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Transistor faults
Summary
Review exercise
1
Ref.: M. J. Howes and D. V. Morgan, Reliability and Degradation Semiconductor Devices and Circuits, Wiley, 1981.
3
s-a-0
g
h
i
f
Test vector for h s-a-0 fault
Fault Equivalence
Equivalence Rules
sa0 sa1
sa0
sa0
sa1
sa1
sa0 sa1
AND
sa0 sa1
sa0 sa1
OR
WIRE
sa0 sa1
sa0 sa1
sa0
sa1
sa0 sa1
sa0 sa1
NAND
sa0 sa1
NOT
sa1
sa0
sa0 sa1
NOR
sa0 sa1
sa0 sa1
sa0
sa1
FANOUT
sa0
sa1
sa0
sa1
8
Equivalence Example
Equivalence Example
Faults in boldface
removed by
equivalence
collapsing
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
sa0 sa1
20
Collapse ratio = = 0.625
32
10
Checkpoints
11
Classes of Stuck-at
Faults
12
Multiple Stuck-at
Faults
13
Transistor (Switch)
Faults
14
Stuck-Open Example
Vector 1: test for A s-a-0
(Initialization vector)
pMOS
FETs
1
VDD
nMOS
FETs
1(Z)
Good circuit states
Stuck-Short Example
Test vector for A s-a-0
pMOS
FETs
1
0
VDD
IDDQ path in
faulty circuit
Stuckshort
nMOS
FETs
0 (X)
Summary
17