Electrical Fast Transients

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 EFT
• It is possible for the transients to be coupled into
a nearby electronics device by inductive
coupling but, generally, they enter the product
via the cable connections.
• On signal ports, the spikes are almost invariably
in common mode, i.e. on all wires at the same
amplitude with respect to external earth.
• On the mains port, they may appear either in
common mode or differentially between phases.
Common mode coupling includes the protective
earth wire.
E Field and M Field Coupling
 EFT
• Poor filtering or inadequate screen termination
on each interface then lets these transients pass
into the electronic circuits where they appear as
interfering signals at sensitive nodes.
• Digital circuits tend to be more susceptible, since
each short pulse can appear as a valid digital
signal.
• Occurring in bursts, there is a higher probability
that one or more pulses will coincide with a
critical timing edge.
• Analogue circuits can also be affected, typically
by saturation of sensitive amplifiers.
 Electrical Fast Transient Effect
• Internal circuit design is bandwidth limited
wherever possible, and the PCB layout
prevents large interference voltages from
appearing within the circuit .
• Interfaces must be filtered or screened to
a structural low impedance earth so that
common mode pulses are prevented from
entering the circuit.
 Test Standards
• First Standard IEC 801-4 published in 1984.
• Changed later to 1000-4-4.
• IEC 61000-4-4 since 1995.
• Currently working on two new standards (IEC 61967 and
IEC 62132) for the characterization of the
electromagnetic emission and the immunity of ICs.
• IEC 62132 describes several measurement methods.
The susceptibility against transient disturbances, such as
fast transients (bursts) is currently not included in this
standard.
 IEC 61000-4-4 Standard
• Basic standard for testing fast transient immunity .
• Accredited labs run world wide.
• The IEC 61000-4-4 defines immunity requirements
and test methods for electrical and electronic equipment
to repetitive electrical fast transients such as those
originating from switching transients (interruption of
inductive loads, relay contact bounce…).
• The standard also defines the test voltage waveform, the range of
the test levels as well as the test equipment and setup for
coupling transients into power supply, control and signal
ports of electrical and electronic equipment.
• It applies a specified burst waveform via a defined coupling network
to the mains connection and via a defined clamp device to any
signal connection. Only conducted coupling is used.
 EFT Test
• A specified burst waveform is applied via a
defined coupling network to the mains
connection and via a defined clamp device to
any signal connection. Only conducted coupling
is used.
• To standardise the test, the waveshape, number
of pulses, their frequency and the burst length
and repetition frequency are all specified.
• The source impedance of the generator is
required to be 50 Ohms and the waveform is
calibrated into a 50 Ohms load . Actual load
impedance may vary.
EFT TESTS
Test Levels
Pulse Generator
Measurement Setup

Coupling Capacitance = 800 nF

Internal Resistance = 10 Ohms
Burst Amplitude = 3 – 37 V
Failures
 Failures
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Thank You