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Syllabus
Precision instruments based on laser
Principle laser interferometer application in linear, angular measurements and machine tool metrology Constructional features types Applications digital de ices
PRINCIPLE OF LASER
!he se"uence of triggered identical photon from stimulated atom is
higher energy le el %& then it $ill cause the atom to return to ground state energy le el %' by releasing another photon
LASER INTERFEROMETRY
Two frequency Laser source Op !ca" e"e#en s
$ea# sp"! er $ea# %en&ers Re ro ref"ec ors Laser 'ea&( s #easure#en rece!)er Measure#en &!sp"ay
*SE OF LASER
(aser !elemetric system (aser and (%) based distance measuring
instruments Scanning (aser gauge )iffraction pattern techni"ue *auging $ide diameter from the diffraction pattern formed in a laser
diameter parts A parallel coherent laser beam is diffracted by a small part and a lens on a linear diode array focuses the resultant pattern+ !he measurement accuracy is more for smaller parts
LASER INTERFEROMETER
,eam splitter
-nterferometer
MIC,ELSON INTERFEROMETER
T-YMAN.GREEN INTERFEROMETER
the machine tool are chec#ed under static conditions then the test are called static test Dyna#!c es s . -f the alignment tests are carried out under dynamic loading condition+ !he accuracy of machine tools $hich cut metal by remo ing chips is tested by t$o types of test namely+
Geo#e r!ca"
es s / -n this test, dimensions of components, position of components and displacement of component relati e to one another is chec#ed+ Prac !ca" es s / -n these test, test pieces are machined in the machines+ !he test pieces must be appropriate to the fundamental purpose for $hich the machine has been designed
Straightness+ /latness+ Parallelism, e"ui0distance and coincidence+ 1ectilinear mo ements or s"uareness of straight line
and plane+
1otations
and ertical planes+ !est for flatness of machine bed and for straightness and parallelism of bed $ays on bearing surface+ !est for perpendicularity of guide $ays to other guide $ays+ !est for true running of the main spindle and its a3ial mo ements+ !est for parallelism of spindle a3is to guide $ays or bearing surfaces+ !est for line of mo ement of arious members li#e spindle and table cross slides etc
CMM
length o er the outer surfaces of a length bar or any other long member -t is more useful and ad antageous than ernier calipers, micrometer, scre$ gauges !he co0ordinate measuring machine is used for contact inspection of parts Sa ings in inspection 5 to '6 percent of the time is re"uired on a CMM compared to manual inspection methods
machine
Types of CMM
-or1!n+
do$n in the 80a3is may occur perpendicularity errors )imensional errors of a CMM is influenced by
Straightness and perpendicularity of the guide $ays+ Scale di ision and ad9ustment+ Probe length+ Probe system calibration, repeatability, 4ero point setting and re ersal error+ %rror due to digiti4ation+ %n ironment
reduce deflection !he $eight of the $or# piece may change the geometry of the guide $ays :ariation in temperature of CMM
APPLICATION
Automobile, machine tool, electronics, space etc+, Machines are best suited for the test and inspection
of test e"uipment, gauges and tools Aircraft and space ehicles determination of shape
ADVANTAGES
!he inspection rate is increased+ Accuracy is more+ 2perators error can be minimi4ed+ S#ill re"uirements of the operator is reduced+ 1educed inspection fi3turing and maintenance cost+ 1eduction in calculating and recording time+ 1eduction in set up time+ 7o need of separate go ; no go gauges for each feature+ 1eduction of scrap and good part re9ection
DISADVANTAGES
!he table and probe may not be in perfect alignment+ !he probe may ha e run out+ !he probe mo ing in 80a3is may ha e some
perpendicular errors+ Probe $hile mo ing in < and = direction may not be s"uare to each other+ !here may be errors in digital system
!ypes
CNC.CMM
MAC,INE VISION
A :ision system can be defined as a system for
automatic ac"uisition and analysis of images to obtain desired data for interpreting or controlling an acti ity
Machine
ision can be defined as a means of simulating the image recognition and analysis capabilities of the human system $ith electronic and electro mechanical techni"ues
computer
)efining and analy4ing the characteristic of image -nterpretation of image and decision0ma#ing