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n+ pSUBSTRATE CHANNEL
n+
IDS = 0
mA
G S
n+ p Substrate
Source Depletion Region Drain Depletion Region
D
VDS n+ _ +
VGS < VT _ +
IDS = 0
mA
G S
n+
Channel in Depletion
D
VDS n+ p Substrate _ +
MOSFET Operation
0 < VGS < VT
Channel in Depletion Majority carriers in p-type substrate (holes) are repelled by positive charge on the Gate No current flows in the channel
VGS VT
Channel in Inversion Electrons (minority carriers in substrate) are drawn into channel by positive charge on the Gate Current flows in the channel
VGS < VT _ +
IDS = 0
mA
G S
n+
Channel in Depletion
D
VDS n+ p Substrate _ +
VGS VT _ +
IDS 0
mA
G S
n+
Channel in Inversion
D
VDS n+ p Substrate _ +
Mobile charge concentration in the channel is proportional to that part of the gate-source voltage which exceeds the threshold voltage VT, that is by (VGS - VT). In this way the gate-source voltage controls the drain-source current. MOS TRANSISTOR MODEL Capacitance of gate-oxide-substrate capacitor is CG Mobile charge (electrons) in the channel is given by: Q = CG (VGS VT )
OXIDE
SILICON
OXIDE
SILICON
-ve Charge NA
-ve Charge NA
is mean transit time for electrons to cross the channel All mobile charge in the channel is swept through the drain once per transit time; hence drain current is: IDS = Q CG (VGS VT ) =
average drift velocity of the electrons in the channel under the influence of an electric field E is: v = E is the mobility or velocity per unit field strength
Let the length of the channel (distance from source to drain) be L; then if the velocity v is constant throughout the channel we can write: L v= Assume E is uniform along the entire length of the channel, and that it is created by a voltage VDS between drain and source, then: VDS E= L [Note: It will be explained later that this condition is only fulfilled if VDS << (VGS VT)]
The transit time is L2 = VDS Substitute into previous equation for IDS: IDS = CG (VGS VT )VDS 2 L
Gate capacitance CG = Cox.WL, where Cox is the gate oxide capacitance per unit area and WL is the area of the channel. Therefore: IDS W = Cox (VGS VT )VDS L
MOS Transistor
n+ L
n+
IDS
Rearrange to obtain channel resistance, Rch: R ch Note that: L R ch W and 1 R ch VGS VT L = Cox W (VGS VT )
Triode Region
The voltage in the channel varies between Source and Drain now that VDS is getting bigger; as a result the charge concentration in the channel also varies with distance from the Source This equation reduces to the earlier one if VDS is small.
Saturation Region
IDS
1 W 2 = Cox (VGS VT ) 2 L
When VDS reaches (VGS - VT) the end of the channel closest to the drain pinches off and the drain current saturates. The amount of charge induced in the channel cannot be increased beyond this level.
D
n+
IDS (A)
60 40 20 0 0 1 2 3 4 5
VT
V GS (V)
3V 2V 1V
12
VDS = 10V
Drain Current (A)
5.43
VGS = 10V
Current (A)
VGS = 8V
6.00
VGS = 6V
VGS = 4V
0.00 0.00 2.50 5.00 Input voltage (V) 7.50 10.00
Substrate
Substrate
MOSFET Transconductance
The transconductance parameter gm is defined as:
gm = IDS VGS
Where
W = Cox L
MOSFET Transconductance
gm = IDS = (VGS VT ) VGS
(VGS VT ) =
2IDS
gm = 2IDS