CTS-4020E Operation Manual - B03 - 20120313 PDF

CTS-4020E
Digital Ultrasonic Flaw Detector
Operation Manual
Shantou Institute of Ultrasonic Instruments Co., Ltd.

DCY2.781.4020ESS/B03
Table of Contents
Chapter 1 CTS-4020E Overview ................................................................................. 1

1.1 About CTS-4020E............................................................................................... 1
1.2 System Appearance............................................................................................ 2
1.2.1 Structure and ports ...................................................................................... 2
1.2.2 System figure............................................................................................... 3
1.2.3 Display mode ............................................................................................... 3
1.3 Operation Power ................................................................................................. 4
1.3.1 Operation with CD-17 charger ..................................................................... 4
1.3.2 Operation with DC-18 rechargeable battery ................................................ 5
1.3.3 Remaining power indicator .......................................................................... 5
1.4 Connecting A Probe ............................................................................................ 5
1.5 System Startup ................................................................................................... 6
Chapter 2 Performance Features and Technical Specifications............................. 7
2.1 Application Range and Performance Features ................................................... 7
2.2 Specifications...................................................................................................... 8
Chapter 3 System Function and Operation............................................................. 11
3.1 Menu Directory ..................................................................................................11
3.2 Basic Operation ................................................................................................ 13
3.2.1 Main menu................................................................................................. 13
3.2.2 Menu page number.................................................................................... 14
3.2.3 Submenu items.......................................................................................... 14
3.2.4 Special function key ................................................................................... 15
3.2.5 Measurement data area............................................................................. 15
3.2.6 System poweroff ........................................................................................ 16
3.3 Submenu Setup and Operation ........................................................................ 16
3.4 Select Display of Measurement Data................................................................ 34
3.5 Waveform Display Area of DAC_MODE ........................................................... 35
3.6 Operation of Other Special Function Keys ........................................................ 36
3.6.1 Gain decrease key ▼ / Gain increase key ▲ ......................................... 36
3.6.2 Gain step adjust key Step.......................................................................... 37
3.6.3 Cine key Cine ............................................................................................ 37
3.6.4 Screen printout /record key Copy .............................................................. 37
3.6.5 Display freeze key Freeze ......................................................................... 37
3.6.6 Echo display zoom key Zoom.................................................................... 38
Chapter 4 Testing Application ................................................................................. 39
4.1 System Calibration Method and Procedures..................................................... 39
4.1.1 Probe parameter setup .............................................................................. 39
4.1.2 Parameter setup for workpieces ................................................................ 41
I
4.1.3 Other important parameter setup............................................................... 41
4.1.4 Gate setup ................................................................................................. 42
4.1.5 Calibrate P_DELAY ................................................................................... 42
4.1.6 Testing sensitivity calibration ..................................................................... 46
4.1.7 Store of calibrated parameter state............................................................ 46
4.2 Other Application and Operation....................................................................... 47
4.2.1 Measurement of material velocity .............................................................. 47
4.2.2 Auto calibration of material velocity and probe delay................................. 49
4.2.3 Making and application of DAC_MODE..................................................... 51
4.2.4 Testing of probe echo frequency................................................................ 56
4.2.5 Angle measurement of angle probe........................................................... 57
4.2.6 Automatic testing of system index ............................................................. 59
4.3 Tips for System Application............................................................................... 60
4.3.1 Flexible application of gate ........................................................................ 60
4.3.2 Make full use of text prompts during operation .......................................... 60
4.3.3 Store and recall of system state and testing parameter ............................. 61
4.3.4 Increase anti-interference by operating with battery .................................. 61
4.3.5 Switch of display mode .............................................................................. 61
4.3.6 Select display of testing data ..................................................................... 61
4.3.7 Record comments during testing process.................................................. 62
4.3.8 Application of PEAK_VALUE function........................................................ 62
4.3.9 Application of GateB track mode ............................................................... 62
Chapter 5 Examples of Test Application................................................................. 65
5.1 Application Example of JB4730-2005 Standard................................................ 65
5.1.1 Initial setup of system parameters ............................................................. 65
5.1.2 Testing of probe parameter ........................................................................ 65
5.1.3 Make DAC curves...................................................................................... 66
5.1.4 Application of gate quantification and positioning ...................................... 67
5.2 Application Example of GB/T11345-1989 Standard .......................................... 67
5.2.1 Initial setup of system parameters ............................................................. 67
5.2.2 Probe parameter testing ............................................................................ 68
5.2.3 Make DAC curves...................................................................................... 68
5.2.4 Application of gate quantification and positioning ...................................... 69
Chapter 6 Operation and Management of Data Set................................................ 71
6.1 Store A Record.................................................................................................. 71
6.2 Recall A Record ................................................................................................ 71
6.3 Delete A Record................................................................................................ 72
6.4 Edit and Store of TESTINFO............................................................................. 72
6.4.1 TESTINFO field ......................................................................................... 72
6.4.2 Save TESTINFO........................................................................................ 75
6.4.3 Exit TESTINFO screen .............................................................................. 76
6.5 Preview of Data Set .......................................................................................... 76
6.6 Directory of Data Sets....................................................................................... 77
II
Chapter 7 Ports and Peripheral Devices ................................................................. 79
7.1 USB Port........................................................................................................... 79
7.1.1 Connect to a USB disk............................................................................... 79
7.1.2 Connnect a printer ..................................................................................... 79
7.2 Network Port ..................................................................................................... 80
Chapter 8 Training, System Maintenance and Service .......................................... 81
8.1 Training ............................................................................................................. 81
8.2 System Maintenance ........................................................................................ 81
8.3 Maitenance of Rechargeable Battery................................................................ 81
8.4 Service.............................................................................................................. 82
Chapter 9 How to Use Major Accessories and Options......................................... 83
9.1 How to Use Computer Communication and Data Processing Software............ 83
9.1.1 Main functions ........................................................................................... 83
9.1.2 Basic operation .......................................................................................... 84
9.2 How to Use Charger ......................................................................................... 85
9.3 How to Install Rechargeable Battery................................................................. 85
9.4 How to Use System Bag ................................................................................... 86
Annexes A Operation Instruction for Parameter Output Function via a USB Disk87
A.1 Manual Parameter Output .................................................................................. 87
A.2 Automatic Parameter Output .............................................................................. 87
Annexes B Operation in AWS D1.1 (Optional) ......................................................... 89
Annexes C AVG Curves(Optional) ............................................................................ 91

C.1 Making AVG Curves ........................................................................................... 91
C.2 Deleting AVG Curves.......................................................................................... 92
Annexes D Activation................................................................................................. 93
Contact Information ...................................................................................................... 94
III
Chapter 1 CTS-4020E Overview
1.1 About CTS-4020E

The CTS-4020E represents the persistent fine tradition of SIUI: topnotch technology,
advanced process, small size, lightweight and powerful functions.
Continuous innovation and endeavor towards world-class technology is SIUI’s invariable
goal. The CTS-4020E adopts an embedded computer system and a super large-scale
field programmable IC design, which combine all good performance of a large ultrasound
system in a very small space: at least 63dB detection sensitivity surplus will meet
detection demand for large forged pieces or coarse-crystal material; The new-type color
TFT LCD results in optimize read & measure effect and visual comfort; The simple but
convenient surface wave tracking function is good for immersion detection; Together with
new techniques and new functions such as DAC, TCG curve, RF echo display, large
memory, Cine, Ethernet and USB port, the CTS-4020E becomes a handy ultrasonic flaw
detector with excellent performance. Furthermore, the fast response time of the color TFT
LCD enables display of fast scanning echoes; the touch keypad is reliable and
comfortable for use; Its outstanding EMC design significantly increases field
anti-interference of the system.

Note: TCG means Time Corrected Gain.
In this manual:
Basic information about the system is described in Chapter 1;
System main performance and specifications are described in Chapter 2;
Detailed submenu directories for 7 groups of main menus and their operation in Chapter 3;
System calibration method for field testing, making of DAC curve, and flexible application
of some system functions are described in Chapter 4;
Testing application examples are listed in Chapter 5 (Chapter 4 & 5 enables an easy
access for the user to know field application very quickly);
Chapter 6 highlights data set operation and management of system built-in memory;
Connection of system peripheral ports with a PC or a printer is described in Chapter 7;
Operator training and system maintenance & service in Chapter 8;

1
How to use the main accessories of the system is described in Chapter 9.
To master the system functional features and operation quickly and use this knowledge for
ultrasonic testing skillfully, please read this operation manual carefully before using the
system.
1.2 System Appearance
1.2.1 Structure and ports
A: Gate horn indicator R: Reject function indicator D: DUAL work mode indicator
Submenu select keys

Gain adjust
Special function
Up/down adjust keys

Main menu keys
Fig. 1.1 Power switch
2
Probe T/R socket
LAN Ethernet port
USB port
Battery back
DC Power In
cover
Fig. 1.2 System handle
1.2.2 System figure Submenu

display area
Gain reading Nex page

Gain Step prompt
Waveform Current main

display area menu and and
submenu page
Measured number/sub-
data area menu total page
Fig. 1.3
1.2.3 Display mode
There are two CTS-4020E screen display modes:
 A-scan in normal mode is as shown in Fig. 1.4. Use this display mode when
adjust and set up the system:
3
Fig. 1.4
 A-scan in zoom mode is as shown in Fig. 1.5. Use this display mode when doing
field testing:
Fig. 1.5
Press Zoom key to activate zoom mode. At this time, except that gain adjust keys ▼
and ▲ , Step key, Copy key and Freeze key are adjustable, other menu functions are
locked and not displayed, so as to avoid misoperation on site. Press Zoom key again, and
it will return to the normal display mode.
1.3 Operation Power
1.3.1 Operation with CD-17 charger
The CTS-4020E can be operated with a CD-17 charger by connecting to the mains AC
4
power supply. Plug the Power DC In port of the CD-17 charger to the Power In socket on
the right of the CTS-4020E.

Note:
If the system power is cut off forcibly (e.g. the battery is removed or the CD-17 charger output
terminal is pulled out), the system will not be shut off properly. If the system is broken down and
cannot be shut off properly, press Power key for about 8 seconds to shut it down.
1.3.2 Operation with DC-18 rechargeable battery
The power for the CTS-4020E can be supplied from a set of 7.4V / 7.2Ah special lithium
battery (model: DC-18). The DC-18 battery can be inside or outside of the system, and
charged with the CD-17 charger.
Once the CTS-4020E is connected to the CD-17 charger, in system shutoff state, the
battery inside the system will be charged; when the system is turned on, the battery
charging will be cut off automatically.
For maintenance of the DC-18 battery, see Section 8.3 “Maintenance of Rechargeable
Battery”.
For load and unload of the DC-18 battery, see Section 9.3 “How to Install Rechargeable
Battery”.
1.3.3 Remaining power indicator
At the bottom right of the measurement data line, when there is only one box indicator left,
it means that the battery power is running out, and you should recharge or replace the
battery in time. It takes about 4 hours for continuous charging on the DC-18 battery. For
charging details of the DC-18 battery, see Section 9.2 “How to Use Charger”.
Note:
When the battery power is very low, to avaoid battery overdischarge, the system will be turned off
automatically.
1.4 Connecting A Probe

When doing testing with the CTS-4020E, use the BNC cable configured with the system or
5
a probe connecting cable of the same model to connect with a proper probe. All the probe
models manufactured by SIUI are suitable for the CTS-4020E.
When working with one probe, either BNC probe connector socket (in internal parallel
connection) can be used. While working with a dual (TR) probe (one crystal for
transmitting, and one for receiving) or two probes (one for transmitting, and one for
receiving), please be noted that you should connect the transmit probe to the left socket (a
“T” is marked on the system housing), and the receive probe to the right socket (with an
“R” mark). The wrong connection may result in abnormalilty such as echo waveform
disorder.
1.5 System Startup
Keep pressing Power key on the system panel for 1 seconds., and the system is started
up. The logo and the model are displayed on the screen. After initialization, it goes to work
mode. After system startup, the submenu setup is the same as the system setup when the
system was normally shut off last time.
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Chapter 2 Performance Features and Technical Specifications
2.1 Application Range and Performance Features

Application range
The CTS-4020E is a lightweight and compact digital ultrasonic flaw detector, especially
suitable for:
 Material testing, flaw positioning and echo evaluation
 Thickness measurement
 Testing result storage and recording
 General ultrasonic flaw detection situations
The CTS-4020E has measurement resolution of 0.1mm, 0.5~15MHz broadband
frequency operating range and a testing range up to 6000mm(steel longitudinal wave),
particularly suitable for testing and thicknes measurement on large workpieces. The large
memory and the DAC curves with variable curve-to-curve distance allow more convenient
field-testing.
Main features:
 Max. sampling rate 240MHz, measurement resolution 0.1mm, min. display range
5mm.
 Operating frequency range: 0.5~15MHz (in two steps), at least 63dB detection
sensitivity surplus, highlighting advantages of high sensitivity and broadband.
 Interface wave tracking function: Immersion detection or precision measurement
can be easily achieved through the logic relation between GateA and GateB.
 Peak value memory and echo comparison function: useful for fast scanning,
measurement and comparison on work pieces.
 Variable PRF: avoid reverberation signals during flaw detection.
 Complete DAC and TCG curve function: convenient for echo evaluation.
 RF (Radio Frequency) echo display: good to thin-wall material measurement,
academic research or quantitative analysis.
 Probe angle (K value) and probe echo frequency measuring function.
7
 Color differentiation display function for second wave signals, when detecting
with an angle probe.
 Large memory for saving up to 1000 data sets, including wave forms, curves,
parameters, detection reports, etc.
 LAN Ethernet port for real-time communication with a PC (Host) and remote
control.
 Cine loop function for recording the dynamic scanning process.
 USB port for saving system stored data and waveforms to a USB disk, as well as
easy printing test reports through a printer.
 Language selection: Chinese & English. Text message prompts during operation.
 High-brightness color TFT LCD, bringing optimized effect for reading
measurement.
 10 waveform colors and character colors are available.
 Large capacity lithium battery pack for continuous operation of over 6 hours.
2.2 Specifications
Table 2.1
Function Unit Specifications
0~6000 (Longitudinal wave in steel), continuously

Display Range mm
adjustable, minimum display range 5 mm
Display Delay mm -10 ~1000 (Longitudinal wave in steel)
Probe Delay μs 0 ~199.9
Material Velocity m/s 1000 ~9999
Damping Ω 30, 60, 150, 500
10 steps adjustable
PRF Approx. 20 to 500Hz for display range within 1500mm
Approx. 20 to 200Hz for display range over 1500mm
8
Table 2.1(continued)
Operating
MHz 0.5 ~15, two steps selectable: 1~4(-6dB) / 0.5~15(-6dB)
Frequency Range
Gain dB 0 ~110, with steps of 0.5 / 2 / 6 / 12
Rectify positive, negative, full, filtering, Radio Frequency (RF)
Reject % 0 ~80, linear reject
Vertical Linearity
% ≤3
Error
Detection
dB ≥63
Sensitivity Surplus
Up to 10 echo reference points recorded, can be
displayed in steps; dB distances between the three DAC
DAC/TCG Curve curves variable; DAC echo reference point can be
inserted, or the selected echo reference point can be
modified.
2 independent measure gate. Gate B can be set as

Gate
interface wave tracking gate mode.
Measure Resolution mm 0.1
Sound & light alarm (built-in beeper and LED on the

Alarm Signal
panel)
Measure Point
Flank of the first echo or peak echo in the gate
Selection
Display of sound path, horizontal distance, vertical

Echo Evaluation
distance, amplitude and dB difference.
Display 5.7” high brightness TFT LCD, 320 x 240 pixels
Zoom Two display modes selectable: normal and zoom
Peak Memory Echo peak memory display (envelope) selectable.
9
Table 2.1(continued)
Waveform compare display mode selectable. The

Waveform Compare
waveform for comparison is displayed in a different color.
A-scan Freeze Freeze detection pictures
1000 data sets, including detection state parameters,

Data Memory
echo figures, DAC curves, remarks, etc.
Replay up to 8 seconds. Can be saved to a USB disk.

Cineloop
Dynamic scan process recordable.
Real-time communication and remote control with the PC

Ethernet Port
(Host).
Save the system internal stored data and data waveforms

USB Port
to a USB disk. Print out detection reports.
Printer Compatible printers: HP-1020, HP-1120, Canon-S100SP
Power supply AC or battery
Battery Lithium battery pack (7.4V, 7.2Ah)
≥6h When using with the 7.2Ah lithium batter pack

Operating Time h
(backlight brightness dependent)
Operating Voltage V DC 6 ~9V (external power supply); 6.0 ~8.4 (battery)
Operating
℃ 0℃～40℃
Temperature
Weight kg Approx. 1.94kg(excluding battery)
Dimension mm 260 mm x 180 mm x 95 mm (W x H x D)
10
Chapter 3 System Function and Operation
3.1 Menu Directory

See Table 3.1 for directories of menus in the CTS-4020E.
Table 3.1
Main
Page 1 Page 2 Page 3 Page 4
Menu
RANGE * ∧
250mm ◄
MTL_VEL * SREF1 *
5920m/s 50.0mm
D_DELAY * SREF2 *
Basic
0.0mm 100.0mm
P_DELAY CALIBRATE
0.00us 0
∨ aSTART *
35.0mm
INTENSITY ∧ ∧ ∧
high
DAMPING FREQUENCY FINE_G BASE_G
150Ω 1~4MHz 0 30.0dB
DUAL RECTIFY AUTO_G REF_G
TR
off full off 0.0dB
P.R.F REJECT A_JAMMING FRE_TEST
6 0% off off
∨ ∨ ∨
Main
Menu
ANGLE * ∧ ∧ ∧
0.0°
K_VALUE * APERTURE S_DISP SEC_COLOR
0.00 Φ50.0mm off off
ANGLE_MEAS X_VALUE PEAK_VALUE MEAS_POINT
Meas
off 0.0mm off peak
REF_DEPTH THICKNESS * COMPARE ENLARGE
40.0mm 25.0mm off off
∨ ∨ ∨ ∨
11
Main
Menu
∧
VDR
off
SEN
Meas
25.0mm
NOISE
off
LINEARITY
off
Main
Menu
aLOGIC ∧
positive
aSTART * bLOGIC
35.0mm positive
aWIDTH * bSTART *
Gate
40.0mm 85.0mm
aTHRESH bWIDTH *
40% 40.0mm
∨ bTHRESH
30%
SET_# ∧ ∧
1
RECALL TESTINFO DELETE_ALL
off off off
STORE PREVIEW U DISK
Mem
off off off
DELETE DIRECTORY SAVE_OPT
off off current
∨ ∨
Main
Menu
DAC_MODE ∧ ∧ ∧
off
DAC_ECHO LINE_3 DAC_CORR PFREQ
0 DAC+6.0dB off 2.5MHz
aSTART * LINE_2 dB_CORR PDIA
DAC
35.0mm DAC+0.0dB 0.0dB 20.0mm
DAC HELP LINE_1 BOLD_LINE BASE
0 DAC-6.0dB Line1 3.0mm
∨ ∨ ∨ ∨
12
Main
Menu
∧ ∧
AVGL1 ATTEN
2.0mm 0.0dB/mm
AVGL2 dB_CORR
DAC
3.0mm 0.0dB
AVGL3 AVG
4.0mm off
∨
Main
Menu
DAC_CLASS ∧ ∧ ∧
3 CLASS
FILLED BRIGHTNESS DATE CLR_WAVE
off 5 2007-01-01 Green
HORN LANG.(语言) TIME CLR_BG
Config
off English 00:00:00 Black
COPY_MODE UNIT AUTOG_LV CLR_FONT
picture mm 80% Green
∨ ∨ ∨ DEFAULT
off
Note:
The setup values in the above tables are factory setting. The submenu value adjust items with a *
mark are fine adjustment. When a submenu is selected, a ◄ mark will be diplayed at its bottom
right as a prompt.
3.2 Basic Operation
3.2.1 Main menu
There are seven main menus in the CTS-4020E. At the lower part of the system, from left
to right 7 main menu keys are arranged, which are: Basic, TR, Meas, Gate, DAC, Mem,
Config. Each main menu includes certain submenus.
Basic: includes all necessary basic adjustments and calibration items for waveform
display.
TR: includes functions for adjusting the transmit circuit and the receive amplifier, as well
13
as digital signal processing.
Meas: includes all required functions for angle probe testing, as well as tracking gate
setup.
Gate: includes all required functions for controlling GateA and GateB, as well as traking
gate setup.
DAC: includes making DAC and TCG curves, as well as functions for evaluating flaw
echoes with DAC and TCG curves.
Mem: These functions are for data sets store, recall and deletion, as well as other
management for data sets.
Config: To configure other system setups, such as the clock, printing and displayed color.
Corresponding selections shall be made per requirements. When a certain main menu is
selected, the submenu content relevant to that main menu will be displayed on the right of
the screen. For more detailed information, refer to Section 3.1Menu Directory.
3.2.2 Menu page number
Each main menu includes certain submenu pages. When a main menu has multiple
submenu pages, the submenu page will include a “V” symbol to indicate to turn to the next
page, or a “∧” to the previous page. See Section 3.1Menu Directory.
3.2.3 Submenu items
Each submenu page has up to 5 submenu items, including the turning page symbols.
On the right of the system panel there are 5 ◄ keys pointing to 5 submenu items. If you
want to operate a certain submenu, press the ◄ submenu selection key corresponding to
it. The selected submenu will have a “◄” prompt, indicating that the submenu is selected.
For submenus with coarse adjustment and fine adjustment, press the same key
repeatedly to switch between coarse adjustment and fine adjustment, in wich the “*”
symbol indicates that it is fine adjustment.
On the right of the system panel, there are two upward and downward adjust keys ▲ and
▼, for changing the value or the function of the selected submenu. If it is a value, press ▲
14
to increase the value, and ▼ to decrease. Under fine adjustment state, keep pressing the
key, and the value will accelerate the value change.
3.2.4 Special function key
There are 7 function keys arranged on the left of the system panel, which include: gain
adjust keys ▼ ▲, Step, Cine, Copy, Zoom and Freeze. Each function key represents a
certain function (see Table 3.2), and the corresponding function will be executed by
pressing one of these keys.
Table 3.2
Key Name Function
Step Change the step of gain adjust
Cine Cine playback

Print pictures or reports, record reference points
Copy
(when making DAC curves)
Zoom in/out the waveform display area on the
Zoom
screen
Freeze Save (Freeze) screen display
Power Power on/off
3.2.5 Measurement data area
Below the waveform display area is the measurement data display area (see Fig. 3.1).
Fig. 3.1
From left to right and from up to down, the measurement data display area respectively
represents:
1st line: range start point, wave height Ha(%)within GateA, wave height △dB within GateA,
gate AL giving the current horn, range end point.
2nd line: Echo path Sa within GateA, echo flank distance Ra within GateA, echo vertical
depth Da within GateA, freeze prompt(*), peak test mode (P), DAC_ECHO recording (R),
15
dB_CORR in use(T), network communication prompt(！), battery power prompt.
Note:
(1) When MEAS_POINT is”flank”, if no echo signal beyond thresh (gate response threshold)
is within the gate, there is no value display for distance measurement, such as
amplitude and sound path, but display of “ * “ symbol, e.g. “ Ha* “.
(2) When MEAS_POINT is “peak”, within the test range covered by the gate, no matter the
echo signal is beyong thresh, the system will automatically measure and display the
distance measured values, such as maximum echo signal amplitude and sound path,
within the gate.
(3) You can select to display the above measured values at the top right of the waveform
display area (set up in the submenu S_DISP of the main menu Meas).
(4) In DAC_MODE state, the dB difference is the dB difference value between the echo
amplitude and the current measurement curve.
3.2.6 System poweroff
Keep pressing Power key on the system panel for 2 seconds. The screen will display
“Power Off......” and then the system is shut off normally.
If the system cannot be shut off normally by pressing Power key for two seconds, you can
also shut off the system forcibly by pressing Power key for 8 seconds. But the current
operating state is not saved in this situation.
3.3 Submenu Setup and Operation

For submenu setup and operation of the system, see Table 3.3.
16
Table 3.3
Main
Submenu Description
Menu
0.0～6000mm(steel longitudinal wave)
Coarse adjustment: 5, 10, 25, 50, 100, 200, 250, 300, 400,
500, 1000, 2000, 4000, 6000.

RANGE *
250mm Fine adjustment: 0~99.9, step 0.1mm.
100~999, step 1mm.
1000~6000, step 10mm.
1000～9999m/s
Coarse adjustment: 10 general material velocity values
preset: 1600, 2730, 3130, 3250, 4000,
5000, 5920, 6320, 7000, 9000.
Fine adjustment: step 1m/s.

MTL_VEL *
5920m/s
Note:
Basic If the material velocity is unknown, it can be measured
automatically with the system. See Section 4.2.2 “Auto
calibration of material velocity and probe delay”.
-10~1000 (steel longitudinal wave)
Coarse adjustment: -10, -5, 0, 5, 10, 25, 50, 100, 200, 250,
D_DELAY *
500, 800, 1000.
0.0mm
Fine adjustment: -10~99.9, step 0.1mm.
100~999, step 1mm.
0~199.99μs (min. step 0.01 μs for continuous adjust)
P_DELAY Note:
0.00μs If Probe Delay is unknown, it can be measured on the system.
See Section 4.2.2 “Auto calibration of material velocity and
probe delay”.
17
Main
Submenu Description
Menu
0.0~1000mm
SREF_1 *
500, 1000
50.0mm
Fine adjustment: 0~99.9, step 0.1mm.
100~999, step 1mm.
0.0~1000mm
SREF_2 *
Basic 500, 1000.
100.0mm
100~999, step 1mm.
When doing auto calibration, the recorded reference echo

CALIBRATE
number is displayed. See Section 4.2.2 “Auto
0
calibration of material velocity and probe delay”.
aSTART * See main menu Gate

35.0mm
Two steps “high”and “low” adjustable.
To adjust transmit pulse intensity, select “low” when higher

INTENSITY
high resolution is required, and select “high” when doing
inspection or penetration testing on large workpieces.
30Ω, 60Ω, 150Ω, 500Ω selectable.
TR Damping resistance is for adjusting probe damping (i.e.
changing probe ring), thus to change echo signal height,

DAMPING
width and resolution. If the setup value is higher, the echo
150Ω
height is higher and the width is wider; if the setup value is
smaller, the echo height is lower, the echo width is
narrower and the testing resolution is higher.
18
Main
Submenu Description
Menu
Single/Dual probe switch function
Pulse transmit-receive separate work mode.
DUAL When using a pulse reflection-type single probe, this

off function shall be set “off”. When using a penetration-type
or dual (TR) probe, it shall be set “on”; and D of the LED
on the left of the panel is on.
Ten steps are available: 1, 2, 3, 4, 5, 6, 7, 8, 9, 10.
Transmit pulse repetition frequency P.R.F means how
many times the transmit pulse is excited per second.
There are 10 steps of P.R.F for setup. To avoid false echo
in field testing, the bigger the workpiece, the P.R.F
required shall be smaller. If the P.R.F value is smaller, the

P.R.F
refresh rate of A-scan is lowered. Therefore, for fast
TR 6
scanning a higher PRF is required.
The best solution to confirm if the P.R.F setup is optimized
is to carry out a test: start from the highest step, with the
value decreases, till no more false echo appears and the
waveform is relatively clear. For general testing, the setup
is 6.
Two steps are available: 1~4MHz, 0.5~15MHz.

FREQUENCY
Based on the probe frequency, adjust the operating
1~ 4 MHz
frequency range of the system receive amplifier.
positive, negative, full, filtering and RF for selection.
RECTIFY Note:
full When the testing range is larger than 50mm, RF mode is
disabled.
19
Main
Submenu Description
Menu
0%～80%, step 1%.
To reject unexpected echo display, e.g. internal structure
noise or other noise from the tested object. The reject
value means the minimal amplitude % of echo displayable
on the screen. The noise lower than the reject height will
be eliminated, while the echo signal higher than the reject
height will be maintained.

REJECT
0%
Note:
The reject value shall not be higher than the minimal threshold
setup of any gate. Please be cautious when using REJECT
function, because this operation may reject echo signals from
the flaw. Many testing standard explicitly prohibits use of
REJECT function. R (Reject) indicator of the LED on the left of
TR the panel is on, indicating that REJECT function is in use.
-20～20
For fine adjustment of the current gain. There are 40 steps

FINE_G
for 4dB fine adjustment range. When adjusting FINE_G,
0
the current gain displayed on the top left of the waveform
display area does not change.
The echo height within the gate is adjusted to a configured

AUTO_G
off height automatically. The default height is 80%.
Suitable for the following situations:

A_JAMMING
1. Increase of S/N ratio at frequency 1~4MHz is required.
off
When cluttered disturbance echo occurs.
Display base gain in total gain

BASE_G
BASE_G value is in the range of 0 ~ 110dB, but belongs to
30.0dB
0 ≤ (BASE_G value + REF_G value) ≤ 110dB
20
Main
Submenu Description
Menu
Display reference gain in total gain
REF_G
REF_G value is in the range of -110 ~ 110dB, but belongs
0.0dB
TR to 0 ≤ (BASE_G value + REF_G value) ≤ 110dB
Automatic testing of probe echo frequency.

FRE_TEST
off See Section 4.2.4 “Testing of probe echo frequency”.
Probe refraction angle 0°~85°

ANGLE *
Coarse adjustment: 0, 35, 45, 60, 70, 80
0.0°
Fine adjustment: step 0.1°
Probe refraction angle tangent value 0~10
Coarse adjustment: 0.00, 1.00, 1.50, 2.00, 2.50, 3.00, 4.00
Fine adjustment: step 0.01

K_VALUE *
0.00
Note:
The angle is relevant to K_VALUE. If the angle is changed,
K_VALUE is changed accordingly.
Automatic measurement of probe refraction angle.

ANGLE_MEAS
Meas off See Section 4.2.5 “Angle measurement of angle probe”.
5~200mm, step 0.1mm.
When using the automatic measuring probe function, to

REF_DEPTH
acquire a precise probe angle, REF_DEPTH shall be set
40.0mm
up.
See Section 4.2.5 “Angle measurement of angle probe”.
0~100mm, step 0.1mm.
When using the function for automatic measurement of

APERTURE
probe angle, to acquire an accurate probe angle, the
Φ50.0mm
aperture of the reflection hole shall be set up.
See Section 4.2.4 “Angle measurement of angle probe”.
21
Main
Submenu Description
Menu
0~100mm, step 0.1.
X_VALUE
The distance between the angle probe front surface and
0.0 mm
the probe incidence point.
500, 1000.

THICKNESS *
25.0 mm 100~999, step 1mm.
For setting the workpiece vertical thickness of the test
surface when doing angle probe testing.
See Table 3.4.

S_DISP
off
Meas
When it is set “on”, the screen will record the maximal
values corresponding to all points in horizontal direction
within the display range, and display these points in white.

PEAK_VALUE
off When a higher echo appears, the maximal values of the
points at that position will be refreshed; otherwise they will
remain the same. If set “off”, PEAK_VALUE is cancelled.
When the menu is set “on”, it will record the current
waveform as a comparison waveform (including the

COMPARE
recalled store waveform), indicating in blue as a
off
differentiation, and to compare with the actual waveform. If
set “off”, COMPARE is cancelled.
22
Main
Submenu Description
Menu
When doing angle probe testing, if SEC_COLOR is set
“on”, the area within the second wave path range will be
displayed in a color different from that of the original
waveform. Thus it is differentiated from reflection waves of

SEC_COLOR
other path ranges, which is easy to be identified.
off
Note:
To display SEC_COLOR correctly, please set the probe angle
and the workpiece thickness properly in advance.
Echo measurement position within the gate
Flank: The first intersection of the gate and the echo.
Peak: the highest echo position within the gate.
When MEAS_POINT is “peak”, at the bottom right of the
MEAS_POINT measurement data display area it displays a symbol “P”

Meas peak
indicating the peak test mode, or a symbol “F” indicating
the flank test mode.
Note:
In DAC_MODE work mode, it should be set “peak”.
This function magnifies the echo area within the gate to

ENLARGE
the whole screen display, which is conducive to a fast and
off
close observation of certain echo area.
Automatic testing of system vertical linearity index. See

VDR
off Section 4.2.6 “Automatic Testing of System Index”.
SEN Automatic testing of system surplus sensitivity index. See

NOISE Automatic testing of system noise level index. See Section

off 4.2.6 “Automatic Testing of System Index”.
23
Main
Submenu Description
Menu
LINEARITY Automatic testing of system horizontal linearity index. See

Meas
aLOGIC is for selecting work mode and alarm logic of
GateA.
Three states are available for selection:
off Turn off Gate, i.e. to turn off alarm and
measurement function.
positive Incoming wave alarm, i.e. within the range
aLOGIC covered by GateA, if the echo is beyond the

positive preset thresh, the alarm light A is on. At that
time if Horn is set “on”, the horn gives out
sound alarm.
negative Lost wave alarm. i.e. within the range covered

Gate
by GateA, if the echo is below the preset thresh, the alarm
light A is on. At that time if Horn is set “on”, the horn gives
out sound alarm.
0~6000mm
250, 300, 400, 500, 1000, 2000, 4000,
6000
aSTART *
35.0mm Fine adjustment: 0~99.9, step 0.1mm；
100~999, step 1mm；
1000~6000, step 10mm
GateA flank position.
24
Main
Submenu Description
Menu
0.1~6000mm
250, 300, 400, 500, 1000, 2000,
4000,6000.
aWIDTH *
40.0mm fine adjustment: 0~99.9, step 0.1mm；
100~999, step 1mm；
1000~6000, step 10mm.

Gate
Distance from GateA flank position to back edge position.
10%~90%, step 1%.
aTHRESH, i.e. GateA response and measurement
threshold.
aTHRESH
40%
Note:
In RF mode, thresh adjust range: -90%~-10% and 10%~90%.
25
Main
Submenu Description
Menu
bLOGIC is for selecting work mode and alarm logic of
GateB.
Four states are available for selection:
off Turn off the gate, i.e. to turn off alarm and
measurement function.
positive Incoming wave alarm, i.e. within the range
covered by GateB, if the echo is beyond the
preset thresh, the alarm light A is on. At that
time if Horn is set “on”, the horn gives out
sound alarm.
bLOGIC
positive
negative Lost wave alarm. i.e. within the range covered
by GateB, if the echo is below the preset
thresh, the alarm light A is on. At that time if
Horn is set “on”, the horn gives out sound

Gate
alarm.
track Take the echo position within GateA as the start
point of GateB. If the echo position within
GateA changes, the start point of GateB
changes accordingly.
See Section 4.3.9 “Application of GateB track mode”.
0~6000mm
250, 300, 400, 500, 1000, 2000, 4000,
6000.
bSTART *
85.0mm Fine adjustment: 0~99.9, step 0.1mm.
100~999, step 1mm.
1000~6000, step 10mm.
GateB flank position.
26
Main
Submenu Description
Menu
0.1~6000mm
250, 300, 400, 500, 1000, 2000,
4000, 6000.
bWIDTH *
40.0mm fine adjustment: 0~99.9, step 0.1mm.
100~999, step 1mm.

Gate
1000~6000, step 10mm.
Distance from GateB flank position to back edge position.
10%~90%, step 1%.
GateB response and measurement threshold.

bTHRESH
30%
Note:
In RF mode, thresh adjust range: -90%~-10% and 10%~90%.
off Turn off DAC_MODE.
DAC_MODE on Activate DAC_MODE making function or display the

off completed DAC curves.
See Section4.2.3 “Making and application of DAC_MODE”
Display number of the current echo reference points (up to
10). If an echo reference point is recorded, an “R” is

DAC_ECHO
DAC displayed on the right of the data display line.
0
See Section4.2.3 “Making and application of
DAC_MODE”.
aSTART * See main menu Gate

35.0mm
Provide help on making DAC curves based on DAC cuve

DAC HELP
0 making steps.
27
Main
Submenu Description
Menu
At 0.5dB step, adjust freely within range -20dB~+12dB of
the DAC base line position. The default is 6dB above the
DAC base line position, i.e. DAC+6.0dB.
LINE_3 Note:
DAC+6.0dB From up to down, the three DAC lines are: LINE_3, LINE_2 and
LINE_1. Within a certain range positions of the three lines can
be adjusted freely, but the sequence of them does not change.
The DAC base line is a curve by connecting peaks of the
recorded reference point echoes.

DAC
At 0.5dB step, adjust freely in the range -20dB~+12dB of
the DAC base line position, which shall not be lower than
LINE_2
DAC+0.0dB LINE_1 or higher than LINE_3. The default is DAC+0.0dB
(i.e. the position of the base line).
At 0.5dB step, adjust freely in the range 0dB~-20dB below

LINE_1
the DAC base line position. The default is 6dB below the
DAC-6.0dB
DAC base line position, i.e. DAC-6.0dB.
To correct the echo reference points of the completed

DAC_CORR
DAC. Each reference point can be adjusted within the
off
range of 1~200 points.
28
Main
Submenu Description
Menu
-60 ~ +60dB, step 0.5dB
During the process of testing with DAC curves, to
compensate acoustic wave loss due to surface coupling,
you can select dB_CORR (sensitivity calibrate) function.
When dB_CORR is not equal to 0dB, a “T” symbol is
displayed on the right of the data display line. If surface
quality of the measured object is different from the
refernce block, it is necessary to do such calibration. In
actual situation, it would be better to find out the adjust

dB_CORR
0.0 dB value to compensate transmit loss through experiments.
Note:
When doing dB_CORR adjust, the echo amplitude chages
DAC accordingly, but the DAC curve remains the same. If you use
the gain adjust key at the top left of the panel, the echo
amplitude and the DAC curve change at the same time.
dB_CORR value is in the range of –60 to +60dB, but belongs to
0 ≤ (dB_CORR value + gain value at the top left ) ≤ 110
Select to highlight any line of LINE_1, LINE_2 or LINE_3.
At that moment, this line is regarded as the current

BOLD_LINE
measurement curve. Together with the testing area
Line1
selected with GateA, each measurement value is
calculated.
PFREQ 0.5～15MHz
2.5MHz The probe frequency in use when making AVG curves.
PDIA 1～50mm
20.0mm The probe diameter in use when making AVG curves.
29
Main
Menu Submenu Description
0～50mm
BASE The diameter of the reference flat bottom hole in use when
3.0mm making AVG curves. When it is set 0, it means that a big
flat bottm is used as the reference.
AVGL1 0.3～10mm
2.0mm The expected AVG curve for flat bottom hole equivalent.
AVGL2
The same as AVGL1.
3.0mm
AVGL3
The same as AVGL1.
4.0mm
DAC
0～50dB/mm
ATTEN
Attenuation factor of the actual tested workpiece, to be set
0.0dB/mm
up according to the special requirements.
-110～110dB
dB_CORR To compensate the difference when the echo amplitude of

0.0dB the reference test block or the workpiece does not comply
with the theoretical value.
AVG off/ record/ disp/ del

off AVG operation options.
Select data set SET_# in the range of 1 to 1000 circularly.
When storing, if the data set SET_# has a symbol in
front of it, it means that the data set is occupied and

SET_#
1 unmodifiable. You need to select a blank data set to save
the new record.

Mem
See Chapter 6 “ Operation and Management of Data Set”.
After recalling the data set, the system parameter is set at
the same setup state as when the data set was saved. The
RECALL
off saved A-scan waveform is displayed. The system is in
Freeze state.
30
Main
Submenu Description
Menu
The current system parameter setup, DAC curves and
A-scan waveform can be stored to a data set with a

STORE
off designated SET_#. The valid input of the test info table will
be stored to the saved data set.
DELETE is to delete data sets. The occupied data sets

DELETE
off have a symbol before their set numbers. If these data
sets are not needed any more, you can delete them.
Each data set can store a lot of additional remark
information, such as tested object info, flaw data,

TESTINFO
off operator’s code or evaluation annotation.
See Section 6.4 “Edit and Store of TESTINFO”.
With data set preview function, you can review A-scan

PREVIEW
figures of all stored data sets.
off
Mem See Section 6.5 “Preview of Data Set”.
The data set directory listing function enables an overview
of all data sets, and displays numbers and names of the
stored data sets. Each time 15 data sets are displayed in

DIRECTORY
off the list. Before the numbers with occupied data sets, a
symbol is marked.
See Section 6.6 “Directory of Data Sets”.
Delete all data sets.

DELETE_ALL
The function is the same as DELETE function, except that
off
it will delete all data sets at once.
U DISK Save the stored data sets to a USB disk. Select this
off submenu, and press ▲ to confirm.
current: Save the current selected SET_# data to usb disk

SAVE_OPT
current all: Save all stored data to usb disk
31
Main
Submenu Description
Menu
3/4
DAC_CLASS
Select to divide the waveform display area into 3 classes
3
or 4 classes with DAC curves (see Fig. 3.2 and Fig. 3.3).
on: The waveform is displayed in solid form.

FILLED
off off: The waveform is displayed in non-solid form.
Horn sound on/off. When HORN is set “on”, if an alarm

HORN
signal is within the gate, the horn will give out a sound
off
alarm.
Select print out format: “picture” or “report”. Press Copy
key on the system panel to print.
(1) “picture” format: the printer prints screen display only.
(2) “report” format: In addition to the screen display, the

Config
printer will print out all status-related parameters,
COPY_MODE
creating a report.
picture
Note:
When the first page of DAC main menu is selected, Copy key is
for assisting to draw DAC curves, but not for printing pictures
or reports. If printing is required, turn to other pages or other
main menu first.
Ten steps are available: 1~10.
Note:
BRIGHTNESS
The higher the brightness is, the higher power consumption is
5
required, which will shorten the battery continuous operation
time.
32
Main
Submenu Description
Menu
Chinese/ English
LANG.(语言)
English Set up the system language as Chinese or English.
mm / inch
UNIT
In Chinese menu, the measurement unit is mm; in English
mm
menu, either mm or inch can be selected.
DATE display format is “yyyy-mm-dd”,
e.g.”2007-02-01”refers to Feb 1, 2007.
Operation:
(1) Press the corresponding select key on the right of
DATE and highlight the value you want to change.

DATE
Press Up or Down adjust key on the right of the panel
2007-01-01
to change the highlighted value. Press the select key
on the right of DATE repeatedly and switch beween
Config Year, Month and Date.
(2) Shift the highlight cursor out till it disappears, and it will
exit DATE setup.
TIME display format is “hh:mm:ss”, e.g. “12:34:56” means
12 o’clock 34 minutes 56 seconds.
Operation:
(1) Press the corresponding select key on the right of
TIME and highlight the value you want to change.

TIME
Press Up or Down adjust key on the right of the panel
00: 00: 00
to change the highlighted value. Press the select key
on the right of TIME repeatedly to switch bewettn Hour,
Minute and Second.
(2) Shift the highlight cursor out till it disappears, and it will
exit TIME setup.
33
Main
Submenu Description
Menu
20%~80%, step 1%.
AUTOG_LV
80% Set up auto gain wave height.
Set up waveform display color on the screen.
The colors for selection are: White, LightBlue, Purple,

CLR_WAVE
Green DeepYellow, Green, OrangeRed, Yellow, Pink, LightGreen,
and RoyalBlue.
Set up screen background color.

CLR_BG
Config Black Black/White is optional.
Set up character display color on the screen.
The colors for selection are: White, LightBlue, Purple,

CLR_FONT
Green DeepYellow, Green, OrangeRed, Yellow, Pink, LightGreen,
RoyalBlue.
When it is set “on”, it prompts “Set default ?”. Press the

DEFAULT
adjust key ▲ on the right of the panel to confirm, or press
off
other key to cancel this operation.
3.4 Select Display of Measurement Data

At the top right of the waveform display area, the selected measurement data is displayed.
The meanings can be found in Table 3.4:
Table 3.4
Symbol Meaning Symbol Meaning

Echo sound path value Vertical distance between workpiece
Sa Da
within GateA surface and flaw echo within GateA
Echo sound path value Vertical distance between workpiece
Sb Db
within GateB surface and flaw echo within GateB
Projection distance from probe
Echo sound path difference
Sb-a Pa incidence point to flaw echo within
within GateA and GateB
GateA
Projection distance from probe
Ha% Echo height within GateA Pb incidence point to flaw echo within
GateB
34
Symbol Meaning Symbol Meaning
Projection distance from probe flank
Hb% Echo height within GateB Ra
to flaw echo within GateA
dB difference from echo
Projection distance from probe flank
Ha dB peak to thresh position Rb
to flaw echo within GateB
within GateA
dB difference from echo
Hb dB peak to thresh position Vel Material velocity
within GateB
Test range start point Prompt which gate gives out the
Rs Alarm
position on screen display current alarm signal
Test range end point Echo display subareas divided by
Re Class
position on screen display DAC curves
Test result on surplus Test result on vertical linearity/
SEN VDR
sensitivity dynamic range
Test result on horizontal
LIN NOISE Test result on noise level
linearity
Fre Probe echo frequency
Note:
(1) In the table above, echo sound path (or distance) measurement value within the gate
has direction relation with the setup of submenu MEAS_POINT. When MEAS_POINT is
at “peak”, the echo peak within the gate is the measurement point; When “flank” is
selected, the first intersected position of the echo within the gate and the gate is the
measurement point. Fre (probe echo frequency) displays the frequency only after
frequency test, which is not saved after system poweroff.
(2) VDR, SEN, NOISE and LIN are displayed only when the corresponding tests are
performed. They are not saved after the system is powered off.
3.5 Waveform Display Area of DAC_MODE

DAC curves divide the waveform display area into 3 or 4 subareas as shown in Fig. 3.2
and Fig. 3.3.
35
Fig. 3.2
Fig. 3.3
3.6 Operation of Other Special Function Keys
3.6.1 Gain decrease key ▼ / Gain increase key ▲
Echo amplitude (receive sensitivity) can be set up by using gain adjust key ▼ and ▲ at
top left of the panel. The current system gain dB value is displayed at top left corner of the
waveform display area.
36
These two keys are for shifting the edit cursor when doing edit and store of TESTINFO.
3.6.2 Gain step adjust key Step
Press gain step key to select gain adjust step, 4 steps are available: 0.5 dB, 2.0 dB, 6.0 dB
and 12.0 dB.
Operation:
Press Step key, to cycle select between 4 steps. The current step value is displayed below
the current gain on the sreen.
3.6.3 Cine key Cine
The dynamic test waveform and data for 8 seconds before pressing Cine key will be
played back at a low speed. The low speed cine period is 30 seconds.
Operation:
(1) Press Cine key to play back the cine, and the top right of the screen displays
“Playing…”. When the cine is finished, it displays “Finished”.
(2) Press Cine key again to complete the playback, and return to the normal mode.
(3) Connect a USB disk to the USB port. Set the submenu TO DISK at “on”, and the top
right of the screen displays “Saving...”. After the saving is finished, the submenu TO
DISK is set “off” automatically. If the system does not identify the USB device, “USB
disk not found” is displayed at the bottom of the screen. At least 10MB free memory
space in the USB disk is required when saving the cine.
3.6.4 Screen printout /record key Copy
After the printer is connected properly and getting ready, the current screen displayed
picture or report can be printed out by pressing Copy key. When making DAC curves, this
key is for recording reference echo points.
3.6.5 Display freeze key Freeze
Press Freeze key to freeze (store) the displayed image on the screen. In freeze mode, the
37
frozen echo signal displayed on the screen can be measured by shifting the gate.
Operation:
(1) To store or freeze the current displayed figure, press Freeze key.
(2) Press Freeze key again to release the freeze state and return to the normal mode.
3.6.6 Echo display zoom key Zoom
Press Zoom key, the waveform display area will be expanded to full screen display (zoom
display mode), enabling easy view of echoes and measurement values. At that time, the
submenu display is cancelled. To return to the normal display mode, press Zoom key
again.
In zoom display mode, except that gain adjust keys ▼ and ▲, Step key, Copy key and
Freeze key can be adjusted, all the other functions are locked in their setup and disabled.
It is useful for avoiding misoperation during field testing.
38
Chapter 4 Testing Application
4.1 System Calibration Method and Procedures

Before testing with the CTS-4020E, calibration is required: based on material and size of
the workpiece to be tested and relevant standards, select the appropriate testing method
and the probe, set up system parameters such as material velocity, test range and
operating frequency as well as probe parameters, and calibrate probe delay. For general
testing application, refer to the steps in Section 4.1.1 ~ 4.1.7 to set up system state and
parameters.
4.1.1 Probe parameter setup
(1) First, determine the testing method and select the proper probe according to the
industry standard or field requirement.
(2) Set up the angle value (probe refraction angle) in ANGLE of the main menu Meas.
For the normal probe, the angle value is set at “0”.
(3) When using dual probe (one for transmit, and one for receive) work mode, DUAL in
the TR menu shall be set at “on”.
(4) When testing with an angle probe, the position of the probe incidence point shall be
measured in advance. Then set up the flank length value of the probe in X_VALUE,
Page 2 the main menu Meas. In this way, the Ra value in the measured data display
line is the horizontal distance from the probe flank to the flaw postion. If X_VALUE is
“0”, Ra is the horizontal distance from the probe incidence point to the flaw position.
When testing with an angle probe, see Fig. 4.1 for relevant parameter relations.
39
Fig. 4.1
 X_VALUE: distance between the probe front surface to the probe incidence point
(where the sound goes out).
 Sa: Rectilinear propogation distance of sound wave from the probe incidence
point to the flaw position.
 Pa (projection distance): Projection distance from the probe incidence point to the
flaw position.
 Da (vertical depth): Vertical distance between the testing surface and the flaw
position.
 Ra (deducted by horizontal distance of X_VALUE): Projection distance from probe
flank to the flaw position.
The relation is shown as the equation:
Ra= Pa - X_VALUE
If X_VALUE is not set up (i.e. set at 0), then:
Ra= Pa
Note:
When the measured gate is GateB, the situation is similar to GateA. Select any item from Sb, Pb,
Db or Rb in S_DISP submenu to display it at the top right of the waveform display area.
40
4.1.2 Parameter setup for workpieces
Set up MTL_VEL value based on the known workpiece material and the testing method
adopted (longitudinal wave, transversal wave or other methods). If the material velocity is
unknown, it can be measured according to the standard test block thickness of such
material. See Section 4.2.1 “Measurement of material velocity” for the method.
Note:
(1) Ensure proper setup of MTL_VEL, because the CTS-4020E will calculate all range and
distance values based on the set material velocity.
(2) When testing with an angle probe, to locate the flaw vertical depth Da properly, please
the workpiece thickness setup is required. Because when using the second wave to
test, if the workpiece thickness is not considered, it may lead to an error result of the
vertical depth Da being larger than the actual workpiece thickness.
4.1.3 Other important parameter setup
(1) RANGE shall be confirmed as per the workpiece to be tested or the testing
requirement. Usually the test range shall cover the workpiece thickness or the echo
area to be examined, and a certain surplus shall be maintained. For example, for a
workpiece thickness of 20mm, RANGE can be set at 25mm. To view the second wave,
RANGE shall be increased.
(2) To increase test resolution, DAMPING can be set at a low value, but the test
sensitivity will be decreased at that time. For general measurement of thin workpieces
and if high resolution is required, set DAMPING at a lower value.
(3) To test large workpieces or coarse-crystal material, set INTENSITY at “high”, so as to
increase test sensitivity.
(4) Usually PRF is set at “6”.
(5) Determine FREQUENCY setup based on the rated frequency of the selected probe.
For a 2.5MHz probe, the testing sensitivity for the step “1～4MHz” is the highest
among the available 2-step operating frequency range.
(6) For situations of thin-plate testing or high test resolution is required, select
41
“positive” or “negative” in RECTIFY.
(7) Generally, REJECT is set at “0”.
4.1.4 Gate setup
(1) Firstly determine GATE_MODE. For reflection testing, usually single gate incoming
horn is (i.e. GATE_MODE is “positive”) adopted; for measuring distance between
echoes or thickness, use dual gate mode.
(2) Select gate measurement point from “peak” or “flank”.
(3) Adjust gate start, width and thresh to make the gate cover the tested area. It can also
be adjusted during testing process.
4.1.5 Calibrate P_DELAY
4.1.5.1 Zero calibration of normal probe or angle probe
Calibration process:
(1) Set up the known material velocity in MTL_VEL (main menu Basic). If the material
velocity is unknown, measure the material velocity first (see Section 4.2.1
“Measurement of material velocity”).
(2) Place the probe on the calibration test block. Ensure good coupling.
(3) Set up the required display range in RANGE (main menu Basic). The calibrated echo
shall be displayed on the screen.
(4) Hitch GateA to any calibration echo, enabling the measurement data line to display
echo sound path Sa. Then adjust submenu P_DELAY (in main menu Basic) till Sa in
the measurement data line displays the correct sound path value of the selected
calibration echo.
Example:
Zero calibration with a normal probe (5C10N) on a keeping-flat #1 standard test block
(thickness 25mm), with RANGE of 50mm steel longitudinal wave.
42
Operation:
(1) Set RANGE at “50mm”. Set MTL_VEL at “5920m/s”. See Fig. 4.2.
(2) Place the normal probe on the test surface of a 25mm thickness test block.
Ensure that the coupling is good.
(3) Set aLOGIC at “positive”, RECTIFY at “negative”, and S_DISP at “Sa”. Move the
probe and adjust the gain the find the highest wave. Then hitch GateA to the first
echo.
(4) Read the sound path from the top right of the waveform display area or the
measurement data line. If the value is not equal to 25.0mm, adjust the value of
submenu P_DELAY till it equals to 25.0mm. See Fig. 4.3.
In this way, the coordinated calibration of the CTS-4020E and the configured probe is
finished, with MTL VEL 5920m/s, calibration range 50mm, P_DELAY 0.27μs.
Fig. 4.2
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Fig. 4.3
4.1.5.2 Zero calibration of dual probe
The dual (TR) probes are especially suitable for wall thickness measurement. When using
such probes, the following characteristics should be considered:
Crystal inclination
The crystal of most dual (TR) probes has an inclination (the transducer crystal inclines to
the testing surface), which may result in a waveform transform after the beam incidence
(waveform entering the material) and the bottom reflection. Such transform may lead to
complicated echoes.
V-Path Error
For dual (TR) probes, the sound wave transmits from a transmit component, and reflects
to the receive component when it reaches the back wall of the workpiece. A V-shape
sound path is produced during this process. The “V-path error” will affect measurement
precision. Therefore, it is necessary to select two wall thickness values from the
measurement range that covers the expected wall thickness for calibration. In this way,
The V-path error could be calibrated to the maximal extent.
To Increase Material Velocity
Due to V-Path error, the material velocity being set during calibration should be higher
than the actual velocity of the tested material, especially when the thickness is very small.
44
This is the typical method that a dual transducer is used to compensate V-Path error.
Due to thin wall thickness, the above effect will lead to echo amplitude decrease, which
shall be noted particularly when wall thickness is less than 2mm.
As for trapezoidal reference blocks for calibration, there are different thicknesses for
selection. To obtain a good measurement linearity within the range of covered estimate
thickness reading, select a few thicknesses from the range of minimal to maximal
thickness as the thicknesses of calibration blocks, and conduct multiple measurement
calibrations to ensure the measurement precision.
Calibration Process:
(1) As for dual probes, it is recommended to use dual gate method to calibrate.
(2) Set submenu DUAL (main menu TR) at “on”.
(3) Determine menu setups of RANGE, TR and Meas based on the probe in use and the
current testing.
(4) Set submenu MEAS_POINT (main menu Meas) at “flank”.
(5) Couple the probe on the calibration block. Adjust submenu P_DELAY value (main
menu Basic) till the calibration echo is around the required position, and the second
echo is still within the display range.
(6) Change gain till the highest echo is about the height of full screen.
(7) Set aLOGIC and bLOGIC at positive, submenu S_DISP at Sb-a (i.e. The echo
sound path difference within GateA and GateB is displayed at top right of the
waveform display area).
(8) Adjust Gate to make it cover the first two echoes reflected from the calibration
position. Adjust the threshold value to enable it intersects with the same position of
the two calibration echo flanks.
(9) Then change MTL_VEL (main menu Basic) till Sb-a displays the correct
measurement value of that calibration position.
(10) Set GateB at off, and adjust GateA threshold to the required height, so as to measure
the sound path of the echo flank.
(11) Adjust P_DELAY till the measurement value of the first echo flank displays the
45
correct distance.
(12) If necessary, calibrate with one or more known thicknesses of the ladder-type test
block.
Note:
(1) When doing high precision measurement with the dual normal probe, the impact of
crystal inclination shall be considered. At that moment, you can consider the dual
normal probe as a small-angle angle probe.
(2) When submenu MEAS_POINT is set at “flank”, the measurement value is determined by
the intersection of the gate and the echo flank. Therefore, it is very important to set up
the echo height and the gate threshold properly for precision of calibration and
measurement. If a dual probe is in use, it is not likely to use “peak” mode for calibration
and measurement, because the echo is usually very wide and irregular, which makes it
uneasy to find a clear echo peak in this situation. During testing application before and
after calibration, the selection of measurement points should be consistent; otherwise
it may result in measurement error.
4.1.6 Testing sensitivity calibration
The sensitivity adjust is usually processed on a test block. The actual testing sensitivity is
determined by the requirements of the tested workpieces, the specific customers or the
industry standards.
4.1.7 Store of calibrated parameter state
The calibrated system parameter state can be saved as a record (data set), and recalled
for direct use if required.
Operation:
(1) Go to Mem menu, select a vacant set number in SET_#.
(2) Set STORE at “on”, and the system parameter state will be saved.
(3) When recalling, set RECALL at “on”.
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4.2 Other Application and Operation
4.2.1 Measurement of material velocity
(1) Set up the approximate material velocity estimate value in MTL_VEL (main menu
Basic).
(2) Set aLOGIC and bLOGIC at positive, S_DISP in menu Meas at Sb-a, and the sound
path difference Sb-a between the two echoes within the two gates is displayed at top
right of the waveform display area for easy reading.
(3) Couple the probe on the known calibration position on the calibration block. Adjust
aTHRESH properly to hitch GateA to the first echo.
(4) Adjust bSTART. Adjust THRESH properly to hitch GateB to the second echo.
(5) Increase or decrease the value of MTL_VEL, till the measurement value Sb-a for the
distance between the two echoes complies with the known sound path distance of the
calibration block, thus the unknown material velocity can be determined.
Example:
(1) Set up the possible MTL_VEL at 5920m/s as shown in Fig. 4.4.
Fig. 4.4
(2) Set aLOGIC and bLOGIC at positive, with the two gates opened.
(3) Couple the probe to 50mm position on the calibration block, and hitch GateA to
the first echo, as shown in Fig. 4.5.
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Fig. 4.5
(4) Hitch GateB to the second echo, as shown in Fig. 4.6.
Fig. 4.6
(5) Select Meas, adjust S_DISP, and have sound path difference Sb-a displayed at
top right of A-scan, as shown in Fig. 4.7.
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Fig. 4.7
(6) Change the value of submenu MTL_VEL, till the measured sound path difference
Sb-a is 50.0mm.
Fig. 4.8
(7) Complete the above items and the material velocity is confirmed. To precisely
measure the material velocity, measure on different positions on the test block.
Select the value that repeats a few times or the mid value as the final result.
4.2.2 Auto calibration of material velocity and probe delay
Use CALIBRATE function in menu Basic, and the material velocity and probe delay value
can be calibrated automatically. Before calibration, SREF1and SREF2 (menu Basic) shall
be set up.
Operation:
49
(1) Set up SREF1/2 as the sound path value of the two reflection echoes with known
distances.
(2) Set aLOGIC (menu Gate) at “positive”, and adjust aSTART (menu Basic) to hitch
the first calibration reflection echo. The echo amplitude shall not exceed the screen
vertical full scale. Press ◄ key on the right of the panel and select CALIBRATE.
Then press ▲ key, and the value of submenu CALIBRATE is changed from “0” to “1”,
as shown in Fig. 4.9.
Fig. 4.9
(3) Readjust aSTART (menu Basic) and adjust wave height properly to have it hitch the
second calibration reflection echo. Press ◄ key on the right of the panel to select
CALIBRATE, then press ▲ key. The value of submenu CALIBRATE is changed from
“1” to “0”. The auto calibration is thus completed, as shown in Fig. 4.10.
Fig. 4.10
50
(4) After the screen is refreshed, the corrected sound velocity, P_DELAY and Sa are
displayed.
4.2.3 Making and application of DAC_MODE
4.2.3.1 Making of DAC curve
(1) Set DAC_MODE in DAC main menu at “DAC”, and dB_CORR at “0dB”.
(2) Couple the probe on a reference block, enabling the first reference echo to the
highest point, and adjust it to about 80% of the screen height.
(3) Press the corresponding ◄ key on the right of aSTART, and press ▲ key to adjust
aSTART to hitch the gate to the echo.
(4) Press Copy key, and the first section of the DAC curve is displayed on the screen. The
value of DAC_ECHO is set at “1” automatically, and on the right of the data display
line, an “R” symbol is displayed as shown in Fig. 4.11 (in the figure, the multiple
echoes of a BH-50 standard echo probe are used to simulate the making of DAC
curves).
Fig. 4.11
(5) Move the probe to bring the highest point of the next reference echo to 80% of the
screen full scale (for easy observation, you can adjust the sensitivity to bring the
highest wave of the echo at 80% of screen height when recording each reference
point. Thanks to the smart design the CTS-4020E, the marking result of DAC curves is
not affected by changing the gain during the making process. Repeat the above
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record steps. Every time it is recorded, the value of submenu DAC_ECHO is
increased by 1 automatically, and the DAC curves are displayed section by section.
(6) During the record process, if there is any issue with the latest recorded reference point,
select DAC_ECHO submenu, then press the upward adjust key ▲. It prompts “Delete
echo?” Then repress the upward adjust key ▲ to confirm, and that point is deleted.
When all the reference points are recorded, press the corresponding select key on the
right of DAC_MODE to switch between DAC curves and TCG curves, or close DAC
curves and TCG curves. The closing of DAC curves will not delete DAC echo
reference points. Reset DAC_MODE at “DAC”, and the curves are displayed again.
Note:
During the making process, the recorded reference points are modifiable. See Section 4.2.3.4
“Correct DAC echo reference point”.
4.2.3.2 Insert DAC_ECHO reference point
During the making of DAC curves, echo reference points can be inserted.
Operation:
(1) As shown in Fig. 4.12 (the multiple echoes of the BH-50 standard echo probe are
used for simulation), three echo reference points are made by using the 1st, 2nd and
4th echoes.
Fig. 4.12
(2) Hitch GateA to the 3rd echo and adjust the wave height to about 80%, is as shown in
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Fig. 4.13.
Fig. 4.13
(3) Press Copy key to insert a DAC echo reference point. The completed DAC curve is
as shown in Fig. 4.14.
Fig. 4.14
Note:
(1) Simulate with multiple echoes of the BH-50 standard echo probe. See Fig. 4.15 for the
DAC curves after 5 reference points are recorded. Before making DAC curves,
parameters should be set up (such as setting MEAS_POINT at “peak”) and P_DELAY be
calibrated. See Seciton 4.1 “System Calibration Method and Procedures”.
(2) When making DAC curves, up to 10 echo reference points can be recorded. The more
reference points are recorded, the more precise DAC will be. If the number in DAC
echo does not increase, it means that the curve points may not be recorded. At that
53
time, the position of the gate and the height of the reference echo should be checked,
and the record operation be repeated.
Fig. 4.15
4.2.3.3 Echo evaluation with DAC
To evaluate defects in DAC format, the following condition requirements shall be met first:
(1) Distance amplitude curves (i.e. DAC curves) shall be made in advance.
(2) One group of DAC curves is only available for the probe used for making such curve.
Even for different probes of the same model, they cannot share the same group of
DAC curves. If being used in a special case, pre-validation is required.
(3) For testing material equivalent to that of the reference block only.
(4) For all functions that affect echo amplitude, their setups shall be the same as those
setups when recording the curves, especially the following functions: DAMPING,
INTENSITY, FREQUENCY, RECTIFY, MTL_VEL and REJECT.
(5) MEAS_POINT shall be set at “peak”.
4.2.3.4 Correct DAC echo reference point
During the making of DAC curves, the amplitude of echo reference points can be
modified.
Operation:
(1) As shown in Fig. 4.16 (the multiple echoes of the BH-50 standard echo probe are
used for simulation), four echo reference points are made by using the 1st, 2nd, 3rd and
4th echoes.
54
Fig. 4.16
(2) As shown in Fig. 4.17 and Fig. 4.18, turn to page 3 of DAC menu and select
DAC_CORR menu. The left refers to reference point serial number (“serial number”);
the right refers to corresponding reference point amplitude (“amplitude”) to the serial
numbers on the left. Repeatedly press the corresponding select key ◄ on the right of
DAC_CORR, and switch between the serial number and the amplitude; the character
in gray (“gray character”) means that the current selected and controlled is the serial
number or the amplitude; when the serial number turns gray, press the upward key ▲
or the downward ▼ key to increase or decrease the serial number; when the
amplitude is in gray characters, press the upward key ▲ or the downward key ▼ to
increase or decrease the amplitude (range between 1~200, with an step of 1).
Fig. 4.17
55
Fig. 4.18
(3) As shown in Fig. 4.19, select the serial number of the reference point to be corrected,
then select the control amplitude. Press the upward ▲ or downward ▼ key to
increase or decrease the amplitude displayed. At that time the DAC curves in the
waveform area changes accordingly (e.g. as shown in Fig. 4.19, select the serial
number for reference point 3, then press the upward key to adjust the amplitude to a
number over 50 for the DAC curve).
Fig. 4.19
4.2.4 Testing of probe echo frequency
FRE_TEST submenu in TR main menu has the function for automatic testing of probe
56
echo frequency.
Operation:
(1) Set INTENSITY at “low”, DAMPING at “30”, RECTIFY at “RF”, FREQUENCY at
“0.5~15MHz”, and RANGE at “10~25mm”. Couple the probe to a proper test block.
(2) Adjust D_DELAY and RANGE to find the first reflection echo. Adjust gain to bring the
echo amplitude around 80％.
(3) Adjust GateA to hitch the reflection echo.
(4) Set FRE_TEST submenu at “on”, on the upper screen it will display the tested probe
echo frequency value. As shown in Fig. 4.20, it is the test result of a 2.5Z10X10A60
probe.
Fig. 4.20
Note: When doing testing, Sa shall be bigger than two times of probe near-field length, and the
echo shall not be severely deformed.
4.2.5 Angle measurement of angle probe
ANGLE_MEAS submenu in Meas main menu has the function for automatic testing of
angle-probe angle.
Operation:
(1) Calibrate P_DELAY and MTL_VEL.
(2) Set up the known depth of the reflection hole in vertical direction in REF_DEPTH
submenu.
57
(3) Set up aperture of reflection hole in APERTURE submenu.
(4) Hitch GateA to the first reflection echo. Move the probe to bring the echo to the
maximum amplitude, with the wave height adjusted to around 80%.
(5) Set ANGLE_MEAS at “on”. At that time ANGLE menu displayed the measured
angle value, and the screen bottom prompts “Refresh or not?”, as shown in Fig.
4.21.
Fig. 4.21
(6) Press the upward key ▲ on the right of the panel to confirm, as shown in Fig. 4.22.
Fig. 4.22
Note: When doing testing, Sa shall be bigger than two times of probe near-field length.
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4.2.6 Automatic testing of system index
4.2.6.1 Vertical linearity
Operation:
(1) Set an appropriate frequency in FREQUENCY (main menu TR) based on the
probe in use.
(2) Adjust GateA to hitch the echo of the flat-bottom hole being measured.
(3) Ajust the gain value to enable the echo amplitude between 20%~100% when the gain
value is >34dB.
(4) Set VDR (main menu Meas) at “on“, and the test result will be displayed at top right of
the waveform area.
4.2.6.2 Surplus sensitivity
Operation:
(1) Set RANGE (main menu Basic) at ”250”, MTL_VEL (main menu Basic) at ”5920m/s”,
INTENSITY (main menu TR) at high, DAMPING (main menu TR) at “500“,
FREQUENCY (main menu TR) at ”1~4MHz”, RECTIFY (main menu TR) at “full“,
REJECT (main menu TR) at “0“, and FINE_G (main menu TR) at “0“.
(2) Enable the echo peak amplitude of the 200mm Φ2 flat-bottom hole at 50%.
(3) Unplug the probe cable from the system probe socket.
(4) Set SEN (main menu Meas) at “on“, and the test result will be displayed at top right of
the waveform area.
4.2.6.3 Noise level
Operation:
Ensure that NOISE is set at “on“ when no probe cable is connected to the probe socket.
The test result will be displayed at top right of the waveform area.
4.2.6.4 Horizontal linearity
Operation:
Connect the system with a BH-50 echo probe. Set LINEARITY (main menu Meas) at “on“,
59
and the test result will be displayed at top right of the waveform area.
Note: After the testing, the system is restored automatically to the operation state it was before
doing the testing.
4.3 Tips for System Application

When using the system to do testing, it is necessary to optimize the powerful functions on
the system to ensure testing precision and increase efficiency. Here is an explanation to
flexible applications of some important functions on the system.
4.3.1 Flexible application of gate
(1) By adjusting aSTART, aWIDTH and aTHRESH, hitch GateA to the echo signal to be
measured. On the measurement data display line, measurement values such as the
echo amplitude Ha and the sound path Sa within the gate are read out directly.
(2) By setting gate method, GateA and GateB can be set as incoming wave alarm or lost
wave alarm gate.
(3) By using dual gate function, thickness of different material layers is measurable. The
sound path difference of the dual gate is displayed at top right of the waveform area
(when S_DISP is set at “Sb-a”).
(4) GateB can be set as a track gate mode relative to GateA.
4.3.2 Make full use of text prompts during operation
During operating the system, when a misoperation occurs or a confirmation for any
operation is required, a text prompt message will be displayed at the screen bottom (in
normal display mode). The user can determine the reason of the misoperation or confirm
whether to continue the operation through the prompts. For example:
(1) When it prompts “ Mtl_Vel is blocked by Freeze”, it means that the current system is
in freeze display, and no material velocity adjust is applicable. After the freeze state is
released, this prompt is not displayed when adjusting material velocity.
(2) Press the corresponding ◄ key to submenu DELETE to send deletion command. At
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that time, it prompts “Delete dataset?”. If the user confirms to delete the data set,
press ▲ key to confirm, and the system will execute the deletion command.
4.3.3 Store and recall of system state and testing parameter
The internal large memory of the system can store up to 1000 groups of system test state
data sets (with info storage such as echo graphs, DAC curves and comments). Therefore
system test state data and DAC curves of calibrated probes for different applications or
specific to workpieces can be saved to records (datasets). Before testing, the
corresponding saved records can be recalled. After releasing freeze state, testing is
available immediately. Thus switch between different test states (testing parameters) is
very fast, which allows easy management and less complicated calibration on the system.
4.3.4 Increase anti-interference by operating with battery
When the AC power grid receives strong interference, please use battery for power supply.
The supply from battery effectively cuts off inteference signals from AC power grid, while
other external interference signals will not easily affect the system.
4.3.5 Switch of display mode
In normal display mode, press Zoom key, and the echo display will be enlarged to full
screen. At that time the main menu display is canceled. In such mode, except that gain is
adjustable through the upper left buttons on the panel, other functional settings are locked
against operation, which is useful to avoid misoperation in field testing. To return to the
normal mode, repress Zoom key. During system calibration adjust or accessing records,
the system shall be in normal display mode; After the system is calibrated, you can switch
to zoom display mode for easy view of echoes when doing testing.
4.3.6 Select display of testing data
By using the function S_DISP (main menu Meas), the selected measurement value can
be displayed at top right of the waveform display area. It is convenient for monitoring the
61
value change.
4.3.7 Record comments during testing process
During testing process, the old practice is to bring paper and a pen for recording
comments and test results relevant to test condition or workpiece status. Now TESTINFO
submenu (main menu Mem) on the system allows the user to input and save the
comments and the test results to data sets, which is the most important for ensuring safety
in upper-air operation.
4.3.8 Application of PEAK_VALUE function
When such function is enabled, the screen will record the maximum values corresponding
to all points in horizontal direction within the display range, and display these points in
white. When higher echoes appear, the corresponding maximums of those positions are
refreshed, or remain unchanged. This application is mainly used for positioning in
angle-probe testing and display of echo envelope.
4.3.9 Application of GateB track mode
When the system is used for immersion testing, if bLOGIC is set at “track”, by hitching
GateA to the boundary surface wave, the calculation position of bSTART is no longer to
display zero, but boundary surface wave. The defect depth within GateB is read out
directly from Sb-a.
When bLOGIC is set at “track”, the GateB position (start point) on screen display will
change. At that time the echo position within GateA is used as the start point for GateB. In
this way, if the echo position within GateA changes, the start point of GateB changes
accordingly. In immersion testing, if bSTART and gate width are set at proper values (such
as covering workpiece scan area), GateB will track the boundary surface wave position of
that workpiece within GateA, without being influenced by depth of water. Only if the
workpiece boundary surface wave is within GateA and beyond its threshold, direct flaw
positioning is available by monitoring the echo signals within GateB and the “Sb-a”
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measurement value.
In the following example, before and after using GateB track function are shown in Fig.
4.23 and Fig. 4.24.
In Fig. 4.23, bLOGIC is set at “positive”, bSTART (30mm) starting from display range
zero position.
In Fig. 4.24, bLOGIC is set at “track”, bSTART (30mm) starting from the echo postion
within GateA, while proper values of bSTART and bWIDTH can be set up based on the
actual depth range in the workpiece to be scanned.
Fig. 4.23
Fig. 4.24
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Chapter 5 Examples of Test Application
5.1 Application Example of JB4730-2005 Standard

Use the CTS-4020E flaw detector with a 2.5Z10×10K2 probe, as per JB4730-2005
standard, to test on the welding line of a 20mm-thick steel plate. The operating procedure
is usually as follows:
5.1.1 Initial setup of system parameters
(1) RANGE=“200mm”, MTL_VEL=“3230m/s”, D_DELAY=“0”
(2) DAMPING=“150Ω”, INTENSITY=“low”, DUAL=“off”, P.R.F=“6”
(3) REJECT=“0%”, FREQUENCY=“1～4MHz”, RECTIFY＝”full”
(4) aLOGIC=“positive”, aWIDTH=“15mm”, aTHRESH=“20%”
(5) MEAS_POINT=“peak”, S_DISP=“Sa”
When calibrating probe parameters and making DAC curves, THICKNESS can be set
at “100mm”. In actual testing, set up based on thickness of the measured workpiece. In
this test example, THICKNESS=“20mm”.
5.1.2 Testing of probe parameter
By using CSK-IA and CSK-IIIA test blocks, test as per the following steps:
(1) Measure X_VALUE and P_DELAY: use the probe to scan CSK-IA test block R100.
Find the highest point of the echo. Hitch GateA to that echo. Adjust P_DELAY value
to bring Sa value at the top right of the screen to 100.0. At that time, the distance from
the incidence point to the front of probe housing is X_VALUE. P_DELAY is the
time of plexiglass sound path from the probe crystal to the incidence point.
(2) Measure probe ANGLE (or K_VALUE): input 30mm in REF_DEPTH field. Use the
measured probe to scan aΦ1×6 hole at the depth of 30mm on the CSK-IIIA test block.
Find the highest point of the echo and hitch GateA to that echo. Set ANGLE_MEAS
65
at “on”. The measurement result is displayed in ANGLE and K_VALUE fields. It
prompts “Refresh or not?”. Press the upward adjust key ▲ to confirm refreshing
ANGLE and K_VALUE. After testing, verify on a Φ1 hole at the depth of 20mm.
5.1.3 Make DAC curves
Operation:
(1) MEAS_POINT=“peak”, DAC_MODE=“DAC”, and start to make the curves.
(2) Use the measured probe to scan a Φ1 hole at the depth of 10mm on the CSK-IIIA test
block. Find the highest point of the echo and hitch the to that echo. Adjust the echo
height to around 80%. Select DAC_ECHO field. Press Copy key, bring
DAC_ECHO=“1”. Now the first echo reference point is recorded and the first curve
section is drawn.
(3) Repeat step (2), and record the echoes of the holes from shallow to deep depth at
20mm, 30mm and 40mm. When the reference echo amplitude at a deeper distance is
less than 20% of screen display amplitude, increase the system sensitivity (gain value)
to increase echo amplitude, enabling easy record of that echo reference point.
(4) After completing DAC_ECHO operation and recording the required echo reference
points, a group of DAC curves are completed. As per JB4730-2005 standard, the
sensitivity of LINE_1, LINE_2 and LINE_3 are: Φ1×6-9dB, Φ1×6-3dB, Φ1×6+5dB.
Therefore the menu items LINE_1, LINE_2, LINE_3 are set at: “DAC-9dB”,
“DAC-3dB”, and “DAC+5dB”. In addition, the workpiece surface compensation is
normally 4dB, dB_CORR shall be set at “+4dB”, and BOLD_LINE at “LINE_2”.
(5) Save the current system state setup and DAC curves in a blank data set. Record the
SET_# of that curve.
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5.1.4 Application of gate quantification and positioning
In field testing, recall the made DAC curves from SET_#, set S_DISP at “HadB”. When a
suspected echo is within the DAC curve measurement range, hitch GateA to that echo. If
the number displayed at top right of the screen is “+5.5”, the number refers to the DB
difference of the echo peak within the gate and the currently selected curve (“LINE_2”).
“+” means higher, and “-” means lower. Thus the echo equivalent value shall
be:Φ1×6-3dB+5.5dB=Φ1×6+2.5dB, which belongs to Class II flaw. When the flaw is
quantified, it is not required to adjust GAIN key and dB_CORR.
The relevant data of the flaw is displayed below the waveform: wave height %, vertical
distance, horizontal distance and sound path, etc. By shifting gate start, flaws can be
quantified and positioned.
5.2 Application Example of GB/T11345-1989 Standard

Use the CTS-4020E flaw detector with a 2.5Z10×10K2 probe, as per Class B of
GB/T11345-1989 standard, to test on the welding line of a 20mm-thick steel plate. This
method is also applicable to general welding line testing. The operating procedure is
usually as follows:
5.2.1 Initial setup of system parameters
(1) RANGE=“200mm”, MTL_VEL=“3230m/s”, D_DELAY=“0”
(2) DAMPING=“150Ω”, INTENSITY=“low”, DUAL=“off”, P.R.F=“6”
(3) REJECT=“0”, FREQUENCY=“1～4MHz”, RECTIFY＝”full”
(4) aLOGIC=“positive”, aWIDTH=“15mm”, aTHRESH=“20%”
(5) MEAS_POINT=“peak”, S_DISP=“Sa”
When calibrating probe parameters and making DAC curves, THICKNESS can be set at
“100mm”. In actual testing, set up based on thickness of the measured workpiece. In this
test example, THICKNESS=“20mm”.

67
5.2.2 Probe parameter testing
By using CSK-IA and RB-3 test blocks, test as per the following steps:
(1) Measure X_VALUE and P_DELAY: use the probe to scan CSK-IA test block R100.
Find the highest point of the echo. Hitch GateA to that echo. Adjust P_DELAY value
to bring Sa value at the top right of the screen to 100.0. At that time, the distance
from the incidence point to the front of probe housing is X_VALUE. P_DELAY is
the time of plexiglass sound path from the probe crystal to the incidence point.
(2) Measure probe ANGLE (or K_VALUE): input “30mm” in REF_DEPTH field. Use the
measured probe to scan aΦ3 hole at the depth of 30mm on the RB-3 test block. Find
the highest point of the echo and hitch GateA to that echo. Set ANGLE_MEAS at
“on”. The measurement result is displayed in ANGLE and K_VALUE fields. It
prompts “ Refresh or not?”. Press the upward adjust key ▲ to confirm the
refreshed ANGLE and K_VALUE. After testing, verify on a Φ3 hole at the depth of
20mm.
5.2.3 Make DAC curves
Operation:
(1) Set MEAS_POINT=“peak”, DAC_MODE=“DAC”, and start to make the curves.
(2) Use the measured probe to scan a Φ3 hole at the depth of 10mm on the RB-3 test
block. Find the highest point of the echo and hitch GateA to that echo. Adjust the echo
height to around 80%. Select DAC_ECHO field. Press Copy key, bring
DAC_ECHO=“1”. Now the first echo reference point is recorded and the first curve
section is drawn.
(3) Repeat step (2), and record the echoes of the holes from shallow to deep depth at
20mm, 30mm and 40mm. When the reference echo amplitude at a deeper distance is
68
less than 20% of screen display amplitude, increase the system sensitivity (gain value)
to increse echo amplitude, enabling easy record of that echo reference point.
(4) After completing DAC_ECHO operation and recording the required echo reference
points, a group of DAC curves are completed.
(5) As per Class B of GB/T11345-1989 standard, sensitivy of LINE_1, LINE_2 and
LINE_3 are:Φ3-16dB, Φ3-10dB, Φ3-4dB.. Set menu items LINE_1, LINE_2 and
LINE_3 at:”DAC-16dB”, “DAC-10dB”, “DAC-4dB”, and BOLD_LINE at “LINE_2”. In
addition, the workpiece surface compensation is normally 4dB, so dB_CORR shall be
set at “+4dB”.
(6) Save the current system state setup and DAC cuves in a blank data set. Record the
SET_# of that curve.
5.2.4 Application of gate quantification and positioning
In field testing, recall the made DAC curves from SET_#, set S_DISP at “HadB”. When a
suspected echo is within the DAC curve measurement range, hitch GateA to that echo. If
the number displayed at top right of the screen is “+5.5”, the number refers to the DB
difference of the echo peak within the gate and the currently selected curve (“LINE_2”).
“+” means higher, and “-” means lower. Thus the echo equivalent value shall be:
Φ3-10dB+5.5dB=Φ3-4.5dB, which belongs to Class II flaw. When the flaw is quantified, it
is not required to adjust GAIN key and dB_CORR.
The relevant data of the flaw is displayed below the waveform: wave height %, vertical
distance, horizontal distance and sound path, etc. By shifting gate start, flaws can be
quantified and positioned.
69
Chapter 6 Operation and Management of Data Set
In main menu Mem, all the functions for store, recall and deleting data sets can be found.
The data sets include not only A-scan waveforms, but all system parameter setup values,
DAC curves and comments. The saved data sets can be recalled any time. The parameter
setups when being recalled from the system are the same as those stored. This function
enables fast system calibration when doing repetitive testing, and also fast switch
between testing work states.
6.1 Store A Record

The function allows storing the parameter setting and waveforms of the current system to
the designated data set. The symbol before the data set code means that the data
set is occupied and unmodifiable; You need to select a blank data set or clear the
occupied data set. The valid input content of the TESTINFO table will be saved to the
stored data set automatically.
Operation:
(1) Press the select key ◄ corresponds to SET_#, then press keys ▲ ▼ to select the
SET_# for storing the current data set (cycle select between 1 and 1000).
(2) Press the select key corresponds to STORE, then use the upward adjust key ▲ to
set at “on”. When the store process is finished, SET_# displays a “ “ symbol, and
is reset at”off” automatically.
6.2 Recall A Record

Recall the stored data of the corresponding SET_#. When the data set is recalled, the
system parameter is set at the same setting as when it is stored. The stored A-scan freeze
waveform is displayed.
Operation:
(1) From SET_#, select the code of the data set to be recalled.
(2) Set the submenu RECALL at “on”. After completing recall, it is reset at “off”
71
automatically.
6.3 Delete A Record
The occupied data sets are marked with symbols in front of their SET_#. It means
that these set numbers are stored with data. If these data are not needed any more, they
can be deleted.
Operation:
(1) Select the code of the data set to be deleted from SET_#.
(2) Press ◄ key corresponds to submenu DELETE. The prompt line will say:”Delete
dataset?”.
(3) Press the upward adjust key ▲ to set at “on”. The data set is deleted, and
symbol before that data set code disappears. After deletion, DELETE is set at “off”
automatically.
(4) After the prompt “Delete dataset?” appears, if you want to quit the deletion, press
any key except ◄ corresponding to the submenu DELETE to exit the operation.
6.4 Edit and Store of TESTINFO

The CTS-4020E provides comprehensive management functions of data set test info.
Each data set can store a lot of additional information, such as tested object info, flaw data
or evaluation comments. The stored additional information is useful to easy management
on data sets. Ten fields of test info are available.
6.4.1 TESTINFO field
In the following fields, up to 11 characters including letters and numbers can be inputted:
DATANAME Data set name
OBJECT Description of welding line
OPERATOR Name or code of the operator
SURFACE Surface quality status
COMMENT Comment
72
The values can be inputted in the follows fields
THICKNESS Description of test piece
TESTLEN Length range of probe-scanned test piece
FLAWLEN Flaw indication length
X-POS X position coordinates
Y-POS Y position coordinates
Operation:
(1) Set TESTINFO in Mem menu at “on”. Go to TESTINFO edit screen. See Fig. 6.1.
Fig. 6.1
(2) There are 5 rows and 3 columns in TESTINFO edit screen. The cursor indicator s are
at the top (the first line) and the utter right, for positioning the current edit position. As
shown in Fig. 6.1, the current edit position is on row 2, line 1.
(3) Press the select key ◄ corresponds to line 2~5. Repeatedly press the same key ◄
to cyclingly switch the column position. See Fig. 6.2. If repress the select key ◄
corresponds to line 2, the cursor indicator at the top will be switched to column 2, i.e.
the current edit position is “THICKNESS” in line 2 column 2.
73
Fig. 6.2
(4) Press gain adjust key ▲ ▼ on the panel. The edit cursor can be shifted left or right
for one space. See Fig. 6.3. Press gain adjust key ▲, and the cursor shifts to right for
one space. “0” in “THICKNESS” column is highlighted. If you want to change the “5”
value, press gain adjust key ▲ or ▼ to adjust.
Fig. 6.3
(5) Press the adjust key ▲ or ▼, the highlighted number 5 is changed. Use the adjust
key ▲ to increase the value, as shown in Fig. 6.4；or the adjust key ▼ to decrease
the value, as shown in Fig. 6.5.
74
Fig. 6.4
Fig. 6.5
Note:
(1) Before recalling a new data set, please be noted that, all the changes to the current data
set will be lost! If you need to save the changes, set SAVE at “on”.
(2) SET_# is not editable. What is displayed here is the code of the current data set.
6.4.2 Save TESTINFO
Select SAVE in line 5, row 3, and set it at “on”.
Note:
It the previous test info is edited, when saving the data, all of the previous test info will change. If
the previous data set is blank, all of the system settings and the current A-scan graphs will be
75
saved together with the edited data. After saving the data, SAVE is reset at “off” automatically.
6.4.3 Exit TESTINFO screen
Press Zoom key to stop edit of test info data, and return to A-scan display.
Note:
If SAVE is not set at “on”, the data will not be saved.
6.5 Preview of Data Set

The data set preview function enables easy review of A-scan graphs in all data sets.
Operation:
(1) Press the select key ◄ corresponds to PREVIEW submenu. Press the adjust key ▲
to set at “on”, and the stored data name, save time and A-scan graph are displayed
on the screen. As shown in Fig. 6.6, it is a preview screen of SET_#1.
Fig. 6.6
(2) Press the select key ◄ corresponds to SET_# submenu, then press adjust key ▼ or
▲ to select the required SET_#. The preview for those SET_# saved with data are
displayed, while those without data saved are omitted. See Fig. 6.7.
(3) Press the select key corresponds to RECALL submenu. Set RECALL at “on”, i.e. to
recall the SET_# with saved data sets. After recalling the data sets, the system
parameters are set at the same state when the data were saved, and the saved
76
A-scan freeze waveform is displayed.
(4) Press Zoom key to return to the A-scan page of the current operation.
Fig. 6.7
6.6 Directory of Data Sets

The data set directory allows for an overview of all data sets and display of data set Mem
codes and names. Each time the display lists up to 15 data sets (See Fig. 6.8). The codes
with occupied data sets are marked with symbols before them.
Fig. 6.8
Operation:
(1) Press the select key ◄ corresponds to DIRECTORY submenu, and use the upward
adjust key ▲ to set at”on”.
(2) Press the djust key ▼ or ▲ to display data set directory in the previous or the next
77
page.
(3) Press Zoom key to return to the A-scan page of the current operation.
78
Chapter 7 Ports and Peripheral Devices
The CTS-4020E system is configured with 2 USB ports and 1 network port.
The USB port is mainly for saving data sets and cine in the system to an external storage
device, and also for connecting to a printer to print test reports or pictures; The network
port is for real-time communication with a PC.
7.1 USB Port
7.1.1 Connect to a USB disk
Connect a USB disk with the USB port. Set the submenu U DISK at “on”, and you can
save the stored data sets to a USB disk. If the system does not identify such USB device,
at the bottom of the screen it prompts “USB disk not found”. After saving, U DISK
submenu is reset at “off” automatically. Cine can also be saved to a USB disk. For more
information, see Section 3.6.3 “Cine key Cine”.
Note:
If the system displays “USB disk not found” or data cannot be saved, you can try the following
methods to find the reason:
(1) Connect the USB disk to the other USB port on the system;
(2) Restart the system;
(3) Check if there is sufficient remaining space on the USB disk;
(4) Try to use another USB disk.
7.1.2 Connnect a printer
The CTS-4020E can be connected to certain printers with USB port to print out test
reports or pictures.
Connect the printer to the system. In Config menu, select “report” or “picture” from
COPY_MODE. Finally press Copy key on the system panel, and the printer will start to
79
print.
Note:
There is a processing time before printing. Please wait for a while. If the system displays “USB printer
not found”, you can try the following methods to find the reason:
(1) Check if the printer model supported by the system;
(2) Use the other USB port;
(3) Restart the system;
(4) Check if there is any problem with the printer. It is recommended to test with another
printer.
7.2 Network Port

To achieve real-time communication, the CTS-4020E is connected to a computer via the
network port. See Section 9.1 “How to Use US4020 Computer Communication and Data
Processing Software”.
80
Chapter 8 Training, System Maintenance and Service
8.1 Training
To ensure a safe and proper operation of the CTS-4020E, the operator shall receive
appropriate training on ultrasound testing, and read this operation instruction before
operating this system. The lack of relevant knowledge to ultrasound testing may lead to
unpredictable wrong testing results. Therefore, to acquire information on ultrasonic testing
training and qualification, you can contact relevant NDT societies, organizations or with
us.
8.2 System Maintenance

Please use the factory configured accessories and options, such as the BNC probe
connection cable and the communication cable. Incompatible cables may result in system
internal circuit failure or external connector damage. AVOID any liquid dripping into the
system.
The system housing, glass panel and other parts can be cleaned with a piece of cloth
soaked with a little water or neutral household cleanser.
Note:
DO NOT use any solvent to clean the system. The plastic parts may be damaged or become
fragile if being cleaned with solvent.
8.3 Maitenance of Rechargeable Battery

The capacity and the operational life span of the rechargeable battery (model DC-18)
depend on whether the battery is used properly. Please recharge the battery with the
configured charger. On how to use the charger, please refer to Section 9.2 “How to Use
Charger”.
In the following cases, the battery shall be recharged
(1) Before using the battery for the first time;
(2) If the battery is stored for or over 3 months;
81
(3) After frequent discharge.
Cautions when using the battery:
DANGER!
Do not short circuit the battery.
Do not charge the battery near fire source or in extremely hot environment.
Do not strike against other object.
Do not try to disassemble the battery in any method.
Do not use the battery if it is in peculiar smelling, heats, distortion, changed color or any
other abnormity.
During storage or transportation, the battery shall be stored with half capacity, i.e. its
voltage shall be 7.2V~7.7V, so as to avoid any gas generated or gas inflation.
8.4 Service
The CTS-4020E, adopts the latest technologies, made of high quality components. The
process inspection, the in-process testing and the quality management system are all
certified by ISO9001, ensuring that the system performance is optimized.
In case any failure is found in the system, please shut off the system and take out the
battery. Please contact us whenever it is necessary to repair or readjust the system. The
warranty does not cover any unauthorized repair or disassembly.
Under the following situations, the safe operation of the system is not ensured:
(1) The system is obviously damaged (with abnormal display or internal sound)
(2) The system is stored in advserse environment for a long time (e.g. abnormal
temperature or high humidity, or erosive condition).
(3) Severe falldown or pressure during transportation.
82
Chapter 9 How to Use Major Accessories and Options
9.1 How to Use Computer Communication and Data Processing Software

The US4020 computer communication and data processing software CD is a standard
accessory to the CTS-4020E.
Run the SETUP.EXE installation program under the CD root directory. Install the US4020
software system to the computer hard disk. Find the installed US4020 program in
WINDOWS “Start” menu\Program list.
The software operation interface is as shown in Fig. 9.1.
Fig. 9.1
9.1.1 Main functions
(1) Real-time display of testing screen on the CTS-4020E
(2) Read and display of parameters on the CTS-4020E
(3) Romote control operation for some of the functions on the CTS-4020E
83
(4) Open and save testing data & waveforms
(5) Edit and print testing reports
(6) Record and replay of cine
9.1.2 Basic operation
1) Start the software. Click “Network”->“Connect” or key on the tool bar to connect
to the network.
2) After connecting to the network successfully, it pops up a box (Fig. 9.2), to prompt
that the computer is connected to the system.
Fig. 9.2
3) Click “Open” key to turn on the system real-time testing screen; to modify system
parameters, click “Modify”; The 7 options correspond to the 7 menus on the system.
Click the option that you want to modify. For example, to change “RANGE” in the
“Basic” main menu from 250mm to 230mm, the procedure is as follows:
(1) Click “Modify “;
(2) Click “Basic” option, and a page like Fig. 9.3 pops up;
Fig. 9.3
84
(3) Input “230” in “RANGE” text box;
(4) Finally click “Download “ to complete the change.
9.2 How to Use Charger

(1) Plug the AC Power In plug of the CD-17 charger in an AC220V socket;
(2) Connect the DC-18 battery to the charger. At that time, the red indicator on the
charger is on, which means it starts charging;
(3) When the green indicator is on, it means the charging is finished. The complete
charging takes about 4 hours;
(4) Disconnect the charger from the power supply;
(5) Take out the battery.
The DC-18 battery can also be recharged when it is installled in the system. For internal
battery charging, the CTS-4020E shall be shut off. Plug the charging Power In plug of the
CD-17 charger to “DC IN” on the right of the CTS-4020E. The charging process is the
same as that of external charging.
9.3 How to Install Rechargeable Battery

(1) Place the system on a table with its back upward. Loose the fixed screws on the
battery compartment. Take out the battery back cover carefully as shown in the
direction in Fig. 9.4.
Fig. 9.4 Fig. 9.5
(2) As shown in Fig. 9.5, install DC-18 battery in the battery compartment. Then insert
the battery back cover and fasten the fixed screws.
Note:
85
(1) After installing the battery, please be sure to fasten the fixed screws on the battery back
cover. Otherwise, it may result in battery fall-down accidently during system operation.
(2) If the system is stored away for a long time or transported to another place, please
disinstall the battery to avoid accidental system power-on and leading to unexpected
results.
9.4 How to Use System Bag

See Fig. 9.6 and Fig. 9.7.
Fig. 9.6 Fig. 9.7
86
Annexes A Operation Instruction for Parameter Output Function
via a USB Disk

A.1 Manual Parameter Output
Operation:
(1) Make sure that the USB disk is connected to the system and identified correctly.
(That is to say, when the USB disk is plugged in, the system will prompt “USB
disk connected”.) Please refer to Chapter 7 Ports and Peripheral Devices for
details.
(2) Select submenu COPY_MODE on the fist page of menu Config and press ▼ key
to display item “param-m”.
(3) Press key COPY each time, parameters will be outputted to the USB disk once.
A.2 Automatic Parameter Output

Operation:
(1) Make sure that the USB disk is connected to the system and identified correctly.
(That is to say, when the USB disk is plugged in, the system will prompt “USB
disk connected”.) Please refer to Chapter 7 Ports and Peripheral Devices for
details.
(2) Select submenu COPY_MODE on the fist page of menu Config and press ▼ key
to display item “param-a”. At this time, the system will begin to output the
parameters to the USB disk automatically.
(3) To stop the automatic output, switch the submenu COPY_MODE to any item
other than “param-a”.
(4) After stopping the automatic output, the USB disk can be unplugged only when
the screen prompts “USB disk can be removed”.
Note:
(1) Output parameter: Sa, Da, Ra, Ha%, Sound Path (SPath), Sb and Sba.
(2) File name: System Model-Date. (CTS4020-02282008 for example)
(3) File content: [hour: minute: second: mantissa] Sa: xxx, Da: xxx, Ra: xxx, Ha%: xxx,
SPath: xxx, Sb:xxx, Sba: xxx
(4) Sound Path (SPath): 1 LEG if ≤ 1 LEG; 2 LEG if > 1 LEG and ≤ 2 LEG; 3 LEG if > 2 LEG
and ≤ 3 LEG, and so on.
(5) Among the output parameters, Da, Ra and SPath are valid only when testing with an
angle probe. (i.e. on the first page of menu Meas, the angle or K value is not set at “0”.)
In addition, Da and SPath values are relative to submenu Thickness (which refers to
workpiece thickness, on the second page of menu Meas). Only the correct Thickness
setting can assure the accuracy of Da and SPath values. When testing with a normal
probe, Da, Ra and SPath will be displayed as Da:*, Ra:*, SPath:-1.
87
(6) Sa will be displayed as Sa:* when Gate a is set off or out of the screen display range.
(7) Sb will be displayed as Sb:* when Gate b is set off or out of the screen display range.
(8) Sba will be displayed as Sba:* in either case of (6) or (7).
(9) Ha% will be displayed as Ha%:* in the case of (6); when the echo amplitude exceeds
the screen range, it will display as Ha%: >100.
(10) When outputting parameters, if there is already a file of the same name in the USB disk,
the parameters will be appended in the file.
(11) When outputting parameters manually, if press key COPY each time, the screen will
pause for a short while, because the system is saving parameters to the USB disk. The
USB disk can be unplugged when the pause ends.
(12) When outputting parameters automatically, the USB disk can only be unplugged when
the submenu COPY_MODE is not in the item “param-a” and the screen prompts “USB
disk can be removed”. In this way it can avoid damaging the outputted parameter files
due to incorrect USB disk removal.
(13) The residual volume of the inserted USB disk cannot be calculated when outputting
parameters automatically, therefore, make sure there is at least 10 MB left in the USB
disk before use.
(14) The automatic parameter output is approximately 8/sec, which depends on the
operation or screen content.
88
Annexes B Operation in AWS D1.1 (Optional)
When using instrument software with AWS D1.1 function, the main menu Meas will be as
below:
Main
Menu
AWS_A_IND ∧ ∧ ∧
0.0dB
AWS_B_REF ANGLE * REF_DEPTH THICKNESS *
0.0dB 0.0° 40.0mm 25.0mm
AWS_C_ATT K_VALUE * APERTURE S_DISP
Meas
0dB 0.00 Φ50.0mm off
AWS_D_RAT ANGLE_MEAS X_VALUE PEAK_VALUE
0.0dB off 0.0mm off
∨ ∨ ∨ ∨
Main
Menu
∧ ∧ ∧
COMPARE ENLARGE NOISE

off off off
SEC_COLOR VDR LINEARITY
Meas
off off off
MEAS_POINT SEN
peak off
∨ ∨
Meaning of submenu belongs to AWS D1.1 function
AWS_A_IND A indication level in AWS D1.1
AWS_B_REF B reference level in AWS D1.1
AWS_C_ATT C attenuation factor in AWS D1.1
AWS_D_RAT D rating in AWS D1.1
89
Operation:
(1) Couple the probe to the standard, and move the probe back and forth to locate the
maximum amplitude signal from the standard. Adjust the height of signal to be
between 20% and 100% of full screen height.
(2) Press Key Gate to activate the main menu Gate and Move the Gate A to capture the
reflector by adjusting submenu "aSTART" and "aWIDTH".
(3) Press Key Meas to activate the main menu Meas.
(4) Press Key ◄ next to submenu "AWS_B_REF" to select it, then press ▲ to recored
the “b Reference Level”.
(5) Couple the probe to the test target, and move the probe back and forth to locate the
maximum amplitude signal from the test target. Adjust the height of signal to be
between 20% and 100% of full screen height.
(6) Press Key Gate to activate the main menu Gate and Move the Gate A to capture the
reflector by adjusting submenu "aSTART" and "aWIDTH".
(7) When at page 1 of the main menu Meas. “a Indication Level”(corresponding to
submenu "AWS_A_IND") will be recorded automatically, And according with the
formula: c=(SA-1)x2 and d=a-b-c, “c Attenuation Factor”(corresponding to
submenu"AWS_C_ATT") and “d Indication Rating”(corresponding to submenu
"AWS_D_RAT") will also be calculated automatically.
Note:
(1) The steps above is base on AWS D1.1-2006.
(2) The calculation is base on unit inch, either system unit is set to inch or set to milimeter.
(3) When submenu AWS_B_REF is selected, and then press key ▼, the value of submenu
AWS_B_REF will be cleared(set to 0).
(4) The automated recording and calculation will be only functional at page 1 of the main
menu Meas.
(5) At step 4 and 7, Gain to be recorded will be automatically converted to the value
corresponding to echo of 50% of full screen height.
90
Annexes C AVG Curves(Optional)
C.1 Making AVG Curves
Operation:
(1) Calibrate probe zero and material velocity;
(2) Input probe information(page 4,5 of DAC menu）
Select the submenus PShape, PFREQ., PDIA_A, PDIA_B, PANGLE and
PK_VALUE respectively, and input information such as probe shape, frequency, size
(for a round-shape probe, input the probe diameter in the submenu PDIA_A; for a
rectangular-shape probe, input the length of two probe sides in PDIA_A and PDIA_B),
and angle.
(3) Input Reference Information(page 6 of DAC menu）
Select the submenu BASE_TYPE, and adjust it to the standard reflector type of the
reference test block or the work piece: if BW is selected from BASE_TYPE, the
system will ignore the input value in the submenu BASE.; if FBH or SDH is selected
from BASE_TYPE, input the diameter of the standard reflector in the submenu
BASE.
(4) Input curve diameters in AVGL1, AVGL2 and AVGL3 (page 6,7 of DAC menu）
（curve diameter refers to flat bottom hole equivalent diameter created by AVG curve.
That is to say, if curve diameter is 2mm, AVG cuve is a Φ2 equivalent curve）.
(5) Input attenuation factor (ATTEN) (page 7 of DAC menu）(ATTEN is determined by the
applicable standard and the workpiece).
(6) Input gain correction (dB_CORR) (page 8 of DAC menu).
When the echo amplitude of the reference test block or the workpiece does not
comply with the theoretical value, compensation is required to compensate the value
difference. This is a common practice when a big flat bottom is used for reference.
Because the big flat bottom echo amplitude usually does not reach the theoretical
difference of amplitude for the echo of the same-distance flat-bottom hole, if the big
flat bottom amplitude is used as a reference, the calculated flat-bottom equivalent
value in actual testing will be inaccurate.
Therefore in situations when the big flat bottom echo is used as a reference, it is
recommended to input the error (between the actual difference of the reference broad
flat-bottom echo amplitude and the flat-bottom test block amplitude with the
same-distance, which can be calculated with the theoretical formula) as
compensation. Input the compensation to bring the calculation more accurate.
(1) Select the submenu AVG and adjust it to record. Record Gate A to the echo, and
move the probe to bring up the maximum echo. Adjust gain to bring the echo
91
between 50～80％. When the current state is in page of AVG submenu in DAC menu,
press Copy to creat the curves.
C.2 Deleting AVG Curves

Operation:
(1) Select AVG submenu（page 8 of DAC menu）. Press ▲ to switch the menu option for
AVG to del.
(2) Press Copy to delete the AVG curve.
Note:
(1) To remake AVG curves, you need to delete the previously created curves.
(2) After making AVG curves, the options for the AVG menu are changed to off, disp and
del.
92
Annexes D Activation
Operation:
(1) Select the last submenu ACTIVATION in Config, and press value adjust up and down
key to enter the activation interface.
(2) Under the activation interface:
Press the submenu select key to select the corresponding module to be activated.
The Gain adjust up and down key is to choose the entered letter position and the
value adjust up and down key to select the entered letter.
After entering the activation codes, press Copy key. If the activation codes is correct,
the corresponding module will become Activated. Otherwise, it keeps remains Not
Activated .
(3) After activation, please reboot the system to enable the activated functions.
93
Contact Information
Shantou Institute of Ultrasonic Instruments Co., Ltd. (SIUI)
Add: 77 Jinsha Road, Shantou, Guangdong 515041, China
Tel: 86-754-88250150 Fax: 86-754-88251499
E-mail: siui@siui.com
94

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CTS-4020E

Digital Ultrasonic Flaw Detector

Shantou Institute of Ultrasonic Instruments Co., Ltd.

Chapter 1 CTS-4020E Overview ................................................................................. 1

Annexes C AVG Curves(Optional) ............................................................................ 91

Contact Information ...................................................................................................... 94

1.1 About CTS-4020E

advanced process, small size, lightweight and powerful functions.

Continuous innovation and endeavor towards world-class technology is SIUI’s invariable

anti-interference of the system.

Basic information about the system is described in Chapter 1;

System main performance and specifications are described in Chapter 2;

of some system functions are described in Chapter 4;

access for the user to know field application very quickly);

Connection of system peripheral ports with a PC or a printer is described in Chapter 7;

Operator training and system maintenance & service in Chapter 8;

1.2 System Appearance

1.2.1 Structure and ports

Submenu select keys

Up/down adjust keys

Fig. 1.1 Power switch

Fig. 1.2 System handle

1.2.2 System figure Submenu

Gain reading Nex page

Waveform Current main

1.2.3 Display mode

There are two CTS-4020E screen display modes:

adjust and set up the system:

it will return to the normal display mode.

1.3 Operation Power

1.3.1 Operation with CD-17 charger

the right of the CTS-4020E.

1.3.2 Operation with DC-18 rechargeable battery

charged with the CD-17 charger.

charging will be cut off automatically.

1.3.3 Remaining power indicator

1.4 Connecting A Probe

models manufactured by SIUI are suitable for the CTS-4020E.

1.5 System Startup

system was normally shut off last time.

2.1 Application Range and Performance Features

 Material testing, flaw positioning and echo evaluation

 Testing result storage and recording

 General ultrasonic flaw detection situations

The CTS-4020E has measurement resolution of 0.1mm, 0.5~15MHz broadband

frequency operating range and a testing range up to 6000mm(steel longitudinal wave),

sensitivity surplus, highlighting advantages of high sensitivity and broadband.

 Interface wave tracking function: Immersion detection or precision measurement

measurement and comparison on work pieces.

 Variable PRF: avoid reverberation signals during flaw detection.

 RF (Radio Frequency) echo display: good to thin-wall material measurement,

academic research or quantitative analysis.

 Probe angle (K value) and probe echo frequency measuring function.

with an angle probe.

parameters, detection reports, etc.

 Cine loop function for recording the dynamic scanning process.

easy printing test reports through a printer.

 High-brightness color TFT LCD, bringing optimized effect for reading

 10 waveform colors and character colors are available.

Function Unit Specifications

0~6000 (Longitudinal wave in steel), continuously

Display Delay mm -10 ~1000 (Longitudinal wave in steel)

Probe Delay μs 0 ~199.9