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Pipelined ADC
Mohamed Dessouky
Ain Shams University
I.C. Lab.
ADC Architectures
Low-to-Medium Speed, Medium Speed, High Speed,
High Resolution Medium Resolution Low-to-Medium
Resolution
Speed ↑, Resolution ↓
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ADC Applications
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ADC Architectures
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Outline
• Introduction
• Stage Errors
• Example
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Vin-DAC
DAC
MSB 01
0100
2nd ADC
Fine LSB + 11
0011
_____
Result 0111
1st ADC
Coarse
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Two-Step ADC
• Number of comparators = 2M + 2Q – 2.
• Example: # of comparators for 8 bits
– Flash = 28 – 1 = 255
– Two-Step (5-5) = 24 + 24 – 2 = 30
• Compared to the Flash A/D converter, the two-step A/D
converter trades speed for reduced complexity and power.
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Pipelined ADC
Multiplying-DAC (MDAC)
• General extension of the two-step ADC with interstage gain.
• Trade conversion speed for latency using interstage SHA
• Speed is limited by conversion speed of one stage.
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Pipelined ADC
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C1 = C2
floating
• Phase φ1: both capacitors are
charged to Vin0.
• Phase φ2: Since node X is floating,
the second capacitor charge is floating
transferred to the first one such
that
Vout = 2Vin 0
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Outline
• Introduction
• Stage Errors
• Example
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∑ ∑ ∑
×G ×G ×G
e1 e2 ek
k
ei
• Input referred error: ein = e1 + ∑
i=2 G i −1
FS i −1
• Each error must be < LSB/2: ei ≤ G
2 N +1
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Stage Errors
ε VA
Vin
Gain/Nonlinearity error
Duty _ cycle f s t VS
Settling error SHA Residue
+ 2M
Offset
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Sub-ADC Errors
• Only the last stage errors are not corrected. However, their
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Sub-DAC Errors
• Offset:
– Equivalent to an offset in the sub-ADC
– Can be corrected by digital correction/redundancy
• Gain error:
– Equivalent to gain error in the sub-ADC + inter-stage
gain error
– Gain error in the sub-ADC can be corrected by digital
correction/redundancy
– Inter-stage SHA gain error, see later
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• Gain error:
– In the first stage, no quantization has occurred yet, SHA
gain error just causes ADC gain error.
– In the following stages, the resulting error must be at
least as linear as the combined resolution of this and
the later stages.
• Nonlinearity error:
– Same as the gain error, but includes also the first stage.
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Errors Summary
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Outline
• Introduction
• Stage Errors
• Example
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Out of range
(underflow) Input range
extension with
one additional
bit
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MSB 1000
10
LSB + 0001
001
Offset − 0010
10
_____
Result 0111
±2 LSB of comparator offset can be tolerated in the coarse ADC.
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∆ × 2 = Vref
V1
V1
Vref
+ MSB 110
1 1
2
LSB + 01
001
Offset − 01
001
Vref _____
−
2 Result 110
MSB 100
1 0
LSB + 11
011
1/4 Vref Offset − 01
001
1/4 Vref _____
Result 110
Residues
• First ADC error can be as large as ¼ Vref and still in input range.
• Both addition and subtraction operations are needed.
• To use only addition, subtract the offset from the input signal
directly.
• Offset = 1 LSB = 2 Vref / 23 = Vref / 4.
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MSB 100
1 0
LSB + 10
010
_____
Result 110
Residues
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Residue
Vref
10
Vref/4
01
-Vref/4
00
-Vref
thresholds
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Outline
• Introduction
• Stage Errors
• Example
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• 9 stages.
• First stage gives two bits
• Stage 2 to 9 give one bit + one bit for digital correction of
the previous stage.
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Number of bits/Stage
• Tradeoff between speed, power, and accuracy of each stage.
• For fewer number of bits per stage,
+ the sub-ADC comparator requirements are more relaxed
+ the inherent speed of each stage is faster because the
inter-stage gain is lower allowing higher speed due to the
fundamental gain-bandwidth tradeoff of amplifiers.
– more stages are required if there are fewer bits per stage.
– the noise and gain errors of the later stages contribute
more to the overall converter inaccuracy because of the
low inter-stage gain.
• High-speed, low-resolution specifications favor a low number
of bits per stage.
• Low-speed, high-resolution specifications tend to favor higher
number of bits per stage.
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References
• Bruce Wooley & Katelijn Vleugels, « EE315: VLSI Data Conversion
Circuits – Handouts », Department of Electrical Engineering,
Stanford University, http://www.stanford.edu/class/ee315/
• Paul G. A. Jespers, « Integrated Converters: D to A and A to D
Architectures, Analysis and Simulation », Oxford University Press,
2001.
• Georges Chien, «High-Speed, Low-Power, Low Voltage Pipelined
Analog-to-Digital Converter », M.Sc., University of California,
Berkeley, 1996.
• S. Lewis, «Optimizing the Stage Resolution in Pipelined,
Multistage, Analog-to-Digital Converters for Video-Rate
Applications», IEEE TCAS-II, Vol. 39, No. 8, August 1992.
• Andrew Masami Abo, «Design for Reliability of Low-voltage,
Switched-capacitor Circuits », Ph.D., University of California,
Berkeley, 1999.
• Behzad Razavi, « Design of Analog CMOS Integrated Circuits »,
McGraw-Hill, 2001.
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