1.

In typical XPS spectra, both photoelectron peaks and Auger

electron peaks are present. The questions are
(a) What instrumental parameter can be used to distinguish the
two?
(b) What is the result?
2. Which of the following is the detection limit of ISS for
monolayer?
a) 10 -1 %
b) 10 -2 %
c) 10 -3 %
d) 10 -4
Answer: a
Explanation: The detection limit of ESCA is 0.1% monolayer. It
has no x-y resolution.%

3. : ISS is less sensitive than which of the following?

a) SIMS
b) Auger
c) ESCA
d) AES
Answer: a
Explanation: ISS is less sensitive than SIMS. It is more sensitive
than Auger or ESCA.
 4. Which of the following is not true about Fourier Transform
Infrared (FTIR) spectrometer?
a) It is of non-dispersive type
b) It is useful where repetitive analysis is required
c) Size has been reduced over the years
d) Size has increased over the years
answer: d
Explanation: FTIR is of non-dispersive type of instruments and is
used for repetitive analysis. Initially, it was bulky and the cost was
high and hence, it was limited to a special application. Now, the
size has been reduced.
5. Which of the following is not the function of the drive
mechanism in Fourier Transform Infrared
Spectrophotometer?
a) Movement of mirror to obtain a satisfactory interferogram
b) Acquire a good interferogram pattern
c) Allow 50% of the beam to pass
d) Keep the speed of the moving mirror constant
Answer: c
Explanation: Drive mechanism does the functions specified in the
other options. It the function of the beam splitter to allow 50% of
the beam to pass through.
6. : Only pyroelectric transducer or pyroelectric crystals are
used as detectors in Fourier Transform Infrared
Spectrophotometer (FTIR). What is the main reason for
 other types of thermal detectors are not being used in FTIR
spectrophotometer?
a) Less accuracy
b) Slower response
c) Less precision
d) Less sensitivity
Answer: b
Explanation: Other thermal detectors are not employed due to
slower response of the detectors. Pyroelectric transducers or
pyroelectric crystals are chosen for their high speed, accuracy,
precision, sensitivity and resolution.
7. Which of the following is not the advantage of Fourier
Transform Spectrometers?
a) Signal to noise ratio is high
b) Information could be obtained on all frequencies
c) Retrieval of data is possible
d) Easy to maintain
Answer: d
Explanation: The instrument is not easy to maintain and it is a
disadvantage. The other disadvantage is that the cost is high.
8. In Michelson’s interferometer, the frequency of the detector
output can be determined by translating the _________ of
movable mirror and the ___________ of monochromatic
radiation.
a) Velocity, wavelength
b) Thickness, intensity
c) Length, velocity
d) Angle, intensity
Answer: a
Explanation: The frequency can be determined by translating the
velocity of the movable mirror and the wavelength of
monochromatic radiation. The reflected beam passes towards the
movable mirror.
9. In Michelson’s interferometer, the __________ of the
detector output will depend upon the intensity of incoming
radiation.
a) Velocity
b) Frequency
c) Amplitude
d) Phase
Answer: c
Explanation: In Michelson’s interferometer, the amplitude of the
detector output will depend upon the intensity of incoming
radiation. If a movable mirror is moved uniformly, the output will
be a sine wave.
 10. The kinetic energy of the photoelectron energies is
dependent on _________ of the atom, which makes XPS
useful to identify the oxide state.
a) Mass
b) Charge
c) Chemical environment
d) Volume
Answer: c
Explanation: The kinetic energy of the photoelectron energies is
dependent on the chemical environment of the atom, which makes
XPS useful to identify the oxide state. It also helps to identify the
ligands of the atom.
11. The kinetic energy of the ejected photoelectron is
dependent upon the energy of which of the following?
a) Ions around
b) Photons around
c) Material
d) Impinging photo
Answer: d
Explanation: The kinetic energy of the ejected photoelectron is
dependent upon the energy of an impinging photon. A free electron
is ejected.
 12. By studying which of the following can we determine if
the surface corresponds to C-O or C=O chemical form?
a) Mass of the electron
b) Energy of the carbon peak
c) Binding energy
d) Charge of electron

13. : Surface is usually more than _____ atomic layer deep

and is a region of ________ atomic potentials.
a) One, uniform
b) One, non-uniform
c) Two, uniform
d) Two, non-uniform
Answer: b
Explanation: Surface is more than one atomic layer deep and is a
region of non-uniform atomic potentials. The outermost layer of
atoms is called a surface.
14. Surface analysis can provide information that classic
methods like microscopic cannot.
a) True
b) False
Answer: a
Explanation: Surface analysis can provide information that classic
methods like microscopic cannot. It is better than reflectivity,
adsorption isotherms, etc.
15. surface spectrometer, which of the following beam is
analysed?
a) Reflected beam
b) Absorbed beam
c) Refracted beam
d) Incident beam
Answer: a
Explanation: When a beam is focussed on a surface, one beam
enters the material and a second beam is reflected. The reflected
beam is analysed.

16. Which of the following is a type of electron

spectroscopy?
a) MIKES
b) Auger spectroscopy
c) Secondary ion mass spectroscopy
d) Ion scattering spectroscopy
Answer: b
Explanation: Auger spectroscopy is a type of electron
spectroscopy. Electron spectroscopy for chemical analysis is also a
type of electron spectroscopy
17. : Surface analysis cannot provide any chemical
information directly.
a) True
b) False
Answer: b
Explanation: Surface analysis can provide chemical information.
Electron and ion spectroscopic techniques are types of surface
analysis.
18. : Which of the following is also known as X-ray
photoelectron spectroscopy?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy
Answer: c
Explanation: Electron spectroscopy for chemical analysis is also
known as X-ray photoelectron spectroscopy. It is an effective
technique for detecting the elements.
19. : Which of the following methods utilizes the emission
of low energy electrons in a process?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy
Answer: a
Explanation: Auger electron spectroscopy utilizes the emission of
low energy electrons in auger process. It is one of the commonly
employed techniques

20. Which of the following is the abbreviation of ESCA?

a) Electron scattering chemical analysis
b) Emission spectroscopy combination analysis
c) Electron spectroscopy for chemical analysis
d) Electron spectrum chemically analysed
Answer: c
Explanation: The abbreviation of ESCA is Electron spectroscopy
for chemical analysis. It is a type of electron spectroscopy.
21. : Which of the following methods use soft X-rays to
eject electrons from inner shell orbitals?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy
Answer: c
Explanation: Electron spectroscopy for chemical analysis using
soft X-rays to eject electrons from inner shell orbitals. It is a type
of electron spectroscopy.
22. : Auger electron spectroscopy can be used for surface
chemical analysis in a way similar to which of the
following?
a) ESCA
b) SIMS
c) ISS
d) Ion spectroscopy
Answer: a
Explanation: Auger electron spectroscopy can be used for surface
chemical analysis in a way similar to ESCA. ESCA is also known
as X-ray photoelectron spectroscopy.
23. : . AES is limited when it comes to very high resolution
studies.
a) True
b) False
Answer: a
Explanation: AES is limited when it comes to very high resolution
studies. It is very characteristic for various elements.
24. : Qualitative chemical analysis is very often performed
using which of the following?
a) ESCA
b) SIMS
c) AES
d) Ion spectroscopy
Answer: c
Explanation: Qualitative chemical analysis is very often performed
using AES. Auger nomenclature follows the old x-ray notation.
25. electron ionization can produce which of the following?
a) ESCA electron
b) Auger electron
c) Ion
d) Photon
Answer: b
Explanation: Electron ionization can produce Auger electron.
Photo-ionisation can also produce Auger electron.
26. : AES is more sensitive than XPS because of which of
the following factors?
a) Binding energies of electrons
b) Kinetic energies of electrons
c) Mass of electrons
d) Mass to charge ratio of electrons
Answer: b
Explanation: AES is more sensitive than XPS because of the
difference in kinetic energies of electrons. Ion etching is
sometimes necessary for AES.
27. : Which of the following must be used with the X-ray
source to have high energy resolution?
a) Chopper
b) Vacuum chamber
c) Accelerator
d) Monochromator
Answer: d
Explanation: Monochromator must be used with the X-ray source
to have high energy resolution. It will also remove the satellite
lines.
28. : If the primary ion is elastically scattered, the kinetic
energy of the reflected primary ion will depend on which of
the following?
a) Charge of the primary ion
b) Charge of the surface ion
c) Mass of the surface ion
d) Number of surface ions
Answer: c
Explanation: If the primary ion is elastically scattered, the kinetic
energy of the reflected primary ion will depend on the mass of the
surface ion. The reflected ion is measured by ISS.
 29. Which of the following causes the phenomena of
sputtering?
a) Primary ion gets embedded in the solid
b) Primary ion is elastically scattered
c) Primary ion is reflected
d) Primary ion is refracted
Answer: a
Explanation: Primary ion may penetrate through a few layers of the
surface and get embedded in the solid. This causes scattering.
30 Fourier transform NMR spectrometer allows NMR
transitions to be observed simultaneously.
a) True
b) False
Answer: a
Explanation: Fourier transform NMR spectrometer is a type of
NMR spectrometer. It allows samples to be observed
simultaneously instead of serially.
31: Sensitivity is the ratio of peak signal amplitude to which of
the following?
a) Time
b) Rms noise
c) Average noise
d) Peak-to-peak noise
Answer: b
Explanation: Sensitivity is the ratio of peak signal amplitude to rms
noise. It is a measure of the ability of an instrument to differentiate
signal from surrounding noise.
32 The amplitude of the NMR signal caused by the absorption
of RF energy at the radio frequency does not depend upon
the power of the RF energy applied.
a) True
b) False
Answer: b
Explanation: The amplitude of the NMR signal caused by the
absorption of RF energy at the radio frequency depends on
33 AES is more sensitive than XPS because of which of the
following factors?
a) Binding energies of electrons
b) Kinetic energies of electrons
c) Mass of electrons
d) Mass to charge ratio of electrons

Answer: b
Explanation: AES is more sensitive than XPS because of the
difference in kinetic energies of electrons. Ion etching is
sometimes necessary for AES.e power of the RF energy applied. It
also depends on the sweep rate selected.
33 X-ray diffractometers are not used to identify the physical
properties of which of the following?
a) Metals
b) Liquids
c) Polymeric materials
d) Solids
nswer: b
Explanation: X-ray diffractometers are not used to identify
the physical properties of liquids. It is used to identify the
physical properties of metals, solids and polymeric
materials.
34 X-ray diffractometers provide ____________ information
about the compounds present in a solid sample.
a) Quantitative
b) Qualitative
c) Quantitative and qualitative
d)Either quantitative or qualitative
Answer: c
Explanation: X-ray diffractometers provide quantitative and
qualitative information about the compounds present in a
solid sample.
35 With the help of which of the following equations is the
distance calculated from a known wavelength of the source
and measured angle?
a) Coolidge equation
b) Bragg’s equation
c) Debye equation
d) Scherrer equation
 answer: b
Explanation: The distance is calculated from a known
wavelength of the source and measured angle using Bragg’
equation. The diffracted angle is calculated by the spacing
between a particular set of plane.
36 When certain geometric requirements are met, X-rays scattered from a crystalline solid can
constructively interfere with each other and produce a diffracted beam.
a) True
b) False

Answer: a
Explanation: When certain geometric requirements are met, X-rays scattered from a crystalline solid
can constructively interfere with each other and produce a diffracted beam. The relationship among
different factors is given by Bragg’s law.
37 11. In Diffractometers, the intensities of the diffraction
peaks of a given compound in a mixture are proportional to
the fraction of the material in the mixture.
a) True
b) False

Answer: a
Explanation: In Diffractometers, the intensities of the
diffraction peaks of a given compound in a mixture are
proportional to the fraction of the material in the mixture.
Hence, they are used in qualitative analysis.
38 Which of the following is not a type of optics employed in
electron probe microanalyser?
a) Electron optics
b) Light optics
c) X-ray optics
d) Gamma optics
 Answer: d
Explanation: Gamma optics is not a type of optics used in
electron probe microanalyser. Electron optics, light optics
and X-ray optics are employed.
39 The specimen is mounted inside which of the following
components?
a) Test tube
b) Glass capillary tube
c) Vacuum column
d) Curvette
View Answer
Answer: c
Explanation: The specimen is mounted inside the vacuum
column in the instrument. It is under the beam as the target.
40 Electron probe microanalyser is a method of destructive
elemental analysis.
a) True
b) False

Answer: a
Explanation: Electron probe microanalyser uses a finely
focussed electron beam to excite the X-rays. It is a method
of destructive elemental analysis.
41  Micro probe analyser cannot be used on inhomogeneous
material.
a) True
b) False

Answer: b
Explanation: Micro probe analyser can be used on
 inhomogeneous material. It can also be focussed on a very
small area.
42 The alternative method using laser does not analyse vapours
by which of the following methods?
a) Mass spectrometer
b) Optical emission
c) Absorption photometry
d) X-ray photometry

Answer: d
Explanation: The alternative method using laser does not
analyse vapours by X-ray photometry. This method is
gaining popularity.