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1. Introduction
2. IEEE-1500 Standard
TAP
port pins:
TCK,
TMS,
TDI,
TDO,
TRST,
a clock pin.
The memory requirements low as for each test pattern only two
pointers are stored and after detecting a fault the corresponding
pattern is removed from the memory.
References
[1] Hyunbean Yi; Jaehoon Song; Sungju Park, "Low-Cost Scan Test
for IEEE-1500-Based SoC," Instrumentation and Measurement,
IEEE Transactions on , vol.57, no.5, pp.1071,1078, May 2008
[2] Novak, O.; Pliva, Z.; Jenicek, J.; Mader, Z.; Jarkovsky, M., "Self
Testing SoC with Reduced Memory Requirements and Minimized
Hardware Overhead," Defect and Fault Tolerance in VLSI Systems,
2006. DFT '06. 21st IEEE International Symposium on , vol., no.,
pp.300,308, 4-6 Oct. 2006