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Chris Magruder
July 12, 2015
1
Olympus Dual Matrix Array Probes – Promotional Video on Web Site
• Please watch the 8 minute promotional video for the Olympus dual matrix array
probes prior to reading this presentation.
• ftp.olympusndt.com/p_support/ChrisMagruder/DMA_PromotionalVideos.mp4
2
Olympus Dual Matrix Array Probes – Probe Overview cont.
• Two standard dual matrix array probes in 2MHz (A17) and 4MHz (A27) are
designed to provide off the shelf inspection capability for a wide range of
austenitic materials and weld bevels including dissimilar metal CRA welds.
• Custom designed dual matrix array (DMA) and dual linear array (DLA) probes of
different aperture, element configuration, and frequency are available from
Olympus probe manufacturing.
3
Olympus Dual Matrix Array Probes – Probe Overview cont.
• DMA probes are purchased in either a dual configuration for single sided DMA
inspection or in quad configuration for two sided simultaneous DMA inspection
as pictured below.
• All standard models are compatible with 32:XXPR pulser instrument
configuration.
• All standard models are compatible with 32:128PR in quad probe configuration.
Single sided dual matrix array inspection Two sided quad matrix array inspection
TX
TX RCV
RCV
RCV TX
TX TX RCV
TX
RCV
RCV
4
Olympus Dual Matrix Array Probes – Probe Overview cont.
• The DMA probes are compatible with standard Olympus Y splitters for two sided
inspection or can be purchased with all four arrays wired into the same
OmniScan connector.
• Use of standard Olympus splitter enables two independent dual matrix array
probes for two sided weld inspection.
• It is never necessary to use a splitter for single sided DMA inspection as the two
probe housings in DMA configuration are always wired into one connector.
5
Olympus Dual Matrix Array Probes – Probe Overview cont. FIX 16-8
• The Olympus 4MHz A27 DMA probe contains a 2X16 small element
configuration in each housing optimized for thinner and less attenuative
austenitic materials.
• Each array has an aperture of 6X16mm.
• Because the A27 DMA probe contains only 2 elements in the secondary axis,
the wedges require a mechanical roof angle for each pipe diameter or focus.
6
Olympus Dual Matrix Array Probes – Probe Overview cont.
• The A27 probe is available in dual matrix array (DMA), dual linear array (DLA),
and single element UT probe configurations.
• Each of the A27 probe configurations below has a 6X16mm aperture and a
specific pro and con with respect to cost, pulser requirement, software,
dependence on wedge design, and acoustic performance.
• All configurations use the same removable A27 IHC wedges that are standard
with acoustic insulation of the TX and RCV, irrigation ports, scanner ports,
adjustable carbide wear pins, and precision mechanical design.
4Mhz A27 dual matrix array probe detects SWLF in Inco alloy 625 CRA weld.
7
Olympus Dual Matrix Array Probes – Probe Overview cont.
• The benefit of the A27 DLA probe is that it uses ½ the elements of a DMA which is
beneficial when 4 or more PA probes are required on the same scanner.
• The A27 DLA probe provides a similar S-scan as the DMA with respect to angle
range and focus but are compatible with 16:128PR pulser configuration.
• A27 DLA is not supported in NDT SUB software. Requires TV Adv Calc.
• DLA focal law creation using TV Adv Calc has no limitation for AOD wedge.
Mechanical pseudo focal plane is visible in draw tool.
• DLA probes can be wired for fixed focal laws that do not require PR option.
• DLA S-scan is compatible with compound S-scan.
8
Olympus Dual Matrix Array Probes – Wedge Overview
• Olympus DMA wedges come standard with IHC options including acoustic
insulation of the TX and RCV housings, irrigation ports, 5mm scanner ports,
carbide wear pins, and precision mechanical design.
• DMA wedges are flat or contoured for pipe diameter on secondary axis. (AOD)
• The wedge nominal refracted angle is designed based on a material velocity of
5890 meters\second.
9
Olympus Dual Matrix Array Probes – Wedge Overview cont.
• Acoustically insulating the TX and RCV in the wedge eliminates the need for
wedge dampening material and a large standoff.
• The smaller DMA wedge allows the useful focus depth and range of the probe to
be extended into the material resulting in higher SNR over larger sound path.
• Significant energy is lost in large wedges designed for 1D linear array probe
pulse echo longitudinal angle beam inspection due to wedge attenuation.
10
Olympus Dual Matrix Array Probes – Wedge Overview cont.
• The probe index offset reference and wedge surface distance reading (PA) are
measured as pictured below and the upper section of the rexolite wedge is only
to accommodate the housing screws.
• This allows beam exit as close to the weld line as possible without acoustic
performance compromise to accommodate mechanics or a big probe housing.
Nominal angle
beam exit
0,0 wedge
reference
PA reading
11
Olympus Dual Matrix Array Probes – Wedge Overview cont.
• Throughout this presentation and the Olympus DMA promotional video DMA
wedges of similar design but different nomenclature are visible in the images.
• During the A17 and A27 DMA development some wedges of the same design
had different names and in some cases wedges used in the studio pictures
shared the same designation but were of slightly different design.
• All DMA data samples in this presentation and in the promotional video were
created with the equivalent of either the standard DN55L volumetric or DNCR
surface designs that are quoted with the A17 and A27 DMA probes.
TRX RCV
Olympus OmniScan PA2 32:128PR
12
Olympus Dual Matrix Array Probes – Instrumentation Overview cont.
• Upgrade pricing is available for all previous generation OmniScan modules to
latest PA2 32:128PR.
• Contact your local sales representative or distributor for details.
• Benefits of PA2 generation OmniScan modules include:
• Significantly improved SNR that is essential for austenitic
weld inspection (>15 dB)
• Expanded operating temperatures
• Fanless design
• 115 volt pulser on PA groups
• Video filtering in PR mode for DMA and DLA probes
• High definition 340V UT board independent of the phased
array electronics. (Allows single group PE or PC A-scan
from the lemo connectors)
• Manufactured to comply with EN-12668-1 (UT standard)
• Manufactured to comply with soon to be released ISO
18563-1 (PA Standard)
13
Olympus Dual Matrix Array Probes – NDT Setup Builder
• The Olympus NDT Setup Builder version 1.1R1 or later supports standard
Olympus DMA probes for scan plan plotting of welds and for creation of focal laws
for use in the OmniScan or Focus PX instruments.
14
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example a 2mm EDM notch is visualized in a 25mm thick inconel alloy
CRA weld through the clad layer.
• Using cursors, length sizing is performed on the C-scan and depth and height
sizing is performed on the A-scan and S-scan.
• The cursor deltas and trigonometry are displayed and can be recorded in an
indication table directly from the OmniScan header.
Sm-r
Um-r VIA
OLYMPUS Scientific Solutions
15
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example the 4MHz A27 DMA probe with DNCR wedge is used for a CRA
weld inspection using 30-80 degree S-scan focused at 30mm sound path.
• The longitudinal velocity of the inconel alloy 625 weld is 5830 meters\sec and
the velocity of the carbon steel base material is 5890 meters\sec resulting in
minor beam angle change at the weld interface.
• The accuracy of depth and height plotting is directly related to the user knowing
the velocity of the base material and weld.
VIA
PA
SA DA
16
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• When no diffracted flaw tips are detected sizing is limited to amplitude drop
method only.
• Fast signal rise and fall time and linear indication on the weld line indicates LOF.
• In this weld, -3dB drop provides sizing accuracy within +\-.5mm and is aided by
higher frequency probe. (4MHz)
Um
Um-r
Ur
17
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• Similarly to conventional UT inspection techniques like PE and TOFD, phased
array S-scans do not oversize flaws, inspectors do.
• The flaw is almost always smaller than the inspector thinks it is so be conservative.
• The benefit of experimentation on SDH, notches, and flaws of known size in the
actual inspection material or weld bevel cannot be over emphasized.
• It is also extremely helpful to validate the probe, wedge, and beam limits in carbon
steel prior to moving to more attenuative austenitic and CRA weld bevels.
• It only gets worse.
18
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• For angle beam groups, which beam parameters below can be corrected in the
OmniScan wizards if an out of tolerance velocity was used for the beam formation?
• Beam angle
• Beam focus
• Beam exit in wedge
• Beam time of flight
• Beam wedge delay
• Trigonometry readings
• All of the above
• None of the above
• Hint: It is the same answer whether the group was created with the OmniScan
setup wizard or a focal law import from a PA calculator.
19
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• It is not possible to take a precision velocity measurement on a pipe or vessel that
does not contain a known reflector for the measurement.
• Use of a database velocity is highly recommended if precision block of same weld
bevel and velocity is not available for the measurement.
• Big SDH, piping notches, or short sound path reflectors are unacceptable for
measuring a precision velocity.
• Inconel = approx. 5700 m\s. Inconel alloy 625 = approx. 5830 m\s. Not the same!
• Use of PMI to validate material properties is highly recommended if available.
Material match
for SS321
20
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• After detection, the flaw is optimized for depth and height sizing by moving the
probe in and out on the encoded index axis with the hand crank of the scanner.
• Sizing is most accurate when a clear upper and lower flaw tip can be imaged
with low angles. (30-60 degrees)
• Sizing is least accurate when low frequency (2.25MHz) amplitude drop sizing is
imaged at high angles. (60+ degrees)
Um-r
Um-r
Sm-r
21
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• In this example a 2MHz A17 DMA probe detects a 3mm 25mm deep SDH
through the weld of a 50mm thick SS316 vessel calibration block.
• Attenuation through the weld is >12dB as compared to detection from the base
material side of the weld.
22
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• What is the minimum size defect that can detected in austenitic materials?
• It is very much dependent on the frequency of the probe and amount of distortion
and attenuation through the weld and around the base material.
• The best case scenario for any UT detection limit is a flaw approximately the size
equal to or greater than ½ the probe’s wavelength.
. / .
• For a 2MHz probe, 2.945mm. = 1.5mm.
• A 1.5mm diameter flaw is mathematically the smallest detection possible by a
2MHz probe in best case carbon steel and will only get worse in coarse grained
austenitic materials.
• As the length of the flaw is increased its probability of detection is also increased.
23
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• It defies physics and common sense that high angle longitudinal S-scan
inspection with low frequency probes (2-4MHz) in coarse grained austenitic
materials and welds can achieve the same detection and sizing precision as
high frequency (5-10MHz) shear wave probes in carbon steel inspections with
full V skipping and supplemental TOFD.
• More than software or instrument specifications it is advanced probes of
different frequency and design that will improve austenitic weld inspection with
regard to probability of detection, sizing accuracy, and flaw characterization.
24
Olympus Dual Matrix Array Probes – Volume Inspection cont.
• Sizing is most accurate with low angles where a definitive diffracted tip is detected
with clarity and confidence.
• Sizing is least accurate at high angles with poor resolution and where only
amplitude drop sizing is possible.
25
Olympus Dual Matrix Array Probes – Off Axis Beam Skew
• Another advantage of 2D matrix arrays is that they have off axis beam skew
capability. This is the ability to steer the S-scan at an angle other than directly in
front of the probe.
• This is only possible with the A17 because it has sufficient elements (4) in the
secondary axis.
• The primary application for off axis S-scans is to detect and size axial and
transverse IGSCC in austenitic piping welds.
• Off axis beam skewing is not normally performed in full volumetric new
construction weld inspections referencing fracture mechanics acceptance criteria.
Electronic beam skew (-30 degrees) Mechanical probe skew (90 and 270 degrees)
-30
TX
90 TX RCV
RCV
RCV TX
90 270
Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• The probe skew is defined as the orientation of the probe and wedge in relation to
the blue mechanical scan axis and is normally 90 and 270 degrees for opposing
probes perpendicular to the weld line as pictured below. The probe skew is
mechanical.
• The beam skew is defined as the orientation of the beam inside the wedge. Beam
skew is electronic and possible with phased array element delay.
Electronic Beam skew (-30, 0, and +30 degrees) Mechanical probe skew (90 and 270 degrees)
-30
TX
90 TX RCV
0
RCV
RCV TX
+30
90 270
26
Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• In the OmniScan the mechanical probe skew is defined by the user in > Probe >
Part > Position and can be changed at any time before or after the inspection.
• The beam skew was created in the focal law and is not editable. The beam skew
is visible with the rest of the beam parameters in the > UT > Beam sub menu.
Electronic Beam skew 30 degrees Mechanical probe skew (90 and 270 degrees)
TX
90 TX RCV
RCV
RCV TX
+30
90 270
Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• The limit of off axis beam skew is directly related to the number of elements in
the secondary axis of the probe and their size and frequency.
• The 2MHz A17 DMA probe is capable of 45+ degrees off axis beam skew with
flat wedge because it has 4 rows of elements in the secondary axis. Off axis
beam skew limits are reduced as the pipe diameter is reduced. (AOD wedge)
• The 4MHz A27 DLA and DMA probes are not capable of off axis beam skew
because they only have 1 or 2 rows of elements in the secondary axis.
Secondary
axis
Primary
axis
27
Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• S-scan groups of different skew must be imported into the OmniScan
independently one at a time. (1 focal law for each S-scan)
• When using Focus PX or OmniScan OSTV for Tomoview acquisition, all beams
from all three S-scans can be acquired in one group (Uncorrected) and merged in
analysis for top, end, and side views. (Volume corrected)
• The limits of beam steering are determined by peaking a SDH or notch on the
calibration block and verifying mechanically if the max peaked signal occurs at the
angle entered in the calculator. (Peak signal by moving probe side to side >
measure angle of wedge and calibration block with protractor)
-30
-30
+30
Olympus Dual Matrix Array Probes – Off Axis Beam Skew cont.
• Use of off axis beam skew for pitch catch between arrays on opposite side of the
weld is configured by using the “Replace receiver” in the TV Adv Calc while
connected to Focus PX or OmniScan OSTV through Tomoview.
• This configuration for focal law import into OmniScan is possible but requires
mechanical drawing with probe separation and offsets of all arrays so the law file
can be created in one step. (Not recommended)
28
DMA Probe Overview – Surface Inspection
• Surface testing refers to the detection, sizing, and characterization of shallow weld
flaws or flaws connected to the outside surface of the weld.
• The surface inspection is optimized using A27 DMA, DLA, or UT probes for and is
limited to high angle first leg inspection.
• The A17 has only 7 large elements in the primary axis of the probe and is not
recommended for surface inspection due to poor high angle beam steering.
• Surface inspection supplements the volumetric inspection to provide complete
weld bevel coverage.
29
DMA Probe Overview – Surface Inspection cont.
• The high angle surface S-scan is imported into the OmniScan similarly as the
volume S-scan and uses either a half path (SUB) or projection (TV) focusing.
• The benefit of using the uncorrected display mode (Sound path) as opposed to
true depth is that 100% of the data view is utilized and gates are positioned more
efficiently for the C-scan data.
• The OmniScan true depth mode is changed to uncorrected in >Group\probe
>Group management >Technique.
30
DMA Probe Overview – Surface Inspection cont.
• Select >Sizing >TGC type: TCG to create the manual TCG points over the weld.
• Select >Curves setup and move the position of TCG point 1 to the notch indication
in the A-scan and increase the gain until the signal is 100% amplitude.
• Select add to create TCG point 2.
31
DMA Probe Overview – Surface Inspection cont.
• Slide the probe backwards from the surface notch to 20mm using a ruler against
the wedge face.
• Move the position of TCG point 3 to the new position of the surface notch
indication in the A-scan and increase the gain until it is 100% amplitude.
• Continue until the desired coverage is obtained over the weld or until SNR of the
notch deteriorates.
3
1 2
1 2 3
32
DMA Probe Overview – Surface Inspection cont.
• Use of an unrectified waveform allows a grey scale color palette similar to TOFD
that is more sensitive to small defects.
• This is possible for the phased array or UT probes used for surface inspection.
• The setup and TCG procedure is the same for full wave rectified or unrectified and
the user can switch between the two before or after setup.
Gate A
33
DMA Probe Overview – Surface Inspection cont.
• In this example the 4MHz A27 DMA probe with DNCR wedge detects a 1mm
deep X 10mm long EDM surface notch at 20mm+ from the wedge face in an
inconel alloy 625 weld.
• This is the same inspection configuration that appears in the DMA promotional
video with the Olympus Mapper scanner.
• If all A-scans above approx. 70 degrees are essentially the same in that they
propagate parallel to the component surface where trigonometry is not possible,
why not just use a single static A-scan?
• Because use of multiple A-scans of slightly different delay, beam exit and beam
angle increase probability of detection and provides more information.
• The maximum amplitude A-scan detection is random and can occur on any of
the A-scans in the S-scan.
34
DMA Probe Overview – Surface Inspection cont.
• In this example the 4MHz A27 DMA probe with DNCR wedge detects 3 shallow
flaws and 1 OD connected flaw in a 6 inch diameter inconel alloy 800 weld.
• There are numerous indications in the C-scan generated by the 75-80 degree
surface S-scan that have at least one A-scan >50% amplitude.
• However there are only 4 indications that generated a >50% amplitude on all A-
scans within the 75-80 degree S-scan.
• Use of the color palette aids analysis by increasing probability of detection and
reducing over calls.
• Best practice for surface inspection includes combining time of flight position,
amplitude, and multiple A-scan detections developed during trials.
35
DMA Probe Overview – Surface Inspection cont.
• In this example the 4MHz A27 conventional UT probes with DNCR wedge detect
an OD connected surface crack in duplex stainless steel.
• Use of the unrectified A-scan and grey scale color palette provides more sensitive
inspection for detection and sizing of small near surface and surface connected
weld flaws.
UT lemo connectors
36
Questions or comments:
Chris.magruder@olympus-ossa.com
37