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Understanding Lightwave Technology Understanding Optical Passive Device Characterization Understanding Optical Transmitters and Receivers and Their Characterization Understanding DWDM Back to Basics in Optical Communications Technology Understanding Optical Networking The Elements of Lightwave Technology
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Todays Presentations
Geometric Optics: The optic fiber as a waveguide Physical Optics and Passive Component Characterization Light Transmission, Reception and Modulation: Active Component Characterization Optical Signal Amplification and DWDM Dispersion: The evolution of the index of refraction with wavelength and polarization Characterizing the Optical Network
Total: 35%/year
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Geometric Optics
Cladding
Core
s Glas SiO2
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Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
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cvacuum n( ) cmedium
At the boundary of two media, incident light is reflected or transmitted (a.k.a., refracted), The relationship between the angles of incidence and transmission is given by Snells Law:
inc
ncore ncladding
trans
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inc
ncore ncladding
trans
Typical values: TIR ~ 80 85 Bending cables losses Only light injected in a cone of some angle smaller than NA will be contained by the fiber The spec for this is numerical aperture, NA:
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
NA
s ff to gth Cu len e av w
1 = 2a 2 = a 3 = 2a/3
a
Conducting wave guide
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Modal Dispersion:
Waveguide dispersion arises from the dependence of the group velocity on the frequency, , and the mode-cutoff frequency cutoff = 2c/cutoff.
group
2 cutoff = c 1 2
Modal dispersion occurs when a pulse is composed of waves of more than one mode.
The different modes travel at very different, speeds Modal Dispersion
1
Vgroup/c
0.5
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E = E ( r ) e j ( t z )
rse ansve ave Tr gw tandin s nal gitudi ve L on wa veling tra
Boundary conditions: Smooth decay of the electric field at the core/cladding boundary
Single mode cutoff 3 > 2 dCore /3 wavelength is larger than the fiber core diameter Single Mode: 1 < < 2 e.g., for 1.5 m,
dCore
dCore dCladding
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10 m.
Bitrate x Distance product is severely limited! 100/140 m Silica Fiber: 0.8/1.0 mm Plastic Optical Fiber: ~ 20 Mb/s km ~ 5 Mb/s km
Fiber Structure
Multi-mode: 100/140 or 200/280 m
Cladding Core
S iO 2 s Glas
NA = 0.24 TIR = 80
Primary coating (e.g., soft plastic)
140m
Diameter (r)
NA = 0.12 TIR = 85
r
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Couplers
The solution includes the smooth decay of E in the cladding
This effervescent wave travels along with the guided wave Energy travels along the cladding and its easy to get it out
Cladding
Core
Core
Cladding
20
End
Side
The distance along the fiber where the signal is in a given core depends on . . . Wavelength The distance between the cores The geometry of the two original single mode fibers
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c 2
1, 2 b
d 1
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Physical Optics
Electromagnetic waves
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Electromagnetic Spectrum
ys Ra Xlet vio tra Ul t gh Li le ht ig sib Vi ed L In r da Ra r fra RF
Frequency Wavelength
1 kHz 1 Mm
1 MHz 1 km
1 GHz 1m
1 THz 1 mm
1 PHz 1 m
1 EHz 1 nm
Frequency Wavelength
250
300 LAN
400
THz nm 400
1200
1000
800
Waves
Describe light with
= c
c 2
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Electromagnetic Waves
Recipe for creating electromagnetic waves:
Changing Electric Field, E
dE dS = B dl n 0 0 A dt C
2
dB A dS = CE dl dt
The strength of the magnetic field is small so we only consider the electric field.
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
2E E = n 0 0 2 t 2 B 2 B = n 2 0 0 2 t
2 2
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Ey
Ex
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Introduction to Polarization
Linear Polarization
Projection of E is a line
Ey
Ex
Circular Polarization
Projection of E is a circle
Ey
Ex
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S3 axis
is ax
axi s
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Coherence
Coherence the phase relationship of waves Coherent waves
Lc
Incoherent waves
Lc
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Average distance over which superposed waves lose their phase relationships
TC 1 8
1. The bandwidth determines the coherence length and time, Tc 1/(8 ), Lc c/(8 ) 2. A minimum optical bandwidth is required for a pulse of duration T, 1/(8T) Restricts the spacing of DWDM signals for given rates
LED:
DFB Laser:
Interference
Interference = effect of adding waves from different sources
Constructive Interference
+ =
Destructive Interference
Conditions for interference: waves must be coherent and have the same polarization
coherent sources add in phase PTotal (t ) = Ek sin(t + k ) k Incoherent sources 2 add in power: PTotal (t ) = Pk (t ) = [Ek sin(t + k )]
k k
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Physical Optics
Interference and Diffraction
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Optical Mux/Demux
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Waves
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Moving mirror
When the mirror moves, the interference pattern alternates light (constructive fringes) and dark (destructive fringes) on the detector. The distance between fringes is related to the wavelength of light
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Fixed Mirror
42
/2
/4
Which makes a filter Its also the foundation for a LASER, as well see soon.
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 43
Thin Films
Series of Fabry-Perot Etalons with different properties Anti-reflective coatings - must be centered at some wavelength Selective transmission/reflective coatings Many possibilities:
Incoming Spectrum Reflected Spectrum Layers
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
d' d
n n'
Transmitted Spectrum
Substrate
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FSR
1 dB
30 dB
Optical Frequency
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To make a stretch of fiber into a grating: scratch the fiber with ultra-violet light
Waves are transmitted and reflected at each scratch Regular intervals between gratings reflect one wavelength
- a notch filter
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Interferometric Filters
1, 3, . . .
3
2 is reflected by the gratings The Coupler is chosen so that the 2 couples to 2 on reflection
Only 2 emerges from 2
+ + +
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Input light
Reflected light
Drop i
Add i
Add / Drop
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
Filter reflects i
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Reflection grating
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Spectrum is Resolved
1000 slits Increases the spectral resolution Wavelengths can be resolved with amazing accuracy: 60 pm
-3 -2
sin() in units of /b
-1
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Input
Aperture
Grating angle, , determines spectral line shining through aperture Photodiode Display ADC Amplifier
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Processor
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Physical Optics
Component Characterization
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Filter Characteristics
Passband
Insertion loss Ripple Wavelengths (peak, center, edges) Bandwidths (0.5 db, 3 db, ..) Polarization dependence
i-1 i i+1
Stopband
Crosstalk rejection Bandwidths (20 db, 40 db, ..) Crosstalk Passband Crosstalk
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Source
Power Meter
Reference Device
IL(dB) = 10 log10
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Source spectrum
Transmitted spectrum
Test Solution
8614x Optical Spectrum Analyzer series Built in applications to characterize Sources, DWDM signals, Passive Components, Amplifiers Built in Broadband Sources 10 pm absolute accuracy 2 pm repeatability 60 pm resolution bandwidth 70+ dB dynamic range 600 nm 1700 nm
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Filter Transmission Spectrum (Insertion Loss) TLS Method: -Selective Source + Broadband Detector
Notch Filter
PWith DUT ( ) PWithout DUT ( )
IL = 10 log10
Reference Device
Test Solutions
Tunable Laser System/ Power Meter + Photonic Foundation Library 86082 Wavelength Domain Component Analyzer
Configurable to perform all parameter tests Scaleable to multi-channels resolution 0.1 pm Low SSE
Fast filter characterization resolution: < 1 pm Speed: > 2 sweeps/s Range: 1260 1640 nm Vertical accuracy 0.06 dB
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Reference p/n 5980-1454E: State of the art characterization of optical components for DWDM applications
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Return Loss
Total Return loss
Light Input
Angled Output
DUT
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Source
Need:
Constant power into DUT Polarization Controller (PC) either provide all states, or use a Mller matrix technique Polarization independent power meter/OSA
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Modulation
Putting information into pulses of light Internal and external modulators
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Modulation
Plogic "1"
P (mW) P avg
Plogic "0"
Time
Extinction ratio: E =
, E (dB) = 10 log10
)
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Indirect modulation:
Modulate with interference Constructive 1, destructive 0 AM sidebands dominate line width 10 Gb/s - 40 Gb/s 200 Eb/s
DC
MOD RF
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Indirect Modulation
Mach-Zehnder Principle
Split the beam and vary the optical path lengths to get: Logic 0 - destructive interference - optical path length difference of (2n-1) /2 Logic 1 - constructive interference - optical path length difference of
Split beam
The relative phase changes!
An external electric field applied to some crystals, e.g., LiNbO3, changes the index of refraction, n = n(E) 1. Use an RF modulation signal to apply a voltage across the crystal 2. Varies the index of refraction of each path 3. Change the path lengths to get desired interference Modulate the light signal!
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 76
Indirect Modulation
A solid-state based shutter
Electro-Absorptive Modulation
Pass a continuous wave through a diode Logic 0 - High reverse bias, smaller band gap light is mostly absorbed Logic 1 - No applied bias, larger band gap light transmits through
Conduction Bands
h > E gap
h < E gap
Energy Valence Bands
Continuous wave input
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Indirect Modulators
Mach-Zehnder Modulator Electro-Absorptive Modulator DFB laser with external on-chip modulator
Laser section
Modulation section
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Atomic Physics:
Light Generation
Electromagnetic radiation
Light Emitting Diodes (LED) Light Amplification by Stimulated Emission of Radiation (LASER)
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An atomic transition
2p state to a 1s state + +
2p
1s
81
Spontaneous Emission
Light is spontaneously emitted when an electron decays from a higher to a lower energy state.
In an atom
In a semiconductor
Conduction Bands
Energy
Energy
Valence Bands
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Data in
Energy
Spontaneous Emission
Valence Bands
Key characteristics Most common for 780, 850, 1300 nm Total power up to a few W Spectral width 30 to 100 nm Coherence length 0.01 to 0.1 mm No specific polarization
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
P peak P -3 dB BW
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LASER
Threshold
I P peak
P peak SMSR
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Fabry-Perot Laser
10 dBm -10 -30 -50 -70 -90 1300 1305 nm 1310
REF: 0.00 dBm
DFB Laser
10 dBm -10 -30 -50 -70 -90 1540 1545 nm 1550
REF: 0.00 dBm
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Key properties
Wavelength range 780 to 1310 nm Gigabit ethernet Spectral width < 1 nm Total power > -10 dBm Coherence length: 10 cm to 10 m Numerical aperture: 0.2 to 0.3
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n/2
High Power
P
Low SSE
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90
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Data in
LASERs
Lasers Require Stimulated Emission Population Inversion Confinement
Spontaneous Emission
Threshold
More electrons in upper energy level than lower (more photons emitted than absorbed)
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Parameters to Test
Output Power Wavelength
Power meter
Characterization of Transmitters
Optical Spectrum Analyzer, accuracy ~ 15 pm, 50 pm Interferometer-based wavelength meter, accuracy ~ 5 pm, 0.3 pm
Linewidth, chirp, modulation effects, ultra DWDM structure High Resolution Spectrometer, accuracy ~ 15 pm, 8 fm Distortion, Relative Intensity Noise (RIN), harmonic noise, Spontaneous emission/recombination relaxation effects
Lightwave Signal Analyzer
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Chirp/FM Measurement
With an HRS
Chirp = A change in the optical frequency caused by direct modulation of the laser Direct Modulation
Modulator Transmitter Interferometer Reference
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Chirp/FM Measurement
With an HRS
Indirect Modulation with a Mach Zehnder modulator
(0.2 nm span)
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Harmonic Noise
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Measures laser fluctuations at modulation frequencies The power variance spectral density, (P)2/ BW, is the fluctuation of power observed in the interval fmod to fmod +dfmod per unit modulation bandwidth, dfmod. After electrical conversion (recall (optical power)2 (electrical power) ), measure RIN from the electrical spectrum analyzer:
[dB/Hz ]
DFB Laser
Agilent 71400
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Atomic Physics:
Light Detection
Solid state photon counters responsivity Photo Diodes efficiency, gain, dark current
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Light Detectors
Photons are absorbed in an intrinsic layer of semiconductor create e - hole pairs Apply a reverse-bias potential photocurrent
Conduction Bands
Energy
Valence Bands
Quantum Efficiency = number of electrons created per photon, () Responsivity = photocurrent per unit of optical power (A/W)
iPhoto ( ) e = ( ) R ( ) = POptical ( ) hc
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 103
Photo Diodes
PIN (p-layer, intrinsic layer, n-layer)
Highly linear, low dark current Detector is followed by a Transimpedance Amplifier
n +
Intrinsic gain up to x100 lifts the optical signal above electrical noise of receiver Strong temperature dependence APD Gain Bias Voltage
Main characteristics
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Germanium (Ge) Classic detector Indium gallium arsenide (InGaAs) Smooth responsivity High speed Notice the sharp wavelength rolloff - due to Eband gap > h = hc/
R ( ) = ( ) e hc
Quantum efficiencies
90% 70%
InGaAs
Si
50% 30% 10%
Ge
0.7
1.7
Quantum efficiency
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 105
Noise
Thermal (Johnson) Noise is the intrinsic noise from the load resistor in the photodiode circuit
R = Load resistance k = Boltzmanns constant = 1.38 10-23 J/K T in Absolute, B = modulation bandwidth
iTherm rms =
4kT B R
Shot Noise, (quantum noise) is from the random arrival time of electrons in the detector- Shot noise causes the photo-current to fluctuate about a
mean, iavg and includes the dark current.
Receivers:
Need to finish detection process fast to accommodate a short pulse Larger the detector the longer the relaxation time of the detection process
Sensitivity
-28 dBm -16 dBm
Modulation rate
2.5 Gb/s 10 Gb/s
107
P = i 2 R Pelectric = ( Poptical G ) 2 R
Pelectric (dB) = 10 log Pelectric f Pelectric i = 20 log POptical f POptical i
RF
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W/A
A/W
Modulation Rate
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Modulation Rate
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113
Atomic Physics:
Optical Amplification
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Signal Attenuation
O-band
OH absorption
C-band
U-band
S-band
E-band
L-band
IR-absorption UV-absorption
1000 1200
Rayleigh Scattering
1400 1600 1800
(nm)
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Stimulated emission
Incident light stimulates the decay of an electron. Light is emitted that is identical to incident light. Same wavelength, direction, polarization, and phase
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Raman Scattering
When a bound electron is excited to some energy Eex and decays by emitting light of energy Elight , with Elight Eex it is called Raman scattering
Elight
Eex
Lifetime of the excited state is the relaxation time ~ 1 ms - metastable (Erbium) < 1 ns - unstable (SiO2)
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 118
Incoming signal
Coupler
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Output Spectrum
+10 dBm
Amplified signal spectrum - the input signal saturates the amplifier) ASE spectrum with no input
1575 nm
The relaxation time of Er causes a ~ 1 ms time scale for the ASE background to shift between levels with and without a signal
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Raman Amplifier
Wavelength
Use vibrational energy states of SiO2 instead of atomic states of a dopant Raman scattering among vibrational states Pump laser through the whole fiber - pump energy is very high - states are not metastable Gain region over ~ 100 nm centered about 13 THz above the pump frequency
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Signal (post-amp)
EDFA
Raman Amplifier
- Material is doped with Erbium - Material is pumped with 1480 or 980nm - Good for 1550nm signals
- Whole undoped fiber is pumped - Wide signal -range - Amplification throughout fiber length - High pump power required
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125
Channels: 16 Spacing: 100 GHz (~ 0.8 nm) Amplified Spontaneous Emission (ASE)
1545 nm
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
1565 nm
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1 2 n-1 n
S1 Rm1
Sd1 R1
1 2 n-1
Sn Rmn
Sdn Rn
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Parameters to Test Channel Gain Noise Figure Center Span Tilt Gain Flatness Channel Spacing
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Amplifier Characteristics
Signal Pout G = Signal Pin
Gain = 0 50 dB
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Power Meter
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 131
2. Long relaxation time (metastability) of the Erbium excited states allow direct measurement of the spontaneous emission curve
DFB/TLS Calibration Path
EDFA Gate
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002 132
Gain Compression
Total output power: Amplified signal + ASE
EDFA is in saturation if almost all Erbium excited states are consumed by amplification Total output power remains almost constant Lowest noise figure
Max -3 dB
Total Pout
Gain
-30 -20 -10
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Peak-to-Peak Deviation
Span Tilt
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The gain of Raman and semiconductor amplifiers depend strongly on signal polarization, EDFA only weakly.
Measure gain and noise figure as a function of signal polarization
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OA (DUT)
SWITCH
WDM
DFB
ATT
Power Meter
Amplifier characteristics depend on input power, wavelength, polarization Sources simulate operation (multichannel, adjustable power)
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Issues in DWDM
SM fiber can tolerate up to 50 mW (+17 dBm) Nonlinear effects start causing trouble around 10 dBm
About 100 kW/m2 ! limits available channel power to Power/channel < 50 mW/Nchannels
Optical Amplifiers have limited effective range e.g., EDFA: 1525 < < 1565 (roughly) High power densities cause nonlinear scattering
e.g., Kerr effect: n = n(E) Four Wave Mixing (FWM), self-phase modulation, . . ., noise Higher capacity 160 wavelengths 12.5 GHz spacing
Trends:
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+
Ruby "atom"
+
Excited ruby "atom"
n ( ) =
cvacuum
cmedia
The energy carried by light is determined by the frequency, not the wavelength, so the frequency of light in media doesnt change, but the wavelength does.
The index of refraction varies with wavelength, different colors travel at different speeds chromatic dispersion. The index of refraction can also vary with polarization birefringence polarization mode dispersion The heart of these phenomena is the response of the media to the electric and magnetic fields that compose the light.
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TC 1
1 thus 8 TPulse
2 or 8 cTPulse
T
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T+ T
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n( ) =
cvacuum = = cmedia 0 0 0
Die
le
t stan on ic c ctr
different boundary conditions for different wavelengths different solutions to the wave equation
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d g ( ) chromatic dispersion d
describes how the propagation time varies with wavelength in ps/nm Factor out the length and get the
g ( )
Group Delay (ps)
0
Zero dispersion wavelength, typically 1300 nm
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Phase Detector
Signal Processing
Data
Tunable RF Source
Back to Basics in Optical Communications Technology Copyright Agilent Technologies, 2002
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151
Ex
Index of refraction can vary with polarization - Crystal asymmetry and impurities n = n(, r) - Fiber cross section asymmetry
boundary conditions differ with different orientation different polarizations have different boundary conditions
T+ T
153
f ( ) =
2 3 e
2
2 2 2
Since contributions from different segments are independent, they combine to a total in quadrature (i.e., like the sides of a right triangle):
2 2 total = 12 + 2 + L + N The mean DGD, , increases with L
Total =
i2
Typical good quality fiber: 0.2 ps / km Older, poor quality fiber: Tolerate
1 2 ps / km
155
Require: < 0.1/B high quality 0.2 ps/km low quality 2 ps/km The graph is for the average,
1,000,000
Length (km)
10,000 OC-1 OC-3 100 Poor quality fiber 1 0.01 0.1 1 Data Rate (Gb/s) 10 100 OC-12
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S2
S3
I1 I2
O1 O2
J()
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Pin =
Pout
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Cannot compensate PMD with a passive device Must have feedback to monitor PMD and actively compensate Also measure PMD with Modulation phase shift and interferometric techniques
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Optical Time-Domain Reflectometer (with Power Meter, Visual Fault Finder, and Laser Source) Optical radar Measures loss vs. distance 10 m - 200 km range
Loss Fusion Bend Connector Splice Crack Fiber End
Mechanical Splice
Distance
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BER
Clock
Pseudo Random Binary Sequences provide known patterns that simulate random data Devices can be tested for BER under various stressful conditions such as clock-data delays, long runs of 1s or 0s, low power levels etc.
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BERTs
Pulse Parameters
Undershoot On Logic 1 Overshoot On Logic 1 Rise Time b1 Fall Time Half-Period Of Ringing Freq.
80%
Pulse Width
Jitter
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168
Eye Diagrams
Power (mW)
Time (ns)
Mask Tests
On the DCA
Defined masks allow conformance testing to standards Mask hits highlight problems with many signal parameters
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Jitter
The short-term, (>10Hz), variations in the time base of a signal
Ideal Clock Jittery Clock
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Characterizing Jitter
Jitter can be measured either as RMS variations or peak-peak Jitter Tolerance = Amplitude of applied sinusoidal jitter to the device under test resulting in a certain Bit Error Rate Jitter Transfer = Ratio of the output jitter amplitude to the amplitude of applied sinusoidal jitter Jitter Generation/Intrinsic Jitter = Jitter produced by the device under test Random Jitter - sum of small random processes resulting in jitter Deterministic jitter - data dependent jitter, duty cycle distortion, etc resulting in jitter
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Measurement of Jitter
TPP
= Trms
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Conclusion
A wealth of technologies have been developed for high speed networking based on a few simple physical phenomena:
Reflection and refraction (geometric optics) Optic fibers Interference Optical Spectrum Analysis high resolution distance measurements Filters, mux/demux, isolators, et cetera external modulators Atomic transitions and Raman scattering LEDs, LASERs Light detectors - PIN diodes, APDs Optical Amplifiers Index of Refraction Chromatic and Polarization Mode Dispersion