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EDA Introduction

Professor: Sci.D., Prof.


Vazgen Melikyan

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Course Overview

 Introduction
 1 lecture
 IC Design Data Formats and Tools
 4 lectures
 Electronic Design Methodology
 4 lectures
 IC Synthesis
 2 lectures
 Databases for EDA
 3 lectures
 IC Design Approaches and Flows
 3 lectures
 EDA Tools
 3 lectures
 Overview of Synopsys EDA Tools
 3 lectures

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Introduction

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IC Design Cycle

Manual
System Chip
Specification
Automation

 Several conflicting considerations:


 Design complexity: large number of devices/transistors
 Performance: optimization requirements for high performance
 Time-to-market: about 15% gain for early customers
 Cost: die area, packaging, testing, etc.
 Others: power, signal integrity (noise, etc.), testability, reliability,
manufacturability, etc.
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IC Design Cycle (2)

 Manual layout design is obviously not practical


 Design complexity:
 Manually drawing layout for a billion transistors would take too long even
if it is known how to:
 Verify (test) designs for functionality, speed, power, etc.
 Complexity scales faster than actual design
 Reuse designs
 Create human-readable designs
 Speed-up design process

 These problems form a great deal of work


 Advancing EDA technology, physical fabrication technology, advanced
designs, and IP form bulk of work (and money) in IC

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IC Design Hierarchy and Abstraction

 Hierarchy shows the structure of a design at different


levels of description.
 Abstraction hides the lower level details.
The use of abstraction makes it possible to reason about
a limited number of interacting parts at each level in the
hierarchy. Each part is itself composed of interacting
subparts at a lower level of abstraction. This
decomposition continues until the basic building blocks
(e.g. transistors) of a IC circuit are reached.

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IC Design Hierarchy
A A Level 1
B D
E F M N
G H O B D Level 2
C
C
I J Level 3
K L E F G HI J M N O
Level 4
K L
b)
a) A
A C
B D I E F I M N
J
C G H K L O

d) e)
c)

 A stylized view of a design (a), its decomposition tree (b), a view of


the design decomposition of entity A at abstraction levels 1 and 2
(c), entity C at levels 2 and 3 (d), the whole design without a
hierarchical organization (e)
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Most Important Entities of IC Design

 Area
One can combine all
 Speed these entities into a
 Power dissipation single cost function - IC
 Design time cost function.
 Testability
It is impossible to try to design an IC circuit at one go
while at the same time optimizing the cost function.
The complexity is simply too high. Two main concepts
that are helpful to deal with this complexity are hierarchy
and abstraction.
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Design Domains

Top-down and bottom-up design methodology

Behavioral Structural
domain domain
High-level synthesis
(algorithmic and system design)

Top-down Logic synthesis


(structural and logic design)

Transistor-level design

Bottom-up Physical design

Physical domain

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Design Domains (2)
Only top-down design methodology

Behavioral Structural
domain domain
High-level synthesis
(algorithmic and system design)

Logic synthesis
(structural and logic design)

Top-down
Transistor layout
Module layout
Cell layout
Floorplans
Physical partitions
Physical domain

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Review of the Design Process

 Application sets specifications and foundries


impose manufacturing constraints
 Design process cycles between synthesis
and verification

Synthesis Verification

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Synthesis
b-view s-view

Architectural Level

PC = PC + 1; // increment the Program Counter
FETCH(PC); // fetch next instruction
DECODE(INST); // decode the instruction

Logic Level

Technology mapping

Geometrical Level

Physical design

p-view

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Design Process: Synthesis

 Make assumptions and local sub-goals


 For example: transistor saturation
 Select circuit topology
 For example: operational amplifier (single-stage, multi-stage, etc.)
 Formulate analytical equations to guide design
decisions
 For example: bandwidth, gain
 Size devices
 Satisfy performance envelope

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Design Process: Verification

 Simulate circuits (typically Spice or derivatives)


 Validate design across multiple operating environments
 Measure circuit parameters
 Evaluate analytical equations based on simulated values
 Verify assumptions
 For example: check transistors are operating correctly
 Goal: explore limitations of the circuit
 Figure out where and how the circuit breaks

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Design Actions and Tools

 The actions involved to design an IC circuit can be grouped in different


categories according to their types as different types of activities require
different EDA tools.

Synthesis tools

Verification tools

Optimization tools

Design management tools

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Design Description

 Options
 Behavioral
 Parallel algorithm
 Sequential algorithm
 Structural
 Logic family
 Clocking strategy
 Logic structures (complementary, dynamic, transmission gate, etc.)
 Physical domain
 Processing technology
 IC packages
 Cell libraries
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Design Description (2)

 Design Parameters
 Performance (speed, power, function,
flexibility)
 Die size (cost of die)
 Design time
 Testability and ease of testing

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Structured Design Strategy

 Trade-off among design parameters


 Design is a continuous trade-off among design
parameters
 Structured design aims to reduce IC design
complexity and provide teamwork

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Structured Design Strategy (2)

 Structured design techniques


 Hierarchy - reduction of complexity by dividing modules into sub-
modules and then repetition of division until the complexity of
sub-modules is at manageable level.
 Regularity - attempt to divide the hierarchy into a set of similar
building blocks.
 Modularity - well defined interfacing among sub-modules. In
structured domain, interfacing among logic structures; in physical
domain, cell connectivity locations.
 Locality - a form of “information hiding” of a module or sub-
module by specification of interfacing only so that module’s
apparent complexity is reduced.
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Design Options

Design Options

Custom Semicustom

Cell-based Array-based

Standard cells Pre-diffused Pre-wired


Macro cells
Compiled cells (gate arrays) (FPGA's)

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Sample Problems in EDA Industry

 Lack (“insufficient supply”) of qualified engineers


 100s of companies may re-implement same algorithms
 Wasted resources compound the problem of insufficient supply

 Time to market (5-7 year delay from publishing to first


industrial use)
 Academic papers often lack empirics - every user re-runs empirics
 Tool integration (academics tend to focus on isolated optimizations)
 Changes in technology and design processes
 Qualify of Result (QoR)
 Often cannot be evaluated in an isolated (optimization) context
 EDA engineers have no feel for QoR

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IC Design Cycle
System Specification Netlist

Architectural Physical
Design Design
Circuit
Architectural Layout
Specification
Design
or
Fabrication
Functional Logic
Design Synthesis
Chips
Timing and relationship
between functional units Packaging
Logic Packaged and
Design tested chips
RTL in HDL

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History and Evolution of the EDA

 1960. The Hand design

Courtesy TI Courtesy RCA– CMOS Test Courtesy Intel and NY


122 Transistors Pattern Museum of Modern Art
EPROM
Paper designs Cutting Rubylith artwork for mask generation
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History and Evolution of the EDA (2)

 1969. Commercial CAD Gets Started


 Applicon- PCB & IC Digitizing, CAM
 ComputerVision- Wiring, Mapping, Documentation, PCB
 David Mann output for IC masks
 Gerber for PCB artwork
33 MB Disk
 Autotrol for digitizing
Plotter

Mag Tape-Output

Digitizing Keyboard, Tablet Mainframe-500 lbs Photo-Mask


Table/Tablet and CRT 128k; 8-16 bit Generation
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History and Evolution of the EDA (3)

 1970s. Basic Early CAD Applications

Gridded Artwork
Pencil IC/PCB Primitive for
Layouts Database Manufacturing

Schematic Card Deck from Simulation


Keypunch 01110010
00011001
10010110
00011001
01110010
Analog
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History and Evolution of the EDA (4)

 1970s. Automated pattern generation and circuit


simulation
 Digitizing systems (Calma)
 Spice for circuit simulation
 Automatic routing for printed circuit boards (Applicon, CV, Racal-
Redac)
 Captive IC routers (IBM, WE, …)
 GDS II becomes the standard layout format (Calma)
 Schematic capture and logic simulation on workstations (Daisy,
Mentor, Valid)

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History and Evolution of the EDA (5)

 Early 1980s. CAE Environment


VAX780 & Tegas Mentor Mentor
or Valid Simulation Graphics Graphics
Spice, NCA/DRC IDEA IDEA

Domain
Network
DECNET

Daisy Daisy
Schematic Schematic
Capture Capture

Keyboard Keyboard  Schematic Capture


 Interactive Simulation
 Eng’g Doc with graphics
 Fast Schematic Capture
 e-mail
 Remote Fast Simulation  MSpice

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History and Evolution of the EDA (6)

 1980s. Placement & Routing


 Automatic placement & routing
 Design Rule Check (DRC), Layout Versus Schematic
(LVS) comparison
 Verilog and VHDL enable Logic and RTL simulation
 The main players in the commercial arena become
Cadence (Gateway/Tangent/ASI/Valid) and Mentor

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History and Evolution of the EDA (7)

 1980s. ECAD Innovates Netlist from IC Layout –


Enables Layout Versus Schematic (LVS)
G1 Net1
G2

Net1: Net1:
G1-O; G2-I; G1-O; G2-I;

Compare

Error
List
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History and Evolution of the EDA (8)

 1980s. Design Rule Check (DRC)


 Design Rule Check identifies geometry errors in
physical design

Error #1 Error List


Error #1-Enclosure
Error #2 Error #2-Width
Error #3-Spacing
Error #3 Error #4-Spacing

Error #4

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History and Evolution of the EDA (9)

 1980s. HDL Becomes Predominant


process begin sad sad
wait unit sad DAs dd.
CLOCK'stable
and CL a SD sock
if(ENABLE='1') then
Verilog or
TOGGLE<= not
TOGGL sad DAs d d
end if;
end process;
process begin sad sad
VHDL
wait unit sad DAs dd.
CLOCK'stable
and CL a SD sock
if(ENABLE='1') then
TOGGLE<= not
Simulation TOGGL sad

Results Synthesis
Formal
Equivalence G1 Net1
Checking
Simulation G2
Results

Net1:
G1-O; G2-I;

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History and Evolution of the EDA (10)

1990s. Synthesis

process begin sad sad


wait unit sad DAs dd.
CLOCK'stable
and CL a SD sock
if(ENABLE='1') then
Verilog or
TOGGLE<= not
TOGGL sad DAs d d
end if;
end process;
VHDL
process begin sad sad
wait unit sad DAs dd.
CLOCK'stable
and CL a SD sock
if(ENABLE='1') then
TOGGLE<= not
TOGGL sad

Synthesis Schematic Full GDS/LEF

G1 Net1
Technology
Mapping
G2

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History and Evolution of the EDA (11)

 1990s. Synthesis Cell Based Design


process begin
Process wait until not
CLOCK'stable
Design and CLOCK=1;
if(ENABLE='1') then
TOGGLE<= not
RTL / Logic
Rules TOGGLE;
end if;
end process;

Cell Library
EDA Tools

Design

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History and Evolution of the EDA (12)

 1990s. The Netlist Becomes the Center of the


CAD and CAE Universe
Logic Simulation
Netlist
Analog Simulation

IC Place and Route


CAE
PCB Place & Route

Connectivity
CAD
Verification

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History and Evolution of the EDA (13)

 2000. New Design Challenges


 IP
 Timing closure / signal integrity
 Testbenches / assertions
 RET
 DFM / Yield
 Statistical analysis

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Future Trends (1)
Transistors
Lvy Bridge
Oracle SPARC T4
10.000.000.000
Core i7
Dual-Core Intel* Itanium* 2 Processor
Intel* Itanium* Processor
1.000.000.000
Intel* Pentium* 4 Processor

Intel* Pentium* III Processor 100.000.000


Intel* Pentium* II Processor
10.000.000
Intel* Pentium* Processor
Intel486* Processor
1.000.000
Intel386* Processor

286 100.000
8085
8080 10.000
8008
4004
1.000
1970 1975 1980 1985 1990 1995 2000 2005 2010 2015 2020

http://www.cringely.com/2013/10/15/breaking
-moores-law/

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Future Trends (2)

Moore’s Law for contemporary ICs


Exceed Moore’s Law

(multi-crystal chip, system on package, etc.)

1 2 3 4 5 6
Systems with CMOS structures base
Scaling according to Moore’s Law

Interactive systems with non-digital 1. Analog & RF circuits


Integration processing
2. Passive components
130nm of DIPs &
other
(system on package) 3. Powerful components
90nm
types of 4. Sensor components
65nm components 5. Optical components
Digital
45nm information 6. Biochips
Processing
32nm (DIP)

22nm

14nm

7nm

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Future Trends (3)

 IP reuse to increase to over 90% by 2020


 IP based design methodology
 IP diversity matters
 It is kept in check by standards
 Processors, memories and busses define platforms IP
 IP needs to work together – platforms
 IP vendor size matters
 IP needs to be certified by the vendor
 The user certifies the vendor
 Consolidation is unavoidable

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Strong Forces for Consolidation in IP

 Reduce number of IP Vendor 1 IP Vendor 2


vendors to minimize
issues: Application
Specific IP Vendor 3
 Multiple block/vendor Memory USB
Logic

evaluations
 Multiple business models, Basic
Peripherals
contracts, royalties, etc. Time
On-chip USB IP Vendor 4
Serial IO
inter-
 Multiple tools, flows, Memory
Control connect

models, decks, layer etc. “Bus” “PCI” IP Vendor 5


assignments, etc.
 Interoperability IP Vendor 7 IP Vendor 6

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Key Power Management Areas
Low Power Thermal Physics
Management
Application

 Wireless  Microprocessors
 Handheld  Graphics/multimedia  Every design
 Embedded systems  Networking/telecom
Concern

 Battery life  Thermal management  Leakage power


 Lowest leakage  Packaging, cooling  IR-drop
and/or dynamic power cost  Electromigration

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Improving Test Quality

Addressing Defects

 Contact defects require at-speed


delay testing
 Transition and path delay fault
ATPG
 Integration with STA to supply
critical paths

 Metal defects require resistive


shorts testing
 Bridging fault ATPG support
 Extraction integration to identify
most likely bridges based on layout

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Via Reliability - Major Issue

 Manufacturing Problem:
 Formation of voids in vias
caused by thermal stress

 Design Solution:
 Minimization of vias in
routing
 Insertion of redundant vias

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Advanced Silicon Process Rules

 Antenna checking and


repair including diode
insertion
 Metal slotting
 Metal fill
 Via optimization
 Min-area rule
 Fat wire rule with range
specification
Via Optimization Improves Process Yield

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Exploding Verification State Space

Bug

Initial
Capacity Gap
State

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Mixed Simulation and Formal
Verification
Formal Verification
Equivalence
Formal Property Topology Checks Checking

Assertions Coverage
Simulations
Metrics
Properties
Functional
Constraints bugs Code
Feedback

Constrained Random Classes Scenarios

Testbench Infrastructure

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Blocks Getting Bigger and More
Complex
PCI Express

1176JZ-S PCI-X v1.0


1022E
PCI v2.3
PCI v1.1

PCI Cores
922T
USB 2.0 Host

USB 1.1 Host


7TDMI-S
USB 2.0 Device
USB 1.1 Device

ARM Cores USB Cores


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System on Chip (SoC)

CPU Memory
(+DSP) Subsystem
+ cache (SRAM, DRAM, Flash,
SDRAM Controller) Custom
Application-
BlueTooth
DSP
Logic
Specific
Subsystem
Logic

AMBA AHB

AMBA APB

Remap Int. IR I/F UART1 GPIO Timer USB


/Pause Cntrl SATA Enet
UART1 GPIO 2.0

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Layout and Technology

Layout 0.25µ 0.18µ

0.15µ 130nm ≤90nm

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Image Correction
Design

OPC

Mask

Wafer

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Synopsys’ Design and Verification
Continuum Platform

www.synopsys.com

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