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Simulation based
Vectors are given, circuit is known, simulation is performed. The instantaneous currents are averaged.
Power is also dissipated due to glitching activity in a circuit. Glitches occur due to different delays through different paths of the circuit. A hazardous transition occurs at the output of the AND gate due to different delays through two different paths converging at the inputs to the AND gate.
The glitches can die while propagating through a logic gate if the width of the glitch is much smaller than the inertial delay of the logic gate.
Mean ergodic: If a constant-mean process g(t) has a finite variance and is such that g(t) and g(t+) become uncorrelated as then g(t) is mean ergodic. Definition 3.1 (Signal Probability) The signal probability of signal g(t) is given by
P(g) = lim T -TT g(t) dt
Definition 3.2 (Signal Activity) The signal activity of a logic signal g(t) is given by A(g) = lim T ng(T)/T where ng(t) is the number of transitions of g(t) in the time interval between T/2 and T/2.
If the primary inputs to the circuit are modeled as mutually independent SSS mean-ergodic 0-1 process, then the probability of signal g(t) assuming the logic value 1 at any given time t becomes a constant, independent of time and is referred to as the equilibrium signal probability of random quantity g(t) and is denoted by P(g=1), which we refer to simply as signal probability. Hence, A(g) becomes the expected number of transitions per unit time.
Step 3: Suppress all exponents in a given expression to obtain the correct probability for that signal.
Reconvergent fanout can produce expressions for the signal probability of internal nodes having exponents greater than 1. Intuitively, in probability expressions involving independent primary inputs, such exponents cannot be present.
If the primary inputs xi, i = 1, , n, to logic gate M are not spatially correlated, then the signal activity at output fj is given by
A(fj) = i=1n P(fj / xi) A(xi) (3.6) P(fj / xi) signifies the probability of sensitizing input xi to output fj , while P(fj / xi) A(xi) is the contribution of switching activity at output fj due to input xi only.
Equation (3.6) fails to consider the effect of simultaneous switching of signals at logic gate inputs and, hence, can grossly overestimate signal activity.
where t/2 is obtained from a t-distribution with N 1 degrees of freedom and Pavg is the true average power. p - Pavg / p < t/2 s / (p* N1/2) < : the desired percentage error for the given confidence level (1 - ) * 100%.
0
0 0 0
1
0 1 X
X
0 X X
Logic simulation can be used to detect probable static hazards by using a sixvalued logic. The estimate is pessimistic because some of these hazards might not be present under certain delay conditions.
1
0
R
0
F
0
SH0
0
SH1
0
1
R F SH0 SH1
0
0 0 0 0
1
R F SH0 SH1
R
R SH0 SH0 R
F
SH0 F SH0 F
SH0
SH0 SH0 SH0 SH0
SH1
R F SH0 SH1
{1000, 1100, 1110} corresponding to fast, medium, and slow falling signals. Eight-valued logic is required for logic simulation to detect dynamic hazard.
0 static 0 1 static 1 R - rising F - falling SH0 static 0 hazard SH1 static 1 hazard DH0 dynamic 0 hazard DH1 dynamic 1 hazard
0000 1111 0001, 0011, 0111 1000, 1100, 1110 0100, 0010, 0110 1011, 1101, 1001 1010 0101
Activity a
a = F(PI, D) PI: primary input vectors, D: a random vector consisting of all the random variables of gate delays.
While the different nonzero-delay models do track each other (except for one circuit, C6288, which has a depth of about 120 levels), it is clear that the nonzero-delay models can produce very different results compared to the zero-delay case. The difference is due to the glitching activity.
For some circuits minimum and maximum average power can vary widely if uncertain specifications of primary inputs exist.
They are 20 times greater than those obtained using the zero-delay model.
B fixed: X1
Z1 X3
A Varies: X2
Y
X1 X2
Z0 X3
Cy
The signal probabilities of the lower order bits of a word are essentially uncorrelated in space and time with a signal probability of 0.5 and switching activity of 0.25 and are essentially independent of the data distributions. The higher order bits show complete dependence because they represent the sign extensions in twos complement representation.
For a discrete variable x, which can take n different values, the entropy is defined as
H(x) = i=1n pi log2 1/pi, where pi is the probability that x takes the ith value xi. Given the input signal probabilities of 0.5, the output entropy of the boolean function can be used to predict the area of its average minimized implementation as A = K* (2n / n)* H(Y) where A is the area of the implementation and K is the proportionality constant, Y = f(X).
Two approaches to determining lower bounds of maximum dynamic power in static CMOS circuits: deterministic (automatic test generation based) and simulation-based approaches.
The instantaneous power dissipation due to two consecutive input binary vectors is proportional to Pi = for all gates T(g) * C(g), where C(g) denotes the output capacitance of gate g and T(g) is a binary variable that indicates whether gate g switches or not corresponding to the two input vectors.
To justify the transition [ i.e., to see if T(*) = 1 is achievable], the modified justification mechanism in a 5-V D algorithm (an ATG algorithm for stuck-at faults) is used. In CMOS circuits, the capacitive load of a logic gate can be approximated by the fanout of the gate. Pi = for all gates [g(V1) g(V2)] * F(g), where V1, V2 denote two consecutive input binary vectors to the circuit, g(*) represents the boolean function of gate g in term of PIs, and F(g) denotes the number of fanouts of gate
The justification mechanism in the algorithm includes two processes backtracing and implication. Two composite values to be in conflict if they have 0 and 1 at the same position. Experiments show the test generation approach is superior to the traditional simulation-based technique in both efficiency and the quality of the results.
1 a 1
GUT D h D i
b g 1
1 c 0 d 1 e
Each gate is associated with a stack to store all the composite logic values a/b that have been assigned to g [ a and b denotes g(V1) and g(V2), respectively]. The variables a and b can be 1, 0, or u (unknown). At each gate, the top of the stack stores the most recently updated value for the gate.
Determine frequency of each net fy = ty/(2T), where ty if the number of logic switches of net y and T is the simulation time, to compute dynamic power Pdyn = CyVDD2fy Pre-layout so must estimate Cy
Capacitance estimation
Device (diffusion and gate) capacitance
Depends on width/length of driving gates source/drain diffusion and fanout gates Part of characterization of cell based designs
Wiring capacitance
Depends on placement and routing Wire load predict wire length of a net from the number of pins incident to the net
Mapping table can be constructed from historical data of existing designs
Assumes given correct signal probabilities for primary inputs (and if wrong, large errors are possible) Given average power dissipation values