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interpretation
X-ray Powder
Diffraction
Particle size
and defects
Peak shapes
Peak relative
intensities
Background
Peak
positions
10
20
30
2
Unit cell
Symmetry
and size
c
b
Diffuse scattering,
sample holder,
matrix, amorphous
phases, etc...
40
Atomic
distribution in
the unit cell
Background
Sinyal yang diinginkan
Noise
Epitaxy/Texture/Orientation
Crystallite Size and Microstrain
Indicated by peak broadening
Other defects (stacking faults, etc.) can be measured by analysis of peak shapes
and peak width
Phase Identification
The diffraction pattern for every phase is as unique as your
fingerprint
Phases with the same chemical composition can have drastically
different diffraction patterns.
Use the position and relative intensity of a series of peaks to match
experimental data to the reference patterns in the database
Raw data
Background substraction
Smoothing
K substraction
K
L
M
K1
K2
K2
K1
K2
Kb
W L1
Bearden
(1967)
Holzer et al.
(1997)
Cobalt
Anodes
Bearden
(1967)
Cu K1
1.54056
1.540598
Co K1
1.788965 1.789010
Cu K2
1.54439
1.544426
Co K2
1.792850 1.792900
Cu Kb
1.39220
1.392250
Co Kb
1.62079
1.620830
Cr K1
2.28970
2.289760
Molybdenum
Anodes
Chromium
Anodes
Mo K1
0.709300
Mo K2
0.713590 0.713609
Cr K2
2.293606 2.293663
Mo Kb
0.632288 0.632305
Cr Kb
2.08487
0.709319
2.084920
Often quoted values from Cullity (1956) and Bearden, Rev. Mod. Phys. 39 (1967)
are incorrect.
Holzer et al.
(1997)
Values from Bearden (1967) are reprinted in international Tables for X-Ray Crystallography
and most XRD textbooks.
Most recent values are from Hlzer et al. Phys. Rev. A 56 (1997)
Has your XRD analysis software been updated?
K
D
b cos
Intensity (a.u.)
23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41
2 (deg.)
K
D
b cos
K
B2
L cos
0.94
B2
L cos
http://prism.mit.edu/xray
I(phase a)/I(phase b)
..
60
50
40
30
20
10
0
0
0,2
0,4
0,6
X(phase a)/X(phase b)
0,8
sin
2
2
4a
(h k l )
2
sin C (h k l )
2
dividing the above equation with the first reflection angle gives the ratio of hkl
sin 2
(h 2 k 2 l 2 )
2
2
sin 1 (h1 k12 l12 )
the ratio of hkl define the possible Miller indices: ratio = h2 + k2 + l2
if there are some possible hkl, the highest number comes first
After indexing, one of the peaks can be used to calculate the cell parameters.
As the error in measuring the diffraction angles is a systematic error, the last
reflection data will be used
sin2
0.0279
ratio
1
Miller indices
100
27.302
33.602
38.995
43.830
48.266
56.331
60.093
63.705
67.213
70.634
0.0557
2
3
4
5
6
8
9
10
11
12
110
111
200
210
211
220
221
310
311
222
topics
Evaluation of the intensities of X-rays
diffracted from polycrystalline samples;
Evaluating crystallinity
taking the sum total of relative intensities of
ten individual characteristic peaks1 then
taking the ratio over the corresponding
relative intensities of standard materials
E.g.:
Comparing crystallinity of flyash-based
zeolite-A using XRD and IR spectroscopy
1CURRENT
% crystallinity =
(AD4R)/(ATO4)
72.8%
85%
98.6%
98.6%
98.6%
100%
83.2%
72.8%
92%
96.2%
93.3%
100%
00-004-0784> Gold - Au
(111)
Intensity(Counts)
8.0
(311)
(200)
6.0
(220)
4.0
(222)
2.0
(400)
3
x10
40
50
60
70
Two-Theta (deg)
80
90
100
ZnO nanorod
1 k1
2
1 ek1t
1 ek 2t N 0
1 ek 2t N 0Al
NaAlH 4 3 3 k k
Na 3 AlH 6
3 k 2 k1
2
1
N Al N 0
N Na 3 AlH 6
1 0
k1 k1t
e
N
ek 2t N 0
ek 2t
Na 3 AlH 6
3 NaAlH 4 k 2 k1
N NaAlH 4 N 0
NaAlH 4
ek1t
Na3AlH6
NaCl
NaAlH4
Al
dispersing the powder with alcohol onto the sample holder and then
allowing the alcohol to evaporate, often provides a nice, even coating of
powder that will adhere to the sample holder
powder may be gently sprinkled onto a piece of double-sided tape or a
thin layer of vaseline to adhere it to the sample holder
the double-sided tape will contribute to the diffraction pattern
What is polymorph?
Same Chemical formula but different crystal system
xrd-6000-pharma.ppt
abnormal peak
xrd-6000-pharma.ppt
xrd-6000-pharma.ppt
Amorphous
Crystallization
Crystal Size
Lattice Strain
Degree of Crystallization
xrd-6000-pharma.ppt
Ic
CrystalinityXc=K
It
Ic: Area of crystalline phase
It: Total area of the profile
xrd-6000-pharma.ppt
Crystalinity Calculation
xrd-6000-pharma.ppt
Crystallite size
Particle size
DCos
Scherrers Formula
xrd-6000-pharma.ppt
xrd-6000-pharma.ppt
Acquisition concerns
Lin (Counts)
3000
2000
1000
0
15
20
30
40
50
60
70
2-Theta - Scale
QUARTZ - File: Q091506.RAW - Type: 2Th/Th unlocked - Start: 18.000 - End: 72.000 - Step: 0.030 - Step time: 0.2 s - Temp.: 25 C (Room) - Time Started: 0 s - 2-Theta: 18.000 - Theta: 0.000 Operations: Strip kAlpha2 0.514 | Background 1.000,1.000 | Import
QUARTZ OFFSET - File: 715Q-01.RAW - Type: 2Th/Th unlocked - Start: 15.000 - End: 69.990 - Step: 0.030 - Step time: 0.2 s - Temp.: 25 C (Room) - Time Started: 0 s - 2-Theta: 15.000 - Theta:
Operations: Y Scale Mul 0.712 | Strip kAlpha2 0.514 | Background 1.000,1.000 | Import
MSE715-XRD.ppt
2500
2400
2300
2200
h < 100mm
2100
2000
1900
1800
1700
Illustrate correction
process later
Lin (Counts)
1600
1500
1400
1300
1200
1100
1000
900
800
700
600
500
400
300
200
100
0
25
26
27
28
2-Theta - Scale
QUARTZ - File: Q091506.RAW - Type: 2Th/Th unlocked - Start: 18.000 - End: 72.000 - Step: 0.030 - Step time: 0.2 s - Temp.: 25 C (Room) - Time Started: 0 s - 2-Theta: 18.000 - Theta: 0.000 Operations: Strip kAlpha2 0.514 | Background 1.000,1.000 | Import
QUARTZ OFFSET - File: 715Q-01.RAW - Type: 2Th/Th unlocked - Start: 15.000 - End: 69.990 - Step: 0.030 - Step time: 0.2 s - Temp.: 25 C (Room) - Time Started: 0 s - 2-Theta: 15.000 - Theta:
Operations: Y Scale Mul 0.712 | Strip kAlpha2 0.514 | Background 1.000,1.000 | Import
MSE715-XRD.ppt
X-Ray Diffraction
Self-assembled mesoporous metal oxide thin films , Heidi Springer, Purdue University MSE REU, August 5, 2004
P123 Results
1.2g P123
8000
1.5g P123
6000
1.8g P123
4000
2000
0
0.6
1.1
1.6
2.1
2.6
Degrees 2-theta
F127 Results
Lowest Concentrations F127
18000
16000
14000
12000
10000
.75g F127
8000
6000
1.0g F127
4000
2000
0
1
Degrees 2-theta
F127 Results
Low Angle XRD at 1.25g F127
Counts Per Second (CPS)
16000
14000
12000
10000
8000
6000
4000
2000
0
1
Degrees 2-theta
F127 Results
Self-assembled mesoporous metal oxide thin films , Heidi Springer, Purdue University MSE REU, August 5, 2004
XRD patterns of mesostructured tin oxide displaying an Im3m derived structure. (a) after thermal
treatment at temperatures up to 250C and (b) after calcination at 400C for four hours.
F127 Results
Self-assembled mesoporous metal oxide thin films , Heidi Springer, Purdue University MSE REU, August 5, 2004
h, k, l are
Miller indices
a, b, c are
unit cell
distances
, b, are
angles
between the
lattice
directions
Complexity of
calculations is
dependent on
the symmetry
of the crystal
system.
Rasio
Rasio x 3
(h k l)
hkil
(derajat)
Sin2
(Sin2) / (Sin21)
(hcp)
30
0,0667
(1 1 1)
100
32.5
0.0783
1.17
(1 1 1)
100
34.5
0.0879
1.32
(0 0 2)
0002
36.6
0.0986
1.48
(0 2 1)
101
48
0.1654
2.48
(2 0 2)
102
57.5
0.2277
3.41
10
(3 1 0)
1 1 2 0
65.5
0.2889
4.33
12
( 2 1 3)
103
69
0.3208
4.8
15
(2 3 2)
1 0 2 2
70.5
0.3331
15
(5 3 1)
2 0 2 1
74
0.3622
5.43
16
(0 0 4)
0004
Penentuan Struktur Kristal Kubus dan non-kubus, Sukir dkk., Tugas Matakuliah Kimia Anorganik Terapan, S2 Depag, 2010
(h k l)
hkil
(bil.
(ccp)
(hcp)
(1 1 1)
(1 0 0)
(1 1 1)
(1 0 0)
(0 0 2)
(0 0 0 2)
(0 2 1)
(1 0 1)
(0 2 2)
(1 0 2)
10
(3 1 0)
(1 1 2 0)
12
( 2 1 3)
(1 0 3)
15
(2 3 2)
(1 0 2 2)
15
(5 3 1)
(2 0 2 1)
16
(0 0 4)
(0 0 0 4)
bulat)
Rule
Rasio x 3
InP nanocrystals
Applications:
Determination of
Crystallite Size
Scherrer equation:
Bcrystallites = (k)/(L cos )
k constant ~ 1 (precision error 10%)
L average crystal size (nm)
wavelength of the X-rays used (nm)
Bragg angle (radians)
B full width at half maximum (FWHM,
radians)
Example: anatase TiO2
Cu = 0.15406 nm
L1 = 0.0061
1=25.28 B1 = 25.3 nm
L2 = 0.0061
2=37.8 B2 = 25.26 nm
K
L=
cos
where L is the dimension of the particle
is the wavelength
b is the peak width
is the angle of reflection
K is a constant, can be assumed to be 1
(This is a simplified analysis)
karakterisering_2004.ppt
Example 1. Phase
identification
karakterisering_2004.ppt
karakterisering_2004.ppt
400
30
40
50
A: Anatase
R: Rutile
R
300
60
R A
o
A
700 C
A
A
400
R R
300
600 C
200
200
o
500 C
100
100
350 C
o
250 C
0
20
nsf.ppt
30
40
2 (degree)
50
60
23 nm (b)
o
800 C
750 C
o
700 C
20nm
as-deposited
12 nm (a)
R(110)
o
800 C
R(101)
R(211)
R(220)
R(111)
AR
AR
A0 0.884 AA AR
750 C
700 C
(*)
A(101)
as-deposited
A(004)
20
nsf.ppt
WR
30
40
2 (deg.)
A(200) A(105)
A(211)
50
60
30
40
50
Intensity (arb. units)
24.5
(101)
23 nm (004)
25.0
60
25.5
26.0
26.5
Anatase (101)
23 nm
17 nm
12 nm
(200)
(105) (211)
17 nm
12 nm
20
nsf.ppt
30
40
2(deg.)
50
60
0.00092
0.00096
0.00100
0.00104
0.00100
0.00104
Ln(AR/A0)
-1
-2
-3
-4
-5
12nm (Ea=180.28kJ/mol)
17nm (Ea=236.38kJ/mol)
23nm (Ea=298.85kJ/mol)
R=0.995
R=0.998
R=0.991
0.00092
0.00096
-1
1/T (K )
AR=A0Exp(-Ea/KT), A0=0.884AA+AR
Ea is anatase to rutile transformation activation energy.
The activation energy decreases with the particle size
and 12-nm sample has the lowest activation energy of 180.28 kJ/mol.
Bulk TiO2 has activation energy of 450 kJ/mol.(*)
(*) H. Zhang and J. F. Banfield, Am. Mineral. 84, 528 (1999).
nsf.ppt
p6mm hexagonal
symmetry
ao = 12.60 nm
ao = 12.61 nm
111
222
311
111
222
311
For every set of planes, there will be a small percentage of crystallites that are properly oriented
to diffract (the plane perpendicular bisects the incident and diffracted beams).
Basic assumptions of powder diffraction are that for every set of planes there is an equal number
of crystallites that will diffract and that there is a statistically relevant number of crystallites, not
just one or two.
2d sin
The interplanar spacing d for a cubic material is given by:
dhkl
h2 k 2 l 2
d2
a
h k l
2
2
4 sin 2
1-92
Which gives:
Sin2
h2 k 2 l 2
4a 2
2
sin 2 1
sin 2
2
1-93
1-94
1.
2.
Determine sin2
3.
integers (1, 2, or 3)
4.
5.
6.
1-95
1-96
1-97
1-98
The Table below illustrates the selection rules for cubic lattices.
According to these rules, the (h2 + k2 + l2) values for the different
cubic lattices follow the sequence:
Simple cubic
BCC
FCC
:
:
:
1,2,3,4,5,6,8,9,10,11,12,13,14,16,.
2,4,6,8,10,12,14,16,18,...
3,4,8,11,12,16,19,20,24,27,32,
1-99
Bravais lattice
All
None
h + k + l = even
h + k + l = odd
h, k, l = unmixed (all
even or all odd)
h, k, l = mixed
1-100
Sin2
h2 k 2 l 2
4a 2
2
Rearranging gives
2 2
h k2 l2
a
2
4 sin
2
1-101
METHOD 2:
This method can be used to index the diffraction pattern from materials
with a cubic structure. From:
Sin2
h2 k 2 l 2
4a 2
2
Since 2 / 4a2 is constant for any pattern and which we will call A, we can
write:
sin 2 A h 2 k 2 l 2
1-102
2
4a
or a
2 A
1-103
1-104
Scherrers Formula
K
t
B cos B
t = thickness of crystallite
K = constant dependent on crystallite shape (0.89)
= x-ray wavelength
B = FWHM (full width at half max) or integral breadth
B = Bragg Angle
Pola difraksi sinar-X : SiO2 dan SiO2-G0SiO-G4.0. 1:SiO2 ; 2:SiO2 - G0; 3:SiO G0.5; 4:SiO2 -G1.0; 5:SiO2 -G1.5; 6:SiO2 -G2.0; 7:SiO2 G2.5;8:SiO2-G3.0;
9:SiO2 -G3.5; 10:SiO2 -G4.0
Daftar Pustaka :