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DO WE NEED A
SUPPLEMENTARY Bifacial PV-modules
Sales price of PV
RATING TEST with unclear rating
modules is based on
CONDITION FOR conditions were seen
STC measurements
BIFACIAL MODULE in the market
PERFORMANCE?
Height above 1m
ground
Global Direct Diffuse Albedo Module Spectral transmission data for
Tilted Beam Beam Component Transmission Glass/EVA/Glass structures of bifacial
Irradiance Component Component modules
Reference:
C. Guyemard et al., “SMARTS2: A simple model of the atmospheric radiative transfer of Sunshine: Algorithms and performance assessment”, FSEC-PF-
270-95 (1995)
Reference:
C. Guyemard et al., “SMARTS2: A simple model of the atmospheric radiative transfer of Sunshine: Algorithms and performance assessment”, FSEC-PF-
270-95 (1995)
1
AM1.5G at front face
Normalised Spectral
Irradiance 0.8
Irradiance [au]
AM1.5G at rear face
Elevation [m]
Distribution at Rear
0.6
Face, GR
0.4
0.2
0
0 400 800 1200 1600 2000 2400 2800 3200 3600 4000
Wavelength [nm]
G [W/m2]
• Accounting for the methodology used in SMARTS2, a physics-based model was created,
which can compute radiation distributions on tilted surfaces and their spectrum.
• It is shown that rear face irradiance for PV-modules deployed in a single row at 1 m above
ground at conditions as defined in AM1.5G lies in the range of 118-138 W/m2.
• The spectral distribution of the irradiance at rear face is red-shifted due to spectral albedo
effects.
Different mismatch factors for front and rear irradiance components.
𝐺𝐸𝑖 = 1000 W/m²+ 𝜑 ∗ 𝐺𝑅𝑖 IEC 60904-1-2 𝐺𝑅𝟏 = 100 W/m² 𝐺𝑅𝟐 = 200 W/m² 𝐺𝑅𝟑 = xxx W/m²
𝝋= 𝑀𝑖𝑛 (𝝋𝑰𝒔𝒄, 𝝋𝑷𝒎𝒂𝒙) 2PfG 2645/11.17 𝐺𝑅𝟏 = 100 W/m² 𝐺𝑅𝟐 = 200 W/m² 𝐺𝑅𝟑 = 135 W/m²
[1] 2PfG 2645/11.17: Measurement of I-V characteristics of bifacial photovoltaic devices and label requirements
100.00%
φ Voc
φ Isc
75.00% 75.00%
99.00%
70.00% 70.00%
98.00%
65.00% 65.00%
60.00% 60.00% 97.00%
PID
Glass /
Frame LID
Breakage
Reliability
Hot-spot? FF Loss
Addressed by current
standards
0.0%
PMAX relative measurement uncertainty: 1.7%, k=2
Relative Efficiency
-0.5%
-1.0%
-1.5%
60 60
40 40
Tmod [oC]
30 30
20 20
10 10
0 0
125 175 225 275 325 375 425 475 525 575 625 675 725 775 825 875 925 975 1025 1075
Irradiance [W/m2]
* Field data were collected in Cologne, Germany from August 2017 to October 2017
Site: Cologne
Measurement Period: Aug. – Sep. 2017
9.0 41.0
40.69
35.0 33.42
Average uo [W m-² K-1]
8.50
31.33
Average u1 [W s m-³ K-1]
8.5 40.5
20.0 7.41
7.5 39.5
39.09
15.0
7.0 39.0
10.0
6.5 38.5
5.0
0.0 6.0 38.0
Bifacial Monofacial Bifacial Monofacial Bifacial Monofacial
Irradiance Dependence Wind Dependence NMOT
Current: 8A Current: 6A
Frequency
Frequency
12000
20000
10000
8000 15000
6000 10000
4000
5000
2000
0 0
100
110
120
130
140
150
160
170
180
190
200
10
20
30
40
50
60
70
80
90
80% 80%
60% 60%
40% 40%
20% 20%
0% 0%
125 175 225 275 325 375 425 475 525 575 625 675 725 775 825 875 925 975 1025 1075
Irradiance [W/m2]
1500 MoFi
BiFi Fresh Snow
1400
Old Snow
1300
1200 Sand This work
Concrete
1100 Grass
Wet Soil
1000
AM1.5G
900
0.00 0.20 0.40 0.60 0.80 1.00
Albedo
A sensitivity analysis of albedo on total irradiance was conducted at conditions given in IEC 60904-3 (AM1.5G
excluding albedo) by means of modelling.
Monofacial samples are insensitive to albedo effects (1042W/m2 at 0.80 albedo), while bifacial modules are highly
sensitive and may experience significantly higher irradiances at higher albedos (1473W/m 2 at 0.80 albedo).
The current severity used in this work derives from irradiances corresponding to reflective ground conditions
(1300W/m2 at 0.51 albedo).
Higher current levels are practically hard to realise due to technology limitations of solar simulator systems.
Bypass diode
thermal test
MQT 18/MST 25
MQT01 MQT03 MQT15 MQT18.2
Temperature test
MST 21
Hot-spot
endurance test
MQT 09/MST 22
MQT01 MQT02 MQT03 MQT15
Thermal cycling
Thermal test
Reverse current
cycling test
(50 cycles)
(200 cycles) overload test
MQT11/MST 51
MQT 11/MST MST 26
51
MST01 MST16 MST17
MST01 MST16
MST01 MST16 MST17
MQT 11/ MST 51 – Thermal cycling test Applied Impp in sequences (c-Si) Applied Impp@GE in sequences (c-Si)
MQT 09/ MST 22 – Hot spot endurance Impp applied while finding the hot spot Impp@GE applied while finding the hot spot
test sensitive cells and the shading rate sensitive cells and the shading rate
Relevant test
MST 26 – Reverse current overload test - Declared IR by manufacturer × 1.35 To Consider: (n-1) × Isc@GE × 1.25 × 1.35
(if this value is higher)
where n is the maximum allowable number
of strings in parallel
Pass/Fail criteria still based on STC measurement (1000W/m2, front side only, covered rear side)
Bypass diode test was performed in accordance with MQT 18/ MST 25 for two module
types.
Tests were performed at current levels of Isc and Isc@GE sequentially.
Significantly higher temperatures were seen for higher current injection (20-30°C).
Point of attention for manufacturers, as degradation will be accelerated in the field.
ΔPmax [%]
1.0% 0.52% -1.0%
0.5% 0.26% -1.5%
-1.46%
0.0% -2.0% -1.66%
-0.5% -2.5%
-1.0% -3.0%
-1.5% -3.5%
-2.0% -4.0%
Bifacial #1 - TC200 Bifacial #1 - TC200 Bifacial #2 - TC200 Bifacial #2 - TC200
(Impp) (Impp@GE) (Impp) (Impp@GE)
TC 200 tests were conducted in accordance with MQT 11/ MST 51 . Current injection was
performed at two levels at Impp and Impp@GE.
All samples were initially stabilised in accordance with IEC 61215-1, -2.
Minor additional FF loss was observed for both sample types for higher current injection.
However, the results lack statistical significance.
It is assumed that HJT samples were influenced by metastability.
Higher sample number is required to reach a conclusion.
TC 200 tests were conducted in accordance with MQT 11/ MST 22.
Tests were performed at current levels of Isc and Isc@GE sequentially.
Higher temperatures in the range of 15-25°C occurred at higher current injection.
No failure was recorded.
Selection of worst case cells: Cells directly in front of shading objects (junction boxes
or nameplates) are prone to partial shading and may have to be prioritized in worst
case cell selection.
6/8/2018 Scientific Conference at SNEC 2018
Glass Breakage Test of Bifacial PV Modules
− Front: PID-shunts
Front glass + Na+
Na+ + Sodium ions accumulation
+ Na+ +
Metal corrosion
EVA − Irreversible
SiNx ARC − +
n-diffused emitter
+− +− + Rear: Polarization
p-type silicon wafer
Charge accumulation
− − − − − − − − Surface recombination
AlOx + + + + + + + +
SiNx ARC + + + + + + + + + + Reversible
EVA +
+ +
Rear glass +
+
S. P. Harvey et. al. Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules. IEEE Journal of
Photovoltaics, vol. 6, pp. 1440–1445, 2016.
P. Hacke, PID mechanisms and degradation rates. PV module Technology & Application, Cologne, Germany, 29-30 January 2018.
Bifacial Standard Test Condition (BSTC) has been proposed based on IEC 60904-1-2 CD and IEC
60904-3, which intends to provide supplementary information on the label:
Mr. Yabin Li, Mr. Fan Wang and Dr. Jason Nee from Yingli Solar
Mr. Thomas Guo and Dr. Jin Hao from Jinko Solar
Dr. Thomas R. Betts from Loughborough University, UK
Participators