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(A)
-2
inverter is not operating in the overmodulation region. 10
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temperature-dependent elements based on data sheets of actual
components.
The power module that will be later used for the
experimental verification is the PS22A78-E IGBT-module. It
includes six IGBTs and six free-wheeling diodes, as well as
the corresponding drivers. The thermal model includes
separate models for each transistor-diode pair, being therefore
Fig. 5. IGBT model from library «Thermal Module». Additional terminals are possible to analyze the thermal processes in each module
as follows: Q1Pc – Conduction losses for the transistor; Q1Psw – switching power device separately. Fig. 5 shows the schematic
losses for the transistor; D1Pc – conduction losses of the diode; D1Psw – representation of the power module model accounting for a
switching losses for the diode.
discrete IGBT and antiparallel diode. In addition to its
electrical terminals, the model provides four additional outputs
regarding the transistor and diode conduction and switching
losses (see Fig. 5 caption). According to the electro-thermal
analogy, power losses are represented as currents. IGBT
model output currents are then transmitted to a thermal model
of the power module structure and heat sink. The thermal
model of the power module is divided into two parts. The first
accounts for the power module semiconductor elements, the
second for the thermal model of the power module case and
heat sink. Fig. 6 shows thermal model of the power module
elements, which correspond to the transistor and diode chip
thermal analogues. Resistor and a capacitor for each model
account for the chip thermal resistance in the direction of heat
flow and its heat-sink capacity respectively. Rthjc_Q and
Fig. 6. Thermal model of the power module. Resistors Rthjc_Q и Rthjc_D
account for the thermal resistance junction-case for the transistor and diode, Rthjc_D correspond to the junction-to-case thermal resistance
respectively. Capacitors CQ and CD account for to the heat capacity of the for transistor and diode respectively, which are provided by
transistor and diode crystals respectively the power module manufacturer in the datasheet. The values
of the capacitors are determined based on the geometric
dimensions of the diode and transistor chips and their thermal
properties.
A thermal model as the one shown in Fig. 6 is used for
each transistor-diode set in the power module. The output
from this set is connected to the terminal Tc, through which
the current flows to the next element of the thermal model,
Fig. 7. Thermal model of the power module case and heat sink. Rthcs and which accounts for the properties of the power module and
Rthsa are the thermal resistance between case and heat sink, and heat sink and
ambient respectively. Cc and C_hs are the heat capacity of the power module
heat sink. This is shown in Fig. 7. Currents in Fig. 6 and 7
base metal and heat sink respectively account for power losses, while voltages account for the
temperature of each element.
III. THERMAL MODEL
IV. SIMULATION RESULTS
Evaluation of the IGBTs thermal stress is a key aspect in
Preliminary analysis of the influence of the modulation
the development of electronic power converters, as the
strategy on the thermal behavior of the power devices has
reliability of the converter is largely determined by thermal
been realized using the models described in the previous
issues. In addition to the maximum temperature of the Silicon,
section. In all the cases the motor operates with a constant
thermal cycles (i.e. periodic changes of the temperature)
torque of 10 Nm. Both CPWM and DPWM have been tested
produce thermal stress and must therefore be considered.
for the comparative analysis. Three different switching
A number of temperature estimation methods have been frequencies of 2 kHz, 5 kHz and 10 kHz have been used, the
proposed [6]-[12]. A widely accepted approach to evaluate fundamental frequency being varied from 0.1 Hz (vey low
the thermal behavior is the electro-thermal analogy method speed) up to 50 Hz (rated speed).
[6]. The main advantage of this method is that it allows to Fig. 8 and 9 shows the results of the electro-thermal
investigate the thermal behavior of the power devices in simulation using both CPWM and DPWM strategies, for the
parallel with their electrical operation and using the same case of a fundamental frequency of 0.1 Hz and 50 Hz
circuit simulation program. PSIM software will be used respectively. In both cases, the PWM frequency was 10 kHz.
therefore for this purpose. Circuit simulation software PSIM The phase voltage command, phase current and transistors and
has in its libraries a «thermal module» which can generate diodes temperatures are shown in all the cases.
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As can be seen from Fig. 8 and 9, the thermal behavior for
the case of DPWM shows a significant improvement
compared to the CPWM, with a decrease of the maximum
temperature of the crystal of ≈20%.
The time scales in Fig. 8 and 9 where chosen to visualize
the temperature oscillations due to the AC nature of the phase
currents. It is noted however that a significantly larger time
span is needed to evaluate the long term thermal behavior
associated with the heat sink. Fig. 10 shows the temperature of
the crystal, case and heat sink, using continuous and
discontinuous modulation, when the simulation spans over 300
s. Table I shows the maximum, average and peak-to-peak
temperatures in the transistors for the different operating modes.
Though not shown in the table, the thermal behavior of the
a) CPWM b) DPWM diodes is similar as for the transistors. Large values of the
Fig. 8. Simulation results. Phase voltage command (top), phase current (mid) maximum temperature can damage the crystal. On the other
and semiconductors temperature (bottom) for the case of a) continuous hand, large peak-to-peak temperatures can reduce the lifetime
modulation and b) discontinuous modulation, for a fundamental frequency of due to thermal cycling stress. It is concluded from Fig. 10 and
0.1 Hz. Tj_Q1, Tj_Q2 and Tj_D1, Tj_D2 are the top and bottom transistors Table I that DPWM is advantageous from a thermal
and diodes temperature for phase A respectively.
perspective. However, DPWM will have an adverse impact on
the current harmonic content, as shown in Fig. 3. The THD
provides a reliable metric of the current quality. Fig. 11 shows
the THD of the current, as well as the maximum, peak-to-peak
and average temperatures, as a function of the switching
frequency. The results comprise both CPWM and DPWM for
different values of the fundamental frequency. The following
conclusions are reached from Table I and Fig. 8 to Fig. 11:
1. It is readily seen comparing Fig. 8 and Fig. 9 (bottom), as
well as from the results shown in Fig. 11, that the peak-to-
peak temperature increases as the fundamental frequency
decreases. This is true both for CPWM and DPWM.
Thermal cycling stress of the power devices can be
therefore a major concern for electric drives which
operate at very low speed or zero speed with heavy loads
a) CPWM b) DPWM for long periods of time.
Fig. 9. Same results as in Fig. 8 for a fundamental frequency of 50 Hz. 2. It is observed from Fig. 11 that using the DPWM strategy,
the temperatures are in all the cases lower than for
CPWM. This result was expected due to the reduced the
switching losses with this strategy.
3. Increasing the switching frequency improves the quality
of the output current for both PWM strategies. A quite
rapid decline of the THD is observed (see Fig. 11) when
the frequency increases up to 5 kHz, the improvement for
frequencies above 5 kHz being modest. The THD is seen
to increase with the fundamental frequency. In all the
cases, the THD is larger for DPWM compared to CPWM.
a) CPWM b) DPWM Larger values of the THD will have an adverse impact in
Fig. 10. Crystal temperature Tj_Q1, case temperature Tc and heat sink
the machine, which need to be considered.
temperature T_hs for the case of a) CPWM and b) DPWM. 4. It is also observed from Fig. 11 that for both PWM
methods, all temperature indicators increase nearly
TABLE I. SEMICONDUCTOR TEMPERATURE
linearly with the switching frequency. In all the cases, the
PWM CPWM DPWM temperature is smaller for DPWM compared to CPWM.
Tj max, Tj p-p, Tj AV, Tj max, Tj p-p, Tj AV, 5. The variation of temperature with the fundamental
fi load, Hz 0
C 0
C 0
C 0
C 0
C 0
C frequency in Fig. 11 does not follow a well defined pattern.
0.1 50.4 14.2 40.3 42.7 10.3 35.1 Tjmax and Tjp-p decreases as the fundamental frequency
50 40 1.8 39.1 35 1.2 34.3
increases, while the opposite behavior is observed for
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a)
va ref
φ = 0°
b)
va ref
φ = 15°
c)
va ref
φ = 30°
d)
va ref
φ = 45°
e)
va ref
φ = 60°
f)
ia
a) CPWM b) DPWM
Fig. 11. Phase current THD and thermal behavior of the crystal for different
values of the fundamental frequency, as a function of the switching frequency
for the case of a) CPWM and b) DPWM. Tjmax, Tjp-p, TjAV account for the Fig. 12. Reference voltage with DPWM for different values of the angle φ.
maximum, peak-to-peak and average value of the crystal temperature φ=0 corresponds to the angle at which each phase voltage becomes selectable
to be clamped.
TjAV. Overall, however, Tjmax and TjAV are less
affected by the fundamental frequency than by the THD of the currents also reaches its minimum for the same
switching frequency. On the contrary, Tjp-p strongly value of φ. This result is important, as it implies that adequate
depends on the fundamental frequency, showing a weak selection of the angle φ to clamp the phase carrying the larges
dependence with the switching frequency. current, simultaneously minimizes all the temperature
indicators and THD of the currents, i.e. it is beneficial both for
All the results shown so far used a constant angle for
the power converter and for the machine.
DPWM. DPWM methods clamp each phase voltage to the DC
link voltage over 60 electrical degrees. However, it is up to the
designer to decide the location of those 60º during the 120º in V. VECTOR CONTROL WITH INTEGRATED
which each phase voltage has the largest or the smallest value TEMPERATURE MONITORING
[4]. Fig. 12-a to e show the phase voltage command for The results shown in the previous sections have illustrated
different values of the angle φ. Minimizing the switching losses the effects of the modulation strategy and the operating point
advises to select φ such that each the phase voltage is clamped of the machine on the silicon temperature and on the currents
when the current in that phase is at its maximum or minimum. quality. Unfortunately, direct measurement of silicon
Fig. 12-f shows the current, clamping the phase carrying the temperature [13] is not advisable or even viable in industrial
largest current will be achieved by selecting φ=30º (Fig. 12-c). drives, estimation methods must be used instead [15], [16].
The results shown in Fig. 10 indicate a good correlation
Fig. 13 shows the THD, as well as the maximum, peak-
between the (non-measurable) silicon and the (measurable)
to-peak and average temperature of the silicon, as a function
heat sink temperature. It is also seen in Fig. 11 that precise
of the angle φ. As expected, all the temperature indicators are
estimation of the silicon temperature requires to consider the
minimized for φ=30º. It is interesting to in this regard that the
mode of operation of the inverter.
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a) analyzed in this paper. DPWM reduce the switching losses
compared to CPWM methods, semiconductor temperature can
THD be decreased using DPWM by more than 10ºC. However,
DPWM results in an increased THD of the currents, adversely
impacting the machine temperature. The influence of the
switching frequency and the fundamental frequency on the
b)
thermal behavior of the Silicon has also been analyzed, the
first mainly affecting to the maximum temperature, the second
Tj MAX to the thermal cycling temperature. The temperature
oscillation of the semiconductor for AC drives operating a low
speeds can reach peak-to-peak values >15ºC, thermal cycling
c) stress being a concern in this case. Combined use of the
silicon and machine temperature monitoring will be key to
Tj P-P improve the reliability and life expectance of the electric drive.
VII. ACKNOWLEDGEMENTS
d) The research was performed with the support of the
Russian Science Foundation grant (project 15-19-20057).
Tj AVE REFERENCES
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