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  • AT24C512 2tp

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    api-3726520
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    AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. The AT3552P version is a single metal mask option repositioning the bond pads for the SOIC package. With the exception of HBM ESD, all tests were performed at atmel's Colorado spring facility.

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    AT24C512_2tp

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    AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. The AT3552P version is a single metal mask option repositioning the bond pads for the SOIC package. With the exception of HBM ESD, all tests were performed at atmel's Colorado spring facility.

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    Attribution Non-Commercial (BY-NC)
    Скачайте в формате PDF, TXT или читайте онлайн в Scribd
    Отметить как неприемлемый контент
    36 просмотров4 страницы

    AT24C512 2tp

    Загружено:

    api-3726520
    AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. The AT3552P version is a single metal mask option repositioning the bond pads for the SOIC package. With the exception of HBM ESD, all tests were performed at atmel's Colorado spring facility.

    Авторское право:

    Attribution Non-Commercial (BY-NC)
    Скачайте в формате PDF, TXT или читайте онлайн в Scribd
    Отметить как неприемлемый контент
    из 4

    AT24C512

    (AT3552P/T)
    2-Wire Bus Serial EEPROM
    Product Qualification

    • 2325 Orchard Parkway • San Jose CA 95131 •


    The AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS
    process. With the exception of HBM ESD, all tests were performed at Atmel’s
    Colorado Springs Facility.

    This report summarizes the product level qualification data, ESD, Latchup, and Write
    Endurance for the AT24C512 Serial EEPROM. The AT3552P version is a single metal
    mask option repositioning the bond pads for the SOIC package. This version was
    evaluated for ESD and Latch Up and had the same level of performance as the
    AT3552T. This data, in conjunction with the AT35000 Process Qualification and
    Reliability Report, qualifies the AT24C512.

    Package specific qualification data is provided separately.

    • 2325 Orchard Parkway • San Jose CA 95131 •


    AT3552T Product Qualification
    ESD Characterization
    Device: AT24C512 (AT3552T)
    Lot Number: 2h1712
    Quantity Tested: 3/ lot per Voltage
    ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Mode
    Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester
    Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations

    3 Positive & 3 Negative Pulses per The Specified Pin


    Combinations
    Max Passing
    Voltage
    Pin Qty/Fail Qty/Fail Qty/Fail Qty/Fail
    Function Tested As Qty/Fail Voltage
    Name 500V 1000V 2000V 4000V
    Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 3000
    Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 3000
    A0 Address Input 3/0 3/0 3/0 3/3 3/0 3000
    A1 Address Input 3/0 3/0 3/0 3/3 3/0 3000
    A2 Address Input 3/0 3/0 3/0 3/3 3/0 3000
    WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 3000
    SCL Serial Clock Input Input 3/0 3/0 3/0 3/3 3/0 3000
    SDA Serial Data Input/Output 3/0 3/0 3/0 3/3 3/0 3000
    Functional Test Only See Above 3/0 3/0 3/0 3/3 3/0 3000
    Failing Pin Not Identified

    Machine Model Testing – JEDEC Std 22A, Method 115A


    Lot Number: 2h6886
    1 Positive & 1 Negative Pulse per The Specified Pin Combinations
    Max Passing
    Voltage
    Pin Qty/Fail Qty/Fail Qty/Fail Qty/Fail
    Function Tested As Qty/Fail Voltage
    Name 50V 100V 150V 200V
    Vcc Power Vcc 3/0 3/0 3/1 3/0 3/0 200
    Gnd Ground Gnd 3/0 3/0 3/1 3/0 3/0 200
    A0 Address Input 3/0 3/0 3/1 3/0 3/0 200
    A1 Address Input 3/0 3/0 3/1 3/0 3/0 200
    A2 Address Input 3/0 3/0 3/1 3/0 3/0 200
    WP Write Protect Input 3/0 3/0 3/1 3/0 3/0 200
    SCL Serial Clock Input Input 3/0 3/0 3/1 3/0 3/0 200
    SDA Serial Data Input/Output 3/0 3/0 3/1 3/0 3/0 200
    Functional Test Only See Above 3/0 3/0 3/1 3/0 3/0 200
    Failing Pin Not Identified

    • 2325 Orchard Parkway • San Jose CA 95131 •


    AT3552T Product Qualification
    Latch-Up Characterization
    Device: AT24C512 (AT3552T)
    Lot Number: 2h1712
    Quantity Tested: 5 per lot
    Test Method: JEDEC 78
    Test Temperature: 125C
    Over Current Test Voltage Vcc = 5.0V
    Maximum Applied Trigger Current = 200 mA
    Maximum Applied Trigger Voltage = 7.0 V

    Max Trigger Current Max Trigger Voltage


    Complianc
    Pin Passing* Passing* Passing* Passing* Compliance
    e Setting
    Name Function Tested As -I (mA) +I (mA) -V (V) +V (V) Setting (mA)
    (V)
    Vcc Power Vcc --- --- --- --- 7.0 250
    Gnd Ground Gnd --- --- --- --- --- ---
    A0 Address Input 200 200 7.0 --- --- ---
    A1 Address Input 200 200 7.0 --- --- ---
    A2 Address Input 200 200 7.0 --- --- ---
    WP Write Protect Input 200 200 7.0 --- --- ---
    SCL Serial Clock Input Input 200 200 7.0 --- --- ---
    SDA Serial Data Input 200 200 7.0 --- --- ---
    SDA Serial Data Output 200 200 7.0 --- --- ---
    * 0 Fails for Latchup or Post Stress Functional Tests.

    Write Endurance Characterization

    Device: AT24C512 (3552T)


    Lot Number: 2h1712
    Quantity Tested: 100
    Test Temperature: 25C
    Vcc: 5 Volts
    Write Mode: Page
    Highest Passing Cycles: 500,000
    Cycles To First Failure: 600,000
    Quantity Failed: 1

    • 2325 Orchard Parkway • San Jose CA 95131 •

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