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Units
atoms/cm2
oC
V/cm dynes/cm2
cm3/gmol nm nm nm
Property Electron effective mass at 4oKe Longitudinal (ml/m0) Transverse (mt/m0) Density of states (m*/m0) Energy gap (see fig. 1.6) Hardness Heat capacity [1] Heat of fusion @ m.p. [1] Heat of sublimation @ m.p. [1] heat of vaporization @ m.p. [1] Hole effective mass at Heavy (m1/m0) Light (m2/m0) Density of states (m*/m0) Intrinsic carrier concentration (see fig. 1.7) ni ni2 Intrinsic Debye length L Lni Intrinsic resistivity Lattice constant Liquid density @ m.p. [1] Liquid heat capacity @ m.p. [1] Liquid thermal capacity @ m.p. [1] Liquid viscosity @ m.p. [1] Melting point [1] Minority carrier lifetime Nearest neighbor distance Percent expansion on freezing @ m.p. [1] Poissons ratio Refractive index Scattering limited velocity Electron Hole Shear modulus Surface tension @ m.p. [1] Symbol Thermal conductivity [1] Torsion modulus 4oKf
Value 0.98 0.19 1.08 1.12 7 4.78 264 4,075.0 3,812.0 0.537 0.153 0.591
Units
1.38x1010 1.90x1020 28.7 4.0x10-7 2.3x105 0.543 2.533 6.755 1.025x10-3 0.88 1,412 2 2.5x10-3 0.235 10% 0.27 3.4 1.0x107 8.4x106 7.55x1011 736 Si 0.353 3.97x1011
s nm
Units mm Hg dyne/cm2
a. Carl L. Yaws, Larry L. Dickens, Ralph Lutwak, and George Hsu, Semiconductor Industry Silicon: Physical and Thermodynamic Properties, Solid State Technol., Jan. (1981). b. J.W. Corbett, R.S. McDonald, and G.D. Watkins, The Configuration and Diffusion of Isolated Oxygen in Silicon and Germanium, J. Phys. Chem. Solids, 25, 878 (1964). c. H.J. McSkimin, Measurement of Elastic Constants at Low Temperatures by means of Ultrasonic Waves - Data for Silicon and Germanium Single Crystals, and for Fused Silica, J. Appl. Phys., 24 (8), 988 (1953). d. A. Thanailakis, Contacts Between Simple Metals and Atomically Clean Silicon, J. Phys. C, 8, 655 (1975) e. Semiconductors ed. N.B. Hannay, Reinhold (1959). f. H.D. barber, Effective Mass and Intrinsic Concentration in Silicon, SolidState Electron. 10, 1039 (1967).