MIL system overview

MIL System Overview EEE Parts

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

CONTENT
MIL system & DSCC MIL system & documentation MIL-STD example: MIL-STD-883
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Screening tests Qualification and Quality Conformance Procedures

General Specifications Detail Specifications Quality levels: recapitulation "From QPL to QML" Conclusion and analysis

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

MIL System & DSCC

DoD Department of Defense

DLA Defense Logistics Agency

4 Supply Centers:

DSCP Defense Supply Center, Philadelphia

DESC Defense Energy Support Center

DSCR Defense Supply Center, Richmond

DSCC Defense Supply Center, Columbus http://www.dscc.dla.mil/

- Standardization & Procurement of military parts for

the US Armed Forces, including Space Community (NASA) - MIL system documentation - Manufacturers audits (QPL/QML) - Quality levels: based on screening level for active parts / based on reliability performance for passive parts

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

MIL system & Documentation

Handbooks: MIL-HDBK -...

Guidance (and not requirements) on procedural, technical or design information

Military Standards: MIL-STD -...

Test methods for qualification and screening

General Specifications: MIL-M-..., MIL-PRF-..., ...

Generic specifications covering requirements and test procedures common to a part family

QPL: Qualified Part List QML: Qualified Manufacturer List

Detail Specifications: Slash sheets, SMD

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

MIL-STD example: MIL-STD-883

Environmental tests Mechanical tests Electrical tests (Digital) Electrical tests (Linear) Test procedures
- TM 5004: Screening Procedures - TM 5005: Qualification & Quality Conformance Procedure

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

MIL-STD example: MIL-STD-883 - Cont'

Screening tests: Test Method (TM) 5004 2 quality levels (classes): B ("Military") & S ("Space")

Refers to test methods. Example: Pind Test, method 2020

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

MIL-STD example: MIL-STD-883 - Cont'

Qualification and Quality Conformance Procedure - TM 5005
5 groups of tests and inspections: A, B, C, D, E
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intended for use in initial qualification, requalification (if product or process changes), and periodic testing for retention of qualification (QCI: Qualification Conformance Inspection) 2 classes: class S (Space level) and class B (military level)
Group A Class S &B: Electrical Tests - Table I Class S: Package tests (physical dimensions, Resistance to solvent, solderability, bond strength, seal...) + Life test - Table IIa Class B: Package tests (Resistance to solvent, solderability, bond strength) - Table IIb Group C Class B only: Life test, as already included in table IIa for Class S (group B) - Table III

Performed on each delivery lot (on samples) Group B

Performed periodically (3/6months) (not necessarily on delivery lot) Group D

Class B & S: Package tests - Table IV

Group E

Radiation Hardness Assurance (RHA) tests - Table V

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

General Specifications
Old spec: MIL-M-xxx, -C-xxx, ... (still applicable for some families) => "New spec": MIL-PRF-xxx
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PRF = Performance - To reflect acquisition reform : Dont tell the manufacturers how to manufacture their parts, just tell them how you need the parts to perform => from QPL to QML (Qualified Part list / Qualified Manufacturer List)

MIL-PRF-38535: "General Specification for Integrated Circuits (Microcircuits) Manufacturing" Superseding MIL-M-38510
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Quality levels: classes M, N, T, Q, V (also called QML-N, -M, -T, -Q, -V) - Refers to MIL -STD-883 Test methods
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Class M: covered by MIL-PRF-38535 appendix A. Class M products require a vendor self certification, not a DSCC certification. DSCC performs verification audit of M level suppliers. Documented in a SMD. Class N: plastic parts. Covered by tables for plastic parts called out in MIL-PRF-38535. Class T: Satellite and similar applications: Class T performance is defined in the manufacturers QM plan and approved by the qualifying activity. Documented in a SMD. Class Q: Hermetic (non plastic) products. Military level covered by MIL-PRF-38535 main body + appendixes C, D, E, F, G, H, J. Documented in a SMD. Class V: Space level: class Q + appendix B requirements. Documented in a SMD. QML Q Class B ("Mil") / QML V Class S ("Space")

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Q & V = main used levels

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BUT Q & V level devices may have optimization of test (test elimination, lower cost ...), due to years of data on production (with DSCC approval). => QML approach.
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Class M: manufacturer not qualified & certified by DSCC, but "self certified 883B", with DSCC validation audit. No test optimization (all "883B tests" must be performed).

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

General Specifications - Cont'

MIL-PRF-19500: "General Specification for Semiconductor Devices - Superseding MIL-S-19500

Quality levels: classes JAN, JANTX, JANTXV, JANJ, JANS - Refers to MIL -STD-750 Test methods
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Class JAN: Military level QCI Only Class JANTX: Screening and QCI without Visual inspection Class JANTXV: JANTX with Visual inspection Class JANJ: Space level product as defined in the specification sheet that shall be capable of passing the test and inspections in Appendix E for JANTXV as a minimum. Not available for all semiconductor devices. Class JANS: Highest Space level product

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

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Detail Specifications
Subordinate to generic specifications:
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ICs: Discrete: Passive:

slash sheets MIL-M-38510/xxx & SMD (Standard Microcircuit Drawing) 5962-yyyy MIL-PRF-19500/xxx MIL-PRF-zzzzz/xxx

Give parametrical and functional limits, RHA (Radiation Hardness Assurance) level, test conditions, package dimensions ... SMD Example: Driver 90C32 NSC 5962-9583401QFA

NSC

Aeroflex UTMC

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

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Quality levels: recapitulation

Integrated circuits and discrete parts: based on screening level
Part type Integrated circuits Integrated circuits Generic Specification MIL-M-38510 (old spec.) MIL-PRF-38535 Military level Class B /883B QML Q Class M Class H JANTXV (= JANTX + internal visual inspection) Space level Class S QML V Class K JANS

Hybrid integrated circuits MIL-PRF-38534 Discrete parts MIL-PRF-19500

Passive Parts: based on reliability performance => "Established Reliability" (ER)

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Definition: "The reliability rating are established on the basis of life tests for Failure Rate Levels (FRL's) ranging from :
a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FR levels are established at a 60-percent confidence level and are maintained at a 10-percent producer's risk (Exponential distribution). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours at a 90-percent confidence level (Weibull distribution)."

More used =
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C & D for Weibull FRL R & S for Exponential FRL

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

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"From QPL to QML"

QPL: Qualified Part List
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Old system based on a part by part qualification

QML: Qualified Manufacturer List

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This new system (1991) is process oriented and allows device manufacturers to qualify an entire line TRB system (Technical Review Board): periodical data review and management of eventual process changes (design, Technology, screening, QCI...) First QML devices = microcircuits => specified on SMDs - Written by manufacturer Extended to 3 families => 4 QML lists:
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QML-19500: QML-31032: QML-38534: QML-38535:

Semiconductor Devices Printed Circuit Board/Printed Wiring Board Hybrid Microcircuits Advanced Microcircuits

Main change: allows flexibility to qualified & certified manufacturers, from the baseline defined in MIL-STD-xxx Test Methods => test optimization

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"

MIL system overview

13

Conclusion and analysis

MIL system is widely used for EEE parts selection in CNES and European Space Projects
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Class 1 & 2 projects (low risk): S/V level or JANS Class 3 & 4 projects (risk-cost compromise): B/Q level or JANTXV

MIL-STD-883 (ICs) and MIL-STD-750 (discrete) specifications are reference documents for test methods, also in ESCC documents BUT, questions are open concerning quality level of MIL products, compared with ESCC products, mainly for QML Q/V level for which manufacturer is authorized to suppress some tests. Indeed, it is difficult, today, to know which tests have been suppressed...

Florence Chiavassa - Nov 2004 - CCT "Politique Composants"