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OptiX SDH Test Principles and Common Specifications


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Objectives
After this course, you will get familiar with:
The test specifications, principles, and methods of

optical interfaces and electrical ports.


The test specification, principles, and methods of bit

error performance.
The concepts, test principles, and methods of jitter and

wander.

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Contents
Principles of Testing Equipment Principles and Methods for Testing the Specifications of an Optical Interfaces Test Principles and Methods of Electrical Ports Index

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Principles of Testing Equipment


Optical Interface Types

Inter-office
Application Scenario Operating wavelength (nm) Fiber Type Transmission Distance (km) STM-1 I-1 Intraoffice 1310 G.652 2 S-1.1 Short-distance 1310 G.652 1550 G.652 1310 G.652 40 L-1.1 L-1.2 Long-distance 1550 G.652/ G.654 G.653

15 S-1.2

80 L-1.3

Rate level

STM-4

I-4

S-4.1
S-16.1

S-4.2
S-16.2

L-4.1
L-16.1

L-4.2
L-16.2

L-4.3
L-16.3

STM-16 I-16

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Principles of Testing Equipment


The Purposes of Defining the Operating Wavelength Range:

1. Ensuring sufficient flexibility in transverse compatibility.

2. When the wavelength division multiplexing (WDM) is applied, more choices of operating lengths can be provided.

Constraints for Choosing Operating Wavelength:

Modal noise-affects the transmission quality


Fiber attenuation-decreases the power Fiber dispersioncauses intersymbol interference

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Principles of Testing Equipment


Three Windows of Fiber Transmission:

1. 850 nm: for multi-mode transmission 2. 1310 nm: for single-mode transmission. The dispersion is the lowest in fiber transmission (0 dispersion) 3. 1550 nm: for single-mode transmission. The attenuation is the lowest in fiber transmission

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Principles of Testing Equipment


Fiber Types

1. G.652 fiber (dispersion-unshifted fiber): The fiber has the best dispersion performance in the 1310nm window. It can transmit the optical signals of 1310nm and 1550nm. 2. G.653 fiber (dispersion-shifted fiber): The fiber has the best dispersion performance in the 1550nm window. It can transmit the optical signals with a wavelength of 1550 nm and thus it is suitable for transmitting single-wavelength and high-speed optical signals. 3. G.655 fiber: The fiber has the best annenuation performance in the 1550 nm window. It has little dispersion and thus it can transmit the optical signals and DWDM optical signals with a wavelength of 1550 nm.

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Principles of Testing equipment


Definitions of Optical Interface Parameters

CTX

CRX

Optical Cable Optical transmit end

Optical receive end

Three types of optical parameters: Optical transmit parameters of the point S.


Optical receive parameters of point R Optical parameters between point S and point R. The criteria for defining the specification of the parameters: When the attenuation and dispersion are the worst, the regenerator sectionBER110 -10

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Principles of Testing equipment


Parameters of Point SLaser Emitter Parameters

1 Maximum 20 dB Bandwidth
The energy of single-longitudinal mode lasers focuses on the dominant mode. Hence, the spectral width is defined according to the maximum width when the maximum peak power falls to -20dB. The features of the spectrum are shown in the following figure.

P
-20dB

A
1

A
2

Maximum -20dB bandwidth is A2-A1


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Principles of Testing Equipment


Parameters of Point SLaser Emitter Parameters

2. Minimum Side-Mode Suppression Ratio (SMSR)


The minimum ratio of the mean optical power (P1) of major longitudinal mode to the optical power (P2) of the most obvious side mode in full modulation under the worst reflection condition.

SMSR10lg(P1/P2)>30dB 3 Extinction Ratio


The minimum of the ratio between the mean launched optical power (A) of the optical signals that are defined as 1s and the mean launched optical power (B) of the optical signals that are defined as 0s. EX10lg(A/B).

The ITU-T recommends EX10dB in long distance and 8.2dB in other cases.

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Principles of Testing Equipment


Parameters of Point SLaser Emitter Parameters

4 Nominal Source Type


The types of the optical components used by the optical transmitter: Light Emitting Diode (LED) Multi-longitudinal mode laser Single-longitudinal mode laser

5 The wave form of transmitting signals (eye pattern)


To prevent the receiver sensitivity from getting severely degraded, the waveform of transmitting signals must be controlled by using eye pattern mask to control the pulse shaping of optical signals.
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Principles of Testing Equipment


Parameters of Point ROptical Parameters of Receivers

BER

11010

Received optical power

Point A is the receiver sensitivity point. Point B is the overload point of optical power

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Principles of Testing Equipment


Parameters of optical channel between point S and point R

1AttenuationDecrease the optical power 2 Dispersion1dBthe power penalty of optical channel 3 ReflectionBrings interference noise

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Contents
Principles of Testing Equipment Test Principles and Methods of Optical Interfaces Index Test Principles and Methods of Electrical Ports Index

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Test Principles and Methods of Optical Interfaces Index


Mean Launched Optical Power
Concept: The index refers to the test value at reference point S (OUT port of the optical board) of the mean power of the pseudorandom binary sequence that is coupled to the fiber by the transmitter. Note: The optical power of the transmitter is relevant to the proportion of 1s in the transmitted signals. The optical power is higher when more 1 signals are contained. When the transmitted data signals are pseudorandom binary sequence, the proportion of 1s and 0s are approximately same. The optical power in this case is defined as the mean launched optical power.

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Test Principles and Methods of Optical Interfaces Index


Fiber jumper

Mean Launched Optical Power


Schematic drawing of the test Test procedure:
Optical power meter -

Optical interface board Tested optical interface


OUT IN

<a>Connect the circuit following the schematic drawing.


<b>The optical power meter is set to the desired wavelength. Wait unitll the output power is stable and then read the mean launched optical power. To achieve high accuracy of test results, more tests for a mean value is recommended. ). Caution: a) To do this test, you have to keep the fiber connector clean and well connected, and also keep the board front panel well connected and clean. b) Test the attenuation of the fiber jumper to ensure proper optical transmit power. c) Identify the optical module for choosing proper wavelength.
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Test Principles and Methods of Optical Interfaces Index


Actual received optical power Concept: The actual received optical power refers to the mean optical power that is actually received in the R reference point (the IN port of the optical board). Test Procedure: <a>Set the optical power meter to the wavelength of the board under test. <b> Choose the fiber jumper that connects with the IN port of the optical interface board in this site. Connect the fiber jumper to the IN port of the optical power meter, as shown in the following figure. <c> Read the optical power after the receive optical power is stable. This is the actual received optical power of the optical board. Caution: a) To do this test, you have to keep the fiber connector clean and well connected. b) The test value of the optical power must be 3dB higher than the sensitivity index of the optical interface board. Otherwise, you need to check the fiber connections. c) The obtained value must be 5dB lower than the overload index value of this optical interface board. Otherwise, add another attenuator at the ODF side. HUAWEI TECHNOLOGIES CO., LTD. All rights reserved Page 17

Test Principles and Methods of Optical Interfaces Index


Receiver sensitivity
Definition: Receiver sensitivity is the minimum mean optical power that a receiver can receive within the allowable bit error range (BER=110-10).Test Configuration:

SDH equipment Tributary SDH analyzer Tributary Receiver side R Power meter Transmitter side
Optical attenuator

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Test Principles and Methods of Optical Interfaces Index


Receiver sensitivity
Configure the NE test: Use the network management system to configure the cross service of the desired circuit and tributary card. (Legend: take slot 2 as PQ1, and slot 6 as SL16 to configure a bidirectional 2M service. You can also configure the service of other rate as required).

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Test Principles and Methods of Optical Interfaces Index


Receiver sensitivity
Test Procedure: <a> Connect the circuit following the configuration diagram. <b> According to the level of the channel monitoring the error codes, the SDH analyzer transmits the PRBS and transmits test signals to the IN port of the 2 Mbit/s tributary (or the circuit IN port). <c> Adjust the optical attenuator by increasing the attenuation value. As a result, the SDH analyzer generates error code. Decrease the attenuation value until the error code disappears, the receive optical power of the SDH equipment is the sensitivity.

<d> Disconnect point R, connect the optical attenuator to the optical power meter, and read the receiver optical power, namely the receiver sensitivity.

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Test Principles and Methods of Optical Interfaces Index


Receiver overload optical power
Definition: Receiver overload optical power is the maximum mean optical power that a receiver can receive within the allowable bit error range (BER=10-10)in the R reference point (the IN port of the optical board). Test Configuration:
SDH equipment Tributary Transmitter side SDH analyzer Tributary Receiver side R Power meter
Optical attenuator

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Test Principles and Methods of Optical Interfaces Index


Receiver overload optical power
Configure the NE test: Use the network management system to configure the cross service of the desired circuit and tributary card. (Legend: take slot 2 as PQ1, and slot 6 as SL16 to configure a bidirectional 2M service. You can also configure the service of other rate as required).

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Test Principles and Methods of Optical Interfaces Index


Receiver overload optical power
Test Procedure: a Connect the circuit following the configuration diagram. <b> According to the level of the channel monitoring the error codes, the SDH analyzer transmits the PRBS and transmits test signals to the 2M tributary IN port (or the circuit IN port). c) Adjust the optical attenuator by decreasing the attenuation value. Ensure the bit error tested by the SDH analyzer close to but not more than the specified BER (in general BER=10-10), and observe the test for 10 minutes. <d> Disconnect point R, connect the optical attenuator to the optical power meter and read the receiver optical power, namely the receiver overload optical power. Summary: If the power is too strong, bit errors may occur or even damage the receiving optical module; if the optical power is too low, bit errors may occur or receive no optical signals. The signals received by the optical board cannot be too strong or poor. The receive optical power must be within the specified range to ensure stability of the optical board. The overload point of the APD is -9DB, and thus easy to be broken down. Test with caution.
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Test Principles and Methods of Optical Interfaces Index


Permitted frequency deviation at the optical input interface
Definition: This index refers to the permitted frequency deviation when the received signals at the optical input interface are normal. Requirements: The accuracy of the internal oscillator of the repeater in the free-run mode should not be worse than 2010-6 . The downstream SDH equipment should be able to tolerate this kind of signals. Test configuration
20 ppm

Receiver

SDH analyzer
Trans m itter

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Test Principles and Methods of Optical Interfaces Index


Permitted frequency deviation at the optical input interface
Configure the NE test: Configure the NE test: Use the network management system to configure the cross service of the desired circuit and tributary card . (Legend: take slot 2 as PQ1, and slot 6 as SL16 to configure a bidirectional 2M service. You can also configure the service of other rate as required).

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Test Principles and Methods of Optical Interfaces Index


Permitted frequency deviation at the optical input interface
Test Procedure: <a> Connect the circuit following the configuration diagram (Loop back the tributary channel that requires bit error monitoring; in the synchronization source, trace the circuit clock). <b> The SDH analyzer transmits proper test signals (without frequency deviation and jitter) according to the rate level of the test interface. <c> Use the SDH analyzer to receive the test signals and detect bit errors at the output port of the tested equipment. The instrument gives no alarms and bit errors. <d> The SDH analyzer transmits signals with positive (+) or negative(-) frequency deviation (the range is 20ppm).No bit errors should occur in the tested equipment during the test.
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Test Principles and Methods of Optical Interfaces Index


Jitter and Wander
Definition: The jitter and wander are relevant with the schedule feature of the system. Scheduled jitter (jitter) refers to the short-time deviation from the ideal time place in the specific time (for example, best sampling time). The short-

time deviation refers to the change of the phase higher


than 10Hz. The wander refers to the long-term deviation from the ideal time place in the specific time. The longterm refers to the change of the phase lower than 10 Hz.

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Test Principles and Methods of Optical Interfaces Index


SDH Input Jitter Tolerance at the SDH port
Definition: For STM-N optical interface the input jitter tolerance is the peakto-peak amplitude of sinusoidal jitter in case of 1dB power penalty. The parameter defines that when the SDH NEs are interconnected to transmit STM-N signals, the input jitter tolerance of the current NE should contain the output jitter generated by the upper NEs. Test configuration

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Test Principles and Methods of Optical Interfaces Index


Input jitter tolerance at the SDH port
Configure the NE test: Configure the NE test: Use the network management system to configure the cross service of the desired circuit and tributary card . (Legend: take slot 2 as PQ1, and slot 6 as SL16 to configure a bidirectional 2M service. You can also configure the service of other rate as required).

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Test Principles and Methods of Optical Interface Indexes


Input jitter tolerance at the SDH port
Test Procedure <a>Connect the circuit following the configuration diagram (Loop back the tributary channel to be monitored and ensure that the path is accessible for the service on the equipment and the SDH analyzer ). <b>The SDH analyzer transmits test signals to the tested interface according to the rate level of the interface. <c> Start the auto test for the jitter tolerance of the SDH analyzer and record the jitter tolerance limits of each frequency. The values should comply with the test standards. It is recommended that you start the print function of the SDH analyzer. The test curve should be higher than the template curve. The index and template of the G.958 type A are as follows:
STM level STM-1 (electrical interface) STM-1 (optical interface) STM-4 STM-16 UIp-p A2 1.5 1.5 1.5 1.5 A1 0.15 0.15 0.15 0.15 f0 6.5 6.5 25 100 Frequency (kHz ft 65 65 250 1000

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Test Principles and Methods of Optical Interfaces Index


Output jitter at the SDH port
Definition: The output jitter at the SDH port refers to the jitter occurred at the output port of the NE. The purpose of the test is to measure the jitter of the desired entity (SDH NE or network interface), to ensure the output jitter of the port does not exceed the limit specified in the NE input port. Note: The SDH output jitter indexes are classified into the index in the case of the whole frequency band (B1 index) and the index in the case of the high frequency band (B2 index) The output jitter amplitude varies in different frequency bands. The jitter has more power in the low frequency part. Use a band-pass filter or high-pass filter to test the jitter. If the filter is shut down, the jitter value of the whole frequency band is tested, namely, the jitter value of the frequency with the maximum jitter in the whole frequency band is displayed. Technical specifications:
Interface Rate STM-1 Measurement Filter 500Hz1.3MHz 65kHz1.3MHz Peak jitter rate 0.5UIpp 0.1UIpp

1000Hz5MHz STM-4
250kHz5MHz 5kHz20MHz STM-16 1MHz20MHz 10kHz80MHz STM-64 4MHz80MHz

0.5UIpp
0.1UIpp 0.5UIpp 0.1UIpp 0.5UIpp 0.1UIpp

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Test Principles and Methods of Optical Interfaces Index


Output jitter at the SDH port
Configuring a service by using the single station: Use the T2000 to configure the cross-connect service of the desired line board and tributary board. (Legend: In the following figure, a bidirectional 2 Mbit/s add/drop service is configured between the PQ1 in slot 2 and the SL16 in slot 6. You can also configure the service of other rate as required).

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Test Principles and Methods of Optical Interfaces Index


Output jitter at the SDH port

Test configuration:
SDH analyzer

Cross-connect

TX

RX

TX

Line board

Tributary

board

board

Test Procedure:

RX

TX

RX

Cable loopback

<a>Connect the circuit following the configuration diagram (Loop back the tributary channel to be monitored and ensure that the path is accessible for the service on the equipment and the SDH analyzer ). <b>The SDH analyzer transmits proper test signals (transmits signals without jitter to the input port corresponding to the tested output port) according to the rate of the tested interface. <c> Set proper test filter for the jitter tester as required. (Select B1, HP1+LP, B2, and HP2+LP). <d>Perform tests not less than 60s continuously and read the maximum peakpeak jitter value.
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Principles of Testing Equipment Test Principles and Methods of Optical Interfaces Index Test Principles and Methods of Electrical Ports Index

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Test Principles and Methods of Electrical Ports Index

Allowed Frequency Deviation at Input Interface of PDH


Definition: This index refers to the permitted maximum frequency deviation when the received signals at the optical input interface are normal. Technical specifications:
Bit Rate (kbit/s 1544VC-11 2048VC-12 34368VC-3 44736VC-3 Tolerance 3210-6 154400050bit/s 5010-6 2048000103bit/s 2010-6 34368000688bit/s 20 10-6 44736000895bit/s 2010-5 1555200003111bit/s Code pattern B8ZSAMI HDB3 HDB3 B3ZS CMI PRBS for test 220-1 215-1 223-1 220-1 223-1

Test Configuration:

155520

Test configuration Pattern generator

SDH receiver side

BER tester PDH/SDH analyzer

SDH transmitter side

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Test Principles and Methods of Electrical Ports Index


Allowed Frequency Deviation at the PDH Input Interface
Test Procedure: a) Connect the circuit following the previous diagram (Configure the tested system using the NMS system; configure the service at the tested port, Perform a selfloop in the monitored optical port by using a fiber jumper to ensure that the path is accessible for the service on the equipment and SDH analyzer); b) The pattern generator or SDH/PDH analyzer transmits proper test signals to the tested input interface according to the interface type and rate level. Adjust the system to the normal work state, no bit errors occur. c )Adjust the frequency deviation to the required range. The whole equipment works normally and no bit errors occur. d) When you need to test the actual frequency deviation tolerance, you can increase the positive and negative frequency deviations until bit errors disappear. Record the relevant frequency deviations.

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Test Principles and Methods of Electrical Ports Index


Input jitter tolerance at the PDH port

Definition: To ensure the stability of the telecommunication equipment, the transmission equipment must tolerate the maximum jitter occurred in the transmission process. Test configuration

Tributary board
SDH analyzer

Cross-connect

Line board

board

Clock tracing

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Test Principles and Methods of Electrical Ports Index

Input jitter tolerance at the PDH port Test Procedure: a) Connect the circuit according to the previous diagram (Configure the test system using the NMS system. Configure the service in the tested ports). b) Transmit test signals to the tested tributary input port according to the rate level. c) Set the auto test function of the jitter tolerance and then start the test. d) Wait for a while and you can obtain complete input jitter tolerance from the meter. Print the results. The test curve must be over the template curve.

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Test Principles and Methods of Electrical Ports Index


PDH Port Output Jitter
Definition: To ensure the stability of telecommunication equipment, the jitter of the output signals should not be greater than the maximum jitter tolerance at the receive side. Technical specifications:
Interface bit rate Filter bandwidth B110Hz40kHz 1544kbit/s B28kHz40kHz 2048kb/s <0.1UIpp Requirement <1.5UIpp

B120Hz100kHz
B218kHz100kHz B1100Hz800kHz B210kHz800kHz B110Hz400kHz B230kHz400kHz

< 1.5UIpp
< 0.2UIpp <1.5UIpp < 0.15UIpp <1.5UIpp <0.1UIpp

34368kb/s

Test configuration

44736kbit/s

Cross-connect

Line board

Tributary

board

board

SDH analyzer

Cable/Fiber loopback

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Test Principles and Methods of Electrical Ports Index


PDH Optical Port Output Jitter
Test Procedure: <a>Connect the circuit following the previous diagram (Configure the tested system using the NMS system; configure the service at the tested port, Self-loop the optical interface to be monitored using the fiber jumper to ensure that the path is accessible for the service on the equipment and SDH analyzer); <b>The SDH analyzer transmits proper test signals (transmits signals without jitter to the input port corresponding to the tested output port) according to the rate of the tested interface. <c> Set proper test filter for the jitter tester as required. (Select B1, HP1+LP, B2, and HP2+LP). <d>Perform tests not less than 60s continuously and read the maximum peak-peak jitter value.

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Test Principles and Methods of Electrical Ports Index


Mapping jitter at the PDH tributary port
Definition: When PDH signals with different frequency deviations are input at a PDH tributary port of the SDH equipment, in the absence of pointer justifications in STM-N signals, the maximum jitter of the output PDH tributary signals at the PDH tributary port is the mapping jitter. Test configuration
Cross-connect

TX

RX
Line board

Tributary board

board

RX SDH analyzer

TX

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Test Principles and Methods of Electrical Ports Index


Mapping jitter at the PDH tributary port

Test Procedure:
<a> Connect the circuit following the test diagram (configure the tested NE using the NMS system. Configure the service at the tributary port to be tested. Observe the SDH analyzer, if no alarms and bit errors occur, perform the test). <b>The SDH analyzer selects proper PRBS according to the rate level of the PDH tributary output port. Set the nominal value (without frequency deviation) for the bit rate, and insert the value into the relevant VC of the tested PDH tributary. The STM-N signals have no pointer justification. <c>Set proper filters (select HP1+LP and HP2+LP) for the jitter tester according to the rate level of the PDH tributary port and the requirements. <d>At the PDH tributary output port, use the jitter tester to test for more than 60s continuously and read the peak-peak value of the jitter generated by the mapping.

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Test Principles and Methods of Electrical Ports Index

Mapping jitter at the PDH tributary port


<e>The SDH analyzer changes the bit rate of the PRBS, namely, adds a certain frequency deviation f,f=5,1015ppm. Repeat this step, and you will obtain some mapping jitter data of different frequency deviations. <f>In the data, the jitter in the case of a certain frequency deviation is obvious. Change the bit rate of the PRBS with smaller frequency deviation step (for example, 1 ppm) close to the specific frequency deviation. Repeat the operation in step E to find out the maximum mapping jitter. Note: The frequency deviation in the test refers to that of the PDH service, namely, the frequency deviation of VC-12 in the STM-N signals, not the frequency deviation of line signals. Normally, STM-1 frequency deviation index is 20ppm. The 50ppm frequency deviation is not allowed. The indexes of the mapping jitter are as follows:
PDH Rate (kbit/s) Tolerance range of bit rate Mapping Jitter Filter characteristics

F1-F4 UI 2,048 34,368 139,264 50 20 15 0.4 0.4 0.4

F3-F4 UI 0.075 0.075 0.075

F1 High pass 20Hz 200Hz 200Hz

F3 High pass 18kHz 10kHz 10kHz

F4 Low pass 100kHz 800kHz 3500kHz

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Test Principles and Methods of Electrical Ports Index


Combined Jitter at PDH Tributary interface
Definition: At the SDH line port, input the signals of pointer test sequence that comply with the G.783 specifications, in this case, the pointer justification occurs on the SDH equipment. Change the frequency deviation of the input signal, the PDH tributary port outputs signals and the tested maximum jitter is the combined jitter of the equipment. Test configuration:
Cross-connect
TX RX

Tributary board
RX SDH analyzer

Line board

board
TX

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Test Principles and Methods of Electrical Ports Index


Combined jitter at PDH Tributary interface
Test Procedure: <a> Connect the circuit following the test diagram (configure the tested NE using the NMS system. Configure the service at the tributary port to be tested. Observe the SDH analyzer. If no alarms and bit errors occur, perform the test).) <b>The SDH analyzer selects the test signal according to the level of the PDH tributary output interface and transmits the G.783-compliant pointer test sequence. <c> At the output port of the PDH tributary, set proper filters (select HP1+LP and HP2+LP ) for the jitter tester, and test for not less than 60s. <d>Change the frequency deviation of the input signal and find the maximum output jitter value, namely the combined jitter.

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Bit Error Performance Indexes


Bit Error Performance Indexes
Definition: A bit error means that an error occurs on some bits in the code stream after the bits are received, judged and regenerated, and the error impairs the quality of information transmitted. Measuring the Performance of Bit Errors: Traditional measurement (G.821) is to measure the performance of bit errors in the digital reference circuit of the 27500 km end-end in the 64kbit/s channel. The measurement is based on the bit errors. Using bits to measure the performance of bit errors is limited when the transmission rate increases. Currently, the performance of bit errors in the channels with high bit rates (2M or 2M higher) is defined in ITU-T G.826 and M.2100, and the measurement unit is blocks (B1, B2, and B3 monitors bit error blocks). As a result, a group of parameters based on blocks are generated. The meanings of the parameters are described as follows:

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Bit Error Performance Indexes


Bit Error Performance Indexes

Block Error
The block with error bits in the transmission is called error block. Errored Second (ES) and Error Second Ratio (ESR)

The errored second (ES) indicates a one-second period that contains one or more errored blocks. The ratio between the total errored second (occurred in the specified test time) and the total available time is called errored second ratio.

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Bit Error Performance Indexes


Serious Errored Second (SES) and Serious Errored

Second Ratio (SESR)


The serious errored second (SES) refers to a one-second period that contains more than 30% errored blocks or at least one SDP. The SDP is a period of at least four consecutive blocks or 1 ms (taking the longer one) where the error ratios of all the consecutive blocks are more than or equal to 10-2 or loss of signal occurs. The SESR refers to the ratio between the SES total (occurred in the test period) and the total available time. The SES is generally burst error block generated by pulse interference. Hence, the SESR reflects the anti-interference capability of the equipment.

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Bit Error Performance Indexes


Background Block Error (BBE) and Background

Block Error Ratio (BBER)


The BBE refers to the block errors occurred out of the unavailable time and SSE period. The BBER refers to the ratio between the BBE and the block total subtracting blocks in the unavailable time and SES period. If the test lasts for long, the BBER reflects the bit errors in the equipment and is relevant with performance stability of the components adopted.

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Bit Error Performance Indexes


Test configuration:
NE SDH analyzer NE
PDH Interface Inloop

NE

NE

Test Procedure
1) Connect the circuit following the previous diagram (Configure the NE to be tested using the NMS system. Configure the service at the tributary port of the NE to be tested. Set the loopback at the port). 2)The SDH analyzer selects proper PRBS to transmit test signals to the input port according to the rate level of the desired system interface.3) 24After 24 hours, read (or print) the test result from the test instrument.

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Bit Error Performance Indexes (Instances)


Bit error performance indexes Test (example)
Following the test diagram, connect the SDH analyzer to the NE3 service port, at the DDF side, self-loop all 2Mbit/s services of NE1.

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Bit Error Performance Indexes (Instances)


Bit error performance indexes Test (example)
Assume that 63X2Mbit/s services are configured between NE1 and NE3. Connect the 63x2Mbit/s services of NE3 in series following the diagram, and connect the services to the SDH analyzer. Perform an inloop for all service ports in the DDF. Set the meter into the Print state and perform the 24-hour BER test. Print the test result 24 hours later. The test result must show that no bit error occurs. A small number of pointer justifications are allowed. The number of justifications must be less than 6. Note: In the case of an MSP ring, perform a 24-hour BER test for the working channel and a 12-hour BER test for the protection channel. The test result must show that no bit error occurs. The number of pointer justifications must be less than 6. If the first 24-hour BER test shows that bit errors occur, rectify the fault and perform another 24-hour BER test. Continually perform the test until no bit error occurs.

Notice

During the test, unrelated personnel are forbidden to enter the test environment. It is forbidden to touch optical fibers, wires, and cables randomly. Do not perform swapping operations to the power supply equipment within the test area. All rights reserved Page 52

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Quiz
What items are included in the optical interface test? What items are included in the electrical interface test? What are the cautions in the optical interface test?

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Conclusion

The mean launched optical power, actual received optical power, and bit error are mandatory items. You need to master the concepts, test principles, and test methods of these items.
The receiver sensitivity, receiver overload optical power, allowed frequency deviation at optical input port, input jitter tolerance at the SDH port, output jitter tolerance at the SDH port, permitted frequency deviation at the PDH input port, Input jitter tolerance at the PDH port, output jitter and mapping jitter at the PDH port, and combined jitter are optional items. You need to know the concepts, test principles, and test methods.

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Thanks!
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