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Bob B. He Topics discussed in the ICDD 1D and 2D Detector Task Group Meeting Optics and Geometry Defocusing and resolution Preferred orientation and relative intensity
XRD2:
scintillation detector
large 2 and chi range measured simultaneously measurement of oriented samples very short measuring times intensity versus 2 by integration of the data
In cases of 0D and 1D, the intensity is a superposition of slices from diffraction ring, all same geometry condition. All within diffractometer plane and same Lorentz polarization and absorption correction.
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XRD2:
XRD2:
Out of diffractometer plane and different Lorentz polarization and absorption correction at different angle.
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XRD2:
Diffraction pattern is measured at different detector swing angle to cover different 2 range.
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Lin (Cps)
10
20
30
40
2-Theta - Scale
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XRD2:
Reflection mode
Transmission mode
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XRD2 :
Defocusing at low incident angle in reflection
XRD2:
XRD2:
Cylinder detector may collect large 2 range, but with large defocusing effect at high 2 angle
Flat Cylinder BB
1.4
1.3
1.2
1.1
1.0
Lin (Cps)
0.9
0.8
0.7
0.6
0.5
0.4
0.3
R T T
3
10
20
30
0.2
0.1
2-Theta - Scale
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Sample with preferred orientation (fiber texture), relative intensity varies with angles
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The relative intensities from NIST 1976 are measured with 6 line detectors. The vertical scale is the deviation from the relative intensities measured with Bragg-Brentano system The 6 detectors show consistent deviations due to preferred orientation in NIST 1976.
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0D/1D/2D:
In BB system, the resolution can be changed with incident and receiving slits. No slits can be used in front of 1D/2D to improve the resolution. In addition to the condition of the incident X-ray beam, the resolution is determined by the detector spatial resolution and distance. The spatial resolution depends on the point spread function and the pixel size.
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Consider a very small diffraction spot (blue linedelta function) An adjacent spot red line
A perfect detector - dashed blue line. A real detector - intensity in a spread distribution. Can be measured if the separation is larger than FWHM.
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XRD2:
Summary
Many advantages of 1D and 2D detectors, such as high speed, high sensitivity and angular coverage in direction, have been recognized by XRD users. The discrepancy between diffraction patterns from conventional Bragg-Brentano system and diffractometers with 1D and 2D detectors can be analyzed and corrected. The instrument parameters for systems with 1D and 2D detectors should be investigated and considered in qualitative and quantitative phase analysis.
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XRD2:
References
Philip R. Rudolf and Brian G. Landes, Two-dimensional X-ray diffraction and scattering of microcrystalline and polymeric Materials, Spectroscopy, 9(6), pp 22-33, Jul/Aug, 1994 B. B. He and U. Preckwinkel, X-ray optics for two-dimensional diffraction, Advances in X-ray Analysis, Vol. 45, 2001. B. He, Satish Rao, and C.R. Houska, A simplified procedures for obtaining relative x-ray intensities when a texture and atomic displacements are present, J. Appl. Phys. Vol. 75, No 9, May 1994. B. B. He, Introduction to two-dimensional X-ray diffraction, Powder Diffraction, Vol. 18, No 2, June 2003.
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