chopper optosensor and chopper
position.
Examples:
TES MECH FILTER 10 <enter>
-
TES MECH CTU 100 <enter>
-
TES VER
This command reports the GAL version number.
Example:
TES VER <enter>
IC702: v01.24
-

TES FLIP
This command drives the flipping mirror to the requested state.
Examples:
TES FLIP UP <enter>
-
TES FLIP DOWN <enter>
-
TES MECH CHO X

T Tests the chopper sensor position. X is the number of seconds to run the test.
Ideal output from this is 0, and is adjustable by re-positioning the chopper sensor up or down. TES CHO STO
should be run before starting this command. Any values greater than +/- 1 should be fixed.
See Figure 6-5. Adjust the sensor position up/down (very sensitive!) to achieve 0. Stop the chopper before each run
of this command, otherwise, the values will run in the 3-4 range, with little or no adjustment. Tighten the sensor
mounting screws after the adjustment is done.
TES ABS
This command takes a %T value and reports the corresponding Abs value
Example:
TES ABS 0.1 <enter>
3.0000
-
TES UPG <DISK/RS232>

This command drops down to the boot code to load new flash code via disk or RS232. The instrument will reboot
once the code has been loaded.
Example:
TES UPG DISK <enter>
TES NVM
This command reports the size of the various elements in the NVM, together with information about checksums,
etc.

Example:
TES NVM <enter>
Name Start Size Allocated Checksum Space
options 0 145 232 PASS PASS
CK_nvm 232 11 12 PASS PASS
LA_nvm 244 9 10 PASS PASS
sampleInfo 254 49 50 PASS PASS
historyInfo 304 13 14 PASS PASS
userRecord 318 721 722 PASS PASS
MP_nvm 1040 41 42 PASS PASS
accessories 1082 167 168 PASS PASS
GainSwitching 1250 541 542 PASS PASS
GainSwitchWave 1792 61 62 PASS PASS
CA_nvm 1854 1801 1802 PASS PASS
Free space 3656 51 52 PASS PASS
RS_header 3708 117 130 PASS PASS
compressed_BL 3838 4351 4352 PASS PASS
-
TES HISTORY <GET / OFF / START / CLEAR / PRINT / SAVE / ROUTINE_M / OPTIC_REP / ELECT_REP /
CHECK_PERF / MAJOR_MAINT> <engineer name <=11 chars> <job ref. <= 8 chars >
TES HISTORY GET reports the contents of the electronic log

TES HISTORY OFF switches logging off (but does not clear old log)
TES HISTORY START switches logging on (appends new entries to existing log)
TES HISTORY CLEAR deletes all entries in electronic log
TES HISTORY PRINT prints the contents of the electronic log on the current printer (no printing errors reported)
TES HISTORY SAVE writes the contents of the electronic log as a file called HISTORY.LOG on a disk (no file-
saving errors reported)
The other options require the second and third parameters. The engineer name (<=11 chars) and job ref. (<= 8
chars) and will add an item to the electronic log:
TES HISTORY ROUTINE_M Routine Preventive Maintenance

TES HISTORY OPTIC_REP Repaired Optics
TES HISTORY ELECT_REP Repaired Electronics
TES HISTORY CHECK_PERF Checked Performance
TES HISTORY MAJOR_M Major Corrective Maintenance
Example:
TES HISTORY MAJOR_M K_E_Thomas 123AABC4 <enter>
-

12.0Error Messages
Evolution 300 and Evolution 600 instruments can output a wide range of status and error messages. It is important
to note that these messages are displayed one at a time, most recent last. When the displayed message is cleared, by
pressing the Clear key, the next one will be displayed. If an error occurs, make a note all of the error messages, the
top one may not be the most important.
12.1 Error Types
There are currently three classes of error message: warnings, fatal errors and accessory configuration change
messages. A warning tells the operator to check something, or that maintenance will soon be needed. It does not
prevent an analysis from being run. A fatal error is issued if the instrument cannot produce an accurate result. The
run will be terminated and the data should not be used. The accessory messages tell the user if the status of an
accessory has changed. For example, an accessory may just have been plugged in.
Error numbers 1000-2999 are warnings.

Error numbers 3000-4999 are fatal errors.
Error numbers 5000-5999 are accessory configuration change messages.
Error numbers 6000- 6999 are used by VISION Software to indicate communications errors.
Error numbers 7000- 7999 are used by VISION Software for warnings
Error numbers 8000- 8999 are used by VISION Software for fatal errors.
VISION errors are not covered in this manual. If you have an error on the 6000 range, check that the RS232 cable
is working and correctly installed. Try rebooting the PC running VISION and re starting the instrument.
12.2 Warnings: Error Numbers 1000 - 1999

1000 to 1014: A parameter sent to the instrument is incorrect.
The last digit of the error number is the number of the parameter that is wrong, starting at zero. For
example, Error 1001 has the second parameter incorrect.
Possible causes. A parameter is out of range.
An incorrect character has been used, typing mistake.
The parameters are not in the correct order.
A parameter is missing.
Spaces have been used in the wrong places.
A communication problem has corrupted the command.
A backspace has been used in the command
1015: The command checksum is incorrect. This error only occurs in Protocol mode.
This is probably due to communication problem.
This error always occurs when debug is switched on; in this case, it should be ignored.
1016: Unrecognized command.

Usually the command has been incorrectly typed. If this is not the case, it may be a command that the
instrument does not support, or there may be a communication problem that has corrupted the command.
1017: Another command is already running. The instrument is busy.

The instrument may be scanning, taking a baseline or performing some other operation that takes time.
Please note that E1017 sometimes hides the real error. Check the full error list.
1018: This error tells you that the error queue is full. Some of the error messages may be lost. It may be necessary to
reinitialize the instrument.
1022: When the data was read from NVM, the checksum calculated from it, did not match the one that had been
stored in the NVM with the data.

1026: A command to drive the CVC was received but the CVC could not be detected.
1027: An overflow occurred on the RS232 link.
1029: A parity error occurred on the RS232 link.
1030: A framing error occurred on the RS232 link.
1031: An overrun error occurred on the RS232 link.
1032: An attempt to send information down the RS232 link failed as nothing was listening. Make sure the receiving
device is switched on and ready.
1033: The RS232 device is now communicating again. This warning is issued after a failed attempt to send data has
left a data buffer full.
1034: A Sipper calibration command was received which would result in the sipper factor being set too low. The
required range of volumes is lower than the Sipper can provide. Therefore, the sipper factor was set to its
lowest possible value.
1035: A Sipper calibration command was received which would result in the sipper factor being set too high. The
required range of volumes could is greater than the Sipper can provide. Therefore, the sipper factor was set to
its maximum value.
1036: A command to drive the Sipper has been received but the Sipper is not connected.
Note This warning will not be generated if the Sipper is disconnected or turned off after it has been used.▲
1037: The battery in the real-time calendar clock chip has failed. Replace if required.
1045: The current wavelength calibration requires motor steps that cannot be achieved. The instrument requires
another wavelength calibration to be performed.
1047: The printer has signaled an error condition.
1048: The printer was off-line.
1049: The printer is out of paper.
1051: The Cell Changer sensor may be faulty.
1052: The Cell Changer has been moved.
1055: There is an internal printer error. Switch the instrument off wait 30 seconds and switch on again.
1056: There is an error in the History File. Delete the History File. This can be done using the local control or the
TES HISTORY CLEAR command. It is recommended that the History File be backed up to disk after each
maintenance operation.
1057: There is an internal printer error. Switch the instrument off wait 30 seconds and switch on again.
1058: The zero order peak has moved - reinitialize the instrument.
1059: Two devices have tried to access the I2C bus at the same time and the conflict could not be resolved.

1060: Unrecognized I2C command
1061: The last I2C command was not allowed
1062: There was too much data on the I2C bus
1063: Invalid I2C bus address
1065: An accessory is not initialized
1066: I2C bus timeout
1067: The accessory present is not a CVC
1068: Incorrect type of carousel fitted
1069: The accessory optosensor is blocked
1070: No carousel installed
1071: I2C bus timeout
1072: The I2C command was not began
1073: A value on the I2C bus was out of range
1074: The carousel was not at its peg
1075: Xenon lamp energy low
1077: Wavelength table compression failed. The table will be recalculated at switch on. The instrument takes longer
to boot up but performance is not affected.
1079: I2C bus transfer not completed
1300: The last command sent is not supported by this version of the instrument
12.3 Fatal Errors: Error numbers 3000 - 3999
3002: The Cell Changer has not moved correctly to the requested cell.
3003: D2 Heater Off. The detection of the deuterium lamp turning off has failed. This most likely due a failure in the
D2 circuit on the lamp control board.
3005: D2 On Ready Signal. The deuterium lamp was already detected as being On when an attempt to turn it on was
made. This most likely due a failure in the D2 detection circuit on the lamp control board.
3008: D2 Failed to Strike. Three failed attempts were made to strike the D2 lamp. The D2 lamp or the D2 circuit on
the lamp control board could have failed.
3010: Tungsten Lamp Off. The detection of the tungsten lamp turning off has failed. This most likely due to a failure
in the tungsten circuit on the lamp control board.
3011: Tungsten Lamp On. The detection of the tungsten lamp turning on has failed. This most likely due to a failure
of the tungsten lamp or the tungsten circuit on the lamp control board.

3016: The ADC reading for the 5V reference signal is considerably less than expected. This implies that either there
is a problem with the reference voltage itself or the ADC is failing.
3024: The monochromator was requested to move to a wavelength greater 1100nm or less than 0nm. This error can
be generated by trying to drive to a wavelength when the bench is not initialized.
3025: Internal software failure. Switch off and on again to reset the instrument.
3026: The device on the RS232 has not responded. Data output to the RS232 has been thrown away.
3027: The instrument has failed to initialize. Record ALL the error messages that are displayed. Make sure the beams
are clear and try again with the debug code switched on.
3028: Failed to find the zero order position of the monochromator. Make sure the beams are clear and try again with
the debug code switched on.
3043: A buffer overflow has occurred during a rate measurement. Data may have been lost.
3046: The real time calendar clock chip has stopped. Try setting a new time with the STIME command before
resetting the instrument. If this fails, ensure that the module, IC104, is firmly seated in its socket.
3048: During the wavelength calibration, a calibration line could not be found. Try running the calibration again.
Ensure that the mercury lamp is installed and working correctly. Check the operation of the flipping mirror, and
make sure it is correctly adjusted.
3049: The measured wavelength calibration coefficient did not fit the actual measured data. Please try running the
wavelength calibration again.
3050: The measured wavelength calibration coefficient was not stored correctly. Please try running the wavelength
calibration again.
3051: The wavelength calibration has failed. The errors in the monochromator are too great. Re-align the
monochromator and try running the wavelength calibration again.
3056: The instrument is not initialized.
3060: There is no valid default baseline in memory.
3066: The monochromator has been requested to move a number of steps that are out of range. Please re-run the
wavelength calibration routine.
3067: The monochromator has been requested to move a number of steps that are not supported. Please re-run
wavelength calibration.
3068: The sample channel gain cannot be set low enough to get an ADC reading in the linear range of the detector.
Too much light in the sample channel can cause this.
3069: The reference channel gain cannot be set low enough to get an ADC reading in the linear range of the detector.
Too much light in the reference channel can cause this.
3072: An error was reported when writing data to the configuration EEPROM. Try repeating the command.
3076: A DMA transfer has timed out.
3077: The baseline is corrupt.

3078: The instrument has failed to reconstruct the baseline from the stored data.
3079: The instrument has failed to compress the baseline data into a form that can be stored.
3081: The VFC has stopped running. This is usually because it has been presented with a negative input. Check for
light leaks, or lid open.
3082: The carousel was not in the expected position when the run started.
3083: The serial number on the CVC did not match that on the stored data. Check that you have the correct disk for
your CVC and re-load the data.
3084: The Cell Changer could not find the flag for the requested position.
3085: The checksum of the CVC data read from the disk is incorrect.
3086: Failed to read the CVC data from disk.
3087: The version number in the file is not a value that the software knows how to deal with.
3088: There was an overflow in the signal processing math. This is normally caused by the sample compartment lid
being opened during a run.
3089: ADC saturated
3091: The instrument is set to its lowest gain but signal is still off-scale, no reading can be made
3093: The dark voltage is too high. Check for light leaks
3094: An I2C device was not present
3095: An accessory is not in initialized
3096: Validation NVM overfilled
3097: No mercury lamp present
3098: The external Peltier power supply is switched off
3099: The CVC has not been able to read the serial number correctly
3100: CTU not present
3101: ADC reading incorrect
3114: Chopper has not initialized or moved correctly (Evolution 600)

12.4 Accessory Errors: Error numbers 5000 - 5999
5001: Accessory lamp installed
5002: Sample channel accessory installed
5003: Reference channel accessory f installed
5101: Accessory lamp removed
5102: Sample channel accessory removed
5103: Reference channel accessory removed

13.0Routine Maintenance
The Evolution 300 and Evolution 600 are designed to require minimal maintenance; however, to ensure the
instrument continues to meet its performance specifications throughout its working life, the following routine
checks are recommended. Some of the tasks listed here are covered elsewhere in this manual. Instructions for
carrying out the remaining ones are in the sections following the maintenance lists.
Maintenance tasks every 500 hours or 6 months

Check that the airflow around the instrument is clear.
Remove any accumulated dust from the exterior of the air-intake grille and the source fan air filter on the
instrument back panel.
Clean all sample compartment and external surfaces.
Clean the source interchange mirror (Evolution 600 only)
Check and record the xenon (Evolution 300 only) or tungsten and deuterium (Evolution 600 only) lamp energy,
lamp hours and percentage of life – this is reported when a performance test is done. Alternatively, the data can
be accessed using remote commands.
Check the xenon lamp energy and percentage of life - this is reported when a performance test done.
Alternatively, the data can be accessed using remote commands.
Check calibration expiry dates on certified reference materials (CVC, filters, etc.) and return for re-calibration
if required.
Check any associated accessories (e.g., Sipper, Cell Changer, etc.) for signs of corrosion or wear. Clean as
necessary and change tubing, etc. as required.
Carry out the following performance checks if these are not already being done on a regular basis:
Absorbance Accuracy
UV absorbance Accuracy
Absorbance Repeatability
Wavelength Accuracy
Wavelength repeatability
Stray light
Baseline flatness
Noise
Optionally the Drift test may also be performed
13.1 Additional maintenance tasks every 1000 hours or 12 months

Clean the external surfaces of the windows of the sealed optics compartment.
Check power cord and connecting lead for damage, solvent attack, etc.
Complete electrical safety checks.
13.2 Additional maintenance tasks every 2000 hours or 24 months

Check the light seals.
Check the operation of the slit selection plate.
Check the operation of the flipping mirror (Evolution 300 only)
Re-run the Default Baseline.
Check cable connections to the main processor board and to the display and keypad where applicable.
Check the operation of the floppy disk drive.
Check the chopper assembly for ease of movement (Evolution 600 only).
Check the source interchange mirror for ease of movement (Evolution 600 only).

13.3 Airflow and cleaning
Make sure the sample compartment is empty. Gain access to the rear of the instrument; brush away any dust that is
blocking the fan input grille. Swing out the service stands (see “Section 14.3”), and tip the instrument into its
service position. Brush away any dust or debris that may be blocking the ventilation slots on the power supply
module.
If there is too much dirt to clean off in this way, it may be necessary to remove the power supply module so that it
can be cleaned internally. See “Section 14.4” for how to gain access to the power supply.
Replace the instrument on the bench. Ensuring that there is no debris underneath it and that there is at least 25mm
between the fan grille and the wall or any other obstruction.
The Evolution 600 has a cooling fan for the source lamps; this filter should be checked and cleaned in one of two
ways. Either by removing the finger guard and filter (4 screws with nuts on the inside), or remove the top
right-hand cover and blow out with compressed air
The exterior of the instrument can be cleaned as follows:
Caution Do not allow moisture to leak into the instrument. ▲
1. Switch off the spectrophotometer and disconnect from the wall outlet.
2. Using a lint free cloth dampened with a weak solution of detergent and water, wipe the exterior surface of the
instrument as necessary.
3. Wipe over with a cloth dampened with plain water.
4. Dry the surface with another cloth.
13.3.1 Cleaning the external surfaces of the optics cover windows
Remove the right-hand top cover (see “Section 14.2.2”). Remove the thin PVC light baffle (Evolution 300 only) or
foam light baffle (Evolution 600 only) to access the optics cover windows. Do not remove the optics cover. Wipe
the windows with a lint free cloth dampened with a weak solution of detergent and water. Wipe over with a cloth
dampened with deionized water; finally dry the surface with another lint free cloth.
13.3.2 Electrical safety checks
Power supplied to the instrument should be from dedicated, uninterrupted sources. Power must be free of voltage
dropouts, transient spikes, frequency shifts and other line disturbances that impair reliable performance. Each wall
outlet must be equipped with a 3-wire line: live, neutral and ground. The ground must be a non-current carrying
wire connected to earth ground at the main distribution box. Reference the manual Evolution 300 and
Evolution 600 Site and Safety Information.
The critical safety checks are earth bonding and insulation breakdown. These should be tested using a Portable
Appliance Tester suitable for Class1 products. This must be used in accordance with the local standards and the
manufacturer's instructions.
Measure the resistance between the ground of the power cable (disconnected from the supply) and each of the
areas outlined below. Ensure that where necessary the probe breaks through the paint.
The base casting in the sample compartment.

The power inlet panel.
The Services panel.
The power supply housing.
Each of the base cover panels.

13.3.3 Checking light seals
Check each of the following areas.
1. Remove the left-hand top cover (see “Section 14.2.1”). Verify the thin black PVC cover (Evolution 300 only)
or the foam light baffle (Evolution 600 only) is in place over the detector housing. Replace the outer cover.
2. Remove the right-hand top cover (see “Section 14.2.2”). Verify the thin black PVC cover (Evolution 300 only)
or the foam light baffle (Evolution 600 only) is in place over light path from the optics cover to the sample
compartment wall.
3. Verify either a mercury lamp is installed or the dummy lamp accessory is in place (Evolution 300 only).
Replace the access cover.
4. Verify the foam rubber gasket on the accessory access panel is in good condition. Replace if necessary. The
gasket is shown in Figure 13-1, and marked with an arrow.
Figure 13-1 Light sealing gasket

14.0Servicing
14.1 Accessing the lamps
The lamps are housed at the right-hand side rear of the instrument. The access cover is held in place by a
quarter-turn screw indicated in the diagram by an arrow.
CAUTION
Figure 14-1 Lamp housing cover
14.2 Removing the top covers

Before removing any covers, switch off and disconnect power cord from the wall outlet. Open the sample
compartment lid.
14.2.1 Left-hand side cover
This is held in place by two screws and a plastic button. The screws are on the back ledge of the instrument and
under the sample compartment lid near the front. Remove these, then depress the plastic button at the front left of
the instrument (see Figure 14-2). The cover can then be lifted clear. Reverse this procedure to re fit the cover.
Figure 14-2 Cover release button

14.2.2 Right-hand side cover
Remove the accessory lamp cover. This exposes the DVI cable that connects the Local control pod to the main
board. Remove the M4 screw that holds down the EMC grounding connection. Undo the jack screws and pull the
cable clear. A small screwdriver is needed at access the jack screws (see Figure 14-3).
Three screws and a plastic button hold the right-hand cover in place. Two of the screws are on the back ledge of the
instrument and the other is under the sample compartment lid near the front. Remove these then depress the plastic
buttons at the each side of the cover at the front. The cover can then be lifted clear.
Important When replacing the covers, make sure that the DVI cable is correctly installed and that the EMC
clip is firmly secured in place.▲
Figure 14-3 Location of DVI plug showing EMC grounding clip
14.3 Accessing the underside

The Evolution 300 and Evolution 600 are designed to stand on their backs for access to the underside while
servicing. Two hinged feet are provided on the rear of the instrument to ensure stability in the service position.
These should be moved out before the instrument is lifted up (see Figure 14-4). It may be necessary to use a
screwdriver to move the feet into the service position.
Figure 14-4 A service foot in position

The base cover is in several parts and not all of these needs to be removed for servicing purposes. The largest
section of the cover is over the processor board. This is the one most frequently removed it is held in place by eight
M3 screws. On a local control instrument, it will be necessary to loosen or remove the disk drive before this cover
can be removed. The disk drive module is held in place by two screws. Remove all these screws and lift the big
cover clear. Replace the disk drive and loosely fix in place with two screws. In addition to safety issues, this cover
also affects the cooling of the sample compartment and provides electrical screening. It is important that it is
correctly replaced with all the screws done up tightly.
14.4 Removing and replacing the power supply
First, switch off the instrument and remove the mains lead. Place the instrument in its service position and remove
the large base cover. The main power supply is mounted in a removable module, in a recess in the rear of the
casting. It is held in place by five M3 screws as indicated in Figure 14-5. Remove these screws, then the module
can be withdrawn, it will now be held in place by two cableforms. The output cableform terminates in a 12-way
MTA156 connector situated on the main board close to the PSU module. Remove this connector. With the module
part way out, the main input connector, marked with an arrow in Figure 14-6, can be removed. Note that for the
Evolution 600, three ring tags are used in place of this connector. The module can now be fully withdrawn.
Figure 14-5 Power Supply Module Fixings
Figure 14-6 Main input to PSU module
To replace the module reverse the steps above. When sliding the module back in, take care not the trap the
cableforms. Hold the module close to the casting to ensure that the fixing lugs locate with the casting.

If it is necessary to dismantle the module further, the power supply is held in place to by two screws on the base of
the module. Remove these, take care with them they are not metric! The power supply can now be removed and the
fan accessed (see Figure 14-7). This assembly differs slightly between the Evolution 300 and the Evolution 600.
Evolution 300: The fan is wired directly into the output cableform. If the fan fails, the whole cableform must be
replaced. This is simple, just remove the MTA connector and unscrew the terminal blocks that take the 5V output.
When fitting the new cableform, make sure that the ring tag on the red wire goes to TB2, the one furthest from the
MTA connector.
Evolution 600: The fan is wired to a 2-way Molex™ connector that plugs into TB5 of the power supply. This is a
polarized connector and can only be plugged in one way.
Figure 14-7 PSU and fan
14.5 Measuring the power supply voltages

Power supply voltages can be read with a multimeter at the power supply connector plugging into the main PCB.
The power connector is a twelve pin Molex that plugs into the lower left hand corner of the main PCB.
Main power
connector pins
12 11 10 9 8 7 6 5 4 3 2 1
VCC VCC
Ground Ground +24V N/C -15V Ground Ground Ground +15V +15V
+5V +5V
Black Red Red Black Yellow White Black Black Black Orange Orange
14.6 Removing and replacing the optics cover

Remove
The right-hand side top cover
The dummy lamp accessory and the thin light baffle next to the sample compartment wall (Evolution 300)
The foam light baffle (Evolution 600)
The optics cover is held in place by four M4 screws each in a recess in the cover wall. Remove these screws. The
cover can then be lifted off. Be careful to lift the cover straight up so as not to damage any of the optics.

When reassembling the cover, take care to ensure that the walls go cleanly into place. Make sure that the thin light
baffle over the monochromator lead screw is not trapped under the nearby wall. It may be necessary to hold this
baffle out of the way while the optics cover is positioned. If working on an Evolution 600, ensure the chopper
cableform is not trapped under the nearby wall (next to the slit wheel assembly).
14.7 Removing and replacing the main PCB
For a local control instrument, start by removing the right-hand top cover, this includes disconnecting the DVI
cable from the main PCB. When this is done, tip the instrument into the service position and remove the main
baseplate (see “Section 14.3”). Remove all the connectors from the main PCB. It is held in place by six (6) screws,
these are marked by arrows in Figure 14-8. Do not remove the screws marked with a cross in the figure. The board
can now be lifted clear.
When replacing the board, make sure that none of the cableforms are trapped between the PCB and the mounting
points. It is best to plug in all the connectors and seat the board before putting in any of the fixing screws.
Figure 14-8 Main board fixings (shown on Evolution 300)

14.7.1 Service procedures for replacing the electronics PCB board
1. Re-enter serial number using the production utility.
2. When replacing a circuit board, the contents of the NVM must be cleared with the following commands, then reboot
the system:
a. TES CLEAR NVM
b. TES CLEAR RTC
c. TES CLEAR EEPROM
3. Use terminal command TES CHO PEAK to set chopper timing.
4. Install the mercury lamp to perform wavelength calibration.
a. The terminal command is MON FULL or use VISION to perform the wavelength calibration.
5. Run a new default baseline.
a. The terminal command for default baseline is DBA 0.5, or use VISION to run the default baseline.
6. Test the NVM with TES NVM to report any errors.
14.8 Checking operation of slits and flipping mirror

Switch on the instrument and allow it to initialize. Connect to a PC running a terminal program and gain control.
Now remove the right-hand side cover and the optics cover, so that the assemblies under test can be seen.
Warning UV Radiation. ▲
14.8.1 Checking the Slit plate
From the PC, use the BAN command to go to each bandwidth. Check that the correct slit is in the beam.
Example:
BAN 4 <enter> should put the 4nm slit in the beam.
The slits can be identified by their size (4nm is the widest). Each bandwidth down from 4nm should move
clockwise one position and the slit should be narrower.
14.8.2 Checking the flipping mirror (Evolution 300 only)
The test is only necessary when a mercury lamp is used with the instrument. For this, you will need to turn on the
mercury lamp, so eye protection must be worn.
Use the command LAM MER <enter>. The mercury lamp should switch on and the mirror should move into the
beam. The command LAM XE <enter> should switch off the mercury lamp and remove the mirror from the beam.
With the mercury lamp on, check that the patch is central on the entrance slit. If necessary, adjust the height first,
this is not a critical adjustment, just ensure the patch is roughly central on the entrance slit. The height is adjusted
by means of the screws marked in Figure 14-9.
Figure 14-9 Flipping mirror assembly showing adjustment points

Next, adjust the angle of the flipping mirror; this is a critical adjustment. It is best done by placing a business card
on the collimator mirror. Loosen the fixing screw and rotate the assembly to maximize the energy throughput.
Once this is achieved, tighten down the screw and check that the adjustment has not been lost.
14.9 Removing the detector cover
Remove the left side cover. The detector cover is now visible. There are three (3) fixing screws; one in the center
and one at each end.
Evolution 300: The end screws also hold down the light baffle. Remove these screws and lift off the cover and the
light baffle. The front corner of the light baffle has to be carefully worked around the main cover fixing boss.
Evolution 600: Remove the sample compartment and the foam light baffle before attempting to remove the
detector cover.
Caution If servicing an Evolution 600, immediately cover the active window of the PMT with black
tape to prevent damage by over-exposure to ambient light. ▲

15.0Fault Finding
This section summarizes some of the more common problems that may be encountered.
15.1 General Advice on fault finding
1. Many reported problems are not real; they are either the result of incorrect operation, or they can easily be
fixed using the remote commands.
2. When fault finding, use the debug code. Collect data and save it to a file so that you can email it to technical
support for further assistance.
3. DO NOT REMOVE THE COVERS UNTIL YOU ARE SURE WHAT THE FAULT IS. Once the covers
are off, it is very easy to impair instrument performance.
4. First, try and replicate the fault and note any error messages. This will help to determine if the fault is in the
hardware of software.
5. For performance problems, first check that the built-in validation tests are working correctly. If so, ensure
that the tests in question are being done in accordance with the test specification. Details are given in
“Section 9.1.”
6. For performance problems, always check that the correct type of cell is being used for the customer’s
application. Make sure that plastic cells are not being used in the UV region. With baseline problems, ensure
that the beams were clear when the baseline was run. Check if the customer is using an adjustable cell
holder. It is possible to largely block the beam by incorrectly adjusting one of these.
15.2 Getting help from technical support

If you need help from technical support, they will need as much information as possible on the nature of the fault.
Here is a list of what is required:
1. You will not get any assistance without the following information.
a) Instrument serial number.
b) Local control software version number(s), if applicable.
c) VISION software version number if applicable.
d) Operating system on which VISION is running (e.g., Windows 95).
e) Default printer setting.
2. When the fault first occurred.
3. If a customer’s method is not working, send a copy of the method, with details of all the reagents, cells used
and the results.
4. For a software problem, send all the keystrokes that lead to the failure, plus a full description of the system.
(What accessories, printers etc. that are being used.)
5. If an instrument is failing a performance test, send the actual results from the instrument the test method and the
calibration values of any filters used in the test.
6. When you have used the built-in debug code and captured all the data, email the file to technical support. Do
not send this on a fax; it is needed in electronic form.
15.3 Using the debug information
The Evolution 300 and Evolution 600 have extensive built-in fault finding software. To access this, the instrument
must be connected to a PC running a terminal program. Once you have done this, the debug systems can be turned
on (currently there are nine of these). The full list is given in “Section 11.1” under the DEB command. The most
useful option is the optical initialization subsystem. The following command sequence will initialize the instrument
with the debug code running.
DEB OI ON <enter>
-
INI OPT <enter>

A lot of data results from these commands, the first part of which is self-explanatory, mostly status messages. Most
of the diagnostic information comes from the peak search data, an example of which is shown in Figure 15-1. The
three columns of figures on the left-hand side are the monochromator position in motor steps from the end stop, the
sample channel voltage and the reference channel voltage. In the first example, we see a successful initialization
with a clean peak well in the dynamic range of the instrument. As a contrast to this, the example in Figure 15-2
shows a bad initialization. Here the instrument has erroneously taken some noise data as a true peak. We know it is
noise because the quoted maximum for the peak 25mV, 0% of the saturation limit. This data indicates a serious
loss of energy somewhere in the optical system.
Peak maximum is 3.684E+00, 52.6 % of saturation limit (7.00)

Sample channel is not saturated
Reference channel is not saturated
Sample = +, Reference = x
Sample : Min = 1.466708E-03, Max = 3.683886E+00
Ref : Min = 3.998622E-04, Max = 8.565088E-01
Pos Sam Ref |
----------------------------|-------------------------------------|
1490 1.173E-02 2.042E-03 |
1491 2.540E-02 3.713E-03 |
1492 8.830E-02 1.120E-02 |
1493 3.385E-01 3.982E-02 | *++
1494 8.997E-01 1.049E-01 | ****+++++
1495 1.909E+00 2.410E-01 | **********+++++++++
1496 2.984E+00 4.338E-01 | ******************+++++++++++
1497 3.684E+00 6.538E-01 | ****************************+++++++++
1498 3.662E+00 8.086E-01 | **********************************++
1499 3.065E+00 8.565E-01 | ******************************xxxxxxx
1500 2.281E+00 7.720E-01 | **********************xxxxxxxxxxx
1501 1.424E+00 5.554E-01 | **************xxxxxxxxx
1502 8.027E-01 3.263E-01 | ********xxxxxx
1503 3.489E-01 1.385E-01 | ***xx
1504 1.188E-01 4.276E-02 | *
1505 3.197E-02 9.302E-03 |
1506 1.491E-02 4.160E-03 |
Figure 15-1 Zero order peak data

Sample channel is not saturated
Reference channel is not saturated
Sample = +, Reference = x
Sample : Min = -6.706321E-06, Max = 2.531714E-04
Ref : Min = 2.642625E-05, Max = 7.709506E-05
Pos Sam Ref |
----------------------------|-------------------------------------|
1490 -3.036E-06 3.549E-05 | xxxxxx
1491 -2.225E-06 4.799E-05 | xxxxxxxxxxxxxxx
1492 8.025E-06 5.231E-05 | **xxxxxxxxxxxxxxxx
1493 3.054E-06 5.281E-05 | *xxxxxxxxxxxxxxxxxx
1494 3.338E-05 5.044E-05 | *****xxxxxxxxxxxx
1495 6.539E-05 3.823E-05 | ********++
1496 1.288E-04 5.830E-05 | *******************xxxx
1497 1.893E-04 5.985E-05 | ************************+++
1498 2.373E-04 5.000E-05 | *****************+++++++++++++++++
1499 2.532E-04 7.710E-05 | *************************************
1500 2.163E-04 6.702E-05 | *****************************++
1501 1.655E-04 6.878E-05 | ************************xxxxxx
1502 8.669E-05 5.537E-05 | *************xxxxxxxx
1503 3.551E-05 3.525E-05 | ******
1504 1.363E-05 4.588E-05 | **xxxxxxxxxxxx
1505 8.087E-07 3.212E-05 | *xxx
1506 5.233E-06 5.463E-05 | *xxxxxxxxxxxxxxxxxxx
1507 2.655E-06 4.840E-05 | *xxxxxxxxxxxxxxx
1508 -3.210E-07 4.957E-05 | xxxxxxxxxxxxxxxx
1509 -1.261E-06 4.173E-05 | xxxxxxxxxxx
Figure 15-2 Data from a bad initialization

When fault finding measurement problems, the command DB1 is very useful. What this does is collect all the
relevant debug information from the various subsystems and reports it for the last reading taken. It should be noted
that this is the last single reading, so if you have a long integration time set you will see only the last data sample
used in the integration time. Here is an example:
DB1 <enter>

1 Xenon DAC = 0
2 Xenon Delay time = 40
3 ADC gain = 0 (x1)
4 Sam gain = 3 (x10)
5 Ref gain = 3 (x10)
6 Coupling = AC
7 Sample & Hold = S&H
8 0V (uncorrected) 1.04602077E-04
9 5V (corrected) 1.01825630E-02
10 Sam Dark (raw) 1.04490519E-04, 0V corr. -1.11558002E-07 (-5.47789399E-05 V)
11 Ref Dark (raw) 1.04951215E-04, 0V corr. 3.49137839E-07 (1.71439076E-04 V)
12 Sam : Slow 185, Fast 96012, Int = 0.0019268425 (uncorr)
13 Ref : Slow 39, Fast 95348, Int = 0.00040902798 (uncorr)
14 Sam (dark corrected) : 0.001822352 (8.94839517E-01 V)
15 Ref (dark corrected) : 0.00030407677 (1.49312489E-01 V)
16 T : 98.991999
17 Abs : 0.0043999041
18 ErrFlags value =, 0x0
19 ErrFlags = NO ERROR
20 Most Recent ZERO
21 Isz= 1.855032E-03 (0.91088654 V)
22 Irz= 3.064097E-04 (0.15045803 V)
23 SplitRatio= 1.651776E-01
Figure 15-3 DB1 output
In Figure 15-3, the line numbers have been added to aid the explanation below.
1. This is the voltage to the lamp, 0 is the default value corresponding to 700V.
2. Flash to hold delay, the default value is 40 corresponding to 80µs.
3. Programmable gain amplifier on main board set to x1 gain.
4. Sample gain set to x3.
5. Reference gain set to x3.
6. AC coupling in the preamplifier is in place.
7. Working in sample and hold mode.
8. The ground input is measured, this is the value, and it is used to correct other readings.
9. The value returned when the 5V reference was measured, with the 0V signal subtracted. This value is used to
scale other measurements to convert them to volts.
10. Sample dark level, figure in brackets corrected for ground signal and converted to volts.
11. Reference dark level, figure in brackets corrected for ground signal and converted to volts.
12. Most recent sample reading, ADC data and resultant uncorrected conversion.
13. Most recent reference reading, ADC data and resultant uncorrected conversion.
14. Sample reading corrected for the dark signal and converted to volts.
15. Reference reading corrected for the dark signal and converted to volts.
16. Computed %T.
17. Computed absorbance.
18. Reported error signal.
19. Reported error.
20. Following data is for the last zero carried out.
21. Sample intensity (volts).
22. Reference intensity (volts).
23. The computed split ratio.

15.4 Error 1022 - NVM corrupted
This error occurs when the stored NVM checksum does not agree with the calculated one. It is likely to be seen
after a software upgrade and if there is a problem with the default baseline. The error can be corrected by clearing
the NVM and rebooting the instrument. If this is done the wavelength calibration will be lost together with any
other none default settings. To clear the NVM connect to a PC running a terminal program, establish control and
issue the command TES CLE NVM <enter>. Switch off the instrument. Wait 10 seconds and switch on again. The
software will refill the NVM with the default parameter settings. You will need to recalibrate the wavelength after
this.
It is likely that the corrupt part of the NVM will be user data so if you are unable to recalibrate the wavelength the
data can be read out and re-entered. Here is an example of how to retrieve the wavelength calibration data, you type
the command MPL <enter>, having set the terminal program to save the resulting reply to a text file.
MPL <enter>
1.998464e+00 2.776559e-07 6.791213e-12 4.0
1.998895e+00 1.885237e-07 1.182525e-11 2.0
1.998711e+00 2.500356e-07 7.840158e-12 1.5
1.998446e+00 3.095027e-07 3.980329e-12 1.0
1.999363e+00 2.078102e-07 7.727445e-12 0.5
-
After the NVM has been cleared and the instrument reinitialized, enter the saved data (a line at a time) using the
MPS command. The saved data is in the correct format for the MPS command so you can cut and paste it from the
saves text file to prevent typing errors.
Example:
MPS 1.998895e+00 1.885237e-07 1.182525e-11 2.0 <enter>
-
15.5 Error 1077 - Wavelength table compression failed
This error occurs after a wavelength calibration because the table that defines the number of motor steps per nm is
too big for the memory available. It means that the monochromator needs more error correction than was expected.
This is not a fatal error, the correct wavelength step tables will be calculated at power up, it will just take about 40
seconds longer to boot up than an instrument that does not show this error. Performance is not affected.
To correct this error the monochromator will need to be realigned. How to do this is detailed in “Section 16.1”.
Before starting the alignment, an adjustment must be made. Drive the monochromator to zero order WDR 0
<enter> will do this. Disconnect the wavelength drive motor and wind the mechanism by hand until the grating is
at 90° to the axis of the monochromator. Now adjust the collimator mirror to bring the patch back onto the exit slit.
Having done that, follow the instructions given in “Section 16.1” to complete the alignment. When this has been
done reconnect the wavelength drive motor and replace the covers. After the instrument has initialized, perform a
wavelength calibration and bandwidth check.
We do not recommend that you carry out this procedure unless the customer is unhappy to live with the warning
message.
15.6 Error 3024 - Monochromator requested to drive out of range
This error usually occurs when a wavelength drive command is issued to an instrument that is not initialized. The
reported wavelength in this case will be -3220nm. To fix this problem reinitialize the instrument.

15.7 Error 3027 - Instrument failed to initialize
This means that the instrument has failed to initialize. There can be many reasons for this, also this may be just the
last of several error messages, make sure that all of them are recorded as these may give a better insight into the
real cause.
The initialization routine is very robust and will cope with most eventualities. However, it will fail is the beams are
blocked or badly restricted. It may also fail is the lid is left open in a brightly lit room. In this case, clear the beams
and close the lid then try again.
If this error occurs immediately after a software upgrade, some of the configuration data may have been lost.
Connect the instrument to a PC running a terminal program and send the command
TES CON ZOR <enter>
The response should be something like:
Sat 8.0 V, Pos 1214, Fil 0, 0.5 -1, 1.0 0, 1.5 1, 2.0 1, 4.0 2
If the Sat figure is zero, re-enter all the data with a figure of 8.0 for the saturation level. If in doubt, enter only the
saturation level with all the other parameters as zero, like this:
TES CON ZOR 8.00000000 <enter>

-
After this, reinitialize the instrument, it should now complete the task without any errors.
15.8 Instrument fails to wavelength calibrate
Error 3051
The calibration has been completed but the system has checked the errors of the calibrated monochromator against
the calibration points and found it to be out of specification. This means that the monochromator is not correctly
aligned and that it needs adjustment. See “Section 16.1” on optical alignment.
Error 3048
The calibration has failed because the instrument could not find one or more of the mercury lines. The debug data
will tell you which lines were not found. Here is an example of the last section of debug from a successful
calibration.
line no. 0 Wavelength 253.65 nm position 5065

The four most likely causes of this error are:

1. Something in the beam.
2. The flipping mirror is not operating, or requires adjustment. See “Section 14.8.2” for how to check this.
3. The mercury lamp output is low.

4. Light leaks, when using the mercury lamp the instrument becomes much more sensitive to light leaks than
normal. This is because the mercury lamp is a continuous source not a flash and because the collected
energy is much lower that that from the xenon lamp. The continuous nature of the lamp means that the AC
coupling in the preamplifier has to be switched out; this effectively disables the low frequency filtering
that removes much of the effects of artificial lights. The low energy means that much more gain is needed
than normal. Check that all the light seals are in place and in good condition. If this does not help try
covering the instrument with a cloth or switching the room lights off.
15.9 Error 3060 - Default baseline corrupt
The default baseline is either not present or has been corrupted. This may occur after a software upgrade and will
definitely occur is the NVM is cleared for any reason. The cure is simple, run a new default baseline. A default
baseline may take more than an hour to collect and compress. The instrument should have been warmed up for at
least 30 minutes before starting the process.
15.10 Error 3079 - Default baseline cannot be compressed
The default baseline needs too much memory to be compressed. First, check that the beams were clear when the
default baseline was run. A sample in the beam may well cause this error. If this is not the case see “Sections 15.16
and 15.13”.
15.11 Wavelength Errors
If the instrument is failing its wavelength validation test, first try a re-calibration, this should correct for any wear
or slight shifts that may have occurred with use. If the problem persists, the monochromator and the drive
mechanism may need adjustment. “Section 16.1” covers re-alignment.
If the instrument is in specification when first switched on but gradually accumulates a wavelength error as it is
used then the wavelength drive is too stiff and requires lubrication and possibly adjustment. “Section 16.3” covers
lubricating the drive mechanism.
15.12 Absorbance errors
There are no adjustments that can be made to correct absorbance errors, the root cause of the problem must be
found. Here is a list of things to check:
1. Check that the instrument is in wavelength calibration.
2. Check that the beams are not clipping the cell holders, or any other obstruction.
3. Check that the light baffles are all in place, especially the two situated between the optics cover and the sample
compartment wall.
4. Check the signal integrity and that the flash to sample delay is correct. See “Section 16.6”.
5. Run a stray light test. If it fails check the condition of the optics and clean if necessary.
6. Check the energy throughput. As a guide at 546nm 1.5nm bandwidth the sample signal should be in the range 1
to 3V and the reference should be approximately 10 times smaller. If the values are much below this range,
check the source alignment, covered in “Section 16.1.1”. If the sample signal approaches 8V check the gain
matrix, see “Section 8.6”.
15.13 Noise
There are several causes of noise problems; here is a list of things to check:
1. Light leaks, check that all the light baffles are in place and are in good condition.
2. Low energy throughput, check this and source alignment.
3. Check that the beams are not clipping the cell holders, or any other obstruction.
4. Poor optical alignment, in general.
5. Incorrect setting of the flash to hold delay. See “Section 16.6”.

15.14 Drift
Due to the low heat input from the lamps, the Evolution 300 is very stable. When drift does occur it is usually an
optical problem, specifically a beam clipping somewhere. This is most likely to occur in the sample compartment.
Check that the beam is clear of the cell holders, especially in the reference position. The reference beam patch is a
lot bigger than the sample one. It is a tight fit through the standard cell holder. Also, the patch is not uniform, it is
composed of two overlapping images, it is not easy to see the rather diffuse edges of the patch, but if these clip the
cell holder, drift will result.
15.15 Noise on kinetics data
When data is taken very rapidly, such as when running a fast kinetics analysis, you sometimes see noise that has a
characteristic cyclical appearance. See Figure 15-4, which shows this effect on a kinetics graph. In this example,
the data is relative absorbance, starting at about 1.9A. This effect is always caused by a light leak. The 100/120Hz
component of the room lighting is beating with the sampling frequency. Check that the lid is properly closed during
the run. If this is so, check all the other light seals.
0.000
-0.020
Relative Absorbance
-0.040
-0.060
-0.080
-0.100
-0.120
-0.140
0.0 5.0 10.0 15.0 20.0 25.0 30.0 35.0 40.0
Time (secs)
Figure 15-4 Noise on a rate graph
15.16 Fixing Baseline Flatness Problems

15.16.1 Background Information
If the instrument is failing its baseline flatness test, the most probably cause is that the gain matrix is not optimal.
This can occur if the wavelength accuracy has drifted out of specification, so check this first. Next, check that the
beams are not clipping the cell holders, or any other obstruction. Then check the energy throughput is OK,
“Section 16.7”. If the energy throughput is OK, the rest of this section describes how to adjust the gain matrix
For clarity this section includes the full test specification for this performance parameter and gives some
background information to aid understanding.
The baseline flatness test

This is the baseline flatness test as defined in the factory test specification. Please note these are the only conditions
for which the specification holds.

Specification
Measured at or near 0A using a scan speed of 120nm/min, with a 2nm data interval, 1.5nm bandwidth and low
smoothing: -
± 0.001A over the wavelength range 200nm to 800nm.
± 0.002A over the ranges 190 to 200 and 800 to 900nm
Baseline flatness test

This test must be performed on a warm instrument. Scan between 190 and 900nm, 1.5nm bandwidth, 120nm/min,
with a 2nm data interval, scale ±0.005 A, smoothing set to low.
Perform a baseline and then a scan. The trace should not show any filter change steps greater than those specified
above.
This test is built into the instrument software and this is what should be used as the definitive test. However, the
instrument software does not give you proper access to the raw data so for fault finding other means of testing will
be required.
15.16.2 Collecting the required data
The raw data can easily be collected by using a PC running a terminal program. Connect to the instrument as
describes in “Section 10.1”. The commands given below will produce a lot of data, which you will need to copy
into a spread sheet. For a short scan this can be done using the Windows Clip Board, but the best way is to set up
the terminal program to save the data to a text file.
Here are the commands to run a baseline test
MOD ABS <enter>

SCAN 190.00 900.00 2 120 <enter>
BAS <enter>
RUN <enter>
The BAS command produces a lot of data that need not be collected. These commands are best used for looking at
small sections of the wavelength range. All you need to do is substitute your start and stop wavelengths in place of
the 190 and 900 shown above.
Here are the commands for collecting an energy profile
MOD SAM <enter>

SCAN 190.00 900.00 1 600 <enter>
RUN <enter>
Again just substitute you start and stop wavelengths.

15.16.3 Energy Profiles
The energy profile of the instrument is a function of the spectral output of the lamp, the optical transfer function
and the spectral response and gain of the detector system. Figure 15-5 shows the spectral output of the lamp after
passing through the optical system, but with no filters in the optical path. The output from the xenon lamp contains
many strong lines over a low continuum. In order to achieve acceptable operation over the full wavelength range it
is necessary try and reduce the variation in the output to something nearer a constant level.

12.0
10.0
8.0
Intensity
6.0
4.0
2.0
0.0
100 300 500 700 900 1100
W avelength (nm)
Figure 15-5 unmodified xenon lamp output
The peaks near 250nm are a particular problem; they may be bigger than they look. The first stage of the
preamplifier operates from a 12V supply and needs 2 to 3V head room so above 9V the response can become non
linear. Some compression of the peak may occur before you see any obvious saturation effect. For this reason, it is
desirable to prevent the energy peaks from exceeding 9V. In addition, more gain is needed in the low energy parts
of the spectrum to improve measurement accuracy. These two requirements are in conflict, in the Evolution 300 the
problem was solved in two ways. First, a filter to attenuate UV was added to the filter wheel to reduce the very
large peaks in the UV region to a more manageable level. Secondly the whole wavelength range was divided into a
number of segments each of which can have a different gain setting in the preamplifier and measurement system,
for each of the bandwidths. The result of this is a gain matrix that can be used to optimize the performance of the
instrument over the full wavelength range.
15.16.4 Optimization controls
All of the parameters, which control the energy profile, are programmable. They are the filter change points, the
segment boundaries and the various system gains. This section describes each of these in turn.
To make any adjustment to these parameters the instrument must be connected to a PC running a terminal program.
How to do this is described in “Section 10” of the service manual.
Filter change points

There are six filter positions on the filter wheel, one is always clear, the other have filters installed. Refer to
Figure 6-3 for the Evolution 300 and Figure 6-4 for the Evolution 600.
The filter change points are programmable and can be moved in 0.1nm steps. The command to recall the current
settings is TES CON STR, here is an example:
TES CON STR <enter> will produce the response

To change one of the filter wavelengths, re-enter the command adding the full list of wavelengths including the
new value. Here is an example
To move the 265 point to 265.55nm, enter the following:
TES CON STR 223.00 265.55 372.00 453.00 590.00 <enter>
Caution The filter change points should not be moved by more than 1 or 2nm, or other performance
parameters may be compromised. ▲

15.16.5 Boundary Points
The number and position of the wavelength segments is programmable. There is provision in the software for up to
30 segments, at present 23 are used. To find out where the boundaries are on a particular instrument, use the
command TES CON BOU. This will display the current boundary settings, as a list of segment numbers and the
start wavelength for that segment. Please note there is always a segment zero that starts at 0nm, and a last segment
will be added with the wavelength of 1101nm. These are used by the software, and should not be altered. Part of a
sample printout is shown in Table 15-1.
Here is an example to change the start point of segment 20 to 918.5nm use this command.
TES CON BOU 20 918.5 <enter>

TES CON BOU <enter>
0 0
1 180
3 217
4 223
5 265
6 308
Table 15-1 part of boundary command output
Segment Start λ Segment Start λ Segment Start λ

1 180 9 432 17 819.5
2 201 10 470 18 834
3 217 11 480 19 877.5
4 223 12 497 20 918
5 265 13 523 21 975
6 308 14 545 22 990
7 372 15 590 23 997
8 412 16 614.5
Table 15-2 the default start wavelengths for each segment
15.16.6 Changing the lamp voltage and gains

Four parameter values are stored, in the gain matrix, for each wavelength segment, for each bandwidth. There are
two gain matrices one for the xenon lamp and one for the mercury lamp. The contents of these matrices can be
examined using the command TES CON GS. Here is an example printout for part of a matrix. The "0.00" row of
the matrix is used by the software and should not be altered. This command produces a lot of output; you may find
it helpful to divert the output to a text file for future reference.
Xe Lamp
Wave 0.2 0.5 1.0 1.5 2.0 4.0
0.00 [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0]
180.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 0 0]
201.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
217.00 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 1 1] [ 0 0 0 0] [ 0 0 0 0]
Table 15-3 Part of a the gain matrix for the xenon lamp
In Table 15-3 the column labeled "Wave" contains the start wavelengths for each segment. Each column in square
brackets represents the data for the bandwidth listed at the top of the column. The following sections explain the
meaning of the numbers in the matrix.

Lamp voltage
The high voltage supply to the lamp set by a 12-bit DAC controlled by the instrument software. The voltage can be
varied from 700 to 1000V for DAC values from 0 to 4095. The first number in the matrix entry is the DAC value.
In practice, the range of values that can be entered is restricted; this is partly due to memory constraints, and partly
from a need to protect the lamp. The software will accept any number in the range 0 to 4095, but for storage, the
value is rounded down to one of four values.
The following paragraph applies to software of V1.05 and below

Three of the four values are hard coded and cannot be changed; the fourth can be set using the command TES CON
PRE. The hard coded values are 0, 511 and 2500. The variable value is the parameter MINDAC in the TES CON
PRE command. In the present implementation of the software, MINDAC is the only TES CON PRE parameter
DAC that is actually used. Changing the others will have no effect.
The default value for MINDAC is 124. In summary, the table below shows the effect of a range of values in the
first position in the matrix.
Matrix Value Value Used

0 0
1-124 0
125-511 124 (MINDAC)
512-2500 511
2501-4095 2500
Table 15-4 Range of values in first position in the matrix
The default value for the DAC entry is zero.
The following paragraph applies to software of V1.06 and above

The four values are all programmable using the command TES CON PRE. This command takes 6 parameters, the
number of flashes discarded before each reading, the maximum value that can be set for the lamp voltage and the
four values that can be used in the gain matrix. These values are called DAC0 to DAC3. The value entered in the
gain table will be rounded down to the next lowest of DAC0 to DAC3. If any of these four values exceeds
MAXDAC, it will be set to MAXDAC.
The default values for the DAC0 to DAC3 are:
DAC parameter Default Value

DAC0 0
DAC1 124
DAC2 511
DAC3 2500
MAXDAC 2500
Table 15-5 Default values for DAC0 to DAC3

ADC gain
The second number in the matrix entry is the "ADC" gain. The input stage of the analog system on the main board
is a variable gain amplifier. The gain can be varied as shown below.
Gain no Gain
0 x1
1 x10
2 x100
For the xenon lamp the gain x1 must be used, always set the second entry in the xenon lamp matrix to 0. The
higher gains are used for the mercury lamp.
Preamplifier gains
There are four gains available on the first stage of the preamplifier. They are set by a number from 0 to 3. The
actual gains vary from amplifier to amplifier; typical values are shown below.
Gain no Gain
0 x1
1 x 1.21
2 x 4.75
3 x 26.96
The last two numbers in the matrix entry are the preamplifier gains sample, then reference. These two gains
should always be set to the same value.
Example command to set an entry in the gain matrix:

For this example, let us say that we want to increase the preamplifier gain, from 1 to 2, over the wavelength range
265 to 308nm for the 1.5nm bandwidth. From Table 15-2, we can see that this wavelength range falls into
segment 5. The command we need is this:

Where: XE is the lamp type
1.5 represents the bandwidth
5 is the segment number
0 is DAC setting - normally zero but check existing settings before using this command
0 is ADC gain setting - this should always be zero
2 is new sample gain
2 is new reference gain - must always be the same as the sample gain.
15.16.7 A case study
In order to explain the process used to investigate and fix a baseline problem an actual example will be used.
The problem
Here is a poor baseline that shows a very large spike near 200nm.

0.012
0.010
0.008
Abs 0.006
0.004
0.002
0.000
-0.002
0 200 400 600 800 1000
Wave le ngth (nm)
Figure 15-6 the problem baseline.
15.16.8 Diagnosis
The first step towards diagnosing what is wrong with this instrument is to measure its energy profile, for the
bandwidth in question. The scan shown in Figure 15-7 was taken at 600nm/min with a 1nm data interval. It clearly
shows that close to 300nm the sample voltage is going well into the non linear region of the preamplifier, which
will explain the big spike seen in the baseline in that wavelength range.
12.0
10.0
Sample voltage
8.0
Orig
6.0 1.0nm
0.5nm
4.0
2.0
0.0
0 200 400 600 800 1000
Wavelength (nm)
Figure 15-7 Energy profile associated with the problem baseline
From Table 15-2 we can see that this peak lies in wavelength segment 6, 308 to 372nm. Usually this is enough
information to proceed but to clarify this example; a more detailed energy profile was taken for this segment. The
results are shown in Figure 15-8, the peak at 310nm is well over 10V and the rather rounded top suggests some
compression has taken place.

12.0
10.0
Sample voltage
8.0
6.0 Before
4.0
2.0
0.0
308 318 328 338 348 358 368
Wavelength (nm)
Figure 15-8 A detail of the energy profile showing the problem peak
Diagnosis - step 2
Next, read the gain table to find out how the instrument is set up. Use the command TES CON GS.
Xe Lamp
Wave 0 0.2 0.5 1 1.5 2 4
0 [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0]
180 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [2500 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
201 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
217 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0] [ 0 0 0 0]
223 [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 1 1] [ 0 0 0 0] [ 0 0 0 0]
265 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 0 0] [ 0 0 0 0]
308 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 0 0]
372 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 0 0]
412 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 0 0]
432 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 0 0]
470 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 0 0]
480 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
497 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 0 0]
523 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1] [ 0 0 0 0]
545 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 0 0]
590 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1]
614.5 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2]
819.5 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1]
834 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 1 1]
877.5 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 0 0]
918.5 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 0 0]
975 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 2 2] [ 0 0 1 1]
990 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2] [ 0 0 1 1]
997 [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 3 3] [ 0 0 2 2]
1101 [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0] [ 0 0 0 0]
Table 15-6 Gain matrix

From the printout shown in Table 15-6, we can see that the preamplifier gains are set to 3 for segment 6. This is too
high and needs to be reduced to gain 2.
15.16.9 Fixing the problem
The change the preamplifier gains from 3 to 2 in segment 6 use the TES CON GS command again. Here it is in
full.
TES CON GS XE 1.5 6 0 0 3 3
Once this is done, re run the energy profile to make sure the large peak has been reduced. A detailed profile,
Figure 15-9, shows that the 310 peak is now below 4V. Note the shape of the peak top now that it is not being
compressed. Figure 15-10 tells us that there are now no peaks above 8V so the problem should be fixed.
4.5
4.0
3.5
Sample voltage
3.0
2.5
After
2.0
1.5
1.0
0.5
0.0
308 318 328 338 348 358 368
Wavelength (nm)
Figure 15-9 Energy profile detail after gain adjustment
9.0
8.0
7.0
Sample voltage
6.0
5.0
4.0
3.0
2.0
1.0
0.0
0 200 400 600 800 1000
Wavelength (nm)
Figure 15-10 Full energy profile after adjustment

15.16.10 Confirming the fix
Once the adjustments have been made and you are satisfied with the energy scans run the baseline test to confirm
the problem is cured. You can use the instrument software to do this.
0.0010
0.0008
0.0006
0.0004
0.0002
Abs
0.0000
-0.0002
-0.0004
-0.0006
-0.0008
-0.0010
100 200 300 400 500 600 700 800 900
Wave le ngth (nm)
Figure 15-11 A baseline test after adjustment

16.0How To Guide
16.1 How to align the optics
Be sure to follow the “General Safety Precautions” section of this manual before servicing the optics.
Warning The tungsten and deuterium sources run extremely hot (tungsten ~250-300°C, deuterium
~150-190°C). Allow the instrument to cool for 15 minutes before servicing the lamps. ▲
Warning The xenon, tungsten and deuterium sources output a lot of harmful UV. CARE MUST BE
TAKEN TO AVOID DIRECT EXPOSURE OF THE SKIN. EYE PROTECTION MUST
BE WORN. ▲
The optical alignment cannot be performed without the aid of a PC running a terminal program.
Remove the optics cover to access the optics.

16.1.1 Aligning the Evolution 300
1. Ensure the flipping mirror is clear of the beam.
2.Connect a PC running a terminal program to the instrument, switch on the instrument and take control.
3.Issue the command INI FAK <enter>. This will make the instrument operate as though it had initialized.
4.Issue the command BAN 4 <enter>.
5.Issue the command FIX 400 <enter>.
6.Put a white card or piece of paper over the right-hand side of the collimator mirror.
7.PUT ON SAFETY GOGGLES. Issue the command RUN <enter>.
8.Now adjust the lamp position and if necessary M1 to get a uniform patch on the card. The patch on the
collimator should be uniform over all its area. The lamp should be adjusted to maximize the brightness of
the patch while maintaining the uniformity. Details on this are given in the next two sections.
Note The lamp assemblies are pre-aligned so it should not be necessary to touch the adjustment screws on
the back of the lamp assembly. ▲
9. Check that the light is flooding the source mirror M1.
Adjust M1 to centralize the patch onto the entrance slit.

Note When adjusting any of the mirrors, and you need to loosen an adjustment screw, make sure that the
bracket is firmly in contact with the screw when the adjustment is complete. If necessary, move the
screw away from the bracket and force it back to the screw, then remake the adjustment. ▲
10. To focus the lamp loosen, the focus lock screw and slide the assembly to get the best focus. The focus
lock screw, see Figure 16-1, should be loosened until the assembly can just be moved. There is some
clearance in the adjustment slot so there will be some side to side movement as the focus adjustment is
made; it will be necessary to correct this before the locking screw is tightened. The aim of this adjustment
is to get the most uniform, brightest patch on the card.
Note Some flicker is normal, especially with a new lamp. If this adjustment is not carried out correctly, it
may not be possible to get the instrument to meet its noise specification. ▲
If the lamp stops flashing before you have finished, send the RUN command again.

Figure 16-1 Lamp adjustment points
(first generation lamp assembly)
11. Remove the power from the wavelength drive motor by disconnecting the motor leads from the interface
board, see Figure 16-2.
12. Rotate the wavelength drive by hand until the grating is square: (the reflections of the Mirror Bracket are
central in the Grating when viewed from over the center of the collimator, M2). Once the grating is in
this position, the small adjustments required later can best be made by means of a 1.5mm Allen key in
one of the coupling grub screws. This makes it easy to move the grating without getting your fingers in
the beam. Figure 16-2 shows this.
13. Check the patch now uniformly floods the right-hand side of M2.
14. Adjust M2 to bring the patch onto the Exit Slit. There are two adjustment screws one for tilt and one for
angle see Figure 16-3. Adjust the angle first to bring the beam back to the exit slit, and then adjust the tilt
to vertically centralize it on the slit. The patch should now be central on the M3 Mirror.
15. The next operation is to get an approximate focus for the collimator. Loosen the focus lock screw; see
Figure 16-4, until the grating assembly can just be moved using a screwdriver as a lever. Keep it as tight
as practical, this reduces height errors and helps to keep the patch on the exit slit.
Issue the command BAN 2 <enter> and start the lamp again.
Place a white card or piece of paper over the M3 mirror; you should be able to clearly see the patch. If
you cannot, the collimator assembly may have moved laterally as the locking screw was loosened, it
should be possible to move it back to the position where the patch is on the exit slit.
Scan the patch across the slit by adjusting the wavelength drive manually. This is best done using a small
Allen key as shown in Figure 16-2.
Important Rotate the drive to the left, if the patch moves the same way the collimator is too far back. If the
patch moves in the opposite direction, the collimator is too far forward. ▲
Move the collimator assemble in the direction indicated by the test, only make very small adjustments.
Test the new position by rotating the drive a small amount and noting which way the patch moves.
Repeat these operations until the patch moves very little as the drive is rotated. It should just get darker.
You now have an approximate focus. Tighten down the focus lock screw; take care not to move the
assembly while doing this.

Figure 16-2 adjusting the grating position
16. The next step is get make fine adjustments to the focus using the angle and tilt adjustment screws. Again,
you start at 2nm bandwidth.
17. Scan the patch across the exit slit by rotating the wavelength drive manually. If the patch at the M3
position appears to move upwards or downwards, return the grating to its original position (patch on slit),
and adjust the tilt, top adjustment screw, see Figure 16-3, of the collimator mirror to correct. Only make
very small adjustments. Repeat the above until the patch does not appear to move upwards or
downwards.
18. Check to see if the patch at the M3 position appears to move from side to side when it is scanned across
the slits. If it does return the grating to its original position (patch on slit), and adjust the angle, lower left
screw, see Figure 16-3, of the M2 mirror assembly. Only make very small adjustments.
Repeat the above until the patch does not appear to move sideways, or up and down.

Figure 16-3 Collimator adjustment screws
Figure 16-4 Collimator locking screw
19. Go to the next narrower slit and repeat the previous section.
Repeat this down to the 0.5nm slit. You will need to do this in the dark or at least in subdued lighting.
20. When the monochromator is correctly set up, as you scan the patch across the slits the patch seems to
disappear from the center. There should be no movement up or down; the patch should just get darker
from the center to the edges as the beam moves off the slit. You need to move the drive very slowly to
see this effect.
21. If the focus condition described above cannot be achieved the coarse focus adjustment you made may not
have been correct. Go back and repeat the process from that point. Only make very small adjustments.
22. Reconnect the wavelength drive motor.
23. Next, set up the post monochromator optics. Drive the slit to the 4nm position (BAN 4 <enter>).
24. Adjust M3 to bring the patch centrally onto M4. Tighten down M3 and re-check.

27. Adjust the Beam splitter to bring the patch centrally onto M8. Tighten down Beam splitter and re-check.
30. Adjust M7 to bring the patch centrally on to the Sample PD. Tighten down M7 and re-check.
31. Adjust M9 to bring the patch centrally on to the Reference PD. Tighten down M9 and re-check.
32. Fit single cell holders in the sample and reference positions. Check the alignment through the sample
compartment using the Cell Alignment Jig in both the sample and reference positions. If necessary,
readjust the mirrors M6 to M9 to ensure that the beam is centered on the hole in the alignment jig. A
dentist's mirror is useful here.
16.1.2 Aligning the Evolution 600
1. Connect a PC running a terminal program to the instrument, switch on the instrument and take control.
2. Issue the command INI FAK <enter>. This will make the instrument operate as though it had initialized.
3. Issue the command BAN 4 <enter>.
4. PUT ON SAFETY GOGGLES. Issue the command LSW TUN ON <enter>. This turns the tungsten lamp
on. The command LAM TUN then WDR 0 moves the selector mirror.
5. Issue the command MOT LAM -950 <enter>. This puts the LM1 in the home position.
6. Place a white card or piece of paper over M1.
7. Issue the command MOT LAM 1000 <enter>. While this command is executed, watch the piece of card
over M1. If a bright patch of light passes over it, LM1 has gone too far; if not LM1 has not gone far
enough.
8. If LM1 has gone too far, enter the command MOT LAM –XX <enter> (where XX is the number of steps
LM1 moves towards the home position). If it has not gone far enough, enter MOT LAM XX (where XX
is the number of steps LM1 moves away from the home position). The patch should be centered on LM2.
Note Using increments of 10 is a good starting point. ▲
9. Remove the piece of card from M1 and adjust M1 to get the image centered on the entrance slit.
10. Put the white card or piece of paper over the right-hand side of the collimator mirror.
11. Now adjust LM1 and M1 to get a bright uniform patch on the card. The patch on the collimator should be
uniform over all its area. LM1 should be adjusted to maximize the brightness of the patch while
maintaining the uniformity. Details on this are given in the next two sections.
Note The lamps are pre-aligned so it should not be necessary to touch the lamp assemblies. ▲
Note When adjusting any of the mirrors, and you need to loosen an adjustment screw, make sure that the
bracket is firmly in contact with the screw when the adjustment is complete. If necessary move the
screw away from the bracket and force it back to the screw, and then remake the adjustment. ▲
12. Remove the power from the wavelength drive motor by disconnecting the motor leads from the interface
board, see Figure 16-2.
13. Rotate the wavelength drive by hand until the grating is square. (The reflections of the Mirror Bracket are
central in the Grating when viewed from over the center of the collimator, M2.)
Once the grating is in this position, the small adjustments required later can best be made by means of a
1.5mm Allen key in one of the coupling grub screws. This makes it easy to move the grating without
getting your fingers in the beam as seen in Figure 16-2.
14. Check the patch now uniformly floods the right-hand side of M2.
15. Adjust M2 to bring the patch onto the Exit Slit. There are two adjustment screws: one for tilt and one for
angle (see Figure 16-3). Adjust the angle first to bring the beam back to the exit slit, and then adjust the
tilt to vertically centralize it on the slit. The patch should now be central on the M3 mirror.

16. The next operation is to get an approximate focus for the collimator. Loosen the focus lock screw (see
Figure 16-4) until the grating assembly can just be moved using a screwdriver as a lever. Keep it as tight
as practical, this reduces height errors and helps to keep the patch on the exit slit.
Issue the command BAN 2 <enter> and start the lamp again.
Place a white card or piece of paper over the M3 mirror; you should be able to clearly see the patch. If
you cannot, the collimator assembly may have moved laterally as the locking screw was loosened, it
should be possible to move it back to the position where the patch is on the exit slit.
Scan the patch across the slit by adjusting the wavelength drive manually. This is best done using a small
Allen key as shown in Figure 16-2. Rotate the drive to the left, if the patch moves the same way the
collimator is too far back. If the patch moves in the opposite direction, the collimator is too far forward.
Move the collimator assembly in the direction indicated by the test, only make very small adjustments.
Test the new position by rotating the drive a small amount and noting which way the patch moves.
Repeat these operations until the patch moves very little as the drive is rotated. It should just get darker.
You now have an approximate focus. Tighten down the focus lock screw; take care not to move the
assembly while doing this.
17. The next step is get make fine adjustments to the focus using the angle and tilt adjustment screws. Again,
you start at 2nm bandwidth.
Scan the patch across the exit slit by rotating the wavelength drive manually. If the patch at the M3
position appears to move upwards or downwards, return the grating to its original position (patch on slit),
and adjust the tilt, top adjustment screw (see Figure 16-3) of the collimator mirror to correct. Only make
very small adjustments.
Repeat the above until the patch does not appear to move upwards or downwards.
Check to see if the patch at the M3 position appears to move from side to side when it is scanned across
the slits. If it does return the grating to its original position (patch on slit), and adjust the angle, lower left
screw (see Figure 16-3) of the M2 mirror assembly. Only make very small adjustments.
Repeat the above until the patch does not appear to move sideways, or up and down.
18. Go to the next narrower slit and repeat the previous section. Repeat this down to the 0.5nm slit. You will
need to do this in the dark or at least in subdued lighting.
19. When the monochromator is correctly set up, as you scan the patch across the slits the patch seems to
disappear from the center. There should be no movement up or down; the patch should just get darker
from the center to the edges as the beam moves off the slit. You need to move the drive very slowly to
see this effect.
20. If the focus condition described above cannot be achieved, the coarse focus adjustment you made may
not have been correct. Go back and repeat the process from that point. Only make very small
adjustments.
21. Reconnect the wavelength drive motor.
22. Next, set up the post monochromator optics. Drive the slit to the 4nm position (BAN 4 <enter>).
25. Issue the command TES CHO INI <enter>. This initializes the chopper.
26. Issue the command TES CHO SAM <enter>. This sets the chopper to the sample position.
27. Adjust M5 to bring the patch centrally onto M6. Tighten down M5 and re-check. Ensure the beam is not
being clipped by the chopper blades.
28. Issue the command TES CHO REF <enter>. This sets the chopper to the reference position.

29. Adjust the Beam splitter to bring the patch centrally onto M8. Tighten down Beam splitter and re-check.
Again, ensure the beam is not being clipped by the chopper blades.
30. Remove the sample compartment, detector compartment cover and foam light shields. Immediately cover
the active window of the PMT with black tape so it is not damaged by over-exposure to ambient light.
31. Remove the preamp and put it in an anti-static bag. Remove the PMT and fit the PMT alignment fixture.
32. Issue the command TES CHO SAM <enter>.
34. Issue the command TES CHO REF <enter>.
36. Adjust M7 to bring the patch centrally on to the PMT alignment fixture. Tighten down M7 and re-check.
37. Adjust M9 to bring the patch centrally on to the PMT alignment fixture. Tighten down M9 and re-check.
38. Install single cell holders in the sample and reference positions. Check the alignment through the sample
compartment using the Cell Alignment tool in both the sample and reference positions. If necessary,
readjust mirrors M6 to M9 to ensure that the beam is centered on the hole in the alignment tool. A
dentist's mirror is useful here.
39. Issue the command LSW TUN OFF <enter>. This turns the tungsten lamp off.
40. Issue the command LSW DEU ON <enter>. This turns the deuterium lamp on.
41. Repeat steps 4 through 38. You will need to do this in the dark or at least in subdued lighting.
42. Issue the command LSW DEU OFF <enter>. This turns the deuterium lamp off.
43. Once the instrument is aligned enter the command “TES CHO PEAK” to optimize the chopper timing.
16.1.3 Installing and adjusting the filter wheel
Note Note the cable orientation before disassembling the filter wheel. The filter wheel cables are not keyed
and could easily be put in backwards. See below. ▲
Figure 16-5 Filter wheel cable orientation

The Filter Wheel assembly is located on two pins and held in place by two fixing screws. Its position is adjusted by
loosening the fixing screws and sliding the assembly until the beam is central in the filter wheel Aperture. Tighten
the fixing screws and re-check.
The figure below shows how the cables connect to the interface PCB. This PCB is also used for the slit assembly
and for the optional Calibration Test Unit.
Figure 16-6 Interface PCB connections
Red Blue
Grey
Motor
Cableform
Violet
Black
Sensor
Red
Figure 16-7 Wavelength Drive PCB connections

16.2 How to Install a CTU (Evolution 300 only)
The calibration test unit is a filter wheel assembly installed with different filters. It is installed in the post
monochromator optics close to the actual filter wheel. Here is a list of what to do to install a CTU.
1. Remove the right-hand top cover and the optics cover.
2. Remove the screw holding down the P clip the restrains the CTU cable. The screw is marked in Figure 16-8; it
is in one of the fixing holes for the CTU. Also marked in the figure is one of the locating pins for the CTU.
3. Locate the CTU on the two pins in the casting, and fit the two fixing screws. Figure 16-9 shows the location
and orientation of the unit.
4. Plug the CTU cable, marked "Self Test" into the top socket on the CTU interconnection board. The gray wire
goes at the top. If in doubt, copy the filter wheel.
5. Replace all light baffles and covers.
Figure 16-8 CTU mounting position
Figure 16-9 CTU in place

16.2.1 Installing the CTU data
The Evolution 300 CTU (Calibration Test Unit) is supplied as a low cost, performance qualification accessory and
as such is not traceable. If a customer should require traceability, the CTU can be calibrated with a CVC. The Test
and Setup software will produce a calibration certificate tracing the calibration of the CTU to the calibration of the
CVC, which is traceable. Note that this option is less satisfactory than using a CVC directly because the extra stage
results in increased tolerances. Calibration of a customer’s CTU is a chargeable service.
Install the CVC in the customer’s instrument and ensure that it has been initialized. Start the Test and Setup
software.
Click on Calibrate CTU.
The CTU Calibration Page will be displayed.
Click on Calibrate to commence calibration.
The communication window will indicate progress.
16.3 How to lubricate the monochromator drive
The monochromator drives in Evolution 300 and Evolution 600 are well-shrouded and located inside the sealed
optics cover. Lubrication should only be undertaken if there is evidence of stiffness in the drive, such as cumulative
wavelength errors that clear for a while after re-initialization.
First, remove the right-hand top cover and the optics cover. Wind the drive as far as it will go away from zero
order. This will extend the flexible coupling. Undo the two grub screws located in the collar where the coupling
joins the micrometer. See Figure 16-10.
Figure 16-10 Monochromator coupling
Slide the coupling away from the micrometer, it should come clear of the fixing shaft. Next, loosen the set screw
holding the micrometer in place. This screw is marked by an arrow in Figure 16-11. It should now be possible to
ease the micrometer out of its mount.

Figure 16-11 Micrometer locking screw
Loosen the 7mm nut at the end of the fixing shaft a few turns. The nut is indicated with an arrow in Figure 16-12.
Tap the shaft on the bench to release the knurled cover from the micrometer thread. Remove the fixing shaft and
the cover. The lead screw is then exposed, see Figure 16-12. Gripping the tapered end of the screw, wind the lead
screw fully out. If there are signs of wear debris clean the thread, otherwise put one or two drops of clock oil on to
the thread, do not over oil it. Wind the lead screw back into its collar; wind it fully in to spread the oil over the
threads. Ensure that there is a thin film of oil over the anvil of the lead screw. Do not adjust the brass ring marked
with an arrow in Figure 16-12. Refit the knurled cover and the fixing shaft. Tighten the 7mm nut. Slide the
assembly back into its mount and retighten the locking screw. Do not over tighten this screw you may jam the
monochromator! Slide the collar of the flexible coupling back onto the fixing shaft and tighten the grub screws.
Ensure the assembly moves smoothly. It is recommended that the wavelength accuracy be checked after this
procedure has been carried out.
Figure 16-12 Micrometer details

16.4 How to dismantle a local control pod
This section describes how to dismantle a local control pod for servicing or for the installation of an internal
printer.
1. Remove the right-hand top cover. Turn it over and remove the 6 screws that hold the pod in place, see
Figure 16-13. Remove the pod, feeding the DVI cable through the top cover molding.
Figure 16-13 Local control pod fixings
2. Disconnect all the cableforms to the local control interface PCB. Remove the four screws that hold the board in
place and lift it clear. See Figure 16-14.
Figure 16-14 Interface board fixing screws

3. If you have not already done so, undo the jack screws and remove the DVI cable. Next, undo the two jack
sockets, shown in the insert of Figure 16-15, then undo the two screws that hold the bracket in place, lift
the bracket clear. Press the plastic clips to release the display section of the assembly. The clips are marked
"Press" in Figure 16-15. Carefully feed the cableforms through the keyboard molding.
Figure 16-15 Display pod fixings

4. Three screws hold the two parts of the display pod molding together. Remove these and separate the two
halves.

16.5 How to install an internal printer
This section describes how to install a printer into a local control pod. Two components need installing, the printer
mechanism and the interface board.
1. Dismantle the local control pod as described in the previous section.

2. Remove the display module, it is held in place by four screws. Remove the screws, lift the display clear, and
disconnect it from the backlight inverter. Take care these parts are static sensitive.
3. Remove the hinged printer cover from the back molding. This is done by using a small flat bladed screwdriver to
depress the hinge lugs.
4. Lay the printer mechanism into the printer cover and fix in place with 3 screws as indicated in Figure 16-16.
Figure 16-16 Printer mechanism fixings

5. Carefully feed the printer cables through the rear of the display housing and clip the hinged lid back into place.
6. Plug the printer cables into the appropriate sockets on the printer interface board. They are either size or color
coded. There are two free cableforms that should be fitted to the printer interface board now. These are the printer
power cableform, a 6-way MTA156 assembly and a ribbon cable assembly.
7. The printer interface board fits component side down (see Figure 16-17). Make sure that the backlight power cable,
the printer power cable and the printer ribbon cable are passed through the molding before the board is tightened
down. The ring tag from the printer chassis ground must be fixed under one of the PCB fixing screws. See arrow in
Figure 16-17.
8. Now fit the display, connect the backlight to the inverter PCB and position the display on the pillars. Tighten the
four screws.
9. Put the two halves of the display pod together. Ensure that the display and small keyboard cable are not trapped.
Tighten the 3 fixing screws.
10. Feed the cableforms through the holes in the keyboard molding. The printer cableforms go through the big hole in
the middle. The display and small keyboard flex strips go through the hole opposite the holes for the fixing lugs.
11. Clip the display pod onto the keyboard mounding.
12. The next operation is to refit the interface PCB. Lay the backlight power cable under where the board fits. Make
sure that the keyboard and display cables are not trapped under the board as you lay it into position. Put in the four
fixing screws, and then fit the connectors. See Figure 16-18; at this stage do not fit the DVI cable.

13. The EMC bracket should now be installed. First, the bracket is fixed to the DVI connector on the PCB by means of
the jack sockets. Then the bracket is attached to the molding with two screws. See Figure 16-15.
14. Re connect the DVI cable, making sure that the jack screws are fully tightened.
15. Feed the DVI cable through the right-hand cover molding and screw the pod into place with the six fixing screws.
Figure 16-17 Printer interface board mounting
Figure 16-18 Pod interface PCB in position

16.6 How to check the flash to hold delay (Evolution 300 only)
16.6.1 Method 1— using an oscilloscope
If you have an oscilloscope, this is the recommended method. Remove the main base plate. Connect scope to
TP202 on the main board, there is a nearby analog ground point, TP207, which you should use. If the scope probe
is not properly grounded you will not be able to see the signals clearly there is a lot of noise in this area. Once the
scope probe is in place, drive to 546nm, 2nm bandwidth and set up a long integration time fixed reading. On the
scope set a time base of 20µs/division and Y sensitivity of 500mV/division. Start the instrument running; you
should get something like the trace shown in Figure 16-19. The measured value is the level after the hold signal has
been activated. In this example, the top line was captured with the correct value (PDL=40). The other two traces
show the delay being set to 10 either side of the correct value. When the delay is too short the waveform is OK but
the signal does not reach its true height. When the delay is too long the peak value is passed and the signal has
begun to drop before the data is held. To make the adjustment, find the point at which this happens and then reduce
the delay by 5. Remember that the delay units are 2µs. Also, that there is a delay of about 17µs from the flash
signal to the output starting to rise. You will also notice that there is considerable flash-to-flash variation in the
signal amplitude. This is normal; the system is designed to cope with it.
1.2000
1.0000
0.8000
Sample signal (V)
PDL 50
0.6000 PDL 30
0.4000
0.2000
0.0000
-0.2000
-10 0 10 20 30 40 50 60 70 80 90 100
Time (µs)
Figure 16-19 Effect of changing PDL on the measured signal
16.6.2 Method 2 — manually

Connect the instrument to a PC running a terminal program. Switch it on and allow it to initialize. Drive to 546nm,
2nm bandwidth. Set the delay to 30 and take a reading. Here are the commands:
WDR 546 <enter>
BAN 2 <enter>
TES CON PDL 30 <enter>
ADC SR 100 <enter>
You will get four numbers in response. The second is in brackets; this is the sample channel signal in volts. Note
this value. Increase the delay by 5 and take another reading. Repeat this process until to see the output start to dip.
Set the PDL to 5 less that the number that causes the output to start to dip. You can use increments of less than 5 if
you feel the particular instrument needs fine-tuning.
16.7 How to check energy throughput
The energy throughput is a good guide to the general performance of the instrument. Checking it is simple; just
scan the full wavelength range, in sample intensity mode, at 2nm bandwidth, with a 2nm data interval. You can do
this from local control. The data you get should look something like Figure 16-20. If you feel the source alignment
needs to be checked, see “Section 16.8.3”, which details how to set up the lamp.

4.0
3.5
3.0
Sample signal (V) 2.5
2.0
1.5
1.0
0.5
0.0
150 350 550 750 950 1150
Wavelength (nm)
Figure 16-20 A typical 2nm energy profile
16.8 How to replace the xenon lamp

Be sure to follow the General Safety Precautions section of this manual before servicing the optics.
Warning UV RADIATION. EYE PROTECTION MUST BE WORN. ▲
Warning The xenon lamp contains high-pressure gas. If the envelope is subjected to shock or gets
scratched, the lamp may explode. It is recommended that gloves, long sleeves and eye
protection be worn when handling the lamp to protect against flying glass. ▲
Caution Do not touch the front surface of the lamp with your fingers, use a cloth or gloves. Touching the
glass will cause it to discolor and reduce the lamp output when the lamp warms up. ▲
Due to the very high voltages and peak currents involved, the components in the trigger circuit and the output
capacitor on the xenon PSU deteriorate with use. We therefore strongly recommend that if a new lamp is required,
the whole subsystem (i.e., lamp, trigger circuit and power supply) be replaced. More information on this subsystem
is given in “Section 4.0”.
16.8.1 Removing the xenon lamp subassembly
1. Remove the bottom covers and main PCB.
2. Unscrew the xenon PSU screening box.
3. Disconnect the lamp from the supply, and remove the supply.
4. Remove the main top cover.
5. Remove the optics cover.
6. Unscrew the lamp bracket and remove the lamp assembly. This step can be difficult due to the limited
clearance between the lamp and the slit assembly.

16.8.2 Replacing the xenon lamp subassembly
1. Drop the connector from the new lamp assembly through the casting.
2. Fit the new lamp assembly and screw the bracket down but do not tighten fully.
3. Fit the new power supply in to screening box. Ensure that any insulation beneath the board is correctly
installed.
4. Connect the lamp to the PSU and connect the control cable to the other end of the PSU. Ensure that the ferrite
toroid is within the can and that the grommet is fitted where the cable exits the box.
5. Screw the PSU assembly in place.
6. Replace the main PCB.
7. Replace the lower covers.
16.8.3 Aligning the xenon lamp
The lamp cannot be aligned without the aid of a PC running a terminal program.
1. Connect a PC running a terminal program to the instrument, switch on the instrument and gain control.
2. Issue the command INI FAK <enter>. This will make the instrument operate as though it had initialized.
3. Issue the command BAN 4 <enter>.
4. Issue the command FIX 400 <enter>.
5. Put a white card over the right-hand side of the collimator mirror.
6. PUT ON SAFETY GOGGLES. Issue the command RUN <enter>.
7. Next, adjust the position of the lamp to give a uniform rectangular patch on the white card. The lamp
assemblies are pre-aligned so it should only be necessary to make a focusing adjustment.
Slide the bracket backwards and forwards to get the most uniform patch on the card. Please note some flicker is
normal, especially with a new lamp. There is some clearance in the adjustment slot so there will be some side to
side movement as the focus adjustment is made; it will be necessary to correct this before the fixing screw is
tightened.
If the patch cannot be got to the correct position in this way, there are two possible further adjustments (see
steps 8 or 9 below).
If the lamp stops flashing, send the RUN command again.

8. If the patch is the wrong height or off to one side, loosen the nylon nuts holding the lamp assembly to the
bracket and move the lamp to get the patch in the correct position. Retighten the nylon nuts. Take care not to
over tighten these fixings as they will then creep or sheer.
9. Adjust the M1 mirror to bring the patch centrally on the entrance slit. Please note, if you adjust this mirror you
will also have to adjust the flipping mirror. To do this you will need a mercury lamp accessory.
10. Once you are satisfied with the adjustments switch the instrument off and refit all the covers.
11. Switch the instrument on and allow it to initialize.
12. Run a sample intensity scan over the full wavelength range for each bandwidth. Ensure that the signal does not
saturate anywhere. The new lamp will have a higher output that the old one and gain adjustments may be
necessary. Instructions for doing this are given in “Section 8.6”.

16.8.4 How to replace the tungsten lamp (Evolution 600)
There is no difficulty diagnosing a failed lamp, but if the lamp is just out of alignment or giving a low output, it can
be more difficult. In these cases the symptoms are those of low energy, noise, drift, poor baseline, unstable zero.
These symptoms will not be present when using the deuterium lamp, unless that is faulty as well.
It has been known for customers to supply their own tungsten lamp, this can cause problems as, due to EEC
regulations, the majority of lamps supplied in the world are now doped to eliminate UV radiation, and therefore
will not allow any light through below 400nm. This will cause very noisy response between 340-400nm. A faulty
tungsten lamp can sometimes be detected by inspection. Symptoms are whiskers growing on the filament,
discoloration of the envelope. If the envelope and filament look OK check the pins, clean any corrosion off and
retry the lamp.
1. Switch off the instrument and let it cool down for 15 minutes.
2. Unplug the tungsten lamp from its socket and replace with the new lamp, taking care not to touch the quartz
envelope (use gloves while handling the lamp). The copper lamp clamp will need to be removed and reinstalled
during this process.
3. Check the optical alignment.
16.8.5 How to replace the deuterium lamp
1. Switch off the instrument and let it cool down for 15 minutes.
2. Unplug the inline connector on the deuterium cable.
3. Unscrew the three fastening screws enough so you can rotate the lamp. These may need to be completely
removed.
4. Remove the deuterium lamp and replace with the new one.
Hold the lamp by the base only. Do not touch the quartz envelope.
5. Turn the lamp counterclockwise until it is stopped against the fastening screws.
6. Tighten down the three fastening screws and plug in the inline connector.
7. Check the optical alignment (see “Section 16.1”).
16.9 How to use the Maintenance Log

Evolution 300 and Evolution 600 software contains a built-in maintenance log. This enables the service engineer to
record the type of work carried out on an instrument and link it to the job reference. When the log is active, it will
automatically record events that may affect instrument performance. The following actions are recorded:
1. A CVC test
2. A software update
3. Lamp energies or hours reset
4. A default baseline is run
5. A wavelength calibration
6. Sipper calibration
The maintenance log is accessed via a TES command. The full syntax of which is given in “Section 11.2”.
16.9.1 Viewing the maintenance log
To read the existing log, enter the command:
TES HIS GET <enter>
The contents of the log will be sent to the terminal. This command works even if the log is switched off.
Alternatively, the log can be sent to the current printer. Make sure the printer is selected and on line before sending
this command. The command to print the log is:
TES HIS PRINT <enter>

16.9.2 Adding new items to the maintenance log
You can add items to the log, to document any work carried out. The file will accept five classes of work. As
shown below.
TES HIS ROUTINE_M routine preventative maintenance
TES HIS OPTIC_REP repairs to the optics
TES HIS ELECT_REP electrical repairs
TES HIS CHECK_PERF performance check
TES HIS MAJOR_M major corrective maintenance
To enter one of these job types you must also add the engineer’s name and the job reference. The engineer’s name
can be up to 11 characters but must not contain any spaces. The job reference can be up to 7 digits.
Here is an example, suppose you carry out a routine maintenance visit and then check the performance. When the
work is finished, you update the maintenance log by making these two entries.
TES HIS ROUTINE_M IAN_T 506617 <enter>

TES HIS CHECK_PERF IAN_T 506617 <enter>
Where IAN_T is the engineer’s name and 506617 is the job number.
The log now reads like this:
TES HIS GET <enter>

08-09-03,09:36:26,IAN_T,
ROUTINE PREVENTATIVE MAINTENANCE,
REFERENCE NUMBER: 506617
08-09-03,11:28:08,IAN_T,
CHECK PERFORMANCE,
REFERENCE NUMBER: 506617
-
16.9.3 Saving the maintenance log
The maintenance log can be saved to disk for archival purposes. This is recommended, in this way the instrument
history can be preserved even if the log is cleared from the instrument’s memory. This feature must be used
carefully, there is no error checking on the disk access routines and any disk error will result in the instrument
locking up. A disk error will result if there is already a file, called HISTORY.LOG, on the disk. Ideally, you should
put a blank formatted disk in the drive before using this command.
The command is:

TES HIS SAVE <enter>
16.9.4 Activating the log
The maintenance log can be switched on and off by the user interface. From the Home page, you press the Options
key. Check the status of the History item. If the History is switched Off, do not switch it on from the user
interface, as this will clear any data that may already have been stored. To activate the log again use the remote
command:
TES HIS START <enter>

16.10 How to use Reset instrument defaults
16.10.1 Why is this necessary?
In normal use there will be no need ever to reset defaults. However, there are some circumstances where it may be
necessary. These are:
¾ If the processor board has to be changed
¾ If the NVM becomes corrupted for any reason
¾ If the correct settings have been lost due to unwise use of set up commands

¾ If some future software update reallocates the storage locations of the configurable parameters
16.10.2 First step - collect current settings
Returning to the instrument default settings will lose all the current settings; this will include the serial number and
wavelength calibration data. It is possible to read out this data so that it can easily be reentered after the defaults
have been reset. How much data you need to collect depends on the reason for returning to the defaults. If the
instrument is working correctly, collect the full data set. If it does not work at all, collect only the serial number
and wavelength calibration data.
First, connect the instrument to a PC running a terminal program set to save data to a text file. Next, execute the
following series of commands.
VER <enter> this returns the model and serial number

MPL <enter> this returns the wavelength calibration data.
These two are the essential commands; the following ones will record some of the other performance related
parameters, which may have been set to non default values.
TES CON STR <enter> this returns the filter change points
TES CON BOU <enter> this returns the list of gain segments
TES CON GS <enter> this returns the gain matrix - a lot of data.
16.10.3 Clearing the current settings
There are three areas of memory that need to be cleared. These are the NVM, the EEPROM and the real time clock
chip. (This has an area of general purpose NVM in it).
Here are the commands:
TES CLE NVM <enter>

TES CLE RTC <enter>
TES CLE EEP <enter>
Once these commands have been began, switch off the instrument, when it is next switched on, the cleared areas of
memory will be filled with the hard coded default values. Switch on, gain control via the terminal and initialize the
instrument.
16.10.4 Replacing serial number
This is done using the VAR command the parameters it requires are the model number and the serial number.
Example:
VAR EV300 123456 <enter>
16.10.5 Resetting the clock
On a local control instrument, this can easily be done via the user interface. For black box instruments, this is done
using the STI command. STIME <day of the week> <day-month-year> <hours: minutes: seconds>
Example:
STI TUE 22-08-03 14:12:22 <enter>
16.10.6 Replacing wavelength calibration
This is done using the MPS command, the parameters it needs at three coefficients and the bandwidth to which
they apply. They are required in the format used by the MPL command. So the easiest way to use this command it
to copy the data from the text file you captured earlier and just paste it after typing MPS. The last figure in the
parameter list is the bandwidth. In the example, the 2nm bandwidth data is being entered.
Example:
MPS 1.998895e+00 1.885237e-07 1.182525e-11 2.0 <enter>
-
You need to do this for each of the instrument bandwidths. This command takes a little while to action, as the
processor has to create new drive tables for each bandwidth using the new data.

16.10.7 Checking the set up
Once you have replaced the wavelength calibration data, check the performance of the instrument by running the
baseline flatness test. If the baseline is in specification, no further action is required. If there are big steps or
very noisy areas, you need to work through the next sections.
Here is a summary of the baseline test:
Scan between 190 and 900nm, 1.5nm bandwidth, 120nm/min, with a 2nm data interval, scale ±0.005 A, smoothing
set to low. Perform a baseline and then a scan. The trace should not show any filter change steps greater than
0.001A in size.
16.10.8 Checking the filter change points
Run the command TES CON STR and check the output against the data you captured earlier. If one of the change
points is different, reenter the data using the same command.
Example: — the previous data should look like this

TES CON STR <enter>
-
Example: — enter this data like this
TES CON STR 223.0 265.0 372.0 453.0 590.0 <enter>
-
16.10.9 Checking the gain matrix
It should not be necessary to check/modify this on an Evolution 600 as the gains are switched automatically by
software dependent on signal levels.
Run the command TES CON GS and check the output against the data you captured earlier. You only need to
check the first table, the one for the xenon lamp. Look for differences in the settings; these are most likely to be
near that start of the table, the UV region. If you see any differences, you will need to program the new values into
the gain matrix. You do this using the TES CON GS command.
Example:
-
In this example the "1.5" is the bandwidth and the "1" is the wavelength segment number. The next four numbers
are the gains; these are the figures that may differ. Please note that the last two numbers must always be the same.
Change only one bandwidth at a time; check the result by running a baseline test. It is very unlikely that more than
two or three entries will need to be changed.

17.0Production Utility and Service Tool
17.1 Requirements
With release of the UV Evaluation System, Version 4.0, the Evolution Production Utility is a v1.1.NET application
and requires the .NET v1.1 redistributable runtime to be installed to run. The runtime can be obtained from the
main Microsoft website or through the Microsoft Windows Update website. Once installed, the runtime is listed in
the Add or Remove Programs dialog in the Control Panel.
17.2 Installation
The installation is performed by running the setup.exe program located on the installation media. Select the default
installation parameters.
17.3 Configuration
The utility uses a number of configuration files. These files contain calibration data for Absorbance, Wavelength
and CVC sets. The configuration files for these standards and kits are located in sub folders in the Application
folder.
The installer provides sample files that can be copied, renamed and edited to display the values in your specific
kits.
17.4 Removal of the software
The UV Evaluation System production utility can be uninstalled using the Add or Remove Programs dialog in the
Control Panel.
17.5 Using the utility
This production utility can be run from the start menu.
Figure 17-1 UV Evaluation System start menu

1. Connect the spectrophotometer to COM1 using a 9 pin female-female serial null modem cable. (Place the
Local Control into Remote Mode if applicable.)

2. Select the correct instrument type and click Connect to establish a connection with the instrument.
A connection confirmation popup window will appear.
Figure 17-2 Connection confirmation

3. The program will confirm the instrument’s type and serial number. If you need to program the serial number,
click No and a dialog will appear giving you the option to change it.
Figure 17-3 Change dialog
Note In Figure 17-4, the instrument is still turning on the deuterium lamp for the Evolution 600. ▲

17.5.1 Basic operations
A number of features can be accessed from this front panel. By pressing the lamp button, the Lamps dialog will
appear.
Figure 17-4 Lamp Control dialog for Evolution 600 instrument

The lamp statistics are made available by pressing the yellow bulb icon as seen below.
Figure 17-5 Lamp status dialog for Evolution 600 instrument
The slit position window is displayed when the Slit Drive button is pressed. This allows the bandwidth or slit
setting to be set manually.

Figure 17-6 Slit Drive dialog
17.5.2 CVC tab

The CVC tab provides quick automation of the CVC tests. The available tests vary depending on the presence of a
CVC and mercury lamp accessory.
Figure 17-7 Tab options

Click the Update Tests button to get the list of currently supported tests.

Figure 17-8 Available tests
Select the desired tests and click Run.
17.5.3 Evolution tab

The Evolution tab is used to perform tests manually without the use of a CVC accessory.
The utility will display results for each test after you have double-clicked on the title (indicated by the green color)
of the test, as shown in Figure 17-9.

Figure 17-9 Test result dialog
These tests require various artifacts, accessories or standards to operate correctly or fully. Some tests only require
the bare instrument

18.0Accessories
18.1 Mercury lamp
This accessory comprises of a mercury pen lamp and power supply, mounted in a pre-aligned package that fits on
the accessory lamp connector at the back of the instrument.
The main body of the accessory holds the lamp and provides the fixing holes that engage with the alignment pins
on the casting. The power supply is housed in a die cast box fastened to the main part of the accessory. The
connector for the accessory is on the die cast box.
There are no adjustments either mechanical or electrical on this accessory.

18.1.1 Mercury lamp connector
The mercury lamp can be installed or removed without switching the instrument off. The following table gives
the pin out of the 9 way "D" type connector used on this accessory.
Pin Circuit Description

2 Lamp Control Logic signal to operate the light switch
3 Code 1 Code line
4 Code 2 Code line
5 0VP Power return
7 N.C.
8 N.C.
9 0VL Logic signal return
18.1.2 Mercury lamp accessory circuit diagram
PL1
R1 R2 TB 2
1 6 10k 10k
1
2
R3 TR1
470 IPS
1 PSU 1 3,4 021
IPS021 1 TB1
2
TDK 1
3
9 C1 CXA-M10A 2
5 1nF 1 2 3
2 5
Lk1 Lk2
18.1.3 PCB configuration

1. Fit link 1
2. Fit the TDK CXA-M10A
3. Fit TB1 only

18.2 Smart accessory PCB
All of the accessories that communicate with the Evolution 300 and Evolution 600 via the I2C bus use the same
basic PCB. This PCB is based on a PIC 16F877 micro controller that provides the memory, computing power and
I2C bus interface. It is supported by two AD 7705 A to D converters, a stepper motor drive, and optionally, a drive
for magnetic stirrers and a high power bridge driver for Peltier control. This is a high density surface mount PCB
with components mounted on both sides.
18.3 Outline circuit description
18.3.1 Power supply
The instrument accessory bus connector provides +5 and ±15V supplies. This board uses power from +5 and +15V.
It also has provision to use a +16.4V supply when it is used with Peltier accessories. The +5V rail is only used to
power the stepper motor. The remaining 5V circuitry is powered by a linear regulator run from the +15V rail.
One of the features of these accessories is that they can be "hot plugged". To make this reliable, the way the power
lines come up needs to be sequenced. This is done by means of an IPS511G "high side switch" in series with the
+15V input. A capacitor resistor network on the +5V supply control the IPS511 so that the +15V to the accessory
is not switched on until the logic supply is up and stable. The lower part of Figure 18-2 shows the relevant
circuitry.

Figure 18-1 Power switch and address circuitry
18.3.2 Address circuitry

Each of the accessory sockets has two address bits uniquely coded for that socket. The accessory picks up these
lines and uses them as part of its I2C address. These lines come in on pins 1 and 2 of J25, and after some filtering,
they are buffered by U39.
18.3.3 Temperature measurement circuitry
There is provision to read three platinum resistance thermometers. These are connected as four terminal devices,
that is, the excitation current it taken to the resistive element through one pair of wires and the voltage across the
element is measured by another pair. The AD7705, U1, measures the two thermometers used to read the block and
heatsink temperatures in the Peltier accessories. The amplifiers in U2 and U3 provide a constant current of
approximately 500µA, which flows through both of the thermometers. The AD7705 differentially monitors the
voltage across each thermometer. An error results if either thermometer is disconnected. This circuitry is duplicated
for the cell temperature channel; a 100-ohm resistor is installed in place of the unused channel. The first two
channels are shown in Figure 18-3.

Figure 18-2 Accessory board temperature circuitry
18.3.4 Stepper motor drive

All the coil sequencing is done in software; I/O lines from the micro controller go directly to the drivers. The
drivers used are IPS021 devices that are very robust and are protected against short circuits and excessive
temperature.

Figure 18-3 Accessory stepper motor drive
18.4 Accessory PCB connector usage

This section lists how the connectors are used in each accessory. See Figure 18-4 to find the location of each
connector.
Rotary Cell Changer

Function Cable part number PCB Notes
Instrument 4401 172 0083 x J25
Motor 4401 172 0115 x J29
SR30 4401 172 0084 x J22
Optosensor 4401 172 0143 x J23
Linear Cell Changer

Motor 4401 172 0115 x J29
SR30 4401 172 0084 x J22
Optosensor 4401 172 0143 x J23

Sipper
Motor 4401 172 0115 x J29
SR30 4401 172 0084 x J22
Beak cableform 4401 172 0142 x Mates with SR30
Peltier Single Position accessory

SR30 4401 172 0112 x J22
Block PRT 4401 172 0089 x J18
Heat sink PRT 4401 172 0089 x J31
Stirrer 4401 172 0090 x J15
Blower Assembly 4401 172 0091 x J30
Single Peltier Cell 4401 172 0110 x J28 Red to pin 1
Figure 18-5 Accessory PCB connectors
18.5 Rotary base unit

The rotary base unit is used for the 7-Cell Changer, CVC, and with a higher torque motor, the Sipper. This unit is
simple to dismantle and re-assemble. The cover is held in place by the four screws securing the handles. With the
cover off, the board is accessible. In Figure 18-6, a standard base unit is shown with some of the less obvious
connectors marked.

Figure 18-6 Base unit showing PCB in place
Figure 18-7 shows a side view of the assembly, note how the heatsink fits around the motor spindle.
Figure 18-7 Side view, PCB removed

With the board removed, the heatsink and drive mechanism can be seen, but to work on the drive mechanism, the
motor assembly must be removed. To do this remove the three screws that hold the motor bracket in place, see
Figure 18-8, the pinion can then be disentangled from the drive belt and the assembly lifted clear.
If the belt needs replacing, it can be done now. Fit the new belt around the large pulley, engage the motor pulley,
hold the motor bracket in place and re-insert the motor screws. Adjust the belt tension by rotating the bracket using
the slots. To check the belt tension press on it at the center on the unsupported length it should depress about 6 to
8mm.

Figure 18-8 motor fixing and belt adjustment
Should the motor be changed it is important to make sure that the thermal break is correctly installed between the
motor bracket and the heatsink, see Figure below.
Figure 18-9 Layer of thermal insulation
The base unit for the Sipper is the same in all respects, apart from the larger higher torque motor that is installed,
see Figure below.
Figure 18-10 Sipper base unit

19.0Spare Part Numbers
Evolution 300 LRU List
Evolution 600 LRU List
Evolution 300 and Evolution 600 Parts and Accessories

20.0Schematics
Evolution 300 Preamp PCB
Evolution 300 Xenon Supply PCB
Evolution 300 and Evolution 600 Smart Accessory PCB
Evolution 300 and Evolution 600 Main Control PCB
Evolution 300 and Evolution 600 POD Interface PCB
Evolution 600 Preamp PCB
Evolution 600 with Deuterium Supply PCB

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The information in this publication is provided for reference only.

All information contained in

For technical assistance, please contact:

Evolution, Smart Accessory, VISIONsecurity and VISIONpro are trademarks of Thermo

PRINTER KEY BD EXT ACCY RS232 EXT DISPLAY

- ii - Thermo Electron Corporation

- iv - Thermo Electron Corporation

- vi - Thermo Electron Corporation

Note Notes contain helpful supplementary information. ▲

1.2 General Safety Precautions

Evolution 300 and Evolution 600 Service Manual -1-

- 2 - Thermo Electron Corporation

Burn from UV Unlikely Minor Allow instrument to cool for 15 Client if in

Evolution 300 and Evolution 600 Service Manual -3-

Part Number Type Description

Part Number Type Description

2.3 About this manual

Circuit and Assembly diagrams are in “Section 20.0.”

2.4 Special Tools

Evolution 300 and Evolution 600 Service Manual -4-

3.2 System outline

-15 V +5V +24V

0V Floppy Disc Drive

Self test motor

Main Processor Board

Accessory Bus Slit drive motor

Filter drive motor

Signal Filter wheel sensor

Zero order sensor

+15V & control

Figure 3-1 Evolution 300 system block diagram

Evolution 300 and Evolution 600 Service Manual -5-

Evolution 300 and Evolution 600 Service Manual -6-

Evolution 300 and Evolution 600 Service Manual -7-

3.7 Accessory Interface

3.7.2 Common accessory connector

Figure 3-4 Accessory connector

-8- Thermo Electron Corporation

Figure 3-6 Evolution 600 DRA accessory connectors

Evolution 300 and Evolution 600 Service Manual -9-

3.8 Accessory Lamps

Figure 3-8 Accessory lamp connector, instrument end

3.8.1 Lamp control

Lamp Code 1 Code 2

- 10 - Thermo Electron Corporation

Pin Circuit Description

Evolution 300 and Evolution 600 Service Manual - 11 -

5M6 5M6 5M6

Figure 4-1 trigger module circuit

Evolution 300 and Evolution 600 Service Manual - 12 -

4.1.2 The xenon power supply assembly

Figure 4-3 Location of the xenon lamp supply

Evolution 300 and Evolution 600 Service Manual - 13 -

Figure 4-5 Tungsten and deuterium lamps

- 14 - Thermo Electron Corporation

Heater Voltage – start (nominal): 10 Volts

Lead coloring is: Anode = Red

4.2.3 Tungsten and deuterium lamp life

4.2.4 Tungsten and deuterium power supply assembly

When working on the lamp power supply:

Evolution 300 and Evolution 600 Service Manual - 15 -

Figure 4-7 Tungsten and deuterium PSU in screening box

- 16 - Thermo Electron Corporation

Figure 5-1 Measurement System Block diagram

Evolution 300 & 600 - Service Manual

Evolution 300 & 600 - Service Manual