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Proceedings of the 2005 IEEE International Conference on Microelectronic Systems Education (MSE’05)
0-7695-2374-9/05 $20.00 © 2005 IEEE
test the circuit in one semester because the CMOS layers
PWELL to CONT have been prefabricated during a previous
semester[2]. The circuits are tested with a probe card
consisting of 40 pins.
5. Summary
Figure 1: Bubble Schematic of ALC.
Proceedings of the 2005 IEEE International Conference on Microelectronic Systems Education (MSE’05)
0-7695-2374-9/05 $20.00 © 2005 IEEE