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Full Automation Maximum benefit of scaling High speed , low power Robustness
Design metrics
INVERTER
STATIC CHARACTERISTICS
PRACTICAL VTC
SWITCHING THRESHOLD
Vth Output changes its state
Noise Margins
Static characteristics
Operating regions
VOH
VOL
VIL
VIH
V th -switching threshold
Critical voltage
Nothing We can design for wide noise margins Set Vth= Vdd
Choose appropriate VM
MOS
CONSTANT
Sub-threshold current
Sub-threshold operation
Required----
Determine g at Vin~Vm
Variation in VM by (w/L)
Critical voltage
Nothing We can design for wide noise margins Set Vth= Vdd
Choose appropriate VM
Effect on kR
Switching characteristics
Capacitive load
Cgd
Equivalence factor
|V GS|
Ron
ln(0.5)
VDD
0.5 0.36
Vin = V DD RonCL
t
Determination of Req
Method 2
t pHL = C
(V 50% -VDD) I av
V out
I av
CL
tpLH = C L (V50%-VOL)
Iav
V in = V
DD
WHERE
Method-3
Differential equation approach
accurate
tpHL
tpLH
0.3
tpHL(nsec)
0.25
0.2
0.15
0.2
0.8
Input slope
or
0.25
Increase VDD
tp(normalized)
1.2
1.4
1.6
1.8
2.2
2.4
DD
(V)
Device Sizing
3.8 3.6 3.4 3.2
tp(sec)
x 10
-11
DELAY REDUCTION
Normalized Delay
85
86
88
89
Delay contributors
is speed of basic transistor p-intrinsic delay of the gate due to its own internal capacitances hcombines the effect of external load with sizes of transistors g effect of circuit topology
90
Observations
Logical effort describes relative ability of gate topology to deliver current [defined to be 1(best av. of charge and discharge both] for an inverter) Electrical effort is the ratio of output to input capacitance Delay increases with electrical effort Delay increases ---More complex gates have greater logical effort and parasitic delay
91
Estimation of
Ring OscillatorCOMPARING
DIFFERENT TECHNOLOGIES
T=2
tp N
2 N tp >> tf +tr
95
Different gates
96
Observations
More complex gates have larger logical efforts Logical efforts grow with increase in no. of inputs Complex gates exhibit high g, greater delay
97
Parasitic delay
It is fixed for a gate More complex gatehigher parasitic delay Ref. Pinv=1 (inverter parasitic delay ) For other gates , parasitic delay is written in terms of pinv
98
Parasitic delay
99
101
103
Skewed Gates
Best WP/WN for min delay other then un/up
r=k
108
Case---=2, =3
109
Wp/Wn=P/N = r = k gives equal rise and fall delay =2; =2; k=1 for inv; k=1/2 for nand2, k=2 for Nor2
=2; =3;
k=2/3 for inv; k=1/3 for nand2, K=4/3 for Nor2
du (1/p) (1+r)
EE141
112
SPICE simulations were done (bottom left) for a fixed extrinsic load of 100fF with increasing transistor width (Wp/Wn = 2.75)
Results show diminishing returns beyond a certain Wn (say about 6 um) due to effect of the increasing drain capacitance on the overall capacitive load
R= Wp/Wn
Unconstrained increase in transistor width in order to improve circuit delay is often a poor tradeoff due to the high cost of silicon real estate on the wafer!!
Star-delta-transformation Vout=ZBC/(ZAB+ZBC) Vout=[(2/RC)/(S+2/RC)]*(1/S) =(1/s)-1/(s+2/RC) =U(t)[1-exp(-2/RC)t] FOR V50% delay tp=(RC ln2)/2=0.35 RC
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Where BH is
EE141
127
Observations regarding F
F depends on only topology and loading F is Indep. of transistor sizes F is unchanged if inverters are added or removed
EE141
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Path Delay D
Sum of delay of all stages
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On Differentiation:
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Thus, minimum stage effort of each stage reqd. for min. delay along a path is
We shd. choose transistor sizes such that stage effort is same for all blocks
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Example
Compute for each stage
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Chain Of Inverters
In
1 Ci u u2 u N-1
Out
C1
C2 CL
uopt = e
135
To find optimum N
If pinv = 0,
EE141 136
For stages in chain with inverters Best delay per stage , d = gh + pinv d = + pinv
137
Graphical sol
As pinv grows, adding inverters become less advantageous
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Chain Of Inverters
BEST NO OF STAGES
In
1 Ci u u2 u N-1
Out
C1
C2 CL
uopt = e
Chain Of Inverters
gu= gav x [2 / (+)] gd= gav x [2 / (+)]
BEST NO OF STAGES
In
1 Ci u u2 u N-1
Out
C1
C2 CL
uopt = e
FO4 DELAY
143
Wrong no of stages
144
EE141 145
4sW C=16
=4/ s
16 W
C=4s = 4s
=4
Mis-sized
D = gh + pinv
= (4s + 4/s + 4 ) + 3 pinv = 15 units (s=1)
146
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Power dissipation
DEC 21164
Rechargable Lithium
40
Ni-Metal Hydride
30 20 10 0 65 70 75 80 85 90 95
Nickel-Cadium
Leakage
Leaking diodes and transistors
Power consumption
4 components Static power consumption Short circuit power consumption Leakage power consumption Dynamic power consumption
Short circuit current flows during the brief transient when the pull down and pull up devices both conduct at the same time where one (or both) of the devices are in saturation
Modelling
t1- t2, Mos operates in saturation At t2, current reaches its maximum value At this point vin=vdd/2, because inverter is symmetrical I mean= 2x [2/T] x Isat dt : Limits(t1, t2)
ConditionsVin(t)=(Vdd/) t;
--assume vin increases linearly with time
For a balanced CMOS inverter with n=p= , and Vtn = |Vtp|, the short circuit power can be expressed by Psc = (/12)(Vdd 2Vt)3 (tr/f/tpin)
where tpin is the period of the input waveform and trf is the input rise time (or fall time) tr = tf = trf
P short circuit reduces Reason---- output start switching after input has completely stabilized
Effect of Cload
Pave = CL Vdd2 f
where f = 1/T
Note that the dynamic power is independent of the typical device parameters, but is simply a function of power supply, load capacitance and frequency of the switching!
Vdd
Vin CL
Vout
Not a function of transistor sizes! Need to reduce C L , Vdd , and f to reduce power.
Inc in W inc in CL
Assume: P(A=1) = 1/2 P(B=1) = 1/2 Then: P(Out=1) = 1/4 P(0 1) = P(Out=0).P(Out=1) = 3/4 1/4 = 3/16 CEFF = 3/16 * CL
No feedback
Vdd=Vddref
Vdd=Vddref
Vdd Vddref
Graphical solution
Design example0.25um technology, find f, Vdd for tpref=0.2ns. Cext=10Cg1, =1, Vref=2.5v
Shd. Be minimum
Combinational logic
STATIC CMOS GATES
asynchronous design
Design Styles
Full Static CMOS or complementary logic
NAND
NOR
XOR/ XNOR
F =
+ A. (B+C)
DCVSL
Xor/ Xnor
ADVANTAGE---TRANSISTOR SHARING
NAND/ AND
Adder
223
Transistor sizes
All stages shd have same sizes C = n W L Cox; n is a non zero no. Each stage load = 3 (w l) Cox L=min size
224
Transistor sizes
Inverter load at the input = (2pmos+1nmos) gate load [Wnmos + Wpmos ]Lmin Cox or [Wnmos + 2Wnmos ]Lmin Cox
Here Cz=C = [Wnmos + Wpmos ]Lmin Cox In a given tech., L is fixed, say 1um We take 1Cg= Wmin Lmin Cox If C= 100Cg; then Wpmos= Wnmos = 100 Wmin
225
Iav
Vin
Vout CL
Transistor Sizing
In
1 Ci u u2 u N-1
Out
C1
C2 CL
uopt = e
design
Determine N, u(=) cL=un+1 cg (n+1)=ln (cL/cg) / ln(u) Delay=o (cd+u cg) / (cd+cg) Delay total = (n+1) o [(cd+u cg) / (cd+cg)] Delay total= [ln (cL/cg) / ln(u) ] * o [(cd+u cg) / (cd+cg)] u(ln u-1) = (cd/cg) ~0 U= e